11 results about "Sample rotation" patented technology

The utility model discloses a kind of water-based paint weatherability detection's cycle exposure tester, including test box, the inside of test box is provided with light source system and spraying system;Further include: rotatable support, inside the box is installed, for driving sample rotation;Sample fixture assembly, rotation is installed in the top of rotatable support, sample fixture assembly is connected with rotatable support by angle adjusting mechanism, sample fixture assembly is configured to automatically change the included angle of sample and horizontal plane by angle adjusting mechanism;Collection analysis unit, it includes conductivity tester collection pool and conductivity sensor.The utility model provides a kind of water-based paint weatherability detection's cycle exposure tester, by setting angle adjusting mechanism, it can automatically drive sample to switch between "accumulation water test" and "aging test" two states, truly simulates the stress and aging environment of outdoor coating under different inclination, improves the authenticity of test data.

The utility model discloses a kind of silicon steel sheet detection devices, comprising: rack;Hoisting module, it is placed on the rack;Visual inspection module, it is installed on the hoisting module, for whether the notch of visual inspection silicon steel sheet sample exists defect, including visual inspection component and drive the first driving component of visual inspection component along silicon steel sheet radial movement;Sample positioning module, it is installed on the hoisting module, for positioning to silicon steel sheet sample and drive silicon steel sheet sample rotation, including driving wheel mechanism, with the driving wheel mechanism opposite setting driven wheel mechanism and drive the second driving component of driven wheel mechanism movement, the silicon steel sheet sample is clamped between driving wheel mechanism and driven wheel mechanism.The silicon steel sheet detection device provided by the utility model can reduce manual labor intensity and improve detection efficiency.

The application discloses a kind of laser additive manufacturing device and method based on in-situ characterization of synchrotron radiation, belong to additive manufacturing and synchrotron radiation characterization technical field.The device includes: laser processing system, synchrotron X-ray imaging system, multidimensional motion platform, powder supply system, environmental control system and synchronous control system;The multidimensional motion platform includes positioning mechanism and rotating mechanism, rotating mechanism is used to drive sample rotation around vertical axis, realizes the continuous adjustment of X ray observation angle.The application is by being provided with multidimensional motion platform with rotating mechanism, so it can be realized that X ray observation angle is continuously adjustable by driving sample rotation around vertical axis, to break through the limitation of fixed observation angle in prior art, so multiple direction molten pool projection images can be acquired, eliminate the observation blind area of single view, can comprehensively capture the three-dimensional topography and dynamic evolution process of molten pool.

The present application relates to sample carrying and detection auxiliary equipment technical field, disclose a kind of interference suppression rotating sample loading device for bottled sample.The device includes rack, rotating sample loading component, drive assembly and fixed component.The device can also be used with laser and detector arranged on the both sides of bottled sample, the incident beam emitted by laser can be obliquely arranged relative to the axis of bottled sample, to reduce the overlapping degree of different transmission beams in detection area;Vibrator can also be arranged at detector, to further improve the interference suppression effect.The present application rotates bottled sample, so that different circumferential regions enter detection path in turn, signal fluctuation caused by uneven bottle wall thickness, surface state difference and local curvature change is averaged, so as to reduce interference, improve stability, repeatability and accuracy in detection process.

The invention discloses a steel rail polishing simulation testing machine and a testing method, and the steel rail polishing simulation testing machine comprises a rack, a millstone module, a feeding module, an operation module and a control module. The millstone module is rotationally connected to the rack and used for polishing the simulated steel rail sample. The feeding module comprises a first driving device and a guiding device and is used for driving the sample to move. The operation module comprises a clamping device and a second driving device and is used for driving the sample to rotate. The control module is in communication connection with all the modules and used for controlling the grinding rotating speed, the feeding speed and the rotating speed. A small-scale simulation steel rail sample is adopted to replace a full-scale steel rail section, the test cost is reduced, and accurate reproduction of polishing parameters is achieved through the control module. The same polished sample can be detached and transferred for a service performance test, the correlation between polishing process parameters and the long-term service performance of the steel rail is established, and the research blank of the wheel-rail friction wear simulation service test in the steel rail polishing direction is filled.

This invention relates to the field of wear-resistant coating technology, and discloses a wear-resistant high-entropy alloy coating, its preparation method, and its application. The preparation method includes the following steps: installing an alloy target on a target position in a deposition chamber; treating the substrate; installing a substrate sample plate and closing the chamber to evacuate the vacuum; closing the gate valve and evacuating the deposition chamber to the target vacuum level; heating the sample plate to the target temperature; adjusting the target-substrate distance and setting the Ar flow rate; setting the sample rotation speed, sputtering power, and substrate bias, and starting sputtering; turning off the power after sputtering and continuing sputtering, followed by heating and sputtering; after deposition, removing the sample after it cools to room temperature; the deposited TaNbHfZr coating has high strength and plasticity, and the presence of the equiaxed crystal layer prevents the continued propagation of cracks in the thickness direction after nano-impact, providing wear-resistant protection for turbine blades; solving the problem of insufficient toughness and poor wear resistance of wear-resistant coatings on turbine blade surfaces.

This invention provides a sample adjustment and positioning device, method, electronic device, and storage medium, including a horizontal displacement component, a vertical displacement component, and a sample rotation component. The vertical displacement component is mounted on the horizontal displacement component. The sample rotation component includes a right-angle fixing member, a sample holder, and a sample holder drive motor. The right-angle fixing member is mounted on the vertical displacement component. The sample holder has a disc structure, and its center is connected to the right-angle fixing member via a central shaft. The sample holder drive motor can drive the sample holder to rotate around the central shaft. Samples are mounted on the sample holder, and the samples are evenly arranged circumferentially along its center. Each sample has a corresponding positioning pin, which secures the sample to the sample holder. Under the action of the positioning pins, each sample has the same angle with the center of the sample holder. The sample adjustment and positioning device and vehicle of this invention can solve the problem in the prior art that it is impossible to easily measure sample results at multiple angles.

This invention discloses a rapid and automatic sample rotation method for transmission electron microscopy (TEM) based on crystal orientation information obtained from electron backscatter diffraction (TKD-EBSD). The steps include: acquiring complete crystallographic information of each grain in the TEM sample; calculating the theoretical tilt angle parameters (α, β) required for the TEM sample stage; loading the TEM sample to be characterized into the TEM sample holder, and then transferring the sample holder into the TEM; making preliminary adjustments to the TEM parameters; controlling the tilt of the sample stage based on the theoretical tilt angle parameters (α, β); moving the target grain to the image center, and making secondary adjustments to the sample stage zone axis based on the alignment accuracy of the target zone axis; and completing the microstructure analysis of the target grain. This invention combines theoretical tilt angle analysis with the TEM sample stage tilting function, ultimately achieving precise and rapid tilting of the target zone axis of the grain of interest in the TEM, thus providing a reliable technical guarantee for efficient and accurate microscopic analysis.

The present application belongs to the technical field of optical interference measurement, non-contact liquid concentration measurement and signal processing, and particularly relates to a non-contact liquid concentration online rapid measurement device based on Michelson interference, which comprises two parts of an optical module and a measurement module; the optical module mainly comprises a main laser, a beam expander, a beam splitter, a mirror, a sample to be measured, a rotating table, a reference laser, a position detector, a variable diaphragm and the like; and the measurement module comprises a photoelectric detector, a data acquisition module and an upper computer data processing module. The initial angle and position of the sample to be measured are fed back in real time to realize accurate calibration of the optical path difference, and then the rapid and accurate measurement of the liquid concentration of the sample to be measured is realized, the random error in the measurement process can be greatly inhibited, and the accuracy and repeatability of the measurement are improved. The present application effectively combines the advantages of light folding reflection, Michelson interference, feedback control, signal acquisition and processing and the like, and the whole device is simple, compact in structure and convenient to operate.

This invention discloses a zeta potential measurement device and method for semiconductor material and process development, belonging to the field of surface electrochemical measurement and semiconductor material characterization technology. The device includes a sample rotation unit for fixing and rotating the sample to be tested; a liquid delivery unit including a working electrode, a pump, and a liquid container; the working electrode is connected to the liquid container via the pump to deliver the liquid to be tested to the surface of the sample to form a liquid layer; an electrode measurement unit including a reference electrode disposed around the sample to detect the current potential generated in the liquid layer due to sample rotation; and a signal processing unit connected to the electrode measurement unit to calculate the zeta potential of the sample surface based on the current potential. This invention achieves high signal-to-noise ratio measurement of single, irregular samples in complex semiconductor liquids, without requiring known Debye lengths, and with short liquid exposure time, significantly improving the adaptability, accuracy, and efficiency of the measurement.

A method for providing data for rotation-dependent position correction of a sample comprises rotating the sample about an axis of rotation to at least one angle of rotation; acquiring at least one first planar image of a first location of the sample for the at least one angle of rotation; acquiring at least one second planar image of a second location of the sample for the at least one angle of rotation; and providing the data for rotation-dependent position correction of the sample at least partially based on the first and the second planar image.