A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and application

Abstract

The invention discloses a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device. A synchrotron radiation X-ray light source, an undulator, a monochromator crystal, an X-ray shutter, a first lifting platform, a focusing device cavity, a vacuum piping, a second lifting platform, a multi-purpose sample room, a vacuum piping, a third lifting platform, a detector, and a computer which is used for collecting data and controlling an electric controlled translation platform are sequentially and coaxially arranged along the forward motion direction of light beam, wherein the monochromator crystal, the X-ray shutter and the first lifting platform are arranged on an electrical rotary platform, the focusing device cavity, the vacuum piping and the second lifting platform are arranged on the first lifting platform, the multi-purpose sample room, the vacuum piping and the third lifting platform are arranged on the second lifting platform, and the detector and the computer are arranged on the third lifting platform. According to the multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device, a low vacuum operating mode, a ventilation working mode, a freezing operating mode, X-ray focusing mode imaging or X-ray non-focusing mode imaging are achieved, the collection of three-dimension diffraction signals of samples are achieved by using a three-dimension rotating platform, a high quality three-dimension rebuilding result is obtained by using computer software, dying treatment and slicing treatment to the samples are needless, and train of thought is supplied to enrich a synchrotron radiation beam line imaging method.

Description

Technical field [0001] The invention relates to a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and the application of the device for coherent X-ray diffraction imaging. Background technique [0002] Since Roentgen first discovered X-rays in 1895, X-rays have been widely used in imaging and structural analysis. Bragg, based on the X-ray diffraction phenomenon of crystals, uses X-rays to analyze the atomic and molecular structure of crystals. After nearly 100 years of development, X-ray crystallography has played an important role in analyzing the atomic structure of crystals, but X-ray crystallography is not suitable for amorphous materials. Coherent X-ray diffraction imaging technology, as the development and extension of X-ray crystallography, is a very potential method to analyze the three-dimensional high-resolution structure of crystalline and amorphous materials. It has important application value in materials science, physics, b...

AI Technical Summary

Problems solved by technology

[0006] At present, the traditional coherent X-ray diffraction microscope imaging system is mainly built on a high-performance synchrotron radiation source, which can mainly realize a certain kind of coherent X-ray diffraction imaging, such as plane wave CDI imaging only in a non-vacuum state, and 3D reconstruction is Based on the traditional equal-angle sampling filter back projection algorithm, the accuracy of 3D reconstruction is poor

There is no good solution to the problem of radiation damage to samples

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