Automatic test method, device and system of NAND FLASH and host

Abstract

The invention discloses an automatic test method, device and system for an NAND FLASH and a host. The method comprises the following steps: establishing SPI protocol communication with the NAND FLASH; extracting pre-stored preset data from the local according to a write data automatic test instruction input by a user, writing the pre-stored preset data into the NAND FLASH, and reading the NAND FLASH to obtain first read data; judging whether the first read data is consistent with preset data or not; if the first read data is consistent with the preset data, judging that the write-in function passes the write-in test; if the first read data is inconsistent with the preset data, judging that the write-in function does not pass the write-in test; and determining a write-in test result according to whether the write-in function passes the write-in test or the write-in function does not pass the write-in test. According to the NAND FLASH test method and device, the NAND FLASH test can be completed by receiving the automatic test instruction input by the user, manual operation is reduced, and the automation degree of the NAND FLASH test is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of data storage, and in particular to an automatic testing method, device, system and host of NAND FLASH. Background Art

[0002] NAND FLASH refers to SPI NAND FLASH (Serial Peripheral Interface NAND FLASH), which is a common non-volatile memory. With the growing demand for memory capacity and performance in embedded systems and electronic devices, NAND FLASH, as a low-cost, easy-to-integrate memory, has become the first choice for solutions. NAND FLASH is widely used in embedded systems and electronic devices. However, for embedded systems and electronic devices, the performance of memory is particularly critical. However, the performance of NAND FLASH may be affected by many factors, such as write function, read function, and erase function. Therefore, during the use of NAND FLASH, it is necessary to test the performance of NAND FLASH.

[0003] However, the existing NAND FLASH testing method usually uses a general programmer or a debugging tool in an embedded system to test the NAND FLASH. This testing method is relatively cumbersome and has a low degree of automation. It cannot efficiently complete the rapid testing of a large number of NAND FLASHs, resulting in low efficiency and low automation of NAND FLASH testing.

[0004] Therefore, there is still an urgent need for a method that can improve the efficiency and automation of NAND FLASH testing. Summary of the invention

[0005] The main purpose of the present invention is to provide a NAND FLASH automated testing method, device, system and host to solve the problems of low efficiency and low automation level in the existing defective NAND FLASH testing.

[0006] To achieve the above object, the present invention proposes an automated testing method for NAND FLASH, the automated testing method for NAND FLASH comprising:

[0007] Establish SPI protocol communication with NAND FLASH;

[0008] According to the automatic data writing test instruction input by the user, the preset data pre-stored in the local memory is extracted and written into the NAND FLASH, and the NAND FLASH is read to obtain the first read data;

[0009] Determining whether the first read data is consistent with the preset data;

[0010] If the first read data is consistent with the preset data, it is determined that the write function of the NAND FLASH passes the write test;

[0011] If the first read data is inconsistent with the preset data, it is determined that the write function of the NAND FLASH fails the write test;

[0012] A write test result is determined according to whether the write function passes the write test or whether the write function fails the write test.

[0013] In some embodiments, it also includes:

[0014] Reading the original data of the NAND FLASH according to the automatic data reading test instruction input by the user to obtain second read data;

[0015] Determining whether the second read data is consistent with the original data;

[0016] If the second read data is consistent with the original data, it is determined that the read function of the NAND FLASH passes the read test;

[0017] If the second read data is inconsistent with the original data, it is determined that the read function of the NAND FLASH fails the read test;

[0018] A read test result is determined according to whether the read function passes the read test or whether the read function fails the read test.

[0019] In some embodiments, it also includes:

[0020] Erasing the NAND FLASH according to the automatic data erasing test instruction input by the user;

[0021] Detecting whether there is residual data in the NAND FLASH;

[0022] If there is no residual data in the NAND FLASH, it is determined that the erasure function of the NAND FLASH passes the erasure test;

[0023] If there is residual data in the NAND FLASH, it is determined that the erase function of the NAND FLASH fails the erase test;

[0024] An erase test result is determined according to whether the erase function passes the erase test or whether the erase function fails the erase test.

[0025] In some embodiments, after establishing SPI protocol communication with NAND FLASH, the method further includes:

[0026] Receiving automatic test instructions input by a user;

[0027] The automatic test instruction is parsed to obtain the write data automatic test instruction, the read data automatic test instruction and / or the erase data automatic test instruction.

[0028] In some embodiments, after parsing the automatic test instruction to obtain the write data automatic test instruction, the read data automatic test instruction and / or the erase data automatic test instruction, the further step includes:

[0029] Generate a write data test voltage of the NAND FLASH according to the write data automatic test instruction;

[0030] generating a read data test voltage of the NAND FLASH according to the read data automatic test instruction; and / or,

[0031] A data erasing test voltage of the NAND FLASH is generated according to the data erasing automatic test instruction.

[0032] In some embodiments, it also includes:

[0033] Analyzing the write test result, the read test result and / or the erase test result to obtain a performance evaluation result;

[0034] generating a test report according to the performance evaluation results;

[0035] Display and save the test report.

[0036] In some embodiments, establishing SPI protocol communication with NAND FLASH includes:

[0037] Obtain model information of the NAND FLASH;

[0038] Performing communication configuration on the NAND FLASH according to the model information of the NAND FLASH;

[0039] Establish SPI protocol communication with NAND FLASH according to the communication configuration.

[0040] The present invention also provides an automatic testing device for NAND FLASH, comprising:

[0041] at least one processor; and,

[0042] a memory communicatively connected to the at least one processor; wherein,

[0043] The memory stores instructions to be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute any one of the above-mentioned automated testing methods for NAND FLASH.

[0044] The present invention also proposes an automated testing system for NAND FLASH, the automated testing system for NAND FLASH comprising a testing device and NAND FLASH, the testing device being configured with the automated testing apparatus for NAND FLASH described above, so that the testing device can execute any of the automated testing methods for NAND FLASH described above.

[0045] The present invention further provides a NAND FLASH automated testing host, wherein the NAND FLASH automated testing host comprises a plurality of the above-mentioned NAND FLASH automated testing systems.

[0046] The present invention establishes SPI protocol communication with NAND FLASH and can perform automatic testing on NAND FLASH through automatic testing instructions input by a user, thereby obtaining test results; during the NAND FLASH test process, the user only needs to input the automatic testing instructions, and the testing equipment can automatically complete the test and obtain the test results, thereby reducing manual operations and improving the automation level of the NAND FLASH test; and through the automatic testing host of the NAND FLASH, the NAND FLASH test can be performed in large quantities, thereby improving the efficiency of the NAND FLASH test. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] Figure 1 Schematic diagram of the process of the automatic testing method of NAND FLASH in an embodiment of the present invention;

[0048] Figure 2 Another schematic diagram of the process of the automated testing method of NAND FLASH in an embodiment of the present invention;

[0049] Figure 3 Another schematic diagram of the process of the automated testing method of NAND FLASH in an embodiment of the present invention;

[0050] Figure 4 Another schematic diagram of the process of the automated testing method of NAND FLASH in an embodiment of the present invention;

[0051] Figure 5 Another schematic diagram of the process of the automated testing method of NAND FLASH in an embodiment of the present invention;

[0052] Figure 6 Another schematic diagram of the process of the automated testing method of NAND FLASH in an embodiment of the present invention;

[0053] Figure 7 It is a schematic diagram of the structure of an automatic testing device for NAND FLASH according to an embodiment of the present invention;

[0054] Figure 8 The figure is a schematic diagram of the structure of an automatic testing system for NAND FLASH according to an embodiment of the present invention.

[0055] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0056] The scheme in the embodiment of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiment of the present invention. Obviously, the described embodiment is only a part of the embodiment of the present invention, not all of the embodiments. Based on the embodiment of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0057] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0058] It should also be noted that when an element is referred to as being "fixed on" or "disposed on" another element, it may be directly on the other element or there may be an intermediate element at the same time. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element at the same time.

[0059] In addition, the descriptions of "first", "second", etc. in the present invention are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in the field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such a combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0060] To achieve the above object, the present invention proposes an automated testing method for NAND FLASH, the automated testing method for NAND FLASH comprising:

[0061] Step S110, establishing SPI protocol communication with NAND FLASH;

[0062] Step S120, according to the automatic data writing test instruction input by the user, extract the pre-stored preset data from the local and write it into the NAND FLASH, and read the NAND FLASH to obtain the first read data;

[0063] Step S130, determining whether the first read data is consistent with the preset data;

[0064] Step S140, if the first read data is consistent with the preset data, it is determined that the write function of the NAND FLASH passes the write test;

[0065] Step S150, if the first read data is inconsistent with the preset data, it is determined that the write function of the NAND FLASH fails the write test;

[0066] Step S160, determining a write test result according to whether the write function passes the write test or fails the write test.

[0067] In this embodiment, refer to Figure 1 , Figure 7 and Figure 8 , the automated testing method of NAND FLASH can be applied to the automated testing device of NAND FLASH. The automated testing device of NAND FLASH can be configured inside the testing equipment so that the testing equipment can execute the automated testing method of NAND FLASH. Among them, NAND FLASH is SPI NANDFLASH (Serial Peripheral Interface NAND FLASH, flash memory of serial peripheral interface). The testing equipment can automatically detect NAND FLASH through the automated testing device of NAND FLASH, and can generate a test report according to the test results by testing the function of NAND FLASH for the user to view. In this embodiment, the execution subject of the method steps is the testing equipment equipped with the automated testing device of NAND FLASH.

[0068] It is understandable that the automated test device for NAND FLASH may include a main control module, a test module, an SPI interface module, a power module, a display and feedback module, a storage module, and an input module. The main control module is used to control and schedule all test operations. The SPI interface module is used to communicate with NAND FLASH via the SPI protocol. The power module is used to provide the necessary power for NAND FLASH to ensure that it can work normally during the test. The display and feedback module is used to display the progress, results, and related status information of the test in real time. The storage module is used to store the data required for the test process, the data generated during the test process, and the test results. The input module is used to receive instructions input by the user.

[0069] When the user needs to test NAND FLASH, the NAND FLASH can be connected to the SPI interface module of the NAND FLASH automatic test device in the test equipment. At this time, the test equipment can establish SPI protocol communication with NAND FLASH through the SPI interface module; after the test equipment and NAND FLASH establish SPI protocol communication, the test equipment and NAND FLASH can exchange data. At this time, the user can input the NAND FLASH test instruction to the test equipment through the input module. When the user wants to test the write function of NAND FLASH, he can input the write data automatic test instruction.

[0070] After the test device receives the automatic test instruction for writing data, it can automatically test the writing function of NAND FLASH. According to the automatic test instruction for writing data, the test device extracts the preset data stored locally; wherein the preset data can be the data pre-set by the user according to the test requirements, and the preset data can be saved in the storage module. For example: the test device can extract the preset data from the storage module; and then write the preset data into NAND FLASH. After the writing is completed, the test device will read the NAND FLASH to obtain the first read data.

[0071] After the test device obtains the first read data, it will judge the first read data. The test device judges whether the first read data is consistent with the preset data. Since the first read data is obtained based on the preset data written into the NAND FLASH; if there is no problem in the process of writing the preset data into the NAND FLASH, then the first read data should be consistent with the preset data.

[0072] If the test device determines that the first read data is consistent with the preset data, it can be said that there is no problem in writing the preset data into the NAND FLASH, indicating that there is no problem with the write function of the NAND FLASH; the test device can determine that the write function of the NAND FLASH passes the write test.

[0073] If the test device determines that the first read data is inconsistent with the preset data, it can be explained that there is a problem in the process of writing the preset data into NAND FLASH, indicating that there is a problem with the write function of NAND FLASH; the test device can determine that the write function of NAND FLASH has failed the write test.

[0074] If the test equipment determines that the write function of the NAND FLASH passes the write test, the write test result can be determined according to the write test of the write function of the NAND FLASH. The test result at this time can indicate that there is no problem with the write function of the NAND FLASH.

[0075] If the test device determines that the write function of the NAND FLASH fails the write test, the write test result can be determined based on the fact that the write function of the NAND FLASH fails the write test. The test result at this time can indicate that there is a problem with the write function of the NAND FLASH. The display and feedback module can include an alarm, and when the write function of the NAND FLASH fails the write test, an alarm can be output through the alarm to prompt the user that there is a problem with the write function of the NAND FLASH.

[0076] By establishing SPI protocol communication with NAND FLASH through this embodiment, and through the automatic test instructions input by the user, the NAND FLASH can be automatically tested to obtain the test results; during the NAND FLASH test process, the user only needs to input the automatic test instructions, and the test equipment can automatically complete the test and obtain the test results, thereby reducing manual operations and improving the automation level of the NAND FLASH test.

[0077] In some embodiments, the aforementioned NAND FLASH automated testing method further includes:

[0078] Step S170, reading the original data of the NAND FLASH according to the automatic data reading test instruction input by the user to obtain the second read data;

[0079] Step S171, determining whether the second read data is consistent with the original data;

[0080] Step S172, if the second read data is consistent with the original data, it is determined that the read function of the NAND FLASH passes the read test;

[0081] Step S173, if the second read data is inconsistent with the original data, it is determined that the read function of the NAND FLASH fails the read test;

[0082] Step S174, determining a read test result according to whether the read function passes the read test or whether the read function fails the read test.

[0083] In this embodiment, refer to Figure 2 After executing step S160, the test device can also test the read function of NAND FLASH. The user can also perform an automated test on the read function of NAND FLASH through the test device; the user inputs a read data automatic test instruction to the test device; at this time, the test device can receive the read data automatic test instruction. After the test device receives the read data automatic test instruction, it can read the NAND FLASH according to the read data automatic test instruction; read the original data of the NAND FLASH, thereby obtaining the second read data. Among them, the original data can be the data stored in the NAND FLASH before the read function test of the NAND FLASH is performed.

[0084] After the test device obtains the second read data, it will judge the second read data. The test device judges whether the second read data is consistent with the original data. Since the second read data is obtained by reading the original data stored in NAND FLASH; if there is no problem in the process of reading the original data, then the second read data should be consistent with the original data.

[0085] If the test equipment determines that the second read data is consistent with the original data, it can be said that there is no problem in the process of reading the original data, indicating that there is no problem with the reading function of the NAND FLASH; the test equipment can determine that the reading function of the NAND FLASH passes the read test.

[0086] If the test equipment determines that the second read data is inconsistent with the original data, it means that there is a problem in the process of reading the original data, indicating that there is a problem with the reading function of the NAND FLASH; the test equipment can determine that the reading function of the NAND FLASH has failed the read test.

[0087] If the test equipment determines that the read function of the NAND FLASH passes the read test, the read test result can be determined based on the read function of the NAND FLASH. The test result at this time can indicate that there is no problem with the read function of the NAND FLASH.

[0088] If the test equipment determines that the read function of the NAND FLASH fails the read test, the read test result can be determined based on the fact that the read function of the NAND FLASH fails the read test. The test result at this time can indicate that there is a problem with the read function of the NAND FLASH. When the read function of the NAND FLASH fails the read test, an alarm can also be output through the alarm to prompt the user that there is a problem with the read function of the NAND FLASH.

[0089] In some embodiments, the aforementioned NAND FLASH automated testing method further includes:

[0090] Step S180, erasing NAND FLASH according to the automatic data erasing test instruction input by the user;

[0091] Step S181, detecting whether there is residual data in NAND FLASH;

[0092] Step S182, if there is no residual data in the NAND FLASH, it is determined that the erasure function of the NAND FLASH passes the erasure test;

[0093] Step S183, if there is residual data in the NAND FLASH, it is determined that the erase function of the NAND FLASH has not passed the erase test;

[0094] Step S184, determining an erase test result according to whether the erase function passes the erase test or whether the erase function fails the erase test.

[0095] In this embodiment, refer to Figure 3 After executing step S160, the test device can also test the erasing function of NAND FLASH. The user can also perform an automated test on the erasing function of NAND FLASH through the test device; the user inputs an automatic data erasing test instruction to the test device; at this time, the test device can receive the automatic data erasing test instruction. After the test device receives the automatic data erasing test instruction, it can completely erase the NAND FLASH according to the automatic data erasing test instruction; completely erase the data stored in the NAND FLASH.

[0096] After erasing the data stored in NAND FLASH, the test equipment will test NAND FLASH. The test equipment detects whether there is residual data in NAND FLASH. Since the test equipment completely erases the data stored in NAND FLASH; if there is no problem in the process of completely erasing the data stored in NAND FLASH, there should be no residual data in NAND FLASH.

[0097] If the test equipment determines that there is no residual data in the NAND FLASH, it means that there is no problem in completely erasing the data stored in the NAND FLASH, indicating that there is no problem with the erasing function of the NAND FLASH; the test equipment can determine that the erasing function of the NAND FLASH passes the erasure test.

[0098] If the test equipment determines that there is residual data in the NAND FLASH, it means that there is a problem in the process of completely erasing the data stored in the NAND FLASH, indicating that there is a problem with the erasing function of the NAND FLASH; the test equipment can determine that the erasing function of the NAND FLASH has failed the erase test.

[0099] If the test equipment determines that the erasing function of the NAND FLASH passes the erasing test, the erasing test result can be determined according to the erasing function of the NAND FLASH. The test result at this time can indicate that there is no problem with the erasing function of the NAND FLASH.

[0100] If the test equipment determines that the erase function of NAND FLASH fails the erase test, the erase test result can be determined based on the fact that the erase function of NAND FLASH fails the erase test. The test result at this time can indicate that there is a problem with the erase function of NAND FLASH. When the erase function of NAND FLASH fails the erase test, an alarm can also be output through an alarm to prompt the user that there is a problem with the erase function of NAND FLASH.

[0101] In some embodiments, after establishing SPI protocol communication with NAND FLASH in the foregoing, the method further includes:

[0102] Step S190, receiving an automatic test instruction input by a user;

[0103] Step S191, parsing the automatic test instruction to obtain a write data automatic test instruction, a read data automatic test instruction and / or an erase data automatic test instruction.

[0104] In this embodiment, refer to Figure 4 After executing step S110, the test device may first receive the automatic test instruction input by the user. An automated test program may be installed on the test device; the automated test program may include a write test, a read test, and an erase test. The user may customize and select one or more tests according to the test requirements. When the user selects a write test, an automatic test instruction for writing data may be generated. When the user selects a read test, an automatic test instruction for reading data may be generated. When the user selects an erase test, an automatic test instruction for erasing data may be generated. Automatic test instructions are generated according to the user's selection. At this point, the test device may receive the automatic test instruction input by the user. The test device parses the automatic test instruction to obtain one or more instructions of the automatic test instruction for writing data, the automatic test instruction for reading data, and the automatic test instruction for erasing data.

[0105] In some embodiments, after parsing the automatic test instruction to obtain the write data automatic test instruction, the read data automatic test instruction and / or the erase data automatic test instruction, the method further includes:

[0106] Generate NAND FLASH write data test voltage according to write data automatic test instruction;

[0107] Generate a NAND FLASH read data test voltage according to a read data automatic test instruction; and / or,

[0108] Generate NAND FLASH data erase test voltage according to the data erase automatic test instruction.

[0109] In this embodiment, after executing step S191, the test device will also generate different test voltages according to different test instructions. When the test device performs different operations on NAND FLASH, different voltages are required to achieve them. The test device can generate the test voltage required for NAND FLASH through the power module. The test device can control the power module to generate the write data test voltage required for NAND FLASH according to the write data automatic test instruction. The test device can also control the power module to generate the read data test voltage required for NAND FLASH according to the read data automatic test instruction. The test device can also control the power module to generate the erase data test voltage required for NAND FLASH according to the erase data automatic test instruction. What kind of test voltage the test device needs to generate needs to be determined according to what kind of test instruction.

[0110] In some embodiments, the aforementioned NAND FLASH automated testing method further includes:

[0111] Step S200, analyzing the write test result, the read test result and / or the erase test result to obtain a performance evaluation result;

[0112] Step S201, generating a test report according to the performance evaluation result;

[0113] Step S202, display and save the test report.

[0114] In this embodiment, refer to Figure 5 After obtaining the test results, the test device will also analyze the test results. According to one or more test instructions, the test device can obtain one or more test results of write test results, read test results, and erase test results. The test device can analyze according to one test result, or according to multiple test results. The test device analyzes the write test results, the read test results, and / or the erase test results to obtain the performance evaluation results. The test device generates a test report based on the performance evaluation results. After obtaining the test report, the test device can display the test report through the display and feedback module, and can also save the test report in the storage module.

[0115] In some embodiments, the aforementioned process of establishing SPI protocol communication with NAND FLASH includes:

[0116] Step S210, obtaining NAND FLASH model information;

[0117] Step S211, performing communication configuration on the NAND FLASH according to the model information of the NAND FLASH;

[0118] Step S212, establishing SPI protocol communication with NAND FLASH according to the communication configuration.

[0119] In this embodiment, refer to Figure 6 When the test device executes step S110, it establishes communication with the NAND FLASH through the model information of the NAND FLASH. NAND FLASH can have multiple models; the test device can test multiple models of NAND FLASH. The test device determines the model of the NAND FLASH by obtaining the model information of the NAND FLASH. The test device can perform matching communication configuration for the NAND FLASH according to the model information of the NAND FLASH; thereby establishing SPI protocol communication with the NAND FLASH according to the matching communication configuration.

[0120] The present invention establishes SPI protocol communication with NAND FLASH and can perform automatic testing on NAND FLASH through automatic testing instructions input by the user, so as to obtain test results; during the NAND FLASH testing process, the user only needs to input the automatic testing instructions, and the testing equipment can automatically complete the test and obtain the test results, thereby reducing manual operations and improving the automation level of NAND FLASH testing.

[0121] The NAND FLASH automated testing device of the embodiment of the present invention may be a controller capable of running the NAND FLASH automated testing method; the controller has at least one. Figure 7 As shown, the automated testing device for NAND FLASH may include: a controller 1001 (e.g., a CPU), a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit, such as a keyboard (Keyboard), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory, or a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may optionally be a storage device independent of the aforementioned controller 1001.

[0122] Those skilled in the art will understand that Figure 7 The structure of the automatic test device for NAND FLASH shown in the figure does not constitute a limitation on the automatic test device for NAND FLASH, and may include more or less components than those shown in the figure, or combine certain components, or arrange the components differently.

[0123] like Figure 7 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module and a computer program.

[0124] exist Figure 7In the NAND FLASH automated testing device shown, the network interface 1004 is mainly used to connect to the background server and communicate data with the background server; the user interface 1003 is mainly used to connect to the client (user end) and communicate data with the client; and the controller 1001 can be used to call the computer program stored in the memory 1005. When the computer program is called and executed by the controller 1001, the steps of the above-mentioned NAND FLASH automated testing method are implemented.

[0125] In a preferred embodiment, the automated test device for NAND FLASH may also include a main control module, a test module, an SPI interface module, a power module, a display and feedback module, a storage module and an input module. The main control module is used to control and schedule all test operations. The SPI interface module is used to communicate with NAND FLASH via the SPI protocol. The power module is used to provide the necessary power for NAND FLASH to ensure that it can work normally during the test. The display and feedback module is used to display the progress, results and related status information of the test in real time. The storage module is used to store the data required for the test process, the data generated during the test process and the test results. The input module is used to receive instructions input by the user.

[0126] The present invention also proposes an automated testing system for NAND FLASH, the automated testing system for NAND FLASH comprising a testing device and NAND FLASH, the testing device being configured with the automated testing apparatus for NAND FLASH described above, so that the testing device can execute any of the automated testing methods for NAND FLASH described above.

[0127] In this embodiment, refer to Figure 8 The automatic test system of NAND FLASH includes a test device and NAND FLASH. The test device is equipped with an automatic test device of NAND FLASH.

[0128] The present invention further provides a NAND FLASH automated testing host, wherein the NAND FLASH automated testing host comprises a plurality of the above-mentioned NAND FLASH automated testing systems.

[0129] In this embodiment, the NAND FLASH automated test host can test multiple NAND FLASHs at the same time; the NAND FLASH automated test host can perform NAND FLASH tests in large quantities, thereby improving the efficiency of NAND FLASH tests.

[0130] The above description is only a partial or preferred embodiment of the present invention. Neither the text nor the drawings can limit the scope of protection of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the overall concept of the present invention, or direct / indirect application in other related technical fields are included in the scope of protection of the present invention.

Claims

1. A NAND FLASH automated testing method, characterized in that: The automated testing method for NAND FLASH includes: Establish SPI protocol communication with NAND FLASH; According to the automatic data writing test instruction input by the user, the preset data pre-stored in the local memory is extracted and written into the NAND FLASH, and the NAND FLASH is read to obtain the first read data; Determining whether the first read data is consistent with the preset data; If the first read data is consistent with the preset data, it is determined that the write function of the NAND FLASH passes the write test; If the first read data is inconsistent with the preset data, it is determined that the write function of the NAND FLASH fails the write test; A write test result is determined according to whether the write function passes the write test or whether the write function fails the write test.

2. The automated testing method for NAND FLASH according to claim 1, characterized in that: Also includes: Reading the original data of the NAND FLASH according to the automatic data reading test instruction input by the user to obtain second read data; Determining whether the second read data is consistent with the original data; If the second read data is consistent with the original data, it is determined that the read function of the NAND FLASH passes the read test; If the second read data is inconsistent with the original data, it is determined that the read function of the NAND FLASH fails the read test; A read test result is determined according to whether the read function passes the read test or whether the read function fails the read test.

3. The automated testing method for NAND FLASH according to claim 1, characterized in that: Also includes: Erasing the NAND FLASH according to the automatic data erasing test instruction input by the user; Detecting whether there is residual data in the NAND FLASH; If there is no residual data in the NAND FLASH, it is determined that the erasure function of the NAND FLASH passes the erasure test; If there is residual data in the NAND FLASH, it is determined that the erase function of the NAND FLASH fails the erase test; An erase test result is determined according to whether the erase function passes the erase test or whether the erase function fails the erase test.

4. The automated testing method for NAND FLASH according to any one of claims 1 to 3, characterized in that: After establishing SPI protocol communication with NAND FLASH, it also includes: Receiving automatic test instructions input by a user; The automatic test instruction is parsed to obtain the write data automatic test instruction, the read data automatic test instruction and / or the erase data automatic test instruction.

5. The automated testing method for NAND FLASH according to claim 4, characterized in that: After parsing the automatic test instruction to obtain the write data automatic test instruction, the read data automatic test instruction and / or the erase data automatic test instruction, the method further includes: Generate a write data test voltage of the NAND FLASH according to the write data automatic test instruction; generating a read data test voltage of the NAND FLASH according to the read data automatic test instruction; and / or, A data erasing test voltage of the NAND FLASH is generated according to the data erasing automatic test instruction.

6. The automated testing method for NAND FLASH according to claim 4, characterized in that: Also includes: Analyzing the write test result, the read test result and / or the erase test result to obtain a performance evaluation result; generating a test report according to the performance evaluation results; Display and save the test report.

7. The automated testing method for NAND FLASH according to claim 1, characterized in that: The SPI protocol communication with NANDFLASH is established, including: Obtain model information of the NAND FLASH; Performing communication configuration on the NAND FLASH according to the model information of the NAND FLASH; Establish SPI protocol communication with NAND FLASH according to the communication configuration.

8. An automatic testing device for NAND FLASH, characterized in that: include: at least one processor; as well as, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the automatic testing method for NAND FLASH according to any one of claims 1 to 7.

9. An automatic test system for NAND FLASH, characterized in that: The automated testing system for NAND FLASH comprises a testing device and NAND FLASH, wherein the testing device is provided with the automated testing apparatus for NAND FLASH according to claim 8, so that the testing device can execute the automated testing method for NAND FLASH according to any one of claims 1 to 7.

10. A NAND FLASH automated test host, characterized in that: The NAND FLASH automated testing host comprises a plurality of NAND FLASH automated testing systems as claimed in claim 9.

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