The invention relates to an IGBT (insulated gate bipolar transistor) dynamic performance test device, which comprises a test current generating circuit, a first temperature collection and storage system, a second temperature collection and storage system, an oscilloscope, an IGBT driving circuit and an IGBT over-temperature protection system, wherein the IGBT over-temperature protection system is connected with the IGBT driving circuit, the test current generating circuit, the first temperature collection and storage system, the second temperature collection and storage system and the oscilloscope are respectively independent, and during testing, an IGBT test module is respectively connected with the test current generating circuit, the first temperature collection and storage system, the second temperature collection and storage system, the oscilloscope, the IGBT driving circuit and the IGBT over-temperature protection system. The IGBT dynamic performance test device has the advantages that the accumulated heat of an internal heating chip and the heat of a copper base board of an IGBT module can be simultaneously and automatically collected, further, the heat resistance parameters of the module can be extracted, and the work frequency of the IGBT module can be adjusted in real time.