Test system and test method, computer device and storage medium

Abstract

The application provides a test system and a test method, a computer device and a storage medium. The test system comprises a light source device, which emits a test light beam and exposure light beams with different exposure doses; a sample adjusting device, which comprises a sample placing table, a lifting mechanism and a rotating mechanism. The sample placing table is connected with the lifting mechanism or the rotating mechanism. The lifting mechanism is used to drive the to-be-tested sample to lift to adjust the exposure position. A detection device is used to detect the transmitted light passing through the to-be-tested sample. A control device is used to control the lifting mechanism to lift, so that different exposure regions of the to-be-tested sample correspond to the exposure light beams with different exposure doses. The control device is also used to control the rotating mechanism to rotate to drive the to-be-tested sample to rotate. The detection device is used to measure the energy change information of the transmitted light passing through the different exposure regions of the to-be-tested sample with the rotation angle in the process of sample rotation. The application can realize the test of the transmitted light of the to-be-tested sample without changing the angle of the light source device, and improves the test efficiency and precision.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of material testing, in particular to a test system and a test method, a computer device and a storage medium. BACKGROUND

[0002] Photopolymers have been applied in multiple cutting-edge optical technologies as optical field recording media. For example, in the application of volume holographic gratings, photopolymers can record high-resolution three-dimensional interference patterns and are widely used in the fields of optical storage and optical microprocessing. At the same time, with the continuous development of display technology, the application of photopolymers in optical display has also gradually matured, especially in the directions of volume holographic display, light modulation and adaptive display, showing strong potential. Photopolymers can produce differences in refractive index by undergoing monomer polymerization reactions at different exposure doses, which makes them have important application value in recording and storing optical field information. However, since the monomer polymerization reaction is usually accompanied by a certain degree of material shrinkage, this shrinkage effect will cause the recorded information to be distorted, thereby affecting the accuracy and reliability of optical field recording. Therefore, measuring and compensating for the shrinkage of photopolymers is an important step to ensure the accuracy of optical field recording.

[0003] In order to accurately evaluate the shrinkage effect of photopolymers under different exposure conditions, it is usually necessary to characterize the optical properties of the material. In related technologies, in order to measure the optical properties of photopolymers, it is usually necessary to frequently adjust the incident angle of the laser to obtain test data at different angles. Such operation is not only complex but also easy to introduce errors, resulting in inconsistency and reduced accuracy of the measurement results. SUMMARY

[0004] The present application provides a test system and a test method, a computer device and a storage medium, which can test the transmission light of the to-be-tested sample without changing the angle of the light source device, improving the efficiency and accuracy of the test.

[0005] To achieve the above-mentioned purpose, the present application provides a test system for testing the material shrinkage rate of a to-be-tested sample, comprising:

[0006] a light source device, the light source device emits a test light beam and an exposure light beam with different exposure doses;

[0007] a sample adjusting device, the sample adjusting device comprises a sample placing table, a lifting mechanism and a rotating mechanism, the sample placing table is used for placing the to-be-tested sample, the lifting shaft of the lifting mechanism and the rotating shaft of the rotating mechanism are coaxial, the sample placing table is connected with the lifting mechanism or the rotating mechanism, the lifting mechanism is used to drive the to-be-tested sample to lift to adjust the exposure position, and the rotating mechanism is used to drive the to-be-tested sample to rotate;

[0008] a detection device for detecting the transmitted light through the sample to be tested;

[0009] a control device in communication with the sample adjusting device, the light source device and the detection device;

[0010] The control device is configured to control the lifting mechanism to lift the sample to be tested so that different exposure regions of the sample to be tested correspond to exposure beams with different exposure doses, and control the rotating mechanism to rotate the sample to be tested, and the detection device is configured to measure the energy change information of the transmitted light through the different exposure regions of the sample to be tested with respect to the rotation angle during the rotation of the sample.

[0011] In addition, to achieve the above object, the application further provides a test method for testing the material shrinkage rate of a sample to be tested, which is applied to the test system according to any one of the embodiments of the application, and the test method comprises the following steps of:

[0012] controlling the lifting mechanism to lift the sample to be tested so that a first exposure region of the sample to be tested corresponds to a first exposure beam, and controlling the light source device to expose the first exposure region to the first exposure beam, the first exposure beam having a first exposure dose;

[0013] controlling the lifting mechanism to lift the sample to be tested so that a second exposure region of the sample to be tested corresponds to a second exposure beam, and controlling the light source device to expose the second exposure region to the second exposure beam, the second exposure beam having a second exposure dose; the first exposure dose is lower than the second exposure dose;

[0014] controlling the light source device to emit the test beam, and controlling the rotating mechanism to rotate the sample to be tested;

[0015] During the rotation of the sample to be tested, the detection device is configured to measure first energy change information corresponding to the change of the first transmitted light from the first exposure region with respect to the rotation angle, and second energy change information corresponding to the change of the second transmitted light from the second exposure region with respect to the rotation angle;

[0016] determining the material shrinkage rate of the sample to be tested according to the first energy change information and the second energy change information.

[0017] In addition, to achieve the above object, the present application also provides a computer device, comprising a memory and a processor; wherein the memory is connected with the processor, for storing programs; the processor is used to realize the steps of the test method provided by any one of the embodiments of the present application by running the programs stored in the memory.

[0018] In addition, to achieve the above object, the present application also provides a computer readable storage medium, which stores a computer program, and the computer program is executed by a processor to make the processor realize the steps of the test method provided by any one of the embodiments of the present application.

[0019] The test system and the test method, the computer device and the storage medium disclosed by the embodiments of the present application realize the following beneficial effects: by fixing the light source incidence angle of the light source device, combining the rotation control of the rotating mechanism and the lifting control of the lifting mechanism in the sample adjusting device, the measurement of the transmitted light of different exposure areas of the sample under test can be realized without adjusting the light source incidence angle of the light source device, the adjustment time and the operation complexity of the light source device are reduced, and the test efficiency is greatly improved. In addition, the coaxial design of the lifting mechanism and the rotating mechanism in the sample adjusting device ensures the accuracy of the position change of the sample under test during rotation and lifting. By controlling the rotation of the rotating mechanism to drive the rotation of the sample under test, the change requirement of the incidence light angle of the sample under test during the test can be met. Compared with the change of the incidence light angle of the light source device in the related art, the method can avoid the measurement deviation caused by the change of the incidence light angle in the related art, ensure the high precision of the test data, and provide stable data support for the accurate calculation of the shrinkage rate. BRIEF DESCRIPTION OF DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0021] Figure 1 is a structural schematic diagram of a test system provided by an embodiment of the present application;

[0022] Figure 2 is a scene schematic diagram of a test system provided by an embodiment of the present application;

[0023] Figure 3 is a scene schematic diagram of another test system provided by an embodiment of the present application;

[0024] Figure 4 is a flowchart of a test method provided by an embodiment of the present application;

[0025] Figure 5 is a schematic block diagram of a computer device provided by an embodiment of the present application.

[0026] Legend:

[0027] 10, light source device; 20, sample adjustment area; 21, sample placement table; 22, lifting mechanism; 23, rotating mechanism; 30, detection device; 221, first exposure area; 222, second exposure area; 11, laser; 12, beam splitter 12; 131, first shutter; 132, second shutter; 141, first mirror; 142, second mirror. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of the present application.

[0029] The flowcharts shown in the drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor do they have to be executed in the order described. For example, some operations / steps can be further divided, combined or partially merged, so the actual execution order may be changed according to the actual situation. In addition, although the functional modules are divided in the device schematic diagram, in some cases, the module division can be different from that in the device schematic diagram.

[0030] The term "and / or" used in the present application specification and the appended claims means any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0031] Some embodiments of the present application will be described in detail below with reference to the drawings. The following embodiments and features in the embodiments can be combined with each other without conflict.

[0032] Please refer to Figures 1 to 3 , Figure 1 is a structural schematic diagram of a test system provided by an embodiment of the present application; Figure 2 is a scene schematic diagram of a test system provided by an embodiment of the present application; Figure 3 is a scene schematic diagram of another test system provided by an embodiment of the present application. As Figure 1As shown, the test system provided by the present application is used for testing the material shrinkage of the sample to be tested, and the test system comprises a light source device 10, a sample adjusting device 20, a detection device 30 and a control device (not shown in the figure). The control device is in communication connection with the light source device 10, the sample adjusting device 20 and the detection device 30 respectively.

[0033] The sample to be tested can comprise a photopolymer, which is a kind of polymer material sensitive to light. The photopolymer can change its physical or chemical properties through chemical reaction under irradiation of light (such as ultraviolet light, visible light) of a specific wavelength, and is widely used in the fields of photolithography, 3D printing, optical storage and the like. The main components of the photopolymer include monomers, photoinitiators and additives. The monomers are used to provide polymerizable groups (such as acrylate, epoxy resin); the photoinitiators (such as ketone and styrene compounds) are used to absorb light energy and initiate polymerization reaction; and the additives include stabilizers and plasticizers and the like, which are used to prolong the storage time of the material and improve the flexibility of the material. Thus, the present application can test the sample to be tested under different exposure doses to determine the material shrinkage of the sample to be tested.

[0034] The light source device 10 emits a test light beam and an exposure light beam with different exposure doses. The exposure light beam is used to expose the sample to be tested according to different exposure doses, and the test light beam is used to calibrate and verify the optical performance of the sample to be tested after exposure, thereby being used for subsequent testing of the material shrinkage of the sample to be tested. In addition, the energy of the test light beam can be smaller than that of the exposure light beam, so as to avoid affecting or changing the state of the sample to be tested after exposure.

[0035] The sample adjusting device 20 comprises a sample placing table 21, a lifting mechanism 22 and a rotating mechanism 23. The sample placing table 20 is used to place the sample to be tested. The lifting shaft of the lifting mechanism 22 and the rotating shaft of the rotating mechanism 23 are coaxial, that is, the lifting mechanism 22 and the rotating mechanism 23 operate along the same axis. The sample placing table 21 is connected with the lifting mechanism 22 or the rotating mechanism 23. The lifting mechanism 22 is used to drive the sample to be tested to lift to adjust the exposure position. The rotating mechanism 23 is used to drive the sample to be tested to rotate, so that the sample to be tested can be accurately adjusted in the exposure position and the rotation angle of the sample to be tested.

[0036] For example, the intersection of the exposure light beam is also located on the coaxially arranged lifting shaft or rotating shaft, so as to ensure that there is no angle change between the surface of the sample to be tested and the exposure light beam when the lifting mechanism 22 moves up and down, and the intersection of the laser light beam always irradiates on the corresponding exposure position when the rotating mechanism 23 rotates, thereby improving the accuracy of the sample to be tested during the exposure process and the measurement process.

[0037] For example, the sample to be tested can also be placed on the lifting mechanism 22 by means of a sample clamping fixture (not shown), thereby ensuring the stability of the sample to be tested, which is not limited in this application.

[0038] The detection device 30 is used to detect the transmitted light passing through the sample to be tested. The detection device 30 includes a detector for receiving the transmitted light passing through the sample and converting it into a quantifiable signal. For example, the detector may include a photodiode, a photomultiplier tube, a fiber optic detector, etc., and this application is not limited to these.

[0039] It should be noted that transmitted light is light that has passed through the sample under test. When the test beam emitted by the light source device 10 passes through the sample under test, part of the light is absorbed, scattered, and diffracted by the sample, while the remaining part continues to penetrate the sample and becomes transmitted light. Since the intensity, wavelength distribution, and phase change of the transmitted light provide information about the optical properties of the sample under test, optical parameters such as transmittance, absorption characteristics, and refractive characteristics of the sample can be obtained by measuring the transmitted light.

[0040] like Figure 2 and Figure 3 As shown, the control device is used to control the lifting mechanism 22 to lift and lower, so that different exposure areas of the sample to be tested correspond to exposure beams with different exposure doses. The first exposure area 221 corresponds to the first exposure dose, and the second exposure area 222 corresponds to the second exposure dose. The first exposure dose is lower than the second exposure dose. The control device is used to control the rotation mechanism 23 to rotate, thereby driving the sample to be tested to rotate. Thus, during the rotation, the sample to be tested will experience different illumination angles and be exposed to different illumination conditions. The detection device 30 can be further used to measure the energy change information of the transmitted light passing through different exposure areas of the sample to be tested with the rotation angle during the rotation of the sample to be tested.

[0041] The test system disclosed by the embodiments of the present application has the following beneficial effects: by fixing the light source incidence angle of the light source device 10, combining the rotation control of the rotating mechanism 23 and the lifting control of the lifting mechanism 22 in the sample adjusting device 20, the measurement of the transmitted light of different exposure regions of the to-be-tested sample can be realized without adjusting the light source incidence angle of the light source device 10, the adjustment time and operation complexity of the light source device 10 are reduced, and the test efficiency is greatly improved. In addition, the coaxial design of the lifting mechanism 22 and the rotating mechanism 23 in the sample adjusting device 20 ensures the accuracy of the position change of the to-be-tested sample during rotation and lifting. By controlling the rotation of the rotating mechanism 23 to drive the rotation of the to-be-tested sample, the change requirement of the incidence light angle of the to-be-tested sample during the test can be met. Compared with the related art of changing the incidence light angle of the light source device 10, the method can avoid the measurement deviation caused by the change of the incidence light angle in the related art, ensure the high precision of the test data, and provide stable data support for the accurate calculation of the subsequent shrinkage rate.

[0042] Optionally, as shown in Figure 1 The light source device 10 includes a laser 11, a beam splitter 12, a first shutter 131, a second shutter 132, a first mirror 141, and a second mirror 142. The laser 11 is configured to emit a test light beam and an exposure light beam. The beam splitter 12 is configured to split the exposure light beam into a first exposure light beam and a second exposure light beam, thereby providing independent exposure light beams for different exposure regions, for example, providing the first exposure light beam for the first exposure region 221 and the second exposure light beam for the second exposure region 222. The first shutter 131 is configured to adjust the exposure time of the first exposure light beam. The second shutter 132 is configured to adjust the exposure time of the second exposure light beam. By adjusting the opening time of the first shutter 131 or the opening time of the second shutter 132, the exposure time of the corresponding exposure light beam can be controlled, thereby achieving control of the exposure dose. The first exposure light beam is incident on the first mirror 141 through the first shutter 131, and the second exposure light beam is incident on the second mirror 142 through the second shutter 132. The first mirror 141 and the second mirror 142 are configured to irradiate the first exposure light beam and the second exposure light beam on the to-be-tested sample, thereby controlling the path of the exposure light beam and ensuring that different exposure regions of the to-be-tested sample can be accurately irradiated.

[0043] The light source device 10 integrates the laser 11, the beam splitter 12, the first shutter 131, the second shutter 132, the first mirror 141, and the second mirror 142 to achieve precise control of the exposure light beam. By adjusting the exposure time and the irradiation position of the exposure light beam, the to-be-tested sample can be exposed according to the corresponding exposure dose in different exposure regions, making the measurement result more accurate and reliable.

[0044] Optionally, after the sample to be tested has been exposed, either shutter can be controlled to close, for example, the first shutter 131 or the second shutter 132 can be controlled to close. This application will use the control of the second shutter 132 to close as an example. Controlling the second shutter 132 to close and controlling the first shutter 131 to open can avoid the waste of test beam energy and avoid the problem of optical interference or signal confusion caused by the test beam simultaneously illuminating the sample to be tested or the detection device 30 from multiple optical paths.

[0045] Optionally, different exposure doses include different exposure times and / or different exposure energies; different exposure doses are obtained by controlling the exposure times of the first shutter 131 and the second shutter 132, or by controlling the exposure energy of the exposure beam emitted by the laser 11.

[0046] It should be noted that exposure dose refers to the total amount of light energy received by the sample under test per unit area. Exposure power is directly related to the energy output of the light source. With constant light power, the total energy received by the sample under test, i.e., the exposure dose, can be directly controlled by controlling the exposure time of the first shutter 131 and the second shutter 132. Furthermore, with a fixed exposure time, different exposure doses can also be obtained by changing the power of the light source (i.e., the exposure energy of the exposure beam emitted by the laser 11 per unit time).

[0047] Optionally, the testing system may also include a partition (not shown) for isolating different exposure areas of the sample under test.

[0048] For example, when exposing or testing different exposure areas of a sample, the partition can effectively block the mutual influence of the light beam between the exposure areas, and prevent cross-interference caused by scattering and reflection of the light beam on or inside the sample. This ensures that each exposure area is only irradiated by the predetermined light beam, and avoids affecting the accuracy of the test results due to optical interference.

[0049] For example, the partition may include a partition plate (such as a metal plate or a black plastic plate), a light-shielding material (such as a black light-shielding cloth), and an anti-reflective layer, etc. This application does not limit the scope of the partition, thereby achieving effective isolation of different exposure areas and improving the accuracy and reliability of test results.

[0050] Please see Figure 4 , Figure 4 This is a flowchart illustrating a testing method provided in an embodiment of this application. Figure 4 As shown, this application also provides a testing method for testing the material shrinkage rate of a sample to be tested, applied to the testing system described in any one of the embodiments of this application, including steps S11 to S15.

[0051] Step S11: Control the lifting mechanism to raise and lower the sample to be tested so that the first exposure area of ​​the sample to be tested corresponds to the first exposure beam, and control the light source device to expose the first exposure area with the first exposure beam, wherein the first exposure beam has a first exposure dose.

[0052] Step S12: Control the lifting mechanism to raise and lower the sample to be tested so that the second exposure area of ​​the sample to be tested corresponds to the second exposure beam, and control the light source device to expose the second exposure area with the second exposure beam. The second exposure beam has a second exposure dose; the first exposure dose is lower than the second exposure dose.

[0053] For example, the movement of the sample under test can be controlled by a lifting mechanism, so that the first exposure area of ​​the sample under test is precisely aligned with the first exposure beam emitted by the light source device, and the second exposure area of ​​the sample under test is precisely aligned with the second exposure beam emitted by the light source device. At the same time, the light source device emits a beam with a first exposure dose, exposing the sample under test in the first exposure area with the first exposure beam, and exposing the sample under test in the second exposure area with the second exposure beam, thereby achieving regional exposure of the sample under test.

[0054] The first exposure dose is lower than the second exposure dose, which allows for the comparison of energy changes of the sample under different exposure doses, thereby determining the material shrinkage rate of the sample.

[0055] Step S13: Control the light source device to emit the test beam and control the rotating mechanism to drive the sample to be tested to rotate.

[0056] Step S14: During the rotation of the sample to be tested, the detection device is used to measure the first energy change information corresponding to the change of the first transmitted light from the first exposure area with the rotation angle, and the second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle.

[0057] For example, a test beam is emitted by a light source device to penetrate the sample under test and probe its optical properties. The energy of the test beam is lower than the exposure dose to avoid altering the properties of the sample. A rotation mechanism causes the sample under test to rotate uniformly around its axis; this rotation allows for the detection of the sample's optical response characteristics at different angles.

[0058] For example, when the test beam penetrates the sample under test, a portion of the light is absorbed, scattered, and diffracted, while the remaining light passes through the sample as transmitted light. The transmitted light from different exposure areas has different intensities and energy distributions to reflect the optical properties of the sample. Furthermore, the detection device can detect the first transmitted light (from the first exposure area) in real time, recording its first energy change information as a function of the rotation angle, and can also detect the second transmitted light (from the second exposure area) in real time, recording its second energy change information as a function of the rotation angle.

[0059] Step S15: Determine the material shrinkage rate of the sample to be tested based on the first energy change information and the second energy change information.

[0060] For example, the first energy change information is derived from the energy change information of transmitted light in the first exposure area with rotation angle, reflecting the optical response of the sample under test at the first exposure dose, such as initial transmittance and diffraction phenomena. The second energy change information is derived from the energy change data of transmitted light in the second exposure area with rotation angle, reflecting the optical response of the sample under test at the second exposure dose, such as the decrease in transmittance caused by photopolymerization or the enhancement of light scattering and diffraction efficiency.

[0061] Since shrinkage causes changes in parameters such as refractive index and period of the sample under test, it affects the distribution characteristics of transmitted light (such as diffraction pattern or transmittance). Therefore, the magnitude of the energy change information can indirectly quantify the degree of shrinkage of the sample under test. Thus, the material shrinkage rate of the sample under test can be determined based on the first and second energy change information.

[0062] Optionally, determining the material shrinkage rate of the sample under test based on the first energy change information and the second energy change information includes: determining the first angular bandwidth peak value corresponding to the first transmitted beam based on the first energy change information; and determining the second angular bandwidth peak value corresponding to the second transmitted beam based on the second energy change information; and determining the material shrinkage rate of the sample under test based on the first angular bandwidth peak value and the second angular bandwidth peak value.

[0063] For example, by rotating the sample under test, the energy information of transmitted light as a function of angle can be obtained. For each exposure area, the energy change information of transmitted light at different rotation angles is measured using a detection device. The energy change information reflects the optical response of the sample under test beam illumination, including the intensity distribution of transmitted light. When the test beam illuminates the sample under test, the sample exhibits a diffraction effect. As the sample rotates, different diffraction angles result in different transmitted light energy distributions.

[0064] Among them, the peak value of the angular bandwidth of the transmitted beam is used to characterize the maximum peak value of the transmitted light intensity within a specific range as the angle changes, that is, the degree of energy concentration of the transmitted light within a specific angular range.

[0065] For example, by rotating the sample under test and measuring the intensity of transmitted light at different rotation angles, data on the change of transmitted light intensity with angle can be obtained, namely, first energy change information and second energy change information. By analyzing the first energy change information and the second energy change information, the maximum intensity of the corresponding transmitted light and its central angle can be determined, which is the peak value of the angular bandwidth.

[0066] Based on the above embodiments, determining the first angular bandwidth peak value corresponding to the first transmitted beam according to the first energy change information; and determining the second angular bandwidth peak value corresponding to the second transmitted beam according to the second energy change information, including: determining the first angular distribution range corresponding to the first transmitted beam according to the first energy change information, and determining the center angle corresponding to the maximum beam intensity in the first angular distribution range as the first angular bandwidth peak value; and determining the second angular distribution range corresponding to the second transmitted beam according to the second energy change information, and determining the center angle corresponding to the maximum beam intensity in the second angular distribution range as the second angular bandwidth peak value.

[0067] The first angular distribution range is the angular distribution range of the intensity change of the first transmitted beam; the second angular distribution range is the angular distribution range of the intensity change of the second transmitted beam.

[0068] For example, to determine the first angular bandwidth peak value corresponding to the first transmitted beam based on the first energy change information, it is first necessary to analyze the energy change of the first transmitted beam at different propagation angles to obtain the angular distribution range of the first transmitted beam. By measuring the transmission intensity of the first transmitted beam at different angles, the first angular distribution range in which the intensity of the first transmitted beam changes significantly can be determined. Then, from the first angular distribution range, the angle corresponding to the maximum beam intensity can be determined; this angle is the center angle of the beam, which is also the first angular bandwidth peak value. Therefore, the first angular bandwidth peak value refers to the center angle corresponding to the maximum beam intensity in the angular distribution. Similarly, the second angular bandwidth peak value corresponding to the second transmitted beam can also be determined using the above method; to avoid repetition, it will not be elaborated here.

[0069] Based on the above embodiments, the material shrinkage rate of the sample under test is determined according to the peak value of the first angular bandwidth and the peak value of the second angular bandwidth, including: obtaining the material shrinkage rate of the sample under test according to the following formula:

[0070]

[0071] in, φ0 represents the material shrinkage rate of the sample to be tested, φ0 represents the peak value of the first angular bandwidth, and φ1 represents the peak value of the second angular bandwidth.

[0072] The testing method disclosed in this application can precisely control the response of the sample under test at different exposure doses, obtaining information on the change of transmitted light energy in each exposure region with rotation angle. By combining different exposure doses of the exposure beam with the sample rotation process, a comprehensive analysis of the transmitted light of the sample under test at different rotation angles is ensured. By measuring the energy change of transmitted light from different exposure regions, the shrinkage effect of the sample under test during illumination can be effectively evaluated, thereby deriving the shrinkage rate of the sample. This method not only improves the accuracy of measurement but also enables a comprehensive performance evaluation of the sample under test under various exposure conditions, which has important practical significance for optimizing the application of photopolymer materials and recording and storing light field information.

[0073] For example, the above-described method or system can be implemented as a computer program, which can be used in, for example... Figure 5 It runs on the computer device shown.

[0074] Please see Figure 5 , Figure 5 This is a schematic diagram of a computer device provided in an embodiment of this application. The computer device may be a server.

[0075] like Figure 5 As shown, the computer device 400 includes a processor 401, a memory 402, and a network interface connected via a system bus. The memory 402 may include volatile storage media, non-volatile storage media, and internal memory.

[0076] The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions that, when executed, cause the processor 401 to perform any test method.

[0077] The processor 401 provides computing and control capabilities to support the operation of the entire computer device 400.

[0078] Internal memory provides an environment for the execution of computer programs stored in non-volatile storage media. When the computer program is executed by the processor, it enables the processor to perform any test method.

[0079] This network interface is used for network communication, such as sending assigned tasks. Those skilled in the art will understand that the structure of this computer device is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device 400 to which the present application is applied. A specific computer device 400 may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0080] It should be understood that processor 401 can be a Central Processing Unit (CPU), but it can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among these, the general-purpose processor can be a microprocessor or any conventional processor.

[0081] In some embodiments, the processor 401 is used to run a computer program stored in a memory to perform the following steps: controlling the lifting mechanism to raise and lower the sample under test so that the first exposure area of ​​the sample under test corresponds to a first exposure beam, and controlling the light source device to expose the first exposure area with the first exposure beam, the first exposure beam having a first exposure dose; controlling the lifting mechanism to raise and lower the sample under test so that the second exposure area of ​​the sample under test corresponds to a second exposure beam, and controlling the light source device to expose the second exposure area with the second exposure beam, the second exposure beam having a second exposure dose; the first exposure dose being lower than the second exposure dose; controlling the light source device to emit the test beam, and controlling the rotation mechanism to rotate the sample under test; during the rotation of the sample under test, using the detection device to measure the first energy change information corresponding to the change of the first transmitted light from the first exposure area with the rotation angle, and the second energy change information corresponding to the change of the energy of the second transmitted light from the second exposure area with the rotation angle; determining the material shrinkage rate of the sample under test based on the first energy change information and the second energy change information.

[0082] In some embodiments, the processor 401 is further configured to determine a first angular bandwidth peak value corresponding to the first transmitted beam based on the first energy change information; and to determine a second angular bandwidth peak value corresponding to the second transmitted beam based on the second energy change information; and to determine the material shrinkage rate of the sample under test based on the first angular bandwidth peak value and the second angular bandwidth peak value.

[0083] In some embodiments, the processor 401 is further configured to determine a first angular distribution range corresponding to the first transmitted beam based on the first energy change information, and determine the center angle corresponding to the maximum beam intensity in the first angular distribution range as the first angular bandwidth peak value; and to determine a second angular distribution range corresponding to the second transmitted beam based on the second energy change information, and determine the center angle corresponding to the maximum beam intensity in the second angular distribution range as the second angular bandwidth peak value.

[0084] In some embodiments, the processor 401 is further configured to obtain the material shrinkage rate of the sample under test according to the following formula:

[0085]

[0086] in, φ0 represents the material shrinkage rate of the sample to be tested, φ1 represents the peak value of the first angular bandwidth, and φ1 represents the peak value of the second angular bandwidth.

[0087] This application also provides a computer-readable storage medium storing a computer program, the computer program including program instructions, which, when executed, implement any of the testing methods provided in this application.

[0088] The computer-readable storage medium may be an internal storage unit of the computer device described in the foregoing embodiments, such as the hard disk or memory of the computer device. The computer-readable storage medium may also be an external storage device of the computer device, such as a plug-in hard disk, SmartMedia Card (SMC), Secure Digital (SD) card, or Flash Card equipped on the computer device.

[0089] Furthermore, the computer-readable storage medium may primarily include a program storage area and a data storage area, wherein the program storage area may store the operating system, at least one application program required for a function, etc.

[0090] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this application, and these modifications or substitutions should all be covered within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A test system, characterized by, A test system for testing material shrinkage of a sample to be tested, the test system comprising: a light source device configured to emit a test light beam and exposure light beams having different exposure doses; a sample adjusting device comprising a sample placement table configured to place the sample to be tested, a lifting mechanism, and a rotating mechanism, a lifting shaft of the lifting mechanism and a rotating shaft of the rotating mechanism being coaxial, the sample placement table being connected to the lifting mechanism or the rotating mechanism, the lifting mechanism being configured to lift the sample to be tested to adjust an exposure position, the rotating mechanism being configured to rotate the sample to be tested; a detection device configured to detect transmitted light passing through the sample to be tested; a control device communicatively connected to the sample adjusting device, the light source device, and the detection device; wherein the control device is configured to control the lifting mechanism to lift the sample to be tested such that different exposure regions of the sample to be tested correspond to the exposure light beams having different exposure doses, and the control device is configured to control the rotating mechanism to rotate the sample to be tested, and the detection device is configured to measure energy variation information of the transmitted light passing through the different exposure regions of the sample to be tested with respect to a rotation angle during the rotation of the sample.

2. The test system of claim 1, wherein, The light source device comprises: a laser configured to emit the test light beam and the exposure light beams; a beam splitter configured to split the exposure light beams into a first exposure light beam and a second exposure light beam; a first shutter configured to adjust an exposure time of the first exposure light beam, and a second shutter configured to adjust an exposure time of the second exposure light beam; a first mirror and a second mirror, the first exposure light beam is incident to the first mirror through the first shutter, and the second exposure light beam is incident to the second mirror through the second shutter, the first mirror and the second mirror are configured to irradiate the first exposure light beam and the second exposure light beam on the sample to be tested.

3. The test system of claim 2, wherein, The different exposure doses include different exposure times and / or different exposure energies, the different exposure doses are obtained by controlling the exposure times of the first shutter and the second shutter, or by controlling the exposure energies of the exposure light beams emitted by the laser.

4. The test system of claim 1, wherein, The test system further comprises a partitioning member configured to partition the different exposure regions of the sample to be tested.

5. A test method characterized by, A test method for testing material shrinkage of a sample to be tested, the test method being applied to the test system of any one of claims 1-4, the test method comprising: controlling the lifting mechanism to lift the sample to be tested such that a first exposure region of the sample to be tested corresponds to a first exposure light beam, and controlling the light source device to expose the first exposure region with the first exposure light beam, the first exposure light beam having a first exposure dose; controlling the lifting mechanism to lift the sample to be tested such that a second exposure region of the sample to be tested corresponds to a second exposure light beam, and controlling the light source device to expose the second exposure region with the second exposure light beam, the second exposure light beam having a second exposure dose, the first exposure dose being lower than the second exposure dose; controlling the light source device to emit the test light beam, and controlling the rotating mechanism to rotate the sample to be tested; during the rotation of the sample to be tested, obtaining first energy variation information corresponding to a variation of a first transmitted light from the first exposure area with respect to a rotation angle, and second energy variation information corresponding to a variation of a second transmitted light from the second exposure area with respect to the rotation angle; determining a material shrinkage rate of the sample to be tested according to the first energy variation information and the second energy variation information.

6. The test method of claim 5, wherein, The determining of the material shrinkage rate of the sample to be tested according to the first energy variation information and the second energy variation information comprises: determining a first angular bandwidth peak value corresponding to the first transmitted light beam according to the first energy variation information, and determining a second angular bandwidth peak value corresponding to the second transmitted light beam according to the second energy variation information; determining the material shrinkage rate of the sample to be tested according to the first angular bandwidth peak value and the second angular bandwidth peak value.

7. The method of claim 6, wherein, The determining of the first angular bandwidth peak value corresponding to the first transmitted light beam according to the first energy variation information, and the determining of the second angular bandwidth peak value corresponding to the second transmitted light beam according to the second energy variation information comprises: determining a first angular distribution range corresponding to the first transmitted light beam according to the first energy variation information, determining a central angle corresponding to a maximum light beam intensity in the first angular distribution range as the first angular bandwidth peak value, and determining a second angular distribution range corresponding to the second transmitted light beam according to the second energy variation information, and determining a central angle corresponding to a maximum light beam intensity in the second angular distribution range as the second angular bandwidth peak value.

8. The test method of claim 6, wherein, The determining of the material shrinkage rate of the sample to be tested according to the first angular bandwidth peak value and the second angular bandwidth peak value comprises: obtaining the material shrinkage rate of the sample to be tested according to the following formula: wherein, is the material shrinkage of the sample under test, φ0is the first angular bandwidth peak value, and φ1is the second angular bandwidth peak value.

9. A computer device, comprising: comprises: a memory and a processor; wherein the memory is connected with the processor, and is used for storing programs; the processor is used for realizing steps of the test method as claimed in any one of claims 5-8 by running the programs stored in the memory.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, and the computer program is executed by the processor to make the processor realize steps of the test method as claimed in any one of claims 5-8.

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