A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and application

A microscopic imaging and X-ray technology, which is used in material analysis, measurement devices, and instruments using wave/particle radiation. , good coherence, the effect of reducing the number of projections

Inactive Publication Date: 2013-06-05
SHANDONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] At present, the traditional coherent X-ray diffraction microscope imaging system is mainly built on a high-performance synchrotron radiation source, which can mainly realize a certain kind of coherent X-ray diffraction imaging, such as plane wave CD

Method used

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  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and application
  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and application
  • A multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and application

Examples

Experimental program
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Effect test

Embodiment 1

[0040] Such as figure 1 , The multi-purpose synchrotron radiation coherent X-ray diffraction microscopy imaging device of the present invention is arranged coaxially in sequence along the beam advancement direction: synchrotron X-ray source 1, undulator 2, monochromator crystal arranged on an electronically controlled rotating platform 3. X-ray shutter 4, first lifting platform and focusing device cavity 5, vacuum pipe 6, second lifting platform and multi-purpose sample chamber provided on it 7, vacuum pipe 8, third lifting platform And a detector 9 arranged on it, and a computer 10 that collects data and controls the movement of the electronically controlled translation stage; wherein the focusing device cavity is provided with a closed door on the side, and the cavity is arranged coaxially along the optical path in sequence: The horizontal focusing KB mirror 11 fixed on the angular displacement stage and the two-dimensional high-precision translation stage, the vertical focusi...

Embodiment 2

[0060] Build the same multi-purpose synchrotron radiation coherent X-ray diffraction microscope imaging device as in Example 1. The multi-purpose means that the device can be divided into X-ray focusing and non-focusing and the sample chamber has multiple working modes. This embodiment illustrates the specific experimental process and experimental parameters in non-X-ray focusing and ventilation working modes.

[0061] Applying the above multi-purpose synchrotron radiation coherent X-ray diffraction microscope device and imaging method, the imaging process is as follows figure 2 As shown, the steps are:

[0062] The first step: such as figure 1 To build a multi-purpose synchrotron radiation coherent X-ray diffraction microscope system

[0063] The selected energy of the X-ray is 8KeV and the wavelength is 0.155nm; other parameter settings and experimental methods are the same as in step 1 of embodiment 1;

[0064] Step 2: Light path collimation and purification

[0065] The inner dia...

Embodiment 3

[0076] Build the same multi-purpose synchrotron radiation coherent X-ray diffraction microscope imaging device as in Example 1. The multi-purpose means that the device can be divided into X-ray focused and non-focused modes and the sample chamber has multiple working modes. This example illustrates the specific experimental process and experimental parameters in non-X-ray focusing and liquid nitrogen freezing modes.

[0077] Applying the above multi-purpose synchrotron radiation coherent X-ray diffraction microscope device and imaging method, the imaging process is as follows figure 2 As shown, the steps are:

[0078] The first step: such as figure 1 To build a multi-purpose synchrotron radiation coherent X-ray diffraction microscope system

[0079] The selected energy of the X-ray is 8KeV and the wavelength is 0.155nm; other parameter settings and experimental methods are the same as in step 1 of embodiment 1;

[0080] Step 2: Light path collimation and purification

[0081] The inn...

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Abstract

The invention discloses a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device. A synchrotron radiation X-ray light source, an undulator, a monochromator crystal, an X-ray shutter, a first lifting platform, a focusing device cavity, a vacuum piping, a second lifting platform, a multi-purpose sample room, a vacuum piping, a third lifting platform, a detector, and a computer which is used for collecting data and controlling an electric controlled translation platform are sequentially and coaxially arranged along the forward motion direction of light beam, wherein the monochromator crystal, the X-ray shutter and the first lifting platform are arranged on an electrical rotary platform, the focusing device cavity, the vacuum piping and the second lifting platform are arranged on the first lifting platform, the multi-purpose sample room, the vacuum piping and the third lifting platform are arranged on the second lifting platform, and the detector and the computer are arranged on the third lifting platform. According to the multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device, a low vacuum operating mode, a ventilation working mode, a freezing operating mode, X-ray focusing mode imaging or X-ray non-focusing mode imaging are achieved, the collection of three-dimension diffraction signals of samples are achieved by using a three-dimension rotating platform, a high quality three-dimension rebuilding result is obtained by using computer software, dying treatment and slicing treatment to the samples are needless, and train of thought is supplied to enrich a synchrotron radiation beam line imaging method.

Description

Technical field [0001] The invention relates to a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device and the application of the device for coherent X-ray diffraction imaging. Background technique [0002] Since Roentgen first discovered X-rays in 1895, X-rays have been widely used in imaging and structural analysis. Bragg, based on the X-ray diffraction phenomenon of crystals, uses X-rays to analyze the atomic and molecular structure of crystals. After nearly 100 years of development, X-ray crystallography has played an important role in analyzing the atomic structure of crystals, but X-ray crystallography is not suitable for amorphous materials. Coherent X-ray diffraction imaging technology, as the development and extension of X-ray crystallography, is a very potential method to analyze the three-dimensional high-resolution structure of crystalline and amorphous materials. It has important application value in materials science, physics, b...

Claims

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Application Information

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IPC IPC(8): G01N23/207
Inventor 江怀东范家东刘宏张剑姚圣坤
Owner SHANDONG UNIV
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