Test system and test method, computer equipment and storage medium

Abstract

The invention provides a test system, a test method, computer equipment and a storage medium, and the test system comprises a light source device which emits a test light beam and exposure light beams with different exposure doses; the sample adjusting device comprises a sample placing table, a lifting mechanism and a rotating mechanism; the sample placing table is connected with the lifting mechanism or the rotating mechanism; the lifting mechanism is used for driving a to-be-tested sample to lift so as to adjust an exposure position; the detection device is used for detecting transmission light passing through the sample to be detected; the control device is used for controlling the lifting mechanism to lift, so that different exposure areas of the to-be-tested sample correspond to exposure light beams with different exposure doses; the detection device is used for controlling the rotating mechanism to rotate so as to drive the to-be-detected sample to rotate, and the detection device is used for measuring energy change information of transmission light passing through different exposure areas of the to-be-detected sample along with the rotating angle in the sample rotating process. The transmission light of the to-be-tested sample can be tested without changing the angle of the light source device, and the testing efficiency and precision are improved.

Description

Technical Field

[0001] The present application relates to the technical field of material testing, and in particular to a testing system and testing method, computer equipment and storage medium. Background Art

[0002] Photopolymers, as light field recording media, have been used in many cutting-edge optical technologies. For example, in the application of volume holographic gratings, photopolymers can record high-resolution three-dimensional interference patterns and are widely used in the fields of optical storage and optical micromachining. At the same time, with the continuous development of display technology, the application of photopolymers in optical display has gradually matured, especially in the fields of volume holographic display, light modulation and adaptive display, showing great potential. Photopolymers can produce differences in refractive index by undergoing monomer polymerization reactions at different exposure doses, which makes them have important application value in recording and storing light field information. However, since monomer polymerization reactions are usually accompanied by a certain degree of material shrinkage, this shrinkage effect will cause the recorded information to be distorted, thereby affecting the accuracy and reliability of light field recording. Therefore, measuring and compensating for the shrinkage rate of photopolymers becomes an important step to ensure the accuracy of light field recording.

[0003] In order to accurately evaluate the shrinkage effect of photopolymers under different exposure conditions, it is usually necessary to characterize the optical properties of the material. In the related art, in order to measure the optical properties of photopolymers, it is usually necessary to frequently adjust the incident angle of the laser to obtain test data at different angles. This operation is not only complicated but also easy to introduce errors, resulting in inconsistency of measurement results and reduced accuracy. Summary of the invention

[0004] The present application provides a testing system and testing method, computer equipment and storage medium, which can realize the testing of the transmitted light of the sample to be tested without changing the angle of the light source device, thereby improving the efficiency and accuracy of the test.

[0005] To achieve the above object, the present application provides a testing system for testing the material shrinkage rate of a sample to be tested, the testing system comprising:

[0006] A light source device, the light source device emitting a test beam and an exposure beam with different exposure doses;

[0007] A sample adjustment device, the sample adjustment device comprising a sample placement table, a lifting mechanism and a rotating mechanism, the sample placement table is used to place the sample to be tested, the lifting shaft of the lifting mechanism and the rotating shaft of the rotating mechanism are coaxial, the sample placement table is connected to the lifting mechanism or the rotating mechanism, the lifting mechanism is used to drive the sample to be tested to lift and lower to adjust the exposure position, and the rotating mechanism is used to drive the sample to be tested to rotate;

[0008] A detection device, the detection device is used to detect the transmitted light passing through the sample to be tested;

[0009] A control device, the control device being in communication connection with the sample adjustment device, the light source device and the detection device;

[0010] Among them, the control device is used to control the lifting and lowering of the lifting mechanism so that different exposure areas of the sample to be tested correspond to exposure light beams with different exposure doses; the control device is used to control the rotation of the rotating mechanism to drive the sample to be tested to rotate, and the detection device is used to measure the energy change information of the transmitted light passing through different exposure areas of the sample to be tested with the rotation angle during the rotation of the sample.

[0011] In addition, to achieve the above-mentioned purpose, the present application also provides a testing method for testing the material shrinkage rate of a sample to be tested, which is applied to the testing system described in any one of the embodiments of the present application, and the testing method includes:

[0012] Controlling the lifting of the sample to be tested by the lifting mechanism so that a first exposure area of ​​the sample to be tested corresponds to a first exposure beam, and controlling the light source device to expose the first exposure area with the first exposure beam, wherein the first exposure beam has a first exposure dose;

[0013] The lifting mechanism is used to control the lifting of the sample to be tested so that the second exposure area of ​​the sample to be tested corresponds to the second exposure beam, and the light source device is controlled to expose the second exposure area with the second exposure beam, wherein the second exposure beam has a second exposure dose; and the first exposure dose is lower than the second exposure dose;

[0014] Controlling the light source device to emit the test light beam, and controlling the rotating mechanism to drive the sample to be tested to rotate;

[0015] During the rotation of the sample to be tested, the detection device is used to measure first energy change information corresponding to the change of the rotation angle of the first transmitted light from the first exposure area, and second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle;

[0016] The material shrinkage rate of the sample to be tested is determined according to the first energy change information and the second energy change information.

[0017] In addition, to achieve the above-mentioned purpose, the present application also provides a computer device, which includes a memory and a processor; wherein the memory is connected to the processor and is used to store programs, and the processor is used to implement the steps of any one of the test methods provided in the embodiments of the present application by running the programs stored in the memory.

[0018] In addition, to achieve the above-mentioned purpose, the present application also provides a computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, the processor implements the steps of any one of the test methods provided in the embodiments of the present application.

[0019] The test system and test method, computer equipment and storage medium disclosed in the embodiments of the present application achieve the following beneficial effects: by fixing the incident angle of the light source of the light source device, combined with the rotation control of the rotating mechanism and the lifting control of the lifting mechanism in the sample adjustment device, the transmitted light of different exposure areas of the sample to be tested can be measured without adjusting the incident angle of the light source of the light source device, reducing the adjustment time and operation complexity of the light source device, and greatly improving the test efficiency. In addition, the sample adjustment device adopts a coaxial design of the lifting mechanism and the rotating mechanism to ensure the accuracy of the position change of the sample to be tested during the rotation and lifting process. By controlling the rotation of the rotating mechanism to drive the rotation of the sample to be tested, the change requirements of the incident light angle of the sample to be tested during the test process can be met. Compared with changing the incident light angle of the light source device in the related art, this method can avoid the measurement deviation caused by the change of the incident light angle in the related art, ensure the high accuracy of the test data, and provide stable data support for the subsequent accurate calculation of the shrinkage rate. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0021] Figure 1 is a structural schematic diagram of a test system provided in an embodiment of the present application;

[0022] Figure 2 is a scenario schematic diagram of a test system provided in an embodiment of the present application;

[0023] Figure 3 is a schematic diagram of another scenario of a test system provided in an embodiment of the present application;

[0024] Figure 4 It is a flow chart of a testing method provided in an embodiment of the present application;

[0025] Figure 5 It is a schematic block diagram of a computer device provided in an embodiment of the present application.

[0026] Description of reference numerals:

[0027] 10. Light source device; 20. Sample adjustment area; 21. Sample placement table; 22. Lifting mechanism; 23. Rotating mechanism; 30. Detection device; 221. First exposure area; 222. Second exposure area; 11. Laser; 12. Beam splitter 12; 131. First shutter; 132. Second shutter; 141. First reflector; 142. Second reflector. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0029] The flowcharts shown in the accompanying drawings are only examples and do not necessarily include all the contents and operations / steps, nor do they have to be executed in the order described. For example, some operations / steps can also be decomposed, combined or partially merged, so the actual execution order may change according to actual conditions. In addition, although the functional modules are divided in the device schematic, in some cases, the module division can be different from that in the device schematic.

[0030] The term "and / or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0031] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0032] See also Figures 1 to 3 , Figure 1 is a structural schematic diagram of a test system provided in an embodiment of the present application; Figure 2 is a scenario schematic diagram of a test system provided in an embodiment of the present application; Figure 3 Schematic diagram of another test system provided in the embodiment of the present application. Figure 1As shown, the test system provided by the present application is used to test the material shrinkage rate of the sample to be tested, and the test system includes a light source device 10, a sample adjustment device 20, a detection device 30 and a control device (not shown). The control device is respectively connected to the light source device 10, the sample adjustment device 20, and the detection device 30 for communication.

[0033] Among them, the sample to be tested may include photopolymers, which are a type of light-sensitive polymer material that can change its physical or chemical properties through chemical reactions under the irradiation of light of a specific wavelength (such as ultraviolet light, visible light), and is widely used in the fields of photolithography, 3D printing, optical storage, etc. The main components of photopolymers include monomers, photoinitiators, and additives. Among them, monomers are used to provide polymerizable groups (such as acrylates, epoxy resins); photoinitiators (such as ketones and styrene compounds) are used to absorb light energy and initiate polymerization reactions; additives include stabilizers and plasticizers, etc., which are used to extend the shelf life of the material and improve the flexibility of the material. Therefore, the present application can determine the material shrinkage rate of the sample to be tested by testing the sample to be tested at different exposure doses.

[0034] The light source device 10 emits a test beam and an exposure beam with different exposure doses. The exposure beam is used to expose the sample to be tested according to different exposure doses, and the test beam is used to calibrate and inspect the optical properties of the sample to be tested after exposure, so as to be used for subsequent testing of the material shrinkage rate of the sample to be tested. In addition, the energy of the test beam can be less than the energy of the exposure beam, thereby avoiding affecting or changing the state of the sample to be tested after exposure.

[0035] The sample adjustment device 20 includes a sample placement table 21, a lifting mechanism 22 and a rotating mechanism 23. The sample placement table 20 is used to place the sample to be tested. The lifting axis of the lifting mechanism 22 and the rotating axis of the rotating mechanism 23 are coaxial, that is, the lifting mechanism 22 and the rotating mechanism 23 run along the same axis. The sample placement table 21 is connected to the lifting mechanism 22 or the rotating mechanism 23. The lifting mechanism 22 is used to drive the sample to be tested to lift and lower to adjust the exposure position. The rotating mechanism 23 is used to drive the sample to be tested to rotate, thereby enabling the sample to be tested to accurately adjust the exposure position and the rotation angle of the sample to be tested.

[0036] For example, the intersection of the exposure beams is also located on a coaxially arranged lifting axis or rotating axis, thereby ensuring that when the lifting mechanism 22 moves up and down, there is no angle change in the surface of the sample to be tested relative to the exposure beam, and when the rotating mechanism 23 rotates, the intersection of the laser beams is always irradiated on the corresponding exposure position, thereby improving the accuracy of the sample to be tested during the exposure and measurement processes.

[0037] For example, the sample to be tested may also be placed on the lifting mechanism 22 by means of a sample clamping fixture (not shown), thereby ensuring the stability of the sample to be tested, which is not limited in the present application.

[0038] The detection device 30 is used to detect the transmitted light passing through the sample to be tested. The detection device 30 includes a detector, which is used to receive the transmitted light passing through the sample to be tested and convert it into a quantifiable signal. For example, the detector includes a photodiode, a photomultiplier tube, an optical fiber detector, etc., which is not limited in this application.

[0039] It should be noted that the transmitted light is the light that passes through the sample to be tested. When the test light beam emitted by the light source device 10 passes through the sample to be tested, part of the light will be absorbed, scattered, and diffracted by the sample, and the remaining part will continue to penetrate the sample to be tested and become the transmitted light. Since the characteristics of the transmitted light, such as the intensity, wavelength distribution, and phase change, provide information on the optical properties of the sample to be tested, the optical parameters such as the transmittance, absorption characteristics, and refraction characteristics of the sample to be tested can be obtained by measuring the transmitted light.

[0040] like Figure 2 and Figure 3 As shown, the control device is used to control the lifting and lowering of the lifting mechanism 22, so that different exposure areas of the sample to be tested correspond to exposure light beams with different exposure doses, wherein the first exposure area 221 corresponds to the first exposure dose; the second exposure area 222 corresponds to the second exposure dose, and the first exposure dose is lower than the second exposure dose; the control device is used to control the rotation of the rotating mechanism 23 to drive the sample to be tested to rotate, thereby the sample to be tested will experience different illumination angles during the rotation process, and then be exposed to different illumination conditions; the detection device 30 can be further used to measure the energy change information of the transmitted light passing through different exposure areas of the sample to be tested as the rotation angle changes during the rotation of the sample to be tested.

[0041] The test system disclosed in the embodiment of the present application achieves the following beneficial effects: by fixing the incident angle of the light source of the light source device 10, combined with the rotation control of the rotating mechanism 23 and the lifting control of the lifting mechanism 22 in the sample adjustment device 20, the measurement of the transmitted light of different exposure areas of the sample to be tested can be achieved without adjusting the incident angle of the light source of the light source device 10, reducing the adjustment time and operation complexity of the light source device 10, and greatly improving the test efficiency. In addition, the sample adjustment device 20 adopts a coaxial design of the lifting mechanism 22 and the rotating mechanism 23 to ensure the accuracy of the position change of the sample to be tested during the rotation and lifting process. By controlling the rotation of the rotating mechanism 23 to drive the rotation of the sample to be tested, the change requirements of the incident light angle of the sample to be tested during the test process can be met. Compared with changing the incident light angle of the light source device 10 in the related art, this method can avoid the measurement deviation caused by the change of the incident light angle in the related art, ensure the high accuracy of the test data, and provide stable data support for the subsequent accurate calculation of the shrinkage rate.

[0042] Alternatively, if Figure 1 As shown, the light source device 10 includes a laser 11 , a beam splitter 12 , a first shutter 131 , a second shutter 132 , a first reflecting mirror 141 , and a second reflecting mirror 142 . Among them, the laser 11 is used to emit a test beam and an exposure beam; the beam splitter 12 is used to split the exposure beam into a first exposure beam and a second exposure beam, so as to provide independent exposure beams for different exposure areas, for example, to provide a first exposure beam for the first exposure area 221; and to provide a second exposure beam for the second exposure area 222; the first shutter 131 is used to adjust the exposure time of the first exposure beam; the second shutter 132 is used to adjust the exposure time of the second exposure beam, and by adjusting the opening time of the first shutter 131 or the opening time of the second shutter 132, the exposure time of the corresponding exposure beam can be controlled, thereby realizing the control of the exposure dose; the first exposure beam passes through the first shutter 131 and is incident on the first reflector 141, and the second exposure beam passes through the second shutter 132 and is incident on the second reflector 142, and the first reflector 141 and the second reflector 142 are used to irradiate the first exposure beam and the second exposure beam onto the sample to be tested, thereby effectively controlling the path of the exposure beam, thereby ensuring that different exposure areas of the sample to be tested can be accurately irradiated.

[0043] The light source device 10 realizes precise control of the exposure beam by integrating the laser 11, the beam splitter 12, the first shutter 131, the second shutter 132, the first reflector 141, and the second reflector 142. By adjusting the exposure time and the irradiation position of the exposure beam, it ensures that the sample to be measured is exposed according to the corresponding exposure dose in different exposure areas, making the measurement result more accurate and reliable.

[0044] Optionally, after the sample to be tested is exposed, any shutter can be controlled to close, for example, the first shutter 131 or the second shutter 132 can be controlled to close. This application takes the control of closing the second shutter 132 as an example for explanation. Controlling the second shutter 132 to close and controlling the first shutter 131 to open can avoid energy waste of the test beam and avoid the problem of optical interference or signal confusion caused by the test beam irradiating the sample to be tested or the detection device 30 from multiple optical paths at the same time.

[0045] Optionally, different exposure doses include different exposure times and / or exposure energies; different exposure doses are obtained by controlling the exposure time of the first shutter 131 and the second shutter 132, or by controlling the exposure energy of the exposure beam emitted by the laser 11.

[0046] It should be noted that the exposure dose refers to the total amount of light energy received by the sample to be tested per unit area. Among them, the exposure power is directly related to the energy output of the light source. When the light power remains unchanged, by controlling the exposure time of the first shutter 131 and the second shutter 132, the total energy received by the sample to be tested can be directly controlled, that is, the exposure dose can be controlled. In addition, when the exposure time is fixed, by changing the power of the light source (that is, the exposure energy of the exposure light beam emitted by the laser 11 per unit time), different exposure doses can also be obtained.

[0047] Optionally, the testing system further includes: a partition (not shown), which is used to separate different exposure areas of the sample to be tested.

[0048] For example, when exposing or testing different exposure areas of a sample to be tested, the partition can effectively block the mutual influence of light beams between the exposure areas, and prevent cross-interference caused by scattering and reflection of light beams on the surface or inside of the sample to be tested, thereby ensuring that each exposure area is only irradiated by a predetermined light beam, avoiding the accuracy of the test results due to optical interference.

[0049] For example, the partition member includes a partition plate (such as a metal plate, a black plastic plate), a shading material (such as a black shading cloth), and an anti-reflection layer, etc., which is not limited in the present application. This can effectively isolate different exposure areas and improve the accuracy and reliability of the test results.

[0050] See also Figure 4 , Figure 4 Schematic diagram of a test method provided in the embodiment of the present application. Figure 4 As shown, the present application further provides a testing method, which is used to test the material shrinkage rate of a sample to be tested, and is applied to the testing system described in any one of the embodiments of the present application, and includes steps S11 to S15.

[0051] Step S11: controlling the lifting of the sample to be tested by the lifting mechanism so that the first exposure area of ​​the sample to be tested corresponds to the first exposure beam, and controlling the light source device to expose the first exposure area with the first exposure beam, wherein the first exposure beam has a first exposure dose.

[0052] Step S12: controlling the lifting of the sample to be tested by the lifting mechanism so that the second exposure area of ​​the sample to be tested corresponds to the second exposure beam, and controlling the light source device to expose the second exposure area with the second exposure beam, the second exposure beam having a second exposure dose; the first exposure dose is lower than the second exposure dose.

[0053] For example, the movement of the sample to be tested can be controlled by the lifting mechanism, so that the first exposure area of ​​the sample to be tested is precisely aligned with the first exposure beam emitted by the light source device, and the second exposure area of ​​the sample to be tested is precisely aligned with the second exposure beam emitted by the light source device. At the same time, the light source device emits a beam with a first exposure dose, and the sample to be tested in the first exposure area is exposed with the first exposure beam, and the sample to be tested in the second exposure area is exposed with the second exposure beam, thereby realizing the sub-area exposure of the sample to be tested.

[0054] The first exposure dose is lower than the second exposure dose, so that the energy change information of the sample to be tested under different exposure doses can be compared to further determine the material shrinkage rate of the sample to be tested.

[0055] Step S13: Control the light source device to emit a test light beam, and control the rotating mechanism to drive the sample to be tested to rotate.

[0056] Step S14: During the rotation of the sample to be tested, a detection device is used to measure first energy change information corresponding to the change of the rotation angle of the first transmitted light from the first exposure area, and second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle.

[0057] For example, the test beam is emitted by the light source device to penetrate the sample to be tested and detect its optical properties. The energy of the test beam is lower than the exposure dose to avoid changing the properties of the sample to be tested. The rotating mechanism makes the sample to be tested rotate uniformly around its axis, and the optical response characteristics of the sample to be tested at different angles can be detected by rotation.

[0058] For example, when the test light beam penetrates the sample to be tested, a portion of the light is absorbed, scattered, and diffracted, and the remaining light passes through the sample to be tested in the form of transmitted light. The transmitted light in different exposure areas has different intensities and energy distributions to reflect the optical properties of the sample to be tested. Furthermore, the detection device can perform real-time detection of the first transmitted light (from the first exposure area) and record its first energy change information as the rotation angle changes, and perform real-time detection of the second transmitted light (from the second exposure area) and record its second energy change information as the rotation angle changes.

[0059] Step S15: determining the material shrinkage rate of the sample to be tested according to the first energy change information and the second energy change information.

[0060] For example, the first energy change information is obtained from the energy change information of the transmitted light of the first exposure area with the rotation angle, reflecting the optical response of the sample to be tested at the first exposure dose, such as the initial transmittance and diffraction phenomenon. The second energy change information is obtained from the energy change data of the transmitted light of the second exposure area with the rotation angle, reflecting the optical response of the sample to be tested at the second exposure dose, such as the decrease in transmittance caused by photopolymerization or the enhancement of light scattering and diffraction efficiency.

[0061] Since the shrinkage rate will cause the refractive index, period and other parameters of the sample to be tested to change, thereby affecting the distribution characteristics of the transmitted light (such as diffraction pattern or transmittance), the change amplitude of the energy change information can indirectly quantify the shrinkage degree of the sample to be tested. Therefore, the material shrinkage rate of the sample to be tested can be determined based on the first energy change information and the second energy change information.

[0062] Optionally, determining the material shrinkage rate of the sample to be tested according to the first energy change information and the second energy change information includes: determining a first angular bandwidth peak value corresponding to the first transmitted light beam according to the first energy change information; and determining a second angular bandwidth peak value corresponding to the second transmitted light beam according to the second energy change information; and determining the material shrinkage rate of the sample to be tested according to the first angular bandwidth peak value and the second angular bandwidth peak value.

[0063] For example, by rotating the sample to be tested, the energy information of the transmitted light changing with the angle can be obtained. For each exposure area, the energy change information of the transmitted light at different rotation angles is measured by the detection device. The energy change information reflects the optical response of the sample under the irradiation of the test beam, including the intensity distribution of the transmitted light. When the test beam irradiates the sample to be tested, the sample to be tested will produce a diffraction effect. As the sample rotates, different diffraction angles will result in different energy distributions of the transmitted light.

[0064] The angular bandwidth peak of the transmitted light beam is used to characterize the maximum peak value within a specific range in which the intensity of the transmitted light changes with angle, that is, the energy concentration of the transmitted light within a specific angular range.

[0065] For example, by rotating the sample to be tested and measuring the intensity of the transmitted light at different rotation angles, data of the intensity of the transmitted light changing with the angle, i.e., the first energy change information and the second energy change information, can be obtained. By analyzing the first energy change information and the second energy change information, the maximum value of the light intensity of the corresponding transmitted light and its central angle can be determined, and the central angle is the angular bandwidth peak.

[0066] On the basis of the above embodiment, a first angular bandwidth peak value corresponding to the first transmitted light beam is determined according to the first energy change information; and a second angular bandwidth peak value corresponding to the second transmitted light beam is determined according to the second energy change information, including: determining a first angular distribution range corresponding to the first transmitted light beam according to the first energy change information, and determining a center angle corresponding to the maximum beam intensity in the first angular distribution range as the first angular bandwidth peak value; and determining a second angular distribution range corresponding to the second transmitted light beam according to the second energy change information, and determining a center angle corresponding to the maximum beam intensity in the second angular distribution range as the second angular bandwidth peak value.

[0067] The first angular distribution range is the angular distribution range of the intensity change of the first transmitted light beam; and the second angular distribution range is the angular distribution range of the intensity change of the second transmitted light beam.

[0068] For example, to determine the first angular bandwidth peak value corresponding to the first transmitted light beam based on the first energy change information, it is first necessary to analyze the energy change of the first transmitted light beam at different propagation angles to obtain the angular distribution range of the first transmitted light beam. By measuring the transmission intensity of the first transmitted light beam at different angles, the first angular distribution range in which the intensity of the first transmitted light beam changes significantly can be determined. Then, from the first angular distribution range, the angle corresponding to the maximum beam intensity can be determined, and this angle is the center angle of the beam, that is, the first angular bandwidth peak value. Therefore, the first angular bandwidth peak value refers to the center angle corresponding to the maximum beam intensity in the angular distribution. Similarly, the second angular bandwidth peak value corresponding to the second transmitted light beam can also be determined according to the above method. To avoid repetition, it will not be described here.

[0069] Based on the above embodiment, determining the material shrinkage rate of the sample to be tested according to the first angular bandwidth peak value and the second angular bandwidth peak value includes: obtaining the material shrinkage rate of the sample to be tested according to the following formula:

[0070]

[0071] in, is the material shrinkage rate of the sample to be tested, φ0 is the peak value of the first angular bandwidth, and φ1 is the peak value of the second angular bandwidth.

[0072] The test method disclosed in the embodiment of the present application can accurately control the reaction of the sample to be tested under different exposure doses, and obtain the information on the change of the energy of the transmitted light in each exposure area with the rotation angle. By combining the different exposure doses of the exposure light beam and the sample rotation process, it is ensured that the transmitted light of the sample to be tested is comprehensively analyzed at different rotation angles. By measuring the energy change of the transmitted light from different exposure areas, the shrinkage effect of the sample to be tested during the illumination process can be effectively evaluated, thereby deducing the shrinkage rate of the sample to be tested. This method not only improves the measurement accuracy, but also can obtain a comprehensive performance evaluation of the sample to be tested under a variety of exposure conditions, which has important practical significance for optimizing the application of photopolymer materials and recording and storing light field information.

[0073] Exemplarily, the above method and system may be implemented in the form of a computer program. The computer program may be implemented in the form of a computer program. Figure 5 Runs on the computer device shown.

[0074] See also Figure 5 , Figure 5 1 is a schematic diagram of a computer device provided in an embodiment of the present application. The computer device may be a server.

[0075] like Figure 5 As shown, the computer device 400 includes a processor 401, a memory 402, and a network interface connected via a system bus, wherein the memory 402 may include a volatile storage medium, a non-volatile storage medium, and an internal memory.

[0076] The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions, and when the program instructions are executed, the processor 401 can execute any test method.

[0077] The processor 401 is used to provide computing and control capabilities and support the operation of the entire computer device 400 .

[0078] The internal memory provides an environment for the operation of the computer program in the non-volatile storage medium. When the computer program is executed by the processor, the processor can execute any test method.

[0079] The network interface is used for network communication, such as sending assigned tasks, etc. Those skilled in the art can understand that the structure of the computer device is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device 400 to which the solution of the present application is applied. The specific computer device 400 may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0080] It should be understood that the processor 401 may be a central processing unit (CPU), and the processor 401 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0081] Wherein, in some embodiments, the processor 401 is used to run a computer program stored in the memory to implement the following steps: controlling the lifting of the sample to be tested by the lifting mechanism so that the first exposure area of ​​the sample to be tested corresponds to the first exposure beam, and controlling the light source device to expose the first exposure area with the first exposure beam, and the first exposure beam has a first exposure dose; controlling the lifting of the sample to be tested by the lifting mechanism so that the second exposure area of ​​the sample to be tested corresponds to the second exposure beam, and controlling the light source device to expose the second exposure area with the second exposure beam, and the second exposure beam has a second exposure dose; the first exposure dose is lower than the second exposure dose; controlling the light source device to emit the test beam, and controlling the rotating mechanism to drive the sample to be tested to rotate; during the rotation of the sample to be tested, the detection device is used to measure the first energy change information corresponding to the change of the first transmitted light from the first exposure area with the rotation angle, and the second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle; determining the material shrinkage rate of the sample to be tested according to the first energy change information and the second energy change information.

[0082] In some embodiments, the processor 401 is also used to determine a first angular bandwidth peak value corresponding to the first transmitted light beam based on the first energy change information; and determine a second angular bandwidth peak value corresponding to the second transmitted light beam based on the second energy change information; and determine the material shrinkage rate of the sample to be tested based on the first angular bandwidth peak value and the second angular bandwidth peak value.

[0083] In some embodiments, the processor 401 is also used to determine a first angular distribution range corresponding to the first transmitted light beam based on the first energy change information, and determine the central angle corresponding to the maximum beam intensity in the first angular distribution range as the first angular bandwidth peak; and determine a second angular distribution range corresponding to the second transmitted light beam based on the second energy change information, and determine the central angle corresponding to the maximum beam intensity in the second angular distribution range as the second angular bandwidth peak.

[0084] In some embodiments, the processor 401 is further configured to obtain the material shrinkage rate of the sample to be tested according to the following formula:

[0085]

[0086] in, is the material shrinkage rate of the sample to be tested, φ0 is the peak value of the first angular bandwidth, and φ1 is the peak value of the second angular bandwidth.

[0087] An embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. The computer program includes program instructions, and when the program instructions are executed, any one of the test methods provided in the embodiments of the present application is implemented.

[0088] The computer-readable storage medium may be an internal storage unit of the computer device described in the foregoing embodiment, such as a hard disk or memory of the computer device. The computer-readable storage medium may also be an external storage device of the computer device, such as a plug-in hard disk, a smart memory card (SmartMedia Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc., equipped on the computer device.

[0089] Furthermore, the computer-readable storage medium may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function, and the like.

[0090] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A testing system, characterized in that: Used to test the material shrinkage rate of the sample to be tested, the testing system comprises: A light source device, the light source device emitting a test beam and an exposure beam with different exposure doses; A sample adjustment device, the sample adjustment device comprising a sample placement table, a lifting mechanism and a rotating mechanism, the sample placement table is used to place the sample to be tested, the lifting shaft of the lifting mechanism and the rotating shaft of the rotating mechanism are coaxial, the sample placement table is connected to the lifting mechanism or the rotating mechanism, the lifting mechanism is used to drive the sample to be tested to lift and lower to adjust the exposure position, and the rotating mechanism is used to drive the sample to be tested to rotate; A detection device, the detection device is used to detect the transmitted light passing through the sample to be tested; A control device, the control device being in communication connection with the sample adjustment device, the light source device and the detection device; Among them, the control device is used to control the lifting and lowering of the lifting mechanism so that different exposure areas of the sample to be tested correspond to exposure light beams with different exposure doses; the control device is used to control the rotation of the rotating mechanism to drive the sample to be tested to rotate, and the detection device is used to measure the energy change information of the transmitted light passing through different exposure areas of the sample to be tested with the rotation angle during the rotation of the sample.

2. The test system according to claim 1, characterized in that: The light source device comprises: A laser, used for emitting the test beam and the exposure beam; A beam splitter, the beam splitter is used to split the exposure beam into a first exposure beam and a second exposure beam; a first shutter and a second shutter, wherein the first shutter is used to adjust the exposure time of the first exposure light beam; and the second shutter is used to adjust the exposure time of the second exposure light beam; A first reflecting mirror and a second reflecting mirror, the first exposure beam passes through the first shutter and is incident on the first reflecting mirror, the second exposure beam passes through the second shutter and is incident on the second reflecting mirror, the first reflecting mirror and the second reflecting mirror are used to irradiate the first exposure beam and the second exposure beam onto the sample to be tested.

3. The test system according to claim 2, characterized in that: The different exposure doses include different exposure times and / or exposure energies; different exposure doses are obtained by controlling the exposure time of the first shutter and the second shutter, or by controlling the exposure energy of the exposure beam emitted by the laser.

4. The test system according to claim 1, characterized in that: The testing system further comprises: a partition member, which is used to separate different exposure areas of the sample to be tested.

5. A testing method, characterized in that: Used to test the material shrinkage rate of a sample to be tested, applied to the test system according to any one of claims 1 to 4, the test method comprising: Controlling the lifting of the sample to be tested by the lifting mechanism so that a first exposure area of ​​the sample to be tested corresponds to a first exposure beam, and controlling the light source device to expose the first exposure area with the first exposure beam, wherein the first exposure beam has a first exposure dose; The lifting mechanism is used to control the lifting of the sample to be tested so that the second exposure area of ​​the sample to be tested corresponds to the second exposure beam, and the light source device is controlled to expose the second exposure area with the second exposure beam, wherein the second exposure beam has a second exposure dose; and the first exposure dose is lower than the second exposure dose; Controlling the light source device to emit the test light beam, and controlling the rotating mechanism to drive the sample to be tested to rotate; During the rotation of the sample to be tested, the detection device is used to measure first energy change information corresponding to the change of the rotation angle of the first transmitted light from the first exposure area, and second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle; The material shrinkage rate of the sample to be tested is determined according to the first energy change information and the second energy change information.

6. The testing method according to claim 5, characterized in that: The determining the material shrinkage rate of the sample to be tested according to the first energy change information and the second energy change information includes: Determine a first angular bandwidth peak value corresponding to the first transmitted light beam according to the first energy change information; and determine a second angular bandwidth peak value corresponding to the second transmitted light beam according to the second energy change information; The material shrinkage rate of the sample to be tested is determined according to the first angular bandwidth peak value and the second angular bandwidth peak value.

7. The method according to claim 6, characterized in that The step of determining a first angular bandwidth peak value corresponding to the first transmitted light beam according to the first energy change information; and determining a second angular bandwidth peak value corresponding to the second transmitted light beam according to the second energy change information, comprises: Determine a first angular distribution range corresponding to the first transmitted light beam according to the first energy change information, and determine a central angle corresponding to a maximum light beam intensity in the first angular distribution range as a peak value of the first angular bandwidth; and A second angular distribution range corresponding to the second transmitted light beam is determined according to the second energy change information, and a central angle corresponding to the maximum light beam intensity in the second angular distribution range is determined as the second angular bandwidth peak value.

8. The testing method according to claim 6, characterized in that: The method of determining the material shrinkage rate of the sample to be tested according to the first angular bandwidth peak value and the second angular bandwidth peak value comprises: The material shrinkage rate of the sample to be tested is obtained according to the following formula: in, is the material shrinkage rate of the sample to be tested, φ0 is the peak value of the first angular bandwidth, and φ1 is the peak value of the second angular bandwidth.

9. A computer device, characterized in that: include: A memory and a processor; wherein the memory is connected to the processor and is used to store a program; the processor is used to implement the steps of the test method as described in any one of claims 5 to 8 by running the program stored in the memory.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the processor implements the steps of the testing method as claimed in any one of claims 5 to 8.

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