The invention relates to an IGBT (
insulated gate bipolar transistor) dynamic performance test device, which comprises a test current generating circuit, a first temperature collection and storage
system, a second temperature collection and storage
system, an
oscilloscope, an IGBT
driving circuit and an IGBT over-temperature
protection system, wherein the IGBT over-temperature
protection system is connected with the IGBT
driving circuit, the test current generating circuit, the first temperature collection and storage
system, the second temperature collection and storage system and the
oscilloscope are respectively independent, and during testing, an IGBT test module is respectively connected with the test current generating circuit, the first temperature collection and storage system, the second temperature collection and storage system, the
oscilloscope, the IGBT
driving circuit and the IGBT over-temperature
protection system. The IGBT dynamic performance test device has the advantages that the accumulated heat of an
internal heating chip and the heat of a
copper base board of an IGBT module can be simultaneously and automatically collected, further, the
heat resistance parameters of the module can be extracted, and the work frequency of the IGBT module can be adjusted in real time.