Phase shift structure, phase shifter array, antenna device and driving voltage compensation method

Abstract

The invention provides a phase shift structure, a phase shifter array, an antenna device and a driving voltage compensation method, belongs to the technical field of antennas, and aims to realize temperature measurement in the phase shift structure, the phase shift structure comprises two oppositely arranged substrates and a liquid crystal layer located between the two substrates, and the liquid crystal layer contains liquid crystals; one side, close to the liquid crystal layer, of at least one substrate is provided with an electrode, and the electrode is configured to provide driving voltage for deflection of the liquid crystal; a temperature measuring structure is arranged on the side, close to the liquid crystal layer, of the at least one substrate and / or the side, away from the liquid crystal layer, of the at least one substrate, the temperature measuring structure is configured to sense the temperature of a temperature measuring area, the temperature measuring area is located on the substrate and close to liquid crystals in the liquid crystal layer, and the temperature of the temperature measuring area is used for determining the temperature of the liquid crystals in the liquid crystal layer; the substrate comprises a temperature measuring structure arranged on the same layer as the electrode and / or a temperature measuring structure arranged on the different layer from the electrode.

Description

Technical Field

[0001] The present disclosure relates to the field of antenna technology, and in particular to a phase shifting structure, a phase shifter array, an antenna device, and a driving voltage compensation method. Background Art

[0002] Antennas are essential devices in communication technology. Phase shifters are often used in antennas. Phase shifters are devices that can adjust the phase of waves. They are widely used in radar, accelerators, communications, instrumentation and even music.

[0003] With the development of phase shifter technology, liquid crystal phase shifters have emerged. Liquid crystal phase shifters modulate the phase of waves through the deflection of liquid crystals, and the viscosity of the liquid crystal itself changes with temperature. Therefore, when performing phase modulation through a liquid crystal phase shifter, the temperature of the liquid crystal needs to be considered. Summary of the invention

[0004] Based on the content of the background technology, the present disclosure proposes a phase shifting structure, a phase shifter array, an antenna device and a compensation method for a driving voltage.

[0005] A phase shift structure includes: two substrates arranged opposite to each other, and a liquid crystal layer located between the two substrates, wherein the liquid crystal layer contains liquid crystal;

[0006] An electrode is disposed on a side of at least one of the substrates close to the liquid crystal layer, and the electrode is configured to provide a driving voltage for deflection of the liquid crystal;

[0007] A temperature measuring structure is arranged on a side of at least one of the substrates close to the liquid crystal layer, and / or on a side of at least one of the substrates away from the liquid crystal layer, wherein the temperature measuring structure is configured to sense the temperature of a temperature measuring area, wherein the temperature measuring area is located on the substrate and close to the liquid crystal in the liquid crystal layer, and the temperature of the temperature measuring area is used to determine the temperature of the liquid crystal in the liquid crystal layer;

[0008] Wherein, for the substrate having the temperature measurement structure, the substrate includes a temperature measurement structure arranged at the same layer as the electrode and / or a temperature measurement structure arranged at a different layer from the electrode.

[0009] Exemplarily, the temperature measuring structure is provided on both substrates; wherein the orthographic projections of the first temperature measuring structure and the second temperature measuring structure on the same substrate are respectively located on opposite sides of the orthographic projection of the liquid crystal in the liquid crystal layer on the same substrate, so as to measure the temperature of the temperature measuring areas on opposite sides of the liquid crystal; the first temperature measuring structure and the second temperature measuring structure are respectively located on the two substrates. Exemplarily, a plurality of the temperature measuring structures are provided on one substrate, and the plurality of the temperature measuring structures respectively sense the temperature of the plurality of the temperature measuring areas; wherein the plurality of the temperature measuring structures do not overlap with each other and are located on the same side of the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate, and the plurality of the temperature measuring structures are spaced apart and distributed in a direction orthogonal to the thickness direction of the liquid crystal layer.

[0010] Exemplarily, the temperature measurement structure includes a temperature measurement circuit, the temperature measurement circuit includes a temperature sensitive element, and the temperature sensitive element is arranged in the test area, wherein the temperature sensitive element is an element whose electrical / chemical properties change with temperature.

[0011] Exemplarily, the temperature measurement area on the substrate does not overlap with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate; wherein the temperature measurement structure includes a temperature measurement circuit; wherein the temperature measurement circuit includes:

[0012] A first metal wire is arranged in the temperature measurement area, and the first metal wire has no overlap with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate; wherein the resistivity of the first metal wire changes with the change of temperature;

[0013] a second metal wire, one end of which is connected to the first metal wire and the other end of which is used to connect to a control unit, wherein the control unit is configured to determine the temperature of the liquid crystal in the liquid crystal layer according to a change in the resistivity of the first metal wire;

[0014] Wherein, the radius of the first metal wire is smaller than the radius of the second metal wire.

[0015] Exemplarily, at least two temperature measurement circuits are included on the same substrate; wherein, in two adjacent temperature measurement circuits located on the same side of the substrate, the minimum vertical distance between the first metal wires is 1 mm-5 mm.

[0016] Exemplarily, at least two temperature measurement circuits are included on the same substrate; wherein, in two adjacent temperature measurement circuits located on the same side of the substrate, the minimum vertical distance between the second metal wires is 1 mm-3 mm.

[0017] Exemplarily, the ratio of the radius of the second metal wire to the radius of the first metal wire is 1:5 to 1:10.

[0018] Exemplarily, the first metal wire is bent in the temperature measurement area to have at least one of a sawtooth shape, a wave shape, and a paper clip shape.

[0019] A phase shifter array is also provided, comprising: two substrates, and a liquid crystal layer disposed between the two substrates, wherein the liquid crystal layer contains liquid crystal, and a plurality of electrodes are arranged in an array on a side of at least one of the substrates close to the liquid crystal layer; wherein:

[0020] The plurality of electrodes divide the liquid crystal layer to form a plurality of phase shifting units, and one of the phase shifting units is configured to perform phase modulation on the electromagnetic wave of one antenna unit;

[0021] Wherein, at least one of the phase shifting units has the phase shifting structure described in the above embodiment.

[0022] Exemplarily, the phase shifter array further includes:

[0023] A temperature control module is connected to the temperature measuring structure in the phase shift structure and is configured to heat or cool the liquid crystals in the plurality of phase shift regions according to the temperature of the liquid crystal measured by the temperature measuring structure.

[0024] Exemplarily, the phase shifter array also includes a control unit, which is connected to the temperature measuring structure in each of the phase shifting structures and to the plurality of electrodes, wherein the control unit is configured to: determine the temperature of the liquid crystal in the liquid crystal layer according to the temperature of the temperature measuring area measured by the temperature measuring structure, and compensate the driving voltage output to the electrode according to the temperature of the liquid crystal.

[0025] There is also provided an antenna device, characterized in that it comprises a radiation structure and the phase shifting structure or the phase shifter array;

[0026] Wherein, the radiation structure is arranged on one side of the outgoing electromagnetic wave of the phase shift structure, and is configured to radiate the electromagnetic wave outward.

[0027] A driving voltage compensation method is also provided, which is applied to the phase shifting structure, or to the phase shifter array, or to the antenna device, and the method comprises:

[0028] Acquiring a first temperature of the temperature measurement area sensed by the temperature measurement structure;

[0029] determining a second temperature of liquid crystal in the liquid crystal layer according to the first temperature of the temperature measurement area;

[0030] The driving voltage is compensated according to the second temperature of the liquid crystal, and the driving voltage is used to drive the liquid crystal in the phase shift structure to generate deflection.

[0031] Exemplarily, the temperature measurement structure includes a plurality of temperature measurement circuits, the plurality of temperature measurement circuits respectively sense the temperature of a plurality of temperature measurement areas, the orthographic projections of the plurality of temperature measurement areas on the liquid crystal layer are located on the same side of the liquid crystal, and are arranged at intervals in a target direction orthogonal to an extension direction of the liquid crystal layer; determining the second temperature of the liquid crystal in the liquid crystal layer according to the first temperature of the temperature measurement area includes:

[0032] Determine the temperature difference between the first temperatures of each two of the temperature measuring zones, and the vertical distance between each two of the temperature measuring zones;

[0033] Acquire a heat flow parameter according to the temperature difference and the vertical distance; wherein the heat flow parameter is used to characterize the heat flow of the liquid crystal in the target direction;

[0034] Acquire a second temperature of the liquid crystal based on the heat flow parameter, the first temperature of the target temperature measurement area, and the distance between the orthographic projection of the target temperature measurement area on the liquid crystal layer and the liquid crystal;

[0035] Wherein, the target temperature measurement area is any temperature measurement area among the multiple temperature measurement areas.

[0036] A phase shift structure provided by the present disclosure may include two substrates arranged opposite to each other, and a liquid crystal layer located between the two substrates, wherein the liquid crystal layer contains liquid crystal; wherein an electrode is arranged on a side of at least one substrate close to the liquid crystal layer, and the electrode is configured to provide a driving voltage for deflection of the liquid crystal; a temperature measuring structure is arranged on a side of at least one substrate close to the liquid crystal layer, and / or on a side of at least one substrate away from the liquid crystal layer, and the temperature measuring structure is configured to sense the temperature of a temperature measuring area, the temperature measuring area is located on the substrate and close to the liquid crystal in the liquid crystal layer, and the temperature of the temperature measuring area is used to determine the temperature of the liquid crystal in the liquid crystal layer; wherein, for a substrate having a temperature measuring structure, the substrate includes a temperature measuring structure arranged on the same layer as the electrode and / or a temperature measuring structure arranged on a layer different from the electrode.

[0037] Since a temperature measuring structure is provided on one side of at least one substrate, the temperature measuring structure can be used to measure the temperature of the temperature measuring area, and the temperature measuring area is provided close to the liquid crystal. Therefore, the temperature of the liquid crystal can be obtained through the temperature of the temperature measuring area. The measured temperature of the liquid crystal can be used to determine the response of the liquid crystal to the voltage at the current temperature. Therefore, the driving voltage output by the electrode to the liquid crystal layer can be compensated according to this response, thereby ensuring that the liquid crystal is deflected to the required angle, thereby solving the problem of inaccurate modulation caused by temperature changes during the modulation process of the liquid crystal phase shifter.

[0038] The phase-shifting structure disclosed in the present invention can realize temperature measurement inside the liquid crystal box by means of a temperature measuring structure arranged in the phase-shifting structure. That is to say, the phase-shifting structure can detect the temperature of the liquid crystal autonomously without the need for an external device to detect the temperature of the liquid crystal, thereby solving the problem of inaccurate temperature detection using an external device and providing an accurate temperature reference for driving the liquid crystal deflection, so that the driving voltage can change with the change of the temperature of the liquid crystal, thereby ensuring the accuracy of phase modulation.

[0039] The above description is only an overview of the technical solution of the present disclosure. In order to more clearly understand the technical means of the present disclosure, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present disclosure more obvious and easy to understand, the specific implementation methods of the present disclosure are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or related technologies, the following is a brief introduction to the drawings required for use in the embodiments or related technical descriptions. Obviously, the drawings described below are some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. It should be noted that the proportions in the drawings are only for illustration and do not represent the actual proportions.

[0041] Figure 1 A schematic top view of a phase shifting structure according to an embodiment of the present disclosure is shown;

[0042] Figure 2 Shows Figure 1 Schematic diagram of the cross-sectional structure of the phase-shifting structure in the AA direction;

[0043] Figure 3a A schematic cross-sectional structure diagram of a phase shifting structure in case 1 in an embodiment of the present disclosure is shown;

[0044] Figure 3b A schematic cross-sectional structure diagram of a phase shifting structure in case 1 in an embodiment of the present disclosure is shown;

[0045] Figure 3c A schematic diagram of a top plan structure of a phase shifting structure in an embodiment of the present disclosure is shown;

[0046] Figure 3d Shows Figure 3c Schematic diagram of the cross-sectional structure of the phase-shifting structure in the AA direction;

[0047] Figure 3e A schematic diagram of a top plan structure of another phase shifting structure in an embodiment of the present disclosure is shown;

[0048] Figure 3f Shows Figure 3eSchematic diagram of the cross-sectional structure of the phase-shifting structure in the AA direction;

[0049] Figure 4 A schematic top view of a phase shifting structure in an embodiment of the present disclosure is shown;

[0050] Figure 5 The resistivity temperature curves of copper wire and aluminum wire in the embodiment of the present disclosure are shown;

[0051] Figure 6a A schematic top view of another phase shifting structure in an embodiment of the present disclosure is shown;

[0052] Figure 6b A schematic top view of another phase shifting structure in an embodiment of the present disclosure is shown;

[0053] Figure 7 A schematic cross-sectional structure diagram of a phase shifter array in an embodiment of the present disclosure is shown;

[0054] Figure 8 A schematic diagram showing the steps of the method for compensating the driving voltage in the embodiment of the present disclosure is shown;

[0055] Fig. 9 A curve diagram showing the relationship between the viscosity coefficient of liquid crystal and temperature according to an embodiment of the present disclosure is shown.

[0056] Description of reference numerals:

[0057] 101. lower substrate; 102. upper substrate; 103. liquid crystal layer; 1031. liquid crystal; 104. temperature measurement structure; 105. electrode; 1021. temperature measurement area; 211. first temperature measurement area; 212. second temperature measurement area; 41. first temperature measurement structure; 42. second temperature measurement structure; 43. third temperature measurement structure; 44. fourth temperature measurement structure; 213. third temperature measurement area; 214. fourth temperature measurement area; 1041. first metal wire; 1042. second metal wire; 201. signal input terminal; 202. signal output terminal; 300. phase shift unit. DETAILED DESCRIPTION

[0058] In order to make the above-mentioned purposes, features and advantages of the present disclosure more obvious and understandable, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are part of the embodiments of the present disclosure, rather than all the embodiments. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present disclosure.

[0059] In the related art, for a liquid crystal phase shifter, the viscosity of the liquid crystal molecules will change with the change of temperature. When the viscosity changes, the response to the voltage will also change, so the phase modulation effect at different temperatures will change. Therefore, in order to achieve an accurate phase modulation effect, it is necessary to detect the temperature of the liquid crystal in the liquid crystal phase shifter. However, in the related art, external sensors are used for detection, or the liquid crystal temperature is deduced based on the ambient temperature. However, a circuit is generally provided in the liquid crystal box to provide a driving voltage to the liquid crystal. In the process of transmitting the voltage, the circuit consumes a certain amount of power. If the power consumption accumulates in the liquid crystal layer, the liquid crystal temperature will increase, resulting in a large temperature difference between the inside and outside of the liquid crystal box. Therefore, the method of using an external sensor for detection will have the problem of inaccurate detection.

[0060] In view of this, the present disclosure proposes a phase-shifting structure that can measure the temperature of the liquid crystal inside the phase-shifting structure. The measured temperature can truly reflect the temperature of the liquid crystal, thereby providing an accurate temperature reference for driving the liquid crystal deflection, so that the driving voltage can change with the change of the temperature of the liquid crystal, thereby ensuring the accuracy of phase modulation.

[0061] Reference Figure 1 and Figure 2 As shown, Figure 1 A schematic top view of a phase shifting structure disclosed in the present invention is shown. Figure 2 Shows Figure 1 The cross-sectional structure diagram of the phase-shifting structure in the AA direction is as follows: Figure 1 and Figure 2 As shown, the phase shift structure of the present disclosure may include:

[0062] Two substrates arranged opposite to each other, and a liquid crystal layer 103 located between the two substrates, wherein the liquid crystal layer 103 contains liquid crystal; wherein an electrode 105 is arranged on a side of at least one substrate close to the liquid crystal layer 103, and the electrode 105 is configured to provide a driving voltage for deflection of the liquid crystal; a temperature measuring structure 104 is arranged on a side of at least one substrate close to the liquid crystal layer, and / or, on a side of at least one substrate away from the liquid crystal layer, and the temperature measuring structure 104 is configured to sense the temperature of a temperature measuring area 1021, wherein the temperature measuring area 1021 is arranged on the substrate and close to the liquid crystal 1031 in the liquid crystal layer 103; wherein the temperature of the temperature measuring area is used to determine the temperature of the liquid crystal in the liquid crystal layer;

[0063] Wherein, for the substrate with the temperature measurement structure, the substrate includes a temperature measurement structure arranged at the same layer as the electrode and / or a temperature measurement structure arranged at a different layer from the electrode.

[0064] In this embodiment, the two substrates may be glass substrates, and the two substrates are arranged opposite to each other to form a cavity for accommodating liquid crystals. After the cavity is filled with liquid crystals, the two substrates may be bonded together to form a liquid crystal box. Specifically, Figure 1 As shown, the orthographic projection of the liquid crystal filled in the two substrates on the substrates occupies a partial area of ​​the substrates.

[0065] Among them, an electrode can be arranged on the side of one substrate close to the liquid crystal layer, and the other substrate can be grounded through a grounding element, so that an electric field is formed on the liquid crystal layer through the driving voltage output by the electrode, and the liquid crystal in the liquid crystal layer is deflected under the action of the electric field. Alternatively, electrodes can be arranged on the sides of both substrates close to the liquid crystal layer, such as an electrode is arranged on the side of the upper substrate close to the liquid crystal layer, and an electrode is also arranged on the side of the lower substrate close to the liquid crystal layer, one of the electrodes is used as a positive electrode, and the other electrode is used as a negative electrode, so that when the two electrodes output corresponding driving voltages, an electric field is formed on the liquid crystal layer, and the liquid crystal in the liquid crystal layer is deflected under the action of the electric field.

[0066] Wherein, a temperature measuring structure is arranged on at least one of the two substrates. Correspondingly, a temperature measuring area is arranged on the substrate provided with the temperature measuring structure. The temperature measuring area can be located on the side of the substrate close to the liquid crystal or on the side of the substrate away from the liquid crystal. Specifically, the temperature measuring area can be understood as a small piece of the substrate. No matter which side of the substrate the temperature measuring structure is arranged on, it can be used to sense the temperature of the temperature measuring area. Figure 1 As shown, a temperature measuring structure is provided on one side of a substrate close to the liquid crystal, wherein the temperature measuring area is shown as a dotted box in the figure, which frames a small piece of the substrate.

[0067] The temperature measurement zone can be set close to the liquid crystal. For example, the temperature measurement zone can be set in a pair of the temperature measurement zones near the liquid crystal layer on the substrate for temperature sensing, wherein, in order to ensure that the temperature of the temperature measurement zone can be close to the temperature of the liquid crystal, the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate can overlap with the temperature measurement zone, or not overlap. Wherein, in the case of no overlap, the minimum distance between the temperature measurement zone and the orthographic projection of the liquid crystal on the substrate can be within a preset range, such as a range of 2mm to 5mm, then the temperature of the temperature measurement zone is the temperature of the area closer to the location of the liquid crystal, and the temperature of the location of the liquid crystal can be derived based on the temperature of the temperature measurement zone. Wherein, in the case of overlap, the temperature measurement structure can directly sense the temperature of the area where the liquid crystal is located, and thus, the temperature of the temperature measurement zone is the temperature of the liquid crystal.

[0068] In one example, a temperature measuring structure may be provided on either of the two substrates, or on both substrates. Specifically, for a substrate provided with a temperature measuring structure, the substrate may include a temperature measuring structure provided on the same layer as the electrode and / or a temperature measuring structure provided on a different layer from the electrode. In other words, the substrate may include only a temperature measuring structure provided on the same layer as the electrode, or only a temperature measuring structure provided on a different layer from the electrode; or both a temperature measuring structure provided on the same layer as the electrode and a temperature measuring structure provided on a different layer from the electrode.

[0069] In the case of the same-layer setting, the temperature measuring structure is located on the side of the substrate close to the liquid crystal layer; in the case of different-layer settings, the temperature measuring structure can be located on the side of the substrate away from the liquid crystal layer, or an independent circuit layer can be formed on the side of the substrate close to the liquid crystal layer, the temperature measuring structure is located in the circuit layer, and the electrode is located on the side of the circuit layer close to the liquid crystal layer, that is, from the liquid crystal layer upwards, there are electrodes, temperature measuring structure and substrate in order.

[0070] Specifically, when the temperature measuring structure and the electrode are arranged in the same layer, the temperature measuring structure and the electrode can be spaced apart. This arrangement makes the temperature measuring structure closer to the liquid crystal and reduces the crosstalk between the temperature measuring structure and the electrode, so that the temperature of the liquid crystal calculated by the measured temperature can better reflect the real temperature of the liquid crystal. More specifically, the size of the temperature measuring structure in the thickness direction of the liquid crystal can be smaller than the size of the electrode in the thickness direction of the liquid crystal, so that in the thickness direction of the liquid crystal, the vertical distance between the temperature measuring structure and the liquid crystal is greater than the vertical distance between the electrode and the liquid crystal, thereby reducing the influence of the electrical signal of the temperature measuring structure on the electric field of the liquid crystal.

[0071] Of course, when the temperature measuring structure and the electrode are arranged in different layers, the orthographic projection of the temperature measuring structure on the substrate may also not overlap with the orthographic projection of the electrode on the substrate. In this way, it can be ensured that there is no interference between the temperature measuring structure and the electrode, so as to reduce the impact on the electric field in the liquid crystal layer. This setting can ensure that there is a certain distance between the temperature measuring structure and the liquid crystal, avoiding interference with the electric field generated by the driving voltage.

[0072] The temperature measuring structure can be arranged in the temperature measuring area, or when the temperature measuring structure is a temperature measuring circuit, the temperature measuring circuit can include a temperature sensitive element, and the temperature sensitive element can be arranged in the temperature measuring area. Thus, the temperature of the temperature measuring area can be sensed by the temperature measuring structure. Specifically, the temperature change of the temperature measuring area can be captured by the temperature measuring structure, thereby converting the temperature change into an electrical signal, and the temperature of the temperature measuring area can be determined based on the electrical signal.

[0073] Since the temperature measuring structure is located on the substrate, no matter which side of the substrate it is located on, the temperature of the liquid crystal is measured in the phase shift structure. Therefore, the phase shift structure of this embodiment can realize temperature measurement in the liquid crystal box through the temperature measuring structure arranged in the phase shift structure. In other words, the phase shift structure can detect the liquid crystal temperature autonomously, that is, detect the liquid crystal temperature at a closer distance without the need to use external equipment to detect the temperature of the liquid crystal, which solves the problem of inaccurate temperature detection using external equipment and provides an accurate temperature reference for driving the liquid crystal deflection, so that the driving voltage can change with the change of the temperature of the liquid crystal, thereby ensuring the accuracy of phase modulation.

[0074] In one example, the temperature measuring structure can be located on the side of the substrate close to the liquid crystal layer, or can be located on the side of the substrate away from the liquid crystal layer, or the temperature measuring structure can be provided on both the side of the substrate close to the liquid crystal layer and the side of the substrate away from the liquid crystal layer. Of course, if the temperature measuring structure is provided on the side of the substrate close to the liquid crystal layer, it can be provided on the same layer as the electrode or on a different layer. Since it can be closer to the liquid crystal, the temperature measured in the temperature measuring area can more truly reflect the temperature of the liquid crystal, and thus the determined temperature of the liquid crystal will be more accurate.

[0075] Wherein, a temperature measuring structure is arranged on a side of at least one substrate close to the liquid crystal layer, and / or, a temperature measuring structure is arranged on a side of at least one substrate away from the liquid crystal layer. In one example, a temperature measuring structure may be arranged on one of the two substrates, and the temperature measuring structure may be located on the side of the substrate away from the liquid crystal layer, or the temperature measuring structure may be located on the side of the substrate close to the liquid crystal layer, and in the case of being located on the side of the substrate close to the liquid crystal layer, the temperature measuring structure may be arranged on the same layer as the electrode.

[0076] In another example, temperature measurement structures can be provided on both substrates, such as in case 1, referring to Figure 3a As shown, a cross-sectional structural diagram of the phase shifting structure in case 1 is shown, such as Figure 3a As shown, the temperature measurement structures on the two substrates may both be located on the side of the substrate close to the liquid crystal layer. In this case, the orthographic projections of the temperature measurement areas sensed by the temperature measurement structures on the two substrates on the same substrate may overlap or may not overlap; Figure 3a Shown is the case with overlap.

[0077] In another case 2, the temperature measuring structures on the two substrates may be located on the side of the substrate facing away from the liquid crystal layer;

[0078] In one case 3, referring to Figure 3b As shown, a schematic cross-sectional structure diagram of the phase shift structure in Case 3 is shown. The temperature measuring structure on one substrate can be located on the side of the substrate away from the liquid crystal layer, and the temperature measuring structure on the other substrate can be located on the side of the substrate close to the liquid crystal layer.

[0079] For Case 1, since the temperature measuring structures on the two substrates are closer to the liquid crystal layer than Cases 2 and 3, the temperature measured in the temperature measuring area can be closer to the temperature of the liquid crystal, so the determined temperature of the liquid crystal will be more accurate; and for Case 2, since the temperature measuring structures are all located on the side away from the liquid crystal layer, compared with Cases 1 and 3, the crosstalk generated to the electric field in the liquid crystal layer will be smaller, so when measuring the liquid crystal temperature, it can ensure that there is no interference with the electric field of the liquid crystal layer, thereby avoiding adverse effects on the phase shift; and for Case 3, since one temperature measuring structure is close to the liquid crystal layer and the other temperature measuring structure is away from the liquid crystal layer, compared with Case 1, the crosstalk generated to the electric field in the liquid crystal layer will be smaller, and compared with Case 2, since one temperature measuring structure is close to the liquid crystal, the detected temperature of the liquid crystal will be more accurate, that is to say, Case 3 can ensure that the liquid crystal temperature detection is relatively accurate while reducing the impact on the electric field in the liquid crystal layer.

[0080] Among them, when the temperature measuring structure is provided on both substrates, the temperature measuring structure can be used to detect the temperature of the temperature measuring area on both sides of the liquid crystal, so that the temperature of the liquid crystal in the liquid crystal layer can be obtained through the temperature of the temperature measuring area on the two substrates. In this case, since the temperature of the temperature measuring area can be measured from the opposite sides of the liquid crystal layer, the temperature of the liquid crystal in the middle can be determined through the temperature on both sides of the liquid crystal layer, so that the liquid crystal temperature can be determined more accurately.

[0081] In one example, temperature measuring structures may be provided on both substrates, wherein all the temperature measuring structures may be located on opposite sides of the orthographic projection of the liquid crystal layer on the substrate when viewed from the orthographic projection of the same substrate; that is, there may be one or more temperature measuring structures on opposite sides of the orthographic projection of the liquid crystal layer on the substrate.

[0082] Reference Figure 3c and Figure 3d As shown, Figure 3c FIG. 1 shows a schematic diagram of a top plan structure of a phase shifting structure. Figure 3d Shows Figure 3c The cross-sectional structure diagram of the phase-shifting structure in the AA direction, wherein temperature measuring structures are arranged on both substrates to perform temperature sensing on the temperature measuring areas on the substrates; wherein the orthographic projections of the first temperature measuring structure 41 and the second temperature measuring structure 42 on the same substrate 102 are respectively located on opposite sides of the orthographic projection of the liquid crystal in the liquid crystal layer on the same substrate 102; wherein the first temperature measuring structure 41 and the second temperature measuring structure 42 are respectively located on the two substrates, and are respectively located on one side of the substrate close to the liquid crystal layer, that is, the first temperature measuring structure 41 is used for temperature sensing in the first temperature measuring area 211, and the second temperature measuring structure 42 is used for temperature sensing in the second temperature measuring area 212.

[0083] In this example, each substrate may be provided with a temperature measuring structure, and a temperature measuring area is correspondingly provided on each substrate, thereby the temperature of the liquid crystal can be measured simultaneously on two opposite sides in the thickness direction of the liquid crystal layer, wherein, Figure 3c As shown, the first temperature measurement area 211 on one substrate 101 of the two substrates and the orthographic projection of the second temperature measurement area 212 on the other substrate 102 on the substrate are respectively located on opposite sides, such as left and right sides, of the orthographic projection of the liquid crystal 103 in the liquid crystal layer on the substrate. Thus, in addition to measuring the temperature on opposite sides in the thickness direction of the liquid crystal layer, the temperature can also be measured on opposite sides in the direction orthogonal to the thickness direction of the liquid crystal layer. For example, the upper substrate located above the liquid crystal layer can measure the temperature of the left area above the liquid crystal, and the lower substrate located below the liquid crystal layer can measure the temperature of the right area below the liquid crystal. These two positions can fully reflect the temperature of the space around the liquid crystal, so that a more accurate temperature of the liquid crystal can be calculated.

[0084] In one example, a substrate has multiple temperature measurement zones, wherein the temperature measurement structure can be used to perform temperature sensing on the multiple temperature measurement zones. Specifically, the multiple temperature measurement zones arranged on a substrate can measure the temperatures of multiple areas located on the same side of the liquid crystal layer, thereby accurately determining the temperature of the liquid crystal through the temperatures of the multiple areas.

[0085] Specifically, refer to Figure 3e and Figure 3f As shown, Figure 3e 1 shows a schematic top view of a phase shifting structure, Figure 3f Shows Figure 3e A schematic diagram of the cross-sectional structure of the phase shift structure, specifically, a substrate is provided with a plurality of temperature measuring structures, and the plurality of temperature measuring structures respectively sense the temperatures of the plurality of temperature measuring areas;

[0086] The multiple temperature measuring structures do not overlap each other and are located on the same side of the orthographic projection of the liquid crystal in the liquid crystal layer on the same substrate, and the multiple temperature measuring structures are spaced apart and distributed in a direction orthogonal to the thickness direction of the liquid crystal layer.

[0087] In this example, the substrate with the temperature measurement structure can be provided with multiple temperature measurement zones, and thus has multiple temperature measurement structures for sensing the temperatures of the multiple temperature measurement zones, such as each temperature measurement zone having a temperature measurement circuit. In one case, if the temperature measurement structure is provided on only one substrate, the substrate has multiple temperature measurement zones, such as Figure 3e and 3fAs shown, the situation of two temperature measuring zones is shown, including a third temperature measuring structure 43 and a fourth temperature measuring structure 44. The third temperature measuring structure 43 is used to measure the temperature of the third temperature measuring zone 213, and the fourth temperature measuring structure 44 is used to measure the temperature of the fourth temperature measuring zone 214. The third temperature measuring structure 43 and the fourth temperature measuring structure 44 are both located on the same side of the positive projection of the liquid crystal 1031 on the upper substrate 102 in the liquid crystal layer, and are arranged at intervals in a direction orthogonal to the thickness direction of the liquid crystal layer; wherein, when multiple temperature measuring structures are set on both substrates, the number of temperature measuring structures on the two substrates may be equal or unequal, thereby, the entire phase shifting structure may have more temperature measuring zones, and more temperature measuring zones may obtain a more accurate temperature of the liquid crystal; of course, if temperature measuring structures are set on two substrates, one substrate may have multiple temperature measuring structures, and the other substrate may have one temperature measuring structure.

[0088] Wherein, for a substrate provided with a plurality of temperature measuring structures, the plurality of temperature measuring structures may be located on the same side of the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate, for example, Figure 3e As shown, it can be located above the orthographic projection of the liquid crystal layer on the substrate, and multiple temperature measuring structures are spaced apart in a direction orthogonal to the thickness direction of the liquid crystal layer, thereby making it possible to measure the temperature of multiple temperature measuring areas distributed on a path from close to the liquid crystal layer to far away from the liquid crystal layer. Assuming that the liquid crystal in the liquid crystal layer is regarded as a heat source, multiple temperature measuring areas are distributed on the heat dissipation path of the heat source, and the heat dissipation path is shown in FIG. Figure 3e As shown by the middle arrow, the temperatures measured in multiple temperature measuring zones can show a gradient change. Therefore, the temperature of the liquid crystal can be obtained based on the temperatures of the multiple temperature measuring zones using Fourier's law. For example, the heat flow of the liquid crystal on the heat dissipation path can be obtained based on the temperatures of the multiple temperature measuring zones, and the temperature at the heat source (liquid crystal) can be calculated based on the heat flow.

[0089] By adopting this exemplary phase-shifting structure, multiple temperature measuring structures can be set on one substrate, and the multiple temperature measuring structures are spaced apart on the heat dissipation path of the liquid crystal temperature. In this way, the temperature of the heat source can be more accurately derived from the temperatures of the multiple temperature measuring zones on the heat dissipation path.

[0090] The temperature measurement structure is introduced below. In one example, the temperature measurement structure can be a temperature sensor. For example, a thin temperature sensor can be pasted on one side of a substrate, which can be located within the range of the temperature measurement area. A transmission line is set on the substrate to connect the thin temperature sensor with an external control unit. The control unit is used to receive data collected by the temperature sensor to obtain the temperature of the temperature measurement area.

[0091] In another example, the temperature measurement structure may be a temperature measurement circuit fabricated on one side of the substrate, wherein the temperature measurement circuit has a temperature sensitive element, and the temperature sensitive element is disposed in the temperature measurement area, and the temperature sensitive element is an element whose electrical / chemical properties change with temperature.

[0092] In this example, the temperature measurement circuit can be used to connect to the control unit. Changes in the electrical / chemical properties of the temperature sensitive element will cause changes in voltage / current in the temperature measurement circuit. The changes in voltage / current will be fed back to the control unit connected to the temperature measurement circuit, so that the control unit can determine the temperature of the temperature measurement area through the current / voltage changes of the temperature measurement circuit, thereby obtaining the temperature of the liquid crystal.

[0093] When the temperature measurement circuit is arranged in the same layer as the electrode, it can be manufactured in the same layer as the electrode, that is, the electrode and the temperature measurement circuit can be patterned on one side of the substrate. In a further example, the temperature measurement circuit may include a first metal wire and a second metal wire, wherein the first metal wire is arranged in the temperature measurement area, and the second metal wire is used to connect the first metal wire and the control unit.

[0094] Reference Figure 4 As shown, a schematic diagram of a top view of a phase shifting structure is shown. Figure 4 As shown, the temperature measurement area on the substrate does not overlap with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate; wherein the temperature measurement structure includes at least one temperature measurement circuit, and the temperature measurement circuit includes: a first metal wire 1041 and a second metal wire 1042 connected to the first metal wire 1041;

[0095] The first metal line 1041 is disposed in the temperature measurement area 1021 and has no overlap with the orthographic projection of the liquid crystal 1031 in the liquid crystal layer 103 on the substrate;

[0096] One end of the second metal wire is connected to the first metal wire, and the other end is used to connect to a control unit, and the control unit is configured to determine the temperature of the liquid crystal in the liquid crystal layer according to the resistivity change of the first metal wire; wherein the radius of the first metal wire is smaller than the radius of the second metal wire, and the resistivity of the first metal wire changes with the change of temperature.

[0097] In this embodiment, the temperature measurement area can also be understood as the area where the first metal wire is located. In the entire temperature measurement circuit, the radius of the first metal wire is small and the arrangement is dense, so it can be considered as a temperature-sensitive element in the temperature measurement structure. Therefore, the temperature measurement area can also be understood as the area where the temperature-sensitive element is located in the temperature measurement structure. Generally speaking, the area where the temperature-sensitive element is located is closer to the liquid crystal, and the structure other than the temperature-sensitive element can be further away from the liquid crystal to avoid affecting the electric field of the liquid crystal.

[0098] In this example, the first metal wire and the second metal wire may be metal wires made of the same metal material or metal wires made of different metal materials. Specifically, the first metal wire may be a copper wire or an aluminum wire.

[0099] Among them, the second metal wire can be regarded as a signal transmission line in the temperature measurement circuit, and the first metal wire can be regarded as a temperature-sensitive element. The temperature change in the temperature measurement zone will cause the resistivity of the first metal wire to change. When the resistivity of the first metal wire changes, the current in the temperature measurement circuit can change. Then, in the control unit, the current resistivity of the first metal wire can be obtained through the change in current, and the temperature of the temperature measurement zone can be inferred based on the current resistivity of the first metal wire.

[0100] Among them, the radius of the first metal wire can be smaller than the radius of the second metal wire. When the radius of the second metal wire is larger, the metal wire serving as the transmission part is thicker, which can minimize voltage loss. When the first metal wire is thinner, when the temperature changes, the thinner metal wire can more sensitively reflect the change in resistivity and can sense temperature changes more accurately.

[0101] In one example, the ratio of the radius of the second metal wire to the radius of the first metal wire is 1:5 to 1:10. Specifically, the ratio of the radius of the second metal wire to the radius of the first metal wire can be 1:5, or 1:10, or any ratio between 1:5 and 1:10.

[0102] Among them, compared with the setting of 1:5, for the setting of 1:10, the electrical signal loss at the first metal wire is larger, but the temperature measurement is more accurate; compared with the setting of 1:10, for the setting of 1:5, the electrical signal loss at the first metal wire is smaller, and the temperature measurement accuracy can be guaranteed. Therefore, any ratio in the above ratio range can be selected according to actual needs.

[0103] When using this example, the second metal wire can be used as a transmission line. When it is thicker, the voltage loss can be minimized as much as possible. The first metal wire becomes thinner and denser in the temperature measurement area, so that the main resistance in the temperature measurement circuit is concentrated near the temperature measurement point. When the temperature changes, the main resistance change will also come from the temperature measurement area, and the measured temperature value will also be more accurate.

[0104] Specifically, the first metal wire is bent in the temperature measurement area to form at least one of a sawtooth shape, a wave shape, and a paper clip shape. Figure 4 As shown, the first metal wire is bent in a wavy shape in the temperature measurement zone, wherein the greater the bending density of the first metal wire in the temperature measurement zone, the more obvious the resistivity thereof changes with the temperature of the temperature measurement zone, and the measured temperature value is also more accurate.

[0105] Of course, in some other examples, the first metal wire may be bent into other shapes in the temperature measurement area, which will not be elaborated here.

[0106] In this example, one temperature measurement circuit or multiple temperature measurement circuits may be included. When multiple temperature measurement circuits are included, the substrate may have multiple temperature measurement areas, and the multiple temperature measurement circuits may be used to sense the temperatures of the multiple temperature measurement areas, respectively.

[0107] In this example, there are multiple temperature measurement zones on a substrate. The distribution of the multiple temperature measurement zones can refer to Figure 3e In the phase-shift structure shown, each temperature measurement zone has a temperature measurement circuit, and the temperatures of the multiple temperature measurement zones can be sensed by multiple temperature measurement circuits. The multiple temperature measurement circuits can be independent of each other, thereby independently detecting the temperature of each temperature measurement zone. Among the multiple temperature measurement circuits, one temperature measurement circuit can be located in the area enclosed by the first metal wire and the second metal wire of another temperature measurement circuit, such as Figure 6b As shown, either, a plurality of temperature measuring circuits are staggered in one direction, or, the sizes of the first metal wires of the plurality of temperature measuring circuits are similar, while the second metal wires of the plurality of temperature measuring circuits are staggered on the substrate.

[0108] Among them, the materials of the first metal wires set in multiple temperature measurement zones can be different. For example, the first metal wire in one temperature measurement zone is a copper wire, and the first metal wire in another temperature measurement zone can be an aluminum wire. In this way, it can be avoided that the error caused by temperature sensing with metal wires of the same material cannot be eliminated.

[0109] The shapes of the first metal wires arranged in the multiple temperature measurement zones may be different. If the first metal wire in one temperature measurement zone is bent into a wavy shape and the first metal wire in another temperature measurement zone is bent into a zigzag shape, the different bending shapes can avoid the temperature sensing error caused by the same bending shape, thereby improving the accuracy.

[0110] The sizes of the first metal wires in the multiple temperature measurement zones may be different. For example, the radius ratio of the first metal wire to the second metal wire in one temperature measurement zone is 1:5, and the radius ratio of the first metal wire to the second metal wire in another temperature measurement zone is 1:10. Thus, by setting two sets of temperature measurement circuits in different ratios, the electrical signal transmission loss and temperature sensing loss of the two sets of temperature measurement circuits can be compensated, thereby obtaining a more accurate temperature of the liquid crystal.

[0111] Among them, when multiple temperature measurement circuits are included on the same substrate, if multiple temperature measurement circuits are included on the same side of the substrate, the minimum spacing between the first metal wires in two adjacent temperature measurement circuits on the same side of the substrate can be maintained within 1mm-5mm. In this way, it can be ensured that the temperature difference is measured in the vicinity of the liquid crystal, and the spacing between the first metal wires can be ensured to avoid current crosstalk between the two temperature measurement circuits. Specifically, the minimum spacing between the first metal wires set in two adjacent temperature measurement areas can be maintained within 1mm-5mm, such as 1mm, or 5mm, or any value between 1mm-5mm, such as 3mm.

[0112] When multiple temperature measurement circuits are included on the same substrate, if multiple temperature measurement circuits are included on the same side of the substrate, then in two adjacent temperature measurement circuits on the same side of the substrate, there is a spacing between the multiple second metal wires, and the spacing can be maintained within 1mm-3mm to avoid multiple temperature measurement circuits from measuring the temperatures of multiple densely packed temperature measurement areas and to avoid interference between the temperature measurement circuits.

[0113] When the spacing between the second metal wires is small, it can help save wiring space, so that more temperature measurement circuits can be arranged on the substrate to obtain the temperatures of multiple temperature measurement zones, forming dense temperature measurement points. Specifically, the minimum spacing between the second metal wires arranged in two adjacent temperature measurement zones can be maintained within 1 mm-3 mm, such as 1 mm, or 3 mm, or any value between 1 mm-3 mm, such as 2 mm.

[0114] Of course, in some other examples, when multiple temperature measuring circuits are included on the same substrate, for the temperature measuring circuits in different layers of the substrate, the first metal wires of the temperature measuring circuits in different layers may be staggered, and / or the second metal wires may also be staggered. Specifically, the first metal wires may be staggered, or the second metal wires may be staggered, or both may be staggered. The staggering may refer to: the orthographic projection of the first metal wire of the temperature measuring circuit on one side of the substrate does not overlap with the orthographic projection of the first metal wire of the temperature measuring circuit on the other side of the substrate. Of course, the first metal wires of the temperature measuring circuits on the opposite sides of the substrate may overlap, and / or the second metal wires may overlap. The overlap may refer to: the orthographic projection of the first metal wire of the temperature measuring circuit on one side of the substrate overlaps with the orthographic projection of the first metal wire of the temperature measuring circuit on the other side of the substrate. The overlap may be an overlap in the extension direction of the first metal wire, such as there is an overlap between the orthographic projections of the first metal wires on the upper and lower sides on the substrate; or the orthographic projections of the first metal wires on the upper and lower sides on the substrate may have an intersection. In this case, multiple temperatures can be obtained in the three-dimensional spatial region on one side of the liquid crystal, so that a more accurate temperature of the liquid crystal can be calculated by the temperature of each position point in the three-dimensional spatial region on one side of the liquid crystal.

[0115] In this embodiment, the first metal wire can extend along the first direction on the substrate, and the second metal wire can extend along the second direction on the substrate, wherein the first direction and the second direction can be orthogonal, and the first direction can be the extension direction of the liquid crystal layer, thereby enabling the first metal wire to measure the temperature of the liquid crystal in the temperature measurement area, and the second metal wire extends to the edge of the substrate in the second direction, so as to be used to connect to the control unit.

[0116] Furthermore, in the case where multiple temperature measurement zones are included on the same substrate, the orthographic projections of the multiple temperature measurement zones on the liquid crystal layer are located on the same side of the liquid crystal in the liquid crystal layer, and are arranged at intervals in a target direction orthogonal to the thickness direction of the liquid crystal layer. In this case, each first metal wire in the multiple temperature measurement circuits is located in a temperature measurement zone, and the multiple temperature measurement circuits do not cross each other to avoid crosstalk between the temperature measurement circuits. In this case, the multiple temperature measurement circuits on the same substrate can measure the temperature of multiple temperature measurement zones, that is, obtain the temperature at multiple positions, and then, according to Fourier's law, the multiple temperatures can be converted to obtain the temperature at the position where the liquid crystal is located.

[0117] For example, Figure 6b For the phase shift structure shown, the process of determining the liquid crystal temperature can be as follows:

[0118] First, obtain the resistivity temperature curve of the first metal wire, and refer to Figure 5As shown, the curve may include the resistivity of the first metal line corresponding to multiple temperatures;

[0119] Next, the temperatures of the two temperature measurement zones are obtained, namely, temperature T1 and temperature T2; and the minimum vertical distance dx between the two first metal wires, such as Figure 6b The enlarged part of the middle elliptical area is shown in the figure;

[0120] Then, the heat flow q on the path from the position Z where the liquid crystal layer is located to the two temperature measurement areas is obtained according to the following formula (1) by Fourier's law;

[0121]

[0122] Wherein, dT represents the temperature difference between temperature T1 and temperature T2, and k is the thermal conductivity of the first metal wire;

[0123] In the case where the heat flow q is obtained, the temperature T3 at the location of the liquid crystal layer can be used as the quantity to be solved, and the temperature T3 at the location of the liquid crystal layer can be inversely deduced through the above formula (1). For example, taking the temperature T1 measured in a temperature measurement zone and the vertical distance dx1 from the first metal wire in the temperature measurement zone to the location of the liquid crystal in the liquid crystal layer as an example, the temperature T3 at the location of the liquid crystal layer can be obtained by the following formula (2) to obtain the temperature difference dT1 between the temperature T3 at the location of the liquid crystal layer and the temperature T1:

[0124]

[0125] Below, two examples of phase shift structures are listed, referring to Figure 6a and Figure 6b As shown, Figure 6a and Figure 6b Schematic diagrams of two types of phase shifting structures are shown in top plan views;

[0126] Example A, such as Figure 6a As shown, the phase shift structure includes two substrates arranged opposite to each other, and a liquid crystal layer located between the two substrates, wherein the liquid crystal layer contains liquid crystal; wherein the orthographic projection of the liquid crystal on the substrate only occupies a partial area of ​​the substrate.

[0127] Wherein, electrodes are arranged on the sides of the two substrates close to the liquid crystal layer, such as a first electrode 1052 is arranged on the side of the upper substrate 102 close to the liquid crystal layer, and a second electrode 1051 is arranged on the side of the lower substrate 101 close to the liquid crystal layer, wherein the first electrode is a positive electrode and the second electrode is a negative electrode; when the phase shift structure is working, the first electrode and the second electrode are configured to provide a driving voltage for the deflection of the liquid crystal, thereby forming an electric field in the liquid crystal layer to drive the liquid crystal to deflect;

[0128] Wherein, a temperature measuring structure is arranged on one side of the upper substrate close to the liquid crystal and on one side of the lower substrate close to the liquid crystal layer, and a temperature measuring area is provided on the upper substrate and a temperature measuring area is provided on the lower substrate; wherein the orthographic projections of the two temperature measuring structures on the same substrate are located on opposite sides of the orthographic projection of the liquid crystal layer on the substrate, thereby forming two temperature measuring areas on opposite sides of the orthographic projection of the liquid crystal layer on the substrate, such as Figure 6a As shown, the orthographic projection of the temperature measurement area 211 on the lower substrate on the upper substrate 102 and the temperature measurement area 212 on the upper substrate 102 are respectively located on opposite sides of the orthographic projection of the liquid crystal layer on the substrate in the upper and lower directions;

[0129] Among them, the temperature measuring structures on the upper and lower substrates both use temperature measuring circuits, and the temperature measuring circuits of the upper and lower substrates are both located on the side of the substrate close to the liquid crystal layer, that is, the temperature measuring circuit and the electrode are arranged on the same layer, thus being closer to the liquid crystal layer; wherein, in order to avoid the temperature measuring circuit from coupling with the electric field formed by the electrode in the liquid crystal layer, the orthographic projection of the liquid crystal layer on the substrate may have a gap with the temperature measuring structure, but the gap should not be too large; for example, the first metal wire and the second metal wire are both located on one side of the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate, and are spaced from the liquid crystal in the liquid crystal layer, wherein the first metal wire is closer to the orthographic projection of the liquid crystal on the substrate.

[0130] The temperature measurement circuit includes a first metal wire and a second metal wire, both ends of the first metal wire are respectively connected to the second metal wire, and one end of the second metal wire not connected to the first metal wire is used to connect to an external control unit, and the first metal wire is arranged in a wavy shape in the temperature measurement area; the second metal wire is not in the temperature measurement area;

[0131] The second metal wire is thicker as a transmission wire, the first metal wire is used as a sensing wire, the resistivity of the first metal wire changes with temperature, and the ratio between the first metal wire and the second metal wire can be 1:8;

[0132] When this phase-shifting structure is adopted, the temperature measuring circuit on the upper substrate obtains the temperature T1 of the temperature measuring areas 211 and 212 on the upper substrate, and the temperature measuring circuit on the lower substrate obtains the temperature T2 of the temperature measuring area on the lower substrate. Since the liquid crystal layer has temperature measuring areas on opposite sides of the upper and lower directions of the orthographic projection on the substrate, the temperature of the liquid crystal in the liquid crystal layer can be the average value of the temperature T1 and the temperature T2.

[0133] The phase-shift structure of Example A can be applied to working conditions without heat sources in the liquid crystal layer, such as low temperature conditions. That is to say, it can be applied to phase-shift structures used in low temperature environments, as well as low-loss phase-shift structures. It should be noted that the low-loss phase-shift structure is related to the setting method, structure and materials of the substrate and electrodes used therein. Therefore, when producing the phase-shift structure, if the phase-shift structure is a low-loss structure, the setting method of the temperature measurement structure in the phase-shift structure of Example A can be adopted.

[0134] Example B, such as Figure 6b As shown, the phase shift structure includes two substrates arranged opposite to each other, and a liquid crystal layer located between the two substrates, wherein the liquid crystal layer contains liquid crystal; wherein the orthographic projection of the liquid crystal on the substrate only occupies a partial area of ​​the substrate.

[0135] Wherein, electrodes are arranged on the sides of the two substrates close to the liquid crystal layer, such as a first electrode is arranged on the side of the upper substrate close to the liquid crystal layer, and a second electrode is arranged on the side of the lower substrate close to the liquid crystal layer, wherein the first electrode is a positive electrode and the second electrode is a negative electrode; when the phase shift structure is working, the first electrode and the second electrode are configured to provide a driving voltage for the deflection of the liquid crystal, thereby forming an electric field in the liquid crystal layer to drive the liquid crystal to deflect;

[0136] Wherein, a temperature measuring structure is arranged on the side of the upper substrate close to the liquid crystal and on the side of the lower substrate close to the liquid crystal layer. There are two temperature measuring structures on the upper substrate and two temperature measuring structures on the lower substrate. Thus, there are two temperature measuring areas on the same substrate, which are located on the same side of the orthographic projection of the liquid crystal layer on the substrate and are arranged at intervals in a direction orthogonal to the thickness direction of the liquid crystal layer, such as Figure 6b As shown, the two temperature measuring structures on the upper substrate are located above the orthographic projection of the liquid crystal layer on the substrate and are arranged along the direction of the arrow; of course, the two temperature measuring structures on the lower substrate may also be located above the orthographic projection of the liquid crystal layer on the substrate and are arranged along the direction of the arrow, or the two temperature measuring areas on the lower substrate may also be located below the orthographic projection of the liquid crystal layer on the substrate and are arranged in the direction opposite to the direction of the arrow.

[0137] The temperature measurement structures on the upper and lower substrates both use temperature measurement circuits, and the temperature measurement circuits of the upper and lower substrates are both located on the side of the substrate close to the liquid crystal layer, that is, the temperature measurement circuit and the electrode are arranged on the same layer, thus being closer to the liquid crystal layer; in order to prevent the temperature measurement circuit from coupling the electric field formed by the electrode on the liquid crystal layer, the orthographic projection of the liquid crystal layer on the substrate may have a gap with the temperature measurement area, but the gap should not be too large;

[0138] Among them, the temperature measurement circuit includes a first metal wire and a second metal wire, the two ends of the first metal wire are respectively connected to the second metal wire, the end of the second metal wire not connected to the first metal wire is used to connect to an external control unit, the first metal wire is arranged in a wavy shape in the temperature measurement area; the second metal wire is not in the temperature measurement area; among them, one of the first metal wires in the two temperature measurement structures is closer to the liquid crystal, and the other first metal wire is farther away from the liquid crystal.

[0139] The second metal wire is thicker as a transmission wire, the first metal wire is used as a sensing wire, the resistivity of the first metal wire changes with temperature, and the ratio between the first metal wire and the second metal wire can be 1:5;

[0140] When the phase-shifting structure is adopted, the temperature measuring circuit on the upper substrate obtains that the temperatures of the two temperature measuring areas 211 and 212 on the upper substrate are respectively temperature T1 and temperature T2. Then, for the two temperature measuring areas on the upper substrate, the temperature T3 of the liquid crystal layer point Z can be obtained according to formula (1) and formula (2); similarly, according to the temperature measured by the temperature measuring circuit on the lower substrate, the temperature T3' of the liquid crystal layer point Z can be obtained, and the temperature of the liquid crystal layer can be the average of temperature T3 and temperature T3'.

[0141] The phase shift structure of Example B can be applied to the case where the phase shift structure is centrally symmetrical. In this case, the liquid crystal in the middle position will generate heat due to loss, and no obvious heat source will appear in other places. If the heat source is in the center, the entire phase shift structure will be in a trend of high middle temperature and gradually decreasing surrounding temperature. At this time, the temperature measuring points on both sides of the heat source (the upper and lower sides of the positive projection of the liquid crystal layer on the substrate) cannot infer the temperature of the center point, while the two temperature measuring areas on the same side of the heat source conform to the temperature gradient, and the heat is gradually reduced from the liquid crystal layer to the temperature measuring area. Therefore, Figure 6b The setting of the temperature measurement zone conforms to Fourier's law in heat transfer, and the location of the liquid crystal can be extrapolated for calculation, that is, the temperature of the liquid crystal layer point Z can be obtained by using formula (1) and formula (2).

[0142] It should be noted that the phase-shift structure of Example B can also be applied to a phase-shift structure in which the loss is concentrated in the liquid crystal layer. Thus, the energy loss occurs in the liquid crystal, and the lost energy is converted into heat, thereby making the liquid crystal layer a heat source. In this case, the phase-shift structure of Example B can more accurately measure the temperature of the liquid crystal in the liquid crystal layer.

[0143] In the phase shifting structures of Examples A and B above, electromagnetic waves are input from the signal input terminal 201 , and after being phase shifted by the phase shifting structure, the electromagnetic waves are emitted from the signal output terminal 202 , thereby achieving phase modulation of the electromagnetic waves.

[0144] Based on the same inventive concept, the present disclosure also provides a phase shifter array, referring to Figure 7As shown, a cross-sectional structure diagram of a phase shifter array is shown, such as Figure 7 As shown, it may specifically include: two substrates, and a liquid crystal layer arranged between the two substrates, the liquid crystal layer having liquid crystal, and a plurality of electrodes arranged in an array on a side of at least one substrate close to the liquid crystal layer; wherein the plurality of electrodes divide the liquid crystal layer to form a plurality of phase shifting units 300, and one phase shifting unit 300 is configured to perform phase modulation on an electromagnetic wave of an antenna unit; wherein at least one phase shifting unit 300 has the phase shifting structure described in the above embodiment.

[0145] In this example, the phase shifter array is divided into multiple phase shift units by multiple electrodes, and each phase shift unit is stacked with a lower substrate, a liquid crystal layer and an upper substrate, wherein electrodes are arranged on the upper substrate and / or the lower substrate. For example, for each phase shift unit, an electrode is arranged on a side of the upper substrate close to the liquid crystal layer, and an electrode is arranged on a side of the lower substrate close to the liquid crystal layer, with liquid crystal in the middle.

[0146] Among them, in the entire phase shifter array, at least one phase shift unit can have the temperature measurement structure described in the above embodiment, that is, it has the phase shift structure described in the above embodiment, and the phase shift structure can be an example or a combination of multiple examples in the above phase shift structure embodiment.

[0147] In one example, a phase shift unit in the entire phase shifter array has the above-mentioned phase shift structure, and the temperature measured by the temperature measurement structure therein can be used as the temperature of the entire phase shifter array, so as to realize the regulation of the driving voltage of each phase shift unit in the entire phase shifter array based on the temperature. This example can reduce the manufacturing cost.

[0148] In another example, multiple phase shifting units in the entire phase shifter array have the above-mentioned phase shifting structure, such as every n phase shifting units have the above-mentioned phase shifting structure, where n is greater than or equal to 1; wherein the temperature measured by the temperature measuring structure in one phase shifting structure can be used as the temperature of the liquid crystal in the adjacent phase shifting unit that does not have a phase shifting structure, so that the temperature measured by one phase shifting unit can be used to regulate the driving voltage of at least two adjacent phase shifting units in the phase shifter array.

[0149] In another example, each phase shifter unit in the entire phase shifter array has the above-mentioned phase shifter structure, and the temperature measured by the temperature measuring structure in a phase shifter structure can be adjusted by its own driving voltage. In this example, when each phase shifter unit has the above-mentioned phase shifter structure, the temperature of the liquid crystals in different phase shifters may be inconsistent. Therefore, when each phase shifter unit has the above-mentioned phase shifter structure, targeted temperature measurement can be achieved, so that the temperature of the liquid crystal on each phase shifter unit can be accurately obtained, and the driving voltage of the phase shifter unit can be adjusted according to the temperature of the liquid crystal in each phase shifter unit, thereby achieving the accuracy of phase shift control.

[0150] By using the phase shifter array in the embodiment, the temperature of the liquid crystal in the array can be detected through the phase shifting structure, so that the temperature of the liquid crystal can be detected at a closer distance without the need to use external equipment to detect the temperature of the liquid crystal, thereby solving the problem of inaccurate temperature detection using external equipment and providing an accurate temperature reference for driving the deflection of the liquid crystal in the phase shifting unit, so that the driving voltage can change with the change of the temperature of the liquid crystal, thereby ensuring the accuracy of phase modulation.

[0151] In one example, the phase shifter array may also have a temperature control module to control the temperature of the liquid crystal in the liquid crystal layer so that the temperature of the liquid crystal is maintained at a preset temperature. Specifically, the temperature control module is connected to the temperature measuring structure in the phase shift structure, and is configured to heat or cool the liquid crystal in multiple phase shift zones according to the temperature of the liquid crystal measured by the temperature measuring structure.

[0152] By way of example, the temperature control module may include a heating wire arranged on the phase shifter array, such as a heating wire arranged on the side of the substrate facing away from the liquid crystal, so that the liquid crystal can be heated. Specifically, when the temperature of the liquid crystal is lower than a preset temperature, the heating wire can be controlled to heat the liquid crystal, so that the liquid crystal is maintained at the preset temperature.

[0153] As another example, the temperature control module may further include a heat dissipation circuit arranged on the phase shifter array, such as a heat dissipation layer arranged on the side of the substrate facing away from the liquid crystal, and a plurality of heat dissipation circuits are provided in the heat dissipation layer; when the temperature of the liquid crystal is higher than a preset temperature, cooling liquid may be input into the heat dissipation circuit to dissipate the heat of the liquid crystal, thereby maintaining the liquid crystal at a preset temperature.

[0154] By adopting the technical solution of this embodiment, the liquid crystal in the phase shifter can be kept at a preset temperature through external temperature control means, so that the viscosity coefficient of the liquid crystal in the liquid crystal layer is always kept consistent, and the liquid crystal can continuously and stably respond to the driving voltage, thereby ensuring the accuracy of phase modulation.

[0155] In another example, the phase shifter array may also be provided with a control unit, which is used to adjust the driving voltage based on the measured temperature of the liquid crystal to ensure the phase modulation effect. The control unit is connected to the temperature measuring structure in each of the phase shift structures and to the plurality of electrodes, wherein the control unit is configured to: determine the temperature of the liquid crystal in the liquid crystal layer according to the temperature of the temperature measuring area measured by the temperature measuring structure, and compensate the driving voltage output to the electrode according to the temperature of the liquid crystal.

[0156] For example, when a phase shift unit has the phase shift structure in the above-mentioned phase shift structure embodiment, the temperature of the temperature measuring area measured by the temperature measuring structure in the phase shift unit can be used as the temperature of the entire phase shifter array, that is, the liquid crystal temperature corresponding to each phase shift unit in the phase shifter array is consistent. Therefore, when the control unit compensates for the driving voltage, for each phase shift unit, the driving voltage corresponding to the phase shift unit can be compensated according to the measured temperature of the liquid crystal.

[0157] As another example, when each phase shift unit is provided with the phase shift structure in the above-mentioned phase shift structure embodiment, the temperature of the temperature measuring area measured by the temperature measuring structure in each phase shift unit is used as the temperature of the phase shift unit. Therefore, when the control unit performs compensation for the driving voltage, for each phase shift unit, the driving voltage corresponding to the phase shift unit can be compensated according to the temperature of the liquid crystal measured by the temperature measuring structure in the phase shift unit, thereby improving the accuracy of phase modulation of the entire phase shifter array.

[0158] Based on the same inventive concept, the present disclosure also provides a driving voltage compensation method, which can be applied to the above-mentioned phase shift structure or to the above-mentioned phase shifter array, referring to Figure 8 As shown, a schematic flow chart of the steps of the drive voltage compensation method is shown, such as Figure 8 As shown, the following steps may be specifically included:

[0159] Step S801: obtaining a first temperature of a temperature measurement area sensed by a temperature measurement structure;

[0160] Step S802: determining a second temperature of liquid crystal in the liquid crystal layer according to the first temperature of the temperature measurement area;

[0161] Step S803: compensating the driving voltage according to the second temperature of the liquid crystal, the driving voltage being used to drive the liquid crystal in the phase shift structure to generate deflection.

[0162] In this embodiment, the specific structure of the temperature measuring structure can refer to the embodiment of the above-mentioned phase-shifting structure, wherein when the temperature measuring structure is a temperature measuring circuit, the temperature measuring circuit may include a first metal wire and a second metal wire, and the resistivity of the first metal wire can be determined according to the current on the temperature measuring circuit. Then, the first temperature of the temperature measuring zone can be determined according to the relationship between the resistivity of the first metal wire and the temperature.

[0163] When the temperature measurement area overlaps with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate, the temperature measurement area is close to the liquid crystal, and its first temperature can be approximately equal to the temperature of the liquid crystal. Therefore, the second temperature of the liquid crystal can be approximately equal to the first temperature.

[0164] Among them, when the temperature measurement zone and the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate do not overlap, although the temperature measurement zone is set close to the liquid crystal, there is a certain distance between the two. Therefore, the second temperature of the liquid crystal can be determined according to the first temperature of the temperature measurement zone. Specifically, there is a certain distance between the two. Therefore, the second temperature of the liquid crystal can be determined according to the first temperature of the temperature measurement zone. In this case, the process of determining the second temperature of the liquid crystal can be determined according to the positional relationship of the temperature measurement zone relative to the liquid crystal layer. For example, when the temperature measurement zone includes multiple temperature measurement zones and the multiple temperature measurement zones are located on the same side of the orthographic projection of the liquid crystal layer on the substrate, such as Figure 3e The phase shift structure shown can determine the second temperature of the liquid crystal according to Fourier's law.

[0165] If multiple temperature measurement zones are located on opposite sides of the orthographic projection of the liquid crystal layer on the substrate, such as Figure 3c With the phase shift structure shown, the average value of the temperatures of the multiple temperature measurement areas can be used as the second temperature of the liquid crystal.

[0166] After obtaining the second temperature of the liquid crystal, the viscosity coefficient of the liquid crystal at the second temperature can be obtained, thereby obtaining the deflection difficulty of the liquid crystal under the viscosity coefficient, and then determining whether to increase or decrease the driving voltage. Fig. 9 As shown, a curve diagram showing the relationship between the viscosity coefficient of liquid crystal and temperature is shown, as Fig. 9 As shown, the higher the temperature of the liquid crystal, the smaller the viscosity coefficient, the easier it is to deflect the liquid crystal, and a smaller driving voltage is required; the lower the temperature of the liquid crystal, the higher the viscosity coefficient, the more difficult it is to deflect the liquid crystal, and a larger driving voltage is required.

[0167] Among them, the driving voltage that drives the liquid crystal to deflect is generally a voltage under a preset viscosity coefficient. After determining the second temperature of the liquid crystal, the viscosity coefficient corresponding to the second temperature can be determined. If it is less than the preset viscosity coefficient, the driving voltage can be reduced. If it is greater than the preset viscosity coefficient, the driving voltage can be increased.

[0168] As described in the above example, a substrate may include multiple temperature measuring circuits, and different temperature measuring circuits are used to sense the temperatures of different temperature measuring areas, and the orthographic projections of the multiple temperature measuring circuits on the liquid crystal layer are located on the same side of the liquid crystal, thereby enabling the temperature of multiple temperature measuring areas on the same side to be sensed, and the multiple temperature measuring circuits are arranged at intervals in a target direction orthogonal to the extension direction of the liquid crystal layer. For details, please refer to Figure 3eThe phase-shifting structure shown in the figure, for this phase-shifting structure, when obtaining the second temperature of the liquid crystal in the liquid crystal layer, Fourier's law can be used for calculation. Specifically, the temperature difference between the first temperatures of each two adjacent temperature measurement zones and the vertical distance between the two adjacent temperature measurement zones can be determined; and the heat flow parameters are obtained according to the temperature difference and the vertical distance; wherein the heat flow parameters are used to characterize the heat flow of the liquid crystal in the target direction; and based on the heat flow parameters, the first temperature of the target temperature measurement zone, and the distance between the orthographic projection of the target temperature measurement zone on the liquid crystal layer and the liquid crystal, the second temperature of the liquid crystal is obtained; wherein the target temperature measurement zone is any one of the multiple temperature measurement zones.

[0169] In this example, the vertical distance between the two temperature measurement zones may be the vertical distance between the temperature measurement elements in the temperature measurement zones, such as the vertical distance between the first metal wires. If a plurality of temperature measurement zones are provided on a substrate, the heat flow coefficient may be determined based on the temperature difference between the first temperatures of each two temperature measurement zones and the vertical distance between each two temperature measurement zones. Specifically, the heat flow coefficient may be obtained based on the above formula (1).

[0170] It should be noted that if the number of temperature measurement zones is three or more, a heat flow coefficient will be calculated for every two temperature measurement zones, and a total of three heat flow coefficients can be obtained. The average of the three heat flow coefficients can be used as the final heat flow parameter to participate in the calculation of the second temperature. Among them, the heat flow parameter can be used to reflect the heat flow in the target direction (from close to the liquid crystal to away from the liquid crystal) when the liquid crystal is used as a heat source, that is, the heat flow on the heat dissipation path.

[0171] Wherein, when obtaining the second temperature of the liquid crystal based on the heat flow parameter, the first temperature of the target temperature measurement area, and the distance between the orthographic projection of the target temperature measurement area on the liquid crystal layer and the liquid crystal, it can be obtained based on the above formula (2). Specifically, the target temperature measurement area can be a temperature measurement area closest to the liquid crystal, or it can be a temperature measurement area farthest from the liquid crystal, which is not limited here.

[0172] In one example, when compensating the driving voltage according to the second temperature of the liquid crystal, the viscosity coefficient of the liquid crystal may be determined according to the temperature of the liquid crystal, and then the current driving voltage may be compensated based on the relationship between the viscosity coefficient and the ease of deflection of the liquid crystal. Specifically, the following process may be included:

[0173] First, based on the correspondence between the temperature and the viscosity coefficient of the liquid crystal, the target viscosity coefficient corresponding to the second temperature and the target deflection angle corresponding to the liquid crystal can be determined;

[0174] Next, the target voltage required for the liquid crystal to deflect to the target deflection angle can be determined according to the target viscosity coefficient and the target deflection angle, and the driving voltage can be compensated to the target voltage.

[0175] In this example, the deflection angle of the liquid crystal is related to the size of the driving voltage applied in the liquid crystal layer. Under the same driving voltage, the larger the viscosity coefficient of the liquid crystal, the smaller the deflection angle, and the smaller the viscosity coefficient of the liquid crystal, the larger the deflection angle. Therefore, when compensating for the driving voltage, the target viscosity coefficient corresponding to the second temperature can be determined first, and then the target deflection angle of the liquid crystal can be determined. The target deflection angle refers to the angle at which the liquid crystal should deflect.

[0176] After obtaining the target deflection angle and the target viscosity coefficient, the target voltage required to deflect to the target deflection angle under the target linear coefficient can be obtained based on the relationship between the viscosity coefficient and the driving voltage. Then, the driving voltage can be compensated to the target voltage. For example, the driving voltage can be increased to the target voltage, or the driving voltage can be reduced to the target voltage.

[0177] Based on the same inventive concept, the present disclosure also provides an antenna device, which may include a radiating structure and a phase shifting structure, wherein the phase shifting structure may be the phase shifting structure described in the above embodiment, or may be the phase shifter array described in the above embodiment, wherein the radiating structure is arranged on one side of the outgoing electromagnetic wave of the phase shifting structure and is configured to radiate electromagnetic waves outward.

[0178] Among them, the antenna device can also include a drive control module, which can be used to execute the drive voltage compensation method described in the above embodiment to compensate for the drive voltage input to the phase shift structure, so that the drive voltage is adapted to the temperature of the liquid crystal to improve the accuracy of phase modulation, so that electromagnetic waves with the required phase can be radiated outward.

[0179] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.

[0180] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0181] The above is a detailed introduction to a phase shifting structure, a phase shifter array, an antenna device and a compensation method for a driving voltage provided by the present disclosure. Specific examples are used herein to illustrate the principles and implementation methods of the present disclosure. The description of the above embodiments is only used to help understand the method of the present disclosure and its core idea. At the same time, for a person skilled in the art, according to the idea of ​​the present disclosure, there will be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as a limitation on the present disclosure.

[0182] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. The present disclosure is intended to cover any variations, uses or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0183] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

[0184] References herein to "one embodiment," "embodiment," or "one or more embodiments" mean that a particular feature, structure, or characteristic described in conjunction with the embodiment is included in at least one embodiment of the present disclosure. In addition, please note that examples of the term "in one embodiment" do not necessarily all refer to the same embodiment.

[0185] In the description provided herein, a large number of specific details are described. However, it is understood that the embodiments of the present disclosure can be practiced without these specific details. In some instances, well-known methods, structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0186] In the claims, any reference signs placed between brackets shall not be construed as limiting the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present disclosure may be implemented by means of hardware comprising a number of different elements and by means of a suitably programmed computer. In a unit claim enumerating a number of means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc. does not indicate any order. These words may be interpreted as names.

[0187] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present disclosure, rather than to limit them. Although the present disclosure has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present disclosure.

Claims

1. A phase shift structure, characterized in that: include: Two substrates arranged opposite to each other, and a liquid crystal layer located between the two substrates, wherein the liquid crystal layer contains liquid crystals; wherein: An electrode is disposed on a side of at least one of the substrates close to the liquid crystal layer, and the electrode is configured to provide a driving voltage for deflection of the liquid crystal; A temperature measuring structure is arranged on a side of at least one of the substrates close to the liquid crystal layer, and / or on a side of at least one of the substrates away from the liquid crystal layer, wherein the temperature measuring structure is configured to sense the temperature of a temperature measuring area, wherein the temperature measuring area is located on the substrate and close to the liquid crystal in the liquid crystal layer, and the temperature of the temperature measuring area is used to determine the temperature of the liquid crystal in the liquid crystal layer; Wherein, for the substrate having the temperature measurement structure, the substrate includes a temperature measurement structure arranged at the same layer as the electrode and / or a temperature measurement structure arranged at a different layer from the electrode.

2. The phase shift structure according to claim 1, characterized in that: The temperature measuring structures are arranged on both substrates; wherein, the orthographic projections of the first temperature measuring structure and the second temperature measuring structure on the same substrate are respectively located on opposite sides of the orthographic projection of the liquid crystal in the liquid crystal layer on the same substrate, so as to measure the temperatures of the temperature measuring areas located on opposite sides of the liquid crystal; the first temperature measuring structure and the second temperature measuring structure are respectively located on the two substrates.

3. The phase shift structure according to claim 1, characterized in that: A plurality of the temperature measuring structures are provided on one substrate, and the plurality of the temperature measuring structures respectively sense the temperatures of the plurality of the temperature measuring areas; The multiple temperature measuring structures do not overlap each other and are located on the same side of the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate. The multiple temperature measuring structures are spaced apart and distributed in a direction orthogonal to the thickness direction of the liquid crystal layer.

4. The phase shifting structure according to claim 1, characterized in that: The temperature measurement structure includes a temperature measurement circuit, and the temperature measurement circuit includes a temperature sensitive element. The temperature sensitive element is arranged in the test area, wherein the temperature sensitive element is an element whose electrical / chemical properties change with temperature.

5. The phase shift structure according to any one of claims 1 to 4, characterized in that: The temperature measurement area on the substrate does not overlap with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate; wherein the temperature measurement structure includes a temperature measurement circuit, and the temperature measurement circuit includes: A first metal wire is arranged in the temperature measurement area, and the first metal wire has no overlap with the orthographic projection of the liquid crystal in the liquid crystal layer on the substrate; wherein the resistivity of the first metal wire changes with the change of temperature; a second metal line, which is farther away from the liquid crystal than the first metal line, one end of the second metal line is connected to the first metal line, and the other end is used to connect to a control unit, the control unit is configured to determine the temperature of the liquid crystal in the liquid crystal layer according to the resistivity change of the first metal line; Wherein, the radius of the first metal wire is smaller than the radius of the second metal wire.

6. The phase shifting structure according to claim 5, characterized in that: At least two temperature measurement circuits are included on the same substrate; wherein, in two adjacent temperature measurement circuits located on the same side of the substrate, the minimum vertical distance between the first metal wires is 1 mm-5 mm.

7. The phase shift structure according to claim 5, characterized in that: At least two temperature measurement circuits are included on the same substrate; wherein, in two adjacent temperature measurement circuits located on the same side of the substrate, the minimum vertical distance between the second metal wires is 1 mm-3 mm.

8. The phase shifting structure according to claim 5, characterized in that: The ratio of the radius of the first metal wire to the radius of the second metal wire is 1:5 to 1:

10.

9. The phase shifting structure according to claim 5, characterized in that: The first metal wire is bent in the temperature measuring area to form at least one of a sawtooth shape, a wave shape, and a paper clip shape.

10. A phase shifter array, characterized in that: include: Two substrates, and a liquid crystal layer disposed between the two substrates, wherein the liquid crystal layer contains liquid crystals, and a plurality of electrodes are arranged in an array on a side of at least one of the substrates close to the liquid crystal layer; wherein: The plurality of electrodes divide the liquid crystal layer to form a plurality of phase shifting units, and one of the phase shifting units is configured to perform phase modulation on the electromagnetic wave of one antenna unit; Wherein, at least one of the phase shifting units has the phase shifting structure described in any one of claims 1-9.

11. The phase shifter array according to claim 10, characterized in that: Also includes: A temperature control module is connected to the temperature measuring structure in the phase shift structure and is configured to heat or cool the liquid crystals in the plurality of phase shift units according to the temperature of the liquid crystals measured by the temperature measuring structure.

12. The phase shifter array according to claim 10, characterized in that: The phase shifter array further comprises a control unit, which is connected to the temperature measuring structure in each phase shifting structure and to the plurality of electrodes, wherein: The control unit is configured to determine the temperature of the liquid crystal in the liquid crystal layer according to the temperature of the temperature measuring area measured by the temperature measuring structure, and compensate the driving voltage output to the electrode according to the temperature of the liquid crystal.

13. An antenna device, characterized in that: Comprising a radiation structure, and a phase shift structure as described in any one of claims 1 to 9 or a phase shifter array as described in any one of claims 10 to 12; Wherein, the radiation structure is arranged on one side of the outgoing electromagnetic wave of the phase shift structure, and is configured to radiate the electromagnetic wave outward.

14. A method for compensating a driving voltage, characterized in that: Applied to the phase shift structure described in any one of claims 1 to 9, or applied to the phase shifter array described in any one of claims 10 to 12, or applied to the antenna device described in claim 13, the method comprising: Acquiring a first temperature of the temperature measurement area sensed by the temperature measurement structure; determining a second temperature of liquid crystal in the liquid crystal layer according to the first temperature of the temperature measuring area; The driving voltage is compensated according to the second temperature of the liquid crystal, and the driving voltage is used to drive the liquid crystal in the phase shift structure to generate deflection.

15. The compensation method according to claim 14, characterized in that: It comprises a plurality of temperature measuring circuits, wherein the plurality of temperature measuring circuits respectively sense the temperature of a plurality of temperature measuring areas, the orthographic projections of the plurality of temperature measuring circuits on the liquid crystal layer are located on the same side of the liquid crystal, and the plurality of temperature measuring circuits are arranged at intervals in a target direction orthogonal to the extension direction of the liquid crystal layer; The step of determining the second temperature of the liquid crystal in the liquid crystal layer according to the first temperature of the temperature measurement area comprises: Determine the temperature difference between the first temperatures of each two of the temperature measuring zones, and the vertical distance between each two of the temperature measuring zones; Acquire a heat flow parameter according to the temperature difference and the vertical distance; wherein the heat flow parameter is used to characterize the heat flow of the liquid crystal in the target direction; Acquire a second temperature of the liquid crystal based on the heat flow parameter, the first temperature of the target temperature measurement area, and the distance between the orthographic projection of the target temperature measurement area on the liquid crystal layer and the liquid crystal; Wherein, the target temperature measurement area is any temperature measurement area among the multiple temperature measurement areas.

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