Equipment testing method and device, electronic equipment and storage medium

Abstract

The invention relates to an equipment testing method and device, electronic equipment and a storage medium, and the method comprises the steps: obtaining a magnetic attraction force threshold value between an accessory of tested equipment and an equipment main body, and enabling the accessory and the equipment main body to be connected with each other at least through the magnetic attraction force; the magnetic attraction force threshold value is used for indicating the minimum acting force for separating the accessory from the equipment main body; a magnetic attraction index is determined according to the magnetic attraction force threshold value, and the magnetic attraction index is used for indicating the firmness degree of connection between the accessory and the equipment body.

Description

Technical Field

[0001] The present disclosure relates to the technical field of equipment testing, and in particular to an equipment testing method, device, electronic equipment and storage medium. Background Art

[0002] In recent years, there are more and more types of small household appliances such as razors, and their structures and functions have also made great progress. For example, the blade cover and the blade of the razor can be connected not by the traditional snap-on method, but by a method such as magnetic suction that has a longer service life. However, in the related art, there is no test method for the strength of the connection of new connection methods such as magnetic suction used in small household appliances during production, resulting in poor product quality control, such as large differences in the strength of the connection. Summary of the invention

[0003] In order to overcome the problems existing in the related art, the embodiments of the present disclosure provide a device testing method, an apparatus, an electronic device and a storage medium to solve the defects in the related art.

[0004] According to a first aspect of an embodiment of the present disclosure, a device testing method is provided, the method comprising:

[0005] Obtaining a magnetic attraction force threshold between an accessory and a device body of the device under test, wherein the accessory and the device body are connected to each other at least by magnetic attraction, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body;

[0006] A magnetic attraction index is determined according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

[0007] In one embodiment of the present disclosure, the magnetic attraction force threshold is obtained in the following manner:

[0008] Applying a force in a direction away from the device body to at least one traction device connected to the accessory, and gradually increasing the magnitude of the force;

[0009] In response to the accessory being separated from the device body, the magnitude of the applied force is determined as the magnetic attraction force threshold.

[0010] In one embodiment of the present disclosure, when the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory;

[0011] In the case where the accessory is connected to a plurality of traction devices, the plurality of traction devices are evenly arranged around the axis of the accessory;

[0012] The axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

[0013] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; the at least one traction device corresponds one-to-one to the at least one magnetic attraction position, and each traction device is connected to the corresponding magnetic attraction position.

[0014] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member and a magnetically attracted member, and the magnetic attraction member and the magnetically attracted member are respectively arranged on the accessory and the device body;

[0015] Determining the magnetic attraction index according to the magnetic attraction force threshold comprises:

[0016] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, and the magnetic force of the magnetic attraction component.

[0017] In one embodiment of the present disclosure, determining the magnetic attraction index according to the magnetic attraction force threshold comprises:

[0018] The magnetic attraction index is determined according to the magnetic attraction force threshold and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0019] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member provided on the accessory and a magnetically attracted member provided on the device body, or a magnetically attracted member provided on the accessory and a magnetically attracted member provided on the device body;

[0020] Determining the magnetic attraction index according to the magnetic attraction force threshold comprises:

[0021] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, the magnetic force of the magnetic attraction component, and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0022] In one embodiment of the present disclosure, the device includes a shaver, and the accessory includes a cutter head cover or a cutter head as a whole;

[0023] At least one force applied to the accessory in the device usage scenario includes facial pressure and facial friction applied to the blade cover or the blade as a whole.

[0024] In one embodiment of the present disclosure, the method further includes:

[0025] The device test result is determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

[0026] In one embodiment of the present disclosure, the detection result of the device in the preset detection scenario includes: whether the accessory is separated from the device body when the device lands in a standard landing posture, whether the accessory is separated from the device body when the accessory is disassembled in a standard disassembly posture and with a standard disassembly force;

[0027] The determining of the device test result according to the magnetic attraction index and the detection result of the device in a preset detection scenario includes at least one of the following:

[0028] In response to satisfying the following conditions, the device test result is determined to be qualified:

[0029] The magnetic attraction index meets the preset requirements;

[0030] The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and

[0031] When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device;

[0032] In response to at least one of the following conditions being met, determining that the device test result is unqualified:

[0033] The magnetic attraction index does not meet the preset requirements;

[0034] The accessory is separated from the main body of the device when the device falls to the ground in a standard landing posture; or

[0035] When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device;

[0036] When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

[0037] In one embodiment of the present disclosure, when the accessory is disassembled with a standard disassembly posture and a standard disassembly force, the accessory is separated from the device body, including:

[0038] When the accessory is removed using the standard disassembly posture and standard disassembly force, the accessory is separated from the device main body, and when the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is not separated from the device main body.

[0039] According to a second aspect of an embodiment of the present disclosure, there is provided a device testing apparatus, the apparatus comprising:

[0040] an acquisition module, used to acquire a magnetic attraction force threshold between an accessory and a device body of the device under test, wherein the accessory and the device body are connected to each other at least by magnetic attraction, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body;

[0041] An index module is used to determine a magnetic attraction index according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

[0042] In one embodiment of the present disclosure, the magnetic attraction force threshold is obtained in the following manner:

[0043] Applying a force in a direction away from the device body to at least one traction device connected to the accessory, and gradually increasing the magnitude of the force;

[0044] In response to the accessory being separated from the device body, the magnitude of the applied force is determined as the magnetic attraction force threshold.

[0045] In one embodiment of the present disclosure, when the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory;

[0046] In the case where the accessory is connected to a plurality of traction devices, the plurality of traction devices are evenly arranged around the axis of the accessory;

[0047] The axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

[0048] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; the at least one traction device corresponds one-to-one to the at least one magnetic attraction position, and each traction device is connected to the corresponding magnetic attraction position.

[0049] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member and a magnetically attracted member, and the magnetic attraction member and the magnetically attracted member are respectively arranged on the accessory and the device body;

[0050] The index module is used to:

[0051] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, and the magnetic force of the magnetic attraction component.

[0052] In one embodiment of the present disclosure, the index module is used to:

[0053] The magnetic attraction index is determined according to the magnetic attraction force threshold and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0054] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member provided on the accessory and a magnetically attracted member provided on the device body, or a magnetically attracted member provided on the accessory and a magnetically attracted member provided on the device body;

[0055] The index module is used to:

[0056] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, the magnetic force of the magnetic attraction component, and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0057] In one embodiment of the present disclosure, the device includes a shaver, and the accessory includes a cutter head cover or a cutter head as a whole;

[0058] At least one force applied to the accessory in the device usage scenario includes facial pressure and facial friction applied to the blade cover or the blade as a whole.

[0059] In one embodiment of the present disclosure, the device further includes a testing module, which is used to:

[0060] The device test result is determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

[0061] In one embodiment of the present disclosure, the detection result of the device in the preset detection scenario includes: whether the accessory is separated from the device body when the device lands in a standard landing posture, whether the accessory is separated from the device body when the accessory is disassembled in a standard disassembly posture and with a standard disassembly force;

[0062] The test module is used for at least one of the following:

[0063] In response to satisfying the following conditions, the device test result is determined to be qualified:

[0064] The magnetic attraction index meets the preset requirements;

[0065] The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and

[0066] When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device;

[0067] In response to at least one of the following conditions being met, determining that the device test result is unqualified:

[0068] The magnetic attraction index does not meet the preset requirements;

[0069] The accessory is separated from the main body of the device when the device is landed in a standard landing posture; or,

[0070] When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device;

[0071] When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

[0072] In one embodiment of the present disclosure, when the accessory is disassembled with a standard disassembly posture and a standard disassembly force, the accessory is separated from the device body, including:

[0073] When the accessory is removed using the standard disassembly posture and standard disassembly force, the accessory is separated from the device main body, and when the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is not separated from the device main body.

[0074] According to a third aspect of an embodiment of the present disclosure, an electronic device is provided, comprising a memory and a processor, wherein the memory is used to store computer instructions executable on the processor, and the processor is used to implement the device testing method described in the first aspect when executing the computer instructions.

[0075] According to a fourth aspect of an embodiment of the present disclosure, a computer-readable storage medium is provided, on which a computer program is stored, and when the program is executed by a processor, the method described in the first aspect is implemented.

[0076] The technical solution provided by the embodiments of the present disclosure may have the following beneficial effects:

[0077] The device testing method provided in the embodiment of the present disclosure can achieve an objective measurement of the connection strength between the accessory and the device body by obtaining the magnetic attraction force threshold between the accessory and the device body of the device under test and determining the magnetic attraction index based on the magnetic attraction force threshold. That is, the connection strength between the accessory and the device body is objectively measured by the magnetic attraction index. Furthermore, the device quality control can be improved based on this objective measurement during the device production process, so that the connection strength between the accessory and the device body in different devices is consistent and meets the requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0078] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0079] Figure 1 is a flow chart of a device testing method shown in an exemplary embodiment of the present disclosure;

[0080] Figure 2is a structural schematic diagram of a device testing apparatus shown in an exemplary embodiment of the present disclosure;

[0081] Figure 3 It is a structural block diagram of an electronic device shown in an exemplary embodiment of the present disclosure. DETAILED DESCRIPTION

[0082] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. Instead, they are merely examples of devices and methods consistent with some aspects of the present disclosure as detailed in the appended claims.

[0083] The terms used in this disclosure are for the purpose of describing specific embodiments only and are not intended to limit the disclosure. The singular forms of "a", "said" and "the" used in this disclosure and the appended claims are also intended to include plural forms unless the context clearly indicates otherwise. It should also be understood that the term "and / or" used herein refers to and includes any or all possible combinations of one or more associated listed items.

[0084] It should be understood that although the terms first, second, third, etc. may be used in the present disclosure to describe various information, such information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present disclosure, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0085] In recent years, there are more and more types of small household appliances such as razors, and their structures and functions have also made great progress. For example, the blade cover of the razor can be connected to the blade head as a whole without the traditional buckle, but with a magnetic suction method that has a longer service life. However, after using the razor, the blade cover needs to be opened to clean the beard. Therefore, the firmness of fixing the blade cover to the blade head is very important to the experience of shaving and cleaning.

[0086] In the related art, there is no test method for the connection firmness of new connection forms such as magnetic suction used in small household appliances during production, resulting in poor product quality control, such as large differences in the connection firmness.

[0087] Based on this, on the first aspect, at least one embodiment of the present disclosure provides a device testing method, wherein the method can be used to test the connection strength between accessories and the device body through magnetic attraction in small household appliances such as shavers, thereby improving quality control during the device production process, so that the connection strength between accessories and the device body connected to each other by magnetic attraction in the same batch of production is consistent and meets the requirements.

[0088] Please refer to the attached Figure 1 , which shows the process of the method, including step S101 to step S102.

[0089] In step S101, a magnetic attraction force threshold between an accessory and a device body of the device under test is obtained, wherein the accessory and the device body are connected to each other at least by magnetic attraction, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body.

[0090] That is, if a force greater than or equal to the magnetic attraction threshold is applied to the accessory or the device body, the accessory can be separated from the device body, but if a force less than the magnetic attraction threshold is applied to the accessory and the device body, the accessory cannot be separated from the device body.

[0091] There is at least one magnetic attraction position between the accessory and the device body, and the magnetic attraction position of the accessory is arranged corresponding to the magnetic attraction position of the device body, and the magnetic attraction member and the magnetically attracted member are arranged in pairs at the corresponding magnetic attraction positions of the accessory and the device body. For example, in one embodiment, the magnetic attraction member can be arranged at the magnetic attraction position of the accessory, and the magnetically attracted member can be arranged at the magnetic attraction position of the device body. In another embodiment, in one embodiment, the magnetically attracted member can be arranged at the magnetic attraction position of the accessory, and the magnetic attraction member can be arranged at the magnetic attraction position of the device body. For example, the magnetic attraction member is a magnet, and the magnetically attracted member is metal iron. Preferably, the at least one magnetic attraction position is evenly distributed around the axis of the accessory, the axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

[0092] It can be understood that when the accessory is placed on the device body according to the matching relationship of the magnetic positions, the magnetically attracted component and the magnetic component at each magnetic position are attracted to each other through magnetic force, thereby connecting the accessory and the device body as one.

[0093] The accessories may be covers of small household appliances and other accessories, and the disassembly process of these accessories requires less force. For example, in the case where the device under test is a razor, the accessories may be a blade cover or a blade as a whole. The blade head of the current razor as a whole includes at least one cutting blade, so at least one magnetic suction position corresponding to the at least one cutting blade may be provided. For example, if the blade head of the razor as a whole includes three cutting blades, a magnetic suction position may be provided on the outside of each cutting blade. Of course, it should be understood that the magnetic suction position may correspond one-to-one to the number of cutting blades, but this is not restrictive, and the magnetic suction position may be arranged as needed.

[0094] In a possible embodiment of the present disclosure, the magnetic attraction force can be obtained by a traction device connected to the accessory. Specifically, this step can be performed in the following manner:

[0095] First, a force is applied to at least one traction device connected to the accessory in a direction away from the device body, and the magnitude of the force is gradually increased. For example, a traction device is stretched toward the device body using a tensile force gauge. For example, the traction device may be a traction rope, etc.

[0096] Preferably, the at least one traction device corresponds to the at least one magnetic attraction position one by one, and each traction device is connected to a corresponding magnetic attraction position. Of course, the traction devices can be arranged independently of the number of magnetic attraction positions.

[0097] Exemplarily, when the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory, that is, the traction device is connected to the center of the accessory and extends along its axis.

[0098] In another exemplary embodiment, when the accessory is connected to multiple traction devices, the multiple traction devices are evenly arranged around the axis of the accessory. That is, the multiple traction devices are respectively connected to different positions of the accessory, and the ends of the multiple traction devices away from the accessory converge at a certain point on the axis of the accessory, so that the multiple traction devices form a triangle (in the case of two traction devices) or a pyramid (in the case of three or more traction devices).

[0099] Next, in response to the accessory being separated from the device body, the magnitude of the force is determined as the magnetic attraction force threshold.

[0100] Thereby, the minimum force for separating the accessory from the device body is captured.

[0101] In step S102, a magnetic attraction index is determined according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

[0102] Exemplarily, the magnetic attraction index may be determined in any of the following four optional ways:

[0103] Option 1: Using the magnetic attraction force threshold as the magnetic attraction index. That is:

[0104] In the above formula, M is the magnetic attraction index and L is the magnetic attraction threshold.

[0105] In other words, the measured magnetic attraction force threshold can be directly used as a magnetic attraction index to evaluate the firmness of the connection between the accessory and the device body.

[0106] Option 2: Determine the magnetic attraction index according to the magnetic attraction force threshold, the number of magnetic attraction positions and the magnetic force of the magnetic attraction component. For example, the magnetic attraction index M is determined according to the following formula:

[0107]

[0108] In the above formula, C is the magnetic force of the magnetic attraction component, N is the number of magnetic attraction positions, and L is the magnetic attraction force threshold.

[0109] It should be understood that the magnetic attraction index can also be related to the magnetic attraction position and the number of magnetic attraction parts / magnetized parts and the magnetic force. If the magnetic attraction part is a magnet with a strong magnetic force, a larger force is required to separate the magnetic attraction part and the magnetized part. Conversely, a smaller force can be used. In addition, if there are more magnetic attraction parts, a larger force is required.

[0110] Option 3: Determine the magnetic attraction index based on the magnetic attraction force threshold and the standard amount of at least one force applied to the accessory in the device usage scenario. For example, when the device under test is a shaver, the magnetic attraction index M can be determined according to the following formula:

[0111]

[0112] In the above formula, L is the magnetic attraction force threshold, and F and G are the facial pressure and facial friction force exerted on the cutter head cover or the cutter head as a whole, respectively.

[0113] It should be understood that different usage scenarios will bring corresponding forces to the accessories to be tested and the device body. For example, when a user uses a razor, the blade cover or the razor will be subjected to facial pressure or skin friction because the user slides / pushes the razor on the face. Accordingly, when testing the force that separates the accessory and the device body, the influence of this pressure or friction should also be considered. The facial pressure and facial friction exerted on the blade cover or the blade head as a whole can be collected under standard test scenarios. For example, a standard shaving simulation device can be configured, which includes at least a mechanical arm and a shaving surface in the shape of a human face. The end of the mechanical arm can fix the razor, and there are multiple force sensors on the shaving surface. The device can control the mechanical arm to operate the razor to imitate the shaving operation on the shaving surface. At the same time, the force sensor on the shaving surface can collect various forces during the shaving process, such as the facial pressure and facial friction exerted on the blade cover or the blade head as a whole. For another example, different types of testers can be selected for force collection. The testers wear masks with multiple force sensors on their faces. The testers use razors on the masks to shave according to their shaving habits. At the same time, the force sensors on the mask can collect various forces during the shaving process, such as the facial pressure and facial friction exerted on the blade cover or the blade head as a whole. Furthermore, the average value of the forces collected by these testers can be used as the collection result of various forces.

[0114] Option 4: Determine the magnetic attraction index based on the magnetic attraction force threshold, the number of magnetic attraction positions, the magnetic force of the magnetic attraction component, and the standard amount of at least one force applied to the accessory in the device usage scenario. For example, when the device under test is a shaver, the magnetic attraction index M can be determined according to the following formula:

[0115]

[0116] In the above formula, L is the magnetic attraction force threshold, C is the magnetic force of the magnetic attraction component, N is the number of magnetic attraction positions, and F and G are the facial pressure and facial friction force exerted on the blade cover or the blade as a whole, respectively.

[0117] It is understandable that the standard amount of at least one force to which the accessory is subjected in the device use scenario involved in the above-mentioned optional method 3 and optional method 4 is at least one force to which the accessory is subjected in the device use scenario collected according to the standard amount collection standard of the device. For example, in the case where the accessory includes a razor, and the accessory includes a blade cover or a blade as a whole, the robot arm can manipulate the razor to perform standard force shaving on a person's face, and collect the facial pressure and facial friction on the person's face as the standard amount of force to which the blade as a whole or the blade cover is subjected in the device use scenario.

[0118] Furthermore, the device test result may be determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

[0119] For example, the detection results of the device in the preset detection scenario include: whether the accessories are separated from the device body when the device falls to the ground in a standard landing posture (for example, place the razor on the table and observe whether its blade cover or the entire blade is separated from the device body), whether the accessories are separated from the device body when the accessories are disassembled in a standard disassembly posture and with a standard disassembly force (for example, apply a preset force away from the device body along the axial direction of the entire blade or the blade cover, and observe whether the blade cover or the entire blade is separated from the device body). The device test results can be determined in the following way:

[0120] In response to satisfying the following conditions, the device test result is determined to be qualified:

[0121] The magnetic attraction index meets the preset requirements;

[0122] The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and

[0123] When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device;

[0124] In response to at least one of the following conditions being met, determining that the device test result is unqualified:

[0125] The magnetic attraction index does not meet the preset requirements;

[0126] The accessory is separated from the main body of the device when the device is landed in a standard landing posture; or,

[0127] When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device;

[0128] When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

[0129] Among them, the above-mentioned separation of the accessory from the device main body when the accessory is disassembled with the standard disassembly posture and standard disassembly force may include: the accessory is separated from the device main body when the accessory is disassembled with the standard disassembly posture and standard disassembly force, and the accessory is not separated from the device main body when the accessory is disassembled with the standard disassembly posture and a force lower than the standard disassembly force (that is, the accessory can be disassembled with the standard force, and the accessory cannot be disassembled with a force lower than the standard force).

[0130] The evaluation criteria reflected in the above test are: if the accessories are easy to disassemble, the connection strength is unqualified; if the accessories are difficult to disassemble, the connection strength is unqualified; if the accessories can be disassembled within a certain range, the connection strength is qualified.

[0131] The device testing method provided in the embodiment of the present disclosure can achieve an objective measurement of the connection strength between the accessory and the device body by obtaining the magnetic attraction force threshold between the accessory and the device body of the device under test and determining the magnetic attraction index based on the magnetic attraction force threshold, that is, objectively measuring the connection strength between the accessory and the device body by the magnetic attraction index; furthermore, a test specification can be provided based on the objective measurement method, and the test specification can be used to improve the equipment quality control during the equipment production process, so that the connection strength between the accessory and the device body in different devices is consistent and meets the requirements.

[0132] By determining the magnetic attraction index, the degree of connection between the accessory and the device body can be quantified, so that the advantages and disadvantages of the magnetic attraction capabilities of different products can be quickly found, such as identifying the difference in magnetic attraction capabilities with competing products; and then the product process can be guided from the product pre-research stage to the production and listing stage, so that each product iteration forms an effective closed loop. This quantitative evaluation method can improve equipment testing efficiency and save testing costs.

[0133] According to a second aspect of the present disclosure, a device testing apparatus is provided. Figure 2 , the device comprises:

[0134] An acquisition module 201 is used to acquire a magnetic attraction force threshold between an accessory and a device body of a tested device, wherein the accessory and the device body are connected to each other at least by magnetic attraction force, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body;

[0135] The index module 202 is used to determine a magnetic attraction index according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

[0136] In one embodiment of the present disclosure, the magnetic attraction force threshold is obtained in the following manner:

[0137] Applying a force in a direction away from the device body to at least one traction device connected to the accessory, and gradually increasing the magnitude of the force;

[0138] In response to the accessory being separated from the device body, the magnitude of the applied force is determined as the magnetic attraction force threshold.

[0139] In one embodiment of the present disclosure, when the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory;

[0140] In the case where the accessory is connected to a plurality of traction devices, the plurality of traction devices are evenly arranged around the axis of the accessory;

[0141] The axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

[0142] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; the at least one traction device corresponds one-to-one to the at least one magnetic attraction position, and each traction device is connected to the corresponding magnetic attraction position.

[0143] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member and a magnetically attracted member, and the magnetic attraction member and the magnetically attracted member are respectively arranged on the accessory and the device body;

[0144] The index module is used to:

[0145] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, and the magnetic force of the magnetic attraction component.

[0146] In one embodiment of the present disclosure, the index module is used to:

[0147] The magnetic attraction index is determined according to the magnetic attraction force threshold and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0148] In one embodiment of the present disclosure, there is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member provided on the accessory and a magnetically attracted member provided on the device body, or a magnetically attracted member provided on the accessory and a magnetically attracted member provided on the device body;

[0149] The index module is used to:

[0150] The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, the magnetic force of the magnetic attraction component, and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

[0151] In one embodiment of the present disclosure, the device includes a shaver, and the accessory includes a cutter head cover or a cutter head as a whole;

[0152] At least one force applied to the accessory in the device usage scenario includes facial pressure and facial friction applied to the blade cover or the blade as a whole.

[0153] In one embodiment of the present disclosure, the device further includes a testing module, which is used to:

[0154] The device test result is determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

[0155] In one embodiment of the present disclosure, the detection result of the device in the preset detection scenario includes: whether the accessory is separated from the device body when the device lands in a standard landing posture, whether the accessory is separated from the device body when the accessory is disassembled in a standard disassembly posture and with a standard disassembly force;

[0156] The test module is used for at least one of the following:

[0157] In response to satisfying the following conditions, the device test result is determined to be qualified:

[0158] The magnetic attraction index meets the preset requirements;

[0159] The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and

[0160] When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device;

[0161] In response to at least one of the following conditions being met, determining that the device test result is unqualified:

[0162] The magnetic attraction index does not meet the preset requirements;

[0163] The accessory is separated from the main body of the device when the device is landed in a standard landing posture; or,

[0164] When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device;

[0165] When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

[0166] In one embodiment of the present disclosure, when the accessory is disassembled with a standard disassembly posture and a standard disassembly force, the accessory is separated from the device body, including:

[0167] When the accessory is removed using the standard disassembly posture and standard disassembly force, the accessory is separated from the device main body, and when the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is not separated from the device main body.

[0168] Regarding the device in the above embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment of the first aspect related to the method, and will not be elaborated here.

[0169] According to the third aspect of the embodiment of the present disclosure, please refer to the attached Figure 3, which exemplarily shows a block diagram of an electronic device. For example, the electronic device 300 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, a fitness device, a personal digital assistant, etc.

[0170] Reference Figure 3 , the electronic device 300 may include one or more of the following components: a processing component 302 , a memory 304 , a power component 306 , a multimedia component 308 , an audio component 310 , an input / output (I / O) interface 312 , a sensor component 314 , and a communication component 316 .

[0171] The processing component 302 generally controls the overall operation of the electronic device 300, such as operations associated with display, phone calls, data communications, camera operations, and recording operations. The processing component 302 may include one or more processors 320 to execute instructions to complete all or part of the steps of the above-mentioned method. In addition, the processing component 302 may include one or more modules to facilitate the interaction between the processing component 302 and other components. For example, the processing component 302 may include a multimedia module to facilitate the interaction between the multimedia component 308 and the processing component 302.

[0172] The memory 304 is configured to store various types of data to support operations on the device 300. Examples of such data include instructions for any application or method operating on the electronic device 300, contact data, phone book data, messages, pictures, videos, etc. The memory 304 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk.

[0173] The power component 306 provides power to the various components of the electronic device 300. The power component 306 may include a power management system, one or more power supplies, and other components associated with generating, managing, and distributing power to the electronic device 300.

[0174] The multimedia component 308 includes a screen that provides an output interface between the electronic device 300 and the user. In some embodiments, the screen may include a liquid crystal display (LCD) and a touch panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive input signals from the user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundaries of the touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 308 includes a front camera and / or a rear camera. When the electronic device 300 is in an operating mode, such as a shooting mode or a video mode, the front camera and / or the rear camera may receive external multimedia data. Each front camera and the rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

[0175] The audio component 310 is configured to output and / or input audio signals. For example, the audio component 310 includes a microphone (MIC), and when the electronic device 300 is in an operating mode, such as a call mode, a recording mode, and a voice recognition mode, the microphone is configured to receive an external audio signal. The received audio signal can be further stored in the memory 304 or sent via the communication component 316. In some embodiments, the audio component 310 also includes a speaker for outputting audio signals.

[0176] I / O interface 312 provides an interface between processing component 302 and peripheral interface modules, such as keyboards, click wheels, buttons, etc. These buttons may include but are not limited to: a home button, a volume button, a start button, and a lock button.

[0177] The sensor assembly 314 includes one or more sensors for providing various aspects of status assessment for the electronic device 300. For example, the sensor assembly 314 can detect the open / closed state of the electronic device 300, the relative positioning of components, such as the display and keypad of the electronic device 300, and the sensor assembly 314 can also detect the position change of the electronic device 300 or a component of the electronic device 300, the presence or absence of user contact with the electronic device 300, the orientation or acceleration / deceleration of the electronic device 300, and the temperature change of the electronic device 300. The sensor assembly 314 can also include a proximity sensor configured to detect the presence of nearby objects without any physical contact. The sensor assembly 314 can also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 314 can also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

[0178] The communication component 316 is configured to facilitate wired or wireless communication between the electronic device 300 and other devices. The electronic device 300 can access a wireless network based on a communication standard, such as WiFi, 2G or 3G, 4G or 5G or a combination thereof. In an exemplary embodiment, the communication component 316 receives a broadcast signal or broadcast-related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 316 also includes a near field communication (NFC) module to facilitate short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, infrared data association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology and other technologies.

[0179] In an exemplary embodiment, the electronic device 300 may be implemented by one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components to perform the device testing method of the above-mentioned electronic device.

[0180] In a fourth aspect, the present disclosure, in an exemplary embodiment, further provides a non-transitory computer-readable storage medium including instructions, such as a memory 304 including instructions, and the instructions can be executed by a processor 320 of an electronic device 300 to complete the device testing method of the electronic device. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.

[0181] Those skilled in the art will readily appreciate other embodiments of the present disclosure after considering the specification and practicing the disclosure disclosed herein. The present disclosure is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include common knowledge or customary techniques in the art that are not disclosed in the present disclosure. The description and examples are to be considered exemplary only, and the true scope and spirit of the present disclosure are indicated by the following claims.

[0182] It should be understood that the present disclosure is not limited to the exact structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims

1. A device testing method, characterized in that: The method comprises: Obtaining a magnetic attraction force threshold between an accessory and a device body of the device under test, wherein the accessory and the device body are connected to each other at least by magnetic attraction, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body; A magnetic attraction index is determined according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

2. The device testing method according to claim 1, characterized in that: The magnetic attraction threshold is obtained in the following manner: Applying a force in a direction away from the device body to at least one traction device connected to the accessory, and gradually increasing the magnitude of the force; In response to the accessory being separated from the device body, the magnitude of the applied force is determined as the magnetic attraction force threshold.

3. The device testing method according to claim 2, characterized in that: In the case where the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory; In the case where the accessory is connected to a plurality of traction devices, the plurality of traction devices are evenly arranged around the axis of the accessory; The axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

4. The device testing method according to claim 2, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; the at least one traction device corresponds to the at least one magnetic attraction position one by one, and each traction device is connected to the corresponding magnetic attraction position.

5. The device testing method according to claim 2, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member and a magnetically attracted member, and the magnetic attraction member and the magnetically attracted member are respectively arranged on the accessory and the device body; The determining of the magnetic attraction index according to the magnetic attraction force threshold comprises: The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, and the magnetic force of the magnetic attraction component.

6. The device testing method according to claim 2, characterized in that: The determining of the magnetic attraction index according to the magnetic attraction force threshold comprises: The magnetic attraction index is determined according to the magnetic attraction force threshold and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

7. The device testing method according to claim 2, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction part provided on the accessory and a magnetically attracted part provided on the device body, or a magnetically attracted part provided on the accessory and a magnetic attraction part provided on the device body; The determining of the magnetic attraction index according to the magnetic attraction force threshold comprises: The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, the magnetic force of the magnetic attraction component, and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

8. The device testing method according to claim 6 or 7, characterized in that: The device includes a shaver, and the accessories include a cutter head cover or a cutter head as a whole; The at least one force to which the accessory is subjected in the device usage scenario includes facial pressure and facial friction force exerted on the blade cover or the blade as a whole.

9. The device testing method according to claim 1, characterized in that: The method further comprises: The device test result is determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

10. The device testing method according to claim 9, characterized in that: The detection results of the device in the preset detection scenario include: whether the accessories are separated from the device body when the device is landed in a standard landing posture, and whether the accessories are separated from the device body when the accessories are disassembled in a standard disassembly posture and with a standard disassembly force; The determining of the device test result according to the magnetic attraction index and the detection result of the device in a preset detection scenario includes at least one of the following: In response to satisfying the following conditions, the device test result is determined to be qualified: The magnetic attraction index meets the preset requirements; The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device; In response to at least one of the following conditions being met, determining that the device test result is unqualified: The magnetic attraction index does not meet the preset requirements; The accessory is separated from the main body of the device when the device falls to the ground in a standard landing posture; or When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device; When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

11. The device testing method according to claim 10, characterized in that: When the accessory is disassembled with the standard disassembly posture and standard disassembly force, the accessory is separated from the device body, including: When the accessory is removed using the standard disassembly posture and standard disassembly force, the accessory is separated from the device main body, and when the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is not separated from the device main body.

12. A device testing apparatus, characterized in that: The device comprises: an acquisition module, used to acquire a magnetic attraction force threshold between an accessory and a device body of the device under test, wherein the accessory and the device body are connected to each other at least by magnetic attraction, and the magnetic attraction force threshold is used to indicate a minimum force for separating the accessory from the device body; An index module is used to determine a magnetic attraction index according to the magnetic attraction force threshold, wherein the magnetic attraction index is used to indicate the firmness of the connection between the accessory and the device body.

13. The equipment testing device according to claim 12, characterized in that: The magnetic attraction threshold is obtained in the following manner: Applying a force in a direction away from the device body to at least one traction device connected to the accessory, and gradually increasing the magnitude of the force; In response to the accessory being separated from the device body, the magnitude of the applied force is determined as the magnetic attraction force threshold.

14. The equipment testing device according to claim 13, characterized in that: In the case where the accessory is connected to a traction device, the traction device is arranged along the axis of the accessory; In the case where the accessory is connected to a plurality of traction devices, the plurality of traction devices are evenly arranged around the axis of the accessory; The axis of the accessory is the central symmetric axis of the accessory in the axial direction, and the axial direction of the accessory is the direction in which the accessory moves away from and approaches the device body.

15. The equipment testing device according to claim 13, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; the at least one traction device corresponds to the at least one magnetic attraction position one by one, and each traction device is connected to the corresponding magnetic attraction position.

16. The equipment testing device according to claim 13, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction member and a magnetically attracted member, and the magnetic attraction member and the magnetically attracted member are respectively arranged on the accessory and the device body; The index module is used to: The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, and the magnetic force of the magnetic attraction component.

17. The equipment testing device according to claim 13, characterized in that: The index module is used to: The magnetic attraction index is determined according to the magnetic attraction force threshold and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

18. The equipment testing device according to claim 13, characterized in that: There is at least one magnetic attraction position between the accessory and the device body; each magnetic attraction position has a magnetic attraction part provided on the accessory and a magnetically attracted part provided on the device body, or a magnetically attracted part provided on the accessory and a magnetic attraction part provided on the device body; The index module is used to: The magnetic attraction index is determined according to the magnetic attraction force threshold, the number of the magnetic attraction positions, the magnetic force of the magnetic attraction component, and a standard amount of at least one force to which the accessory is subjected in a device usage scenario.

19. The equipment testing device according to claim 17 or 18, characterized in that: The device includes a shaver, and the accessories include a cutter head cover or a cutter head as a whole; The at least one force to which the accessory is subjected in the device usage scenario includes facial pressure and facial friction force exerted on the blade cover or the blade as a whole.

20. The equipment testing device according to claim 12, characterized in that: The device also includes a testing module, which is used to: The device test result is determined according to the magnetic attraction index and the test result of the device under test in a preset test scenario.

21. The equipment testing device according to claim 20, characterized in that: The detection results of the device in the preset detection scenario include: whether the accessories are separated from the device body when the device is landed in a standard landing posture, and whether the accessories are separated from the device body when the accessories are disassembled in a standard disassembly posture and with a standard disassembly force; The test module is used for at least one of the following: In response to satisfying the following conditions, the device test result is determined to be qualified: The magnetic attraction index meets the preset requirements; The accessories are not separated from the main body of the device when the device is landed in a standard landing posture; and When the accessories are removed with standard disassembly posture and standard disassembly force, the accessories are separated from the main body of the device; In response to at least one of the following conditions being met, determining that the device test result is unqualified: The magnetic attraction index does not meet the preset requirements; The accessory is separated from the main body of the device when the device is landed in a standard landing posture; or, When removing the accessories with standard disassembly posture and standard disassembly force, the accessories are not separated from the main body of the device; When the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is separated from the device body.

22. The equipment testing device according to claim 21, characterized in that: When the accessory is disassembled with the standard disassembly posture and standard disassembly force, the accessory is separated from the device body, including: When the accessory is removed using the standard disassembly posture and standard disassembly force, the accessory is separated from the device main body, and when the accessory is removed using the standard disassembly posture and a force lower than the standard disassembly force, the accessory is not separated from the device main body.

23. An electronic device, characterized in that: The electronic device comprises a memory and a processor, wherein the memory is used to store computer instructions executable on the processor, and the processor is used to implement the device testing method according to any one of claims 1 to 11 when executing the computer instructions.

24. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the program is executed by a processor, the method according to any one of claims 1 to 11 is implemented.

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