125 results about "Sample rotation" patented technology

Generally, and in one form of the present invention, is a polarization-maintaining fiber-based polarization sensitive optical low coherence reflectometer for depth resolved birefringence measurement. With the present invention, linear birefringence of a sample may be measured from data recorded in a single A-Scan. In addition, the present invention provides for the simultaneous measurement of retardation and orientation of birefringent axes, wherein measured retardation is insensitive to sample rotation in the plane perpendicular to ranging.

The related liquid surface and interface dynamic behavior test and analysis device based on high-speed image process comprises: with a general platform, arranging an optical system, a video imaging system, a control system for locating and feeding, a rotating platform, a LED monochromatic cold light source, and a computer-control light modulation system. This invention has well effect and reliability.

A metrology system that uses an imaging system to monitor alignment features on the sample or sample holder of an X-ray laminography or tomography system. the metrology system has the capability to provide both sample shift and sample rotation movement data to a data acquisition system. These shift and rotation data can be used in alignment routines to produce 3D reconstructions from the X-ray images/projections. The metrology system is based on an imaging and focusing measurement of intrinsic feature of the sample or artificial features fabricated on the sample or sample holder.

The invention relates to a multifunctional high-efficiency laser damage test device and method in a vacuum environment. Five samples can be placed on a sample stage in a vacuum chamber at one time; the samples can be sequentially rotated to the laser irradiation position for testing laser damage by rotating the sample stage; online monitoring and judgment of damage conditions can be realized by using an online imaging and scattered light detection device of a CCD (Charge Coupled Device) camera and a pressure detection element; and the samples can also be rotated to an observation window and then the damage morphology of the samples is observed in an off-line manner and analyzed. Meanwhile, the function that front sides and back sides of the samples are respectively irradiated by laser can be achieved by using the rotation of the sample stage. The device is simple and easy to operate; according to the device, the data test time in the vacuum environment is greatly saved and the efficiency of damage test is increased; and meanwhile, test method and functions are diversified and comprehensive damage information can be obtained.

In an ion milling system and an ion milling method for making unnecessary the effort of resetting a sample in a sample stage mechanism whenever a machining region is changed, the system includes an ion gun that generates an ion beam with which a sample is to be irradiated, a sample chamber within which the sample to be subjected to irradiation processing by the ion beam is put, an exhaust that evacuates air in order to maintain vacuum in the sample chamber, a gas injection mechanism that injects ion-generating gas, and a sample stage mechanism in which the sample is placed and which rotates with the sample set thereon. The sample stage mechanism has a rotary table that rotates with the sample set thereon, a rotating mechanism that drives the rotary table, an eccentric mechanism capable of eccentrically adjusting a positional relationship between a rotation center axis of the rotary table and a centerline of the ion beam, and a sample position adjusting mechanism capable of eccentrically adjusting a positional relationship between a centerline of the sample set on the sample stage and the rotation center axis of the rotary table.

The invention discloses a multifunctional X-ray orientation device and a method, and belongs to the field of single crystal material processing. The multifunctional X-ray orientation device comprises a working table, a radiation-proof protection cover, an X-ray generating system, a diffracted-ray receiving system, a crystal sample rotating table and a computer control system. A sample containing table in the crystal sample rotating table can be replaced through detachable bolts. The method includes the steps that the multifunctional X-ray orientation device is used to carry out crystal defect identification, different crystal characteristic measurement, manual orientation measurement and angle error obtaining. The multifunctional X-ray orientation device is integrated with an X-ray orientation device measurement system for a plurality of single crystals, the device cost is reduced, and the product homogeneity is guaranteed; detection data of all single crystal materials is fused and finished, the defect types of the single crystal materials are obtained in an intelligent mode, and the utilization efficiency of existing data is improved; a scintillation detector is used as an X-ray detector, the stability degree is high, the anti-interference capability is high, and the defects of a Geiger pipe are recovered.

A focused ion beam system capable of acquiring surface structure information, internal structure information, and internal composition information about a sample simultaneously from the same field of view of the sample. A method of sample preparation and observation employs such focused ion beam system to accurately set a sample processing position based on information about the structure and composition of the sample acquired from multiple directions of the sample, and to process and observe the sample. The system includes, in order to acquire the sample structure and composition information simultaneously, a secondary electron detector, a transmission electron detector, and an energy dispersive X-ray spectroscope or an electron energy loss spectroscope, and employs a stub having the sample rotating and tilting function. The method includes a marking process.

The invention discloses an optical three-dimensional correlation identification device based on an integrated imaging system and an identification method. The device comprises a three-dimensional information acquisition device and a correlation identification system, wherein the three-dimensional information acquisition device comprises a sample rotation device, an optical microscope, a diffuse transmission element, a micro lens array, an imaging lens and a computer, the correlation identification system comprises a laser device, a first reflective mirror, a second reflective mirror, a reverse telescope system, a spatial light modulator, a first Fourier light transmission mirror, a third reflective mirror, a diaphragm, a light refractive crystal, a second Fourier light transmission mirror, a second CCD sensor and a spatial light modulator. The device has advantages of good amplification capability, high imaging quality, comprehensive three-dimensional information and excellent identification effect.

A magazine-type sample rotation body (7) is arranged in a high frequency chamber (5) so that it rotates away from the horizontal, the body (7) accommodating, in fixed location, reactor blocks (10) that are sealed or sealable from fluids such that fluids contained in sample vessels in the reactor blocks can be mixed before, during and after high frequency exposure because of the rotational movement of the sample rotation body.

An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample, can measure optical properties of the periodic structure. An E-O modulator in the illumination path can modulate the polarization. The head optics collect light reflected from the periodic structure and feed that light to a spectrometer for measurement. A beamsplitter in the collection path can ensure both S and P polarization from the sample are separately measured. The measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.

A three-dimensional measuring apparatus for fabric pendency based on grating fringe comprises main driving system, elevation system, optics system and image collection system. The sample rotation step motor (5) controls the rotation of rotation platform (17), and elevation platform step motor (7) controls the up and down movement of elevation platform, and step motor (11) controls the up and down movement of ring reflection pyramidal face (14). The diffused light sent by point source (6) is converted into parallel light by ring paraboloid (8) and then forms light and shade even grating fringe with clear outline on the three dimensional surface of the fabric to be measured through ring reflecting pyramidal face (14) with 45 degree angle and two grating molds (9). The image collection (21) directly gets two-dimensional contour chart of the sample, which is processed by computer to get three-dimensional outline curved surface. And it can realize the whole dynamic and static measuring of the fabric and stepless speed regulating realizes the continuity of pendency dynamic and static measuring.

The present invention discloses an imaging system which comprises the following components: a sample carrying table which is placed with a sample to be imaged; a beam source part which radiates beam; a beam detecting collecting part which receives a beam image; a rotation control part which has two ends respectively fixedly connected with the beam source part and the beam detecting collecting part and drives the beam source part and beam collecting part to rotate; and a computer which transmits control instruction to the beam source part, the rotation control part and the detecting collecting part and receives the image received by the beam detecting collecting part for imaging processing. The invention also correspondingly provides an imaging method. According to the imaging method, an expected imaging requirement is input. The related parameters are calculated. A control instruction is transmitted. The beam source part and the beam detecting collecting part are fixed at two ends of the rotation control part. According to the control instruction, the beam source part radiates beam, the beam detecting collecting part collects the projection image of beam after transmitting the sample. The projection image is executed with imaging. The invention settles the problems of deformation and motion artifact caused by sample rotation.

The invention discloses an automatic online near infrared spectrum detecting device and a control method. The device comprises two parts, namely, an automatic sample feeding system and a near infrared spectrum acquisition system, wherein the automatic sample feeding system comprises an intermittent sample feeding mechanism and a sample rotating mechanism which is positioned above the intermittent sample feeding mechanism; the near infrared spectrum acquisition system comprises a diffuse reflection and diffuse transmission integrated acquisition light path and a light source adjustment and control mechanism thereof. The invention innovatively provides that two acquisition modes for diffuse reflection and diffuse transmission are integrated in one spectrum detecting device; multi-station automatic feeding is provided; the adjustability of the angle of a light source and the rotation of a sample to be detected are realized; the online detecting efficiency of a spectrograph is improved; comprehensive sample spectrum acquisition information can be obtained; great convenience is provided for scientific research and production.

The invention discloses an intersection recognition method based on a GoogLeNet neural network. The intersection recognition method comprises the following steps: S1, sampling: selecting road networkdata of main cities throughout the country as a sampling source of a complex intersection sample; S2, constructing a Delaunay triangulation network: carrying out the initial positioning of the complexintersection, and preliminarily determining the central position and spatial range of the complex intersection; S3, enhancing the sample size: enhancing the sample size through sample simplification,sample rotation and mirroring; according to the method, a research hotspot GoogLeNet neural network in the field of machine vision is introduced into complex intersection recognition, and rapid and high-quality positioning of the OSM data complex intersection is realized in a mode of combining vector data and raster images.

The invention relates to a urine sampling device which comprises a sampling funnel, locking devices, a sampling device and a conduction device. The upper end of the sampling funnel is funnel-shaped, the lower end of the sampling funnel is of a square hollow structure, the left side and the right side of the upper end of the sampling funnel are respectively provided with the locking device, the lower end of the sampling funnel is provided with the sampling device, and the conduction device is arranged at the left end of the middle of the sampling funnel; each locking device comprises a height bracket, a connecting cross column, a locking fastener, a telescopic sliding column, a sliding column spring and a locking clamping plate. The sampling device comprises a sampling rotation plate, a sampling rotation shaft, a tensioning mechanism, a containing frame, a containing telescopic rod, a telescopic spring and a sampling clamping sleeve. The problems of incapability of automatically collecting midstream urine, possibility of pollution of the midstream urine, incapability of automatically controlling the amount of urine taken, occurrence of urine spillage during urine taking and the likewhen a man inconvenient to move performs urine taking are solved.

The invention discloses a clamping strip type full-automatic sample loading detection immunity analyzer which can perform colloidal gold immunity quantitative analysis and fluorescence immunity quantitative analysis and comprises a case, a sample rotating disc, a clamping strip rotating disc, a rotation driving device, a sample loading component, a detection component and an output component. The sample rotating disc and the clamping strip rotating disc are arranged on the case in a manner of being capable of rotating around own axes, and the rotation driving device is used for driving the sample rotating disc and the clamping strip rotating disc to rotate. Automatic conveying of sample tubes and detection clamping strips is realized respectively through the sample rotating disc and the clamping strip rotating disc, samples are automatically fetched from the sample tubes to be detected and released onto the corresponding detection clamping strips through the sample loading component, the samples complete the chromatographic process on the detection clamping strips and then are detected automatically by the detection component, and detection results are output by the output component finally. The immunity analyzer realizes automatic sample loading and automatic detection, errors caused by artificial operation are avoided, and the objectives of single-sample detection and small-lot continuous detection can be achieved. The immunity analyzer is simple in structure, and space and cost are saved.

The invention discloses a micro-nano structure inscribing device based on sample rotation and laser double-beam interference. The micro-nano structure inscribing device comprises a He-Cd laser, a photoelectric shutter, a short-focus lens, a long-focus lens, a beam splitter, a planar reflector A, a planar reflector B, a photoresist sample and a sample rotation control system, wherein a laser beam emitted from the He-Cd laser is split into two laser beams with equal intensity after passing through the photoelectric shutter, the short-focus lens, the long-focus lens and the beam splitter, is reflected by the planar reflector A and the planar reflector B and then irradiates the photoresist sample for exposure. By rotation of the photoresist sample and multiple times of double-beam interference exposure as well as selection for the wavelenth of the laser, various micro-nano structures such as a one-dimensional grating, a two-dimensional lattice, a hexagon, concentric equal-interval rings and vertical-horizontal two-dimensional rectangular lattices with different periods can be prepared by inscription. The micro-nano structure inscribing device disclosed by the invention has the advantages of simple structure and low cost, and has wide application in the field of manufacture of the micro-nano structure.

The invention relates to a light integrating cavity device, such as an integrating sphere, for measuring diffuse reflectance of a sample. A light trap is movable within a light scattering cavity of the device for controlling specular reflections during measurements. The light trap may be rotatable around the sample under test inside the cavity so that specular reflections off the sample can be included or excluded from the measurement. The sample may also be placed at the outside against a measurement port, and a measurement instrument is moveable on a rotating arm within or outside of the cavity.

The invention relates to a computer imaging technique, especially an X-ray CT data collecting method and rebuilding method, wherein the invention uses diffraction strengthen waist imaging method to use two methods that sample rotation axle is vertical to crystal rotation axle and sample rotation axle is parallel to the crystal rotation axle, to combine and convert collected four groups of CT data, to make rebuild function meet rotation constant property, and use traditional CT method to rebuild the three-dimension distribution of three refractive indexes. And said method comprises that: S1, finding the conditions of X-ray diffraction strengthen waist image; S2, collecting four groups of CT data; S3, combining and converting CT groups, to meet rotation constant property; S43, using traditional CT method to rebuild the three-dimension distribution of refractive indexes in sample.

The invention provides a system for measuring cable structural dimension parameters based on a machine vision algorithm. The system adopts an illumination unit to illuminate a cable sample to be measured, and a position control unit to control the rotation and bounce of the sample; an optical imaging unit collects image information of a moving cable sample to be measured and transmits the image information to a data processing unit; and the data processing unit calculates structural dimension parameters of the sample according to the received image information. A subpixel edge extraction and fitting algorithm is used to calculate the diameter parameters of the cable contour, and the thickness parameter of the cable contour is calculated by using a matching algorithm, and the number of conductor cores of the cable is calculated by using a region filling method. The system and the method can accurately, quickly and comprehensively measure the structural dimension parameters of the cable,and the maximum thickness of the measured cable sample can reach 10cm, so that the measurement time of the size parameters of the cable structure is greatly reduced, the measurement efficiency of thesize parameters of the cable structure is improved, the measurement process is saved, and the labor intensity is reduced.