Crystal geometrically necessary dislocation automatic analysis method based on synchrotron radiation

Abstract

The invention relates to a crystal geometrically necessary dislocation automatic analysis method based on synchrotron radiation. The method comprises the following steps: step one, acquiring a binary map, diffraction spot calibration information and crystal orientation information from an original map through the map processing; step two, establishing a dislocation dictionary through the crystallographic theory, establishing equipment model and simulating an elongation direction in combination with the diffraction spot calibration information and the crystal orientation information so as to obtain a candidate elongation direction; step three, using the binary map, the diffraction spot calibration information and the crystal orientation information to compute a diffraction spot elongation or splitting direction and elongation diffraction spot vertex through the graphic computation method of a diffraction map, the position computation method of the diffraction spot position and a rotation matrix method of the crystal orientation; step four, computing the diffraction spot elongation or splitting angle through the elongation diffraction spot vertex and the splitting diffraction spot calibration information; step five, identifying and matching the diffraction spot elongation or splitting according to the candidate elongation direction produced through simulation, computed elongation or splitting direction and elongation or splitting angle.

Description

technical field [0001] The invention relates to the technical field of crystal dislocation analysis methods, in particular to an automatic analysis method for crystal geometrically necessary dislocations based on synchrotron radiation, which is suitable for automatic analysis of crystal synchrotron radiation micro-area Laue diffraction data to obtain geometrically necessary dislocations in crystals. Dislocation information of dislocations; this method has the characteristics of high resolution, large penetration depth, high accuracy, high universality, and automatic processing. Background technique [0002] According to the existing dislocation theory, geometrically essential dislocations are dislocations produced by coordinating geometric shape changes when material properties are deformed. The application of geometrically essential dislocation theory can distinguish different plastic deformation processes, which is helpful to measure the deformation strengthening degree of...

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Problems solved by technology

However, the current micro-area Laue diffraction analysis of synchrotron radiation needs to scan the sample point by point to generate at least a thousand diffraction patterns. Researchers need to manually perform complex proc

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