225 results about "Synchrotron radiation" patented technology

An in-situ fretting corrosion fatigue testing machine based on synchrotron radiation diffraction and three-dimensional (3D) imaging includes an axial fatigue loading system, a fretting loading system, and a corrosion environment control system, where the axial fatigue loading system includes a driving device, a load control device, and a load sensing device; the load sensing device is configured to measure an axial force and a normal force in real time; the driving device is configured to drive the load control device, thereby achieving axial displacement of the load control device; the load control device is configured to carry out axial fatigue loading of a specimen; and the fretting loading system includes a fretting wear device. The testing machine achieves real-time 3D imaging characterization of wear spot and crack morphology of a material in a fretting corrosion environment, as well as characterization of a residual stress evolution law.

To study a system that transmutes atomic nuclei using muons, devise a light source device and a propulsion device including a nuclear transmutation system, and examine a centrifugal force application unit which may be accelerated by the propulsion device, and devise an electric field generator or a magnetic field generator.SOLUTION: A system is devised that decelerates cosmic muons produced from cosmic rays or high-speed muons derived from mesons produced from atomic collisions with electric field and deceleration means and uses the muons for nuclear transmutation. Also, a decelerator using a laser wake field and a decelerator using an element forming an electric field are proposed. A radiation light source having the nuclear transmutation unit is disclosed. An ionization device, a centrifugal gun device, a centrifugal force and pressure applying device, a pressure generation unit, a pressure applying material, a high-pressure induction superconductivity experimenting system, a magnetic device, and a magnetic sail are disclosed.SELECTED DRAWING: Figure 18

The invention relates to a multi-principal element alloy local lattice distortion measurement method based on a synchrotron radiation X-ray atom pair distribution function, which comprises the following steps: preparing an experimental material, and collecting two-dimensional diffraction data by using synchrotron radiation high-energy X-rays; separating local and average structure information through an atom pair distribution function; and verifying local distortion causes by combining structure fitting and DFT supercell relaxation. According to the method, the accuracy of capturing the local distortion of the atomic scale can be improved, the integrity of statistical information of the local structure distortion of the quantitative characterization material can be fully supplemented, and high-precision measurement and quantitative analysis of dynamic distortion can be systematically realized.

The invention relates to an in-situ XAFS reaction tank for photocatalytic reaction and a use method, and belongs to the technical field of material characterization. The in-situ XAFS reaction tank for the photocatalytic reaction is used for gas-solid in-situ X-ray absorption of a fine structure spectrum. The in-situ XAFS reaction tank comprises a reaction tank body and a top plate, the reaction tank body is mounted on the top plate, and a sample window and two light path windows are arranged on the reaction tank body; the sample window is used for placing a to-be-tested sample, the first light path window is used for transmitting a catalytic light source, and the second light path window is used for transmitting X-rays. The in-situ XAFS reaction tank disclosed by the invention can well meet the requirements of a gas-solid in-situ X-ray absorption fine structure spectrum test, and can be used for simultaneously collecting transmission and fluorescence signals and applying the signals to an in-situ photocatalytic reaction system, so that the limitation of the existing off-line test is broken through; and the application of a synchrotron radiation X-ray absorption fine structure spectrum technology in gas-solid phase photocatalytic reaction research is widened.

The invention relates to a multi-principal element alloy local lattice distortion measurement method based on a synchrotron radiation X-ray atom pair distribution function, which comprises the following steps: preparing an experimental material, and collecting two-dimensional diffraction data by using synchrotron radiation high-energy X-rays; separating local and average structure information through an atom pair distribution function; and verifying local distortion causes by combining structure fitting and DFT supercell relaxation. According to the method, the accuracy of capturing the local distortion of the atomic scale can be improved, the integrity of statistical information of the local structure distortion of the quantitative characterization material can be fully supplemented, and high-precision measurement and quantitative analysis of dynamic distortion can be systematically realized.

The utility model relates to the field of batteries, and discloses a battery in-situ test sample cell, which comprises a first shell and a second shell, a first accommodating cavity with one closed end is arranged in the first shell, the first accommodating cavity is used for accommodating a sample to be tested, and the second shell covers the first shell so that the other end of the first accommodating cavity is closed. The top of the second shell is provided with an observation window, the observation window can observe the to-be-tested sample in the first containing cavity through the observation channel, an annular second containing cavity is formed outside the first containing cavity, and a semiconductor temperature control chip is installed in the second containing cavity. The device can be combined with synchrotron radiation analysis and gas product detection, has a lateral visual observation function, is reasonable in whole structural design and high in compatibility, can stably operate in a temperature range of-20 DEG C to 70 DEG C, and is adaptive to various in-situ characterization platforms.

The invention provides a synchrotron radiation scanning imaging system which comprises a first support, a second support and a third support, a through hole is formed in the first support so that X-rays input from the outside can penetrate through the through hole, and the first support is provided with a diffraction assembly, a first lens and a second lens, the diffraction assembly is installed on the first support and used for diffracting the X-rays and focusing the X-rays to obtain X-ray focusing light spots; the sample assembly is used for bearing samples; the laser interference assembly is used for emitting emission laser and receiving reflection laser, calculating an optical path difference generated by vibration between the emission laser and the reflection laser, and converting the optical path difference into a first electric signal; the controller is connected with the laser interference assembly and the sample assembly, and the controller is used for controlling the sample assembly to move based on the first electric signal, so that the X-ray focusing light spot is aligned with the sample for radiation, and an X-ray radiation signal is obtained; and the detection assembly is used for performing laminated coherent diffraction imaging or scanning transmission X-ray microscopic imaging on the sample through the X-ray radiation signal.

The invention relates to the technical field of synchrotron radiation experiments, in particular to an XAFS automatic sample changing device integrating light intensity management and an operation method.The XAFS automatic sample changing device integrating light intensity management comprises an optical filter wheel, a sample table and a control assembly, the optical filter wheel and the sample table form an integrated structure used for XAFS experiments, the sample switching process is matched with the incident X-ray light intensity adjusting process, and the XAFS automatic sample changing device integrating light intensity management is achieved. Therefore, light intensity management is realized in an automatic sample changing process; an optical filter wheel capable of automatically switching, a sample table capable of accurately positioning and a temperature monitoring and remote control system cooperating with the sample table are introduced into a synchrotron radiation X-ray optical path, so that the photon flux incident on a sample can be optimized in real time according to the signal state of a detector and the thermal load of an optical filter; the stability, repeatability and safety of an XAFS experiment are remarkably improved while signal saturation and equipment overheating are avoided, so that manual intervention is reduced, the debugging time is shortened, and the operation efficiency of a whole light beam line is improved.

The invention relates to the field of batteries, and discloses a battery in-situ testing device suitable for a wide temperature range, the battery in-situ testing device comprises a first shell and a second shell, the first shell is internally provided with a first accommodating cavity with one closed end, the first accommodating cavity is used for accommodating a to-be-tested sample, the second shell covers the first shell so that the other end of the first accommodating cavity is closed, and the first accommodating cavity is used for accommodating the to-be-tested sample. The top of the second shell is provided with an observation window, the observation window can observe a to-be-tested sample in the first accommodating cavity through the observation channel, an annular second accommodating cavity is arranged outside the first accommodating cavity, a temperature control part is arranged in the second accommodating cavity, and the temperature control part controls the test temperature of the first accommodating cavity based on the Peltier effect. The sample cell provided by the invention is suitable for wide temperature range conditions, can be combined with synchrotron radiation analysis and gas product detection, has a lateral visual observation function, is reasonable in overall structural design and high in compatibility, can stably operate in a temperature range of-20 DEG C to 70 DEG C, and is adaptive to various in-situ characterization platforms.

The utility model discloses an in-situ synchrotron radiation device for testing a core element of a thin film capacitor, and belongs to in-situ synchrotron radiation testing equipment. In order to achieve in-situ synchrotron radiation testing of a core element of the thin-film capacitor, the core element is installed in a containing cavity of a shell, a temperature control mechanism is installed on the shell and adjusts the temperature of the containing cavity of the shell, and a high-voltage polarization power source is connected with the two ends of the core element to apply voltage. The pressure regulating mechanism comprises two pressure regulating plates and a pressure regulating driving assembly, the two pressure regulating plates are respectively mounted on two sides of the core element, and the pressure regulating driving assembly is connected with the two pressure regulating plates and regulates the distance between the two pressure regulating plates; the synchrotron radiation light source and the signal receiving plate are respectively arranged at two sides of the shell, two side walls of the shell are respectively provided with a light hole I, each pressure regulating plate is provided with a light hole II, the synchrotron radiation light source emits x-rays, the x-rays irradiate the core element, and then the x-rays are received by the signal receiving plate. The device is used for realizing the in-situ synchrotron radiation test of the core element.

The invention relates to a micro-channel flow boiling in-situ measurement method, which comprises the following steps of: 1) establishing a micro-channel flow boiling test system (17), and testing to ensure the sealing performance and the stability of the test system; 2) building a synchrotron radiation X-ray imaging system; 3) performing a pre-test to ensure that synchrotron radiation X-rays can penetrate through the micro-channel, pass through the scintillation crystal (3) and the reflector (4) and then are received by the high-speed camera; (4) micro-channel flow boiling tests under different test working conditions are carried out, and after it is monitored that the wall surface temperature reaches an approximate steady state, the synchrotron radiation X-ray imaging system is used for shooting the flow boiling phenomenon in the micro-channel; meanwhile, a temperature and pressure sensor in the micro-channel flow boiling test system is used for collecting wall surface temperature and inlet and outlet pressure, and in-situ measurement results of the wall surface temperature and the inlet and outlet pressure are obtained. Compared with the prior art, the method has the advantages of solving the problem of view angle limitation existing in a micro-channel flow boiling observation means and the like.

The invention provides a method for simulating and measuring phase volume fraction change in a metal material additive manufacturing process. The method comprises the following steps: preparing a sample; mounting the sample to an experimental device; performing cyclic heat treatment on the sample to simulate an additive manufacturing process, and acquiring synchrotron radiation X-ray two-dimensional diffraction patterns of the sample at different moments; converting the two-dimensional diffraction pattern into a one-dimensional diffraction pattern; and refining the one-dimensional diffraction pattern by using a Rietveld method to obtain a change chart of the volume fraction of each phase of the sample along with time. According to the method, the heating process of a lower-layer material in the additive manufacturing process is simulated by conducting cyclic heat treatment on the material, the phase change of the material is detected through synchrotron radiation X-rays, and the complex unbalanced solid-state phase change of the lower-layer material in the additive manufacturing process of a metal material can be researched in situ; and then the additive manufacturing process is optimized in an auxiliary mode, and the alloy performance is regulated and controlled.

The utility model discloses an electrochemical reaction tank for a hard X-ray absorption spectrum in-situ dual-mode test. The electrochemical reaction tank comprises a reaction tank body, a working electrode, a reference electrode and a graphite counter electrode, the front plate is provided with a working electrode window, and the upper plate is provided with a reference electrode hole and a graphite counter electrode hole. The working electrode is arranged at the window of the front plate and is tightly attached to the reaction tank body through a polyimide adhesive tape, and the reference electrode and the graphite counter electrode are arranged on the two sides of the reaction tank body and are respectively connected with an external electrochemical working platform. The distance between the working electrode window and the rear plate is controlled, and the working electrode is coupled with synchrotron radiation X-ray incident light, a fluorescence signal and a transmission signal to form an X-ray dual-mode test channel. The advantages of a synchrotron radiation X-ray absorption spectrum measuring platform are fully utilized, a real in-situ electrochemical detection environment is simulated, and reliable fluorescence and transmission signals are collected at the same time.

The utility model relates to an in-situ synchrotron radiation transmission type XAS battery testing device, which comprises a battery mould, the battery mould comprises a sealing cover, a main shell and a base, the sealing cover comprises a sleeve part inserted into the main shell, a first beryllium window is arranged at the lower end of the sleeve part, the base is fixedly arranged at the lower end of the main shell, and a second beryllium window is arranged in the middle of the base. A sealed space for containing the battery assembly is formed among the sleeve part, the main shell and the base, the upper side of the battery assembly is provided with a negative electrode making contact with the first beryllium window, and the lower side of the battery assembly is provided with a positive electrode making contact with the second beryllium window. And the base is provided with a positive lead connected with the charge-discharge instrument. According to the in-situ synchrotron radiation transmission-type XAS testing device, the combination of an electrochemical performance test and an in-situ synchrotron radiation transmission-type XAS test is realized, and the negative lead and the positive lead are respectively connected to the limiting flange part at the upper end of the sealing cover and the base, so that the sealing performance of an internal electrochemical cell cannot be damaged.

The invention relates to the technical field of spectral measurement and analysis, and discloses an in-situ cell for rapid and continuous synchrotron radiation X-ray absorption spectrum measurement, the in-situ cell comprises a housing 1, one side of the housing 1 is provided with two through holes, and a counter electrode and a reference electrode are respectively fixed in the two through holes; the first shell and the second shell are correspondingly arranged, and square optical windows are arranged in the center of the second shell and the center of the first shell; the first shell and the second shell are each provided with a hole channel, the two hole channels are located on the two sides of the square optical window respectively, and a working electrode is fixedly arranged between the second shell and the first shell. The in-situ synchrotron radiation X-ray absorption spectrum measuring device is suitable for in-situ synchrotron radiation X-ray absorption spectrum measurement in a time-resolved energy dispersion / transmission mode, and through real-time supply and circular flow of the electrolyte on the surface of the working electrode, the uniformity of the X-ray penetrating through a solution layer is ensured, the elimination of product gas is accelerated, the influence of solution disturbance on a test signal is reduced, and the test stability is improved.

The application discloses a high-frequency shielding bellows and a synchrotron radiation accelerator with the same, which comprises a bellows outer tube extending along a first direction; a shielding tube arranged on the radially inner side of the bellows outer tube and comprising two beam flow pipes extending along the first direction and arranged at intervals in the first direction, and the opposite ends of the two beam flow pipes are fixed with the bellows outer tube respectively; and a sliding unit comprising a sliding piece extending along the first direction, the sliding piece being a conductive piece, and the two ends of the sliding piece are configured to be always slidably attached to the beam flow pipe on the same side along the first direction. According to the high-frequency shielding bellows, when the electron beam flows, a continuous mirror wall current path can be formed, good electrical contact is maintained, high-order mode leakage and electron beam instability are effectively inhibited, and the heating phenomenon caused by the excessive wall resistance of the bellows outer tube can be avoided, so that the reliability of the high-frequency shielding bellows is significantly improved.

The invention belongs to the technical field of synchrotron radiation light sources, and discloses a serial impact magnet device which comprises a shell assembly, a positive pulse electrode, a negative pulse electrode and a strip magnet. The shell assembly comprises a shell body and a side end cover which are detachably connected, and a magnetic core space is formed between the shell body and the side end cover. The positive pulse electrodes extend into the magnetic core space and are arranged at intervals. The negative pulse electrodes extend into the magnetic core space and are arranged opposite to the positive pulse electrodes, and the multiple negative pulse electrodes are arranged at intervals. The strip magnets are arranged in the magnetic core space, the strip magnets are connected between every two adjacent positive pulse electrodes, the strip magnets are connected between every two adjacent negative pulse electrodes, and the two strip magnets are spaced from each other to form a magnetic field space. The electron beam current can be transmitted in the magnetic field space. The tandem impact magnet device can improve the compact degree and the vacuum degree, facilitates the assembly of an internal structure, and can meet the injection requirements of electron beams of a synchrotron radiation light source.

The invention discloses a seawater environment biaxial mechanical loading device based on synchrotron radiation X-ray diffraction, and belongs to the technical field of material testing in a seawater environment. Comprising a ray generator, and a slit, a mechanical loading device and a detector are sequentially arranged along a light path of the ray generator; a seawater environment box is arranged in the center of the mechanical loading device, and a three-dimensional adjusting platform is arranged below the mechanical loading device; by adopting the structure, in-situ characterization and analysis of corrosion product evolution at the crack are realized under the near-service working condition of a complex stress state and a seawater corrosion environment, and a technical support is provided for revealing a microcrack corrosion failure mechanism of a marine material under the near-service working condition.

The invention belongs to the technical field of micro-nano processing, and particularly relates to a Pt-HSQ-based high-resolution X-ray Fresnel zone plate and a preparation method thereof. According to the X-ray Fresnel zone plate, a Pt-HSQ metal-inorganic material system is adopted, a diffraction structure with a large aspect ratio and Pt material quasi-periodic dense stripes specially needed by an X-ray zone plate lens is formed through electron beam lithography and an ALD process, and diffraction focusing from a soft X-ray wave band to a hard X-ray wave band and imaging with an amplification function are achieved. The wave zone plate has excellent mechanical stability, and the irradiation resistance and morphology retentivity of the wave zone plate under high-energy irradiation are remarkably improved. And high-resolution X-ray focusing elements with different energy wavebands and different focal lengths can be prepared according to geometric design and material selection of the wave zone plate. The lens is suitable for microscopic imaging, coherent diffraction imaging, X-ray spectrum, nanometer detection and other scenes of a synchrotron radiation or off-line laboratory X-ray light source, and has wide popularization value and application prospect.

This application relates to the field of lasers and discloses a reflector module, a synchrotron radiation device, and a free-electron laser device. The module includes a mirror body, a cooling component, and a heating component. The cooling component is connected to the mirror body and disposed on a first surface, used to reduce the temperature of the reflecting surface. The heating component is connected to the cooling component and used to compensate for the temperature of the reflecting surface. The heating component includes a heat-conducting block and a heating plate. This application utilizes a heat-conducting block connected to the cooling component and protruding from the reflecting surface along a third direction. A heating plate is disposed on the surface of the heat-conducting block facing the mirror body along a second direction. The heating component provides localized temperature compensation for the reflecting surface, which, combined with the uniform cooling of the cooling component, effectively reduces the localized high thermal gradient and non-uniform thermal expansion deformation of the reflecting surface caused by changes in the beam position.

The invention discloses a method for human brain tissue staining and synchrotron radiation X-ray imaging at a near freezing point temperature. The method comprises the following steps: 1) preparing a Golgi staining solution; (2) unfreezing the death delayed frozen human brain tissue which is subjected to cryopreservation; 3) dip-dyeing the human brain tissue obtained in the step 2) in the Golgi staining solution, and staining at a temperature close to a freezing point; 4) developing neurons in the human brain tissue obtained in the step 3); 5) performing dehydration, transparentizing and tissue embedding on the human brain tissue obtained in the step 4); and 6) imaging and observing under a synchrotron radiation X-ray microscope. According to the method, the Golgi staining method is carried out at the near freezing point temperature for the first time, efficient staining of neurons of the dead delayed frozen human brain tissue is achieved, the neuron marking efficiency is improved, synchrotron radiation X-ray imaging of the neuron form and connection of the large-size human brain tissue is achieved, and the imaging accuracy is improved. The method is expected to be applied to imaging of a fine structure of a large-volume human brain tissue sample.

The utility model discloses a groove cutting type absorber for composite use conditions of synchrotron radiation beam lines, which is characterized by comprising an absorber main body, a knife edge flange and a leading-out water pipe, one end of the absorber main body is connected with the inner side of the knife edge flange, and the other end is provided with a lighting surface; a cooling water channel is formed in the absorber main body and used for being communicated with a cooling water inlet and outlet channel in the knife edge flange, and a water inlet pipe and a water outlet pipe of the leading-out water pipe are connected with ports of the cooling water inlet and outlet channel on the outer side of the knife edge flange respectively and form a cooling water circulation channel with the cooling water channel in the absorber main body; the lighting surface is a sectional inclined surface and comprises a plurality of inclined surfaces which are connected in sequence and have different included angles with the synchrotron radiation light along the optical axis direction; the switching direction of the absorber main body is perpendicular to the beam direction of the synchrotron radiation light, and the lighting surface is parallel to the switching direction and is used for enabling the slopes to light simultaneously when the absorber main body is switched into a light path. The absorber can better bear high heat load.

The present invention discloses an in-situ test device and a test method for catalyst reactions, which can be used for in-situ synchrotron radiation testing during the process of heterogeneous catalyst reactions and obtain high-quality X-ray absorption and X-ray diffraction spectra during the catalytic reaction process, providing basic data for further developing efficient heterogeneous catalysts. The structure of the present invention is simple, and the flow state of the reaction gas can be controlled by controlling the size of the catalyst powder sample particles, the inner diameter of the sample tube, and the flow rate of the high-pressure gas. It can be used to monitor the in-situ catalyst structure evolution law during the fixed-bed catalytic reaction process, solving the problems that the previous equipment could not reflect the true in-situ spectroscopic information of heterogeneous catalytic reactions, had poor signals, and could not simultaneously achieve multiple spectroscopic monitoring, and has important value and significance for promoting the development of heterogeneous catalysts.

The present invention relates to a method for constructing a simulation model of a CFRP laminate based on DIC and synchrotron radiation, belonging to the technical field of model simulation, and solves the problems in the prior art that the fracture toughness of CFRP cannot be accurately calculated and the modeling parameters of the cohesive force model are inaccurate. A CFRP laminate specimen containing a prefabricated crack is constructed, and a three-point bending fracture loading test is carried out on the specimen. The fracture toughness value is calculated based on the type-I dynamic stress intensity factor. An integrated synchrotron radiation device is introduced to carry out an impact fracture test on the specimen to obtain high-resolution images. The final failure displacement is corrected based on the high-resolution images and the crack initiation time. The initial damage displacement is corrected based on the fracture toughness value and the high-resolution images. A finite element model of a CFRP laminate specimen containing a prefabricated crack is constructed based on the fracture toughness value and the corrected final failure displacement and initial damage displacement. An accurate calculation method for fracture toughness and a correction method for cohesive force model parameters are realized.

The application relates to an in-situ XAFS reaction cell for a photocatalytic reaction and a use method, and belongs to the technical field of material characterization. The in-situ XAFS reaction cell for the photocatalytic reaction is used for gas-solid in-situ X-ray absorption fine structure spectrum, and the in-situ XAFS reaction cell comprises a reaction cell body and a top plate; the reaction cell body is installed on the top plate, sample windows and two light path windows are arranged on the reaction cell body; the sample windows are used for placing samples to be tested, wherein the first light path window is used for transmitting a catalytic light source, and the second light path window is used for transmitting X-rays. The in-situ XAFS reaction cell can well adapt to the needs of gas-solid in-situ X-ray absorption fine structure spectrum testing, simultaneously collect transmission and fluorescence signals and be applied to an in-situ photocatalytic reaction system, breaks through the limitation of existing offline testing, and widens the application of a synchrotron radiation X-ray absorption fine structure spectrum technology in gas-solid phase photocatalytic reaction research.

The invention discloses a natural gas hydrate CT image threshold segmentation method and a storage medium, and belongs to the technical field of natural gas hydrate detection.The method comprises the steps that S1, a natural gas hydrate sample image obtained through synchrotron radiation CT scanning is obtained, the image is preprocessed, and a central area image is obtained; s2, performing edge recognition on the preprocessed central region image by using a convolutional neural network and combining a Sobel operator to obtain an edge feature matrix; s3, clustering the edge feature matrix by adopting a KMeans clustering algorithm, and determining gray boundary values of the solid particles and the methane bubbles; s4, removing gray scale parts of solid particles and methane bubbles in the image according to the gray scale boundary value, and performing maximum and minimum normalization processing on the residual gray scale values of water and hydrates to obtain a gray scale probability density; and S5, drawing a normalized gray probability density map according to the gray probability densities of all the images, and determining a threshold segmentation range of the hydrate according to the probability density peak displacement. The method can automatically extract the hydrate threshold range, and improves the segmentation precision.

The invention discloses a synchrotron radiation hard X-ray electron coupling nanoscale high spatial resolution detection method. The method comprises the following steps: 1) selecting synchrotron radiation hard X-rays as a light source; selecting a matched light source energy interval according to the material and thickness of the sample; 2) according to the selected synchrotron radiation hard X-ray energy, selecting a point spread function with high quantum efficiency, a small point spread function and a narrow emission electron spectrum, and calculating a corresponding photocathode material and thickness; 3) detecting the sample by using the light source and the photocathode determined in the above step to obtain a synchrotron radiation hard X-ray transmission image carrying sample structure information, and incidence the synchrotron radiation hard X-ray transmission image on the photocathode; the photocathode emits electrons under the action of incident photons, converts an X-ray transmission signal into an electronic signal, inputs the electronic signal into the electronic imaging system for focusing, amplifying and imaging, and inputs the electronic signal into the imaging recording system; and 4) obtaining a detection result of the sample according to the image recorded by the imaging recording system.

The invention discloses a focusing method for synchrotron radiation X-ray nanometer coaxial holographic imaging, and belongs to the technical field of coaxial holography. The method realizes integrated control of optical path equipment through an EPICS, and comprises the following steps: building an optical path, initializing positions of a sample and a detector, and connecting a linear displacement table and the detector into an EPICS control system; a displacement table and a detector are synchronously controlled in real time through an EPICS to collect a hologram of a standard resolution target, and an optimal reconstruction distance is determined through automatic continuous equivalent distance scanning and an image definition recognition function; calculating an actual object-source distance and a geophysical prospecting distance by using the equivalent distance and the magnification; in the verification link, the hologram is recollected by adjusting the position of the sample or the detector, so that the imaging definition under different magnifications is ensured. According to the invention, the data acquisition and data processing speed, the focusing precision and the imaging quality in the focusing process are obviously improved, and the method is suitable for nanoscale microstructure research in the fields of material science, life science and the like.

The present invention discloses a serial crystallography experimental device based on conveyor belt technology. The device comprises a goniometer head, a base film, and a crystallization plate storage tray. The bottom end of the goniometer head is provided with a goniometer head groove for coupling with the goniometer head base on a synchrotron beamline station. The top end of the goniometer head is provided with two goniometer head support rods for coupling with bearing short rods, and a goniometer head waste liquid tank for collecting waste liquid after X-ray irradiation. The base film is coupled to the crystallization plate storage tray for supporting and flipping the crystallization plate storage tray. During the experiment, the crystallization plate storage tray, equipped with a sitting drop in situ crystallization plate, is coupled to the base film. The low background scattering film on the back of the sitting drop in situ crystallization plate is connected to the bearing short rod via an adhesive film to form a conveyor belt film. Driven by a motor, the bearing short rod tears off the conveyor belt film during sample delivery to the goniometer head and performs diffraction data acquisition. Waste sample droplets are squeezed out and flow down the goniometer head support rods into the waste liquid tank.

The application provides an ADC resolution optimization method of a synchrotron radiation device controller, which comprises the following steps: establishing an ADC resolution optimization system of the synchrotron radiation device controller on an FPGA chip of the synchrotron radiation device controller; defining a desired signal-to-noise ratio variable of the ADC resolution optimization system, and then solving a controller parameter; obtaining a transfer function from an external disturbance signal to an error from the ADC resolution optimization system of the synchrotron radiation device controller, and minimizing an H2 norm of the transfer function from the external disturbance signal to the error by optimizing the controller parameter; and taking a sampling rate of ADC data obtained by the FPGA as a control variable to control, so as to realize direct control of the ADC resolution and noise reduction control. The application also provides a corresponding ADC resolution optimization system. The ADC resolution optimization method of the synchrotron radiation device controller can effectively improve the ADC resolution, and the hardware does not need to be changed, so that the cost is reduced.