Wide-range multifunctional analysis device

Abstract

The embodiment of the invention provides a wide-range multifunctional analysis device. The wide-range multifunctional analysis device comprises a light source assembly, a sample pool, a first detector (an L-boundary transmission spectrum detector) and a second detector (an X-ray fluorescence spectrum detector). The light source assembly is used for emitting primary X-rays. The sample pool is arranged on one side of the light source assembly so as to receive the irradiated primary X-rays, and the primary X-rays irradiate a sample in the sample pool so as to obtain a transmission spectrum and an X-ray fluorescence spectrum. A first detector is disposed on an optical path of the transmitted spectrum to measure the transmitted spectrum. A second detector is disposed on an optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum. The wide-range multifunctional analysis device provided by the embodiment of the invention is wide in fluctuation range of the content in the measured solution.

Description

Technical Field

[0001] The present application relates to the technical field of post-processing analysis, and in particular to a wide-range and multifunctional analysis device. Background Art

[0002] Post-processing analysis technology is the "eye" of the post-processing process and the key to ensuring the safe and stable operation of the post-processing process. In the uranium-based post-processing PUREX process, there are a large number of uranium samples, plutonium samples and uranium-plutonium mixed samples with a wide concentration range. Whether the concentration of uranium and plutonium samples can be analyzed quickly and accurately also directly affects the processing efficiency and stability of the entire process.

[0003] However, during the trial run or when the process is abnormal, the concentration range of the process samples varies greatly. At this time, some samples need to be re-adjusted and re-measured due to the incorrect measurement range, which greatly increases the workload and radiation dose of the staff, and also reduces the analysis efficiency. In addition, the concentration range measured by the analysis device in the current related technology is relatively small. Summary of the invention

[0004] In view of this, the main purpose of the embodiments of the present application is to provide a wide-range multifunctional analysis device that can measure the fluctuation of the content in a solution over a wide range.

[0005] To achieve the above purpose, the technical solution of the embodiment of the present application is implemented as follows:

[0006] The present application provides a wide-range multifunctional analysis device, comprising:

[0007] A light source assembly, the light source assembly is used to emit primary X-rays;

[0008] A sample pool, the sample pool is arranged at one side of the light source assembly to receive the irradiated primary X-rays, the primary X-rays are irradiated onto the sample in the sample pool to obtain a transmission spectrum and an X-ray fluorescence spectrum;

[0009] a first detector, the first detector being arranged on an optical path of the transmission spectrum to measure the transmission spectrum;

[0010] A second detector is arranged on an optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum.

[0011] In one embodiment, at least one of the first detector and the second detector is a silicon drift detector.

[0012] In one embodiment, the X-ray fluorescence spectrum is the X-ray fluorescence spectrum generated when the X-rays are irradiated onto the sample in the sample cell to interact with the sample.

[0013] In one embodiment, the optical path of the transmission spectrum is perpendicular to the optical path of the X-ray fluorescence spectrum.

[0014] In one embodiment, the analysis device comprises a primary collimator and a primary filter, wherein the primary filter and the primary collimator are sequentially arranged on an irradiation light path from the light source assembly to the sample cell; and / or,

[0015] The analysis device comprises a secondary collimator and a secondary filter, and the secondary collimator and the secondary filter are sequentially arranged on the optical path of the transmission spectrum from the sample cell to the first detector.

[0016] In one embodiment, the analysis device includes a diffractor, and the diffractor is arranged on an optical path of the X-ray fluorescence spectrum from the sample cell to the second detector.

[0017] In one embodiment, the analysis device further includes a shielding shell, the light source assembly includes an X-ray tube, and the head of the X-ray tube, the sample pool, the head of the first detector, and the head of the second detector are respectively arranged in the shielding shell.

[0018] In one embodiment, the shielding shell is made of stainless steel or copper; and / or,

[0019] The thickness of the shielding shell is greater than or equal to 10 mm.

[0020] In one embodiment, the analysis device further includes a digital processor, and the digital processor is respectively connected to the first detector and the second detector for receiving detection data from the first detector and the second detector.

[0021] In one embodiment, the analysis device further comprises a controller, wherein the controller is connected to the light source assembly and the digital processor respectively, so as to display the working state of the light source assembly in real time through the digital processor; and / or,

[0022] The digital processor includes a data acquisition module and a data analysis module, the data acquisition module is used to receive and pre-process the measured spectral data of the first detector and the second detector, and the data analysis module is used to perform XRF analysis, LED analysis, LED / XRF hybrid analysis or self-correction on the measured spectral data after pre-processing the transmission spectrum and the X-ray fluorescence spectrum.

[0023] The embodiment of the present application provides a wide-range multifunctional analysis device, including a light source assembly, a sample cell, a first detector and a second detector. The light source assembly is used to emit primary X-rays. The sample cell is arranged on one side of the light source assembly to receive the irradiated primary X-rays, and the primary X-rays are irradiated onto the sample in the sample cell to obtain a transmission spectrum and an X-ray fluorescence spectrum. The first detector is arranged on the optical path of the transmission spectrum to measure the transmission spectrum. The second detector is arranged on the optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum. Thus, on the one hand, by setting two detectors, namely the first detector and the second detector, the measurement range of the analysis device is broadened, so that it can simultaneously meet the measurement requirements of trace and constant samples, greatly reducing the measurement workload and the irradiation dose of the staff. On the other hand, the analysis device meets the measurement of uranium samples, plutonium samples and even uranium-plutonium mixed samples with a large concentration range during the trial stage of the new process or when the process is abnormal, thereby improving the practicality and analysis efficiency of the analysis device and saving costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 This is a schematic diagram of the principle structure of a wide-range multifunctional analysis device according to an embodiment of the present application;

[0025] Figure 2 This is a schematic diagram of the optical path design of a wide-range multifunctional analysis device according to another embodiment of the present application, in which the dotted line is the optical path of the transmission spectrum and the dotted line is the optical path of the X-ray fluorescence spectrum;

[0026] Figure 3 This is a schematic structural diagram of a shielding shell of a wide-range multifunctional analysis device according to another embodiment of the present application;

[0027] Figure 4 This is a schematic structural diagram of a control system of a wide-range multifunctional analysis device according to another embodiment of the present application.

[0028] Description of Reference Numerals

[0029] 10. Light source assembly; 101. X-ray tube; 11. Sample cell; 12. First detector; 13. Second detector; 14. Primary collimator; 15. Primary filter; 16. Secondary collimator; 17. Secondary filter; 18. Diffractor; 19. Shielding shell; 19a. Accommodating cavity; 20. Digital processor; 201. Analog-to-digital conversion module; 21. Controller; 211. Communication module; 22. Protection circuit. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly described below in conjunction with the drawings in the embodiments of the present application. The following embodiments are only used to more clearly illustrate the technical scheme of the present application, and are therefore only used as examples, and the protection scope of the present application cannot be limited by this. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present application.

[0031] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0032] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0033] An embodiment of the present application provides a wide range and multifunctional analysis device, see Figure 1 and Figure 2 The analysis device includes a light source assembly, a sample pool 11, a first detector 12 and a second detector 13.

[0034] The light source assembly 10 is used to emit primary X-rays.

[0035] The sample cell 11 is disposed at one side of the light source assembly 10 to receive the irradiated primary X-rays. The primary X-rays irradiate the sample in the sample cell to obtain a transmission spectrum and an X-ray fluorescence spectrum.

[0036] The first detector 12 is disposed on the optical path of the transmission spectrum to measure the transmission spectrum.

[0037] The second detector 13 is arranged on the optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum.

[0038] Specifically, the light source assembly 10 refers to a component in the analysis device that emits primary X-rays.

[0039] The sample pool 11 refers to a component for placing a sample to be tested. The sample pool 11 can effectively receive the primary X-rays emitted by the light source assembly 10 and allow the primary X-rays to fully interact with the sample, thereby generating a transmission spectrum and an X-ray fluorescence spectrum.

[0040] It should be noted that the transmission spectrum refers to the spectrum of the primary X-ray irradiated on the sample in the sample cell 11 and transmitted through the sample.

[0041] The first detector 12 is a component used to detect the transmission spectrum after passing through the sample and perform LED analysis (L boundary densitometer analysis), thereby meeting the measurement requirements of constant samples.

[0042] The second detector 13 is a component for detecting the fluorescence spectrum of X-rays after passing through the sample and performing XRF analysis (X-ray fluorescence analysis), thereby meeting the measurement requirements of trace samples.

[0043] The structure types of the first detector 12 and the second detector 13 are not limited. For example, at least one of the first detector and the second detector 13 is a silicon drift detector. Thus, the measurement accuracy can be improved.

[0044] Specifically, only the first detector 12 may be a silicon drift detector, only the second detector 13 may be a silicon drift detector, or both the first detector 12 and the second detector 13 may be silicon drift detectors.

[0045] The structure type of the light source assembly 10 is not limited.

[0046] For example, the light source assembly 10 includes an X-ray tube 101 and a power supply, which are electrically connected. According to the detection requirements of different samples in the sample pool 11, the power supply adjusts the voltage and current so that the X-ray tube 101 emits primary X-rays of different energies and intensities.

[0047] The structural type of the X-ray tube 101 is not limited.

[0048] For example, the X-ray tube 101 is a silver transmission target X-ray tube 101 of 50 kV and 1000 μA.

[0049] The heat dissipation form of the X-ray tube 101 is not limited.

[0050] For example, the heat dissipation form of the X-ray tube 101 is air cooling.

[0051] The structure type of the power supply is not limited.

[0052] For example, the power supply is a 24V DC power supply.

[0053] The analysis device provided in the embodiment of the present application includes a light source assembly 10, a sample cell 11, a first detector 12 and a second detector 13. The light source assembly 10 is used to emit primary X-rays. The sample cell 11 is arranged on one side of the light source assembly 10 to receive the irradiated primary X-rays, and the primary X-rays are irradiated onto the sample in the sample cell to obtain a transmission spectrum and an X-ray fluorescence spectrum. The first detector 12 is arranged on the optical path of the transmission spectrum to measure the transmission spectrum. The second detector 13 is arranged on the optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum. Thus, on the one hand, by setting two detectors, namely the first detector 12 and the second detector 13, the measurement range of the analysis device is broadened, so that it can simultaneously meet the measurement requirements of trace and constant samples, greatly reducing the measurement workload and the irradiation dose of the staff. On the other hand, the analysis device meets the measurement of uranium samples, plutonium samples and even uranium-plutonium mixed samples with a large concentration range during the commissioning stage of the new process or when the process is abnormal, thereby improving the practicality and analysis efficiency of the analysis device and saving costs.

[0054] In one embodiment, please refer to Figure 1 and Figure 2 The X-ray fluorescence spectrum is an X-ray fluorescence spectrum generated when the primary X-rays are irradiated onto the sample in the sample pool 11 to interact with the sample.

[0055] Specifically, when the primary X-rays are irradiated onto the sample, the inner electrons of the atoms in the sample absorb the energy of the primary X-rays and are excited to the outer layer or separated from the atoms, so that the atoms are in an excited state. Subsequently, the outer electrons will transition to the inner vacancies to release excess energy. The energy generated in this process is emitted in the form of X-rays, which is the X-ray fluorescence spectrum. The X-ray fluorescence spectrum is emitted by the sample pool 11 and is emitted into the second detector 13, and is received by the second detector 13.

[0056] In one embodiment, please refer to Figure 2 , the optical path of the transmission spectrum is perpendicular to the optical path of the X-ray fluorescence spectrum. Therefore, the irradiation optical path of the primary X-ray irradiating the sample pool 11, the optical path of the transmission spectrum of the primary X-ray passing through the sample pool 11, and the optical path of the X-ray fluorescence spectrum together form a "T"-shaped optical path, which enables the first detector 12 and the second detector 13 to share a sample pool 11, thereby simplifying the optical path and reducing the size of the instrument.

[0057] In one embodiment, please refer to Figure 1 and Figure 2The analysis device includes a primary collimator 14 and a primary filter 15, and the primary filter 15 and the primary collimator 14 are sequentially arranged on the irradiation light path from the light source assembly 10 to the sample pool 11. Therefore, on the one hand, the primary collimator 14 collimates the primary X-rays emitted by the light source assembly 10 into a parallel beam, so that more primary X-rays can be accurately irradiated onto the sample, thereby improving the utilization rate of the primary X-rays. On the other hand, the primary filter 15 can filter out unnecessary energy components, so that the energy of the primary X-rays reaching the sample is more in line with the measurement requirements, reducing the interference caused by stray primary X-rays and primary X-rays of inappropriate energy, thereby improving the accuracy of the measurement.

[0058] Specifically, the primary collimator 14 refers to a component capable of limiting and adjusting the propagation direction of the primary X-ray.

[0059] The primary filter 15 refers to a component that can selectively absorb or transmit primary X-rays of a specific wavelength (or energy). By selecting a suitable material and thickness of the primary filter 15, the unnecessary low-energy or high-energy parts of the primary X-rays emitted by the light source assembly 10 can be effectively filtered out, and only the primary X-rays of a specific energy range can be passed.

[0060] The material type of the primary filter 15 is not limited as long as it can filter the primary X-rays.

[0061] In one embodiment, please refer to Figure 1 and Figure 2 The analysis device includes a secondary collimator 16 and a secondary filter 17, which are sequentially arranged on the optical path of the transmission spectrum from the sample pool 11 to the first detector 12. Thus, the transmission spectrum with excess energy can be effectively filtered to maximize the intensity of the transmission spectrum, thereby reducing the measurement background and improving the measurement sensitivity.

[0062] Specifically, the secondary collimator 16 refers to a component capable of limiting and adjusting the propagation direction of the primary X-ray.

[0063] It should be noted that when the primary X-ray passes through the sample, due to the inhomogeneity of the internal structure and composition of the sample, the transmission spectrum may be scattered and diverged to a certain extent. The secondary collimator 16 further collimates the transmission spectrum after passing through the sample, and re-collimates the scattered transmission spectrum into a more parallel light beam, thereby reducing the divergence and loss of the transmission spectrum during transmission to the first detector 12, thereby improving the quality of the optical signal reaching the first detector 12.

[0064] The secondary filter 17 refers to a component that can selectively absorb or transmit a specific wavelength (or energy) transmission spectrum. By selecting a suitable secondary filter 17 material and thickness, the unwanted low energy or high energy part in the transmission spectrum can be effectively filtered out, and only the primary X-rays in a specific energy range can pass.

[0065] It should be noted that when the primary X-ray passes through the sample, the elements in the sample will absorb and scatter the primary X-ray, resulting in changes in the energy distribution of the transmission spectrum, which may produce some unnecessary scattering peaks or low-energy components, which will interfere with the accurate analysis of the sample information. The secondary filter 17 can filter out these interfering energy components, so that the transmission spectrum reaching the first detector 12 has a clearer energy spectrum that is more conducive to analysis, thereby improving the accuracy of the measurement.

[0066] The material type of the secondary filter 17 is not limited as long as it can filter the primary X-rays.

[0067] In one embodiment, please refer to Figure 1 and Figure 2 The analysis device includes a diffractor 18, which is arranged on the optical path of the X-ray fluorescence spectrum from the sample pool 11 to the second detector 13. On the one hand, the diffractor 18 can diffract stray light, so that more useful light signals can be accurately irradiated onto the second detector 13, thereby improving the peak-to-background ratio. On the other hand, the diffractor 18 can reduce the scattering background of the measurement and improve the sensitivity of the instrument.

[0068] Specifically, the structural type of the diffractor 18 is not limited.

[0069] For example, the diffractor 18 is a graphite crystal diffractor 18 .

[0070] In one embodiment, please refer to Figure 1 , Figure 2 and Figure 3 The analysis device further includes a shielding shell 19, the light source assembly 10 includes an X-ray tube 101, and the head of the X-ray tube 101, the sample pool 11, the head of the first detector 12, and the head of the second detector 13 are respectively arranged in the shielding shell 19. Therefore, on the one hand, the shielding shell 19 can fix the light source assembly 10, the sample pool 11, the first detector 12, and the second detector 13, so that the optical dimensions of each path in the optical path system are constant. On the other hand, the shielding shell 19 effectively prevents the leakage of primary X-rays to the surrounding environment, reducing the risk of radiation hazards to operators.

[0071] Specifically, the shielding shell 19 refers to a structure for blocking or reducing the leakage of primary X-ray radiation.

[0072] The shielding shell 19 has a containing cavity 19 a , and the X-ray tube 101 , the sample pool 11 , the first detector 12 and the second detector 13 are all arranged in the containing cavity 19 a .

[0073] The number of the accommodating chambers 19a is not limited.

[0074] For example, the shielding shell 19 has a containing cavity 19a, and the X-ray tube 101, the sample pool 11, the first detector 12 and the second detector 13 are all fixed in the containing cavity 19a.

[0075] For another example, the shielding shell 19 has a plurality of accommodating cavities 19a, and the X-ray tube 101, the sample pool 11, the first detector 12 and the second detector 13 correspond to each accommodating cavity 19a one by one and are fixed in each accommodating cavity 19a.

[0076] In a specific embodiment, the accommodating cavity 19a of the sample pool 11 extends along the direction of the X-ray fluorescence spectrum, thereby reducing the occupied space and making the structure of the analysis device more compact.

[0077] The material type of the shielding case 19 is not limited.

[0078] For example, the shielding shell 19 is made of stainless steel or copper.

[0079] The head of the X-ray tube 101, the head of the first detector 12, and the head of the second detector 13 are respectively arranged in the shielding shell 19, which means that only the head of the emitting end of the X-ray tube, the head of the first detector 12 for receiving light, and the head of the second detector 13 for receiving light can be arranged in the shielding shell 19 (that is, the key functional parts of each component are located in the shell to achieve the generation, transmission and detection of rays within the shielding range), or the entire X-ray tube 101, the entire first detector 12, and the entire second detector 13 are all located in the shielding shell 19 (in this case, the entire component is shielded and protected, and it can also ensure that the primary X-rays emitted by the X-ray tube 101 propagate in the shielding shell 19 and are effectively received by the first detector 12 and the second detector 13). As long as it can ensure that the primary X-rays emitted by the X-ray tube 101 are transmitted in the shielding shell 19 and accurately received by the first detector 12 and the second detector 13 in the shielding shell 19.

[0080] In one embodiment, the thickness of the shielding shell is greater than or equal to 10 mm. Thus, the primary X-rays can be effectively prevented from leaking to the surrounding environment, reducing the risk of radiation hazards to operators.

[0081] It should be noted that the thickness of the shielding shell 19 varies, wherein the thickness of the thinnest part of the shielding shell 19 is greater than or equal to 10 mm.

[0082] In one embodiment, please refer to Figure 1The analysis device further includes a digital processor 20, which is connected to the first detector 12 and the second detector 13 by signals, so as to receive detection data from the first detector 12 and the second detector 13. Thus, the detection data of the first detector 12 and the detection data of the second detector 13 are processed in a timely manner by the digital processor 20, which can significantly improve the working efficiency of the analysis device.

[0083] Specifically, the manner in which the digital processor 20 is signal-connected to the first detector 12 and the second detector 13 respectively is not limited.

[0084] For example, the digital processor 20 is directly connected to the first detector 12 and the second detector 13 respectively.

[0085] For another example, the digital processor 20 is respectively connected to the first detector 12 and the second detector 13 through a switch.

[0086] In one embodiment, please refer to Figure 1 The analysis device further includes a controller 21, which is connected to the light source assembly 10 and the digital processor 20 respectively, so as to display the working state of the light source assembly 10 in real time through the digital processor 20. This improves the flexibility and visualization of the operation of the analysis device.

[0087] Specifically, the controller 21 realizes real-time display of the working status of the light source assembly 10 by connecting with the digital processor 20. The user can directly view the various working parameters (such as voltage, current, temperature, working time, etc.) and operating status (such as normal operation, standby, fault, etc.) of the light source assembly 10 on the operating interface of the analysis device (the display is controlled by the digital processor 20).

[0088] In a specific embodiment, the controller 21 further includes a control switch, which is used to control the on and off of the light source assembly 10. Thus, according to the working state of the light source assembly 10 displayed in real time by the digital processor 20, the control switch can prevent the high-intensity primary X-rays from directly damaging the first detector 12 and also extend the service life of the X-ray tube 101 by controlling the on and off of the light source assembly 10.

[0089] In a specific embodiment, the controller 21 includes a hardware control function module, which includes hardware connection detection, parameter setting and monitoring (voltage value, current value, gain, number of channels, forming time, etc.), and optical path interlocking protection control.

[0090] Specifically, in a non-working state or in a working state but when there is no sample in the sample pool 11 , the control switch turns off the light source assembly 10 .

[0091] The structural type of the control switch is not limited.

[0092] For example, the control switch is a Hall switch.

[0093] The Hall switch circuit (protection circuit 22 ) is interlocked with the X-ray tube 101 , and the controller 21 controls the on and off of the Hall switch circuit to realize the opening and closing of the light source assembly 10 .

[0094] In a specific embodiment, please refer to Figure 4 The controller 21 includes a communication module 211, which is signal-connected to the digital processor 20, thereby enabling information transmission between the controller 21 and the digital processor 20.

[0095] In one embodiment, the digital processor 20 includes a data acquisition module and a data analysis module. The data acquisition module is used to receive and pre-process the measured spectrum data of the first detector 12 and the second detector 13. The data analysis module is used to perform XRF analysis, LED analysis, LED / XRF hybrid analysis or self-calibration on the measured spectrum data after the transmission spectrum and the X-ray fluorescence spectrum are pre-processed. In this way, the analysis device can be used for multiple purposes, which improves the convenience of use of the analysis device.

[0096] Specifically, the data analysis module can perform LED analysis only based on the measured spectrum data of the first detector 12, or can perform XRF analysis only based on the measured spectrum data of the second detector 13, or can perform both LED analysis and XRF analysis based on the measured spectrum data of the first detector 12 and the second detector 13. Thus, the analysis device can meet the measurement requirements of trace and constant samples at the same time.

[0097] In a specific embodiment, the self-calibration includes energy self-calibration and periodic calibration self-calibration.

[0098] In one embodiment, please refer to Figure 4 The data acquisition module includes an analog-to-digital conversion module 201 and a spectrum preprocessing module, and the spectrum preprocessing module has smoothing, background subtraction and energy calibration functions. Thus, the operation and use of the analysis device can be facilitated.

[0099] Specifically, the analog-to-digital conversion module 201 is connected to the light source assembly 10 and the communication module 211 respectively, thereby enabling the data acquired by the data acquisition module to be converted into a digital signal and transmitted to the digital processor 20 through the communication module 211 for further data analysis.

[0100] The type of the analog-to-digital conversion module 201 is not limited.

[0101] For example, the analog-to-digital conversion module 201 is an A / D conversion module (analog-to-digital conversion module).

[0102] For another example, the analog-to-digital conversion module 201 is a D / A conversion module (digital to analog conversion module).

[0103] In one embodiment, the digital processor 20 further includes an interface design module and a data management design module.

[0104] Specifically, the interface design module has functions such as menu design, toolbar design, status bar design, table design, graphic display design, etc. Thus, the operation and use of the analysis device can be facilitated.

[0105] The data management design module has functions such as analysis result management, spectrum management, and historical data storage and query, which can facilitate the operation and use of the analysis device.

[0106] In the description of the present application, the description with reference to the terms "in one embodiment", "in some embodiments", "in a specific embodiment", or "exemplary" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the embodiments of the present application. In the present application, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in a suitable manner in any one or more embodiments or examples. In addition, those skilled in the art may combine different embodiments or examples described in the present application and the features of different embodiments or examples without contradiction.

[0107] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application are included in the protection scope of the present application.

Claims

1. A wide-range multifunctional analytical device, characterized in that: include: A light source assembly, the light source assembly is used to emit primary X-rays; A sample pool, the sample pool is arranged at one side of the light source assembly to receive the irradiated primary X-rays, the primary X-rays are irradiated onto the sample in the sample pool to obtain a transmission spectrum and an X-ray fluorescence spectrum; a first detector, the first detector being arranged on an optical path of the transmission spectrum to measure the transmission spectrum; A second detector is arranged on an optical path of the X-ray fluorescence spectrum to measure the X-ray fluorescence spectrum.

2. The analysis device according to claim 1, characterized in that At least one of the first detector and the second detector is a silicon drift detector.

3. The analysis device according to claim 1, characterized in that The X-ray fluorescence spectrum is the X-ray fluorescence spectrum generated when the primary X-ray irradiates the sample in the sample cell to interact with the sample.

4. The analysis device according to claim 1, characterized in that The optical path of the transmission spectrum is perpendicular to the optical path of the X-ray fluorescence spectrum.

5. The analysis device according to any one of claims 1 to 4, characterized in that: The analysis device comprises a primary collimator and a primary filter, wherein the primary filter and the primary collimator are sequentially arranged on an irradiation light path from the light source assembly to the sample cell; and / or, The analysis device comprises a secondary collimator and a secondary filter, and the secondary collimator and the secondary filter are sequentially arranged on the optical path of the transmission spectrum from the sample cell to the first detector.

6. The analysis device according to any one of claims 1 to 4, characterized in that: The analysis device comprises a diffractor, which is arranged on an optical path of the X-ray fluorescence spectrum from the sample cell to the second detector.

7. The analysis device according to any one of claims 1 to 4, characterized in that: The analysis device further comprises a shielding shell, the light source assembly comprises an X-ray tube, and the head of the X-ray tube, the sample pool, the head of the first detector and the head of the second detector are respectively arranged in the shielding shell.

8. The analysis device according to claim 7, characterized in that The shielding shell is made of stainless steel or copper; and / or, The thickness of the shielding shell is greater than or equal to 10 mm.

9. The analysis device according to any one of claims 1 to 4, characterized in that: The analysis device further includes a digital processor, which is signal-connected to the first detector and the second detector respectively to receive detection data from the first detector and the second detector.

10. The analysis device according to claim 9, characterized in that The analysis device further comprises a controller, which is connected to the light source assembly and the digital processor respectively, so as to display the working state of the light source assembly in real time through the digital processor; and / or, The digital processor includes a data acquisition module and a data analysis module, the data acquisition module is used to receive and pre-process the measured spectral data of the first detector and the second detector, and the data analysis module is used to perform XRF analysis, LED analysis, LED / XRF hybrid analysis or self-correction on the measured spectral data after pre-processing the transmission spectrum and the X-ray fluorescence spectrum.

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