Silk-screen mark inspection method

Abstract

The invention provides a silk-screen identification checking method, which is used for checking whether a polarity identification or a pin 1 identification of a device is lost or shifted in ALLEGRO software, and comprises the following steps of: obtaining current identification information in a silk-screen layer from an editable packaging library, the current identification information comprises pattern information and coordinate information of each identification in the current state; copying the current identification information to a to-be-compared stack of an editable packaging library; the editable packaging library is updated based on the original packaging library, so that the current identification information is recovered to initial identification information, and the initial identification information comprises pattern information and coordinate information of each identification in an initial state; and traversing and comparing the current identification information with the initial identification information to obtain the lost or shifted identification. According to the method, changes of all identification marks in the silk-screen layer can be visually obtained through one-time comparison, the reliability is good, and the efficiency is high.

Description

Technical Field

[0001] The invention relates to the field of PCB design, and in particular to a silk-screen marking inspection method. Background Art

[0002] In the design of printed circuit boards (PCBs), in order to ensure the correct function and smooth assembly of the circuit board, the polarity mark and the 1-pin mark of the device need to be correctly displayed on the silk screen layer. The polarity mark is usually used to indicate the current direction of the polarity device, while the 1-pin mark indicates the correct position of the first pin of the device. If the polarity mark or the 1-pin mark is lost or shifted, it may cause errors in subsequent welding, which may lead to serious consequences such as electrical failure of the circuit board or damage to the equipment.

[0003] In traditional PCB design, checking the polarity and correctness of one-pin identification usually depends on the identification of the silk screen layer. Specifically, the properties of the PCB device frame silk screen and the one-pin identification silk screen can be set, and then the XOR operation can be used to determine whether the silk screen layer identification is missing. However, this method can only check the identification of the polarity identification and the one-pin identification that are both missing.

[0004] Therefore, how to accurately and easily inspect the silk-screen markings on printed circuit boards has become a technical problem that urgently needs to be solved in the industry. Summary of the invention

[0005] The invention provides a method for inspecting silk-screen marks, which solves the technical problem of how to accurately inspect silk-screen marks on a printed circuit board in a relatively simple manner.

[0006] According to a first aspect of the present invention, an embodiment of the present invention provides a method for checking a silk screen mark, which is used to check whether an identification mark of a device is lost or shifted in ALLEGRO software, wherein the identification mark is a polarity mark or a 1-pin mark, and the method comprises:

[0007] Obtaining current identification mark information in the silk-screen layer from the editable package library, the current identification mark information including pattern information and coordinate information of each identification mark in the current state;

[0008] Copying the current identification information to the stack to be compared in the editable package library;

[0009] After the copying is performed, the editable package library is updated based on the original package library to restore the current identification information to the initial identification information, wherein the initial identification information includes pattern information and coordinate information of each identification in an initial state;

[0010] The current identification information is traversed and compared with the initial identification information to obtain the lost or displaced identification.

[0011] Optionally, in the silk-screen layer, the device has an association relationship with the corresponding identification mark; in the stack to be compared, the device has no association relationship with the corresponding identification mark;

[0012] The method for updating the editable package library based on the original package library includes:

[0013] The editable package library is updated so that the attribute information of the editable package library associated with the device is the same as the attribute information of the original package library associated with the device, wherein the attribute information includes the current identification information and the initial identification information.

[0014] Optionally, the stack to be compared is a newly created stack or an assembled layer.

[0015] Optionally, the method of comparing the current identification information with the initial identification information to obtain the lost or displaced identification includes:

[0016] Obtain the current identification information in the stack to be compared by using the axlDBGetShapes function of the skill language;

[0017] Obtain the initial identification information in the silk-screen layer through the axlDBGetShapes function of the skill language, wherein the initial identification information also includes silk-screen position number information corresponding to the identification;

[0018] Based on the initial identification information, obtaining a first position list sorted by silk screen position number, wherein the first position list also includes coordinate information corresponding to the silk screen position number;

[0019] Based on the current identification information, obtaining a second position list, wherein the second position list includes coordinate information of all identifications in the stack to be compared;

[0020] Compare the coordinate information corresponding to each silk-screen position number with all the coordinate information in the second position list to determine whether the identification mark of each device is lost or shifted;

[0021] An unmatched list is obtained, wherein the unmatched list includes the number of missing identification marks, silk screen position number information of the missing or shifted identification marks, and corresponding coordinate information.

[0022] Optionally, the method of comparing the coordinate information corresponding to the silk-screen position number with all the coordinate information in the second position list to determine whether the identification mark of the device is lost or shifted includes:

[0023] The coordinate information corresponding to the silk-screen position number is traversed and compared with all the coordinate information in the second position list, so as to find out whether there is a coordinate in the second position list whose deviation from the coordinate information corresponding to the silk-screen position number is less than or equal to a preset deviation value;

[0024] If yes, the identification mark of the device is normal; otherwise, the identification mark of the device is lost or shifted.

[0025] Optionally, the preset deviation value is 11 mil.

[0026] Optionally, after getting the unmatched list, also include:

[0027] Displaying the initial identification information in a first color on the silk-screen layer, and displaying the current identification information in a second color on the stacked layer to be compared, wherein the first color is different from the second color;

[0028] Performing a layer overlay process on the silk-screen layer and the layer to be compared;

[0029] Based on the unmatched list, the device with the identification mark lost or shifted is located.

[0030] Optionally, after locating the device where the identification mark is lost or shifted, the method further includes:

[0031] The shifted identification mark is modified and confirmed.

[0032] Optionally, the silk-screen layer includes a silk-screen top layer and a silk-screen bottom layer, and the stack to be compared includes a top layer to be compared and a bottom layer to be compared, and copying the current identification information to the stack to be compared of the editable package library includes:

[0033] Copying the identification information of the silk-screen top layer to the top layer to be compared of the editable package library; and

[0034] The identification information of the silk-screen bottom layer is copied to the bottom layer to be compared of the editable package library.

[0035] Optionally, the method of comparing the current identification information with the initial identification information includes:

[0036] Comparing the initial identification information in the silk-screen top layer with the current identification information in the top layer to be compared; and

[0037] The initial identification information in the silk-screen bottom layer is compared with the current identification information in the bottom layer to be compared.

[0038] Compared with the prior art, the technical solution of the embodiment of the present invention has the following beneficial effects:

[0039] In the silk screen identification inspection method of the technical solution of the present invention, the method is used to check whether the polarity identification or 1-pin identification of the device is lost or shifted in the ALLEGRO software. The method includes obtaining the current identification information in the silk screen layer from the editable package library, and the current identification information includes the pattern information and coordinate information of each identification in the current state; copying the current identification information to the stack to be compared in the editable package library; updating the editable package library based on the original package library to restore the current identification information to the initial identification information, and the initial identification information includes the pattern information and coordinate information of each identification in the initial state; traversing and comparing the current identification information with the initial identification information to obtain the lost or shifted identification. The present invention can intuitively obtain the changes of all identification marks in the silk screen layer through one comparison, with good reliability and high efficiency.

[0040] Furthermore, after obtaining the unmatched list, the method further includes: displaying the initial identification information in a first color on the silk-screen layer, and displaying the current identification information in a second color on the stack to be compared, wherein the first color is different from the second color; performing layer overlay processing on the silk-screen layer and the stack to be compared; and locating the device whose identification mark is lost or shifted based on the unmatched list. Thus, the present invention can also visually and clearly check whether the identification mark is lost or shifted, and can also locate the shift point in the silk-screen layer as needed, and the operation is convenient.

[0041] Furthermore, the silk-screen layer includes a silk-screen top layer and a silk-screen bottom layer, and the stack to be compared includes a silk-screen top layer and a silk-screen bottom layer, and the current identification information is copied to the stack to be compared in the editable package library, including: copying the identification information of the silk-screen top layer to the top layer to be compared in the editable package library; and copying the identification information of the silk-screen bottom layer to the bottom layer to be compared in the editable package library. Thus, the present invention can check whether the identification mark is lost or shifted layer by layer, thereby ensuring the accuracy of the inspection. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0043] Figure 1 It is a schematic flow chart of a silk screen marking inspection method provided by a first embodiment of the present invention;

[0044] Figure 2 It is a flow chart of a silk screen marking inspection method provided by a second embodiment of the present invention;

[0045] Figure 3 It is a schematic flow chart of a silk screen marking inspection method provided by a third embodiment of the present invention;

[0046] Figure 4 1 is a flow chart of a silk screen marking inspection method provided by a fourth embodiment of the present invention;

[0047] Figure 5 It is a schematic diagram of the effect of the silk screen marking inspection method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0048] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0049] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0050] The technical solution of the present invention is described in detail with specific embodiments below. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0051] As described in the background art, it is difficult to accurately and simply inspect the silk-screen markings on printed circuit boards in the prior art, which will be described in detail below.

[0052] Components need to be laid out in PCB design. Due to the large number of components, the identification marks of some components may overlap. At this time, the designer will fine-tune the identification marks. However, multiple layout adjustments may cause the identification marks to be misplaced.

[0053] In addition, when designing the copper plating of PCB wiring, designers will perform deletion operations on the silk screen layer, and there is a possibility that the identification mark will be deleted by mistake.

[0054] Therefore, after the PCB design is completed, it is necessary to ensure that the identification mark in the PCB can correctly identify the device information.

[0055] In order to accurately check the silk screen markings of the printed circuit board, in a current implementation, the attributes of the silk screen of the PCB package are set, and then an XOR operation is performed to determine whether the silk screen is missing.

[0056] Specifically, by performing a logical XOR operation on the device frame silk screen attributes and the 1pin silk screen attributes, an error is reported when SK⊕sk=0, indicating that the silk screen is missing, and then a check and modification is performed. Conversely, when SK⊕sk=1, it indicates that the silk screen design is correct.

[0057] However, this implementation only checks whether the silk screen is missing, and does not check the placement of the silk screen.

[0058] Moreover, since a device may have both the outer frame silk screen and the 1-pin silk screen attributes, or may not have both attributes, checking the silk screen through a logical XOR operation will bring new problems. As long as the device has either the outer frame silk screen or the 1-pin silk screen, it means that the silk screen design is correct. If both exist or both do not exist, the silk screen needs to be checked and modified. Therefore, a large number of silk screens need to be manually checked again to determine whether there is a problem of silk screen omission.

[0059] In view of this, the present invention proposes a silk screen identification inspection method, which is used to check whether the polarity identification or 1-pin identification of the device is lost or shifted in the ALLEGRO software. The method includes obtaining the current identification information in the silk screen layer from the editable package library, and the current identification information includes the pattern information and coordinate information of each identification in the current state; copying the current identification information to the stack to be compared in the editable package library; updating the editable package library based on the original package library to restore the current identification information to the initial identification information, and the initial identification information includes the pattern information and coordinate information of each identification in the initial state; traversing and comparing the current identification information with the initial identification information to obtain the lost or shifted identification. The present invention can intuitively obtain the changes of all identification marks in the silk screen layer through one comparison, with good reliability and high efficiency.

[0060] It should be understood that the present invention is used to check in the ALLEGRO software whether the identification mark of the device is lost or shifted, and the identification mark is a polarity mark or a 1-pin mark.

[0061] The device of the present invention refers to a chip and a polar device, such as an electrolytic capacitor, a diode, a triode, an integrated circuit IC, etc. The device may have a polarity mark and / or a 1-pin mark. The polarity mark is used to indicate the positive and negative poles of the component, and the 1-pin mark is used to indicate the position of the first pin.

[0062] Polar components must be mounted on the PCB in a certain direction to ensure that the positive and negative poles of the device or the first pin of the device are consistent with the actual circuit of the PCB. If the mounting direction is incorrect, it will cause circuit failure, short circuit and burn of the component body, and circuit failure to work properly.

[0063] As an example, the identification mark may be a rectangle, a circle, "○", "▲", "+" or other symbols.

[0064] For a specific implementation, please refer to Figure 1 The silk screen marking inspection method of the present invention comprises:

[0065] S11: obtaining current identification mark information in the silk-screen layer from the editable package library, wherein the current identification mark information includes pattern information and coordinate information of each identification mark in the current state;

[0066] In the ALLEGRO software, the editable package library can be understood as the editable PACKAGEGEOMETRY class in the ALLEGRO software, and the current identification information can be obtained through the information of the shape attribute in the silk screen layer (SILKSCREEN).

[0067] S12: copying the current identification information to the stack to be compared in the editable package library;

[0068] S13: after the copying is performed, the editable package library is updated based on the original package library to restore the current identification mark information to the initial identification mark information, wherein the initial identification mark information includes pattern information and coordinate information of each identification mark in an initial state;

[0069] S14: traverse and compare the current identification information with the initial identification information to obtain the lost or displaced identification.

[0070] It can be seen that the present invention can intuitively obtain the changes of all identification marks in the silk-screen layer through one comparison, with good reliability and high efficiency.

[0071] Among them, in the silk-screen layer, the device and the corresponding identification mark are associated with each other; in the stacked layer to be compared, the device and the corresponding identification mark are not associated with each other.

[0072] Specifically, it can be understood that the identification mark and the device in the silk-screen layer have a joint attribute, and the information of the identification mark bound to the device can be found by selecting the device;

[0073] In the stack to be compared, only the pattern information and coordinate information of each of the identification marks are included.

[0074] On this basis, the method of updating the editable package library based on the original package library in step S13 includes:

[0075] The editable package library is updated so that the attribute information of the editable package library associated with the device is the same as the attribute information of the original package library associated with the device, wherein the attribute information includes the current identification information and the initial identification information.

[0076] It can be seen that the present invention obtains device information from the original package library of the device, and the update operation is used to restore the data of the device association relationship in the silk screen layer to the state before the PCB layout operation. However, this operation can only ensure that the silk screen layer has the correct number of polarity marks and 1-pin marks.

[0077] It should be understood that the number of polarity identifiers and the number of 1-pin identifiers in the current identification identifier information may be different from the number of polarity identifiers and the number of 1-pin identifiers in the initial identification identifier information.

[0078] To complete the inspection of the silk screen markings, you need to compare the positions of the front and rear polarity markings and the 1-pin marking.

[0079] In a specific implementation manner, the stack to be compared is a newly created stack or an assembled layer.

[0080] The present invention is not limited to this, and other stacking without joint properties may also be used. Those skilled in the art can select a suitable stacking as needed.

[0081] In practical applications, the silk-screen layer and the layer stack to be compared are both under the PACKAGEGEOMETRY class in the editable package layer.

[0082] Please refer to Figure 2 In one embodiment, the method of comparing the current identification information with the initial identification information in step S14 to obtain the lost or displaced identification includes:

[0083] S1411: Obtain the current identification information in the stack to be compared through the axlDBGetShapes function of the skill language.

[0084] The skill language is a secondary development language designed by Cadence for its software Allegro.

[0085] S1412: Obtain the initial identification information in the silk screen layer through the axlDBGetShapes function of the skill language, wherein the initial identification information also includes silk screen position number information corresponding to the identification.

[0086] If the silk-screen layer is the silk-screen bottom layer, in a specific calling example, all shape information in this stack can be obtained through axlDBGetShapes("PACKAGE GEOMETRY / SILKSCREEN_BOTTOM"), and the shape information includes the initial identification information.

[0087] S1413: Based on the initial identification information, obtain a first position list sorted by silk screen position number, wherein the first position list also includes coordinate information corresponding to the silk screen position number.

[0088] S1414: Based on the current identification mark information, obtain a second position list, where the second position list includes coordinate information of all identification marks in the stack to be compared.

[0089] S1415: Compare the coordinate information corresponding to each silk-screen position number with all the coordinate information in the second position list to determine whether the identification mark of each device is lost or shifted.

[0090] S1416: Obtain an unmatched list, wherein the unmatched list includes the number of missing identification marks, silk screen position number information where the identification marks are lost or shifted, and corresponding coordinate information.

[0091] In a specific implementation manner, the present invention can obtain the number of lost identification identifiers by comparing the number of identification identifiers in the current identification identifier information and the number of identification identifiers in the initial identification identifier information.

[0092] In practical applications, one identification mark corresponds to two coordinates. When determining whether the identification mark of each device is lost or shifted in the present invention, any one of the two coordinates can be arbitrarily selected as a comparison standard.

[0093] For a specific implementation, please refer to Figure 3For a single device, the method of comparing the coordinate information corresponding to the silk-screen position number with all the coordinate information in the second position list in step S145 to determine whether the identification mark of the device is lost or shifted includes:

[0094] S14151: Traverse and compare the coordinate information corresponding to the silk-screen position number with all the coordinate information in the second position list to find out in the second position list whether there is a coordinate whose deviation from the coordinate information corresponding to the silk-screen position number is less than or equal to the preset deviation value; if so, enter S1452; otherwise, enter S1453.

[0095] In a specific implementation, the preset deviation value is 11 mil. Of course, the present invention is not limited to this, and other deviation values ​​may also be used. Those skilled in the art may select a suitable value as needed.

[0096] S14152: Determine whether the identification mark of the device is normal.

[0097] Specifically, it can be understood that the identification mark of the device corresponding to the silk-screen number is normal.

[0098] S14153: Determine whether the identification mark of the device is lost or shifted.

[0099] Specifically, it can be understood that the identification mark of the device corresponding to the silk-screen number is lost or shifted.

[0100] It should be understood that the present invention is not limited to the specific traversal algorithm, which may be linear traversal, depth-first traversal, breadth-first traversal, etc. Those skilled in the art may select a suitable traversal algorithm as needed.

[0101] To facilitate the inspection by technicians, in a preferred implementation, please refer to Figure 4 After obtaining the unmatched list in step S1416, the method of the present invention further includes:

[0102] S1417: Displaying the initial identification information in a first color on the silk-screen layer, and displaying the current identification information in a second color on the layer to be compared, wherein the first color is different from the second color;

[0103] S1418: performing layer overlay processing on the silk-screen layer and the layer to be compared;

[0104] S1419: Based on the unmatched list, locate the device whose identification mark is lost or shifted.

[0105] As an example, the unmatched list may include silk screen position number information, stacking information, and initial identification coordinate information. By clicking on the silk screen position number in the unmatched list, the system can jump to the silk screen layer stacking design interface corresponding to the ALLEGRO software, and display and locate the position of the silk screen position number in the interface.

[0106] Therefore, the present invention can also clearly and intuitively check whether the identification mark is lost or shifted, and can also locate the shift point in the silk-screen layer as needed, which is convenient to operate.

[0107] In practical applications, after locating the device whose identification mark is lost or shifted in step S149, the method provided by the present invention further includes:

[0108] The shifted identification mark is modified and confirmed.

[0109] Now combined Figure 5 The effect of the silk screen marking inspection method for double-sided assembled PCB boards is described, including:

[0110] ①, which can be understood as the initial polarity mark;

[0111] ②, which can be understood as the polarity mark of the shift.

[0112] It can be seen that since the initial polarity mark is overlapped by other devices, the designer fine-tunes the polarity mark so that the coordinate deviation value between the shifted polarity mark and the original polarity mark is greater than the preset deviation value. The silk screen mark inspection method provided by the present invention can locate the change, allowing the designer to modify and confirm the change, thereby ensuring that the modified polarity mark (i.e., the shifted polarity mark) meets production requirements.

[0113] Therefore, the present invention can complete the inspection of the silk-screen mark of the printed circuit board while retaining the result of PCB design.

[0114] The method provided by the present invention is not only applicable to a PCB board assembled on one side, but also applicable to a PCB board assembled on both sides.

[0115] In one embodiment, the silk-screen layer includes a silk-screen top layer SILKSCREEN_TOP and a silk-screen bottom layer SILKSCREEN_BOTTOM, and the layer stack to be compared includes a silk-screen top layer to be compared and a silk-screen bottom layer to be compared.

[0116] In this case, the step S12 of copying the current identification information to the stack to be compared in the editable package library includes:

[0117] S121: copying the identification information of the silk-screen top layer to the top layer to be compared of the editable package library; and

[0118] S122: Copy the identification information of the silk-screen bottom layer to the bottom layer to be compared of the editable package library.

[0119] When the top layer to be compared and the bottom layer to be compared are the assembly top layer and the assembly bottom layer respectively, the above steps can be understood as follows in actual operation:

[0120] Copy the information with the attribute shape in the silkscreen top layer (PACKAGE GEOMETRY-SILKSCREEN_TOP) in the editable package library to the assembly top layer (ASSEMBLY_TOP stack);

[0121] Copy the shape information in the silkscreen bottom layer (PACKAGE GEOMETRY-SILKSCREEN_BOTTOM) in the editable package library to the assembly bottom layer (ASSEMBLY_BOTTOM stack).

[0122] In this case, the method of comparing the current identification information with the initial identification information in step S14 includes:

[0123] S1421: Compare the initial identification information in the silk-screen top layer with the current identification information in the top layer to be compared;

[0124] S1422: Compare the initial identification information in the silk-screen bottom layer with the current identification information in the bottom layer to be compared.

[0125] Therefore, the present invention can check layer by layer whether the identification mark is lost or shifted, thereby ensuring the accuracy of the inspection.

[0126] Specifically, the silk-screen top layer and the top layer to be compared may be subjected to layer overlay processing, and the silk-screen bottom layer and the bottom layer to be compared may be subjected to layer overlay processing. By selecting different overlay layers, layer-by-layer inspection of the silk-screen layer may be achieved.

[0127] In summary, the method provided by the present invention is used to check whether the polarity mark or 1-pin mark of the device is lost or shifted in the ALLEGRO software. The method includes obtaining the current identification mark information in the silk screen layer from the editable package library, and the current identification mark information includes the pattern information and coordinate information of each identification mark in the current state; copying the current identification mark information to the stack to be compared in the editable package library; updating the editable package library based on the original package library to restore the current identification mark information to the initial identification mark information, and the initial identification mark information includes the pattern information and coordinate information of each identification mark in the initial state; traversing and comparing the current identification mark information with the initial identification mark information to obtain the lost or shifted identification mark. The present invention can intuitively obtain the changes of all identification marks in the silk screen layer through one comparison, with good reliability and high efficiency.

[0128] Although the present invention is disclosed as above, the present invention is not limited thereto. Any person skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the scope defined by the claims.

Claims

1. A method for inspecting a silk screen mark, characterized in that: Used to check whether the identification mark of the device is lost or shifted in the ALLEGRO software, wherein the identification mark is a polarity mark or a 1-pin mark, the method comprises: Obtaining current identification mark information in the silk-screen layer from the editable package library, the current identification mark information including pattern information and coordinate information of each identification mark in the current state; Copying the current identification information to the stack to be compared in the editable package library; After the copying is performed, the editable package library is updated based on the original package library to restore the current identification information to the initial identification information, wherein the initial identification information includes pattern information and coordinate information of each identification in an initial state; The current identification information is traversed and compared with the initial identification information to obtain the lost or displaced identification.

2. The method for inspecting silk screen markings according to claim 1, characterized in that: In the silk-screen layer, the device is associated with the corresponding identification mark; in the stacked layer to be compared, the device is not associated with the corresponding identification mark; The method for updating the editable package library based on the original package library includes: The editable package library is updated so that the attribute information of the editable package library associated with the device is the same as the attribute information of the original package library associated with the device, wherein the attribute information includes the current identification information and the initial identification information.

3. The method for inspecting silk screen markings according to claim 2, characterized in that: The stack to be compared is a newly built stack or an assembled layer.

4. The method for inspecting silk screen markings according to claim 2, wherein: The method of comparing the current identification information with the initial identification information to obtain the lost or displaced identification includes: Obtain the current identification information in the stack to be compared by using the axlDBGetShapes function of the skill language; Obtain the initial identification information in the silk-screen layer through the axlDBGetShapes function of the skill language, wherein the initial identification information also includes silk-screen position number information corresponding to the identification; Based on the initial identification information, obtaining a first position list sorted by silk screen position number, wherein the first position list also includes coordinate information corresponding to the silk screen position number; Based on the current identification information, obtaining a second position list, wherein the second position list includes coordinate information of all identifications in the stack to be compared; Compare the coordinate information corresponding to each silk-screen position number with all the coordinate information in the second position list to determine whether the identification mark of each device is lost or shifted; An unmatched list is obtained, wherein the unmatched list includes the number of missing identification marks, silk screen position number information of the missing or shifted identification marks, and corresponding coordinate information.

5. The method for inspecting silk screen markings according to claim 4, characterized in that: The method of comparing the coordinate information corresponding to the silk-screen position number with all the coordinate information in the second position list to determine whether the identification mark of the device is lost or shifted includes: The coordinate information corresponding to the silk-screen position number is traversed and compared with all the coordinate information in the second position list to find out whether there is a coordinate in the second position list whose deviation from the coordinate information corresponding to the silk-screen position number is less than or equal to a preset deviation value; If yes, the identification mark of the device is normal; otherwise, the identification mark of the device is lost or shifted.

6. The method for inspecting silk screen markings according to claim 5, characterized in that: The preset deviation value is 11 mil.

7. The method for inspecting silk screen markings according to claim 4, characterized in that: After getting the unmatched list, also include: Displaying the initial identification information in a first color on the silk-screen layer, and displaying the current identification information in a second color on the to-be-compared stack, wherein the first color is different from the second color; Performing a layer overlay process on the silk-screen layer and the layer to be compared; Based on the unmatched list, the device with the identification mark lost or shifted is located.

8. The method for inspecting silk screen markings according to claim 4, characterized in that: After locating the device with the missing or displaced identification mark, the method further includes: The shifted identification mark is modified and confirmed.

9. The method for inspecting silk screen markings according to claims 1 to 8, characterized in that: The silk-screen layer includes a silk-screen top layer and a silk-screen bottom layer, and the stack to be compared includes a top layer to be compared and a bottom layer to be compared, and copying the current identification information to the stack to be compared of the editable package library includes: Copying the identification information of the silk-screen top layer to the top layer to be compared of the editable package library; and The identification information of the silk-screen bottom layer is copied to the bottom layer to be compared of the editable package library.

10. The method for inspecting silk screen markings according to claim 9, wherein: The method of comparing the current identification information with the initial identification information includes: Comparing the initial identification information in the silk-screen top layer with the current identification information in the top layer to be compared; and The initial identification information in the silk-screen bottom layer is compared with the current identification information in the bottom layer to be compared.

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