A solid state hard disk customized testing method, system, electronic device and medium

Abstract

A customized test method, system, electronic device and medium for solid-state hard disks, relating to the field of data processing technology. The method comprises: obtaining status data of a sample hard disk, the status data including the number of bad blocks, the number of erase and write times, and the read and write delay; generating a cyclic test instruction according to the number of erase and write times and the read and write delay, and determining the execution time of the cyclic test instruction based on the number of bad blocks; writing the cyclic test instruction into the non-bad block area of ​​multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data read and write operations respectively according to the execution time; obtaining the response delay of each solid-state hard disk after the data read and write operation, and calculating the delay growth rate corresponding to each solid-state hard disk based on each response delay and the read and write delay; determining any solid-state hard disk with a delay growth rate greater than the growth rate threshold as an abnormal hard disk. The implementation of the technical solution provided by the present application achieves the effect of improving the accuracy of solid-state hard disk testing.

Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a customized testing method, system, electronic device and medium for solid-state hard disks. Background Art

[0002] With the rapid development of information technology, solid-state drives have been widely used in personal computers, data centers, etc. due to their advantages such as high speed, low power consumption and high reliability. Especially in large-scale data centers, the performance and reliability of solid-state drives directly affect the stability of the entire system and data security.

[0003] At present, existing SSD testing methods usually use fixed testing standards to perform quality inspection on SSDs. However, in actual applications, due to the differences in the status of different batches of SSDs, it is often difficult to make adaptive adjustments to the testing standards when only fixed testing standards are used to perform quality inspection on SSDs, which can easily cause differences in the testing of different batches of SSDs, thereby reducing the accuracy of SSD testing. Summary of the invention

[0004] The present application provides a solid-state drive customized testing method, system, electronic device and medium, which can improve the accuracy of solid-state drive testing.

[0005] In a first aspect, the present application provides a customized testing method for a solid state drive, comprising:

[0006] Acquire status data of a sample hard disk, wherein the status data includes the number of bad blocks, the number of erase and write times, and the read and write delay;

[0007] Generate a loop test instruction according to the number of erase and write times and the read and write delay, and determine the execution time of the loop test instruction based on the number of bad blocks;

[0008] Writing the loop test instruction into the non-bad block areas of multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data reading and writing operations respectively according to the execution time;

[0009] Obtaining a response delay of each of the solid-state hard disks after the data read and write operations, and calculating a delay growth rate corresponding to each of the solid-state hard disks based on each of the response delays and the read and write delays;

[0010] Any solid state hard disk whose delay growth rate is greater than the growth rate threshold is determined as an abnormal hard disk.

[0011] In a second aspect of the present application, a solid state drive customized testing system is provided, the system comprising:

[0012] A data acquisition module, used to acquire status data of a sample hard disk, wherein the status data includes the number of bad blocks, the number of erase and write times, and the read and write delay;

[0013] A hard disk test module, used for generating a cycle test instruction according to the number of erase and write times and the read and write delay, and determining the execution time of the cycle test instruction based on the number of bad blocks; writing the cycle test instruction into the non-bad block areas of multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data read and write operations respectively according to the execution time;

[0014] A growth rate determination module, used to obtain the response delay of each of the solid state drives after the data read and write operations, and calculate the delay growth rate corresponding to each of the solid state drives based on each of the response delays and the read and write delays;

[0015] The hard disk identification module is used to determine any solid state disk whose delay growth rate is greater than a growth rate threshold as an abnormal hard disk.

[0016] In a third aspect of the present application, an electronic device is provided, comprising a memory, a processor, and a program stored in the memory and executable on the processor, wherein the program can implement a customized testing method for a solid-state hard disk when loaded and executed by the processor.

[0017] In a fourth aspect of the present application, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the processor implements a customized test method for a solid-state hard disk.

[0018] In summary, one or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:

[0019] By adopting the above technical solution, the status data of the sample hard disk is obtained, including the number of bad blocks, the number of erase and write times, and the read and write delay, so that the current health status of the solid-state hard disk can be fully understood. A cyclic test instruction is generated according to the number of erase and write times and the read and write delay, and the execution time of the test instruction is dynamically determined based on the number of bad blocks, so that the test process can accurately adapt to the actual use status of different hard disks. The cyclic test instruction is written into the non-bad block area of ​​multiple hard disks in the solid-state hard disk group to be tested, and the data read and write operations are performed respectively according to the execution time, which effectively avoids the interference of bad blocks on the test results, and ensures the comprehensiveness and effectiveness of the test. After obtaining the response delay of each solid-state hard disk after the data read and write operation, the delay growth rate is calculated based on the response delay and the initial read and write delay, which can quantitatively evaluate the performance changes of the hard disk during the test process. When the delay growth rate of a hard disk exceeds the preset growth rate threshold, it is promptly determined as an abnormal hard disk, thereby improving the detection accuracy of the abnormal hard disk and reducing the risk of misjudgment and missed judgment. By dynamically adjusting the test instructions and execution time, combined with the accurate calculation of the delay growth rate, the accuracy of the solid-state hard disk test is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 It is a flowchart of a customized solid-state hard disk test method provided in an embodiment of the present application;

[0021] Figure 2 It is a structural schematic diagram of a customized solid-state drive test system provided in an embodiment of the present application;

[0022] Figure 3 It is a structural schematic diagram of an electronic device provided in an embodiment of the present application.

[0023] Description of reference numerals: 300, electronic device; 301, processor; 302, communication bus; 303, user interface; 304, network interface; 305, memory. DETAILED DESCRIPTION

[0024] In order to enable technicians in this field to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below in conjunction with the drawings in the embodiments of this specification. Obviously, the described embodiments are only part of the embodiments of this application, not all of the embodiments.

[0025] In the description of the embodiments of the present application, words such as "for example" or "for example" are used to indicate examples, illustrations or explanations. Any embodiment or design described as "for example" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "for example" or "for example" is intended to present related concepts in a specific way.

[0026] In the description of the embodiments of the present application, the meaning of the term "multiple" refers to two or more. For example, multiple systems refer to two or more systems, and multiple screen terminals refer to two or more screen terminals. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. The terms "include", "comprise", "have" and their variations all mean "including but not limited to", unless otherwise specifically emphasized.

[0027] The present application embodiment provides a customized test method for a solid state drive. In one embodiment, please refer to Figure 1 , Figure 1 This is a flow chart of a customized solid-state drive test method provided in an embodiment of the present application. The method can be implemented by a computer program, which can be integrated into an application or run as an independent tool application. The method can also be implemented by a single-chip microcomputer or run on a customized solid-state drive test system based on the von Neumann system. Specifically, the method can include the following steps:

[0028] Step 101: Obtain status data of a sample hard disk, the status data including the number of bad blocks, the number of erase and write times, and the read and write delay.

[0029] The sample hard disk refers to a representative solid-state hard disk selected from the group of solid-state hard disks to be tested. Since different batches of solid-state hard disks may come from different production batches or have different usage histories, corresponding sample hard disks need to be selected for each batch of solid-state hard disks. For example, for solid-state hard disks from the same batch with similar usage time and usage environment, one of them can be randomly selected as the sample hard disk of the batch; for solid-state hard disks from different batches, sample hard disks from each batch need to be selected separately to ensure that the test parameters can accurately reflect the characteristics of each batch of solid-state hard disks.

[0030] Status data refers to key parameter indicators that reflect the current usage status of the sample hard disk. Specifically, it includes: the number of bad blocks, which is used to reflect the degree of wear and tear of the storage unit of the sample hard disk; the number of erase and write times, which is used to characterize the usage intensity of the sample hard disk; and the read and write delay, which is used to indicate the response speed of the sample hard disk when performing read and write operations. These status data together constitute the comprehensive evaluation indicators of the performance and health status of the sample hard disk, providing the necessary reference basis for generating customized test instructions.

[0031] Specifically, firstly, a sample hard disk is selected from the solid state hard disk group to be tested. Since different batches of solid state hard disks may come from different production batches or have different usage histories, corresponding sample hard disks need to be selected for each batch of solid state hard disks to ensure that the subsequent test parameters can accurately reflect the characteristics of each batch of solid state hard disks. Then, the status data of the sample hard disk is obtained, and the status data includes the number of bad blocks, the number of erases and writes, and the read and write delay. Among them, the number of bad blocks is obtained by reading the reallocated sector count value in the health monitoring system of the hard disk, which indicates the number of storage units that have been marked as unavailable; the number of erases and writes is obtained by reading the medium wear index, which reflects the number of times the storage unit is reused; the read and write delay is measured by continuously reading and writing data blocks of a preset size and recording the operation completion time, and the average read and write delay value can be obtained by dividing the measured time by the data block size. Since the solid state hard disk will gradually generate bad blocks during use, and the number of erases and writes will affect its performance life, and the read and write delay reflects the real-time performance status of the hard disk, the collection of these key parameters can fully reflect the health status of the sample hard disk. This data collection method based on actual status provides a reliable reference for the subsequent generation of customized test instructions, ensuring that the test process is more in line with the actual conditions of the hard disk being tested. The status data obtained in this way can not only truly reflect the usage characteristics of the sample hard disk, provide a basis for subsequent test parameter adjustments, avoid the deviations that may be caused by traditional fixed test standards, but also provide a benchmark reference value for evaluating the performance of other hard disks in the same batch.

[0032] Step 102: Generate a loop test instruction according to the number of erase and write times and the read and write delay, and determine the execution time of the loop test instruction based on the number of bad blocks.

[0033] Among them, the loop test instruction refers to a set of instruction sequences that perform repeated read and write operations on the solid-state drive. This set of instruction sequences includes two basic operations: writing data and reading data. The number of write instructions and the time interval between write instructions are dynamically determined based on the number of erase and write times and the read and write delay of the sample hard disk. For example, when the number of erase and write times of the sample hard disk is high, the number of write instructions will be reduced accordingly to reduce the test intensity; when the read and write delay is large, the time interval between write instructions will be increased accordingly to avoid too intensive operations. This loop test instruction can simulate the read and write load of the solid-state drive during actual use by repeatedly executing it.

[0034] The execution time refers to the duration of the repeated execution of the loop test instructions. This time is calculated by multiplying the benchmark execution time by the bad block decay factor, where the benchmark execution time is the pre-set standard test time, and the bad block decay factor reflects the actual status of the hard disk's available space.

[0035] Specifically, after obtaining the status data of the sample hard disk, it is necessary to generate a cyclic test instruction according to its erase and write times and read and write delay, and determine the execution time of the cyclic test instruction based on the number of bad blocks. Specifically, first obtain a preset erase and write times range and a preset delay range, which are divided into multiple sub-intervals respectively, for adapting to solid-state hard disks in different states. Then, according to the sub-interval where the erase and write times of the sample hard disk are located in the preset erase and write times range, determine the corresponding number of write instructions; at the same time, according to the sub-interval where the read and write delay of the sample hard disk is located in the preset delay range, determine the corresponding write instruction time interval. The determined number of write instructions and the write instruction time interval are used as instruction parameters to generate the corresponding cyclic test instruction. This method of generating test instructions based on actual parameters can match the test intensity with the current state of the hard disk and avoid excessive or insufficient testing. Then, obtain the benchmark execution time, and calculate the available space ratio of the sample hard disk according to the number of bad blocks. Based on the preset attenuation coefficient and the available space ratio, determine the bad block attenuation factor, and use the product of the benchmark execution time and the bad block attenuation factor as the execution time of the cyclic test instruction. In this way, the test duration can be dynamically adjusted according to the actual available space of the hard disk. When the number of bad blocks is large, the test time can be appropriately shortened to avoid additional burden on the damaged storage area. The loop test instructions generated in this way take into account both the usage intensity and performance status of the hard disk and the degree of physical wear of the hard disk, making the test process more scientific and reasonable, and accurately reflecting the actual performance and reliability level of the solid-state drive to be tested. At the same time, this customized test method can also improve test efficiency and avoid additional wear on the hard disk caused by invalid tests.

[0036] Based on the above embodiment, as an optional embodiment, in step 102: generating a cycle test instruction according to the number of erase and write times and the read and write delay, this step may also include the following steps:

[0037] Step 201: obtaining a preset range of erase / write times and a preset delay range, wherein the preset range of erase / write times and the preset delay range respectively include a plurality of sub-ranges.

[0038] Specifically, first obtain the preset erase and write times range and the preset delay range, both of which are divided into multiple sub-ranges to adapt to SSDs in different states. For example, the preset erase and write times range can be set to 0 to 10,000 times, and is divided into five sub-ranges: 0-2000 times as the first sub-range, 2001-4000 times as the second sub-range, 4001-6000 times as the third sub-range, 6001-8000 times as the fourth sub-range, and 8001-10000 times as the fifth sub-range; the preset delay range can be set to 0 milliseconds to 100 milliseconds, and is also divided into five sub-ranges: 0-20 milliseconds as the first sub-range, 21-40 milliseconds as the second sub-range, 41-60 milliseconds as the third sub-range, 61-80 milliseconds as the fourth sub-range, and 81-100 milliseconds as the fifth sub-range. This interval division method can adopt corresponding test strategies for hard disks in different usage states.

[0039] Step 202: Determine the corresponding number of write instructions according to the sub-interval of the erase and write times of the sample hard disk in the preset erase and write times range, and determine the corresponding write instruction time interval according to the sub-interval of the read and write delay of the sample hard disk in the preset delay range.

[0040] Specifically, it is necessary to determine the number of write instructions and the time interval of write instructions according to the specific state of the sample hard disk. First, determine which sub-interval of the preset erase and write times the erase and write times of the sample hard disk falls into. For example, when the erase and write times are 3000 times, it falls into the second sub-interval, and the number of write instructions can be set to 800 at this time; when the erase and write times are 7000 times, it falls into the fourth sub-interval, and the number of write instructions can be set to 400 at this time, reflecting the principle of reducing the test intensity as the erase and write times increase. Similarly, determine the sub-interval in which the sample hard disk is located according to its read and write delay. For example, when the read and write delay is 30 milliseconds, it falls into the second sub-interval, and the time interval of write instructions can be set to 50 milliseconds; when the read and write delay is 70 milliseconds, it falls into the fourth sub-interval, and the time interval of write instructions can be set to 100 milliseconds, reflecting the principle of increasing the instruction interval as the delay increases.

[0041] Step 203: Generate corresponding loop test instructions by taking the number of write instructions and the time interval of write instructions as instruction parameters.

[0042] Specifically, the determined number of write instructions and the time interval of write instructions are used as instruction parameters to generate corresponding cyclic test instructions. A corresponding number of data write instructions are generated specifically according to the number of write instructions, each write instruction is followed by a read instruction for verifying the correctness of the written data, and the execution interval between instructions is set according to the determined write instruction time interval. For example, when the number of write instructions is 600 and the time interval of write instructions is 80 milliseconds, the generated cyclic test instructions will contain 600 pairs of read and write instructions, and each pair of instructions will be executed at an interval of 80 milliseconds. This cyclic test instruction generated according to actual parameters not only ensures the effectiveness of the test, but also avoids excessive wear and tear on the hard disk.

[0043] Based on the above embodiment, as an optional embodiment, in step 102: determining the execution time of the loop test instruction based on the number of bad blocks, this step may also include the following steps:

[0044] Step 204: Obtain the benchmark execution time; calculate the available space ratio of the sample hard disk according to the number of bad blocks.

[0045] Specifically, first obtain the preset benchmark execution time. For example, the benchmark execution time can be set to 60 minutes. This time is determined based on the standard time required for the solid-state drive to complete a full round of testing under normal conditions. Then calculate the percentage of available space based on the number of bad blocks of the sample hard disk. The specific calculation method is to subtract the number of bad blocks from the total number of storage blocks, and then divide it by the total number of storage blocks. For example, when a solid-state drive with a capacity of 1000GB has 100 bad blocks, assuming that the size of each storage block is 1MB, the total number of storage blocks is 1024000. At this time, the percentage of available space is (1024000-100) / 1024000, which is approximately equal to 0.9999. This calculation method can accurately reflect the actual available status of the hard disk storage space and provide a basis for the subsequent determination of the execution time.

[0046] Based on the above embodiment, as an optional embodiment, in step 204: calculating the available space ratio of the sample hard disk according to the number of bad blocks, this step may also include the following steps:

[0047] Step 214: Obtain the total number of blocks and the capacity of a single block of the sample hard disk; determine the total storage capacity as the product of the total number of blocks and the capacity of a single block, and determine the loss capacity as the product of the number of bad blocks and the capacity of a single block.

[0048] Specifically, in order to accurately calculate the storage status of the sample hard disk, it is first necessary to obtain the two basic parameters of the total number of blocks and the single-block capacity of the sample hard disk. For example, the total number of blocks of a certain model of solid-state hard disk is 1024000, and the capacity of each storage block is 1MB. Based on these two parameters, by multiplying the total number of blocks by the single-block capacity, the total storage capacity of the hard disk can be calculated, which is 1024000×1MB=1000GB in this example. At the same time, by multiplying the known number of bad blocks by the single-block capacity, the loss capacity caused by the bad blocks can be obtained. For example, when the number of bad blocks is 100, the loss capacity is 100×1MB=100MB. This calculation method can intuitively reflect the storage space composition of the hard disk and provide basic data for evaluating the actual available status of the hard disk.

[0049] Step 224: Divide the capacity difference between the total storage capacity and the lost capacity by the total storage capacity to obtain the available space ratio of the sample hard disk.

[0050] Specifically, in order to obtain a more representative available space indicator, it is necessary to calculate the percentage of available space of the sample hard disk. The specific calculation method is to subtract the lost capacity from the total storage capacity to obtain the actual available capacity, and then divide the available capacity by the total storage capacity. For example, when the total storage capacity is 1000GB and the lost capacity is 100MB, first calculate the capacity difference as 1000GB-100MB=999.9GB, and then divide 999.9GB by 1000GB to obtain the available space percentage of 0.9999. This percentage expression can not only intuitively reflect the health of the hard disk, but also serve as an important basis for determining the subsequent test parameters, which is helpful to formulate a more reasonable test strategy.

[0051] Step 205: Determine a bad block attenuation factor based on a preset attenuation coefficient and the available space ratio; and use the product of the benchmark execution time and the bad block attenuation factor as the execution time of the loop test instruction.

[0052] Specifically, the bad block attenuation factor is first determined based on the preset attenuation coefficient and the percentage of available space. The preset attenuation coefficient can be set to 0.5, which means that when the hard disk is completely damaged, the test duration will be reduced to half of the benchmark duration. The calculation formula for the bad block attenuation factor is: 1-preset attenuation coefficient × (1-available space percentage). For example, when the preset attenuation coefficient is 0.5 and the available space percentage is 0.9999, the calculated bad block attenuation factor is 0.99995. Then multiply the benchmark execution duration by the bad block attenuation factor to obtain the actual execution duration of the loop test instruction. Continuing with the above example, when the benchmark execution duration is 60 minutes, the final execution duration is 60×0.99995=59.997 minutes. This method of dynamically adjusting the execution duration can reasonably allocate the test time according to the actual condition of the hard disk, which not only ensures the adequacy of the test, but also avoids excessive testing of the damaged storage area, thereby improving the pertinence and efficiency of the test.

[0053] Step 103: Write the loop test instruction into the non-bad block area of ​​multiple solid state drives in the solid state drive group to be tested and perform data read and write operations respectively according to the execution time.

[0054] The SSD group to be tested refers to a collection of SSDs that need to undergo performance testing. These SSDs have the same model, capacity, and production batch. They have been in similar usage environments and for similar lengths of time, and their performance and reliability levels need to be evaluated using a unified test method. Each SSD in the SSD group to be tested will receive a cyclic test instruction generated based on the sample hard drive status characteristics to ensure uniform testing standards and comparability of results.

[0055] The non-bad block area refers to the storage area in the SSD where data can still be read and written normally. The health monitoring system of the SSD can obtain the bad block distribution information, and the remaining storage area after excluding the location of these bad blocks is the non-bad block area. The storage units in these areas remain intact and can accurately perform data write and read operations, which is an effective area for performance testing.

[0056] Specifically, after generating a cyclic test instruction and determining the execution time, it is necessary to write the cyclic test instruction into multiple solid-state hard disks in the solid-state hard disk group to be tested and perform the test. First, by reading the health monitoring system of each solid-state hard disk to be tested, its bad block distribution information is obtained, and the non-bad block area that can be used to write the test instruction is determined. Then, the generated cyclic test instruction is written into the non-bad block area of ​​each solid-state hard disk, so that the test can be avoided on the damaged storage area and the effectiveness of the test can be improved. Then, according to the previously determined execution time, the data read and write operations are performed on each solid-state hard disk respectively. During the execution process, the system will cyclically execute the data writing and reading verification operations according to the setting of the number of write instructions and the time interval of the write instructions. For example, when the execution time is 60 minutes, the system will repeatedly execute the preset read and write instruction sequence within this time period. Since the test instruction is generated according to the state characteristics of the sample hard disk, and the test area is limited to the non-bad block area, this test method can accurately reflect the performance status of the solid-state hard disk group to be tested. At the same time, since the same test instruction and execution time are used for each solid-state hard disk, the test results have good comparability, which is convenient for subsequent performance analysis and evaluation. This targeted testing method not only improves testing efficiency, but also maximizes the protection of the solid-state drive under test and avoids further degradation of hard drive performance due to excessive testing.

[0057] Based on the above embodiment, as an optional embodiment, in step 103: writing the loop test instruction into the non-bad block area of ​​multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data read and write operations respectively according to the execution time, this step may also include the following steps:

[0058] Step 301: Divide the solid state drive group to be tested into multiple test batches; obtain the bad block address table corresponding to the solid state drives in each test batch.

[0059] Specifically, in order to improve test efficiency and reasonably allocate test resources, it is necessary to divide the solid-state drive group to be tested into multiple test batches, each test batch contains a fixed number of solid-state drives. For example, when the solid-state drive group to be tested contains 100 hard drives, it can be divided into 10 test batches, each batch containing 10 hard drives. After the division is completed, the bad block address table of each solid-state drive is obtained through the health monitoring system of each solid-state drive. The bad block address table records the specific physical addresses of all bad blocks in each solid-state drive. This address information is crucial for the subsequent determination of storage areas that can be used for testing. For example, the bad block address table of a solid-state drive may record multiple discontinuous bad block address segments, such as 0x1000-0x1FFF, 0x5000-0x5FFF, etc. This information will be used to plan the distribution of the test area.

[0060] Step 302: Based on each bad block address table, determine the data writing start address corresponding to the non-bad block area of ​​each solid state drive.

[0061] Specifically, the system determines the data write start address for each solid-state drive based on the acquired bad block address table. The specific method is to first sort the address segments in the bad block address table from small to large, and then select a sufficiently large storage area as the test area in the continuous available space before the first bad block address or between adjacent bad block addresses, and set the start address of the area as the data write start address. For example, when the first bad block address segment of a solid-state drive is 0x1000-0x1FFF, 0x0000 can be set as the data write start address, and ensure that the continuous space starting from this address is sufficient to store the amount of data required for the test. This method can ensure that the test data is written to a completely available storage area to avoid conflicts with bad blocks.

[0062] Step 303: Write the loop test instructions into the corresponding data write start address in sequence according to each test batch and execute the data read and write operation of the execution time.

[0063] Specifically, the system tests the SSDs in each batch in turn according to the divided test batches. First, write the cyclic test instructions to the predetermined data write start address of each SSD, and then perform data read and write operations according to the set execution duration. For example, for the 10 SSDs in the first test batch, the system will simultaneously write the test instructions to the start addresses of these hard drives, and synchronously start the data read and write operations lasting 60 minutes. After the first batch of tests is completed, the same operation is performed on the second batch of SSDs. This batched testing method not only improves the parallel efficiency of the test, but also avoids excessive occupation of system resources. At the same time, it ensures that each SSD can complete the test in the most suitable storage area, thereby improving the accuracy of the test results.

[0064] Step 104: Obtain the response delay of each solid-state drive after the data read and write operation, and calculate the delay growth rate corresponding to each solid-state drive based on each response delay and the read and write delay.

[0065] The response delay refers to the time required for each SSD in the SSD group to be tested to complete the corresponding operation from receiving the read / write instruction to completing the corresponding operation when executing the cyclic test instruction to perform data read / write operations. Specifically, when the system sends a data read or write instruction to the SSD, it records the time when the instruction is sent, and when the SSD completes the corresponding data read or write operation, it records the time when the operation is completed. The time difference between the two times is the response delay of the SSD.

[0066] The latency growth rate refers to the percentage increase in the response latency of each SSD in the SSD group under test after executing the cyclic test command relative to the read and write latency of the sample hard drive. It is calculated by comparing the response latency after the test with the benchmark read and write latency, and reflects the degree of performance degradation of the SSD under test.

[0067] Specifically, in order to evaluate the performance change of each SSD in the SSD group to be tested, it is necessary to obtain the response delay data of each SSD after completing the data read and write operation. Response delay refers to the actual response time when the SSD executes the read and write instructions, which can be obtained through the performance monitoring module of the hard disk. For example, for a certain SSD, the system records its response time when executing the same read and write instructions during the test, assuming it is 2 milliseconds. By comparing this response delay with the read and write delay of the sample hard disk obtained previously, the delay growth rate of the SSD can be calculated. The specific calculation method is to subtract the read and write delay from the response delay, and then divide it by the read and write delay. For example, when the read and write delay is 1.5 milliseconds and the response delay is 2 milliseconds, the delay growth rate is (2-1.5) / 1.5=33.33%. In this way, the degree of performance change of each SSD after the test can be clearly reflected. The higher the delay growth rate, the more serious the performance degradation of the hard disk. This evaluation method based on actual test data can accurately reflect the performance status of each SSD and provide a reliable basis for subsequent classification and screening.

[0068] Based on the above embodiment, as an optional embodiment, in step 104: based on each response delay and read / write delay, the delay growth rate corresponding to each solid state drive is calculated. This step may also include the following steps:

[0069] Step 401: extract the corresponding read operation delay and write operation delay of the solid state drive from each response delay; calculate the first difference between the read operation delay and the read and write delay of each solid state drive, and the second difference between the write operation delay and the read and write delay of each solid state drive.

[0070] Specifically, in order to more accurately analyze the performance changes of the solid-state drive, the response delay needs to be subdivided into two specific indicators: read operation delay and write operation delay. The system first records the read and write operation time of each solid-state drive in the process of executing the loop test instruction through the performance monitoring module, and stores these time data in the performance log. For example, for a solid-state drive, the average response time recorded in multiple read operations is 1.8 milliseconds, which is the read operation delay of the hard disk; similarly, the average response time recorded in multiple write operations is 2.2 milliseconds, which is the write operation delay. After obtaining these specific delay data, it is necessary to calculate the difference between them and the standard read and write delay of the sample hard disk. Assuming that the read and write delay of the sample hard disk is 1.5 milliseconds, the first difference of the read operation of the solid-state drive is calculated as 1.8-1.5=0.3 milliseconds, and the second difference of the write operation is calculated as 2.2-1.5=0.7 milliseconds. This separate calculation method can not only more accurately reflect the performance changes of the solid-state drive under different operation types, but also help identify whether the solid-state drive has an imbalance in read and write performance.

[0071] Step 402: Divide the first difference of each solid state drive by the read and write delay to obtain a corresponding read delay growth rate, and divide the second difference of each solid state drive by the read and write delay to obtain a corresponding write delay growth rate.

[0072] Specifically, the system needs to convert the calculated first difference and second difference into a standardized growth rate index to facilitate performance comparison between different SSDs. The specific calculation process is to divide the first difference by the read and write delay of the sample hard disk to obtain the read delay growth rate of the SSD; similarly, divide the second difference by the read and write delay of the sample hard disk to obtain the write delay growth rate. For example, the read delay growth rate of the SSD is calculated as 0.3 / 1.5=20%, indicating that its read performance is reduced by 20% relative to the sample hard disk; the write delay growth rate is calculated as 0.7 / 1.5≈46.7%, indicating that its write performance is reduced by 46.7% relative to the sample hard disk. Through this standardized processing, the basic performance differences between hard disks of different specifications can be eliminated, making the comparison of performance degradation more objective and effective. At the same time, this separate calculation method can also help technicians quickly locate specific performance problems that may exist in the SSD, providing an important reference for subsequent fault diagnosis and maintenance.

[0073] Step 403: Perform weighted calculation on the read delay growth rate and the write delay growth rate of each solid state drive to obtain a corresponding delay growth rate.

[0074] Specifically, considering that in actual application scenarios, the degree of influence of read operations and write operations on system performance may be different, it is necessary to perform weighted calculation on the read delay growth rate and the write delay growth rate to obtain a comprehensive delay growth rate with more practical reference value. According to the actual use scenario and performance requirements of the solid-state drive, the system can flexibly set the weight coefficients of read and write operations. For example, in data-intensive application scenarios, the read operation weight can be set to 0.4 and the write operation weight can be set to 0.6, indicating that the write performance has a greater impact on the overall performance. For the solid-state drive in the example, its final delay growth rate is calculated as: read delay growth rate × 0.4 + write delay growth rate × 0.6, that is, 20% × 0.4 + 46.7% × 0.6 ≈ 36%. Through this weighted calculation method, not only can a performance evaluation result that is more in line with actual application requirements be obtained, but also the evaluation criteria can be optimized by adjusting the weight coefficient according to different application scenario requirements. This flexible evaluation method can provide a more accurate basis for the performance grading and screening of solid-state drives, and also help ensure that the screened solid-state drives can better meet actual application requirements.

[0075] Step 105: Determine any solid state drive with a delay growth rate greater than a growth rate threshold as an abnormal hard drive.

[0076] Specifically, in order to accurately identify the hard disks with substandard performance in the SSD group to be tested, it is necessary to compare the calculated delay growth rate of each SSD with the preset growth rate threshold. The growth rate threshold is a performance judgment standard determined based on the actual application scenario requirements and historical test data. For example, the growth rate threshold can be set to 50%. After the system completes the calculation of the delay growth rate of all hard disks in the SSD group to be tested, it will compare the delay growth rate of each hard disk with this threshold in turn. Assuming that the delay growth rate of a certain SSD after weighted calculation is 65%, which exceeds the preset 50% threshold, the system will mark the hard disk as an abnormal hard disk. This threshold-based judgment method can quickly screen out SSDs with serious performance degradation and avoid putting hard disks with substandard performance into actual use. In order to improve the accuracy of the judgment, the system can also dynamically adjust the growth rate threshold according to different application scenarios and performance requirements. For example, for server applications with higher requirements, the threshold can be adjusted to 30%, while for ordinary consumer applications, the threshold can be set to 60%. This flexible threshold adjustment mechanism can not only meet the performance requirements in different scenarios, but also improve the efficiency and accuracy of SSD screening. Abnormal hard disks identified in this way can be isolated or maintained in a timely manner, thus avoiding system failures caused by hard disk performance problems and improving the reliability and stability of the overall system.

[0077] Based on the above embodiment, as an optional embodiment, in step 105: any solid state drive with a delay growth rate greater than a growth rate threshold is determined as an abnormal hard drive. After this step, the following steps may also be included:

[0078] Step 106: Calculate the growth rate difference between the delay growth rate of the abnormal hard disk and the growth rate threshold.

[0079] Specifically, in order to further evaluate the performance degradation of abnormal hard disks, the system needs to calculate the difference between the delay growth rate of the abnormal hard disk and the growth rate threshold. This calculation process is to subtract the preset growth rate threshold from the actual delay growth rate of the abnormal hard disk to obtain a specific growth rate difference. For example, when the delay growth rate of a solid-state drive that is judged to be abnormal is 75%, and the system preset growth rate threshold is 50%, the growth rate difference of the hard disk can be calculated to be 75%-50%=25%. This difference intuitively reflects the specific extent to which the performance of the abnormal hard disk exceeds the normal range, and provides a quantitative basis for the subsequent loss level determination. By calculating the growth rate difference, the system can more accurately distinguish the performance differences between different abnormal hard disks, avoid treating abnormal hard disks with different degrees of performance degradation in the same way, and thus achieve more targeted hard disk management and maintenance strategies.

[0080] Step 107: Based on a preset hard disk wear level mapping table, determine the hard disk wear level corresponding to the growth rate difference.

[0081] Specifically, the system needs to determine the specific loss level of the abnormal hard disk based on the calculated growth rate difference and the pre-configured hard disk loss level mapping table. The hard disk loss level mapping table is a grading standard developed based on historical data and actual experience, which defines in detail the loss levels corresponding to different growth rate difference intervals. For example, the loss level can be divided into three levels: mild loss, moderate loss, and severe loss. When the growth rate difference is between 0% and 20%, it is judged as mild loss, when it is between 20% and 40%, it is judged as moderate loss, and when it exceeds 40%, it is judged as severe loss. For the abnormal hard disk with a growth rate difference of 25% mentioned above, it can be determined that it belongs to the moderate loss level according to the mapping table. This grading method based on the mapping table can convert quantitative performance data into qualitative loss level assessment results, so that technicians can more intuitively understand the status of the abnormal hard disk and formulate corresponding treatment plans accordingly. At the same time, this division of wear levels also makes it easier for the system to adopt differentiated processing strategies according to different degrees of wear, such as retesting and evaluating hard disks with slight wear, timely maintenance of hard disks with moderate wear, and direct replacement of hard disks with severe wear, thereby improving the system's maintenance efficiency and resource utilization.

[0082] Reference Figure 2, is a customized solid-state hard disk test system provided in an embodiment of the present application, the system comprises: a data acquisition module, a hard disk test module, a growth rate determination module, and a hard disk identification module, wherein:

[0083] A data acquisition module is used to obtain status data of a sample hard disk, including the number of bad blocks, the number of erase and write times, and the read and write delay;

[0084] The hard disk test module is used to generate a cycle test instruction according to the number of erase and write times and the read and write delay, and determine the execution time of the cycle test instruction based on the number of bad blocks; write the cycle test instruction into the non-bad block area of ​​multiple solid-state hard disks in the solid-state hard disk group to be tested and perform data read and write operations respectively according to the execution time;

[0085] A growth rate determination module, used to obtain the response delay of each solid state drive after the data read and write operation, and calculate the delay growth rate corresponding to each solid state drive based on each response delay and the read and write delay;

[0086] The hard disk identification module is used to determine any solid state disk whose delay growth rate is greater than a growth rate threshold as an abnormal hard disk.

[0087] Based on the above embodiment, the hard disk test module is also used to obtain a preset erase and write number range and a preset delay range, and the preset erase and write number range and the preset delay range respectively include multiple sub-intervals; according to the sub-interval in which the erase and write number of the sample hard disk is located in the preset erase and write number range, the corresponding number of write instructions is determined, and according to the sub-interval in which the read and write delay of the sample hard disk is located in the preset delay range, the corresponding write instruction time interval is determined; and the corresponding loop test instruction is generated using the write instruction number and the write instruction time interval as instruction parameters.

[0088] Based on the above embodiment, the hard disk test module is also used to obtain the benchmark execution time; calculate the available space ratio of the sample hard disk according to the number of bad blocks; determine the bad block attenuation factor based on the preset attenuation coefficient and the available space ratio; and use the product of the benchmark execution time and the bad block attenuation factor as the execution time of the loop test instruction.

[0089] Based on the above embodiment, the hard disk testing module is also used to obtain the total number of blocks and the single-block capacity of the sample hard disk; the product of the total number of blocks and the single-block capacity is determined as the total storage capacity, and the product of the number of bad blocks and the single-block capacity is determined as the loss capacity; the capacity difference between the total storage capacity and the loss capacity is divided by the total storage capacity to obtain the available space ratio of the sample hard disk.

[0090] Based on the above embodiments, the hard disk test module is also used to divide the solid-state hard disk group to be tested into multiple test batches; obtain the bad block address table corresponding to the solid-state hard disks in each test batch; based on each bad block address table, determine the data write start address corresponding to the non-bad block area of ​​each solid-state hard disk; write the cyclic test instructions into the corresponding data write start address in turn according to each test batch and execute the data read and write operations of the execution time.

[0091] Based on the above embodiment, the growth rate determination module is also used to extract the corresponding read operation delay and write operation delay of the solid-state hard disk from each response delay; calculate the first difference between the read operation delay and the read and write delay of each solid-state hard disk, and the second difference between the write operation delay and the read and write delay of each solid-state hard disk; divide the first difference of each solid-state hard disk by the read and write delay to obtain the corresponding read delay growth rate, and divide the second difference of each solid-state hard disk by the read and write delay to obtain the corresponding write delay growth rate; perform weighted calculation on the read delay growth rate and write delay growth rate of each solid-state hard disk to obtain the corresponding delay growth rate.

[0092] Based on the above embodiment, the hard disk identification module is also used to calculate the growth rate difference between the delay growth rate of the abnormal hard disk and the growth rate threshold; based on the preset hard disk loss level mapping table, determine the hard disk loss level corresponding to the growth rate difference.

[0093] It should be noted that: when the device provided in the above embodiment realizes its function, only the division of the above functional modules is used as an example. In actual application, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device is divided into different functional modules to complete all or part of the functions described above. In addition, the device and method embodiments provided in the above embodiment belong to the same concept, and the specific implementation process is detailed in the method embodiment, which will not be repeated here.

[0094] The present application also discloses an electronic device. Figure 3 , Figure 3 The electronic device 300 may include: at least one processor 301 , at least one network interface 304 , a user interface 303 , a memory 305 , and at least one communication bus 302 .

[0095] The communication bus 302 is used to realize the connection and communication between these components.

[0096] The user interface 303 may include a display interface and a camera interface. Optionally, the user interface 303 may also include a standard wired interface and a wireless interface.

[0097] The network interface 304 may optionally include a standard wired interface or a wireless interface (such as a WI-FI interface).

[0098] Among them, the processor 301 may include one or more processing cores. The processor 301 uses various interfaces and lines to connect various parts in the entire server, and executes various functions of the server and processes data by running or executing instructions, programs, code sets or instruction sets stored in the memory 305, and calling data stored in the memory 305. Optionally, the processor 301 can be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), and programmable logic array (Programmable Logic Array, PLA). The processor 301 can integrate one or a combination of a central processing unit (Central Processing Unit, CPU), a graphics processing unit (Graphics Processing Unit, GPU) and a modem. Among them, the CPU mainly processes the operating system, user interface diagrams and applications, etc.; the GPU is responsible for rendering and drawing the content to be displayed on the display screen; the modem is used to process wireless communications. It can be understood that the above-mentioned modem may not be integrated into the processor 301, and it can be implemented separately through a chip.

[0099] Among them, the memory 305 may include a random access memory (Random Access Memory, RAM) and may also include a read-only memory (Read-Only Memory). Optionally, the memory 305 includes a non-transitory computer-readable storage medium. The memory 305 can be used to store instructions, programs, codes, code sets or instruction sets. The memory 305 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above-mentioned various method embodiments, etc.; the data storage area may store data involved in the above-mentioned various method embodiments, etc. The memory 305 may optionally also be at least one storage device located away from the aforementioned processor 301. Refer to Figure 3 , the memory 305 as a computer storage medium may include an operating system, a network communication module, a user interface module and an application program for a customized test method for a solid state drive.

[0100] exist Figure 3 In the electronic device 300 shown, the user interface 303 is mainly used to provide an input interface for the user and obtain the data input by the user; and the processor 301 can be used to call an application program storing a customized test method for a solid-state hard disk in the memory 305, and when executed by one or more processors 301, the electronic device 300 executes one or more methods in the above-mentioned embodiments. It should be noted that for the aforementioned method embodiments, for the sake of simple description, they are all expressed as a series of action combinations, but those skilled in the art should know that the present application is not limited to the described order of actions, because according to the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required for the present application.

[0101] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0102] In the several embodiments provided in this application, it should be understood that the disclosed devices can be implemented in other ways. For example, the device embodiments described above are only schematic, such as the division of units, which is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some service interfaces, and the indirect coupling or communication connection of devices or units can be electrical or other forms.

[0103] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0104] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0105] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable memory. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, which is stored in a memory and includes several instructions for a computer device (which can be a personal computer, server or network device, etc.) to execute all or part of the steps of the various embodiments of the present application. The aforementioned memory includes: various media that can store program codes, such as USB flash drives, mobile hard drives, magnetic disks or optical disks.

[0106] The above are only exemplary embodiments of the present disclosure and cannot be used to limit the scope of the present disclosure. That is, any equivalent changes and modifications made according to the teachings of the present disclosure are still within the scope of the present disclosure. After considering the disclosure of the specification and practice, those skilled in the art will easily think of other embodiments of the present disclosure.

[0107] This application is intended to cover any variation, use or adaptation of the present disclosure, which follows the general principles of the present disclosure and includes common knowledge or customary technical means in the art not recorded in the present disclosure. The description and examples are to be regarded as exemplary only.

Claims

1. A customized test method for a solid state drive, characterized in that: include: Acquire status data of a sample hard disk, wherein the status data includes the number of bad blocks, the number of erase and write times, and the read and write delay; Generate a loop test instruction according to the number of erase and write times and the read and write delay, and determine the execution time of the loop test instruction based on the number of bad blocks; Writing the loop test instruction into the non-bad block areas of multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data reading and writing operations respectively according to the execution time; Obtaining a response delay of each of the solid-state hard disks after the data read and write operations, and calculating a delay growth rate corresponding to each of the solid-state hard disks based on each of the response delays and the read and write delays; Determine any solid state drive whose delay growth rate is greater than a growth rate threshold as an abnormal hard drive; The generating a cycle test instruction according to the erase and write times and the read and write delay comprises: Obtaining a preset erasing and writing times range and a preset delay range, wherein the preset erasing and writing times range and the preset delay range respectively include a plurality of sub-ranges; Determine the corresponding number of write instructions according to the sub-interval of the number of erase and write times of the sample hard disk within the preset erase and write number range, and determine the corresponding write instruction time interval according to the sub-interval of the read and write delay of the sample hard disk within the preset delay range; Using the number of write instructions and the time interval of the write instructions as instruction parameters to generate a corresponding loop test instruction; The step of determining the execution time of the loop test instruction based on the number of bad blocks includes: Get the benchmark execution time; Calculate the available space ratio of the sample hard disk according to the number of bad blocks; Determine a bad block attenuation factor based on a preset attenuation coefficient and the available space ratio; The product of the benchmark execution time and the bad block attenuation factor is used as the execution time of the loop test instruction.

2. The customized testing method for solid state drives according to claim 1, characterized in that: Calculating the available space ratio of the sample hard disk according to the number of bad blocks includes: Obtain the total number of blocks and the capacity of a single block of the sample hard disk; Determine the total storage capacity by multiplying the total number of blocks by the capacity of the single block, and determine the loss capacity by multiplying the number of bad blocks by the capacity of the single block; The capacity difference between the total storage capacity and the lost capacity is divided by the total storage capacity to obtain the available space ratio of the sample hard disk.

3. The customized testing method for solid state drives according to claim 1, characterized in that: The step of writing the cyclic test instruction into the non-bad block areas of the plurality of solid state disks in the solid state disk group to be tested and performing data reading and writing operations respectively according to the execution time includes: Dividing the solid state drive group to be tested into multiple test batches; Obtaining a bad block address table corresponding to the solid state drives in each of the test batches; Based on each of the bad block address tables, determining a data writing start address corresponding to a non-bad block area of ​​each of the solid state drives; The loop test instructions are sequentially written into corresponding data write start addresses according to each of the test batches, and data read and write operations of the execution duration are executed.

4. The customized testing method for solid state drives according to claim 1, characterized in that: The calculating the delay growth rate corresponding to each of the solid state drives based on the response delays and the read / write delays includes: Extracting the corresponding read operation delay and write operation delay of the solid state hard disk from each of the response delays; Calculating respectively a first difference between a read operation delay of each of the solid state drives and the read / write delay, and a second difference between a write operation delay of each of the solid state drives and the read / write delay; Dividing the first difference of each of the solid-state hard disks by the read and write delays to obtain a corresponding read delay growth rate, and dividing the second difference of each of the solid-state hard disks by the read and write delays to obtain a corresponding write delay growth rate; A weighted calculation is performed on the read delay growth rate and the write delay growth rate of each of the solid state drives to obtain a corresponding delay growth rate.

5. The customized testing method for solid state drives according to claim 1, characterized in that: After determining any solid state hard disk having a delay growth rate greater than a growth rate threshold as an abnormal hard disk, the method further includes: Calculating a growth rate difference between a delay growth rate of the abnormal hard disk and the growth rate threshold; Based on a preset hard disk wear level mapping table, the hard disk wear level corresponding to the growth rate difference is determined.

6. A customized solid state drive test system, characterized in that: The system comprises: A data acquisition module, used to acquire status data of a sample hard disk, wherein the status data includes the number of bad blocks, the number of erase and write times, and the read and write delay; A hard disk test module, used for generating a cycle test instruction according to the number of erase and write times and the read and write delay, and determining the execution time of the cycle test instruction based on the number of bad blocks; writing the cycle test instruction into the non-bad block areas of multiple solid-state hard disks in the solid-state hard disk group to be tested and performing data read and write operations respectively according to the execution time; A growth rate determination module, used to obtain the response delay of each of the solid state drives after the data read and write operations, and calculate the delay growth rate corresponding to each of the solid state drives based on each of the response delays and the read and write delays; A hard disk identification module, used to determine any solid state disk whose delay growth rate is greater than a growth rate threshold as an abnormal hard disk; The generating a cycle test instruction according to the erase and write times and the read and write delay comprises: Obtaining a preset erasing and writing times range and a preset delay range, wherein the preset erasing and writing times range and the preset delay range respectively include a plurality of sub-ranges; Determine the corresponding number of write instructions according to the sub-interval of the number of erase and write times of the sample hard disk within the preset erase and write number range, and determine the corresponding write instruction time interval according to the sub-interval of the read and write delay of the sample hard disk within the preset delay range; Using the number of write instructions and the time interval of the write instructions as instruction parameters to generate a corresponding loop test instruction; The step of determining the execution time of the loop test instruction based on the number of bad blocks includes: Get the benchmark execution time; Calculate the available space ratio of the sample hard disk according to the number of bad blocks; Determine a bad block attenuation factor based on a preset attenuation coefficient and the available space ratio; The product of the benchmark execution time and the bad block attenuation factor is used as the execution time of the loop test instruction.

7. An electronic device, characterized in that: It includes a processor, a memory, a user interface and a network interface, the memory is used to store instructions, the user interface and the network interface are used to communicate with other devices, and the processor is used to execute the instructions stored in the memory so that the electronic device executes the customized test method for solid-state drives as described in any one of claims 1-5.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores instructions, and when the instructions are executed, the customized testing method for the solid-state drive according to any one of claims 1 to 5 is executed.

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