Withstand voltage test device for high-layer thick copper inductance stepped circuit board
By designing a high-layer thick copper inductor step circuit board voltage test device, using components such as slide rails, bars and detection components to simulate local impacts and collisions, the problem of insufficient voltage test of circuit board voltage in the prior art is solved, and more accurate and comprehensive voltage resistance detection is achieved.
Patent Information
- Application Number
- CN202411932249.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2025-05-02
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
In the prior art, there is insufficient testing on the local impact and impact of the circuit board during actual use, resulting in insufficient accuracy and reliability of the voltage withstand voltage test results.
A high-layer thick copper inductor step circuit board voltage test device is designed. Through the combination of slide rails, bars, detection components, clamping units and testing units, the circuit board can be subjected to local impact and collision simulation tests.
The device can more realistically and comprehensively simulate the stress conditions of the circuit board in actual use, provide more accurate voltage resistance detection data, and help evaluate the stability and durability of the circuit board.
Smart Images

Figure CN119916175A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of circuit board testing, and in particular relates to a withstand voltage testing device for a high-layer thick copper inductor ladder circuit board. Background Art
[0002] In the prior art, the withstand voltage test of the circuit board usually adopts the method of stamping test on the entire circuit board; such as the Chinese patent with application number CN202323211243.3, which discloses a circuit board testing device, including a test bench, the interior of which is provided with a control device, the control device including a motor, a first gear, a second gear, a first bevel gear and a second bevel gear. In the circuit board testing device, when testing, the motor is started, the rotating shaft drives the first gear to rotate, the first gear drives the second gear to rotate, and then the first rotating rod rotates, and then the first bevel gear is driven to rotate, the first bevel gear drives the second bevel gear to rotate, and the second rotating rod rotates, and then the threaded rod rotates, so that the lifting plate moves up and down inside the test bench, and the mounting plate moves with the fixed round rod, driving the pressing plate to squeeze the circuit board to be tested below, when the pressing plate squeezes the circuit board, the reaction force of the pressing plate will cause the spring to contract, and at the same time, the elastic force of the spring will squeeze the pressure sensor, so that the pressure of the pressing plate on the circuit board can be measured.
[0003] Although this test method can detect a certain degree of voltage resistance performance, it does not fully consider the use environment of the circuit board in actual applications. Specifically, during the plugging and unplugging process of the circuit board, only one end of the circuit board is often inserted into or pulled out of the card slot, while the other end of the circuit board may be subjected to different degrees of impact. In addition, when installing other components, accidental collisions may also occur to the end of the circuit board away from the card slot. Since the prior art mainly focuses on stamping tests on the entire surface of the circuit board, this test method fails to fully simulate these specific situations in actual use, which may lead to insufficient accuracy and reliability of the voltage resistance test results. Therefore, there is a problem in the prior art of insufficient testing of the local impact and collision effects on the circuit board during actual use. Summary of the invention
[0004] In view of the deficiencies in the prior art, the purpose of the present invention is to provide a high-layer thick copper inductor ladder circuit board withstand voltage testing device, which solves the problem in the prior art of insufficient testing of local impact and collision effects on the circuit board during actual use.
[0005] The purpose of the present invention can be achieved through the following technical solutions:
[0006] High-layer thick copper inductor ladder circuit board withstand voltage test device, including slide rails;
[0007] A horizontal strip plate is arranged directly above the slide rail and is placed vertically to the slide rail. The strip plate is used to place the circuit board. The slide rail is provided with a lifting part that connects the strip plate and drives it to rise and fall.
[0008] A pair of detection components are slidably connected to the slide rail along its axis direction, and the two detection components are symmetrically placed about the strip plate. The detection components each include a mobile frame, and a clamping unit and a first test unit are arranged on the mobile frame, and the clamping unit is located on a side of the corresponding first test unit close to the strip plate;
[0009] The clamping units each include a pair of clamping strips symmetrically placed up and down, the clamping strips are coaxially placed with the strip plate, the clamping strip located at the bottom is fixed to the mobile frame, the clamping strip located at the top is slidably connected to the mobile frame, a fixing piece fixed to the mobile frame is provided above the two clamping strips, a first telescopic cylinder placed vertically downward is installed at the lower end of the fixing piece, and the lower end of the first telescopic cylinder is fixed to the clamping strip located at the top;
[0010] The first test unit is used to apply vertical downward stamping to the end of the circuit board close to the detection component and perform a withstand voltage test;
[0011] A driving part is arranged on the slide rail, the driving part is connected with the two detection components, and is used to drive the two detection components to move closer to or away from each other;
[0012] A hanging plate is provided above the strip plate, and the hanging plate is fixed on the slide rail through a pair of support plates. A second test unit is provided at the lower end of the hanging plate and is located directly above the strip plate. The second test unit is used to apply vertical downward stamping to the middle section of the circuit board and perform a withstand voltage test;
[0013] The movable racks are all slidably connected to the slide rails;
[0014] The driving part includes a screw which is rotatably connected in the slide rail and is coaxially placed therewith, and the screw threads of the screw are located on both sides of the symmetry plane of the two detection components and have opposite spiral directions, and two sliders corresponding to the moving frames are sleeved on the screw, and the sliders are both threadedly connected to the screw, and the sliders are both fixed to the corresponding moving frames, and a rotating motor is installed on the slide rail, and the rotating motor is connected to either end of the screw and is used to drive it to rotate;
[0015] The first test unit includes a second telescopic cylinder fixed on the mobile frame and placed vertically downward, a buffer portion is fixed at the lower end of the second telescopic cylinder, and a first pressure strip placed coaxially with the clamping strip is fixed at the lower end of the buffer portion;
[0016] The buffer part includes a first connecting strip fixed to the lower end of the second telescopic cylinder, the first connecting strips are coaxially placed with the clamping strip, at least two first telescopic rods are arranged along the axial direction of the lower end surface of the first connecting strip, and the multiple first telescopic rods below the first connecting strip are symmetrically arranged about the central axis of the second telescopic cylinder, the lower ends of the first telescopic rods are fixed to the first pressure strip, the first telescopic rods are sleeved with first springs, the lower ends of the first springs are fixed to the first pressure strip, the upper ends of the first springs are fixed with first pressure sensors, and the first pressure sensors are fixed to the first connecting strip;
[0017] The second test unit includes a third telescopic cylinder vertically fixed below the hanging plate, a second connecting strip coaxially placed with the clamping strip is fixed to the lower end of the third telescopic cylinder, a second pressure strip coaxially placed is provided directly below the second connecting strip, at least two second telescopic rods are arranged along the axial direction of the lower end surface of the second connecting strip, and the plurality of second telescopic rods below the second connecting strip are symmetrically arranged about the central axis of the third telescopic cylinder, the lower ends of the second telescopic rods are all fixed to the second pressure strip, the second telescopic rods are all sleeved with second springs, the lower ends of the second springs are all fixed to the second pressure strip, the upper ends of the second springs are all fixed to the second pressure sensors, and the second pressure sensors are all fixed to the second connecting strip;
[0018] The first connecting bar and the second connecting bar are both provided with an early warning device;
[0019] The lifting part comprises a pair of symmetrically placed fourth telescopic cylinders, the two fourth telescopic cylinders are respectively fixed at two ends of the lower end surface of the strip plate, and the bottoms of the fourth telescopic cylinders are fixed on the slide rails.
[0020] Beneficial effects of the present invention:
[0021] The present application facilitates the position adjustment of the circuit board placed on the strip board through the coordinated arrangement of the strip board, the lifting part, the mobile frame, the clamping unit, the first test unit, the driving part, the hanging plate, the support plate and the second test unit, so that the circuit board itself is symmetrically placed with respect to the symmetry plane of the two detection components, and through the coordination of the clamping units on both sides and the first test unit, the clamping unit on one side is first loosened, and the circuit board is subjected to a withstand voltage test through the first test unit on this side, which can better simulate the stress conditions that the circuit board may encounter in actual use, and solves the problem of insufficient testing of the local impact and collision effects on the circuit board during actual use in the prior art, thereby realizing a more realistic and comprehensive withstand voltage test of the circuit board, and can provide more accurate data to help evaluate the stability and durability of the circuit board during actual application. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0023] Figure 1 It is a schematic diagram of the overall structure of the present invention;
[0024] Figure 2 It is a schematic diagram of the overall structure of the present invention from different viewing angles;
[0025] Figure 3 It is a schematic diagram of the structure of the screw rod of the present invention;
[0026] Figure 4 It is a partial structural schematic diagram of the third telescopic cylinder of the present invention;
[0027] Figure 5 It is a partial structural schematic diagram of the clamping strip of the present invention;
[0028] Figure 6 It is a partial structural schematic diagram of the first telescopic rod of the present invention. DETAILED DESCRIPTION
[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0030] like Figures 1 to 6 As shown, a high-layer thick copper inductor ladder circuit board withstand voltage test device includes a slide rail 100;
[0031] A horizontal strip plate 200 is arranged directly above the slide rail 100 and is placed vertically to the slide rail 100. The strip plate 200 is used to place a circuit board. The slide rail 100 is provided with a lifting part that connects the strip plate 200 and drives it to rise and fall.
[0032] A pair of detection assemblies 300 are slidably connected to the slide rail 100 along its axis direction. The two detection assemblies 300 are symmetrically placed with respect to the strip plate 200. The detection assemblies 300 each include a mobile frame 301. The mobile frame 301 is provided with a clamping unit and a first test unit, and the clamping unit is located on a side of the corresponding first test unit close to the strip plate 200.
[0033] The clamping units each include a pair of clamping strips 302 symmetrically placed up and down, the clamping strips 302 are coaxially placed with the strip plate 200, the clamping strip 302 located at the bottom is fixed to the mobile frame 301, the clamping strip 302 located at the top is slidably connected to the mobile frame 301, a fixing piece 303 fixed to the mobile frame 301 is provided above the two clamping strips 302, a first telescopic cylinder 304 placed vertically downward is installed at the lower end of the fixing piece 303, and the lower end of the first telescopic cylinder 304 is fixed to the clamping strip 302 located at the top;
[0034] The first testing unit is used to apply vertical downward stamping to the end of the circuit board close to the detection component 300 and perform a withstand voltage test;
[0035] The slide rail 100 is provided with a driving unit, which is connected to the two detection components 300 and is used to drive the two detection components 300 to move closer to or away from each other;
[0036] A hanging plate 500 is provided above the strip plate 200, and the hanging plate 500 is fixed on the slide rail 100 through a pair of support plates 501. A second test unit 600 is provided at the lower end of the hanging plate 500 and is located directly above the strip plate 200. The second test unit 600 is used to apply vertical downward stamping to the middle section of the circuit board and perform a withstand voltage test;
[0037] The circuit board to be tested is placed on the strip plate 200, and initially, the two clamping strips 302 of the clamping unit are both in a fitted state, and the strip plate 200 and the circuit board are driven by the lifting unit to be raised and lowered, so that the lower end surface of the circuit board is flush with the upper end surface of the clamping strip 302 located below;
[0038] The driving unit drives the two detection components 300 to synchronously approach the circuit board, and during the movement, the clamping strips 302 on both sides can push the circuit board to adjust its position, so that the circuit board itself is symmetrically placed with respect to the symmetry plane of the two detection components 300;
[0039] When the clamping strips 302 on the two detection components 300 are both in contact with the ends of the circuit board, the driving of the two detection components 300 to move is immediately stopped, and the clamping strip 302 located on the top is driven to move up to the top of the circuit board by the first telescopic cylinder 304, and then the driving unit is turned on to drive the two detection components 300 to move closer to each other, so that the two ends of the circuit board pass through the two clamping strips 302 of the clamping units at the two ends, respectively, until the two ends of the circuit board are respectively located under the first test units on both sides, and then the driving unit is turned off, and the clamping strip 302 located on the top is driven to move down by the first telescopic cylinder 304, so that the clamping unit fixes and clamps the circuit board;
[0040] Then, the strip plate 200 is driven downward by the lifting part to make the middle section of the circuit board suspended in the air, and then the second detection unit is used to apply vertical downward stamping to the middle section of the circuit board and perform a withstand voltage test;
[0041] Then, the first telescopic cylinder 304 on either side is opened to drive the connected clamping strip 302 to move upward, so that the clamping unit on this side releases the clamping of the circuit board, and the first detection unit on this side is opened, and when the end of the circuit board away from this side is clamped, the end of the circuit board is punched and a withstand voltage test is performed; after the test is completed, the clamping unit on this side clamps and fixes the circuit board again, and then repeats the above process to punch the other end of the circuit board and perform a withstand voltage test; it can better simulate the stress conditions that the circuit board may encounter in actual use, solves the problem of insufficient testing of local impact and collision effects on the circuit board during actual use in the prior art, thereby achieving a more realistic and comprehensive withstand voltage test of the circuit board, and can provide more accurate data to help evaluate the stability and durability of the circuit board during actual application.
[0042] In order to facilitate driving the two detection components 300 to move closer or farther synchronously, the moving frames 301 are slidably connected to the slide rails 100;
[0043] The driving part includes a screw 401 which is rotatably connected to the slide rail 100 and placed coaxially therewith, and the screw 401 is located on both sides of the symmetry plane of the two detection components 300 with opposite spiral directions, and two sliders 402 corresponding to the moving frame 301 are sleeved on the screw 401, and the sliders 402 are all threadedly connected to the screw 401, and the sliders 402 are all fixed to the corresponding moving frame 301, and a rotating motor 403 is installed on the slide rail 100, and the rotating motor 403 is connected to either end of the screw 401 and is used to drive it to rotate; the screw 401 is driven by the rotating motor 403, and the screw 401 drives the slider 402 for thread transmission, and the slider 402 drives the detection component 300, thereby controlling the two detection components 300 to approach or move away synchronously.
[0044] The first test unit includes a second telescopic cylinder 305 fixed on the mobile frame 301 and placed vertically downward, a buffer portion is fixed at the lower end of the second telescopic cylinder 305, and a first pressure strip 307 coaxially placed with the clamping strip 302 is fixed at the lower end of the buffer portion; the buffer portion and the first pressure strip 307 are driven downward by the second telescopic cylinder 305, thereby applying a vertical downward stamping to the upper end surface of the circuit board.
[0045] The buffer portion includes a first connecting strip 306 fixed to the lower end of the second telescopic cylinder 305, the first connecting strips 306 are coaxially arranged with the clamping strip 302, at least two first telescopic rods 308 are arranged on the lower end surface of the first connecting strip 306 along its axial direction, and the plurality of first telescopic rods 308 below the first connecting strip 306 are symmetrically arranged about the central axis of the second telescopic cylinder 305, the lower ends of the first telescopic rods 308 are fixed to the first pressure strip 307, the first telescopic rods 308 are sleeved with first springs 309, and the lower ends of the first springs 309 are The first pressure sensor 310 is fixed to the first pressure strip 307, and the upper end of the first spring 309 is fixed, and the first pressure sensor 310 is fixed to the first connecting strip 306; when the second telescopic cylinder 305 drives the first pressure strip 307 to contact the circuit board, the second telescopic cylinder 305 drives the first connecting strip 306 to continue to move downward through the setting of the first spring 309, so that the pressure of the first pressure strip 307 on the circuit board can be gradually increased, and by setting the first pressure sensor 310, it is convenient to detect the pressure, and then perform a pressure resistance test on the circuit board.
[0046] The second test unit 600 includes a third telescopic cylinder 601 vertically fixed below the hanging plate 500, a second connecting strip 602 coaxially placed with the clamping strip 302 is fixed at the lower end of the third telescopic cylinder 601, a second pressure strip 603 coaxially placed is provided directly below the second connecting strip 602, at least two second telescopic rods 604 are arranged along the axial direction of the lower end surface of the second connecting strip 602, and the multiple second telescopic rods 604 below the second connecting strip 602 are symmetrically arranged about the central axis of the third telescopic cylinder 601, the lower ends of the second telescopic rods 604 are fixed to the second pressure strip 603, the second telescopic rods 604 are sleeved with second springs 605, the lower ends of the second springs 605 are fixed to the second pressure strip 603, the upper ends of the second springs 605 are fixed to the second pressure sensors 606, and the second pressure sensors 606 are fixed to the second connecting strip 602; when the two clamping units clamp both ends of the circuit board at the same time, it is convenient to apply pressure to the middle section of the circuit board for detection.
[0047] The first connecting bar 306 and the second connecting bar 602 are both provided with an early warning device 700 ; an early warning value can be set in advance on each early warning device 700 , and the early warning device 700 can send out an early warning signal according to the detection result of the first pressure sensor 310 or the second pressure sensor 606 .
[0048] The lifting part includes a pair of symmetrically placed fourth telescopic cylinders 201, the two fourth telescopic cylinders 201 are respectively fixed to the two ends of the lower end surface of the strip plate 200, and the bottoms of the fourth telescopic cylinders 201 are fixed on the slide rail 100; the strip plate 200 can be driven by the fourth telescopic cylinders 201 to be lifted and lowered.
[0049] In the description of this specification, the description with reference to the terms "one embodiment", "example", "specific example", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.
[0050] The above shows and describes the basic principles, main features and advantages of the present invention. It should be understood by those skilled in the art that the present invention is not limited by the above embodiments, and the above embodiments and descriptions are only for explaining the principles of the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, and these changes and improvements all fall within the scope of the present invention to be protected.
Claims
1. A high-layer thick copper inductor ladder circuit board withstand voltage test device, comprising a slide rail (100), characterized in that: A strip plate (200) is provided directly above the slide rail (100) and is placed horizontally and perpendicularly to the slide rail (100); the strip plate (200) is used to place a circuit board; and a lifting part is provided on the slide rail (100) for connecting the strip plate (200) and driving the strip plate (200) to move upward and downward; A pair of detection assemblies (300) are slidably connected to the slide rail (100) along its axial direction, the two detection assemblies (300) are symmetrically placed with respect to the strip plate (200), and the detection assemblies (300) each include a moving frame (301), a clamping unit and a first test unit are arranged on the moving frame (301), and the clamping unit is located on a side of the corresponding first test unit close to the strip plate (200); The clamping units each include a pair of clamping strips (302) symmetrically arranged in an upper and lower direction, the clamping strips (302) are coaxially arranged with the strip plate (200), the clamping strip (302) located at the bottom is fixed to the moving frame (301), the clamping strip (302) located at the top is slidably connected to the moving frame (301), a fixing member (303) fixed to the moving frame (301) is provided above the two clamping strips (302), a first telescopic cylinder (304) vertically arranged downward is installed at the lower end of the fixing member (303), and the lower end of the first telescopic cylinder (304) is fixed to the clamping strip (302) located at the top; The first testing unit is used to apply vertical downward stamping to the end of the circuit board close to the detection component (300) and perform a withstand voltage test; A driving unit is provided on the slide rail (100), the driving unit is connected to the two detection components (300), and is used to drive the two detection components (300) to move closer to or farther from each other; A hanging plate (500) is provided above the strip plate (200), and the hanging plate (500) is fixed on the slide rail (100) through a pair of support plates (501). A second test unit (600) located directly above the strip plate (200) is provided at the lower end of the hanging plate (500), and the second test unit (600) is used to apply vertical downward stamping to the middle section of the circuit board and perform a withstand voltage test.
2. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 1 is characterized in that: The movable racks (301) are all slidably connected to the slide rails (100); The driving part comprises a screw rod (401) which is rotatably connected to the slide rail (100) and is coaxially arranged therewith, and the screw rod (401) is located on both sides of the symmetry plane of the two detection components (300) and has opposite spiral directions of threads, and two sliders (402) corresponding to the moving frames (301) are sleeved on the screw rod (401), and the sliders (402) are both threadedly connected to the screw rod (401), and the sliders (402) are both fixed to the corresponding moving frames (301), and a rotating motor (403) is installed on the slide rail (100), and the rotating motor (403) is connected to either end of the screw rod (401) and is used to drive the screw rod (401) to rotate.
3. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 2 is characterized in that: The first test unit comprises a second telescopic cylinder (305) fixed on the mobile frame (301) and placed vertically downward, a buffer portion is fixed at the lower end of the second telescopic cylinder (305), and a first pressure strip (307) placed coaxially with the clamping strip (302) is fixed at the lower end of the buffer portion.
4. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 3 is characterized in that: The buffer part comprises a first connecting strip (306) fixed to the lower end of the second telescopic cylinder (305), the first connecting strip (306) is coaxially arranged with the clamping strip (302), at least two first telescopic rods (308) are arranged along the axial direction of the lower end surface of the first connecting strip (306), and the plurality of first telescopic rods (308) below the first connecting strip (306) are symmetrically arranged about the central axis of the second telescopic cylinder (305), the lower ends of the first telescopic rods (308) are fixed to the first pressure strip (307), the first telescopic rods (308) are sleeved with a first spring (309), the lower ends of the first springs (309) are fixed to the first pressure strip (307), the upper ends of the first springs (309) are fixed with a first pressure sensor (310), and the first pressure sensor (310) is fixed to the first connecting strip (306).
5. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 4 is characterized in that: The second test unit (600) comprises a third telescopic cylinder (601) vertically fixed below the hanging plate (500), a second connecting bar (602) coaxially arranged with the clamping bar (302) being fixed at the lower end of the third telescopic cylinder (601), a second pressing bar (603) coaxially arranged directly below the second connecting bar (602), at least two second telescopic rods (604) being arranged on the lower end surface of the second connecting bar (602) along the axial direction thereof, and below the second connecting bar (602) The plurality of second telescopic rods (604) are symmetrically arranged about the central axis of the third telescopic cylinder (601); the lower ends of the second telescopic rods (604) are fixed to the second pressure strip (603); the second springs (605) are sleeved on the second telescopic rods (604); the lower ends of the second springs (605) are fixed to the second pressure strip (603); the upper ends of the second springs (605) are fixed to the second pressure sensors (606); and the second pressure sensors (606) are fixed to the second connecting strip (602).
6. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 5 is characterized in that: The first connecting bar (306) and the second connecting bar (602) are both provided with an early warning device (700).
7. The high-layer thick copper inductor ladder circuit board withstand voltage test device according to claim 6 is characterized in that: The lifting part comprises a pair of symmetrically placed fourth telescopic cylinders (201), the two fourth telescopic cylinders (201) are respectively fixed to the two ends of the lower end surface of the strip plate (200), and the bottoms of the fourth telescopic cylinders (201) are fixed on the slide rail (100).
Citation Information
Patent Citations
Circuit board withstand voltage test device
CN221303035U