Equipment hot plug redundancy test method and device, electronic equipment and storage medium

Abstract

The invention discloses an equipment hot plug redundancy test method and device, electronic equipment and a storage medium, and relates to the technical field of computers, and the main technical scheme comprises the following steps: in response to a processing instruction for simulating hot plug of at least one piece of component equipment in a server, performing simulated hot plug processing on the at least one piece of component equipment, obtaining a processing result; the simulation hot plug processing is to simulate state information when the component equipment is in a plug-in state or a plug-out state when the component equipment is in a connection state; and determining whether the server is abnormal or not according to the processing result. Compared with the prior art, the embodiment of the invention has the advantages that the component equipment does not need to be physically inserted and pulled out manually, the test efficiency of the redundancy test of the hot plug of the equipment is improved, the abrasion degree of the interface of the component equipment is reduced, the error probability of the automatic test is lower than that of the manual test, and the test accuracy is further improved.

Description

Technical Field

[0001] The present disclosure relates to the field of computer technology, and in particular to a method and apparatus for redundant testing of hot-swappable devices, an electronic device, and a storage medium. Background Art

[0002] The running component devices in the server are usually equipped with multiple redundant component devices. When an operating component device fails, the running component device is switched to the redundant component device for operation. In order to ensure the normal operation of the server during the component device switching process, the component devices need to be hot-swapped and redundancy tested.

[0003] In the related technologies of device hot-swap redundancy testing, component devices are usually plugged and unplugged manually, resulting in low test efficiency and poor test accuracy of the device hot-swap redundancy testing, and high wear and tear on the interfaces of the component devices. Summary of the Invention

[0004] The present disclosure provides a device hot-swap redundancy test method and apparatus, electronic equipment, and storage medium. Its main purpose is to address the problems of low test efficiency and poor test accuracy in device hot-swap redundancy testing, as well as high wear and tear on the interfaces of component devices.

[0005] According to a first aspect of the present disclosure, a device hot-swap redundancy testing method is provided, comprising:

[0006] In response to a processing instruction for simulating hot plugging of at least one component device in the server, performing a simulated hot plugging process on the at least one component device to obtain a processing result; the simulated hot plugging process is to simulate state information of the component device being in an inserted state or unplugged state when the component device is in a connected state;

[0007] According to the processing result, it is determined whether the server is abnormal.

[0008] Optionally, the simulating hot plugging of the at least one component device includes:

[0009] Obtaining a hot-swap cycle and hot-swap times of the at least one component device;

[0010] Performing simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plug times.

[0011] Optionally, performing simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plugs includes:

[0012] According to the hot plug cycle, the at least one component device is subjected to a simulated unplugging process and a simulated plugging process in a cyclic alternating manner until the number of the simulated unplugging process and the simulated plugging process reaches the number of hot plugs; the simulated unplugging process is to simulate the status information of the component device when it is in an unplugged state when the component device is in a connected state, and the simulated plugging process is to simulate the status information of the component device when it is in an inserted state when the component device is in a connected state.

[0013] Optionally, the cyclically alternating simulated unplugging and simulated plugging of the at least one component device according to the hot plug cycle includes:

[0014] If the number of the at least one component device is not one, obtaining a hot plug sequence corresponding to the at least one component device;

[0015] In a redundant test cycle of hot plugging of a device, a simulated unplugging process is performed on the at least one component device, and a simulated plugging process is performed on the at least one component device according to the hot plugging sequence and the hot plugging cycle.

[0016] Optionally, the simulating unplugging of the at least one component device includes:

[0017] The power supply of the at least one component device is turned off, and the presence signal of the at least one component device is modified to an absence signal; the state information of the component device in the unplugged state includes the power supply of the component device being turned off and the absence signal.

[0018] Optionally, the performing simulated insertion processing on the at least one component device includes:

[0019] The power supply of the at least one component device is turned on, and an out-of-place signal of the at least one component device is modified to a present signal; the state information of the component device when in the inserted state includes the power supply of the component device and the present signal.

[0020] Optionally, determining whether the server is abnormal according to the processing result includes:

[0021] Obtaining a system log of the server during a simulated hot-swap process of at least one component device; wherein the process result includes the system log;

[0022] If there is an error event in the system log, it is determined that the server is abnormal.

[0023] According to a second aspect of the present disclosure, a redundant testing apparatus for hot-swapping of equipment is provided, comprising:

[0024] a processing unit configured to, in response to a processing instruction for simulating hot plugging of at least one component device in the server, perform a simulated hot plugging process on the at least one component device to obtain a processing result; wherein the simulated hot plugging process is to simulate, when the component device is in a connected state, state information of the component device in an inserted state or an unplugged state;

[0025] A determining unit is used to determine whether the server is abnormal based on the processing result.

[0026] Optionally, the processing unit includes:

[0027] An acquisition module, configured to acquire a hot-plug cycle and a hot-plug count of the at least one component device;

[0028] The processing module is configured to perform simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plug times.

[0029] Optionally, the processing module is further configured to:

[0030] According to the hot plug cycle, the at least one component device is subjected to a simulated unplugging process and a simulated plugging process in a cyclic alternating manner until the number of the simulated unplugging process and the simulated plugging process reaches the number of hot plugs; the simulated unplugging process is to simulate the status information of the component device when it is in an unplugged state when the component device is in a connected state, and the simulated plugging process is to simulate the status information of the component device when it is in an inserted state when the component device is in a connected state.

[0031] Optionally, the processing module is further configured to:

[0032] When the number of the at least one component device is not one, obtaining a hot plug sequence corresponding to the at least one component device;

[0033] In a redundant test cycle of hot plugging of a device, a simulated unplugging process is performed on the at least one component device, and a simulated plugging process is performed on the at least one component device according to the hot plugging sequence and the hot plugging cycle.

[0034] Optionally, the processing module is further configured to:

[0035] The power supply of the at least one component device is turned off, and the presence signal of the at least one component device is modified to an absence signal; the state information of the component device in the unplugged state includes the power supply of the component device being turned off and the absence signal.

[0036] Optionally, the processing module is further configured to:

[0037] The power supply of the at least one component device is turned on, and an out-of-place signal of the at least one component device is modified to a present signal; the state information of the component device when in the inserted state includes the power supply of the component device and the present signal.

[0038] Optionally, the determining unit includes:

[0039] an acquisition module, configured to acquire a system log of the server during a simulated hot-swap process of at least one component device; the processing result includes the system log;

[0040] A determination module is used to determine that the server is abnormal when there is an error event in the system log.

[0041] According to a third aspect of the present disclosure, there is provided an electronic device, including:

[0042] at least one processor; and

[0043] a memory communicatively connected to the at least one processor; wherein,

[0044] The memory stores instructions that can be executed by the at least one processor. The instructions are executed by the at least one processor to enable the at least one processor to perform the method described in the first aspect.

[0045] According to a fourth aspect of the present disclosure, a non-transitory computer-readable storage medium storing computer instructions is provided, wherein the computer instructions are used to enable the computer to execute the method described in the first aspect.

[0046] According to a fifth aspect of the present disclosure, a computer program product is provided, comprising a computer program, wherein when the computer program is executed by a processor, the computer program implements the method as described in the first aspect above.

[0047] The present disclosure provides a device hot-plug redundant testing method and apparatus, an electronic device, and a storage medium. In response to a processing instruction for simulating hot plugging of at least one component device in a server, the method performs simulated hot plugging processing on the at least one component device to obtain a processing result. The simulated hot plugging processing is to simulate the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state. Based on the processing result, it is determined whether the server is abnormal. Compared with the related art, the embodiment of the present disclosure performs hot-plug redundant testing on the component device by automatically simulating the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state. There is no need to manually physically plug and unplug the component device, which improves the test efficiency of the device hot-plug redundant testing and reduces the wear of the interface of the component device. Compared with manual testing, the automated test has a lower probability of error, thereby improving the test accuracy.

[0048] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] The accompanying drawings are provided to facilitate a better understanding of the present invention and do not constitute a limitation of the present disclosure.

[0050] Figure 1 A flowchart of a device hot-swap redundancy testing method provided by an embodiment of the present disclosure;

[0051] Figure 2 A schematic diagram of a process flow for simulating hot plugging of a component device provided by an embodiment of the present disclosure;

[0052] Figure 3 A flowchart of a device hot-swap redundancy testing method in a related art provided by the present disclosure;

[0053] Figure 4 A flowchart of another device hot-swap redundancy testing method provided by the present disclosure;

[0054] Figure 5 A schematic diagram of the structure of a device hot-swappable redundant test system provided by an embodiment of the present disclosure;

[0055] Figure 6 A schematic diagram of the structure of a device hot-swappable redundant test device provided by an embodiment of the present disclosure;

[0056] Figure 7 A schematic diagram of the structure of another device hot-swappable redundant testing device provided by an embodiment of the present disclosure;

[0057] Figure 8 A schematic block diagram of an exemplary electronic device provided for an embodiment of the present disclosure. DETAILED DESCRIPTION

[0058] The following description of exemplary embodiments of the present disclosure is made in conjunction with the accompanying drawings, including various details of the embodiments of the present disclosure to facilitate understanding. These details should be considered as merely exemplary. Therefore, those skilled in the art will recognize that various changes and modifications may be made to the embodiments described herein without departing from the scope and spirit of the present disclosure. Similarly, for the sake of clarity and conciseness, descriptions of well-known functions and structures are omitted in the following description.

[0059] The following describes a device hot-plugging redundancy testing method and apparatus, an electronic device, and a storage medium according to embodiments of the present disclosure with reference to the accompanying drawings.

[0060] Figure 1 A flowchart of a device hot-swap redundancy testing method provided by an embodiment of the present disclosure is provided.

[0061] like Figure 1 As shown, the method is applied to the server and includes the following steps:

[0062] Step 101, in response to a processing instruction for simulating hot plugging of at least one component device in a server, performing simulated hot plugging processing on the at least one component device to obtain a processing result; the simulated hot plugging processing is to simulate the status information of the component device when it is in an inserted state or unplugged state when the component device is in a connected state.

[0063] The hot-swappable redundancy test of the server's component devices refers to the unplugging and plugging of redundant component devices in the server while the server is operating normally, to verify whether the redundant component devices can smoothly take over the work when a component device fails and needs to be switched, thereby ensuring the overall stability and reliability of the server.

[0064] Component devices refer to hardware components in the server that are equipped with redundant components, including but not limited to hard drives, fans, power supply units (PSUs), memory modules, and network cards.

[0065] A processing instruction refers to an operating instruction that starts a simulated hot-plug test on at least one component device in a server. The processing instruction can be triggered by a tester using a remote terminal to send the processing instruction to a processor in the server, and the processor in the server performs simulated hot-plug processing on at least one component device based on the processing instruction. The processing instruction can also be triggered by a tester using an operation interface of the server to directly send the processing instruction to the processor in the server, or by setting a trigger time for the processing instruction, so that the processing instruction is automatically triggered when the trigger time is reached. The processing instruction can be controlled in the form of a script, including but not limited to issuing control commands for simulated hot-plug processing and detecting whether there is an error event in the log generated by the server when the server performs simulated hot-plug processing on at least one component device. The processor includes but is not limited to a baseboard management controller (Baseboard Management Controller, BMC) and a complex programmable logic device (Complex Programmable Logic Device, CPLD).

[0066] Simulated hot-swap processing refers to simulating the status information of a component device when it is in an inserted or unplugged state through software or hardware means while the component device is in a connected state. This does not actually unplug or plug the component device from the server, but rather simulates the effects of similar unplugging or plugging operations without interrupting the normal operation of the server, so as to test the server's redundancy mechanism and the hot-plug compatibility of the component device. The status information refers to the various signals and parameters when the component device is in an unplugged state or plugged in state. For example, when simulating a component device in an unplugged state, the status information includes but is not limited to the component device's power-off and out-of-place signals; when simulating a component device in an inserted state, the status information includes but is not limited to the component device's power-on and in-place signals. The status information is used to allow the server to perceive the "unplugged" or "plugged" state of the component device, thereby triggering corresponding redundancy switching and other operations.

[0067] The execution method of simulating hot plugging and unplugging at least one component device can be to randomly simulate hot plugging and unplugging a preset number of component devices in the server, or to simulate hot plugging and unplugging a preset number of component devices according to the hot plugging order of the component devices, or to simulate hot plugging and unplugging all component devices according to the hot plugging order of the component devices.

[0068] Hot-swap simulation allows automated testing tools or scripts to automatically test server components according to pre-set hot-swap cycles and times. This eliminates the need for manual insertion and removal of component devices, reducing testing time and effort, and improving test efficiency. By simulating component device status during insertion and removal, such as power on / off and presence signal changes, the impact of actual hot-swap operations on the server system can be more accurately simulated. This precise simulation helps more realistically reflect the server's behavior and response during component hot-swap operations, thereby improving the accuracy of test results. Manual insertion and removal are prone to errors, such as improper insertion and removal and uneven speeds, which can affect test results. Hot-swap simulation, however, can be performed according to strictly defined parameters, eliminating human interference and ensuring consistency and accuracy in every test. Traditional manual hot-swap testing requires frequent physical insertion and removal of component devices, which can cause significant wear and tear on interfaces and connectors, reducing their service life. By simulating hot-swap processing, there is no need to actually plug and unplug component devices, which effectively reduces the number of physical plug-ins and plug-outs, reduces equipment wear, and extends the service life of component devices.

[0069] Step 102: Determine whether the server is abnormal based on the processing result.

[0070] The processing result is the result obtained after performing a simulated hot-swap operation on at least one component device. This result can include various information, such as the server's system log, component device status change records, and changes in server performance indicators. These results are used to evaluate the server's performance during the simulated hot-swap operation, determine whether any server anomalies exist, and determine whether the redundancy mechanism is functioning properly.

[0071] During the simulated hot-swap process, the server's system log is captured in real time. System logs record various events during server operation, including hardware status changes, software operation status, and error messages. These logs provide a detailed overview of the server's internal operating status during the simulated hot-swap operation. If any of these error events are found in the system logs, it can be determined that an anomaly occurred during the simulated hot-swap process.

[0072] The system logs in the processing results provide a detailed record of the status changes and related events of each component device during the simulated hot-swap process. By analyzing the system logs, you can pinpoint the specific component device and process that caused the server anomaly. For example, you can determine whether a specific power module triggered a system error during the simulated insertion, or whether a network interface card failed to restore communication after a simulated removal. This precise location helps resolve issues quickly and efficiently, reducing the time and effort required for troubleshooting.

[0073] The present disclosure provides a device hot-plug redundant testing method, which responds to a processing instruction for simulating hot plugging of at least one component device in a server, performs simulated hot plugging processing on the at least one component device to obtain a processing result; the simulated hot plugging processing is to simulate the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state; and determines whether the server is abnormal based on the processing result. Compared with the related art, the embodiment of the present disclosure performs hot-plug redundant testing on the component device by automatically simulating the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state, without the need for manual physical insertion and unplugging of the component device, thereby improving the test efficiency of the device hot-plug redundant testing and reducing the wear of the interface of the component device. Compared with manual testing, the automated test has a lower probability of error, thereby improving the test accuracy.

[0074] As a refinement of step 101, when performing the simulated hot plug processing on the at least one component device, it can be implemented in the following manner but is not limited to: Figure 2 As shown, Figure 2 A schematic diagram of a process flow for simulating hot plugging of a component device provided in an embodiment of the present disclosure includes:

[0075] Step 201: Obtain the hot-plug cycle and hot-plug times of at least one component device.

[0076] The hot-swap cycle refers to the time interval required to complete a simulated removal and insertion of a server component device during a simulated hot-swap test. The hot-swap cycle controls the frequency of simulated hot-swap operations, i.e., the interval between simulated hot-swap operations. The hot-swap count refers to the total number of simulated removals and insertions of a server component device during a simulated hot-swap test. The hot-swap count controls the scale and intensity of the simulated hot-swap test, i.e., the number of simulated hot-swap operations performed on a component device.

[0077] The hot-swap cycle and the number of hot-swap times can be flexibly adjusted according to test requirements to adapt to different test scenarios. The embodiments of the present disclosure do not limit the specific setting values ​​of the hot-swap cycle and the number of hot-swap times.

[0078] Step 202: Perform simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plug times.

[0079] According to the set hot-swap cycle, a timer is started. The timer is used to control the frequency of simulated hot-swap operations to ensure that the time interval between each operation meets the requirements. When the timer reaches one hot-swap cycle, the specified component device is simulated unplugged. The specific operation includes turning off the power of the component device and changing its in-place signal to an out-of-place signal. In this way, the server will believe that the component device has been unplugged. When the timer reaches another hot-swap cycle, the component device is simulated inserted. The operation includes turning on the power of the component device and changing its out-of-place signal to an in-place signal, so that the server believes that the component device has been reinserted.

[0080] After each simulated unplug and plug process is completed, a check is performed to see if the set number of hot plugs has been reached. If not, the hot plug cycle continues for the next round; if so, the simulated hot plug process for the component device ends.

[0081] Different hot-swap cycles and times can simulate a variety of usage scenarios, ranging from occasional plugging and unplugging to frequent component replacement. This allows for a more comprehensive assessment of server performance and stability under various possible hot-swap operations, avoiding misjudgment of actual server operation due to incomplete testing scenarios.

[0082] As a refinement of step 202, when performing the simulated hot plug processing of the at least one component device according to the hot plug cycle and the number of hot plugs, it can be implemented in but not limited to the following manner: according to the hot plug cycle, the at least one component device is cyclically and alternately subjected to simulated unplugging processing and simulated plugging processing until the number of simulated unplugging processing and simulated plugging processing reaches the number of hot plugs; the simulated unplugging processing is to simulate the status information of the component device when it is in the unplugged state when the component device is in the connected state, and the simulated plugging processing is to simulate the status information of the component device when it is in the plugged state when the component device is in the connected state.

[0083] The simulated unplugging process simulates the status information of the component device when it is in the unplugged state when it is in the connected state. The specific operations include but are not limited to turning off the power of the component device and changing the component device's in-place signal to a not-in-place signal. The simulated insertion process simulates the status information of the component device when it is in the plugged-in state when it is in the connected state. The specific operations include but are not limited to turning on the power of the component device and changing the component device's not-in-place signal to a in-place signal. According to the hot plug cycle, simulated unplugging and simulated insertion processes are performed alternately. Wait for the hot plug cycle after each operation and repeat the operation until the hot plug count is reached. It supports complex scenario testing and improves the performance of verifying the stability and redundancy capabilities of the system.

[0084] As a refinement of the above embodiment, when executing the simulated unplugging process and the simulated plugging process of the at least one component device in accordance with the hot plug cycle, it can be implemented in but not limited to the following manner: if the number of the at least one component device is not one, obtain the hot plug sequence corresponding to the at least one component device; within a redundant test cycle of hot plugging a device, simulated unplugging process is performed on the at least one component device, and simulated plugging process is performed on the at least one component device in accordance with the hot plug sequence and the hot plug cycle.

[0085] A redundancy test cycle is the process of performing a complete simulated removal and insertion of at least one component device in a server during a hot-swap redundancy test. This cycle is performed according to a pre-set hot-swap cycle, with each redundancy test cycle including simulated removal and insertion of one or more component devices until the pre-set number of hot-swap attempts is reached. The hot-swap sequence refers to the order in which multiple component devices are simulated removed and inserted within the same redundancy test cycle. When testing multiple component devices, a pre-determined sequence is required to ensure an orderly and controllable test.

[0086] To facilitate understanding, an example is provided. Suppose there are three component devices in a server that require hot-swappable redundancy testing. These are A, B, and C. The hot-swappable cycle is 1 minute, the number of hot-swappable attempts is 2, and the hot-swappable order is A, B, and C. The first redundancy test cycle is 0 minutes: Start the test by simulating the unplugging of A. 1 minute: Simulate the plugging of A. 2 minutes: Simulate the unplugging of B. 3 minutes: Simulate the plugging of B. 4 minutes: Simulate the unplugging of C. 5 minutes: Simulate the plugging of C. The second redundancy test cycle is: 6 minutes: Simulate the unplugging of A. 7 minutes: Simulate the plugging of A. 8 minutes: Simulate the unplugging of B. 9 minutes: Simulate the plugging of B. 10 minutes: Simulate the unplugging of C. 11 minutes: Simulate the plugging of C.

[0087] As a refinement of the above embodiment, when performing the simulated unplugging processing of the at least one component device, it can be implemented in but not limited to the following manner: turning off the power of the at least one component device and modifying the in-place signal of the at least one component device to an out-of-place signal; the status information of the component device when it is in the unplugged state includes the power-off signal of the component device and the out-of-place signal.

[0088] The in-place signal is a logical signal that indicates that a component device is correctly installed in the corresponding slot of the server and can be recognized and used by the server. The in-place signal is sent to the server when the component device is connected and functioning normally. The out-of-place signal is a logical signal that indicates that a component device is not installed in the corresponding slot of the server, or that, although physically installed, it is not recognized as a usable device by the server. The out-of-place signal is sent to the server when a component device is removed or malfunctions and is not functioning properly.

[0089] The power of the component device can be turned off by lowering the level signal of the component device until the power of the component device is turned off, and the power of the component device can be turned on by raising the level signal of the component device until the power of the component device is turned on.

[0090] As a refinement of the above embodiment, when performing the simulated insertion processing of the at least one component device, it can be implemented in the following manner, but not limited to: turning on the power of the at least one component device, and modifying the out-of-place signal of the at least one component device to an in-place signal; the status information of the component device when in the inserted state includes the power-on and in-place signals of the component device. It can highly simulate the actual hot-swap operation. In actual use, when the component device is unplugged, its power will be turned off, and the server will detect that the device is not in place; when the device is plugged in, the power will be turned on, and the server will detect that the device is in place. By simulating the hot-swap method, the test can more realistically reflect the behavior and reaction of the server in the actual hot-swap operation.

[0091] As a refinement of step 102, when determining whether the server is abnormal based on the processing result, it can be implemented in the following manner but is not limited to: obtaining the system log of the server during the simulated hot-plug processing of at least one component device; the processing result includes the system log; if there is an error event in the system log, it is determined that the server is abnormal.

[0092] System logs are records generated during server operation, containing detailed information such as system operating status, operational events, and error messages. Error events are exceptions or failures recorded in the system log, indicating that a problem occurred during the simulated hot-swap process. By analyzing error events in the system log, you can quickly locate specific server issues during the simulated hot-swap process (such as component device switching failures and power management anomalies).

[0093] In order to better understand the redundant test method of hot-swappable equipment in related technologies, such as Figure 3 As shown, Figure 3This is a flow chart of a redundant testing method for hot-plugging devices in a related technology provided by the present invention. When the server is in the power-on state and there is no error event in the system log of the server, component device 1 is manually unplugged to observe whether there is an error event in the system log. If no error event occurs, component device 1 is manually inserted and component device 2 is tested according to the test method of component device 1. If no error event occurs during the test of component device 2, component device 1 and component device 2 are alternately plugged and unplugged for testing, and the test stops when an error event occurs.

[0094] In order to better understand the public device hot plug redundancy test method, such as Figure 4 As shown, Figure 4 A flow chart of another device hot-plug redundant testing method provided by the present invention, in which, when the server is in the power-on state and there is no error event in the system log of the server, a processing instruction for simulating hot plugging of component device 1 and component device 2 in the server is sent to the processor in the server. The processor in the server automatically performs a simulated unplugging process on component device 1 according to the processing instruction, and determines whether an error event is generated in the system log of the server during the hot-plug cycle. If no error event is generated, simulated insertion process is performed on component device 1, and determines whether an error event is generated in the system log of the server during the hot-plug cycle. If no error event is generated, component device 2 is tested according to the test method of component device 1. If no error event is generated, component device 1 and component device 2 are tested alternately in a cyclic manner. If an error event is generated, the test is stopped.

[0095] In order to better understand the entire system of hot-swappable redundant testing of equipment, such as Figure 5 As shown, Figure 5 This is a schematic diagram of a device hot-swap redundancy test system provided by an embodiment of the present disclosure. A remote terminal sends a processing instruction to the BMC to simulate hot-swap at least one component device in a server. Based on the processing instruction, the BMC controls the server's CPLD to simulate hot-swap processing on the component device. The BMC and CPLD work together to remotely implement device hot-swap redundancy testing. Remote terminals include, but are not limited to, intelligent electronic devices such as desktop computers, tablets, laptops, smart watches, and smartphones.

[0096] In summary, the embodiments of the present disclosure can achieve the following effects:

[0097] The disclosed embodiment performs hot-swappable redundant testing on component devices by automatically simulating status information of component devices in an inserted state or an unplugged state when the component devices are in a connected state. This eliminates the need for manual physical insertion and unplugging of component devices, thereby improving the test efficiency of hot-swappable redundant testing of devices and reducing the wear of the interfaces of component devices. Compared with manual testing, automated testing has a lower probability of error, thereby improving test accuracy.

[0098] Corresponding to the aforementioned device hot-swap redundancy testing method, the present invention also provides a device hot-swap redundancy testing apparatus. Since the apparatus embodiment of the present invention corresponds to the aforementioned method embodiment, details not disclosed in the apparatus embodiment may be referred to the aforementioned method embodiment and will not be further described in this invention.

[0099] Figure 6 This is a structural diagram of a device hot-swappable redundant test device provided by an embodiment of the present disclosure, the device is applied to a server, such as Figure 6 Shown, including:

[0100] The processing unit 31 is configured to, in response to a processing instruction for simulating hot plugging of at least one component device in the server, perform a simulated hot plugging process on the at least one component device to obtain a processing result; the simulated hot plugging process is to simulate, when the component device is in a connected state, state information of the component device being in an inserted state or an unplugged state;

[0101] The determining unit 32 is configured to determine whether the server is abnormal based on the processing result.

[0102] The device hot-plug redundant test device provided by the present disclosure responds to a processing instruction for simulating hot plugging of at least one component device in a server, performs simulated hot plugging processing on the at least one component device, and obtains a processing result; the simulated hot plugging processing is to simulate the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state; and determines whether the server is abnormal based on the processing result. Compared with the related art, the embodiment of the present disclosure performs hot-plug redundant testing on the component device by automatically simulating the status information of the component device when it is in an inserted state or an unplugged state when the component device is in a connected state, without the need for manual physical insertion and unplugging of the component device, thereby improving the test efficiency of the device hot-plug redundant test and reducing the wear of the interface of the component device. Compared with manual testing, the automated test has a lower probability of error, thereby improving the test accuracy.

[0103] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the processing unit 31 includes:

[0104] An acquisition module 311 is configured to acquire a hot-swap cycle and a hot-swap count of the at least one component device;

[0105] The processing module 312 is configured to perform simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plug times.

[0106] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the processing module 312 is further used to:

[0107] According to the hot plug cycle, the at least one component device is subjected to a simulated unplugging process and a simulated plugging process in a cyclic alternating manner until the number of the simulated unplugging process and the simulated plugging process reaches the number of hot plugs; the simulated unplugging process is to simulate the status information of the component device when it is in an unplugged state when the component device is in a connected state, and the simulated plugging process is to simulate the status information of the component device when it is in an inserted state when the component device is in a connected state.

[0108] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the processing module 312 is further used to:

[0109] When the number of the at least one component device is not one, obtaining a hot plug sequence corresponding to the at least one component device;

[0110] In a redundant test cycle of hot plugging of a device, a simulated unplugging process is performed on the at least one component device, and a simulated plugging process is performed on the at least one component device according to the hot plugging sequence and the hot plugging cycle.

[0111] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the processing module 312 is further used to:

[0112] The power supply of the at least one component device is turned off, and the presence signal of the at least one component device is modified to an absence signal; the state information of the component device in the unplugged state includes the power supply of the component device being turned off and the absence signal.

[0113] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the processing module 312 is further used to:

[0114] The power supply of the at least one component device is turned on, and an out-of-place signal of the at least one component device is modified to a present signal; the state information of the component device when in the inserted state includes the power supply of the component device and the present signal.

[0115] Furthermore, in a possible implementation of the embodiment of the present disclosure, as Figure 7 As shown, the determining unit 32 includes:

[0116] An acquisition module 321 is configured to acquire a system log of the server during a simulated hot-swap process of at least one component device; the processing result includes the system log;

[0117] The determination module 322 is configured to determine that the server is abnormal when there is an error event in the system log.

[0118] It should be noted that the above explanation of the method embodiment is also applicable to the device of the embodiment of the present disclosure, and the principles are the same, which is no longer limited in the embodiment of the present disclosure.

[0119] According to an embodiment of the present disclosure, the present disclosure further provides an electronic device and a readable storage medium.

[0120] Figure 8 A schematic block diagram of an example electronic device 400 that can be used to implement embodiments of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are provided as examples only and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0121] like Figure 8 As shown, the device 400 includes a computing unit 401, which can perform various appropriate actions and processes according to a computer program stored in a ROM (Read-Only Memory) 402 or a computer program loaded from a storage unit 408 into a RAM (Random Access Memory) 403. Various programs and data required for the operation of the device 400 can also be stored in the RAM 403. The computing unit 401, the ROM 402, and the RAM 403 are connected to each other via a bus 404. An I / O (Input / Output) interface 405 is also connected to the bus 404.

[0122] Various components in device 400 are connected to I / O interface 405, including an input unit 406, such as a keyboard, mouse, etc.; an output unit 407, such as various types of displays, speakers, etc.; a storage unit 408, such as a magnetic disk, optical disk, etc.; and a communication unit 409, such as a network card, modem, wireless communication transceiver, etc. Communication unit 409 allows device 400 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0123] Computing unit 401 can be any general-purpose and / or specialized processing component with processing and computing capabilities. Some examples of computing unit 401 include, but are not limited to, a CPU (Central Processing Unit), a GPU (Graphic Processing Unit), various specialized AI (Artificial Intelligence) computing chips, various computing units that run machine learning model algorithms, a DSP (Digital Signal Processor), and any suitable processor, controller, microcontroller, etc. Computing unit 401 performs the various methods and processes described above, such as the device hot-swap redundancy testing method. For example, in some embodiments, the device hot-swap redundancy testing method can be implemented as a computer software program tangibly embodied in a machine-readable medium, such as storage unit 408. In some embodiments, part or all of the computer program can be loaded and / or installed onto device 400 via ROM 402 and / or communication unit 409. When the computer program is loaded into RAM 403 and executed by computing unit 401, one or more steps of the method described above can be performed. Alternatively, in other embodiments, the computing unit 401 may be configured to execute the aforementioned device hot-plugging redundancy testing method in any other appropriate manner (eg, by means of firmware).

[0124] Various embodiments of the systems and techniques described herein can be implemented in digital electronic circuit systems, integrated circuit systems, FPGAs (Field Programmable Gate Arrays), ASICs (Application-Specific Integrated Circuits), ASSPs (Application Specific Standard Products), SOCs (System on Chips), CPLDs (Complex Programmable Logic Devices), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include being implemented in one or more computer programs that are executable and / or interpreted on a programmable system that includes at least one programmable processor, which can be a special-purpose or general-purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0125] The program code for implementing the method of the present disclosure can be written in any combination of one or more programming languages. These program codes can be provided to a processor or controller of a general-purpose computer, a special-purpose computer, or other programmable data processing device so that when the program code is executed by the processor or controller, the functions / operations specified in the flow chart and / or block diagram are implemented. The program code can be executed entirely on the machine, partially on the machine, as a stand-alone software package, partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0126] In the context of the present disclosure, a machine-readable medium may be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, device, or apparatus. A machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or apparatus, or any suitable combination of the foregoing. More specific examples of machine-readable storage media may include an electrical connection based on one or more wires, a portable computer disk, a hard disk, RAM, ROM, EPROM (Electrically Programmable Read-Only-Memory) or flash memory, optical fiber, CD-ROM (Compact Disc Read-Only Memory), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0127] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device (e.g., a CRT (Cathode-Ray Tube) or LCD (Liquid Crystal Display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user can provide input to the computer. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0128] The systems and techniques described herein can be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: LAN (Local Area Network), WAN (Wide Area Network), the Internet, and blockchain networks.

[0129] A computer system may include a client and a server. The client and server are generally remote from each other and typically interact via a communication network. This client-server relationship is established by computer programs running on the respective computers, establishing a client-server relationship. The server may be a cloud server, also known as a cloud computing server or cloud host, a host product within the cloud computing service ecosystem that addresses the management difficulties and limited scalability of traditional physical hosts and VPS services ("Virtual Private Servers" or simply "VPS"). The server may also be a server in a distributed system or a server integrated with blockchain.

[0130] It's important to note that artificial intelligence (AI) is the study of how computers can simulate certain human thought processes and intelligent behaviors (such as learning, reasoning, thinking, and planning). This encompasses both hardware and software technologies. AI hardware technologies generally include sensors, specialized AI chips, cloud computing, distributed storage, and big data processing. AI software technologies primarily encompass computer vision, speech recognition, natural language processing, machine learning / deep learning, big data processing, and knowledge graphs.

[0131] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in this disclosure can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved. This is not limited herein.

[0132] The above specific embodiments do not constitute a limitation on the scope of protection of this disclosure. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this disclosure shall be included within the scope of protection of this disclosure.

Claims

1. A redundant testing method for hot-plugging of equipment, characterized in that: include: In response to a processing instruction for simulating hot plugging of at least one component device in the server, performing a simulated hot plugging process on the at least one component device to obtain a processing result; the simulated hot plugging process is to simulate the state information of the component device being in an inserted state or unplugged state when the component device is in a connected state; According to the processing result, it is determined whether the server is abnormal.

2. The method according to claim 1, characterized in that The simulating hot plugging of the at least one component device comprises: Obtaining a hot-swap cycle and a hot-swap number of the at least one component device; According to the hot plug cycle and the number of hot plug times, simulated hot plug processing is performed on the at least one component device.

3. The method according to claim 2, characterized in that The performing simulated hot plug processing on the at least one component device according to the hot plug cycle and the number of hot plug times includes: According to the hot plug cycle, the at least one component device is subjected to a simulated unplugging process and a simulated plugging process alternately in a cycle until the number of the simulated unplugging process and the simulated plugging process reaches the number of hot plug times; the simulated unplugging process is to simulate the state information of the component device when it is in an unplugged state when the component device is in a connected state, and the simulated plugging process is to simulate the state information of the component device when it is in an plugged state when the component device is in a connected state.

4. The method according to claim 3, characterized in that According to the hot plug cycle, cyclically and alternately performing simulated unplugging and simulated plugging processing on the at least one component device includes: If the number of the at least one component device is not one, obtaining a hot plug sequence corresponding to the at least one component device; In a redundant test cycle of hot plugging of a device, a simulated unplugging process is performed on the at least one component device and a simulated plugging process is performed on the at least one component device according to the hot plugging sequence and the hot plugging cycle.

5. The method according to any one of claims 3 to 4, characterized in that: The simulating unplugging process of the at least one component device comprises: The power of at least one component device is turned off, and the on-site signal of at least one component device is modified to an off-site signal; the state information of the component device when being unplugged includes the power off and the off-site signal of the component device.

6. The method according to any one of claims 3 to 4, characterized in that: The performing of the simulated insertion process on the at least one component device comprises: The power of the at least one component device is turned on, and the out-of-place signal of the at least one component device is modified to a presence signal; the state information of the component device when in the inserted state includes the power on and the presence signal of the component device.

7. The method according to any one of claims 1, characterized in that Determining whether the server is abnormal according to the processing result includes: Acquiring a system log of the server during a simulated hot-swap process of at least one component device; the process result includes the system log; If there is an error event in the system log, it is determined that the server is abnormal.

8. A redundant test device for hot-swappable equipment, characterized in that: include: A processing unit, configured to respond to a processing instruction for simulating hot plugging of at least one component device in the server, perform simulated hot plugging processing on the at least one component device, and obtain a processing result; the simulated hot plugging processing is to simulate the state information of the component device being in an inserted state or unplugged state when the component device is in a connected state; A determination unit is used to determine whether the server is abnormal according to the processing result.

9. An electronic device, characterized in that: include: at least one processor; as well as a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 1 to 7.

10. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: The computer instructions are used to cause the computer to execute the method according to any one of claims 1-7.

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