Thermal cycle detection device for computer mainboard

Abstract

The invention relates to the technical field of detection devices, and particularly discloses a computer mainboard thermal cycle detection device which comprises a test box body and further comprises a detection assembly arranged in a cavity, a mainboard to be detected is installed on the detection assembly, and the detection assembly detects the deformation quantity of the mainboard; and the adjusting assembly is arranged in the cavity, when the sizes of different batches of mainboards are increased, the mainboard clamping size of the detection assembly is increased through the adjusting assembly, and meanwhile, the detection range of the detection assembly on the mainboard deformation degree is increased. Through the detection assembly, the deformation of the computer mainboard can be detected, the computer mainboard which does not meet the requirement can be directly screened out, and through the adjustment assembly, the detection assembly can be used in cooperation with the detection assembly, so that the detection assembly is adjusted according to different length sizes of the computer mainboard; through the auxiliary assembly, the detection assembly can be adjusted according to different temperature change ranges and different sizes of the mainboard.

Description

Technical Field

[0001] The invention relates to the technical field of detection devices, in particular to a computer mainboard thermal cycle detection device. Background Art

[0002] The computer motherboard thermal cycle detection device is a device specially used to test the reliability and stability of computer motherboards in temperature-changing environments. This device helps to detect the working performance and durability of the motherboard in such an environment by simulating an environment with drastic temperature changes. Therefore, a high and low temperature test chamber is usually used to test the computer motherboard. The high and low temperature test chamber is a device that can simulate extreme temperature environments. By accurately controlling the temperature range and change rate, it provides strong support for performance testing and reliability evaluation of various products. It can perform high-temperature aging tests, low-temperature cold start tests and temperature cycle tests on electronic components, circuit boards, etc. to ensure the stability of the product in various environments.

[0003] When a computer motherboard is subjected to a thermal cycle test in a high and low temperature test chamber, the computer motherboard will be placed in the high and low temperature test chamber and undergo a cycle from high temperature to low temperature (or low temperature to high temperature) to simulate the temperature changes that may be encountered in the actual use environment, so as to evaluate the performance, reliability and adaptability of the computer motherboard at different temperatures, and ensure that it can still work normally under various extreme temperature conditions. However, after the simultaneous testing of multiple computer motherboards in the high and low temperature test chamber is completed, the multiple computer motherboards will be taken out, and then they will be checked one by one to determine whether the computer motherboards meet the testing requirements. In this way, the one-by-one inspection of the circuit boards after the test may affect the efficiency of the computer motherboard detection and may be inconvenient for the detection personnel to use. For this reason, we propose a computer motherboard thermal cycle detection device. Summary of the invention

[0004] The purpose of the present invention is to provide a computer motherboard thermal cycle detection device to solve the problem raised in the above background technology that after multiple computer motherboards are tested in a high and low temperature test chamber, the multiple computer motherboards will be taken out, and then they will be checked one by one to determine whether the computer motherboards meet the test requirements. In this way, the one-by-one inspection of the circuit boards after the test may affect the efficiency of the computer motherboard detection and may be inconvenient for the detection personnel to use.

[0005] To achieve the above object, the present invention provides the following technical solution: A computer motherboard thermal cycle detection device, comprising: a test box body, a chamber is provided on the test box body, It also includes: a detection component, the detection component is arranged in the chamber, the mainboard to be detected is installed on the detection component, and the detection component detects the deformation of the mainboard; The adjusting component is arranged in the chamber. When the sizes of different batches of mainboards become larger, the adjusting component is used to increase the size of the mainboards clamped by the detection component, and at the same time, the detection range of the mainboard deformation degree of the detection component is increased. When the sizes of different batches of mainboards become smaller, the adjusting component is used to reduce the size of the mainboards clamped by the detection component, and at the same time, the detection range of the mainboard deformation degree of the detection component is reduced. The auxiliary component is arranged in the chamber. When the temperature in the chamber increases, the detection range of the detection component for the degree of deformation of the mainboard is synchronously increased according to the size of the mainboard. When the temperature in the chamber decreases, the detection range of the detection component for the degree of deformation of the mainboard is synchronously reduced according to the size of the mainboard.

[0006] Among them, the detection component includes a mounting plate fixedly arranged on the inner side of the chamber of the test box body, a screw member is rotatably arranged on one side of the mounting plate, a guide rod is fixedly arranged on the other side of the mounting plate, a movable plate slidably arranged with the guide rod is threadedly arranged on one side of the screw member, a sliding frame is fixedly arranged at equal intervals on the lower side of the movable plate, a clamp is slidably arranged on the upper side of the sliding frame, clamps are fixedly arranged at equal intervals on one side of the mounting plate, and indicator lights are installed at equal intervals on the outer side of the movable plate.

[0007] Among them, the screw member and the guide rod are both provided with support blocks on one side of the movable plate, the support block on the screw member is rotatably set with the screw member, the support block on the guide rod is fixed with the guide rod, the two support blocks are respectively fixed with the inner wall of the chamber of the test box body, a first spring is fixedly set between the clamp and the movable plate, a pull rod member is rotatably set at the lower side of the clamp, and a protrusion is fixedly set at one end of the pull rod member close to the clamp.

[0008] Among them, a connecting plate is fixedly provided on one side of the sliding frame, sliding parts are slidably provided on both sides of the connecting plate, and sliding grooves adapted to the sliding parts are opened on both sides of the connecting plate. The two sliding parts are respectively slidably provided along the two sliding grooves, and mounting blocks are fixedly provided on the upper sides of the two sliding parts. Switches electrically connected to the indicator lights are installed on the sides of the two mounting blocks close to each other, and a pressing block is provided between the two mounting blocks, and a fixing rod fixed to the clamp is fixedly provided on the upper side of the pressing block.

[0009] Among them, the adjustment component includes a stopper slidably set on the lower side of the sliding frame, the stopper is located on the lower side of the protrusion, the sliding frame is symmetrically provided with guide grooves on both sides of the stopper, the stopper is slidably set along the guide grooves, and a second spring is fixedly set on the lower side of the stopper and fixed with the sliding frame.

[0010] Among them, balls are movably arranged at equal intervals on the upper side of the stopper, a first conductive block is fixedly embedded on the side of the stopper close to the clamp, a second conductive block is fixedly embedded on the side of the clamp close to the stopper, and an indicator rod is fixedly arranged on the outer side of the pull rod.

[0011] Among them, a first rack is arranged on one side of the sliding frame, a support rod fixed to the bottom of the chamber of the test box body is symmetrically fixed on the lower side of the first rack, a first gear is meshed and connected to one side of the first rack, a second gear is fixed on the upper side of the first gear, and a connecting rod fixed to the bottom of the connecting plate is rotatably arranged in the middle of the first gear and the second gear.

[0012] Among them, the second gear is meshedly connected with the second racks on both sides, and the two second racks are fixedly provided with pillars that movably penetrate the connecting plate on one side, and the upper ends of the two pillars are respectively fixedly provided with the sliding members on both sides.

[0013] Among them, the auxiliary components include two L-shaped plates fixed to one side of the two sliding parts respectively, a metal strip is provided on one side of the two L-shaped plates, and limiting balls are fixedly provided on both sides of the metal strips. The mounting blocks and the side of the L-shaped plates close to the metal strips are provided with mounting grooves matched with the limiting balls, and the limiting balls are movably arranged in the mounting grooves. Limiting blocks are fixedly provided on the lower sides of the two mounting blocks, and limiting grooves matched with the limiting blocks are opened on the upper sides of the two sliding parts, and the limiting blocks slide along the limiting grooves.

[0014] Among them, a bracket is provided on one side of the two metal strips, and tooth blocks are slidably provided on the upper and lower sides of the brackets of the metal strips, a third spring is fixedly provided between the tooth block and the bracket, and electromagnetic blocks are symmetrically fixedly provided on the sides where the two tooth blocks are close to each other, the outer bracket is fixedly provided with a connecting plate, a tooth condition slidably provided with the connecting plate is fixedly provided at the lower end of the inner bracket, a directional groove matched with the tooth condition is provided on the connecting plate, a third gear is meshedly connected to one side of the tooth condition, a fixed tooth block fixedly provided with the connecting plate is meshedly connected to one side of the third gear, and a support rod fixedly provided with the inner sliding member is rotatably provided in the middle of the third gear.

[0015] The present invention has at least the following beneficial effects: The present invention can detect the deformation of the computer mainboard through the detection component. If the high and low temperature resistance of the computer mainboard is exceeded, the computer mainboard will exceed the allowed deformation limit range, indicating that the detection does not meet the requirements, so that the computer mainboard that does not meet the requirements can be directly screened out, and there is no need to check the computer mainboard one by one after the test is completed, thereby effectively reducing the workload of the detection personnel, assisting the detection personnel to detect the computer mainboard, and improving the detection efficiency of the computer mainboard, so as to facilitate the detection and use of the detection personnel. Through the adjustment component, it can be used in conjunction with the detection component to adjust the detection component according to the different length dimensions of the computer mainboard, so that the detection component can adapt to the detection of computer mainboards of different sizes; through the auxiliary component, the adjustment component can be assisted in adjusting the detection component. During the detection process, the detection range of the detection component can be adjusted according to different temperature change ranges and different sizes of the computer mainboard to detect whether the deformation degree of the computer mainboard within different temperature change ranges meets the requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a three-dimensional structural schematic diagram of the present invention; Figure 2 It is a schematic diagram of the structure of the detection component and the adjustment component inside the chamber of the present invention; Figure 3 It is a schematic diagram of the structure of the connection between the clamp and the clamp plate of the present invention; Figure 4 For the present invention Figure 3 The enlarged structural diagram at A in the middle; Figure 5 It is a schematic structural diagram of the connection between the sliding frame and the clamping member of the present invention; Figure 6 It is a schematic diagram of the structure of the sliding frame and the clamping member explosion of the present invention; Figure 7 It is a schematic structural diagram of a cross-section of a sliding frame and a clamp of the present invention; Figure 8 For the present invention Figure 7 The enlarged structural diagram at B in the middle; Fig. 9 It is a schematic diagram of the structure of the clamp, the pull rod and the protrusion of the present invention; Fig.10 It is a structural schematic diagram of the sliding frame and the clamping member of the present invention from another perspective; Fig.11 It is a schematic diagram of the structure of the connection between the first gear and the second gear of the present invention; Fig.12 It is a schematic diagram of the structure of the sliding member and the connecting plate exploded in the present invention; Fig.13 This is a schematic diagram of the structure of the auxiliary component in the second embodiment of the present invention; Fig.14 It is a structural schematic diagram of the auxiliary component of the present invention from another perspective; Fig.15 For the present invention Fig.14 The enlarged structural diagram at C in the middle; Fig.16 It is a schematic diagram of the structure of the limit ball and the installation groove explosion of the present invention; Fig.17 It is a schematic structural diagram of a cross-section of the stent of the present invention.

[0017] In the figure: 11, test box body; 12, chamber; 13, box door; 2, detection assembly; 21, mounting plate; 22, screw member; 23, guide rod; 24, moving plate; 25, sliding frame; 26, clamp; 27, clamp; 28, support block; 29, first spring; 210, connecting plate; 211, sliding member; 212, mounting block; 213, switch; 214, fixing rod; 215, pressing block; 216, pull rod; 217, protrusion; 218, slide groove; 219, indicator light; 3, adjustment assembly; 31, stopper; 32, guide groove; 33, second spring; 34, indicator Rod; 35, first conductive block; 36, second conductive block; 37, ball; 38, first rack; 39, support rod; 310, first gear; 311, second gear; 312, connecting rod; 313, second rack; 314, pillar; 4, auxiliary component; 41, L-shaped plate; 42, metal strip; 43, limiting ball; 44, mounting groove; 45, limiting block; 46, limiting groove; 47, bracket; 48, gear block; 49, electromagnetic block; 410, third spring; 411, gear condition; 412, directional groove; 413, fixed gear block; 414, third gear; 415, support rod. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] Embodiment 1 See also Figures 1 to 17 The present invention provides a technical solution: a computer motherboard thermal cycle detection device, comprising: a test box body 11, a chamber 12 is arranged on the test box body 11, and a box door 13 is rotatably arranged outside the chamber 12. The chamber 12 further comprises a detection component 2, wherein the detection component 2 is disposed in the chamber 12, the mainboard to be detected is mounted on the detection component 2, and the detection component 2 detects the deformation of the mainboard; The adjusting component 3 is arranged in the chamber 12. When the size of the mainboards of different batches increases, the adjusting component 3 increases the size of the mainboards clamped by the detecting component 2, and at the same time increases the detection range of the mainboard deformation degree of the detecting component 2. When the size of the mainboards of different batches decreases, the adjusting component 3 reduces the size of the mainboards clamped by the detecting component 2, and at the same time reduces the detection range of the mainboard deformation degree of the detecting component 2. Auxiliary component 4, auxiliary component 4 is arranged in chamber 12, when the temperature of auxiliary component 4 in chamber 12 increases, the detection range of detection component 2 for the degree of deformation of the mainboard is synchronously increased according to the size of the mainboard; when the temperature of auxiliary component 4 in chamber 12 decreases, the detection range of detection component 2 for the degree of deformation of the mainboard is synchronously reduced according to the size of the mainboard.

[0020] When the computer motherboard is subjected to a thermal cycle test through the high and low temperature test box body 11, the box door 13 can be opened, the computer motherboard can be placed in the chamber 12 in the test box body 11, and the relevant parameters of the test box body 11 can be set to test the computer motherboard. During the test, if the high and low temperature resistance of the computer motherboard is exceeded, the computer motherboard will undergo changes such as bending, expansion, softening, and contraction, which means that the test of the computer motherboard does not meet the requirements. The deformation of the computer motherboard can be detected through the detection component 2. If the high and low temperature resistance of the computer motherboard is exceeded, the computer motherboard will exceed the allowed deformation limit range, which means that the test does not meet the requirements, so that the computer motherboard that does not meet the requirements can be directly screened out, and there is no need to perform a test after the test is completed. Then, the computer mainboards are checked one by one, which can effectively reduce the workload of the inspectors, assist the inspectors in inspecting the computer mainboards, improve the inspection efficiency of the computer mainboards, and facilitate the inspection by the inspectors. The adjusting component 3 can be used in conjunction with the inspection component 2 to adjust the inspection component 2 according to the different lengths of the computer mainboards, so that the inspection component 2 can adapt to the inspection of computer mainboards of different sizes; the auxiliary component 4 can assist the adjusting component 3 in adjusting the inspection component 2. During the inspection process, the inspection range of the inspection component 2 can be adjusted according to different temperature change ranges and different sizes of the computer mainboards, so as to detect whether the deformation degree of the computer mainboard within different temperature change ranges meets the requirements.

[0021] The detection component 2 includes a mounting plate 21 fixedly arranged on the inner side of the chamber 12 of the test box body 11, a screw member 22 is rotatably arranged on one side of the mounting plate 21, a guide rod 23 is fixedly arranged on the other side of the mounting plate 21, a movable plate 24 slidably arranged with the guide rod 23 is threadedly arranged on one side of the screw member 22, a sliding frame 25 is fixedly arranged at equal intervals on the lower side of the movable plate 24, a clamp 26 is slidably arranged on the upper side of the sliding frame 25, and the sliding frame 25 can support and guide the sliding of the clamp 26, a clamp 27 is fixedly arranged at equal intervals on one side of the mounting plate 21, and an indicator light 219 is installed at equal intervals on the outer side of the movable plate 24, each clamp 26, clamp 27 and indicator light 219 correspond to each other, and a clamping groove is arranged on the side where the clamp 26 and the clamp 27 are close to each other to clamp and support the computer motherboard.

[0022] The screw member 22 and the guide rod 23 are both provided with a support block 28 on one side of the movable plate 24. The support block 28 on the screw member 22 is rotatably arranged with the screw member 22, and the support block 28 on the guide rod 23 is fixedly arranged with the guide rod 23. The two support blocks 28 are respectively fixedly arranged with the inner wall of the chamber 12 of the test box body 11. The two support blocks 28 can respectively support the screw member 22 and the movable plate 24. A first spring 29 is fixedly arranged between the clamp 26 and the movable plate 24. A pull rod member 216 is rotatably arranged at the lower side of the clamp 26. A protrusion 217 is fixedly arranged at one end of the pull rod member 216 close to the clamp 26. The protrusion 217 is eccentrically fixed to the pull rod member 216. The clamp 26 is provided with a receiving groove at the protrusion 217. The protrusion 217 is located in the receiving groove of the clamp 26, and the protrusion 217 can be rotated in the receiving groove of the clamp 26 by rotating the pull rod member 216. When placing the computer motherboard into the chamber 12, the rod member 216 can be pulled outward to drive the clamp 26 to slide outward along the sliding frame 25 through the protrusion 217, and the first spring 29 is compressed to place the computer motherboard between the clamp 26 and the clamp plate 27. Then the rod member 216 is released, and under the elastic force of the first spring 29, the clamp 26 and the clamp plate 27 clamp both sides of the computer motherboard and are located in the clamping groove on the side where the clamp 26 and the clamp plate 27 are close to each other, so as to firmly clamp the computer motherboard.

[0023] A connecting plate 210 is fixedly provided on one side of the sliding frame 25, and sliding members 211 are slidably provided on both sides of the connecting plate 210. Slide grooves 218 adapted to the sliding members 211 are provided on both sides of the connecting plate 210. The two sliding members 211 are slidably provided along the two slide grooves 218, respectively, which can guide and limit the sliding of the sliding members 211. A mounting block 212 is fixedly provided on the upper side of the two sliding members 211. A switch 213 electrically connected to the indicator light 219 is installed on the side where the two mounting blocks 212 are close to each other. A pressing block 215 is provided between the two mounting blocks 212, and a fixing rod 214 fixedly provided with the clamp 26 is fixedly provided on the upper side of the pressing block 215. During the detection process, if the high and low temperature resistance of the computer motherboard is exceeded, the computer motherboard will bend, expand, soften, shrink, etc., which will cause the size of the computer motherboard to become longer, and the pressing clamp 26 will move outward, or the size of the computer motherboard will become shorter. Under the elastic force of the first spring 29, the clamp 26 moves close to the clamp 27, and then the clamp 26 drives the fixing rod 214 and the pressure block 215 to move toward the mounting block 212 on one side. If the high and low temperature resistance of the computer motherboard is exceeded, the deformation of the computer motherboard will exceed its allowable limit range, and then it will press the switch 213 on one side, so that the indicator light 219 corresponding to this computer motherboard is powered on and lights up. Therefore, after the test is completed, if the indicator light 219 of the corresponding computer motherboard is observed to light up, it means that the detection of this computer motherboard does not meet the requirements, so that the computer motherboard that does not meet the requirements can be directly screened out, which can effectively reduce the workload of the detection personnel, facilitate the detection of the detection personnel, and improve the detection efficiency.

[0024] The adjusting assembly 3 includes a stopper 31 slidably arranged on the lower side of the sliding frame 25, the stopper 31 is located on the lower side of the protrusion 217, the sliding frame 25 is symmetrically provided with guide grooves 32 on both sides of the stopper 31, the stopper 31 is slidably arranged along the guide grooves 32, and can play a guiding and limiting role for the up and down sliding of the stopper 31, a second spring 33 fixedly arranged with the sliding frame 25 is fixedly arranged on the lower side of the stopper 31, and balls 37 are movably arranged on the upper side of the stopper 31 at equal intervals, and a spherical limiting groove adapted to the ball 37 is provided at the stopper 31 at the ball 37, and the ball 37 is movably arranged in the spherical limiting groove on the stopper 31, a first conductive block 35 is fixedly embedded on the side of the stopper 31 close to the clamp 26, and a second conductive block 35 is fixedly embedded on the side of the clamp 26 close to the stopper 31 The electric block 36, the first conductive block 35, the second conductive block 36 and the indicator light 219 are electrically connected. Initially, under the elastic force of the second spring 33, the stopper 31 is located in the receiving groove of the clamp 26 and abuts against the inner end of the receiving groove of the clamp 26 near the indicator rod 34. At this time, the first conductive block 35 abuts against the second conductive block 36, and the indicator light 219 is powered on and lights up; an indicator rod 34 is fixedly arranged on the outside of the pull rod 216, and the indicator rod 34 can play an indicating role. When the indicator rod 34 is facing upward, it means that the protrusion 217 is located on the eccentric upper side of the pull rod 216. On the contrary, when the indicator rod 34 is facing downward, the protrusion 217 is located on the eccentric lower side of the pull rod 216, so that it is convenient to judge whether the protrusion 217 presses the stopper 31 downward into the sliding frame 25; When clamping computer motherboards of different lengths, in order to ensure the detection of the computer motherboard, the screw member 22 can be rotated first to move the movable plate 24 away from the clamping plate 27, thereby driving the multiple sliding frames 25 to move synchronously outward, and through the stopper 31, the multiple clamps 26 can be driven to move synchronously outward, so that the computer motherboard can be placed between the clamp 26 and the clamp 27. First, place a computer motherboard between the clamp 26 and the clamp 27, and rotate the screw member 22 in the opposite direction to make the movable plate 24, the multiple sliding frames 25 and the clamp 26 move in the opposite direction. When the clamp 26 moves to contact one side of the computer motherboard, as the screw member 22 continues to rotate, the other side of the computer motherboard will contact the clamp 27. At this time, if the screw member 22 continues to be rotated, the clamp 26 will no longer move, the first spring 29 will be further compressed, and the stopper 31 will no longer contact The receiving groove of the clamp 26 is in contact with the inner end of one side of the indicator rod 34, that is, the first conductive block 35 is out of contact with the second conductive block 36, so that the indicator light 219 is turned off, indicating that the screw member 22 is over-rotated. At this time, the screw member 22 should be rotated in the opposite direction to move the movable plate 24 and the plurality of sliding frames 25 toward the outside. When the stopper 31 moves toward the outside to make the first conductive block 35 contact with the second conductive block 36 again, the indicator light 219 is powered on and lights up, and the rotation of the screw member 22 is stopped. At this time, the position adjustment of the movable plate 24 and the clamp 26 is completed, so that after the adjustment is completed, the initial compression degree of the first spring 29 is the same, so that the force when clamping computer motherboards of different lengths is the same, so as to meet the detection of computer motherboard deformation and prevent the clamping force from being too large or too small, which affects the deformation detection of the computer motherboard; Subsequently, the pull rod 216 is rotated downward by 180 degrees to drive the protrusion 217 to rotate downward by 180 degrees, so that the protrusion 217 presses the stopper 31 downward to enter the inner side of the sliding frame 25, so that the first conductive block 35 is separated from the second conductive block 36, so as not to affect the subsequent detection of the computer motherboard not meeting the requirements when the indicator light 219 is turned on. At the same time, the stopper 31 can be moved downward out of the receiving groove on the lower side of the clamp 26, so as not to block the sliding of the clamp 26 toward the outside or the inside along the sliding frame 25, and when the clamp 26 slides toward the outside or the inside, the roller on the upper side of the stopper 31 The ball 37 will roll along the bottom side of the clamp 26 or the bottom side of the protrusion 217, and protrusions are set at both ends of the bottom side of the clamp 26, and the stopper 31 moves between the protrusions on both sides of the bottom of the clamp 26; therefore, when multiple computer motherboards are subsequently placed, it is only necessary to slightly pull the pull rod 216 outward to move the clamp 26 away from the clamp 27, so as to facilitate the placement of the computer motherboard between the clamp 26 and the clamp 27, and then release the pull rod 216 and rotate the pull rod 216 downward to rotate the protrusion 217 downward to press the stopper 31 downward to the inside of the sliding frame 25.

[0025] A first rack 38 is provided on one side of the sliding frame 25, and a support rod 39 fixed to the bottom of the chamber 12 of the test box body 11 is symmetrically fixed on the lower side of the first rack 38, a first gear 310 is meshed and connected on one side of the first rack 38, and a second gear 311 is fixed on the upper side of the first gear 310, and a connecting rod 312 fixed to the bottom of the connecting plate 210 is rotatably provided in the middle of the first gear 310 and the second gear 311, and the connecting rod 312 can support and stabilize the first gear 310 and the second gear 311, and the second racks 313 are meshed and connected on both sides of the second gear 311, and pillars 314 that movably penetrate the connecting plate 210 are fixed on one side of the two second racks 313, and the pillars 314 and the connecting plate 210 are slidably arranged, and the upper ends of the two pillars 314 are respectively fixed to the sliding members 211 on both sides; When the positions of the movable plate 24 and the clamp 26 are adjusted by rotating the screw member 22, the movable plate 24, the sliding frame 25 and the clamp 26 move outward, which will drive the connecting plate 210, the fixing rod 214 and the pressing block 215 to move outward synchronously, so that the first gear 310 rotates during the process of moving outward along the first rack 38, and the second gear 311 rotates, so that the second racks 313 on both sides move relative to each other, so that the pillars 314 and the sliding member 211 on both sides move away from each other, and then drive the mounting blocks 212 on both sides to move away from each other, so that for a computer motherboard with a larger length dimension, the allowable deformation limit range is larger than that of a computer motherboard with a smaller size, so that the distance between the two mounting blocks 212 and the pressing block 215 can be adjusted according to computer motherboards of different sizes, so that the detection component 2 can adapt to the detection of computer motherboards of different sizes by adjusting the component 3.

[0026] Embodiment 2 like Figures 13 to 17 As shown, other structures remain unchanged, and the difference from the first embodiment is: The auxiliary component 4 includes two L-shaped plates 41 fixedly arranged on one side of the two sliding members 211, and the two L-shaped plates 41 are respectively located on one side of the two sliding members 211 close to the clamping plate 27, that is, they are respectively located on the inner side of the two sliding members 211, one side of the two L-shaped plates 41 is provided with a metal strip 42, and both sides of the metal strip 42 are fixedly provided with a limiting ball 43, the mounting block 212 and the side of the L-shaped plate 41 close to the metal strip 42 are provided with a mounting groove 44 adapted to the limiting ball 43, and the limiting ball 43 is movably arranged in the mounting groove 44, and the lower side of the two mounting blocks 212 is fixedly provided with a limiting block 45, and the upper side of the two sliding members 211 is provided with a limiting groove 46 adapted to the limiting block 45, and the limiting blocks 45 on both sides are respectively arranged along the limiting grooves on the sliding members 211 on both sides. The positioning groove 46 slides, that is, in this embodiment, the mounting block 212 is no longer fixed to the sliding member 211, but the mounting block 212 is slidably arranged along the positioning groove 46 on the upper side of the sliding member 211 through the limiting block 45, and initially, for the mounting block 212 close to the side (inner side) of the clamping plate 27, the limiting block 45 fixed on its lower side is located at the outer end of the limiting groove 46, so that the inner mounting block 212 can slide inwardly through the limiting block 45 and limit the sliding of the inner mounting block 212 outwardly, and for the mounting block 212 away from the side (outer side) of the clamping plate 27, the limiting block 45 fixed on its lower side is located at the inner end of the limiting groove 46 on the other side, so that the outer mounting block 212 can slide outwardly through the limiting block 45 and limit the sliding of the outer mounting block 212 inwardly; When the computer motherboard is tested by the high and low temperature test box body 11, the temperature change will cause the expansion and contraction of the metal strip 42. When the temperature rises, the end of the metal strip 42 away from the side of the clamping plate 27 away from the L-shaped plate 41 will stretch, pushing the outer mounting block 212 away from the pressing block 215, and the computer motherboard also expands outward, so that the clamp 26 drives the fixing rod 214 and the pressing block 215 to move closer to the outer mounting block 212. Conversely, when the temperature drops, the metal strip 42 away from the L-shaped plate 41 will stretch, pushing the outer mounting block 212 away from the pressing block 215. The end of the metal strip 42 on one side of the clamping plate 27 away from the L-shaped plate 41 will be shortened, and the inner mounting block 212 can be pulled away from the pressing block 215 through the limiting ball 43 and the mounting groove 44, and the computer motherboard also shrinks inward. Under the elastic force of the first spring 29, the clamp 26, the fixing rod 214 and the pressing block 215 move inward, that is, move closer to the inner mounting block 212, so that the distance between the two mounting blocks 212 and the pressing block 215 can be adjusted according to different temperature change ranges. Auxiliary adjustment is then performed to detect whether the deformation degree of the computer motherboard within different temperature change ranges meets the requirements. If during the detection process, the pressure block 215 presses against the switch 213, it means that the deformation degree of the computer motherboard within the temperature change range exceeds the allowable limit range, that is, the detection does not meet the requirements. At this time, the corresponding indicator light 219 will light up. The switch 213 can adopt a self-locking switch 213, so that when the temperature returns to normal, the recovery of the metal strip 42 may cause the installation block 212 to separate from the pressure block 215, the switch 213 will not be reset, but the indicator light 219 will be kept powered on to indicate that the detection of this computer motherboard does not meet the requirements. For the reset of the switch 213, after the computer motherboard test is completed and taken out, the pull rod 216 can be moved outward or inward to move the clamp 26, the fixing rod 214 and the pressure block 215 outward or inward, so that the pressure block 215 presses the switch 213 on one side again to reset the switch 213, and the closure of the corresponding indicator light 219 can be used as a guide for judgment.

[0027] A bracket 47 is provided on one side of the two metal strips 42. The bracket 47 is located on the upper and lower sides of the metal strip 42 and is slidably provided with tooth blocks 48. A third spring 410 is fixedly provided between the tooth block 48 and the bracket 47. The upper and lower sides of the metal strip 42 are provided with tooth grooves that match the tooth block 48. Initially, the upper and lower tooth blocks 48 and the metal strip 42 are separated from each other. Electromagnetic blocks 49 are symmetrically fixedly provided on the sides of the two tooth blocks 48 that are close to each other. After power is turned on, the electromagnetic blocks 49 on the upper and lower tooth blocks 48 generate a force of mutual attraction, and the outer bracket 47 and the connecting plate 21 are connected. 0 is fixedly arranged, a gear condition 411 which is slidably arranged with the connecting plate 210 is fixedly arranged at the lower end of the inner bracket 47, and an orientation groove 412 which is adapted to the gear condition 411 is opened on the connecting plate 210, and the gear condition 411 is slidably arranged along the orientation groove 412, which can play a positioning and guiding role for the movement of the gear condition 411, and a third gear 414 is meshedly connected to one side of the gear condition 411, and a fixed gear block 413 which is fixedly arranged with the connecting plate 210 is meshedly connected to one side of the third gear 414, and a support rod 415 which is fixedly arranged with the inner sliding member 211 is rotatably arranged in the middle of the third gear 414; When testing a computer motherboard with a relatively large length, the support pillars 314 on both sides and the sliding member 211 can be moved away from each other by adjusting the assembly 3, thereby driving the synchronous movement of the L-shaped plate 41, the metal strip 42 and the mounting block 212. When the outer metal strip 42 moves outward, the length of the outer metal strip 42 between the outer mounting block 212 and the two outer upper and lower tooth blocks 48 can be relatively large. When the inner sliding member 211, the L-shaped plate 41, the metal strip 42 and the mounting block 212 move inward, the support rod 415 can be used to drive the outer metal strip 42 to move outward. When the third gear 414 is driven to move inward, it can mesh and rotate along the fixed tooth block 413, so that the gear condition 411 can be driven to move inward along the directional groove 412, and then the inner bracket 47 and the tooth block members 48 on both sides thereof can be driven to move synchronously, so that the length of the inner metal strip 42 between the inner mounting block 212 and the inner upper and lower tooth block members 48 can be larger. After the computer motherboard is placed in the test box body 11, the box door 13 is closed, and the test box body 11 is controlled to work to detect the computer motherboard, the electromagnetic block 42 can be controlled at the same time. 9 is powered on, so that the electromagnetic blocks 49 on the tooth blocks 48 on the upper and lower sides of the inner and outer metal strips 42 respectively generate a force of mutual attraction, so that the upper and lower tooth blocks 48 move closer to each other, so that the upper and lower tooth blocks 48 are respectively inserted into the tooth grooves on the upper and lower sides of the metal strip 42. For a computer motherboard with a larger length, the metal strip 42 can be fixed by the upper and lower tooth blocks 48, so that the length of the metal strip 42 between the mounting block 212 and the tooth block 48 is larger, so that when testing, the metal strip 42 can be expanded and contracted. The effective length of the shrinkage change is larger to adapt to the larger size of the computer motherboard, so that the auxiliary component 4 can adjust the distance between the two mounting blocks 212 and the pressing block 215 according to different temperature change ranges and the size of the computer motherboard, that is, adjust the detection range of the detection component 2 for the deformation degree of the motherboard; after the detection of the computer motherboard is completed, the test box body 11 stops working, and the electromagnetic block 49 can be controlled to be powered off. Under the elastic force of the third spring 410, the upper and lower tooth blocks 48 move away from each other and separate from the metal strip 42.

[0028] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0029] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A computer motherboard thermal cycle detection device, comprising: A test box body (11), wherein the test box body (11) is provided with a chamber (12), The invention is characterized in that it further comprises: a detection component (2), the detection component (2) being arranged in the chamber (12), the mainboard to be detected being mounted on the detection component (2), and the detection component (2) detecting the deformation amount of the mainboard; An adjusting component (3), wherein the adjusting component (3) is arranged in the chamber (12); when the size of the mainboards of different batches increases, the adjusting component (3) increases the size of the mainboards clamped by the detection component (2), and at the same time increases the detection range of the mainboard deformation degree of the detection component (2); when the size of the mainboards of different batches decreases, the adjusting component (3) decreases the size of the mainboards clamped by the detection component (2), and at the same time reduces the detection range of the mainboard deformation degree of the detection component (2); An auxiliary component (4), wherein the auxiliary component (4) is arranged in the chamber (12); when the temperature in the chamber (12) increases, the auxiliary component (4) increases the detection range of the detection component (2) for the degree of deformation of the mainboard according to the size of the mainboard; when the temperature in the chamber (12) decreases, the auxiliary component (4) decreases the detection range of the detection component (2) for the degree of deformation of the mainboard according to the size of the mainboard.

2. The computer motherboard thermal cycle detection device according to claim 1, characterized in that: The detection assembly (2) comprises a mounting plate (21) fixedly arranged on the inner side of a chamber (12) of a test box body (11); a screw member (22) is rotatably arranged on one side of the mounting plate (21); a guide rod (23) is fixedly arranged on the other side of the mounting plate (21); a movable plate (24) is threadedly arranged on one side of the screw member (22) and is slidably arranged with the guide rod (23); a sliding frame (25) is fixedly arranged at equal intervals on the lower side of the movable plate (24); a clamp (26) is slidably arranged on the upper side of the sliding frame (25); a clamp (27) is fixedly arranged at equal intervals on one side of the mounting plate (21); and indicator lights (219) are installed at equal intervals on the outer side of the movable plate (24).

3. The computer motherboard thermal cycle detection device according to claim 2, characterized in that: The screw member (22) and the guide rod (23) are both provided with a support block (28) on one side of the movable plate (24); the support block (28) on the screw member (22) is rotatably arranged with the screw member (22); the support block (28) on the guide rod (23) is fixedly arranged with the guide rod (23); the two support blocks (28) are respectively fixedly arranged with the inner wall of the chamber (12) of the test box body (11); a first spring (29) is fixedly arranged between the clamp (26) and the movable plate (24); a pull rod member (216) is rotatably arranged on the lower side of the clamp (26); and a protrusion (217) is fixedly arranged at one end of the pull rod member (216) close to the clamp (26).

4. The computer motherboard thermal cycle detection device according to claim 3, characterized in that: A connecting plate (210) is fixedly provided on one side of the sliding frame (25), sliding members (211) are slidably provided on both sides of the connecting plate (210), sliding grooves (218) adapted to the sliding members (211) are provided on both sides of the connecting plate (210), the two sliding members (211) are slidably provided along the two sliding grooves (218) respectively, mounting blocks (212) are fixedly provided on the upper sides of the two sliding members (211), switches (213) electrically connected to the indicator light (219) are installed on the sides of the two mounting blocks (212) close to each other, a pressing block (215) is provided between the two mounting blocks (212), and a fixing rod (214) fixedly provided on the upper side of the pressing block (215) and fixed to the clamp (26).

5. The computer motherboard thermal cycle detection device according to claim 4, characterized in that: The adjustment assembly (3) comprises a stopper (31) slidably arranged on the lower side of the sliding frame (25), the stopper (31) being located on the lower side of the protrusion (217), the sliding frame (25) being symmetrically provided with guide grooves (32) on both sides of the stopper (31), the stopper (31) being slidably arranged along the guide grooves (32), and a second spring (33) fixedly arranged on the lower side of the stopper (31) and being fixedly arranged with the sliding frame (25).

6. The computer motherboard thermal cycle detection device according to claim 5, characterized in that: Ball bearings (37) are movably arranged at equal intervals on the upper side of the stop block (31); a first conductive block (35) is fixedly embedded on a side of the stop block (31) close to the clamp (26); a second conductive block (36) is fixedly embedded on a side of the clamp (26) close to the stop block (31); and an indicator rod (34) is fixedly arranged on the outer side of the pull rod (216).

7. The computer motherboard thermal cycle detection device according to claim 6, characterized in that: A first rack (38) is provided on one side of the sliding frame (25); a support rod (39) is symmetrically fixedly provided on the lower side of the first rack (38) and is fixedly provided on the bottom of the chamber (12) of the test box body (11); a first gear (310) is meshingly connected to one side of the first rack (38); a second gear (311) is fixedly provided on the upper side of the first gear (310); and a connecting rod (312) is rotatably provided in the middle of the first gear (310) and the second gear (311) and is fixedly provided on the bottom of the connecting plate (210).

8. The computer motherboard thermal cycle detection device according to claim 7, characterized in that: The second gear (311) is meshedly connected to the second racks (313) on both sides, and a support (314) movably penetrating the connecting plate (210) is fixedly provided on one side of the two second racks (313), and the upper ends of the two support (314) are respectively fixedly provided to the sliding members (211) on both sides.

9. The computer motherboard thermal cycle detection device according to claim 4, characterized in that: The auxiliary component (4) comprises two L-shaped plates (41) respectively fixedly arranged on one side of the two sliding members (211); a metal strip (42) is arranged on one side of the two L-shaped plates (41); limiting balls (43) are fixedly arranged on both sides of the metal strip (42); a mounting groove (44) matching the limiting balls (43) is arranged on the mounting block (212) and the side of the L-shaped plate (41) close to the metal strip (42); the limiting balls (43) are movably arranged in the mounting groove (44); limiting blocks (45) are fixedly arranged on the lower sides of the two mounting blocks (212); limiting grooves (46) matching the limiting blocks (45) are opened on the upper sides of the two sliding members (211); and the limiting blocks (45) slide along the limiting grooves (46).

10. The computer motherboard thermal cycle detection device according to claim 9, characterized in that: A bracket (47) is provided on one side of the two metal strips (42); tooth blocks (48) are slidably provided on the upper and lower sides of the bracket (47) located on the metal strip (42); a third spring (410) is fixedly provided between the tooth block (48) and the bracket (47); an electromagnetic block (49) is symmetrically fixedly provided on the sides of the two tooth blocks (48) close to each other; the outer bracket (47) is fixedly provided with a connecting plate (210); and the lower end of the inner bracket (47) is fixedly provided with a third spring (410) connected to the tooth block (48). A toothed condition (411) is slidably arranged on the connecting plate (210), and an orientation groove (412) matching the toothed condition (411) is provided on the connecting plate (210); a third gear (414) is meshedly connected to one side of the toothed condition (411); a fixed tooth block (413) fixedly arranged to the connecting plate (210) is meshedly connected to one side of the third gear (414); a support rod (415) fixedly arranged to the inner sliding member (211) is rotatably arranged in the middle of the third gear (414).

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