Memory testing device and testing method

Abstract

The invention provides a memory testing device and a memory testing method, which can be applied to the technical field of testing. The memory testing device comprises a shell which comprises an upper shell and a lower shell which can be opened and closed, and the lower shell is internally provided with a memory card slot; the adjustable card slot device is movably connected with the memory card slot and is used for adjusting the size of the memory card slot so as to dynamically adapt to the physical contours of to-be-tested memories with different sizes; the conveying mechanism is arranged at a position corresponding to the memory card slot and is used for realizing positioning fit between the memory to be tested and the memory card slot; and the pressing stroke control device penetrates through the upper shell and is used for adjusting the pressing stroke of the pressing structure, so that the conductor array on the lower surface of the memory to be tested is electrically connected with the conductive contact array in the memory card slot through the pressing structure, and the memory to be tested is tested.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a memory testing device and a testing method. Background Art

[0002] With the popularization of electronic products and the development of various data clouds, the types of integrated circuits used in electronic products are gradually increasing. As a result, in the process of developing electronic products, it is often necessary to adapt and verify the various integrated circuits involved in electronic products.

[0003] For relatively simple integrated circuit packages, you can basically use an air gun or soldering iron to solder them yourself for adaptation and verification. However, for relatively complex integrated circuit packages, such as DRAM (Dynamic Random Access Memory) and BGA (Ball Grid Array) packaged integrated circuits, it is difficult to solder them yourself. Even if you solder them yourself, you cannot guarantee 100% normal adaptation and verification. In addition, this type of integrated circuit needs to be factory-made for adaptation and verification every time, which makes the timeliness of development worse. Summary of the invention

[0004] In view of the above problems, the present invention provides a memory testing device and a testing method.

[0005] According to a first aspect of the present invention, a memory testing device is provided, comprising: a shell, comprising an upper shell and a lower shell that can be opened and closed, wherein the lower shell is provided with a memory card slot; an adjustable card slot device, movably connected to the memory card slot, and used for adjusting the size of the memory card slot to dynamically adapt to the physical contours of memories to be tested of different sizes; a conveying mechanism, arranged at a position corresponding to the memory card slot, and used for achieving positioning and matching between the memory to be tested and the memory card slot; a downward pressing stroke control device, passing through the upper shell, and used for adjusting the downward pressing stroke of the downward pressing structure, so as to electrically connect the conductor array on the lower surface of the memory to be tested with the conductive contact array in the memory card slot through the downward pressing structure, thereby achieving testing of the memory to be tested.

[0006] The second aspect of the present invention provides a method for testing a memory, comprising: controlling an adjustable slot device to move toward the interior of a lower shell to adjust the size of a memory slot, so that the size of the memory slot is consistent with the size of a memory to be tested; controlling the memory to be tested to be placed on a conveying mechanism; controlling the conveying mechanism to move downward relative to the lower shell to convey the memory to be tested to the memory slot, thereby achieving positioning and matching between the memory to be tested and the memory slot; controlling a downward pressing stroke control device to rotate relative to the upper shell to adjust the downward pressing stroke of the downward pressing structure, thereby electrically connecting the conductor array on the lower surface of the memory to be tested to the conductive contact array in the memory slot, thereby achieving testing of the memory to be tested.

[0007] According to the memory testing device and testing method provided by the present invention, based on the size of the memory to be tested, the memory card slot can be adjusted to a size matching the memory to be tested through an adjustable card slot device, so as to dynamically adapt to the physical contours of the memory to be tested of different sizes; the transmission mechanism is used to realize the positioning and matching of the memory to be tested and the memory card slot, and is also convenient for placing and taking the memory to be tested; the pressing stroke control device can be used to control the pressing stroke of the pressing structure, so that the pressing structure contacts the top of the memory to be tested, while avoiding excessive adjustment of the pressing stroke of the pressing structure to cause damage to the memory to be tested and avoiding insufficient adjustment of the pressing stroke of the pressing structure to cause poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array. Therefore, the setting of the adjustable card slot device, the pressing block and the transmission mechanism improves the versatility and reliability of the memory testing device, makes the operation more convenient, and also improves the development efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] The above contents and other objects, features and advantages of the present invention will become more apparent through the following description of the embodiments of the present invention with reference to the accompanying drawings.

[0009] Figure 1 A schematic diagram of a memory testing device according to an embodiment of the present invention is shown.

[0010] Figure 2 A schematic diagram showing a connection structure between an adjustable card slot device and a memory card slot according to an embodiment of the present invention is shown.

[0011] FIG. 3( a ) shows a schematic diagram of an adjustment process of an adjustable slot device according to an embodiment of the present invention.

[0012] FIG. 3( b ) shows a schematic diagram of the adjustment completion of the adjustable slot device according to an embodiment of the present invention.

[0013] FIG3( c ) shows a schematic diagram of resetting the adjustable slot device according to an embodiment of the present invention.

[0014] Figure 4 A schematic diagram of a conveying mechanism according to an embodiment of the present invention is shown.

[0015] Figure 5 A schematic diagram of a conveying mechanism controller according to an embodiment of the present invention is shown.

[0016] Figure 6 A schematic diagram of a memory card slot according to an embodiment of the present invention is shown.

[0017] Figure 7 A schematic diagram showing a memory to be tested located in a memory card slot according to an embodiment of the present invention is shown.

[0018] Figure 8 FIG. 4 is a schematic diagram showing a memory testing device according to another embodiment of the present invention.

[0019] Fig. 9 A flow chart of a memory testing method according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0020] Below, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are exemplary only and are not intended to limit the scope of the present invention. In the following detailed description, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of embodiments of the present invention. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of known structures and technologies are omitted to avoid unnecessary confusion of concepts of the present invention.

[0021] The terms used herein are only for describing specific embodiments and are not intended to limit the present invention. The terms "comprise", "include", etc. used herein indicate the existence of the features, steps, operations and / or components, but do not exclude the existence or addition of one or more other features, steps, operations or components.

[0022] All terms (including technical and scientific terms) used herein have the meanings commonly understood by those skilled in the art unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0023] When using expressions such as "at least one of A, B, and C, etc.", they should generally be interpreted according to the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include but is not limited to a system having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.).

[0024] In the process of implementing the present invention, it is found that the number of bottom solder balls, solder ball spacing, solder ball size, etc. of the same generation of DRAM will remain consistent to ensure compatibility and consistency, but due to different manufacturing processes, the frame sizes of the same generation of DRAM produced by different suppliers are different.

[0025] In the related art, the area in the test socket for placing DRAM is fixed, and the test socket is only compatible with DRAM of one size, that is, no matter how large or small the DRAM frame size is, it cannot be directly placed in the test socket and accurately connected to the pins at the bottom of the test socket.

[0026] To this end, an embodiment of the present invention provides a memory testing device to adapt to DRAMs of different sizes.

[0027] Figure 1 A schematic diagram of a memory testing device according to an embodiment of the present invention is shown.

[0028] like Figure 1 As shown, the housing of the memory testing device 100 may include an upper shell 101 and a lower shell 102 that can be opened and closed. A downward pressing structure 104 is arranged inside the upper shell 101, and a memory card slot 103 is arranged inside the lower shell 102. The memory card slot 103 is located at the bottom of the lower shell.

[0029] The memory card slot 103 is used to place the memory to be tested so as to test the memory to be tested; the memory to be tested may be a DRAM.

[0030] Among them, the memory test device (Test Socket) 100 can be opened because it has an upper shell and a lower shell that can be opened and closed. For example, the upper shell 101 can be opened through the fixed connection piece 108 to open the memory test device; optionally, the memory test device may not be provided with a fixed connection piece 108, and the upper shell of the memory test device is detachable, and the memory test device is opened by removing the upper shell.

[0031] According to an embodiment of the present invention, the memory test device may further include an adjustable card slot device. In the case where the housing of the memory test device is a cubic structure, the number of the adjustable card slot devices may be four, and they are respectively arranged on the four sides of the outer surface of the lower shell to adjust the length and width of the memory card slot from four directions, so that the size of the memory card slot is consistent with the size of the memory to be tested.

[0032] exist Figure 1In the example, the memory test device 100 may include a first adjustable slot device 1051, a second adjustable slot device 1052, and a third adjustable slot device 1053. Figure 1 It is a side view of the memory testing device. An adjustable slot device is further provided on the side opposite to the side where the third adjustable slot device 1053 is located.

[0033] According to an embodiment of the present invention, the adjustable card slot device is movably connected to the memory card slot, and the adjustable card slot device can also be connected to the memory card slot 103 via a connecting structure to achieve movable connection between the adjustable card slot device and the memory card slot, and the connecting structure between each adjustable card slot device and the memory card slot is the same.

[0034] by Figure 1 Taking the first adjustable slot device 1051 in the example, the first adjustable slot device 1051 is connected to one side of the memory slot 103 via the connecting structure 109.

[0035] Since the adjustable card slot device is connected to the memory card slot via the connecting structure, the adjustable card slot device can be used to drive the connecting structure to move toward the interior of the lower shell when it moves toward the interior of the lower shell, thereby driving the position of the memory card slot to change, that is, the size of the memory card slot can be adjusted via the connecting structure to dynamically adapt to the physical contours of memories to be tested of different sizes.

[0036] According to an embodiment of the present invention, the memory test device may further include a conveying mechanism 106, which is disposed inside the lower housing 102 and is located at a position corresponding to the memory card slot, for example, the conveying mechanism 106 is located directly above the memory card slot 103. The conveying mechanism 106 is used to place the memory to be tested and convey the memory to be tested to the memory card slot 103, so as to achieve positioning and matching between the memory to be tested and the memory card slot.

[0037] According to an embodiment of the present invention, the memory test device further includes a pressing stroke control device 107, which is arranged corresponding to the memory card slot 103. For example, the pressing stroke control device 107 can be located directly above the memory card slot 103. The pressing stroke control device 107 passes through the upper part of the outer surface of the upper shell 101 and extends downward. The end of the pressing stroke control device 107 is connected to the pressing structure 104. The pressing stroke control device 107 is used to adjust the pressing stroke of the pressing structure 104, that is, to adjust the pressing displacement of the pressing structure 104, so that the pressing structure 104 contacts the top of the memory to be tested located in the memory card slot 103, so as to realize the test of the memory to be tested through the electrical connection between the conductor array on the lower surface of the memory to be tested and the conductive contact array in the memory card slot.

[0038] In one embodiment, the pressing structure 104 may be a block structure, and the pressing stroke control device 107 may include a screw portion, so as to move downward by rotating and drive the pressing structure 104 to move downward as well.

[0039] According to an embodiment of the present invention, a conductive contact array is further provided in the memory card slot 103, that is, a conductive contact array is further provided at the bottom of the memory test device, and the conductive contact array may be a pin array. The pressing stroke control device 107 electrically connects the conductor array on the lower surface of the memory to be tested with the conductive contact array while making the pressing structure 104 contact the top of the memory to be tested.

[0040] Specifically, the memory testing device can be arranged on a test circuit board, and the other end of the conductive contact in the conductive contact array is electrically connected to the test circuit board, so that when the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array, the memory to be tested can be tested. Therefore, the memory to be tested of different sizes can be tested simply by adjusting the memory card slot to the corresponding size and placing the memory to be tested in the memory card slot.

[0041] Among them, the conductors in the conductor array on the lower surface of the memory to be tested can be solder balls, and the arrangement of the conductors in the conductor array on the lower surface of the memory to be tested is consistent with the arrangement of the conductive contacts in the conductive contact array; the arrangement of the conductors in the conductor array on the lower surface of the memory to be tested of different sizes is the same.

[0042] According to an embodiment of the present invention, based on the size of the memory to be tested, the memory slot can be adjusted to a size that matches the memory to be tested through an adjustable slot device, so as to dynamically adapt to the physical contours of memories to be tested of different sizes; the conveying mechanism is used to achieve the positioning and coordination between the memory to be tested and the memory slot, and also facilitates the placement and removal of the memory to be tested; the downward pressing stroke control device can be used to control the downward pressing stroke of the downward pressing structure, so that the downward pressing structure contacts the top of the memory to be tested, while avoiding excessive adjustment of the downward pressing stroke of the downward pressing structure to cause damage to the memory to be tested, and avoiding insufficient adjustment of the downward pressing stroke of the downward pressing structure to cause poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array. Therefore, the setting of the adjustable slot device, the downward pressing block and the conveying mechanism improves the versatility and reliability of the memory testing device, makes the operation more convenient, and improves the development efficiency.

[0043] Figure 2 A schematic diagram showing a connection structure between an adjustable card slot device and a memory card slot according to an embodiment of the present invention is shown.

[0044] like Figure 2 As shown, a first adjustable slot device 1051, a second adjustable slot device 1052, and a third adjustable slot device 1053 are arranged on the outer surface of the lower shell 102, wherein a fourth adjustable slot device 1054 is also arranged on the side opposite to the side where the third adjustable slot device 1053 is located.

[0045] According to an embodiment of the present invention, the connection structure may include a booster connector, a slot pusher and a traction spring; the memory slot may include a slot wall, that is, the memory slot is an area surrounded by four slot walls; the adjustable slot device is connected to the first end of the booster connector, the second end of the booster connector is connected to the first end of the slot pusher, the second end of the slot pusher is connected to the slot wall, and the two ends of the traction spring are respectively connected to the first end of the slot pusher and the inner surface of the lower shell.

[0046] by Figure 1 Taking the first adjustable slot device 1051 in the embodiment as an example, the connection structure 109 for connecting the first adjustable slot device 1051 and the memory slot 103 may specifically include the following: Figure 2 The booster adapter 201, the slot pusher 202 and the traction spring 203 shown in the figure.

[0047] Specifically, taking four slot walls as an example, the first adjustable slot device 1051 is connected to the first end of the booster connector 201, the second end of the booster connector 201 is connected to the first end of the slot push 202, the second end of the slot push 202 is connected to the first slot wall 2051, and the two ends of the traction spring are respectively connected to the first end of the slot push 202 and the inner surface of the lower shell 102.

[0048] According to an embodiment of the present invention, based on the connection relationship between the adjustable card slot device, the booster connector, the card slot pusher, and the traction spring, the booster connector and the card slot pusher can be driven to move by moving the adjustable card slot device, thereby realizing the adjustment of the size of the memory card slot.

[0049] According to an embodiment of the present invention, the inner surface of the lower shell is further provided with a first scale tooth and a second scale tooth, and the booster connector is located between the first scale tooth and the second scale tooth.

[0050] like Figure 2 As shown in , a first scale tooth and a second scale tooth are provided on both sides of each booster connector, one end of each of the first scale tooth and the second scale tooth are connected to the inner surface of the lower shell 102, and the first scale tooth and the second scale tooth are provided at the same horizontal height relative to the ground of the lower shell 102. Taking the booster connector 201 as an example, the booster connector 201 is located between the first scale tooth 2041 and the second scale tooth 2042.

[0051] According to an embodiment of the present invention, the booster connector may be an arrow-shaped structure, and the arrow tip portion of the booster connector may be designed to be openable and closable, that is, the arrow tip portion of the booster connector may be both expandable and retractable. Due to the openable and closable design of the booster connector, the adjustable slot device may be configured to push the booster connector and the slot pusher relative to the first scale tooth and the second scale tooth during the process of moving toward the interior of the lower shell, so as to move the slot wall, thereby adjusting the size of the memory slot to match the size of the memory to be tested according to the scale mark of the first scale tooth and / or the scale mark of the second scale tooth, that is, adjusting the size of the memory slot to be consistent with the size of the memory to be tested.

[0052] Wherein, the first scale tooth and / or the second scale tooth are provided with scale marks, and each sawtooth on the first scale tooth and / or the second scale tooth may be provided with a corresponding scale, and the scale mark is used to indicate the distance between two opposite slot walls.

[0053] exist Figure 2 In the embodiment, scale marks are set on the first scale teeth and / or the second scale teeth corresponding to each booster connector; the two first scale teeth in the same direction are the same, the two second scale teeth are also the same, and the scale marks set on the first scale teeth and / or the second scale teeth are consistent.

[0054] by Figure 2For example, the scale mark shown in the figure is 6mm~8mm for the first scale tooth 2041 and / or the second scale tooth 2042 opposite to the first adjustable slot device 1051, and three saw teeth are arranged in the first scale tooth 2041 and the second scale tooth 2042. When the booster connector 201 moves one saw tooth toward the inside of the lower shell, the booster connector 201 will be located at the scale mark of 8mm. Similarly, the booster connector corresponding to the second adjustable slot device 1052 is also moved one saw tooth toward the inside of the lower shell, which means that the second adjustable slot device 1052 and the first adjustable slot device 1051 adjust the distance between the first slot wall 2051 and the second slot wall 2052 to 8mm. Similarly, the adjustment principle of the third adjustable slot device 1053 and the fourth adjustable slot device 1054 is consistent with that of the second adjustable slot device 1052 and the first adjustable slot device 1051, and will not be repeated here.

[0055] The scale markings on the first scale teeth and / or the second scale teeth may be set according to actual needs.

[0056] FIG. 3( a ) shows a schematic diagram of an adjustment process of an adjustable slot device according to an embodiment of the present invention.

[0057] As shown in Figure 3 (a), taking the first adjustable slot device 1051 as an example, when the first adjustable slot device 1051 moves toward the inside of the lower shell, such as moving in the direction indicated by the arrow in Figure 3 (a), when the booster connector 201 passes through the serrations in the first scale teeth and the second scale teeth, the arrow tip portion of the booster connector 201 is affected by the serrations and will shrink to pass through the serrations. The shrinkage trajectory of the arrow tip portion of the booster connector 201 can be shown as the dotted line in Figure 3 (a).

[0058] Among them, the arrow tip part of the booster connector 201 is parallel to the bottom of the lower shell; the contraction trajectory of the booster connector can be specifically described as the two oblique sides of the arrow tip of the booster connector being acted upon by the sawtooth, the two oblique sides contract, that is, the angle between the two oblique sides becomes smaller, and the part between the two oblique sides is folded toward the inner direction of the lower shell.

[0059] FIG. 3( b ) shows a schematic diagram of the adjustment completion of the adjustable slot device according to an embodiment of the present invention.

[0060] As shown in FIG3(b), when the first adjustable slot device 1051 needs to be moved a sawtooth distance toward the inside of the lower shell, after the booster connector 201 passes the first sawtooth, the booster connector 201 is stuck at the plane of the first sawtooth of each of the first scale teeth 2041 and the second scale teeth 2042 on both sides, so that the first slot wall 2051 moves from the position shown in FIG3(a) to the position shown in FIG3(b), thereby completing the adjustment.

[0061] Based on the above content, the adjustment process of the second adjustable slot device 1052 , the third adjustable slot device 1053 and the fourth adjustable slot device 1054 is the same as that of the first adjustable slot device 1051 , and will not be repeated here.

[0062] According to an embodiment of the present invention, serrated first and second scale teeth are provided on both sides of the booster connector, the booster connector is in the shape of an arrow and the arrow tip portion is designed to be openable and closable, so that when the size adjuster moves toward the inside of the lower shell, the arrow tip portion of the booster connector can be retracted, pushing the booster connector and the card slot to move through the serrations on the first and second scale teeth to move the card slot wall, so that the size of the memory card slot can be adjusted to be consistent with the size of the memory to be tested according to the scale markings on the first and / or second scale teeth. At this time, the booster connector will be stuck on the scale teeth on both sides to stabilize the card slot wall, so that the size of the adjusted memory card slot is fixed.

[0063] According to an embodiment of the present invention, the adjustable slot device can be configured to rotate a preset angle relative to the lower shell when the test of the memory to be tested is completed, so that when the constraints of the first scale teeth and the second scale teeth are removed, the traction spring is restored to achieve the resetting of the memory slot.

[0064] Among them, the preset angle can represent the angle that the adjustable slot device needs to rotate relative to the lower shell in order to prevent the arrow tip portion of the booster connector from being constrained by the sawtooth.

[0065] FIG3( c ) shows a schematic diagram of resetting the adjustable slot device according to an embodiment of the present invention.

[0066] As shown in FIG3 (c), taking the first adjustable slot device 1051 as an example, when the memory to be tested is tested, the first adjustable slot device 1051 can be rotated relative to the lower shell by a preset angle so that the arrow tip of the booster connector 201 is not constrained by the sawtooth, such as rotating the first adjustable slot device 1051 relative to the lower shell by 90° so that the arrow tip of the booster connector 201 is perpendicular to the bottom of the lower shell so that the arrow tip of the booster connector 201 is not constrained by the sawtooth. Since the two ends of the traction spring are respectively connected to the inner surface of the lower shell and the first end of the slot push, as shown in FIG3 (b), the booster connector, the slot push and the slot wall can be driven to move along the arrow direction shown in FIG3 (c) during the recovery of the traction spring 203 to achieve the backward reset of the memory slot.

[0067] Wherein, the slot wall will not rotate with the rotation of the booster connector.

[0068] According to an embodiment of the present invention, when the size of the memory card slot is adjusted, since the booster connector is arrow-shaped, it will be stuck on the serrations to fix the size of the memory card slot. Therefore, after the test of the memory to be tested is completed, the adjustable card slot device needs to be rotated relative to the lower shell by a preset angle, and drive the booster connector to rotate by a preset angle, so as to eliminate the constraint of the serrations on the booster connector, so that the traction spring between the inner surface of the lower shell and the first end of the card slot can be restored to achieve the resetting of the memory card slot.

[0069] Figure 4 A schematic diagram of a conveying mechanism according to an embodiment of the present invention is shown.

[0070] like Figure 4 As shown, the conveying mechanism 106 may be a quadrilateral frame structure, and supporting claws are provided at the four corners of the quadrilateral frame, and the supporting claws are used to place the memory to be tested.

[0071] According to an embodiment of the present invention, the memory to be tested 410 can be placed in the conveying mechanism 106. The four claws in the conveying mechanism 106 are used to firmly clamp the memory to be tested 410. That is, the memory to be tested 410 is placed on the four claws to place the memory to be tested in the conveying mechanism.

[0072] In one embodiment, the memory under test 410 is placed in the conveying mechanism 106. The position of the memory under test 410 in the conveying mechanism 106 can be as follows: Figure 4 As shown, the four supporting claws of the transport mechanism 106 can support the memory to be tested 410 .

[0073] The bisector of the angle between the two sides adjacent to the claw is at a certain angle and extends toward the bottom of the lower shell. For example, the bisector of the angle between the two sides adjacent to the claw is at 45°.

[0074] According to an embodiment of the present invention, based on Figure 4 The transport mechanism shown can place the memory to be tested in the transport mechanism, so that the memory to be tested can be stably clamped by four claws in the transport mechanism, thereby the transport mechanism can be used to stably transport the memory to be tested to the memory card slot.

[0075] Figure 5 A schematic diagram of a conveying mechanism controller according to an embodiment of the present invention is shown.

[0076] like Figure 5 , which is a front view of the memory testing device. The memory testing device may further include a conveying mechanism controller 510 . The conveying mechanism controller 510 may further be provided with a handle 511 that is vertically movable relative to the lower shell.

[0077] The handle can be connected to the transmission mechanism to control the transmission mechanism, such as Figure 5 The handle 511 shown in FIG. 1 is connected to the conveying mechanism 106 .

[0078] According to an embodiment of the present invention, the handle 511 on the conveying mechanism controller 510 can be used to control the conveying mechanism 106 to move downward relative to the lower shell 102 when the memory to be tested is placed on the conveying mechanism 106, so as to transfer the memory to be tested to the memory card slot 103 by moving the handle 511 downward relative to the lower shell 102.

[0079] According to an embodiment of the present invention, the memory testing device may further include a conveying mechanism controller for controlling the conveying mechanism. The conveying mechanism controller is provided with a handle. By moving the handle downward relative to the lower shell, the conveying mechanism can be controlled to move downward, thereby enabling the memory to be tested to be transferred to the memory card slot, which is beneficial for placing the memory to be tested stably and smoothly in the memory card slot, and avoiding the situation where the memory to be tested cannot be accurately placed in the memory card slot.

[0080] According to an embodiment of the present invention, the handle on the conveying mechanism controller can also be used to control the conveying mechanism to move upward relative to the lower shell when the test of the memory to be tested is completed, so as to take out the memory to be tested.

[0081] like Figure 5 As shown, when the memory to be tested is tested, the handle 511 is moved upward relative to the lower shell 102 to control the conveying mechanism 106 to move upward relative to the lower shell 102 to facilitate taking out the memory to be tested from the conveying mechanism 106 .

[0082] According to an embodiment of the present invention, when the test of the memory to be tested is completed, the handle is moved upward relative to the lower shell so that the conveying mechanism drives the memory to be tested to move upward as well, thereby facilitating the taking of the memory to be tested.

[0083] According to an embodiment of the present invention, the position of the claws in the conveying mechanism is fixed; the size of the area formed by the ends of the four claws in the conveying mechanism is smaller than the size of the memory to be tested and the size of the quadrilateral frame is larger than the size of the memory to be tested.

[0084] According to an embodiment of the present invention, in the process of placing the memory to be tested on the conveying mechanism, the memory to be tested is placed downward from the quadrilateral frame to the corresponding positions of the four supporting claws. Therefore, the size of the quadrilateral frame needs to be larger than the maximum size of the memory to be tested, so that the memory to be tested of any size can be placed downward from the quadrilateral frame, and the size of the area formed by the ends of the four supporting claws needs to be smaller than the minimum size of the memory to be tested, so that the four supporting claws can stably clamp the memory to be tested of any size, that is, the memory to be tested of any size will not fall off from the ends of the four supporting claws.

[0085] The positions of the four claws can be set according to the size of the memory to be tested.

[0086] According to an embodiment of the present invention, the size of the area formed by the ends of the four claws in the conveying mechanism is smaller than the size of the memory to be tested, so that the four claws can hold the memory to be tested with the smallest size, and the size of the quadrilateral frame is larger than the size of the memory to be tested, so that the memory to be tested with the largest size can be placed therein, that is, memories to be tested of different sizes can be placed therein.

[0087] Figure 6 A schematic diagram of a memory card slot according to an embodiment of the present invention is shown.

[0088] like Figure 6 As shown, taking four slot walls as an example, the memory slot is an area surrounded by the first slot wall 2051, the second slot wall 2052, the third slot wall 2053 and the fourth slot wall 2054, and a striped texture is formed on one side of the memory slot that contacts the memory to be tested, that is, a striped texture is formed on one side of the first slot wall 2051, the second slot wall 2052, the third slot wall 2053 and the fourth slot wall 2054 that contacts the memory to be tested.

[0089] The lengths of the first slot wall 2051, the second slot wall 2052, the third slot wall 2053 and the fourth slot wall 2054 are smaller than the length of the side of the smallest size of the memory to be tested, so as to avoid obstruction of the claws by the slot walls while stabilizing the memory to be tested.

[0090] According to an embodiment of the present invention, a side of the slot wall that contacts the memory to be tested can be formed with a strip texture, so that the friction between the memory to be tested and the surrounding areas of the memory slot can be increased, ensuring that the memory to be tested is firmly installed in the memory slot and the memory to be tested is stable, thereby facilitating the precise fit between the conductor array and the conductive contact array at the bottom of the memory to be tested.

[0091] According to an embodiment of the present invention, grooves are further arranged around the memory card slot, and when the conveying mechanism conveys the memory to be tested to the memory card slot, the conveying mechanism enters the grooves.

[0092] Figure 7 A schematic diagram showing a memory to be tested located in a memory card slot according to an embodiment of the present invention is shown.

[0093] like Figure 7 As shown, the memory to be tested 410 is located in a memory card slot formed by the first card slot wall 2051, the second card slot wall 2052, the third card slot wall 2053 and the fourth card slot wall 2054, and the transmission mechanism 106 also enters the grooves around the memory card slot accordingly.

[0094] exist Figure 7 In the embodiment, the conductor array on the lower surface of the memory to be tested 410 is in electrical contact with the conductive contact array 710 in the memory card slot.

[0095] According to an embodiment of the present invention, when the conveying mechanism conveys the memory to be tested to the memory card slot at the bottom, the conveying mechanism will also accordingly enter a groove reserved in advance, without affecting the fitting of the conductor array and the conductive contact array at the bottom of the memory to be tested, and when the test of the memory to be tested is completed, the conveying mechanism moves upward relative to the lower shell, a claw will extend from the bottom of the groove, and move upward relative to the lower shell to send out the memory to be tested.

[0096] According to an embodiment of the present invention, a rotation scale is further formed on the surface of the pressing stroke control device, and the rotation scale can be used to characterize the pressing stroke of the pressing structure.

[0097] According to an embodiment of the present invention, a visual window is further provided on the outer surface of the lower shell, and a push-down scale is formed on the visual window. The push-down scale can be used to display the distance between the push-down structure and the memory to be tested.

[0098] Figure 8 FIG. 4 is a schematic diagram showing a memory testing device according to another embodiment of the present invention.

[0099] like Figure 8 As shown, a rotating scale 810 is also formed on the surface of the downward pressing stroke control device 107, and the rotating scale 810 can represent the downward pressing stroke of the downward pressing structure. For example, when the rotating scale on the surface of the downward pressing stroke control device 107 indicates 4, it can indicate that the downward pressing stroke of the downward pressing structure is 4 unit lengths, that is, the downward pressing structure moves downward by 4 unit lengths.

[0100] exist Figure 8In the example, taking two visual windows as an example, the outer surface of the lower shell is also provided with a first visual window 821 and a second visual window 822, a first push-down scale is formed on the first visual window 821, and a second push-down scale is formed on the second visual window 822, and the first push-down scale and the second push-down scale can be used to display the distance between the push-down structure and the memory to be tested. The first push-down scale on the first visual window 821 and the second push-down scale on the second visual window 822 are the same; the portion of the outer surface of the lower shell where the visual window is provided can be made of a transparent material.

[0101] In one embodiment, it can be observed through the first visual window 821 and the second visual window 822 that the distance between the pressing structure and the memory to be tested is 10 unit lengths. The pressing stroke control device 107 can be rotated so that the rotating scale formed on the surface of the pressing stroke control device 107 points to the scale mark 10, so that the pressing structure can be pressed down a distance of 10 unit lengths, thereby making the pressing structure contact with the top of the memory to be tested.

[0102] The units of the push-down scale and the rotation scale may be mm; and the scale marks of the push-down scale and the rotation scale may be set according to actual needs.

[0103] According to an embodiment of the present invention, a rotating scale is provided on the surface of the pressing stroke control device to indicate the pressing stroke of the pressing structure at this time through the rotating scale. The pressing scale on the visual window is convenient for observing the distance between the pressing structure and the memory to be tested, so that the appropriate pressing stroke of the pressing structure can be adjusted based on the rotating scale and the pressing scale, thereby avoiding excessive adjustment of the pressing stroke of the pressing structure resulting in damage to the memory to be tested and insufficient adjustment of the pressing stroke of the pressing structure resulting in poor contact between the conductor array and the conductive contact array at the bottom of the memory to be tested and inability to fix the memory to be tested.

[0104] According to an embodiment of the present invention, the size of the lower surface of the pressing structure is smaller than the size of the memory to be tested, so as to electrically connect the conductor array on the lower surface of the memory to be tested of different sizes with the conductive contact array in the memory card slot.

[0105] According to an embodiment of the present invention, the lower surface of the pressing structure needs to contact the top of the memory to be tested so that the memory to be tested can be in close contact with the conductive contact array by applying a certain force to the memory to be tested. Therefore, the size of the lower surface of the pressing structure needs to be smaller than the size of the upper surface of the smallest size of the memory to be tested, so that the pressing structure can adapt to the contact surfaces of memories to be tested of different sizes and make the conductor array on the lower surface of the memory to be tested fit precisely with the conductive contact array.

[0106] According to an embodiment of the present invention, the pressing down structure is used to contact the top of the memory to be tested so that the conductor array on the lower surface of the memory to be tested is in good contact with the conductive contact array. Therefore, the size of the lower surface of the pressing down structure needs to be smaller than the minimum size of the memory to be tested, so that the pressing down structure can adapt to the contact surfaces of memories to be tested of different sizes and improve the contact stability and fitting accuracy between the memory to be tested and the conductive contact array.

[0107] Based on the above content, it can be known that the memory testing device of the present invention can adjust the size of the memory card slot to dynamically adapt to the physical contours of memories of different sizes to be tested, and is provided with a transmission mechanism, a visual window, etc., so that the operation is convenient while ensuring the stability and reliability of the test of the memory to be tested.

[0108] Fig. 9 A flow chart of a memory testing method according to an embodiment of the present invention is shown.

[0109] like Fig. 9 As shown, the method 900 includes operations S910 to S940.

[0110] The method 900 is applied to the memory testing device 100 described above.

[0111] In operation S910, the adjustable card slot device is controlled to move toward the inside of the lower case to adjust the size of the memory card slot so that the size of the memory card slot is consistent with the size of the memory to be tested.

[0112] According to an embodiment of the present invention, before testing the memory to be tested, the memory can be opened. Figure 1 The upper shell 101 shown in the figure controls the adjustable card slot device to move toward the inside of the lower shell based on the size of the memory to be tested, so as to adjust the size of the memory card slot to the same size as the test memory.

[0113] In operation S920, the memory to be tested is controlled to be placed on the transport mechanism.

[0114] In operation S930, the conveying mechanism is controlled to move downward relative to the lower housing to convey the memory to be tested to the memory card slot, thereby achieving positioning and matching between the memory to be tested and the memory card slot.

[0115] According to an embodiment of the present invention, Figure 5 The handle 511 on the conveying mechanism controller 510 shown in FIG. 1 controls the conveying mechanism to move downward relative to the lower housing.

[0116] In operation S940, the pressing stroke control device is controlled to rotate relative to the upper shell to adjust the pressing stroke of the pressing structure so that the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array in the memory card slot to implement the test of the memory to be tested.

[0117] According to an embodiment of the present invention, based on Figure 8 The first pressing scale on the first visual window 821, the second pressing scale on the second visual window 822 and the rotation scale 810 shown in the figure control the pressing stroke control device to rotate relative to the upper shell so that the pressing structure contacts the top of the memory to be tested.

[0118] According to an embodiment of the present invention, based on the size of the memory to be tested, the memory slot can be adjusted to a size that matches the memory to be tested through an adjustable slot device, so as to dynamically adapt to the physical contours of memories to be tested of different sizes; the conveying mechanism is used to achieve the positioning and coordination between the memory to be tested and the memory slot, and also facilitates the placement and removal of the memory to be tested; the downward pressing stroke control device can be used to control the downward pressing stroke of the downward pressing structure, so that the downward pressing structure contacts the top of the memory to be tested, while avoiding excessive adjustment of the downward pressing stroke of the downward pressing structure to cause damage to the memory to be tested, and avoiding insufficient adjustment of the downward pressing stroke of the downward pressing structure to cause poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array. Therefore, the setting of the adjustable slot device, the downward pressing block and the conveying mechanism improves the versatility and reliability of the memory testing device, makes the operation more convenient, and improves the development efficiency.

[0119] According to an embodiment of the present invention, when the test of the memory to be tested is completed, the testing method of the above-mentioned memory also includes: controlling the downward pressure stroke control device to rotate relative to the upper shell so that the downward pressure structure moves upward relative to the lower shell to the inside of the upper shell; controlling the adjustable slot device to rotate a preset angle relative to the lower shell so that the memory slot is reset; controlling the conveying mechanism to move upward relative to the lower shell so as to take out the memory to be tested.

[0120] According to an embodiment of the present invention, when the test of the memory to be tested is completed, the downward pressing stroke control device is controlled to rotate relative to the upper shell so that the downward pressing structure moves upward relative to the lower shell to the inside of the upper shell. At this time, the direction of rotation of the downward pressing stroke control device is opposite to the direction of rotation in operation S940.

[0121] According to an embodiment of the present invention, as shown in FIG. 3( c ), the adjustable slot device is controlled to rotate relative to the lower shell by a preset angle, driving the booster connector to rotate accordingly by a preset angle, thereby removing the constraint of the saw teeth and resetting the memory slot during the recovery of the traction spring.

[0122] According to an embodiment of the present invention, when the test of the memory to be tested is completed, the downward pressure stroke control device is controlled to rotate relative to the upper shell to move the downward pressure structure upward to the inside of the upper shell so that the upper shell can be opened, and the adjustable slot device is controlled to rotate a preset angle relative to the lower shell to reset the memory slot, and the conveying mechanism is controlled to move upward so that the memory to be tested can be taken out.

[0123] The flow chart and block diagram in the accompanying drawings illustrate the possible architecture, function and operation of the system, method and computer program product according to various embodiments of the present invention. In this regard, each box in the flow chart or block diagram can represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from the order marked in the accompanying drawings. For example, two boxes represented in succession can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved. It should also be noted that each box in the block diagram or flow chart, and the combination of the boxes in the block diagram or flow chart can be implemented with a dedicated hardware-based system that performs a specified function or operation, or can be implemented with a combination of dedicated hardware and computer instructions.

[0124] It will be appreciated by those skilled in the art that the features described in the various embodiments of the present invention may be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present invention. In particular, without departing from the spirit and teachings of the present invention, the features described in the various embodiments of the present invention may be combined and / or combined in various ways. All of these combinations and / or combinations fall within the scope of the present invention.

[0125] The embodiments of the present invention are described above. However, these embodiments are only for the purpose of illustration, and are not intended to limit the scope of the present invention. Although each embodiment is described above, it does not mean that the measures in each embodiment cannot be used in combination advantageously. Without departing from the scope of the present invention, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present invention.

Claims

1. A memory testing device, characterized in that: The memory testing device comprises: The housing comprises an upper housing and a lower housing which can be opened and closed, wherein a memory card slot is arranged in the lower housing; An adjustable slot device, movably connected to the memory slot, for adjusting the size of the memory slot to dynamically adapt to the physical contours of the memory to be tested of different sizes; A transmission mechanism, arranged at a position corresponding to the memory card slot, for realizing the positioning and matching between the memory to be tested and the memory card slot; A downward pressing stroke control device passes through the upper shell and is used to adjust the downward pressing stroke of the downward pressing structure so that the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array in the memory card slot through the downward pressing structure to realize the test of the memory to be tested.

2. The memory testing device according to claim 1, characterized in that: The memory testing device also includes a booster connector, a slot pusher and a traction spring; the memory slot includes a slot wall; the adjustable slot device is connected to the first end of the booster connector, the second end of the booster connector is connected to the first end of the slot pusher, the second end of the slot pusher is connected to the slot wall, and the two ends of the traction spring are respectively connected to the first end of the slot pusher and the inner surface of the lower shell.

3. The memory testing device according to claim 2, characterized in that: The inner surface of the lower shell is provided with a first scale tooth and a second scale tooth, the booster connector is located between the first scale tooth and the second scale tooth, and the booster connector is in the shape of an arrow; The adjustable slot device is configured to push the booster connector and the slot pusher to move relative to the first scale teeth and the second scale teeth during the process of moving toward the interior of the lower shell, so as to move the slot wall, thereby adjusting the size of the memory slot to match the size of the memory to be tested according to the scale markings of the first scale teeth and / or the scale markings of the second scale teeth.

4. The memory testing device according to claim 3, characterized in that: The adjustable slot device is configured to rotate a preset angle relative to the lower shell when the test of the memory to be tested is completed, so that when the constraints of the first scale teeth and the second scale teeth are removed, the traction spring is restored to achieve the resetting of the memory slot.

5. The memory testing device according to claim 1, characterized in that: The conveying mechanism is a quadrilateral frame, and four corners of the quadrilateral frame are provided with supporting claws, and the supporting claws are used to place the memory to be tested.

6. The memory testing device according to claim 5, characterized in that: The memory testing device further comprises a conveying mechanism controller, on which a handle is provided which is vertically movable relative to the lower shell; The handle on the conveying mechanism controller is used to control the conveying mechanism to move downward relative to the lower shell when the memory to be tested is placed on the conveying mechanism, so as to convey the memory to be tested to the memory card slot.

7. The memory testing device according to claim 6, characterized in that: The handle on the conveying mechanism controller is also used to control the conveying mechanism to move upward relative to the lower shell when the test of the memory to be tested is completed, so as to take out the memory to be tested.

8. The memory testing device according to claim 7, characterized in that: Grooves are also arranged around the memory card slot. When the conveying mechanism conveys the memory to be tested to the memory card slot, the conveying mechanism enters the grooves.

9. The memory testing device according to claim 5, characterized in that: The position of the claws in the conveying mechanism is fixed; the size of the area formed by the ends of the four claws in the conveying mechanism is smaller than the size of the memory to be tested and the size of the quadrilateral frame is larger than the size of the memory to be tested.

10. The memory testing device according to any one of claims 1 to 9, characterized in that: A stripe texture is formed on a surface of the memory card slot that contacts the memory to be tested.

11. The memory testing device according to any one of claims 1 to 9, characterized in that: A rotation scale is formed on the surface of the pressing stroke control device, and the rotation scale is used to indicate the pressing stroke of the pressing structure.

12. The memory testing device according to claim 11, characterized in that: A visual window is arranged on the outer surface of the lower shell, and a pressing scale is formed on the visual window. The pressing scale is used to display the distance between the pressing structure and the memory to be tested.

13. The memory testing device according to claim 12, characterized in that: The size of the lower surface of the pressing structure is smaller than the size of the memory to be tested, so as to electrically connect the conductor array on the lower surface of the memory to be tested of different sizes with the conductive contact array in the memory card slot.

14. A memory testing method, characterized in that: A memory testing device according to any one of claims 1 to 13; the method comprising: Control the adjustable card slot device to move toward the inside of the lower shell to adjust the size of the memory card slot so that the size of the memory card slot is consistent with the size of the memory to be tested; Controlling the storage device to be tested to be placed on a conveying mechanism; Controlling the conveying mechanism to move downward relative to the lower shell to convey the memory to be tested to the memory card slot, so as to achieve positioning and matching between the memory to be tested and the memory card slot; The pressing stroke control device is controlled to rotate relative to the upper shell to adjust the pressing stroke of the pressing structure, so that the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array in the memory card slot to implement the test of the memory to be tested.

15. The method according to claim 14, characterized in that When the test of the memory to be tested is completed, the method further includes: Controlling the downward pressing stroke control device to rotate relative to the upper shell so that the downward pressing structure moves upward relative to the lower shell to the inside of the upper shell; Controlling the adjustable card slot device to rotate relative to the lower shell by a preset angle to reset the memory card slot; The conveying mechanism is controlled to move upward relative to the lower shell so as to take out the memory to be tested.

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