Assembly line type chip test equipment

Abstract

The invention relates to the technical field of chip testing, in particular to assembly line type chip testing equipment which comprises a cabinet, a console and a displayer are arranged at one corner of the upper side of the cabinet, two sets of belt conveyors are arranged on the upper side of the cabinet, and a screening machine is arranged on the side face of one set of belt conveyors. A testing mechanism is arranged between the two sets of belt conveyors, a three-axis transfer is arranged on the side face of each belt conveyor, and a material suction set is arranged on the side face of each three-axis transfer. By arranging the three-axis transfer, the material suction group, the testing mechanism, the belt conveyor and the peripheral parts of the belt conveyor, automatic assembly line testing operation of chips can be achieved, stable clamping connection of the chips and the testing plate can be guaranteed during testing, the testing effect is guaranteed, the chips are preliminarily limited and positioned through a mechanical structure before testing, and the testing efficiency is improved. Therefore, the chip and the test board are not deviated when clamped, a visual detector does not need to be arranged, and the equipment manufacturing cost is also reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a pipeline chip testing device. Background Art

[0002] With the advancement of science and technology, related industries have put forward high requirements on chip performance, which has greatly promoted the development of chips. The reliability of chips plays a vital role in practical applications. Under the premise of the current surge in demand for chips, suppliers must not only ensure that the final test is qualified, but also be able to ship in large quantities quickly; The existing method is to use automated testing equipment for rapid testing. The existing equipment uses a test bench and a mechanical transfer device to place the chips one by one on the side of the test bench for testing. After observation, the following problems still exist in on-site use: 1. The existing chip test is to insert the chip pins into the side of the test bench. The existing chips are transported through the conveyor line and their side positions are not fixed. Although a visual inspection instrument is provided to assist in determining the position, there is still a situation where the chip and the test bench cannot be properly connected; 2. In the production of existing chips, due to process problems, the thickness of the chips may vary. The chips that are too thin cannot be used normally in the future, and the existing test equipment cannot detect them, so they need to be sorted out later; 3. Existing chip testing can only be carried out at room temperature in conjunction with a test bench, and cannot effectively simulate the chip usage status under high or low temperature conditions. For this reason, we propose a pipeline chip testing device. Summary of the invention

[0003] In order to overcome the technical problems existing in the above-mentioned prior art, the present invention provides a pipeline chip testing device.

[0004] In order to solve the above technical problems, the present invention provides the following technical solutions: comprising a cabinet, a control console and a display are arranged at a corner of the upper side of the cabinet, two groups of belt conveyors are arranged on the upper side of the cabinet, a screening machine is arranged on the side of one group of belt conveyors, a testing mechanism is arranged between the two groups of belt conveyors, a three-axis transfer is arranged on the side of the belt conveyor, and a suction group is arranged on the side of the three-axis transfer; The test mechanism comprises a mounting platform, a cavity is formed on the side of the mounting platform, a test plate is fixedly mounted on the bottom wall of the cavity, a pressing block is arranged inside the mounting platform, a fixing frame is arranged on the side of the pressing block, a stopper is arranged on the side of the fixing frame, and a calibration module and a temperature control module are arranged inside the mounting platform; The calibration module comprises a movable cavity, an inner cavity and a sliding cavity, wherein a first gear shaft is movably installed inside the movable cavity, a synchronizing plate is movably installed inside the inner cavity, and a calibration block is movably installed inside the sliding cavity; The temperature control module includes a matching cavity, a first air guide cavity and a second air guide cavity. A connecting pipe is arranged on the side of the first air guide cavity. A matching block is movably installed inside the matching cavity. A connecting groove is opened on the side of the matching block. A second gear shaft is arranged on the lower side of the matching block.

[0005] Furthermore, a storage box and a waste box are respectively provided on the upper side of the cabinet, a guide plate is provided on the upper side of the belt conveyor, a connecting block is fixedly installed on the side of the guide plate, a bolt group is movably provided inside the connecting block and the bolt group is fixedly installed on the side of the belt conveyor bracket.

[0006] Furthermore, the mounting platform is arranged between two groups of belt conveyors and a cylindrical support is arranged on the lower side of the mounting platform and fixed on the upper side of the cabinet. The opening is opened in the middle position of the upper side of the mounting platform, and a connecting cavity is opened on the side wall of the opening. The pressure block is movably installed inside the connecting cavity, the fixing frame is arranged on the side of the mounting platform, and the stopper is arranged on the upper position of the guide plate, and the stopper is fixed to the side of the fixing frame by bolts.

[0007] Furthermore, a constraint rod is fixedly installed on the side of the pressing block, a support tube is fixedly connected between the pressing block and the side of the fixing frame, and the support tube is movably sleeved on the side position of the constraint rod, and a first electric push rod is fixedly installed on the lower side of the mounting platform through a connecting piece, and the output end of the first electric push rod is fixedly installed on the side of the fixing frame.

[0008] Furthermore, the movable cavity is opened on the side of the mounting table and is arranged below the test plate, the inner cavity is opened on the top wall of the movable cavity and is arranged below the test plate, the first gear shaft extends into the inner cavity, the synchronization plate is fixedly installed on the upper side of the first gear shaft, and four groups of guide grooves are equidistantly opened on the side of the synchronization plate.

[0009] Furthermore, the sliding cavity is opened on the top wall of the inner cavity and passes through the mounting platform to the inside of the cavity. The sliding cavity corresponds to the position of the four side walls of the cavity. The calibration block is arranged above the guide groove. The guide block is fixedly installed on the lower side of the calibration block and the guide block is movably installed inside the guide groove.

[0010] Furthermore, the matching cavity is opened on the top wall of the movable cavity, the first air guide cavity is opened on the inner wall of the matching cavity, and the second air guide cavity is opened on the inner wall of the matching cavity and penetrates the mounting platform to the internal position of the cavity.

[0011] Furthermore, the connecting pipe is fixedly installed on the side of the console and passes through the mounting platform to the inside of the first air guide cavity. The connecting groove is opened on the side of the matching block corresponding to the positions of the first air guide cavity and the second air guide cavity. The second gear shaft is fixedly installed on the lower side of the matching block and extends out of the matching cavity to the inside of the active cavity.

[0012] Compared with the prior art, the present invention can achieve the following beneficial effects: 1. The present invention can realize the automated assembly line test operation of the chip by setting up a three-axis transfer, a material suction group, a test mechanism, a belt conveyor and its peripheral components, and can ensure the stable connection between the chip and the test board during the test to ensure the test effect. Before the test, the chip is preliminarily restricted and positioned by a mechanical structure so that the position of the chip and the test board will not be offset when they are connected. There is no need to set up a visual inspection instrument, which also reduces the equipment manufacturing cost.

[0013] 2. The present invention sets a stopper and its peripheral components. The stopper can cooperate with the guide plate to constrain and limit the chip. At the same time, the position of the stopper can be adjusted, and the chips with unqualified thickness can be directly removed during transportation, avoiding the complicated work of subsequent sorting. In addition, multiple groups of stops can limit the chips one by one to complete the positioning and loading test operation of the chips during transportation.

[0014] 3. The present invention sets a calibration module, that is, when the chip is placed in the cavity, the first electric push rod pulls the fixing frame to trigger the calibration block therein to squeeze and limit the four sides of the chip, and cooperates with the pressure block to press the chip down, so that the chip can be stably connected and fixed with the test board, and further completes the positioning operation of the chip to ensure the best efficiency of chip testing.

[0015] 4. The present invention sets a temperature control module, which can adjust the temperature inside the open cavity according to needs during chip testing, simulating chip testing under high and low temperature conditions, and multiple groups of test boards can perform separate temperature interference through the temperature control module to perform temperature adjustment operations in a small range, thereby ensuring temperature diversification during temperature test simulation.

[0016] 5. The present invention can drive and trigger the calibration module and the temperature control module components through a single set of first electric push rods, thereby reducing the number of drive components and optimizing the cost of equipment manufacturing and the complexity of program writing.

[0017] 6. The present invention provides a support block and its peripheral components so that the gear rod can be in an elastic state on the side of the linkage frame, so that after the gear rod is separated from the first gear shaft and the second gear shaft, the subsequent meshing operation can be better performed. When the gear rod contacts the side surfaces of the first gear shaft and the second gear shaft, a certain avoidance will be produced to ensure stable meshing and docking. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a schematic diagram of the overall structure of the present invention; Figure 2 It is a partial structural schematic diagram of the present invention; Figure 3 It is a partial structural schematic diagram of the belt conveyor of the present invention; Figure 4 It is a structural schematic diagram of the testing mechanism of the present invention; Figure 5It is a partial cross-sectional structural schematic diagram of the mounting platform of the present invention; Figure 6 For the present invention Figure 4 A schematic diagram of the enlarged structure at point A; Figure 7 It is a schematic diagram of a partial explosion structure of a calibration module of the present invention; Figure 8 It is a schematic diagram of the local structure of the temperature control module of the present invention.

[0019] Among them: 1. Cabinet; 11. Control console; 12. Display; 2. Three-axis transfer; 21. Suction group; 3. Belt conveyor; 31. Storage box; 32. Waste box; 33. Guide plate; 34. Connecting block; 35. Bolt group; 4. Test mechanism; 41. Mounting table; 42. Open cavity; 421. Test plate; 43. Connecting cavity; 431. Press block; 432. Constraint rod; 433. Support cylinder; 44. Fixing frame; 441. Stopper; 45 , the first electric push rod; 5, calibration module; 51, movable cavity; 52, inner cavity; 53, first gear shaft; 54, synchronization plate; 541, guide groove; 55, sliding cavity; 551, calibration block; 552, guide block; 56, linkage frame; 57, gear rod; 571, support block; 6, temperature control module; 61, matching cavity; 62, first air guide cavity; 63, second air guide cavity; 64, connecting pipe; 65, matching block; 66, connecting groove; 67, second gear shaft. DETAILED DESCRIPTION

[0020] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below in conjunction with specific embodiments, but the following embodiments are only preferred embodiments of the present invention, not all. Based on the embodiments in the implementation mode, other embodiments obtained by those skilled in the art without creative work all belong to the protection scope of the present invention. The experimental methods in the following embodiments, unless otherwise specified, are conventional methods, and the materials, reagents, etc. used in the following embodiments, unless otherwise specified, can all be obtained from commercial channels.

[0021] Example: Figure 1As shown, a pipeline chip testing device includes a cabinet 1, which is a rectangular cabinet with a control integrated circuit board, a detection module and a power supply module arranged inside. A control console 11 is arranged at a corner position on the upper side of the cabinet 1. The control console 11 is an integration of a touch screen, a control panel and a cooling and heating fan module, which can be powered by the power supply module inside the cabinet 1 to perform program selection and subsequent temperature control operations. A display 12 is arranged at another corner position on the upper side of the cabinet 1, which can be used to display test working status information. Two groups of belt conveyors 3 are equidistantly arranged on the upper side of the cabinet 1, one group of belt conveyors A screening machine is arranged on the side of the conveyor 3, which is used to convey the chips piece by piece to the side of the belt conveyor 3 for assembly line testing. Another group of belt conveyors 3 is used to convey and collect the tested chips. A testing mechanism 4 for stable testing is arranged between the two groups of belt conveyors 3. A three-axis transfer 2 is arranged on the side of the belt conveyor 3 for conveying and testing. A suction group 21 is arranged on the side of the three-axis transfer 2 and is connected to the air pump through a pipeline to suck and release the chips. The three-axis transfer 2 can drive the suction group 21 to pick up and unload the chips. like Figure 2 and Figure 3 As shown, a storage box 31 and a waste box 32 are respectively arranged on the upper side of the cabinet 1. The storage box 31 is arranged on the side of the belt conveyor 3 after the conveying test, and the waste box 32 is arranged on the side of the belt conveyor 3 and the testing mechanism 4 before the conveying test. The storage box 31 is a rectangular box, and the waste box 32 is an "L"-shaped box. A guide plate 33 is mirror-set on the upper side of the belt conveyor 3 before the conveying test. The guide plate 33 is a folding rod. Two groups of guide plates 33 can form a funnel-shaped channel to constrain the chip to the middle position on the upper side of the belt conveyor 3. A connecting block 34 is fixedly installed on the side of the guide plate 33. The connecting block 34 is a U-shaped block. A bolt group 35 is movably arranged inside the connecting block 34 and the bolt group 35 is fixedly installed on the side of the belt conveyor 3 bracket. The bolt group 35 is composed of a cross-shaped cylindrical rod and a nut. The connecting block 34 can be fixed by tightening the nut, and the guide plate 33 can be adjusted by loosening it. The chip can be subjected to pipeline automated testing by cooperating with other components through the test mechanism 4; like Figures 4 to 8As shown, the test mechanism 4 includes a mounting platform 41 arranged at a staggered position between two groups of belt conveyors 3, and a cylindrical support is arranged on the lower side of the mounting platform 41 and fixed on the upper side of the cabinet 1. The mounting platform 41 is a rectangular platform, and an opening 42 is opened in the middle position of the upper side of the mounting platform 41, and the opening 42 is a rectangular cavity. A test board 421 is fixedly installed on the bottom wall of the opening 42, and the test board 421 is connected to the detection module inside the cabinet 1 through wires. A connecting cavity 43 that passes through the mounting platform 41 is opened on the side wall of the opening 42 near the position of the three-axis transfer 2, and the connecting cavity 43 is a rectangular cavity. A pressure block 431 is movably installed inside the connecting cavity 43, and the pressure block 431 is a trapezoidal block made of rubber. A fixing frame 44 is provided, and the fixing frame 44 is an "L"-shaped frame. A stopper 441 is provided on the side of the fixing frame 44 away from the mounting platform 41, and the stopper 441 is arranged on the upper side of the guide plate 33. The stopper 441 is fixed to the side of the fixing frame 44 by bolt extrusion. The stopper 441 is a concave "L" block with rectangular grooves symmetrically opened on the side. A restraining rod 432 is fixedly installed on the side of the pressing block 431 close to the fixing frame 44, and the restraining rod 432 penetrates the fixing frame 44. The restraining rod 432 is a cylindrical rod. A supporting tube 433 is fixedly connected between the pressing block 431 and the side of the fixing frame 44, and the supporting tube 433 is movably sleeved on the side of the restraining rod 432. The supporting tube 433 is a spring steel cylinder with a continuous "W"-shaped cross section. A first electric push rod 45 is fixedly installed on the lower side of the mounting table 41 through a connecting piece, and the output end of the first electric push rod 45 is fixedly installed on the side of the fixing frame 44. A calibration module 5 that can assist in chip positioning is arranged at the bottom wall position of the opening 42 inside the mounting table 41, and a temperature control module 6 that can adjust and stabilize the detection chip is arranged at the side wall position of the opening 42 inside the mounting table 41. Specifically, the position of the side of the fixing frame 44 can be adjusted by the set stopper 441. By default, the stopper 441 is arranged on the upper side of the guide plate 33 to block the chip with the minimum thickness requirement, and cooperates with the guide plate 33 to preliminarily position the chip. The chip that does not meet the thickness requirement falls directly into the waste box 32 and is driven by the three-axis transfer 2. The suction group 21 sucks the chip and places it inside the cavity 42. The first electric push rod 45 pulls the fixing frame 44 toward the mounting platform 41. At this time, the pressing block 431 slides into the cavity 42 to constrain the chip and press it down. The subsequent components are triggered to constrain the four sides of the chip, so that the chip and the test board 421 are perfectly connected. The support cylinder 433 provides elastic support for the pressing block 431. The operation steps are as follows: the farthest stopper 441 extends to the upper side of the guide plate 33. After the chip is loaded, the stopper 441 moves forward one grid and then moves to the upper side of the guide plate 33. The chip is loaded step by step, and the step-by-step limit loading test operation can be completed. In addition, a sensor can be added to the side of the belt conveyor 3 or the side of the stopper 441 to determine whether the chip is in place. The calibration module 5 can be used to further position the chip before testing, and the accurate card connection detection of the chip can be ensured by pressing the pressing block 431; like Figures 4 to 8 As shown, the calibration module 5 includes an active cavity 51 that runs through the side of the mounting platform 41, and the active cavity 51 is arranged below the test plate 421. The active cavity 51 is a rectangular cavity. An inner cavity 52 is opened on the top wall of the active cavity 51 and the inner cavity 52 is arranged below the test plate 421. The inner cavity 52 is a circular cavity with a convex cross-section. A first gear shaft 53 is movably installed inside the active cavity 51 and the first gear shaft 53 extends into the inner cavity 52. ​​The first gear shaft 53 is a cylindrical shaft with a toothed side. A synchronization plate 54 is movably installed inside the inner cavity 52 and the synchronization plate 54 is fixedly installed at the upper side of the first gear shaft 53. The synchronization plate 54 is a circular plate. Four groups of guide grooves 541 are equidistantly opened in a circular array on the side of the synchronization plate 54. The guide grooves 541 are arc grooves. Sliding cavities 55 are equidistantly opened on the top wall of the inner cavity 52 and the sliding cavity 55 runs through the mounting platform 41 to the inside of the open cavity 42 , the sliding cavity 55 corresponds to the position of the four side walls of the opening cavity 42, a calibration block 551 is movably installed inside the sliding cavity 55 and the calibration block 551 is arranged above the guide groove 541, the calibration block 551 is an "L"-shaped block made of elastic rubber material, a guide block 552 is fixedly installed on the lower side of the calibration block 551 and the guide block 552 is movably installed inside the guide groove 541, and the guide block 552 is a cylindrical block; specifically, the first gear shaft 53 can be triggered to drive the synchronous plate 54 to rotate, and the rotation of the synchronous plate 54 causes the suction group 21 of the calibration module 5 to slide inside the guide groove 541, and the synchronous calibration block 551 is constrained to slide inside the sliding cavity 55 to the inside of the opening cavity 42, so that the calibration block 551 has a limiting and extruding constraint on the four sides of the chip inside the opening cavity 42, ensuring the accuracy of the position of the chip inside the opening cavity 42, and cooperating with the pressing block 431 to tightly clamp the chip and the test board 421 for testing operation; The movable chamber 51 is internally movably provided with a linkage frame 56, and the linkage frame 56 is fixedly installed at a side position of the fixed frame 44. The linkage frame 56 is a "U"-shaped frame, and a gear rod 57 is movably provided on the side of the linkage frame 56, and the gear rod 57 is meshed with the first gear shaft 53. The gear rod 57 is a rectangular rod with teeth on one side, and support blocks 571 are symmetrically fixedly installed on both sides of the gear rod 57, and the other end of the support block 571 is fixedly installed on the inner side of the linkage frame 56, and the support block 571 is a "W"-shaped block made of elastic material; specifically, the fixed frame 44 can be moved synchronously by setting the linkage frame 56, and the gear rod 57 is meshed and driven with the first gear shaft 53, and after the chip is positioned, the pressing operation is performed synchronously, and the support block 571 provided in addition can elastically support the gear rod 57, so that the gear rod 57 and subsequent components are better elastically meshed with the first gear shaft 53; The temperature control module 6 can be set to adjust the temperature of the chip during the chip detection, and different temperature adjustment controls can be performed inside each mounting platform 41, which has stronger adaptability; like Figure 1 , Figure 2 and Figures 4 to 8 As shown, the temperature control module 6 includes a matching cavity 61 opened on the top wall of the active cavity 51, and the matching cavity 61 corresponds to the side position of the test board 421. The matching cavity 61 is a cylindrical cavity with a cross-shaped cross section. A first air guide cavity 62 is opened on the inner wall of the matching cavity 61 away from the position of the three-axis transfer 2. The first air guide cavity 62 is a rectangular groove. A second air guide cavity 63 is opened on the inner wall of the matching cavity 61 in a mirror image, and the second air guide cavity 63 passes through the mounting platform 41 to the internal position of the opening cavity 42. The second air guide cavity 63 is an "L"-shaped groove. A connecting pipe 64 is fixedly installed on the side of the console 11 and The connecting pipes 64 respectively penetrate the mounting platform 41 to the inside of the first air guide cavity 62. The connecting pipes 64 are circular pipes with multiple branches, which connect the air outlet of the cooling and heating fan module in the control console 11 to the inside of the first air guide cavity 62. A matching block 65 is movably installed inside the matching cavity 61. The matching block 65 is a convex cylindrical block. A connecting groove 66 that penetrates the first air guide cavity 62 and the second air guide cavity 63 is opened on the side of the matching block 65 corresponding to the position of the first air guide cavity 62 and the second air guide cavity 63. The connecting groove 66 is a "T"-shaped groove. A second gear shaft 67 is fixedly installed on the lower side of the matching block 65 and the second gear shaft 67 is fixedly installed on the lower side of the matching block 65. The gear shaft 67 extends out of the matching cavity 61 to the internal position of the active cavity 51. The second gear shaft 67 is a cylindrical shaft with a toothed side. Specifically, as the first electric push rod 45 pulls the fixing frame 44, the linkage frame 56 can continue to drive the gear rod 57 to slide inside the active cavity 51. The chip is connected with the test board 421. The gear rod 57 is separated from the side of the first gear shaft 53 and elastically meshes with the second gear shaft 67. The gear rod 57 can drive the second gear shaft 67 to rotate. When the second gear shaft 67 rotates to different positions, the wind flow can be guided differently. The first position is the first wind guide cavity 62, The two groups of second air guide cavities 63 and the connecting grooves 66 are in corresponding positions, so that the wind can enter the interior of the open cavity 42 for heating and cooling operations. The second position of the first air guide cavity 62, a group of second air guide cavities 63 and the connecting grooves 66 correspond to each other, which can reduce the wind flow entering the interior of the open cavity 42. The third position of the first air guide cavity 62 and the two groups of second air guide cavities 63 do not correspond to the connecting grooves 66, so that the wind cannot enter the interior of the open cavity 42. In this way, the test temperature control of the chip can be satisfied, and the operation can be appropriately adjusted according to the internal temperature of the open cavity 42 of different mounting platforms 41.

[0022] Working principle: Before the test: First, check and adjust the positions of various components, such as adjusting the positions of the guide plate 33 and the stopper 441 accordingly, and select a program through the console 11 to perform a pre-control simulation to observe whether the operating status is normal; In the second step, program modifications and component replacements are performed based on the problems observed in the pre-operation simulation, and the corresponding program can be selected for pipeline test operation; During the test: In the first step, the chips are transferred one by one to the side of the first group of belt conveyors 3 for conveying through the screening machine. At this time, the farthest first electric push rod 45 pushes the fixing frame 44 to make the block 441 to the upper side position of the guide plate 33, and the remaining position block 441 remains in a pending state at the side position of the guide plate 33. The chip is constrained to the upper center position of the first group of belt conveyors 3 through the guide plate 33. When the chip reaches the position of the block 441, the chip with qualified thickness is blocked, and the primary positioning of the chip can be completed. The chip with unqualified thickness is not blocked and is directly transported from the side of the first group of belt conveyors 3 to the inside of the waste box 32 for collection. In this way, the chips with unqualified thickness can be preferentially removed, so that there is no need to sort them later; In the second step, the suction group 21 is driven to move by the three-axis transfer 2 to suck the chip and place it in the position inside the cavity 42, and then the farthest first electric push rod 45 pulls the fixing frame 44 to clamp the mounting table 41. At this time, the second group of fixing frames 44 pushes the stopper 441 to the upper position of the guide plate 33, and the material receiving and limiting operations can be performed one by one; when the first electric push rod 45 pulls the fixing frame 44, the linkage frame 56 slides inside the movable cavity 51, first driving the gear rod 57 to engage with the first gear shaft 53 to rotate the synchronous plate 54, and the synchronous plate 54 rotates to constrain the guide block 552 through the guide groove 541 so that the calibration block 551 slides inside the sliding cavity 55 to the inside of the cavity 42, and the four sides of the chip therein are clamped. The synchronous fixing frame 44 pushes the pressing block 431 to slide into the cavity 42 to press and fix the chip, so that the chip and the test board 421 are accurately positioned and clamped, ensuring stable testing of the chip; The third step is that during the test, according to the requirements, the default state of the matching block 65 is the third position, the first air guide cavity 62 and the second air guide cavity 63 are not connected, when the temperature adjustment simulation test is required, the first electric push rod 45 pulls the fixing frame 44 to make the linkage frame 56 slide inside the movable cavity 51, at this time, the gear rod 57 is separated from the side of the first gear shaft 53 and elastically meshed with the second gear shaft 67, and at the same time, the pressing block 431 squeezes the wall of the cavity 42 to squeeze the support cylinder 433 to cooperate with it, the gear rod 57 is meshed with the second gear shaft 67 to drive it to drive the matching block 65 to rotate, the matching block 65 rotates to the first position, the first air guide cavity 62 is connected with the two groups of second air guide cavities 63, and the cooling and heating fan module inside the control console 11 is used to perform cooling and heating operations, and cold air or hot air flows into the cavity 42 to simulate the test state of the chip at high temperature and low temperature, wherein the matching block 65 rotates to the second position, the first air guide cavity 62 is connected with a group of second air guide cavities 63, and the adjustment simulation of different temperatures of the chip can be completed; After the test, the first electric push rod 45 pushes the fixing frame 44 to reset. At this time, all components are reset. The three-axis transfer 2 drives the suction group 21 to move and absorb the chip out of the cavity 42. If the chip is qualified, the chip is placed on the side of the second belt conveyor 3 and transported to the storage box 31 for collection. If the chip is unqualified, the chip is moved to the side of the corresponding mounting table 41 and directly dropped into the waste box 32 for collection. According to the chip testing time, the corresponding number of test boards 421 of the mounting table 41 can be selected for testing, so that after the test of the first group of test boards 421 is completed, the last group of test boards 421 can be used for testing. In this way, the block 441 can perfectly limit the positioning of the chips one by one, and cooperate with the suction group 21 to perform suction and feeding testing.

[0023] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited thereto, and various changes can be made within the knowledge scope of technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. A pipeline chip testing device, comprising a cabinet (1), a control console (11) and a display (12) being arranged at a corner of the upper side of the cabinet (1), two groups of belt conveyors (3) being arranged on the upper side of the cabinet (1), a screening machine being arranged on the side of one group of belt conveyors (3), a testing mechanism (4) being arranged between the two groups of belt conveyors (3), a three-axis transfer (2) being arranged on the side of the belt conveyor (3), and a material suction group (21) being arranged on the side of the three-axis transfer (2); Features: The testing mechanism (4) comprises a mounting platform (41), a cavity (42) is provided on a side of the mounting platform (41), a testing plate (421) is fixedly mounted on the bottom wall of the cavity (42), a pressing block (431) is arranged inside the mounting platform (41), a fixing frame (44) is arranged on a side of the pressing block (431), a stopper (441) is arranged on a side of the fixing frame (44), and a calibration module (5) and a temperature control module (6) are arranged inside the mounting platform (41); The calibration module (5) comprises a movable cavity (51), an inner cavity (52) and a sliding cavity (55); a first gear shaft (53) is movably mounted inside the movable cavity (51); a synchronizing plate (54) is movably mounted inside the inner cavity (52); and a calibration block (551) is movably mounted inside the sliding cavity (55); The temperature control module (6) comprises a matching cavity (61), a first air guide cavity (62) and a second air guide cavity (63); a connecting pipe (64) is arranged on the side of the first air guide cavity (62); a matching block (65) is movably installed inside the matching cavity (61); a connecting groove (66) is provided on the side of the matching block (65); and a second gear shaft (67) is arranged on the lower side of the matching block (65).

2. The pipeline chip testing device according to claim 1, characterized in that: A storage box (31) and a waste box (32) are respectively arranged on the upper side of the cabinet (1); a guide plate (33) is arranged on the upper side of the belt conveyor (3); a connecting block (34) is fixedly mounted on the side of the guide plate (33); a bolt group (35) is movably arranged inside the connecting block (34); and the bolt group (35) is fixedly mounted on the side of the belt conveyor (3) bracket.

3. The pipeline chip testing device according to claim 2, characterized in that: The mounting platform (41) is arranged between the two groups of belt conveyors (3), and a cylindrical support is arranged on the lower side of the mounting platform (41) and fixed on the upper side of the cabinet (1). The opening (42) is opened at the middle position of the upper side of the mounting platform (41), and a connecting cavity (43) is opened on the side wall of the opening (42). The pressing block (431) is movably installed inside the connecting cavity (43). The fixing frame (44) is arranged on the side of the mounting platform (41), and the stopper (441) is arranged on the upper side of the guide plate (33). The stopper (441) is fixed to the side of the fixing frame (44) by bolts.

4. The pipeline chip testing device according to claim 3, characterized in that: A restraining rod (432) is fixedly mounted on the side of the pressing block (431), a supporting tube (433) is fixedly connected between the pressing block (431) and the side of the fixing frame (44), and the supporting tube (433) is movably sleeved on the side of the restraining rod (432), and a first electric push rod (45) is fixedly mounted on the lower side of the mounting platform (41) via a connecting piece, and an output end of the first electric push rod (45) is fixedly mounted on the side of the fixing frame (44).

5. The pipeline chip testing device according to claim 4, characterized in that: The movable cavity (51) is opened on the side of the mounting platform (41) and is arranged below the test plate (421); the inner cavity (52) is opened on the top wall of the movable cavity (51) and is arranged below the test plate (421); the first gear shaft (53) extends into the inner cavity (52); the synchronizing plate (54) is fixedly installed on the upper side of the first gear shaft (53); and four groups of guide grooves (541) are opened at equal intervals on the side of the synchronizing plate (54).

6. The pipeline chip testing device according to claim 5, characterized in that: The sliding cavity (55) is provided on the top wall of the inner cavity (52) and penetrates the mounting platform (41) to the interior of the opening cavity (42). The sliding cavity (55) corresponds to the positions of the four side walls of the opening cavity (42). The calibration block (551) is arranged above the guide groove (541). A guide block (552) is fixedly mounted on the lower side of the calibration block (551) and the guide block (552) is movably mounted inside the guide groove (541).

7. The pipeline chip testing device according to claim 6, characterized in that: The matching cavity (61) is opened on the top wall of the active cavity (51), the first air guide cavity (62) is opened on the inner wall of the matching cavity (61), and the second air guide cavity (63) is opened on the inner wall of the matching cavity (61) and penetrates the mounting platform (41) to the inner position of the open cavity (42).

8. The pipeline chip testing device according to claim 7, characterized in that: The connecting pipe (64) is fixedly mounted on the side of the console (11) and passes through the mounting platform (41) to the inside of the first air guide cavity (62). The connecting groove (66) is provided on the side of the matching block (65) at positions corresponding to the first air guide cavity (62) and the second air guide cavity (63). The second gear shaft (67) is fixedly mounted on the lower side of the matching block (65) and extends from the matching cavity (61) to the inside of the movable cavity (51).

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