Information management system of memory chip

Abstract

The invention discloses an information management system for a storage chip, and the system comprises at least one information collection module which is disposed at a corresponding testing position, and is used for carrying out the information collection of an identity recognition code on the surface of a to-be-tested chip, so as to obtain collection data; and at least one test module, each test module is provided with a corresponding information acquisition module, and is used for obtaining identity information of the to-be-tested chip from the acquisition data, executing a test task on the to-be-tested chip moved to the test position, obtaining test information, and storing the test information in a test log, the test information at least comprises a test process and a test result of the to-be-tested chip; and the test upper computer communicates with the at least one test module and is used for acquiring test information from each test module and displaying the test information. The invention discloses an information management system of a storage chip, which can realize updating and comprehensive recording of product information.

Description

Technical Field

[0001] The present application relates to the field of storage technology, and in particular to an information management system for storage chips. Background Art

[0002] Currently, many storage products use laser technology to mark unique codes, barcodes or QR codes on the surface of products during the production process to achieve basic tracking of products. However, the limitation of this method is that the amount of information that a barcode or QR code can carry is extremely limited, and it is impossible to record in detail key data such as product test results (good / bad products), test process, test progress, batch number, grade information, etc. This not only limits the refinement of production management, but also increases the workload of manual recording and verification, affecting production efficiency and cost control. Therefore, it is necessary to solve the problem of automatic update of storage product information and comprehensive recording of product details. Summary of the invention

[0003] The purpose of this application is to provide an information management system for a storage chip, aiming to solve the problem of automatic updating of storage chip information and comprehensive recording of product detailed information.

[0004] A technical solution disclosed in the present application is: an information management system for a storage chip, comprising:

[0005] At least one information collection module, each of which is deployed at a corresponding test position and is used to collect information about the identity code on the surface of the chip to be tested to obtain collected data;

[0006] At least one test module, each of which is provided with a corresponding information acquisition module, for acquiring the identity information of the chip to be tested from the acquired data, and performing a test task on the chip to be tested moved to the test position, obtaining test information and storing it in a test log, wherein the test information includes at least a test process and a test result of the chip to be tested;

[0007] The test host computer communicates with the at least one test module and is used to obtain and display test information from each of the test modules.

[0008] Preferably, the test module comprises: a test board, wherein the test board is provided with a data processing module and a test execution module;

[0009] The data processing module communicates with the information collection module, and is used to obtain the identity information from the collected data, and generate a test instruction based on the identity information;

[0010] The test execution module is connected to the data processing module and the chip to be tested moved to the test position, and is used to receive the test instruction sent by the data processing module and control the chip to be tested to execute the test task based on the test instruction.

[0011] Preferably, the data processing module is also used for:

[0012] After all test stations have completed the test tasks, the complete test information of the chip to be tested is collected;

[0013] The complete test information is updated to the test log corresponding to the chip to be tested.

[0014] Preferably, a cloud server is also included, and the data processing module is further used to upload the product information together with the updated test log to the cloud server in real time.

[0015] Preferably, the data processing module is further configured to resend an acquisition instruction to the information collection module when the acquisition of the identity information fails;

[0016] The information collection module is further used to obtain the collected data for a second time according to the re-received acquisition instruction.

[0017] Preferably, the data processing module comprises: a microprocessor and a data register;

[0018] The microprocessor communicates with the information acquisition module, and is used to obtain the identity information from the acquired data, generate a test instruction based on the identity information, execute the test task on the chip to be tested to obtain test information, and output an alarm message when the test information indicates a test abnormality;

[0019] The data register communicates with the microprocessor and is used to store the identity information, the alarm information and the test information obtained from the microprocessor.

[0020] Preferably, the laser recognition device further comprises:

[0021] A clock timer, connected to the information collection module, and configured to send the acquisition instruction to the information collection module when a preset clock cycle is reached;

[0022] The information collection module triggers information collection of the identity identification code when receiving the acquisition instruction.

[0023] Preferably, the information acquisition module comprises an image capturing unit and a communication unit, the image capturing unit is used to capture the identity identification code, and the communication unit is used to communicate with the test module.

[0024] Preferably, the image capturing unit comprises at least one of the following types: a camera, a high-definition scanner, a barcode scanner or a microscope.

[0025] Preferably, the identification code is a laser code.

[0026] The beneficial effects of a storage chip information management system and its information management system disclosed in the present application are: through the collaborative work of the information acquisition module, the test module and the test host computer, the automated test of the storage chip and the real-time update and comprehensive recording of the test-related information are realized; through the communication between the data processing module in the test module and the information acquisition module and the test host computer, the identification of the storage chip identity information, as well as the effective storage, processing and anomaly detection of the relevant test information are realized, thereby enhancing the accuracy and reliability of the test; the real-time display of the storage chip identity information and the relevant test information and the anomaly monitoring are realized; the configuration of multiple information acquisition modules and test modules is supported, and it can be flexibly adjusted according to the test requirements to adapt to the storage chip tests of different scales and types. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 This is a module diagram of an embodiment of an information management system for a storage chip provided by the present application;

[0028] Figure 2 It is a structural diagram of a test module in an embodiment of an information management system for a storage chip of the present application;

[0029] Figure 3 It is a structural diagram of a data processing module in an embodiment of an information management system for a storage chip of the present application.

[0030] Description of labels:

[0031] Label name Label name 1 Information collection module 11 Image capture unit 12 Communication unit 2 Test Module 21 Test Board 211 Data processing module 212 Test execution module 2111 microprocessor 2112 Data Register 3 Test host computer 4 Cloud Server 5 Clock timer DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the scheme in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments in the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0033] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0034] It should also be noted that when an element is referred to as being "fixed on" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element at the same time. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0035] In addition, the descriptions of "first", "second", etc. in this application are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0036] like Figure 1 As shown, the present application proposes an information management system for a storage chip. In a preferred embodiment, the information management system for the storage chip includes:

[0037] At least one information collection module 1, each of which is deployed at a corresponding test position and is used to collect information about the identity code on the surface of the chip to be tested to obtain collected data;

[0038] At least one test module 2, each of which is provided with a corresponding information acquisition module 1, for acquiring the identity information of the chip to be tested from the acquired data, and performing a test task on the chip to be tested moved to the test position, obtaining test information and storing it in a test log, wherein the test information includes at least a test process and a test result of the chip to be tested;

[0039] The test host computer 3 communicates with the at least one test module 2 and is used to obtain and display test information from each of the test modules 2.

[0040] like Figure 1 As shown, in the embodiment of the present application, the information management system for the storage chip is used to read the identification code on the surface of the storage chip, which can automatically match and execute the corresponding test tasks, and finally summarize and update all the information related to the test through the test host computer 3. In the embodiment of the present application, the identification code can be a QR code, a bar code, etc. The simplest one only needs to contain the identity information of the storage chip.

[0041] The information collection module 1 is respectively arranged at a specific test position to read the identification code on the surface of the chip, thereby obtaining the collected data including the identity information. In the embodiment of the present application, the information collection module 1 can read the identification code by scanning and the like to obtain the collected data.

[0042] The test module 2 is located at the test position corresponding to the information acquisition module 1, and is connected to the corresponding information acquisition module 1 and the chip to be tested moved to the test position. After receiving the collected data, the test module 2 will first parse the identity information of the chip to be tested, and then generate and execute the test instructions based on the information. During the test process, the test module 2 will record key information such as the test steps, test conditions and test results in detail, and integrate this information into a test log for storage. The test log at least contains the test process and test results of the chip to be tested; the test host computer 3 is connected to all test modules 2 to ensure that the test information can be transmitted from the test module 2 to the host computer in real time and accurately.

[0043] In this embodiment, the chip to be tested may pass through multiple test positions, so one or more test modules 2 may be provided at each position to test the chip to be tested. After the chip to be tested passes through all predetermined test positions and completes all necessary test tasks, the test module 2 will collect and record the test results, and the test module 2 will match the test results with the test procedures corresponding to the test positions. Finally, the test module 2 will generate test information based on the test results and the test procedures, and the test module will integrate these scattered test information to form a complete target test log containing all test results, and display it in real time on the test host computer 3, thereby providing a reference for the evaluation of the performance, quality and reliability of the chip to be tested.

[0044] like Figure 1 and Figure 2As shown, in some embodiments, the test module 2 includes a test board 21, and the test board is provided with a data processing module 211 and a test execution module 212. The data processing module 211 communicates with the information acquisition module 1 and is responsible for extracting identity information from the acquired data, and is used to parse and identify the image data to obtain the chip identity information stored in the identity identification code. Once the identity information is successfully acquired, the data processing module 211 will generate test instructions corresponding to the identity information according to the preset test process and specifications. These instructions include the test tasks, test parameters and test steps that the chip to be tested needs to execute; the test execution module 212 communicates with the data processing module 1. 211 connection, responsible for receiving the test instructions sent by the data processing module 211. The test execution module 212 has necessary circuits and logic inside to parse and understand the meaning and requirements of these instructions. After parsing the test instructions, the test execution module 212 will control the chip to be tested to perform the corresponding test tasks according to the instructions. During the execution of the test tasks, the test execution module 212 will collect the test results of the chip in real time and feed back these results to the data processing module 211; the data processing module 211 further processes and analyzes these results to generate the final test information, and these data will be integrated into the test log for subsequent analysis and use.

[0045] In this embodiment, after all test stations complete the test tasks for the chip to be tested, the data processing module 211 will collect all relevant test information generated by these test stations, including but not limited to various performance indicators, test results, test time, test conditions and any possible abnormal or warning information during the test process; the data processing module 211 will associate the collected complete test information with the identity information of the chip to be tested, and update it to the test log corresponding to the chip.

[0046] The test log is a detailed record file that records all key information in the entire process of the chip to be tested, from information collection to test task execution and then to test result feedback.

[0047] Furthermore, when the data processing module 211 fails to obtain identity information from the collected data, it can automatically send an acquisition instruction to the information collection module 1 to ensure that even in the case of an initial identification failure, the data processing module 211 will immediately recognize this situation and can attempt to restore the test process by collecting data through the resent acquisition instruction. When the information collection module 1 receives the acquisition instruction sent by the data processing module 211, it will immediately re-execute the acquisition operation to obtain new collected data; regardless of whether the secondary acquisition is successful, the information collection module 1 will feed back the result to the data processing module 211. If the identity information is successfully obtained, the data processing module 211 will continue to execute subsequent test tasks; if it still fails, further troubleshooting measures will be taken.

[0048] like Figure 2 and Figure 3 As shown, in some embodiments, the data processing module 211 will integrate the product information of the chip to be tested while collecting the complete test information and updating the test log, including the chip model, batch number, production date and other information; after completing the integration of the product information and the test log, the data processing module 211 will also upload these data to the cloud server 4 in real time, and the cloud server 4 is used to receive the product information together with the updated test log in real time and organize it. The setting of the cloud server 4 can increase the storage capacity while allowing the information to be accessed and used in different geographical locations and time periods.

[0049] Among them, the cloud server 4 will communicate with the test host computer 3. When the cloud server 4 receives an access request from the test host computer 3, it will automatically respond to the request and send the product information and test log related to the access request back to the test host computer 3.

[0050] like Figure 3 As shown, in some embodiments, the data processing module 211 includes a microprocessor 2111 and a data register 212. The microprocessor 2111 first communicates with the information acquisition module 1, parses the acquired data, and extracts identity information therefrom, and then generates a test instruction based on the identity information. The test instruction is used to guide the test module 2 to perform the corresponding test task on the test chip. After the test task is completed, the microprocessor 2111 will receive the test information returned by the test module 2 and evaluate it. If the test information indicates a test abnormality (for example, the chip performance does not meet expectations or there are defects), the microprocessor 2111 will trigger the output of alarm information; the data register 212 is responsible for storing various information received from the microprocessor 2111, including the identity information obtained from the information acquisition module 1 through the microprocessor 2111, the alarm information generated during the test, and the test information related to the identity information.

[0051] Furthermore, the microprocessor 2111 will perform a comparative analysis based on the current test information and the standard data of the chip to be tested to determine whether the deviation between the two is within an acceptable range, or whether there are significant abnormal characteristics. If the analysis result shows that there is a test abnormality, that is, there is a significant difference between the current test information and the judgment standard, or the current test information exceeds the preset threshold range, then the microprocessor 2111 will make a corresponding judgment and trigger the output of an alarm information.

[0052] Among them, the data register 212 will also communicate with the test host computer 3 and the external management system. The product information processed by the microprocessor 2111 will update the test log with complete test information through the data register 212, and will also be displayed in real time on the test host computer 3, and the product information will be uploaded to the cloud server 4 together with the updated test log in real time.

[0053] like Figure 3 As shown, the working process of the information management system of the storage chip in this embodiment is as follows:

[0054] The chip to be tested with the entered identity information is moved to the test position; the information acquisition module 1 acquires an image of the chip to be tested and generates acquisition data containing the identity information; the microprocessor 2111 in the data processing module 211 parses the acquisition data. If the analysis is successful, the identity information of the chip to be tested is obtained from the acquisition data and a test instruction is generated according to the identity information. Then, the test execution module 212 executes the test task on the chip to be tested. If the analysis fails, an acquisition instruction can be automatically sent to the information acquisition module 1 to repeat the previous process; the test board 21 collects the test results and sends the results to the microprocessor 2111. The microprocessor 2111 The test information is obtained, processed and analyzed. If the test information indicates that the test is normal, the subsequent test process continues or the test is ended. If the test information indicates that the test is abnormal, the microprocessor 2111 outputs an alarm message and triggers the corresponding fault handling process; the identity information of the storage chip, the relevant test information and the alarm information will be sent to the data register 212 through the microprocessor 2111; the test information and the alarm information will communicate with the cloud server 4 and the test host computer 3 through the data register 212 in the form of a test log and the identity information of the storage chip, and will be updated in real time on the cloud server 4 and displayed on the test host computer 3.

[0055] like Figure 3As shown, in some embodiments, the information management system of the storage chip also includes a clock timer 5. The clock timer 5 is the time reference in the information acquisition module 1 and is timed according to a preset clock cycle. When the preset clock cycle is reached, the clock timer 5 will send an acquisition instruction to the information acquisition module 1. After receiving the acquisition instruction sent by the clock timer 5, the information acquisition module 1 will immediately trigger the information acquisition process of the identity identification code. Through the timing control of the clock timer 5, the information acquisition module 1 can collect information within a fixed time interval, thereby improving the efficiency of information collection. The timing of information collection is automatically controlled by the clock timer 5, which can reduce the dependence and demand on manual operation.

[0056] Furthermore, when the microprocessor 2111 receives feedback information from the test link, and the information clearly indicates that there is an abnormality in the laser recognition test of the current memory chip, the microprocessor 2111 will send a clear control instruction to the clock timer 5, requiring it to dynamically adjust the originally preset clock cycle to a more suitable target clock cycle, and send an acquisition instruction to the information acquisition module 1. Therefore, in the face of test abnormalities, the information management system of the memory chip can also maintain an efficient and stable operating state, ensuring accurate information collection and transmission, and providing a basis for subsequent data processing and storage.

[0057] like Figure 2 and Figure 3 As shown, in some embodiments, the information acquisition module 1 includes an image capture unit 11 and a communication unit 12. During the detection process of the storage chip, each chip will have a unique identification code for identification or tracking, and the image capture unit 11 is used to capture images of these identification codes; the communication unit 12 is responsible for communicating with the test module 2. Once the image capture unit 11 successfully captures the identification code, the communication unit 12 will transmit the image data to the test module 2, and the test module 2 will further process or analyze the image data to verify the validity of the identification code and read the information therein.

[0058] In this embodiment, the information acquisition module 1 is concretized as an image acquisition module, including an image capture unit 11 and a communication unit 12, that is, the image acquisition technology is used to obtain the image information of the identity identification code on the surface of the chip to be tested and transmit it to the test module 2 through the communication unit 12; when the chip to be tested moves to the test position, the image acquisition module will use the image capture unit 11 to capture the image of the area on its surface with the identity identification code. After the image acquisition is completed, an initial image containing the identity identification code will be generated, and the initial image will be subsequently recognized and processed through the communication unit 12; using image processing and recognition algorithms, the test module 2 can accurately identify the identity identification code from the initial image. After identifying the identity identification code, the test module 2 will parse the information in the identity identification code to obtain the identity information of the chip to be tested, and the acquired identity information will be used to execute the test task corresponding to the identity information.

[0059] Furthermore, the image capture unit 11 is one of a camera, a high-definition scanner, a barcode scanner or a microscope. A suitable image capture unit 11 can be selected according to different application scenarios and requirements, so that the information management system of the storage chip can better adapt to different working environments and test requirements.

[0060] Furthermore, the identification code is a laser code, which is used to uniquely identify the key information of each storage chip. In the information acquisition module 1, an image is captured for the area where the laser code is located; in the data processing module 21, the laser code can be parsed and stored more accurately and quickly. By defining the identification code as a laser code, a more reliable and efficient identification mechanism is provided for the information management system of the storage chip.

[0061] In summary, the present application provides an information management system for storage chips, which realizes the real-time update and comprehensive recording of automated testing of storage chips and test-related information through the collaborative work of the information acquisition module 1, the test module 2 and the test host computer 3; the cloud server 4 stores the product information together with the updated test log, which increases the storage capacity while also allowing the information to be accessed and used in different geographical locations and time periods; the clock timer 5 makes the process of information collection for storage chips more accurate and controllable, which helps to reduce collection errors and improve collection efficiency; through the communication between the data processing module 211 in the test module 2 and the information acquisition module 1, the test host computer 3 and the cloud server 4, the identification of the identity information of the storage chip, as well as the effective storage, processing and anomaly detection of related test information are realized, thereby enhancing the accuracy and reliability of the test.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present application, rather than to limit the scope of protection of the present application. Although the present application has been described in detail with reference to the preferred embodiments, ordinary technicians in this field should understand that the technical solution of the present application can be modified or replaced by equivalents without departing from the essence and scope of the technical solution of the present application.

Claims

1. An information management system for a storage chip, characterized in that: include: At least one information collection module, each of which is deployed at a corresponding test position and is used to collect information about the identity code on the surface of the chip to be tested to obtain collected data; At least one test module, each of which is provided with a corresponding information acquisition module, for acquiring the identity information of the chip to be tested from the acquired data, and performing a test task on the chip to be tested moved to the test position, obtaining test information and storing it in a test log, wherein the test information includes at least a test process and a test result of the chip to be tested; The test host computer communicates with the at least one test module and is used to obtain and display test information from each of the test modules.

2. The information management system of the memory chip according to claim 1, characterized in that: The test module includes a test board, and the test board is provided with a data processing module and a test execution module; The data processing module communicates with the information collection module, and is used to obtain the identity information from the collected data, and generate a test instruction based on the identity information; The test execution module is connected to the chip to be tested moved to the test position, and is used to receive the test instruction sent by the data processing module, and control the chip to be tested to execute the test task based on the test instruction.

3. The information management system of the memory chip according to claim 2, characterized in that: The data processing module is also used for: After all test stations have completed the test tasks, the complete test information of the chip to be tested is collected; The complete test information is updated to the test log corresponding to the chip to be tested.

4. The information management system of the memory chip according to claim 3, characterized in that: It also includes a cloud server, and the data processing module is also used to upload the product information together with the updated test log to the cloud server in real time.

5. The information management system of the memory chip according to claim 4, characterized in that: The data processing module is further configured to resend an acquisition instruction to the information collection module when the acquisition of the identity information fails; The information collection module is further used to obtain the collected data for a second time according to the re-received acquisition instruction.

6. The information management system for storage chips according to claim 5, characterized in that: The data processing module includes: a microprocessor and a data register; The microprocessor communicates with the information acquisition module, and is used to obtain the identity information from the acquired data, generate a test instruction based on the identity information, execute the test task on the chip to be tested to obtain test information, and output an alarm message when the test information indicates a test abnormality; The data register communicates with the microprocessor and is used to store the identity information, the alarm information and the test information obtained from the microprocessor.

7. The information management system of the memory chip according to claim 6, characterized in that: The information management system also includes: A clock timer, connected to the information collection module, and configured to send the acquisition instruction to the information collection module when a preset clock cycle is reached; The information collection module triggers information collection of the identity identification code when receiving the acquisition instruction.

8. The information management system of the memory chip according to claim 6, characterized in that: The information acquisition module includes an image capturing unit and a communication unit. The image capturing unit is used to capture the identity identification code, and the communication unit is used to communicate with the test module.

9. The information management system for storage chips according to claim 8, characterized in that: The image capturing unit includes at least one of the following types: a camera, a high-definition scanner, a barcode scanner or a microscope.

10. The information management system of the memory chip according to any one of claims 2 to 9, characterized in that: The identity identification code is a laser code.

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