An in-line chip testing device

Abstract

The present invention relates to the technical field of chip testing, and particularly to a pipeline-type chip testing device, which includes a cabinet. A console and a display are arranged at a corner position on the upper side of the cabinet. Two groups of belt conveyors are arranged on the upper side of the cabinet. A screening machine is arranged on the side of one group of belt conveyors. A testing mechanism is arranged between the two groups of belt conveyors. A three-axis transfer device is arranged on the side of the belt conveyor, and a material suction group is arranged on the side of the three-axis transfer device. By setting the three-axis transfer device, the material suction group, the testing mechanism, the belt conveyor and their peripheral components, the present invention can realize the automatic pipeline testing operation of the chip, and can ensure the stable clamping of the chip and the test board during testing, guarantee the testing effect. Before testing, the chip is preliminarily limited and positioned through a mechanical structure, so that the position of the chip will not shift when it is clamped with the test board. There is no need to set up a vision detector, and the manufacturing cost of the equipment is also reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and particularly to a pipeline-type chip testing device. Background Art

[0002] With the progress of science and technology, high requirements have been put forward in the performance of chips in related industries, which has greatly promoted the development of chips. The reliability of chips plays a crucial role in the actual application process. Under the premise of a large increase in the current demand for chips, in addition to ensuring the final test is qualified, suppliers must also be able to quickly ship a large number of products;

[0003] Currently, rapid testing is carried out through automated testing equipment. The existing equipment is through the cooperation of a test bench and a mechanical transfer device, and the chips are placed on the side of the test bench one by one for detection. After observing the on-site use, the following problems are found:

[0004] 1. The existing chip testing is through inserting the chip pins into the side of the test bench. The existing chips are conveyed through a conveyor line, and their side positions are not fixed. Although a vision detector is set to assist in judging the position, there are still cases where the chip is not properly engaged with the test bench;

[0005] 2. In the production of existing chips, due to process problems, the chips may have uneven thickness. The too-thin chips cannot be used normally later, and the existing testing devices cannot detect them, and subsequent picking is required;

[0006] 3. The existing chip testing can only cooperate with the test bench for detection according to room temperature, and cannot effectively simulate the chip usage state under high temperature or low temperature conditions. Therefore, we propose a pipeline-type chip testing device. Summary of the Invention

[0007] In order to overcome the technical problems existing in the above-mentioned prior art, the present invention provides a pipeline-type chip testing device.

[0008] To solve the above technical problems, the present invention provides the following technical solutions: including a cabinet, a console and a display are arranged at a corner position on the upper side of the cabinet, two groups of belt conveyors are arranged on the upper side of the cabinet, a screening machine is arranged on the side of one group of belt conveyors, a testing mechanism is arranged between the two groups of belt conveyors, a three-axis transfer is arranged on the side of the belt conveyor, and a material suction group is arranged on the side of the three-axis transfer;

[0009] The testing mechanism includes an installation table, a cavity is opened on the side of the installation table, a test board is fixedly installed on the bottom wall of the cavity, a pressing block is arranged inside the installation table, a fixing frame is arranged on the side of the pressing block, a blocking block is arranged on the side of the fixing frame, and a calibration module and a temperature control module are arranged inside the installation table;

[0010] The calibration module includes a movable cavity, an inner cavity, and a sliding cavity. A first gear shaft is movably installed inside the movable cavity, a synchronization plate is movably installed inside the inner cavity, and a calibration block is movably installed inside the sliding cavity;

[0011] The temperature control module includes a fitting cavity, a first air guide cavity, and a second air guide cavity. A connecting pipe is provided on the side of the first air guide cavity. A fitting block is movably installed inside the fitting cavity. A communication groove is provided on the side of the fitting block, and a second gear shaft is provided on the lower side of the fitting block.

[0012] Furthermore, a storage box and a waste box are respectively provided on the upper side of the cabinet. A guiding plate is provided on the upper side of the belt conveyor. A connecting block is fixedly installed on the side of the guiding plate. A bolt group is movably arranged inside the connecting block and the bolt group is fixedly installed on the side of the belt conveyor bracket.

[0013] Furthermore, the installation table is arranged between two belt conveyors and a cylindrical support is provided on the lower side of the installation table and fixed on the upper side of the cabinet. An opening cavity is provided in the middle position on the upper side of the installation table. A connecting cavity is provided on the side wall of the opening cavity. A pressing block is movably installed inside the connecting cavity. A fixing frame is provided on the side of the installation table. A blocking block is provided at the upper side position of the guiding plate. The blocking block is fixed on the side of the fixing frame by bolts.

[0014] Furthermore, a restraint rod is fixedly installed on the side of the pressing block. A support cylinder is fixedly connected between the side of the pressing block and the fixing frame and the support cylinder is movably sleeved on the side of the restraint rod. A first electric push rod is fixedly installed on the lower side of the installation table through a connecting member and the output end of the first electric push rod is fixedly installed on the side of the fixing frame.

[0015] Furthermore, the movable cavity is opened on the side of the installation table and is arranged below the test board. The inner cavity is opened on the top wall of the movable cavity and is arranged below the test board. The first gear shaft extends into the inner cavity. The synchronization plate is fixedly installed on the upper side of the first gear shaft. Four guiding grooves are equidistantly opened on the side of the synchronization plate.

[0016] Furthermore, the sliding cavity is opened on the top wall of the inner cavity and penetrates through the installation table to the inside of the opening cavity. The sliding cavity corresponds to the four side wall surfaces of the opening cavity. The calibration block is arranged above the guiding grooves. A guiding block is fixedly installed on the lower side of the calibration block and the guiding block is movably installed inside the guiding grooves.

[0017] Furthermore, the fitting cavity is opened on the top wall of the movable cavity. The first air guide cavity is opened on the inner wall of the fitting cavity. The second air guide cavity is opened on the inner wall of the fitting cavity and penetrates through the installation table to the inside of the opening cavity.

[0018] Furthermore, the connecting pipe is fixedly installed on the side of the console and passes through the mounting platform to the inside of the first air guide cavity. The connecting groove is opened on the side of the matching block corresponding to the positions of the first air guide cavity and the second air guide cavity. The second gear shaft is fixedly installed on the lower side of the matching block and extends out of the matching cavity to the inside of the active cavity.

[0019] Compared with the prior art, the present invention can achieve the following beneficial effects:

[0020] 1. The present invention can realize the automated assembly line test operation of the chip by setting up a three-axis transfer, a material suction group, a test mechanism, a belt conveyor and its peripheral components, and can ensure the stable connection between the chip and the test board during the test to ensure the test effect. Before the test, the chip is preliminarily restricted and positioned by a mechanical structure so that the position of the chip and the test board will not be offset when they are connected. There is no need to set up a visual inspection instrument, which also reduces the equipment manufacturing cost.

[0021] 2. The present invention sets a stopper and its peripheral components. The stopper can cooperate with the guide plate to constrain and limit the chip. At the same time, the position of the stopper can be adjusted, and the chips with unqualified thickness can be directly removed during transportation, avoiding the complicated work of subsequent sorting. In addition, multiple groups of stops can limit the chips one by one to complete the positioning and loading test operation of the chips during transportation.

[0022] 3. The present invention sets a calibration module, that is, when the chip is placed in the cavity, the first electric push rod pulls the fixing frame to trigger the calibration block therein to squeeze and limit the four sides of the chip, and cooperates with the pressure block to press the chip down, so that the chip can be stably connected and fixed with the test board, and further completes the positioning operation of the chip to ensure the best efficiency of chip testing.

[0023] 4. The present invention sets a temperature control module, which can adjust the temperature inside the open cavity according to needs during chip testing, simulating chip testing under high and low temperature conditions, and multiple groups of test boards can perform separate temperature interference through the temperature control module to perform temperature adjustment operations in a small range, thereby ensuring temperature diversification during temperature test simulation.

[0024] 5. The present invention can drive and trigger the calibration module and the temperature control module components through a single set of first electric push rods, thereby reducing the number of drive components and optimizing the cost of equipment manufacturing and the complexity of program writing.

[0025] 6. The present invention provides a support block and its peripheral components so that the gear rod can be in an elastic state on the side of the linkage frame, so that after the gear rod is separated from the first gear shaft and the second gear shaft, the subsequent meshing operation can be better performed. When the gear rod contacts the side surfaces of the first gear shaft and the second gear shaft, a certain avoidance will be produced to ensure stable meshing and docking. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1Schematic diagram of the overall structure of the present invention;

[0027] Figure 2 Schematic diagram of a partial structure of the present invention;

[0028] Figure 3 Schematic diagram of a partial structure of the belt conveyor of the present invention;

[0029] Figure 4 Schematic diagram of the structure of the test mechanism of the present invention;

[0030] Figure 5 Schematic diagram of a partial sectional structure of the mounting table of the present invention;

[0031] Figure 6 For the present invention Figure 4 Enlarged schematic diagram of part A;

[0032] Figure 7 Exploded schematic diagram of a part of the calibration module of the present invention;

[0033] Figure 8 Schematic diagram of a partial structure of the temperature control module of the present invention.

[0034] Wherein: 1, cabinet; 11, console; 12, display; 2, three-axis transfer; 21, material suction group; 3, belt conveyor; 31, storage box; 32, waste box; 33, guiding plate; 34, connecting block; 35, bolt group; 4, test mechanism; 41, mounting table; 42, cavity; 421, test plate; 43, connecting cavity; 431, pressing block; 432, restraining rod; 433, support cylinder; 44, fixing frame; 441, stop block; 45, first electric push rod; 5, calibration module; 51, movable cavity; 52, inner cavity; 53, first toothed shaft; 54, synchronous plate; 541, guiding groove; 55, sliding cavity; 551, calibration block; 552, guiding block; 56, linkage frame; 57, toothed rod; 571, support block; 6, temperature control module; 61, mating cavity; 62, first air guide cavity; 63, second air guide cavity; 64, connecting pipe; 65, mating block; 66, communication groove; 67, second toothed shaft. Detailed implementation manners

[0035] In order to make the technical means, creative features, achieved purposes and effects of the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments. However, the following embodiments are only the preferred embodiments of the present invention, not all of them. Based on the embodiments in the implementation manners, other embodiments obtained by those skilled in the art without creative efforts all belong to the protection scope of the present invention. The experimental methods in the following embodiments are all conventional methods unless otherwise specified, and the materials, reagents, etc. used in the following embodiments can all be obtained from commercial channels unless otherwise specified.

[0036] Embodiment: As Figure 1 shown, a pipeline-type chip testing device includes a cabinet 1. The cabinet 1 is a rectangular cabinet with a control integrated circuit board, a detection module, a power supply module, etc. arranged inside. At a corner position on the upper side of the cabinet 1, a console 11 is provided. The console 11 is integrated with a touch screen, a control board, and a refrigeration and heating blower module, and can be powered by the internal power supply module of the cabinet 1 to perform program selection control and subsequent temperature control operations. At another corner position on the upper side of the cabinet 1, a display 12 is provided, which can be used to display the test working status information. On the upper side of the cabinet 1, two groups of belt conveyors 3 are arranged at equal intervals and staggered. A screening machine is arranged on the side of one group of belt conveyors 3, which is used to convey the chips one by one to the side of the belt conveyor 3 for pipeline testing operations. The other group of belt conveyors 3 is used to convey and collect the tested chips. A testing mechanism 4 capable of performing stable testing is arranged between the two groups of belt conveyors 3. A three-axis transfer device 2 is arranged on the side of the belt conveyor 3 for conveying and testing. A chip suction group 21 is arranged on the side of the three-axis transfer device 2, and the chip suction group 21 is connected to an air pump through a pipeline to suck and release the chips. The three-axis transfer device 2 can drive the chip suction group 21 to perform three-axis transfer device 2 adaptation to pick up and place the chips;

[0037] As Figure 2 and Figure 3 shown, a storage box 31 and a waste box 32 are respectively arranged on the upper side of the cabinet 1. The storage box 31 is arranged on the side of the belt conveyor 3 after conveying and testing, and the waste box 32 is arranged on the side of the belt conveyor 3 before conveying and testing and the testing mechanism 4. The storage box 31 is a rectangular box, and the waste box 32 is an "L"-shaped box. Guide plates 33 are arranged on the upper side of the belt conveyor 3 before conveying and testing in a mirror image manner. The guide plates 33 are folding rods, and the two groups of guide plates 33 can form a funnel-shaped channel to constrain the chips to the middle position on the upper side of the belt conveyor 3. A connecting block 34 is fixedly installed on the side of the guide plate 33. The connecting block 34 is a square frame-shaped block. A bolt group 35 is movably arranged inside the connecting block 34, and the bolt group 35 is fixedly installed on the side of the belt conveyor 3 bracket. The bolt group 35 is composed of a cross-shaped cylindrical rod and a nut. Tightening the nut can fix the connecting block 34, and conversely, loosening the nut can adjust the position of the guide plate 33;

[0038] Through the cooperation of the set testing mechanism 4 and other components, the chips can be tested automatically in a pipeline;

[0039] As Figures 4 to 8As shown, the test mechanism 4 includes a mounting platform 41 arranged at a staggered position between two groups of belt conveyors 3, and a cylindrical support is arranged on the lower side of the mounting platform 41 and fixed on the upper side of the cabinet 1. The mounting platform 41 is a rectangular platform, and an opening 42 is opened in the middle position of the upper side of the mounting platform 41, and the opening 42 is a rectangular cavity. A test board 421 is fixedly installed on the bottom wall of the opening 42, and the test board 421 is connected to the detection module inside the cabinet 1 through wires. A connecting cavity 43 that passes through the mounting platform 41 is opened on the side wall of the opening 42 near the position of the three-axis transfer 2, and the connecting cavity 43 is a rectangular cavity. A pressure block 431 is movably installed inside the connecting cavity 43, and the pressure block 431 is a trapezoidal block made of rubber. A fixing frame 44 is provided, and the fixing frame 44 is an "L"-shaped frame. A stopper 441 is provided on the side of the fixing frame 44 away from the mounting platform 41, and the stopper 441 is arranged on the upper side of the guide plate 33. The stopper 441 is fixed to the side of the fixing frame 44 by bolt extrusion. The stopper 441 is a concave "L" block with rectangular grooves symmetrically opened on the side. A restraining rod 432 is fixedly installed on the side of the pressing block 431 close to the fixing frame 44, and the restraining rod 432 penetrates the fixing frame 44. The restraining rod 432 is a cylindrical rod. A supporting tube 433 is fixedly connected between the pressing block 431 and the side of the fixing frame 44, and the supporting tube 433 is movably sleeved on the side of the restraining rod 432. The supporting tube 433 is a spring steel cylinder with a continuous "W"-shaped cross section. A first electric push rod 45 is fixedly installed on the lower side of the mounting table 41 through a connecting piece, and the output end of the first electric push rod 45 is fixedly installed on the side of the fixing frame 44. A calibration module 5 that can assist in chip positioning is arranged at the bottom wall position of the opening 42 inside the mounting table 41, and a temperature control module 6 that can adjust and stabilize the detection chip is arranged at the side wall position of the opening 42 inside the mounting table 41. Specifically, the position of the side of the fixing frame 44 can be adjusted by the set stopper 441. By default, the stopper 441 is arranged on the upper side of the guide plate 33 to block the chip with the minimum thickness requirement, and cooperates with the guide plate 33 to preliminarily position the chip. The chip that does not meet the thickness requirement falls directly into the waste box 32 and is driven by the three-axis transfer 2. The suction group 21 sucks the chip and places it inside the cavity 42. The first electric push rod 45 pulls the fixing frame 44 toward the mounting platform 41. At this time, the pressing block 431 slides into the cavity 42 to constrain the chip and press it down. The subsequent components are triggered to constrain the four sides of the chip, so that the chip and the test board 421 are perfectly connected. The support cylinder 433 provides elastic support for the pressing block 431. The operation steps are as follows: the farthest stopper 441 extends to the upper side of the guide plate 33. After the chip is loaded, the stopper 441 moves forward one grid and then moves to the upper side of the guide plate 33. The chip is loaded step by step, and the step-by-step limit loading test operation can be completed. In addition, a sensor can be added to the side of the belt conveyor 3 or the side of the stopper 441 to determine whether the chip is in place.

[0040] The set calibration module 5 can further perform a positioning operation on the chip before chip testing. With the cooperation of the pressing block 431, accurate clamping and detection of the chip can be ensured;

[0041] As Figures 4 to 8 shown, the calibration module 5 includes a movable cavity 51 penetrating through the side of the mounting table 41, and the movable cavity 51 is arranged below the test board 421. The movable cavity 51 is a rectangular cavity. An inner cavity 52 is opened on the top wall of the movable cavity 51, and the inner cavity 52 is arranged below the test board 421. The inner cavity 52 is a circular cavity with a convex cross-section. A first gear shaft 53 is movably installed inside the movable cavity 51, and the first gear shaft 53 extends into the inner cavity 52. The first gear shaft 53 is a cylindrical shaft with teeth on the side. A synchronous plate 54 is movably installed inside the inner cavity 52, and the synchronous plate 54 is fixedly installed at the upper side position of the first gear shaft 53. The synchronous plate 54 is a circular plate. Four groups of guiding grooves 541 are equidistantly arranged in a circumferential array on the side of the synchronous plate 54. The guiding grooves 541 are arc-shaped grooves. Slide cavities 55 are equidistantly opened on the top wall of the inner cavity 52, and the slide cavities 55 penetrate through the mounting table 41 to the inside of the cavity 42. The slide cavities 55 correspond to the four side wall surfaces of the cavity 42. A calibration block 551 is movably installed inside the slide cavity 55, and the calibration block 551 is arranged above the guiding groove 541. The calibration block 551 is an "L"-shaped block made of elastic rubber. A guiding block 552 is fixedly installed on the lower side of the calibration block 551, and the guiding block 552 is movably installed inside the guiding groove 541. The guiding block 552 is a cylindrical block; specifically, the first gear shaft 53 can drive the synchronous plate 54 to rotate when triggered. The rotation of the synchronous plate 54 causes the suction group 21 of the calibration module 5 to slide inside the guiding groove 541, and the synchronous calibration block 551 is constrained to slide inside the slide cavity 55 to the inside of the cavity 42, so that the calibration block 551 plays a role of limiting, extruding, and constraining the four sides of the chip inside the cavity 42, ensuring the accuracy of the chip's position inside the cavity 42. With the cooperation of the pressing block 431, the chip and the test board 421 are tightly clamped for testing operations;

[0042] A linkage frame 56 is movably installed inside the movable cavity 51, and the linkage frame 56 is fixedly installed at the side position of the fixed frame 44. The linkage frame 56 is a "U"-shaped frame. A rack 57 is movably arranged on the side of the linkage frame 56, and the rack 57 meshes with the first gear shaft 53. The rack 57 is a rectangular rod with teeth on one side. Support blocks 571 are symmetrically and fixedly installed on both sides of the rack 57, and the other ends of the support blocks 571 are fixedly installed inside the linkage frame 56. The support blocks 571 are "W"-shaped blocks made of elastic material; specifically, the set linkage frame 56 can make the fixed frame 44 move synchronously. After meshing the rack 57 with the first gear shaft 53 and completing the positioning of the chip, the pressing operation is performed synchronously. In addition, the set support blocks 571 can elastically support the rack 57, making the rack 57 and subsequent components better elastically meshed with the first gear shaft 53;

[0043] The temperature control module 6 can perform temperature adjustment operations on the chip during chip detection, and can perform different temperature adjustment controls inside each mounting table 41, with stronger adaptability;

[0044] Such as Figure 1 , Figure 2 and Figures 4 to 8 As shown, the temperature control module 6 includes a mating cavity 61 opened on the top wall of the movable cavity 51, and the mating cavity 61 corresponds to the side position of the test board 421. The mating cavity 61 is a cylindrical cavity with a cross-shaped cross-section. A first air guide cavity 62 is opened on the inner wall of the mating cavity 61 away from the three-axis transfer 2. The first air guide cavity 62 is a rectangular groove. A second air guide cavity 63 is mirror-image opened on the inner wall of the mating cavity 61, and the second air guide cavity 63 penetrates through the mounting table 41 to the inside of the opening cavity 42. The second air guide cavity 63 is an "L"-shaped groove. A connecting pipe 64 is fixedly installed on the side of the control console 11, and the connecting pipe 64 respectively penetrates through the mounting table 41 to the inside of the first air guide cavity 62. The connecting pipe 64 is a circular pipe with multiple branches, connecting the air outlet of the refrigeration and heating fan module inside the control console 11 to the inside of the first air guide cavity 62. A mating block 65 is movably installed inside the mating cavity 61. The mating block 65 is a convex-shaped cylindrical block. A communication groove 66 penetrating through it is opened on the side of the mating block 65 corresponding to the positions of the first air guide cavity 62 and the second air guide cavity 63. The communication groove 66 is a "T"-shaped groove. A second tooth shaft 67 is fixedly installed on the lower side of the mating block 65, and the second tooth shaft 67 extends out of the mating cavity 61 to the inside of the movable cavity 51. The second tooth shaft 67 is a cylindrical shaft with a toothed side; specifically, as the first electric push rod 45 pulls the fixing frame 44, the linkage frame 56 can continue to drive the toothed rod 57 to slide inside the movable cavity 51. After the chip is clamped with the test board 421, the toothed rod 57 disengages from the elastic engagement with the side of the first tooth shaft 53 and the second tooth shaft 67, and the toothed rod 57 can drive the second tooth shaft 67 to rotate. When the second tooth shaft 67 rotates to different positions, the air flow can be guided differently. In the first position, the first air guide cavity 62, two groups of second air guide cavities 63 and the communication groove 66 are in corresponding positions, so that the air flow can enter the inside of the opening cavity 42 for heating and cooling operations. In the second position, the first air guide cavity 62, one group of second air guide cavities 63 and the communication groove 66 are in corresponding positions, which can reduce the air flow entering the inside of the opening cavity 42. In the third position, the first air guide cavity 62 and two groups of second air guide cavities 63 are not in corresponding positions with the communication groove 66, so that the air flow cannot enter the inside of the opening cavity 42. In this way, the test temperature control of the chip can be satisfied, and appropriate adjustment operations can be performed according to the temperature inside the opening cavity 42 of different mounting tables 41.

[0045] Working principle:

[0046] Before testing: In the first step, check and adjust the positions of each component. For example, adjust the positions of the guiding plate 33 and the stopper 441 to be corresponding. Select a program through the control console 11 for pre-control simulation, and observe whether the operating state is normal;

[0047] In the second step, modify the program and replace components according to the problems observed in the pre-operation simulation, and then you can select the corresponding program to perform the pipeline test operation;

[0048] During the test: In the first step, the chip sorter transfers the chips one by one to the side of the first group of belt conveyors 3 for conveying. At this time, the outermost first electric push rod 45 pushes the fixing frame 44 to move the stopper 441 to the upper side of the guide plate 33. The stopper 441 at other positions remains in a pending state on the side of the guide plate 33. The chips are constrained to the central position above the first group of belt conveyors 3 through the guide plate 33. When reaching the position of the stopper 441, the chips with qualified thickness are blocked, and the primary positioning of the chips can be completed. The chips with unqualified thickness are not blocked and are directly conveyed to the inside of the waste box 32 through the side of the first group of belt conveyors 3 for collection. In this way, the chips with unqualified thickness can be preferentially removed, so that there is no need for subsequent picking;

[0049] In the second step, the three-axis transfer 2 drives the suction group 21 to move to suck and hold the chips and then place them at the internal position of the cavity 42. Subsequently, the outermost first electric push rod 45 pulls the fixing frame 44 to be clamped to the mounting table 41. At this time, the second group of fixing frames 44 push the stopper 441 to the upper side of the guide plate 33, and then the continuous feeding and limiting operation can be carried out one by one; when the first electric push rod 45 pulls the fixing frame 44, the linkage frame 56 slides inside the moving cavity 51, first driving the rack 57 to engage with the first gear shaft 53 to rotate the synchronous plate 54. The rotation of the synchronous plate 54 restricts the guide block 552 through the guide groove 541 to make the calibration block 551 slide inside the sliding cavity 55 to the inside of the cavity 42 to perform the clamping operation on the four sides of the chips therein. At the same time, the fixing frame 44 pushes the pressing block 431 to slide into the inside of the cavity 42 to press and fix the chips, so that the chips are accurately positioned and clamped with the test board 421 to ensure the stable test of the chips;

[0050] In the third step, during testing, according to requirements, the default state of the cooperation block 65 is the third position, and the first air guide cavity 62 and the second air guide cavity 63 are in a non-connected state. When a temperature adjustment simulation test is required, the first electric push rod 45 pulls the fixing frame 44 to make the linkage frame 56 slide inside the movable cavity 51. At this time, the toothed rod 57 disengages from the side of the first toothed shaft 53 and elastically engages with the second toothed shaft 67. At the same time, the pressing block 431 squeezes the wall of the opening cavity 42 to squeeze and cooperate with the support cylinder 433 for use. The toothed rod 57 meshes with the second toothed shaft 67 to drive it to drive the cooperation block 65 to rotate. The cooperation block 65 rotates to the first position, and the first air guide cavity 62 is connected to the two second air guide cavities 63. Through the refrigeration and heating fan module inside the control console 11, refrigeration and heating operations are carried out, and cold air or hot air flows into the opening cavity 42 to simulate the test state of the chip at high and low temperatures. When the cooperation block 65 rotates to the second position, the first air guide cavity 62 is connected to one of the second air guide cavities 63, and the adjustment simulation of different temperatures of the chip can be completed.

[0051] After the test, the first electric push rod 45 pushes the fixing frame 44 to reset. At this time, all components are reset. The three-axis transfer 2 drives the material suction group 21 to move to suck and separate the chip from the inside of the opening cavity 42. When the chip is qualified, the chip is placed on the side of the second group of belt conveyors 3 and conveyed to the inside of the storage box 31 for collection. When the chip is unqualified, the chip is moved to the side of the corresponding mounting table 41, and the chip is directly dropped into the waste box 32 for collection.

[0052] The above can select the test boards 421 of the corresponding number of mounting tables 41 for test use according to the chip test duration. After the first group of test boards 421 complete the test, the last group of test boards 421 is just about to perform the test operation. In this way, the stop block 441 can perfectly limit and position the chips one by one, and cooperate with the material suction group 21 for suction feeding and testing.

[0053] The embodiments of the present invention have been described in detail above in conjunction with the accompanying drawings. However, the present invention is not limited to this. Within the scope of knowledge possessed by those skilled in the art to which the present invention pertains, various changes can be made without departing from the purpose of the present invention.

Claims

1. A pipeline chip testing device, comprising a cabinet (1), a control console (11) and a display (12) being arranged at a corner of the upper side of the cabinet (1), two groups of belt conveyors (3) being arranged on the upper side of the cabinet (1), a screening machine being arranged on the side of one group of belt conveyors (3), a testing mechanism (4) being arranged between the two groups of belt conveyors (3), a three-axis transfer (2) being arranged on the side of the belt conveyor (3), and a material suction group (21) being arranged on the side of the three-axis transfer (2); Features: The testing mechanism (4) comprises a mounting platform (41), a cavity (42) is provided on a side of the mounting platform (41), a testing plate (421) is fixedly mounted on the bottom wall of the cavity (42), a pressing block (431) is arranged inside the mounting platform (41), a fixing frame (44) is arranged on a side of the pressing block (431), a stopper (441) is arranged on a side of the fixing frame (44), and a calibration module (5) and a temperature control module (6) are arranged inside the mounting platform (41); The calibration module (5) comprises a movable cavity (51), an inner cavity (52) and a sliding cavity (55); a first gear shaft (53) is movably mounted inside the movable cavity (51); a synchronizing plate (54) is movably mounted inside the inner cavity (52); and a calibration block (551) is movably mounted inside the sliding cavity (55); The movable cavity (51) is provided on a side of the mounting platform (41) and is arranged below the test plate (421); the inner cavity (52) is provided on a top wall of the movable cavity (51) and is arranged below the test plate (421); the first gear shaft (53) extends into the inner cavity (52); the synchronizing plate (54) is fixedly mounted on an upper side of the first gear shaft (53); and four groups of guide grooves (541) are provided on a side of the synchronizing plate (54) at equal intervals; The sliding cavity (55) is provided on the top wall of the inner cavity (52) and penetrates the mounting platform (41) to the inside of the opening cavity (42); the sliding cavity (55) corresponds to the position of the four side walls of the opening cavity (42); a guide block (552) is fixedly installed on the lower side of the calibration block (551) and the guide block (552) is movably installed inside the guide groove (541); The temperature control module (6) comprises a matching cavity (61), a first air guide cavity (62) and a second air guide cavity (63); a connecting pipe (64) is provided on the side of the first air guide cavity (62); a matching block (65) is movably installed inside the matching cavity (61); a connecting groove (66) is provided on the side of the matching block (65); and a second gear shaft (67) is provided on the lower side of the matching block (65); The matching cavity (61) is formed on the top wall of the active cavity (51), the first air guide cavity (62) is formed on the inner wall of the matching cavity (61), and the second air guide cavity (63) is formed on the inner wall of the matching cavity (61) and penetrates the mounting platform (41) to the inner position of the open cavity (42); The connecting pipe (64) is fixedly mounted on the side of the console (11) and passes through the mounting platform (41) to the inside of the first air guide cavity (62). The connecting groove (66) is provided on the side of the matching block (65) at positions corresponding to the first air guide cavity (62) and the second air guide cavity (63). The second gear shaft (67) is fixedly mounted on the lower side of the matching block (65) and extends from the matching cavity (61) to the inside of the movable cavity (51). A gear rod (57) is movably arranged inside the movable cavity (51). The gear rod (57) is meshed with the first gear shaft (53) and is used to drive the calibration block (551) to slide and perform limited extrusion and constraint on the four sides of the chip. The gear rod (57) is meshed with the second gear shaft (67) after being separated from the first gear shaft (53) and is used to drive the second gear shaft (67) to rotate to different positions to guide the airflow differently, so as to meet the test temperature control of the chip.

2. The pipeline chip testing device according to claim 1, characterized in that: A storage box (31) and a waste box (32) are respectively arranged on the upper side of the cabinet (1); a guide plate (33) is arranged on the upper side of the belt conveyor (3); a connecting block (34) is fixedly mounted on the side of the guide plate (33); a bolt group (35) is movably arranged inside the connecting block (34); and the bolt group (35) is fixedly mounted on the side of the belt conveyor (3) bracket.

3. The pipeline chip testing device according to claim 2, characterized in that: The mounting platform (41) is arranged between the two groups of belt conveyors (3), and a cylindrical support is arranged on the lower side of the mounting platform (41) and fixed on the upper side of the cabinet (1). The opening (42) is opened at the middle position of the upper side of the mounting platform (41), and a connecting cavity (43) is opened on the side wall of the opening (42). The pressing block (431) is movably installed inside the connecting cavity (43). The fixing frame (44) is arranged on the side of the mounting platform (41), and the stopper (441) is arranged on the upper side of the guide plate (33). The stopper (441) is fixed to the side of the fixing frame (44) by bolts.

4. The pipeline chip testing device according to claim 3, characterized in that: A restraining rod (432) is fixedly mounted on the side of the pressing block (431), a supporting tube (433) is fixedly connected between the pressing block (431) and the side of the fixing frame (44), and the supporting tube (433) is movably sleeved on the side of the restraining rod (432), and a first electric push rod (45) is fixedly mounted on the lower side of the mounting platform (41) via a connecting piece, and an output end of the first electric push rod (45) is fixedly mounted on the side of the fixing frame (44).

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