Labyrinth component testing method and device, electronic equipment and storage medium

Abstract

The invention provides a labyrinth assembly testing method and device, electronic equipment and a storage medium. The method comprises the steps of obtaining a plurality of first voltage signals and a plurality of second voltage signals in a smokeless environment; determining whether the labyrinth assembly has defects according to the plurality of first voltage signals and the plurality of second voltage signals; if it is determined that the labyrinth assembly does not have the defect, a plurality of third voltage signals and a plurality of fourth voltage signals in the smoke environment are obtained; and determining whether the labyrinth assembly has defects or not according to the plurality of third voltage signals and the plurality of fourth voltage signals. Therefore, the quality of the labyrinth assembly can be comprehensively evaluated, the stability and reliability of the labyrinth assembly under various conditions are ensured, and the accuracy of the test result of the labyrinth assembly is further improved.

Description

Technical Field

[0001] The present application relates to the technical field of maze component testing, and in particular to a maze component testing method, device, electronic equipment and storage medium. Background Art

[0002] Smoke detection mainly uses the principle of light reflection and scattering by smoke particles. The higher the smoke concentration, the stronger the reflected light. The maze component is a special smoke detection chamber structure. Its main function is to ensure that smoke can enter the detection area smoothly and block the light waves that affect smoke detection. At the same time, the maze component will also produce a certain amount of reflection of the light emitted by the infrared transmitting tube to reach the infrared receiving tube.

[0003] The color and structural design of the maze component have a great influence on the reflection of light. The current quality control method for maze plastic parts is to use a colorimeter to detect color differences. When there is color difference in the plastic raw materials, the abnormality can be found in the injection molding plant and IQC incoming material inspection. However, for the reflection of light in the maze component, in addition to being affected by the color, the smoothness of the internal surface of the component body and structural variations (such as deformation and light leakage) will also have a serious impact on the reflection of light. Monitoring and controlling the color alone cannot ensure the quality of the maze component. Summary of the invention

[0004] The present application provides a maze component testing method, device, electronic device and storage medium, which determines whether the maze component has defects by combining the voltage signal fed back from the infrared receiving end of the maze component in smoke-free and smoke-containing environments. In this way, the quality of the maze component can be comprehensively evaluated to ensure its stability and reliability under various conditions.

[0005] In a first aspect, the present application provides a maze component testing method, which is applied to a host computer in a maze testing system, wherein the maze testing system further includes a slave computer, and the slave computer is connected to an infrared transmitting tube and an infrared receiving tube in the maze component, and the method includes:

[0006] Acquire a plurality of first voltage signals and a plurality of second voltage signals, wherein the plurality of first voltage signals correspond to the plurality of second voltage signals, and the first voltage signals and the corresponding second voltage signals are respectively voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment;

[0007] determining whether the maze assembly is defective based on the plurality of first voltage signals and the plurality of second voltage signals;

[0008] If it is determined that the maze assembly does not have defects according to the multiple first voltage signals and the multiple second voltage signals, multiple third voltage signals and multiple fourth voltage signals are obtained, the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off in a smoky environment;

[0009] It is determined whether the maze assembly is defective based on the plurality of third voltage signals and the plurality of fourth voltage signals.

[0010] It can be seen that in this application, in a smoke-free environment, the infrared receiving tube receives the reflected signal of the infrared light emitted by the infrared transmitting tube, thereby determining the corresponding voltage signal. Based on the voltage signal, a preliminary performance test of the maze component for light reflection can be conducted to determine whether the maze component has corresponding defects. Subsequently, for the components that are determined to be free of defects, they are tested in a smoky environment to ensure that their smoke detection capabilities meet the requirements. In this way, the quality of the maze component is comprehensively evaluated by combining the test results in smoke-free and smoke-containing environments to ensure its stability and reliability under various conditions, thereby improving the accuracy of the maze component test results.

[0011] In a feasible example, before determining whether the maze component is defective according to multiple first voltage signals and multiple second voltage signals, the method also includes: training a first classification model according to multiple first training data to obtain a second classification model, the second classification model includes a first classification network and a second classification network, the first classification network is used to output whether the maze component is defective, and the second classification network is used to output the type of defect existing in the maze component, each of the multiple first training data includes multiple first historical voltage data, multiple second historical voltage data, a first classification result and a second classification result, the first classification result includes a classification result of whether there is a defect, and the second classification result includes the type of defect; determining whether the maze component is defective according to multiple first voltage signals and multiple second voltage signals includes: inputting the multiple first voltage signals and the multiple second voltage signals into the first classification network in the second classification model to obtain a first output result, and the first output result is used to indicate whether the maze component is defective; if it is determined that the first output result indicates that the maze component is defective, then inputting the multiple first voltage signals and the multiple second voltage signals into the second classification network in the second classification model to obtain a second output result, and the second output result is used to indicate the type of defect existing in the maze component.

[0012] In this application, the trained first classification network can be used to quickly and accurately determine whether the maze component has defects, reducing the possibility of human misjudgment. The second classification network provides detailed fault diagnosis information to help engineers or quality inspectors quickly locate and repair problems, improving the efficiency and accuracy of product quality control.

[0013] In a feasible example, the opening of the infrared emitting tube is based on the order of size and is controlled according to multiple first current signals, and the multiple first current signals are evenly distributed within a preset current range. Determining whether the maze component is defective is based on multiple first voltage signals and multiple second voltage signals, including: determining multiple ninth voltage signals based on the difference between the corresponding two voltage signals between the multiple first voltage signals and the multiple second voltage signals; determining a first number of ninth voltage signals in the multiple ninth voltage signals that are in the corresponding preset voltage range; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is greater than the preset ratio, and the multiple ninth voltage signals have a linear relationship in the acquisition time, then determining that the maze component is not defective; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is not greater than the preset ratio, or the multiple ninth voltage signals do not have a linear relationship in the acquisition time, then determining that the maze component is defective.

[0014] In the present application, by calculating the difference between the first voltage signal and the second voltage signal, the influence of background noise can be eliminated, focusing on the voltage change caused by infrared emission, so as to more accurately evaluate the performance of the maze component. And by counting the number of ninth voltage signals within the preset voltage range and evaluating whether there is a linear relationship between them in the acquisition time, it can be determined whether the maze component is defective.

[0015] In a feasible example, after determining that each of the multiple ninth voltage signals is in a first number of the preset voltage ranges corresponding to each ninth voltage signal, the method further includes: fitting the multiple ninth voltage signals according to a linear regression model and the acquisition time of the multiple ninth voltage signals corresponding to the first voltage signal, and determining a fitting straight line and a determination coefficient between the multiple ninth voltage signals and the fitting straight line; determining the standard deviation of the residuals between the multiple ninth voltage signals and the multiple data values ​​in the fitting straight line according to the multiple ninth voltage signals and the multiple data values ​​corresponding to the multiple ninth voltage signals respectively; if it is determined that the determination coefficient is greater than the first preset threshold and the standard deviation of the residuals is less than the second preset threshold, it is determined that the multiple ninth voltage signals have a linear relationship in the acquisition time; if it is determined that the determination coefficient is not greater than the first preset threshold and the standard deviation of the residuals is not less than the second preset threshold, it is determined that the multiple ninth voltage signals do not have a linear relationship in the acquisition time.

[0016] In the present application, a quantitative evaluation index is provided through a linear regression model and residual analysis to evaluate whether a plurality of ninth voltage signals have a linear relationship in acquisition time, thereby improving the accuracy of the judgment.

[0017] In a feasible example, the multiple third voltage signals and the corresponding multiple fourth voltage signals are respectively the voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off under multiple smoke concentrations, and determining whether the maze component is defective based on the multiple third voltage signals and the multiple fourth voltage signals includes: determining multiple tenth voltage signals based on the difference between the corresponding two voltage signals between the multiple third voltage signals and the multiple fourth voltage signals; determining at least one eleventh voltage signal and at least one twelfth voltage signal among the multiple tenth voltage signals, the third voltage signal and the fourth voltage signal corresponding to the eleventh voltage signal being the infrared value when the infrared transmitting tube is turned on and off under a smoke concentration greater than a preset smoke concentration. The voltage value obtained by feedback from the receiving tube, the third voltage signal and the fourth voltage signal corresponding to the twelfth voltage signal are the voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off under a smoke concentration not greater than the preset smoke concentration; if it is determined that at least one eleventh voltage signal is not less than the first preset voltage signal, and at least one twelfth voltage signal is less than the second preset voltage signal, it is determined that the maze component has no defects; if it is determined that there is a voltage signal less than the first preset voltage signal in at least one eleventh voltage signal, or there is a voltage signal not less than the second preset voltage signal in at least one twelfth voltage signal, it is determined that the maze component has defects, and the first preset voltage signal is not greater than the second preset voltage signal.

[0018] In this application, the tenth voltage signal is divided into two categories: high-concentration smoke (eleventh voltage signal) and low-concentration smoke (twelfth voltage signal), and the response characteristics under different concentrations are evaluated respectively. In this way, the maze components that do not meet the quality standards can be effectively identified, ensuring that they can reliably detect smoke in practical applications.

[0019] In a feasible example, before determining whether the maze component is defective based on multiple first voltage signals and multiple second voltage signals, the method also includes: obtaining multiple fifth voltage signals and multiple first temperature signals, the fifth voltage signal being the working voltage signal of the lower computer when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal being the ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off; determining a sixth voltage signal among the multiple fifth voltage signals that is not within the preset working voltage range; determining a second temperature signal among the multiple first temperature signals that is not within the preset temperature range; and eliminating the voltage signals corresponding to the sixth voltage signal and the second temperature signal among the multiple first voltage signals and the multiple second voltage signals.

[0020] In the present application, by eliminating invalid voltage signals, abnormal data caused by external factors (such as power supply fluctuations or temperature changes) are eliminated, thereby improving the accuracy and reliability of the final evaluation results.

[0021] In a feasible example, the method also includes: displaying multiple first voltage signals, multiple second voltage signals, and multiple ninth voltage signals in the form of curves respectively; and / or displaying multiple third voltage signals, multiple fourth voltage signals, and multiple tenth voltage signals in the form of curves respectively.

[0022] In the present application, by displaying the voltage signal fed back by the infrared receiving tube in the form of a curve, the user can intuitively understand the trend change of the voltage signal, which is conducive to evaluating the quality of the maze component based on the trend change of the voltage signal.

[0023] In a second aspect, the present application provides a maze component testing device, the device comprising:

[0024] An acquisition unit, used for acquiring a plurality of first voltage signals and a plurality of second voltage signals, the plurality of first voltage signals corresponding to the plurality of second voltage signals, the first voltage signals and the corresponding second voltage signals being respectively voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment;

[0025] a processing unit, configured to determine whether the maze assembly has a defect based on the plurality of first voltage signals and the plurality of second voltage signals;

[0026] If it is determined that the maze component does not have defects according to the multiple first voltage signals and the multiple second voltage signals, the acquisition unit is further used to acquire multiple third voltage signals and multiple fourth voltage signals, the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off in a smoky environment;

[0027] The processing unit is further used to determine whether the maze component has defects according to the multiple third voltage signals and the multiple fourth voltage signals.

[0028] In a third aspect, the present application provides an electronic device comprising a processor, a memory, and a communication interface. The processor, the memory, and the communication interface are interconnected and perform communication with each other. The memory stores executable program code, the communication interface is used for wireless communication, and the processor is used to call the executable program code stored in the memory to execute, for example, some or all of the steps described in any method of the first aspect.

[0029] In a fourth aspect, the present application provides a computer-readable storage medium, in which electronic data is stored. When the electronic data is executed by a processor, it is used to execute the electronic data to implement some or all of the steps described in the first aspect of the present application.

[0030] In a fifth aspect, the present application provides a computer program product, including a computer program, which is operable to cause a computer to execute some or all of the steps described in the first aspect of the present application. The computer program product may be a software installation package. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0032] Figure 1 A schematic diagram of the structure of a maze component testing system provided in an embodiment of the present application;

[0033] Figure 2 An example diagram of an application of a maze component testing system provided in an embodiment of the present application;

[0034] Figure 3 A schematic diagram of a flow chart of a maze component testing method provided in an embodiment of the present application;

[0035] Figure 4 A simplified schematic diagram of a pair of tubes provided in an embodiment of the present application;

[0036] Figure 5 A schematic diagram of a voltage signal curve provided in an embodiment of the present application;

[0037] Figure 6 A schematic diagram of the structure of a data display page provided in an embodiment of the present application;

[0038] Figure 7 A block diagram of the functional units of a maze component testing device provided in an embodiment of the present application;

[0039] Figure 8 A block diagram of the functional units of another maze component testing device provided in an embodiment of the present application;

[0040] Fig. 9 A structural block diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0041] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0042] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps is not limited to the listed steps, but optionally includes steps that are not listed, or optionally includes other steps inherent to these processes, methods, products or devices.

[0043] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0044] The prior art involved in this application is described below:

[0045] Maze: A plastic structure used for fire smoke detection, which includes a maze body and a maze cover. After the maze body and the maze cover are assembled and installed, the internal hollow structure constitutes a smoke detection chamber.

[0046] Pair of tubes: Consists of an infrared light emitting tube and an infrared light receiving tube with specific wavelength and luminous power.

[0047] Maze assembly: The maze after installing the pair of tubes.

[0048] MCU: Microcontroller Unit, also known as Single Chip Microcomputer or MCU, is a chip-level computer that appropriately reduces the frequency and specifications of the central processing unit (CPU), and integrates peripheral interfaces such as memory, timer, USB, A / D conversion, UART, PLC, DMA, and even LCD drive circuits on a single chip to form a chip-level computer for different combination controls for different applications.

[0049] The key to smoke alarms is smoke detection, smoke sensitivity is the core indicator, and the maze component is the key hardware foundation of smoke sensitivity and plays a decisive role. Whether its electrical performance parameters meet the standards is directly related to whether the product is qualified. Based on this, this application proposes a test method for the maze component. The following is a detailed description of the system architecture of this application:

[0050] See also Figure 1 , Figure 1 A schematic diagram of the structure of a maze component testing system provided in an embodiment of the present application is shown in FIG. Figure 1 As shown, the maze component testing system 100 includes a host computer 101 , a slave computer 102 and a maze component 103 .

[0051] The host computer 101 generally refers to a higher-level computer device, usually a desktop computer, a server or an embedded computer, etc., which is responsible for controlling and managing the entire system, collecting and processing data, and performing complex algorithms and logical operations. The host computer 101 generally runs a software program written in a high-level language and provides a user-friendly graphical interface so that the user can interact with the system.

[0052] The lower computer 102 usually refers to a lower-level computer device, usually a microcontroller, a single-chip microcomputer, a sensor, etc., which is responsible for performing simple control tasks, collecting sensor data and passing it to the upper computer 101, or executing instructions sent by the upper computer 101. The lower computer 102 usually uses a program written in a low-level language and can directly interact with the hardware.

[0053] In the present application, the host computer 101 sends corresponding instructions to the subordinate computer 102 so that the subordinate computer 102 controls the operation of the infrared emitting tube and the infrared receiving tube in the maze component 103. Specifically, in the process of testing the maze component, the host computer 101 sends a first execution instruction to the subordinate computer 102 so that the subordinate computer 102 controls the opening and closing of the infrared emitting tube in a smoke-free environment, thereby obtaining a plurality of first voltage signals and a plurality of second voltage signals fed back by the infrared receiving tube. The subordinate computer 102 uploads the plurality of first voltage signals and the plurality of second voltage signals to the host computer 101, and the host computer 101 determines whether the maze component has defects according to the plurality of first voltage signals and the plurality of second voltage signals. If it is determined that the maze component does not have defects according to the plurality of first voltage signals and the plurality of second voltage signals, the host computer 101 will also send a second execution instruction to the subordinate computer 102 so that the subordinate computer 102 controls the opening and closing of the infrared emitting tube in a smoke-free environment, thereby obtaining a plurality of third voltage signals and a plurality of fourth voltage signals fed back by the infrared receiving tube. The lower computer 102 sends a plurality of third voltage signals and a plurality of fourth voltage signals to the upper computer 101, and the upper computer 101 finally determines whether the maze component has defects according to the plurality of third voltage signals and the plurality of fourth voltage signals. When the upper computer 101 finally determines that the maze component has no defects, it is determined that the quality of the maze component is qualified.

[0054] It can be seen that in a smoke-free environment, the infrared receiving tube receives the reflected signal of the infrared light emitted by the infrared transmitting tube, thereby determining the corresponding voltage signal. Based on the distribution range of the voltage signal, the performance of the maze component for light reflection can be preliminarily evaluated to determine whether the maze component has defects. Subsequently, the components that are determined to be free of defects are tested in a smoky environment to ensure that their smoke detection capabilities meet the requirements. In this way, the test results in smoke-free and smoke-containing environments are combined to comprehensively evaluate the quality of the maze component, ensure its stability and reliability under various conditions, and thus improve the accuracy of the maze component test results.

[0055] For example, see Figure 2 , Figure 2 An example diagram of an application of a maze component testing system provided in an embodiment of the present application, such as Figure 2As shown, it includes: the lower computer uses a USB cable to connect to the USB port of the upper computer, the DC-DC buck chip realizes the voltage reduction based on the voltage provided by the USB cable, provides the working power to the circuit board of the lower computer, and the USB to serial port chip realizes the serial port communication between the upper computer and the lower computer. The lower computer receives and executes the instructions of the upper computer, samples the working voltage, samples the temperature signal based on the temperature sensor (thermistor), controls the opening and closing of the infrared transmitting tube in the tube circuit of the maze component, and the voltage signal received by the infrared receiving tube is output to the lower computer through the operational amplifier circuit; then the lower computer performs CRC check calculation on the working voltage value, temperature signal value, and voltage signal fed back by the infrared receiving tube according to the instructions of the upper computer, according to the proposed communication protocol and coding rules, and after the check is passed, the above information is sent to the upper computer through the USB to serial port chip. The lower computer will also flash the working indicator LED light cyclically.

[0056] Based on this, an embodiment of the present application provides a maze component testing method, and the embodiment of the present application is described in detail below in conjunction with the accompanying drawings.

[0057] See also Figure 3 , Figure 3 A flow chart of a maze component testing method provided in an embodiment of the present application, the method is applied to the above-mentioned host computer, such as Figure 3 As shown, the method comprises the following steps:

[0058] Step S301, acquiring a plurality of first voltage signals and a plurality of second voltage signals.

[0059] Among them, the multiple first voltage signals correspond to the multiple second voltage signals, and the first voltage signal and the corresponding second voltage signal are respectively the voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment. The multiple first voltage signals are based on the order of magnitude, and the voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on are controlled according to the multiple first current signals. The multiple first current signals are evenly distributed within the preset current range, or the multiple first current signals increase linearly from large to small or from small to large.

[0060] The voltage value obtained by the infrared receiving tube feedback refers to the voltage signal converted into a current signal after the infrared receiving tube receives the corresponding light signal, and then amplified by the operational amplifier circuit.

[0061] For example, see Figure 4 , Figure 4 A simplified schematic diagram of a pair of tubes provided in an embodiment of the present application is shown in FIG. Figure 4 As shown, it includes an infrared emitting tube 401 and an infrared receiving tube 402. When the infrared emitting tube 401 and the infrared receiving tube 402 are on the circuit board, they can be as shown in FIG. Figure 4 Place at the angle shown in .

[0062] Step S302 , determining whether the maze assembly has defects according to the plurality of first voltage signals and the plurality of second voltage signals.

[0063] Among them, multiple second voltage signals can be used to characterize the ambient light noise received by the infrared receiving tube in the current environment, and multiple first voltage signals can be used to characterize the reflection effect of the maze component on infrared rays. According to the multiple first voltage signals and the multiple second voltage signals, it can be determined whether the maze component has defects. For example, if there is a larger second voltage value among the multiple second voltage values, there may be a problem of light leakage. If the multiple first voltage signals are small, there may be a problem of structural deformation or a rough surface. If the multiple first voltage signals are large, there may be a lighter color. Defects are used to characterize that the maze component may have color difference, structural deformation, rough surface and other problems due to defects in the production process.

[0064] The following is a detailed description of the current steps:

[0065] In a feasible embodiment, before determining whether the maze component is defective according to multiple first voltage signals and multiple second voltage signals, the method also includes: training a first classification model according to multiple first training data to obtain a second classification model, the second classification model includes a first classification network and a second classification network, the first classification network is used to output whether the maze component is defective, and the second classification network is used to output the type of defect existing in the maze component, each of the multiple first training data includes multiple first historical voltage data, multiple second historical voltage data, a first classification result and a second classification result, the first classification result includes a classification result of whether there is a defect, and the second classification result includes the type of defect existing; determining whether the maze component is defective according to multiple first voltage signals and multiple second voltage signals includes: inputting the multiple first voltage signals and the multiple second voltage signals into the first classification network in the second classification model to obtain a first output result, and the first output result is used to indicate whether the maze component is defective; if it is determined that the first output result indicates that the maze component is defective, then inputting the multiple first voltage signals and the multiple second voltage signals into the second classification network in the second classification model to obtain a second output result, and the second output result is used to indicate the type of defect existing in the maze component.

[0066] Among them, the first classification network and the second classification network can share the same feature extraction network. It is understandable that multiple first historical voltage data correspond to multiple second historical voltage data. The first historical voltage data and the second historical voltage data are respectively the voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off in a historical smoke-free environment. Furthermore, the multiple first historical voltage signals can also be based on the order of size, and the voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on according to multiple first current signals. It is understandable that if the first classification result in the first training data is that there is no defect, then the second classification result is not included in the current first training data.

[0067] When training is performed on the first classification network in the first classification model, the training is performed based on the multiple first historical voltage data, the multiple second historical voltage data, and the first classification result included in each of the multiple first training data. When training is performed on the second classification network in the first classification model, the training is performed based on the first training data whose first classification result is defective included in the multiple first training data.

[0068] After the trained second classification model is obtained, the multiple first voltage signals and the multiple second voltage signals are input into the first classification network in the second classification model to obtain the result of whether there is a defect. If it is determined that there is a defect, the multiple first voltage signals and the multiple second voltage signals can also be input into the second classification network in the second classification model to obtain the type of defect. The type of defect may include color difference, structural deformation, surface roughness, etc.

[0069] It can be seen that in this application, the trained first classification network can be used to quickly and accurately determine whether the maze component has defects, reducing the possibility of human misjudgment. The second classification network provides detailed fault diagnosis information to help engineers or quality inspectors quickly locate and repair problems, improving the efficiency and accuracy of product quality control.

[0070] In addition, in a feasible embodiment, the opening of the infrared emitting tube is based on the order of size and is controlled according to multiple first current signals, the multiple first current signals are evenly distributed within a preset current range, and the maze component is determined to have defects based on multiple first voltage signals and multiple second voltage signals, including: determining multiple ninth voltage signals based on the difference between the corresponding two voltage signals between the multiple first voltage signals and the multiple second voltage signals; determining a first number of ninth voltage signals in the multiple ninth voltage signals that are in the corresponding preset voltage range; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is greater than the preset ratio, and the multiple ninth voltage signals have a linear relationship in the acquisition time, it is determined that the maze component has no defects; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is not greater than the preset ratio, or the multiple ninth voltage signals have no linear relationship in the acquisition time, it is determined that the maze component has defects.

[0071] Among them, for the control of the infrared light-emitting tube, these current signals can be applied in order from small to large to gradually increase the luminous intensity of the infrared emitting tube, or these current signals can be applied in order from large to small to gradually reduce the luminous intensity of the infrared emitting tube. For the difference between the two corresponding voltage signals between the multiple first voltage signals and the multiple second voltage signals, the voltage signal after eliminating the environmental noise can be determined. The preset voltage range corresponding to each ninth voltage signal can be determined according to the first current signal of the control of the infrared light-emitting tube corresponding to the first voltage signal corresponding to each ninth voltage signal. Specifically, it can be determined based on the first current signal and the empirical value.

[0072] Then, a first number of each ninth voltage signal in the plurality of ninth voltage signals is determined to be within a preset voltage range corresponding to each ninth voltage signal, and a ratio between the first number and the number of the plurality of ninth voltage signals is determined, and a linear relationship exists between the plurality of ninth voltage signals in terms of acquisition time. It can be understood that if it is determined that each ninth voltage signal is within the preset voltage range corresponding to each ninth voltage signal, then it can be determined that the light reflection effect of the maze component is good, which means that the internal structure of the maze component has no obvious deformation, light leakage or other defects that affect the reflection characteristics.

[0073] Since the control current of the infrared light-emitting tube is evenly distributed, and the multiple first currents control the infrared light-emitting tube based on the order of size, it can also be said that there is a linear relationship between the multiple first currents, so the light intensity of the infrared light-emitting tube also has a linear relationship. When the quality of the maze component is good (for example, the smoothness and structural design of the internal surface of the maze component are good, and it can evenly reflect light without abnormal reflection due to material unevenness or structural variation), the intensity of the light signal received by the infrared receiving tube is also linear in the case of the receiving order. Therefore, if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is not greater than the preset ratio, or there is no linear relationship between the multiple ninth voltage signals in the acquisition time, it is determined that the maze component is defective. If it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is not greater than the preset ratio, or there is a linear relationship between the multiple ninth voltage signals in the acquisition time, it is determined that the maze component is defective.

[0074] It can be understood that the acquisition time corresponding to the plurality of ninth voltage signals refers to the acquisition time of the plurality of first voltage signals corresponding to the plurality of ninth voltage signals. Generally, the control frequency for the infrared emitting tube is fixed. The acquisition time corresponding to the plurality of ninth voltage signals can also be determined according to the acquisition order of the plurality of first voltage signals corresponding to the plurality of ninth voltage signals.

[0075] It can be seen that in the present application, by calculating the difference between the first voltage signal and the second voltage signal, the influence of background noise can be eliminated, focusing on the voltage change caused by infrared emission, so as to more accurately evaluate the performance of the maze component. And by counting the number of ninth voltage signals within the preset voltage range and evaluating whether there is a linear relationship between the plurality of ninth voltage signals in the acquisition time, it can be determined whether the maze component has defects.

[0076] Further, in a feasible embodiment, after determining that each of the plurality of ninth voltage signals is in a first number of the preset voltage ranges corresponding to each of the ninth voltage signals, the method further includes: fitting the plurality of ninth voltage signals according to a linear regression model and the acquisition time of the plurality of ninth voltage signals corresponding to the first voltage signal, and determining a fitting straight line and a coefficient of determination between the plurality of ninth voltage signals and the fitting straight line; determining a standard deviation of residuals between the plurality of ninth voltage signals and the plurality of data values ​​respectively corresponding to the plurality of ninth voltage signals in the fitting straight line; if it is determined that the coefficient of determination is greater than a first preset threshold value, and the standard deviation of the residuals is less than a second preset threshold value, then it is determined that the plurality of ninth voltage signals have a linear relationship in acquisition time; if it is determined that the coefficient of determination is not greater than the first preset threshold value, and the standard deviation of the residuals is not less than the second preset threshold value, then it is determined that the plurality of ninth voltage signals do not have a linear relationship in acquisition time.

[0077] Among them, a linear regression model is used to fit the ninth voltage signal to obtain a best fitting straight line, which can be a function corresponding to a fitted straight line, and the determination coefficient between multiple ninth voltage signals and the fitted straight lines is calculated. Linear regression model (Linear Regression Model) is a statistical method used to establish a linear relationship between a dependent variable (ninth voltage signal) and one or more independent variables (such as current intensity). The fitted line (Fitted Line) is the best fitting straight line calculated by the linear regression model, which represents the trend of changes in the ninth voltage signal. Coefficient of Determination (Coefficient of Determination, R 2 ) is a statistic used to measure the degree of fit between the fitted line and the actual data points. The value range is 0 to 1, and the larger the value, the better the fit.

[0078] Then, the difference (residual) between each ninth voltage signal and the predicted value on the corresponding fitting straight line is calculated, and the standard deviation of all residuals is calculated to evaluate the dispersion degree of the data points around the fitting straight line. Finally, it is determined whether there is a linear relationship between the plurality of ninth voltage signals in the acquisition time according to the size of the determination coefficient and the standard deviation of the residuals. If it is determined that the determination coefficient is greater than the first preset threshold value, and the standard deviation of the residuals is less than the second preset threshold value, it is determined that there is a linear relationship between the plurality of ninth voltage signals in the acquisition time; if it is determined that the determination coefficient is not greater than the first preset threshold value, and the standard deviation of the residuals is not less than the second preset threshold value, it is determined that there is no linear relationship between the plurality of ninth voltage signals in the acquisition time. The first preset threshold value and the second preset threshold value can be determined according to empirical values.

[0079] In this application, a quantitative evaluation index is provided through a linear regression model and residual analysis, thereby improving the accuracy of judgment.

[0080] Step S303: if it is determined that the maze component has no defects according to the plurality of first voltage signals and the plurality of second voltage signals, a plurality of third voltage signals and a plurality of fourth voltage signals are obtained.

[0081] Among them, the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively the voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoky environment. Further, the multiple third voltage signals and the corresponding fourth voltage signals are respectively the voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off under multiple smoke concentrations, and the multiple smoke concentrations can also be evenly distributed within a preset smoke concentration range.

[0082] Step S304 , determining whether the maze assembly has defects according to the plurality of third voltage signals and the plurality of fourth voltage signals.

[0083] Among them, the defect refers to the problem that the maze component cannot correctly detect smoke in a smoky environment, which may be caused by design defects, manufacturing process problems or other factors.

[0084] The following is a detailed description of the current steps:

[0085] In a feasible embodiment, the plurality of third voltage signals and the corresponding plurality of fourth voltage signals are respectively the voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off under a plurality of different smoke concentrations, and determining whether the maze component is defective according to the plurality of third voltage signals and the plurality of fourth voltage signals includes: determining a plurality of tenth voltage signals according to the difference between the corresponding two voltage signals between the plurality of third voltage signals and the plurality of fourth voltage signals; determining at least one eleventh voltage signal and at least one twelfth voltage signal among the plurality of tenth voltage signals, the third voltage signal and the fourth voltage signal corresponding to the eleventh voltage signal being the infrared receiving tube when the infrared transmitting tube is turned on and off under a smoke concentration greater than a preset smoke concentration. The third voltage signal and the fourth voltage signal corresponding to the twelfth voltage signal are the voltage values ​​fed back by the infrared receiving tube when the infrared emitting tube is turned on and off under a smoke concentration not greater than the preset smoke concentration; if it is determined that at least one eleventh voltage signal is not less than the first preset voltage signal, and at least one twelfth voltage signal is less than the second preset voltage signal, it is determined that the maze component is not defective; if it is determined that there is a voltage signal less than the first preset voltage signal in at least one eleventh voltage signal, or there is a voltage signal not less than the second preset voltage signal in at least one twelfth voltage signal, it is determined that the maze component is defective and the first preset voltage signal is not greater than the second preset voltage signal.

[0086] Among them, the multiple third voltage signals and the multiple fourth voltage signals are the voltage signals fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off based on a fixed current value under different smoke concentrations. The smoke concentration is used to represent the number or density of smoke particles in the air and is used to simulate different working environments. Similarly, calculating the difference between the corresponding two voltage signals between the multiple third voltage signals and the multiple fourth voltage signals can eliminate the influence of background noise and focus on the voltage changes caused by infrared emission, thereby more accurately evaluating the performance of the maze component.

[0087] Then, the plurality of tenth voltage signals are divided into at least one eleventh voltage signal at a smoke concentration greater than a preset smoke concentration, and a twelfth voltage signal at a smoke concentration not greater than the preset smoke concentration. The preset smoke concentration may be a standard smoke concentration threshold value set according to an empirical value, which is used to distinguish between high-concentration and low-concentration environments. Similarly, the preset smoke concentration may also be the smoke triggering concentration corresponding to the smoke alarm in actual applications. Finally, if it is determined that at least one eleventh voltage signal is not less than the first preset voltage signal, and at least one twelfth voltage signal is less than the second preset voltage signal, it is determined that the maze component is not defective. If it is determined that there is a voltage signal less than the first preset voltage signal in at least one eleventh voltage signal, or there is a voltage signal not less than the second preset voltage signal in at least one twelfth voltage signal, it is determined that the maze component is defective.

[0088] The reason why the first preset voltage signal is not greater than the second preset voltage signal is that the smoke alarm should be triggered in a timely manner. Therefore, the reference preset voltage signal under low concentration may not be less than the reference preset voltage signal under high concentration, but the difference between the first preset voltage signal and the second preset voltage signal should not be too large.

[0089] In this application, the tenth voltage signal is divided into two categories: high-concentration smoke (eleventh voltage signal) and low-concentration smoke (twelfth voltage signal), and the response characteristics under different concentrations are evaluated respectively. In this way, the maze components that do not meet the quality standards can be effectively identified, ensuring that they can reliably detect smoke in practical applications.

[0090] In addition, in a feasible embodiment, before determining whether the maze component is defective based on multiple first voltage signals and multiple second voltage signals, the method also includes: obtaining multiple fifth voltage signals and multiple first temperature signals, the fifth voltage signal is the working voltage signal of the lower computer when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal is the ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off; determining a sixth voltage signal that is not within a preset working voltage range among the multiple fifth voltage signals; determining a second temperature signal that is not within a preset temperature range among the multiple first temperature signals; and eliminating the voltage signals corresponding to the sixth voltage signal and the second temperature signal among the multiple first voltage signals and the multiple second voltage signals.

[0091] Among them, since the fifth voltage signal is the working voltage signal when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal is the ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off, each of the multiple first voltage signals and the multiple second voltage signals has a corresponding fifth voltage signal, and each of the multiple first voltage signals and the multiple second voltage signals has a corresponding first temperature signal. It can be understood that the preset working voltage range can be a reasonable voltage interval set according to empirical values ​​to ensure that the lower computer works within a normal range, and the preset temperature range can also be a reasonable temperature interval set according to empirical values ​​to ensure that the test environment temperature is within a controllable range.

[0092] When the fifth voltage signal is not within the preset operating voltage range, the first voltage signal or the second voltage signal corresponding to the fifth voltage signal may be abnormal data caused by unstable operation of the lower computer. And because the temperature data will affect the performance of the infrared transmitting tube and the infrared receiving tube. When the first temperature signal is not within the preset temperature range, the first voltage signal or the second voltage signal corresponding to the first temperature signal may be abnormal data caused by abnormal ambient temperature. Therefore, it is necessary to eliminate the voltage signal corresponding to the sixth voltage signal and the second temperature signal from the multiple first voltage signals and the multiple second voltage signals.

[0093] It can be understood that the current step can also be applied before determining whether the maze component is defective based on multiple third voltage signals and multiple fourth voltage signals. Specifically, multiple fifth voltage signals and multiple first temperature signals are obtained, the fifth voltage signal is the working voltage signal of the lower computer when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal is the ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off; determine the sixth voltage signal that is not within the preset working voltage range among the multiple fifth voltage signals; determine the second temperature signal that is not within the preset temperature range among the multiple first temperature signals; and eliminate the voltage signals corresponding to the sixth voltage signal and the second temperature signal among the multiple third voltage signals and the multiple fourth voltage signals.

[0094] In the present application, by eliminating invalid voltage signals, abnormal data caused by external factors (such as power supply fluctuations or temperature changes) are eliminated, thereby improving the accuracy and reliability of the final evaluation results.

[0095] In addition, in a feasible embodiment, the method also includes: displaying multiple first voltage signals, multiple second voltage signals, and multiple ninth voltage signals in the form of curves; and / or displaying multiple third voltage signals, multiple fourth voltage signals, and multiple tenth voltage signals in the form of curves.

[0096] Among them, after receiving data such as multiple first voltage signals, multiple second voltage signals, and calculating multiple ninth voltage signals, the upper computer can use drawing software to display multiple first voltage signals, multiple second voltage signals, and multiple ninth voltage signals in the form of curves. That is, the aforementioned three voltage signals can be displayed on a graph, so that the value change curve and trend can be displayed in real time. The horizontal axis can correspond to the control current of the infrared emitting tube, and the vertical axis corresponds to the voltage signal. For the curve display of multiple third voltage signals, multiple fourth voltage signals, and multiple tenth voltage signals, the horizontal axis can be the corresponding smoke concentration, and the vertical axis corresponds to the voltage signal.

[0097] In the present application, by displaying the voltage signal fed back by the infrared receiving tube in the form of a curve, the user can intuitively understand the trend change of the voltage signal, which is conducive to evaluating the quality of the maze component based on the trend change of the voltage signal.

[0098] For example, see Figure 5 , Figure 5 A schematic diagram of a voltage signal curve provided in an embodiment of the present application, such as Figure 5 As shown, a curve graph of voltage signals of a maze component test in a smoke-free environment includes a first voltage signal, a second voltage signal and a ninth voltage signal. The horizontal axis corresponding to the curve graph is the control current of the infrared emitting tube, and the vertical axis corresponds to the voltage signal.

[0099] In addition, the corresponding detailed data can be displayed to the user. For example, please refer to Figure 6 , Figure 6 A schematic diagram of a data display page structure provided in an embodiment of the present application, such as Figure 6 As shown, it includes serial number, data type, working voltage, temperature, feedback voltage and time. The data type refers to the voltage signal obtained when the infrared transmitting tube is turned on or off, the working voltage refers to the working voltage of the lower computer, the temperature refers to the test environment temperature of the maze component, and the feedback voltage refers to the voltage fed back by the infrared receiving tube.

[0100] It can be seen that in the embodiment of the present application, in a smoke-free environment, the infrared receiving tube receives the reflected signal of the infrared emitted by the infrared transmitting tube, thereby determining the corresponding voltage signal. Based on the distribution range of the voltage signal, a preliminary performance test of the maze component for light reflection can be conducted to determine whether the maze component has defects. Subsequently, for the components that are determined to be free of defects, they are tested in a smoky environment to ensure that their smoke detection capabilities meet the requirements. In this way, the quality of the maze component is comprehensively evaluated by combining the test results in smoke-free and smoke-containing environments to ensure its stability and reliability under various conditions, thereby improving the accuracy of the maze component test results.

[0101] In accordance with the above-mentioned embodiments, please refer to Figure 7 , Figure 7 This is a functional unit block diagram of a maze component testing device provided in an embodiment of the present application. The maze component testing device is the above-mentioned host computer or a part of the host computer, such as Figure 7 As shown, the maze assembly testing device 70 includes:

[0102] An acquisition unit 701 is used to acquire a plurality of first voltage signals and a plurality of second voltage signals, wherein the plurality of first voltage signals correspond to the plurality of second voltage signals, and the first voltage signals and the corresponding second voltage signals are respectively voltage values ​​obtained by the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment;

[0103] A processing unit 702, configured to determine whether the maze component has a defect according to the plurality of first voltage signals and the plurality of second voltage signals;

[0104] If it is determined that the maze component does not have defects according to the multiple first voltage signals and the multiple second voltage signals, the acquisition unit 701 is further used to acquire multiple third voltage signals and multiple fourth voltage signals, the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off in a smoky environment;

[0105] The processing unit 702 is further configured to determine whether the maze component has defects according to the plurality of third voltage signals and the plurality of fourth voltage signals.

[0106] In a feasible embodiment, the processing unit 702 is also used to: train the first classification model according to multiple first training data to obtain a second classification model, the second classification model includes a first classification network and a second classification network, the first classification network is used to output whether the maze component has a defect, and the second classification network is used to output the type of defect in the maze component, each of the multiple first training data includes multiple first historical voltage data, multiple second historical voltage data, a first classification result and a second classification result, the first classification result includes a classification result of whether there is a defect, and the second classification result includes the type of defect; in terms of determining whether the maze component has a defect according to multiple first voltage signals and multiple second voltage signals, the processing unit 702 is specifically used to: input the multiple first voltage signals and the multiple second voltage signals into the first classification network in the second classification model to obtain a first output result, and the first output result is used to indicate whether the maze component has a defect; if it is determined that the first output result indicates that the maze component has a defect, the multiple first voltage signals and the multiple second voltage signals are input into the second classification network in the second classification model to obtain a second output result, and the second output result is used to indicate the type of defect in the maze component.

[0107] In a feasible embodiment, the opening of the infrared emitting tube is based on the order of size and is controlled according to multiple first current signals, and the multiple first current signals are evenly distributed within a preset current range. In terms of determining whether the maze component is defective based on multiple first voltage signals and multiple second voltage signals, the processing unit 702 is specifically used to: determine multiple ninth voltage signals based on the difference between the corresponding two voltage signals between the multiple first voltage signals and the multiple second voltage signals; determine a first number of ninth voltage signals in the multiple ninth voltage signals that are in the corresponding preset voltage range; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is greater than the preset ratio, and the multiple ninth voltage signals have a linear relationship in the acquisition time, then it is determined that the maze component is not defective; if it is determined that the ratio between the first number and the number of the multiple ninth voltage signals is not greater than the preset ratio, or the multiple ninth voltage signals do not have a linear relationship in the acquisition time, then it is determined that the maze component is defective.

[0108] In a feasible embodiment, the processing unit 702 is also used to: fit the multiple ninth voltage signals according to the linear regression model and the acquisition time of the multiple ninth voltage signals corresponding to the first voltage signal, and determine the fitting straight line and the determination coefficient between the multiple ninth voltage signals and the fitting straight line; determine the standard deviation of the residuals between the multiple ninth voltage signals and the multiple data values ​​according to the multiple ninth voltage signals and the multiple data values ​​in the fitting straight line that respectively correspond to the multiple ninth voltage signals; if it is determined that the determination coefficient is greater than the first preset threshold and the standard deviation of the residuals is less than the second preset threshold, it is determined that the multiple ninth voltage signals have a linear relationship in the acquisition time; if it is determined that the determination coefficient is not greater than the first preset threshold and the standard deviation of the residuals is not less than the second preset threshold, it is determined that the multiple ninth voltage signals do not have a linear relationship in the acquisition time.

[0109] In a feasible embodiment, the multiple third voltage signals and the corresponding multiple fourth voltage signals are respectively the voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off under multiple smoke concentrations. In terms of determining whether the maze component is defective based on the multiple third voltage signals and the multiple fourth voltage signals, the processing unit 702 is specifically used to: determine multiple tenth voltage signals based on the difference between the corresponding two voltage signals between the multiple third voltage signals and the multiple fourth voltage signals; determine at least one eleventh voltage signal and at least one twelfth voltage signal among the multiple tenth voltage signals, and the third voltage signal and the fourth voltage signal corresponding to the eleventh voltage signal are when the infrared transmitting tube is turned on under a smoke concentration greater than a preset smoke concentration. and closed, the third voltage signal and the fourth voltage signal corresponding to the twelfth voltage signal are the voltage values ​​fed back by the infrared receiving tube when the infrared emitting tube is turned on and off under a smoke concentration not greater than the preset smoke concentration; if it is determined that at least one eleventh voltage signal is not less than the first preset voltage signal, and at least one twelfth voltage signal is less than the second preset voltage signal, it is determined that the maze component is not defective; if it is determined that there is a voltage signal less than the first preset voltage signal in at least one eleventh voltage signal, or there is a voltage signal not less than the second preset voltage signal in at least one twelfth voltage signal, it is determined that the maze component is defective and the first preset voltage signal is not greater than the second preset voltage signal.

[0110] In a feasible embodiment, the acquisition unit 701 is also used to: acquire multiple fifth voltage signals and multiple first temperature signals, the fifth voltage signal is the working voltage signal of the lower computer when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal is the ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off; the processing unit 702 is also used to determine the sixth voltage signal that is not within the preset working voltage range among the multiple fifth voltage signals; determine the second temperature signal that is not within the preset temperature range among the multiple first temperature signals; and eliminate the voltage signals corresponding to the sixth voltage signal and the second temperature signal among the multiple first voltage signals and the multiple second voltage signals.

[0111] In a feasible embodiment, the processing unit 702 is also used to: display multiple first voltage signals, multiple second voltage signals and multiple ninth voltage signals in the form of curves; and / or display multiple third voltage signals, multiple fourth voltage signals and multiple tenth voltage signals in the form of curves.

[0112] It can be understood that since the method embodiment and the device embodiment are different presentation forms of the same technical concept, the content of the method embodiment part in this application should be synchronously adapted to the device embodiment part and will not be repeated here.

[0113] In the case of integrated units, such as Figure 8 As shown, Figure 8 This is a block diagram of the functional units of another maze component testing device provided in an embodiment of the present application. Figure 8 In the embodiment, the maze component testing device 70 includes: a processing module 812 and a communication module 811. The processing module 812 is used to control and manage the actions of the maze component testing device 70, for example, the steps of the processing unit 702, and / or other processes for executing the technology described herein. The communication module 811 is used to support the interaction between the maze component testing device 70 and other devices (such as a lower host computer), for example, the steps of the acquisition unit 701. Figure 8 As shown, the maze component testing device 70 may further include a storage module 813 , and the storage module 813 is used to store program codes and data of the maze component testing device 70 .

[0114] Among them, the processing module 812 can be a processor or a controller, for example, a central processing unit (CPU), a general processor, a digital signal processor (DSP), an ASIC, an FPGA or other programmable logic device, a transistor logic device, a hardware component or any combination thereof. It can implement or execute various exemplary logic blocks, modules and circuits described in conjunction with the disclosure of this application. The processor can also be a combination that implements a computing function, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, and the like. The communication module 811 can be a transceiver, an RF circuit or a communication interface, and the like. The storage module 813 can be a memory.

[0115] Among them, all relevant contents of each scenario involved in the above method embodiment can be referred to the functional description of the corresponding functional module, and will not be repeated here. The above maze component testing device 70 can execute the above Figure 2 The maze assembly testing method shown.

[0116] The above embodiments can be implemented in whole or in part by software, hardware, firmware or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When a computer instruction or computer program is loaded or executed on a computer, a process or function according to an embodiment of the present application is generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. Computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, computer instructions can be transmitted from one website site, computer, server or data center to another website site, computer, server or data center by wired or wireless means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center containing one or more available media sets. The available medium can be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium. The semiconductor medium can be a solid-state hard disk.

[0117] Fig. 9 This is a structural block diagram of an electronic device provided in an embodiment of the present application. Fig. 9 As shown, the electronic device 900 may include one or more of the following components: a processor 901, a memory 902 and a communication interface 903. The processor 901, the memory 902 and the communication interface 903 are interconnected and perform communication work with each other, wherein the memory 902 may store one or more computer programs, and the one or more computer programs may be configured to implement the methods described in the above embodiments when executed by one or more processors 901.

[0118] The processor 901 may include one or more processing cores. The processor 901 uses various interfaces and lines to connect the various parts of the entire electronic device 900, and executes various functions and processes data of the electronic device 900 by running or executing instructions, programs, code sets or instruction sets stored in the memory 902, and calling data stored in the memory 902. Optionally, the processor 901 can be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 901 can integrate one or more combinations of a central processing unit (Central Processing Unit, CPU), an image processor (Graphics Processing Unit, GPU) and a modem. It is understandable that the above-mentioned modem may not be integrated into the processor 901, and may be implemented separately through a communication chip.

[0119] The memory 902 may include a random access memory (RAM) or a read-only memory (ROM). The memory 902 may be used to store instructions, programs, codes, code sets or instruction sets. The memory 902 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for implementing at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc. The data storage area may also store data created by the electronic device 900 during use, etc.

[0120] It is understandable that the electronic device 900 may include more or fewer structural elements than those in the above structural block diagram, for example, a power module, physical buttons, a WiFi (Wireless Fidelity) module, a speaker, a Bluetooth module, a sensor, etc., which are not limited here.

[0121] The electronic device 900 may be a host computer or a part of the host computer.

[0122] An embodiment of the present application provides a computer-readable storage medium, wherein program data is stored in the computer-readable storage medium. When the program data is executed by a processor, it is used to execute part or all of the steps of any maze component testing method recorded in the above method embodiments.

[0123] The present application also provides a computer program product, including a computer program, which can be operated to enable a computer to execute some or all steps of any maze component testing method described in the above method embodiment. The computer program product can be a software installation package.

[0124] It should be noted that, for the sake of simplicity, for any of the aforementioned method embodiments of the maze component testing method, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the present application is not limited by the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions involved are not necessarily required by the present application.

[0125] Although the present application is described herein in conjunction with various embodiments, in the process of implementing the claimed application, those skilled in the art may understand and implement other variations of the disclosed embodiments by viewing the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "a" or "one" does not exclude multiple situations. Certain measures are recorded in different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

[0126] A person skilled in the art can understand that all or part of the steps in the various methods of any of the above-mentioned maze component testing method embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable memory, and the memory can include: a flash drive, a read-only memory (English: Read-Only Memory, abbreviated as: ROM), a random access memory (English: Random Access Memory, abbreviated as: RAM), a disk or an optical disk, etc.

[0127] The above is a detailed introduction to the embodiments of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of a maze component testing method, device, electronic device and storage medium of the present application. The description of the above embodiments is only used to help understand the method of the present application and its core idea; at the same time, for general technical personnel in this field, based on the idea of ​​a maze component testing method, device, electronic device and storage medium of the present application, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as a limitation on the present application.

[0128] The present application is described with reference to the flowcharts and / or block diagrams of the methods, hardware products, and computer program products of the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0129] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0130] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0131] It can be understood that any product that is controlled or configured to execute the processing method of the flowchart described in the method embodiment of a maze component testing method of the present application, such as the terminal and computer program product in the above flowchart, falls within the scope of the related products described in the present application.

[0132] Obviously, those skilled in the art can make various changes and modifications to the maze component testing method, device, electronic device and storage medium provided by the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.

Claims

1. A maze component testing method, characterized in that: The method is applied to a host computer in a maze test system, wherein the maze test system further comprises a slave computer, wherein the slave computer is connected to an infrared transmitting tube and an infrared receiving tube in a maze component, and the method comprises: Acquire a plurality of first voltage signals and a plurality of second voltage signals, wherein the plurality of first voltage signals correspond to the plurality of second voltage signals, and the first voltage signal and the corresponding second voltage signal are respectively voltage values ​​obtained by feedback from the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment; determining whether the maze assembly is defective based on the plurality of first voltage signals and the plurality of second voltage signals; If it is determined that the maze assembly does not have defects according to the multiple first voltage signals and the multiple second voltage signals, multiple third voltage signals and multiple fourth voltage signals are obtained, wherein the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off in a smoky environment; It is determined whether the maze assembly is defective based on the plurality of third voltage signals and the plurality of fourth voltage signals.

2. The method according to claim 1, characterized in that Before determining whether the maze assembly is defective according to the plurality of first voltage signals and the plurality of second voltage signals, the method further includes: The first classification model is trained according to a plurality of first training data to obtain a second classification model, wherein the second classification model includes a first classification network and a second classification network, the first classification network is used to output whether the maze component has a defect, and the second classification network is used to output the type of defect of the maze component, each of the plurality of first training data includes a plurality of first historical voltage data, a plurality of second historical voltage data, a first classification result and a second classification result, the first classification result includes a classification result of whether a defect exists, and the second classification result includes a type of defect; The determining whether the maze component has a defect according to the plurality of first voltage signals and the plurality of second voltage signals comprises: Inputting the plurality of first voltage signals and the plurality of second voltage signals into a first classification network in the second classification model to obtain a first output result, wherein the first output result is used to indicate whether the maze component has a defect; If it is determined that the first output result indicates that the maze component is defective, the multiple first voltage signals and the multiple second voltage signals are input into the second classification network in the second classification model to obtain a second output result, and the second output result is used to indicate the type of defect in the maze component.

3. The method according to claim 1, characterized in that The opening of the infrared emitting tube is controlled by a plurality of first current signals, and the plurality of first current signals are evenly distributed within a preset current range. The method of determining whether the maze component has a defect according to the plurality of first voltage signals and the plurality of second voltage signals includes: Determine a plurality of ninth voltage signals according to differences between corresponding two voltage signals between the plurality of first voltage signals and the plurality of second voltage signals; Determining a first number of ninth voltage signals in the plurality of ninth voltage signals that are within a corresponding preset voltage range; If it is determined that the ratio between the first number and the number of the plurality of ninth voltage signals is greater than a preset ratio, and the plurality of ninth voltage signals have a linear relationship in acquisition time, it is determined that the maze component has no defects; If it is determined that the ratio between the first number and the number of the plurality of ninth voltage signals is not greater than the preset ratio, or the plurality of ninth voltage signals do not have a linear relationship in acquisition time, it is determined that the maze component has a defect.

4. The method according to claim 3, characterized in that After determining that each of the plurality of ninth voltage signals is within a first quantity of a preset voltage range corresponding to each of the ninth voltage signals, the method further includes: Fitting the plurality of ninth voltage signals according to a linear regression model and acquisition times of the plurality of ninth voltage signals corresponding to the first voltage signal to determine a fitting straight line and a determination coefficient between the plurality of ninth voltage signals and the fitting straight line; Determine, according to the plurality of ninth voltage signals and a plurality of data values ​​in the fitting straight line that respectively correspond to the plurality of ninth voltage signals, a standard deviation of residuals between the plurality of ninth voltage signals and the plurality of data values; If it is determined that the determination coefficient is greater than a first preset threshold value, and the standard deviation of the residual is less than a second preset threshold value, it is determined that the plurality of ninth voltage signals have a linear relationship in acquisition time; If it is determined that the determination coefficient is not greater than the first preset threshold, and the standard deviation of the residual is not less than the second preset threshold, it is determined that the plurality of ninth voltage signals do not have a linear relationship in acquisition time.

5. The method according to claim 1, characterized in that The plurality of third voltage signals and the corresponding plurality of fourth voltage signals are respectively voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off under a plurality of different smoke concentrations, and determining whether the maze component has a defect according to the plurality of third voltage signals and the plurality of fourth voltage signals includes: Determine a plurality of tenth voltage signals according to differences between corresponding two voltage signals between the plurality of third voltage signals and the plurality of fourth voltage signals; Determine at least one eleventh voltage signal and at least one twelfth voltage signal among the plurality of tenth voltage signals, wherein the third voltage signal and the fourth voltage signal corresponding to the eleventh voltage signal are voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off under a smoke concentration greater than a preset smoke concentration, and the third voltage signal and the fourth voltage signal corresponding to the twelfth voltage signal are voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off under a smoke concentration not greater than the preset smoke concentration; If it is determined that the at least one eleventh voltage signal is not less than the first preset voltage signal, and the at least one twelfth voltage signal is less than the second preset voltage signal, it is determined that the maze assembly has no defects; If it is determined that there is a voltage signal less than the first preset voltage signal in the at least one eleventh voltage signal, or if there is a voltage signal not less than the second preset voltage signal in the at least one twelfth voltage signal, then it is determined that the maze assembly is defective and the first preset voltage signal is not greater than the second preset voltage signal.

6. The method according to any one of claims 1 to 5, characterized in that: Before determining whether the maze assembly is defective according to the plurality of first voltage signals and the plurality of second voltage signals, the method further includes: Acquire multiple fifth voltage signals and multiple first temperature signals, wherein the fifth voltage signal is a working voltage signal of the lower computer when the lower computer controls the infrared emitting tube to be turned on and off, and the first temperature signal is an ambient temperature signal of the maze component when the lower computer controls the infrared emitting tube to be turned on and off; Determining a sixth voltage signal among the plurality of fifth voltage signals that is not within a preset operating voltage range; Determine a second temperature signal among the plurality of first temperature signals that is not within a preset temperature range; The voltage signals corresponding to the sixth voltage signal and the second temperature signal are eliminated from the plurality of first voltage signals and the plurality of second voltage signals.

7. The method according to claim 4 or 5, characterized in that: The method further comprises: Displaying the plurality of first voltage signals, the plurality of second voltage signals, and the plurality of ninth voltage signals in the form of curves respectively; and / or The plurality of third voltage signals, the plurality of fourth voltage signals, and the plurality of tenth voltage signals are respectively displayed in the form of curves.

8. A maze component testing device, characterized in that: The device comprises: An acquisition unit, used for acquiring a plurality of first voltage signals and a plurality of second voltage signals, wherein the plurality of first voltage signals correspond to the plurality of second voltage signals, and the first voltage signal and the corresponding second voltage signal are respectively voltage values ​​fed back by the infrared receiving tube when the infrared transmitting tube is turned on and off in a smoke-free environment; a processing unit, configured to determine whether the maze assembly has a defect based on the plurality of first voltage signals and the plurality of second voltage signals; If it is determined that the maze component does not have the defect according to the multiple first voltage signals and the multiple second voltage signals, the acquisition unit is further used to acquire multiple third voltage signals and multiple fourth voltage signals, the multiple third voltage signals correspond to the multiple fourth voltage signals, and the third voltage signals and the corresponding fourth voltage signals are respectively voltage values ​​obtained by the infrared receiving tube feedback when the infrared transmitting tube is turned on and off in a smoky environment; The processing unit is further used to determine whether the maze component has defects according to the multiple third voltage signals and the multiple fourth voltage signals.

9. An electronic device, comprising a processor, a memory, and a computer program stored in the memory, characterized in that: The processor is used to call the executable program code computer program stored in the memory to execute the method according to any one of claims 1-7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

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