High and low temperature test equipment for optical module and use method thereof

Abstract

The invention discloses optical module high and low temperature testing equipment and a use method thereof, and belongs to the technical field of optical module testing. A pushing assembly is driven by a supporting assembly to move downwards and make contact with an object placing plate, and after a pressing ring is pressed, an inclined block is driven by a plurality of sliding rods to move upwards; the inclined surface part of the inclined block is in contact with the roller in the locking assembly, the roller can drive the sliding frame to slide in the second sliding hole, the sliding frame drives the positioning plates to approach the optical module, and the four positioning plates move synchronously, so that the four positioning plates can push the optical module to the central position of the supporting table, and the purpose of calibrating the center of the optical module is achieved. The optical module can be locked along with continuous folding of the positioning plate, and the optical module is tested by being matched with downward movement of the test jumper wire and being in contact with the port at the top of the optical module, so that the optical module is effectively rectified, and the test efficiency is improved. Deviation of the fixing point of the optical module is prevented from influencing the test precision.

Description

Technical Field

[0001] The present invention relates to the technical field of optical module testing, and in particular to a high and low temperature testing device for an optical module and a use method thereof. Background Art

[0002] In mobile telecommunication services such as the construction and networking of mobile communication core networks and access networks, mobile communication optical modules are important devices used in optical fiber communication systems. They are mainly used to realize photoelectric conversion and electro-optical conversion functions. They play a vital role in the entire optical network and can convert electrical signals into optical signals for long-distance transmission, or convert received optical signals back into electrical signals to complete information decoding.

[0003] High and low temperature testing of mobile communication optical modules is an important means to evaluate the performance of optical modules in high and low temperature environments to ensure their stability and reliability under high and low temperature conditions. When testing the optical module, the optical module needs to be heated or cooled to the target temperature before testing. After the test is completed, the next optical module needs to be heated or cooled before testing can begin. The preheating time is long, and only a single product can be tested each time. Such repeated operations make the utilization rate and test efficiency of the high and low temperature test box low; and during the test, the test jumper needs to be inserted into the port on the optical module to obtain data. In order to improve the test accuracy, a fixture will be used to lock it. However, for the testing of batch optical modules, frequent disassembly and assembly processes will increase the workload and reduce the efficiency of the entire test work. In addition, during the locking process, it is difficult to achieve the purpose of correcting the optical module, so that there is a certain deviation in the fixing point of each optical module, resulting in inconsistent angles and depths of jumper insertion, which affects the test accuracy and is prone to damage to the optical module or jumper end face. Summary of the invention

[0004] The purpose of the present invention is to provide a high and low temperature testing device for optical modules and a method of using the same, so as to solve the problems proposed in the above-mentioned background technology that the surface preheating time of the optical module is long and only a single product can be tested each time. Such repeated operations result in low utilization rate and test efficiency of the high and low temperature test box. For the testing of batch optical modules, frequent disassembly and assembly processes will increase the workload and reduce the efficiency of the entire testing work. Moreover, during the locking process, it is difficult to achieve the purpose of correcting the optical module, so that there is a certain deviation in the fixing point of each optical module, affecting the test accuracy.

[0005] To achieve the above object, the present invention provides the following technical solutions:

[0006] A high and low temperature test device for an optical module, comprising a high and low temperature test box, inlet and outlet holes are respectively opened on both sides of the high and low temperature test box, a workbench is installed at the bottom of the inner wall of the high and low temperature test box, a control panel and a TEC temperature control device are installed on the top of the high and low temperature test box, a plurality of support components are arranged in the high and low temperature test box, a fixing seat is fixedly connected to the support component, a plurality of fixing seats are fixedly connected to top plates, a multi-stage electric hydraulic rod is fixedly connected to the top plate, the top end of the multi-stage electric hydraulic rod is fixed to the top of the inner wall of the high and low temperature test box, a pushing component is installed at the bottom of the support component, four locking components are connected to the top end of the pushing component, the locking component passes through the inner side of the support component, a test component is arranged between the four locking components, and the test component is installed in the fixing seat;

[0007] The two sides of the workbench are respectively connected with storage plates, and the positions of the storage plates corresponding to the supporting components are provided with supporting platforms, and the temperature sensing module is provided on the supporting platform. Sealing plates are respectively installed in the middle of the two storage plates and on the sides of the two storage plates away from each other, wherein the two sealing plates are respectively installed in the inlet and outlet holes on both sides of the high and low temperature test box, and the bottoms of the two storage plates are provided with adjusting components, and the adjusting components are installed in the workbench.

[0008] As a further solution of the present invention, the support assembly includes an annular cylinder, four first sliding holes are opened at the bottom of the annular cylinder, the pushing assembly slides through the four first sliding holes, a plurality of roller rods are provided at the top of the inner wall of the annular cylinder corresponding to the positions of the first sliding holes, the bottom of the roller rods overlaps with the top of the locking assembly, four limiting holes and four second sliding holes are opened on the inner wall of the annular cylinder, and the locking assembly slides through the limiting holes and the second sliding holes.

[0009] As a further solution of the present invention, the pushing assembly includes a pressure ring, four sliding rods are fixedly connected to the pressure ring, the sliding rods are slidably connected in the first sliding hole, the top of the sliding rod is fixedly connected to a tilting block, and the top of the tilting block overlaps the locking assembly.

[0010] As a further solution of the present invention, the locking assembly includes a positioning plate, the inner wall of the positioning plate is provided with anti-slip patterns, a slide is fixed to the outer wall of the positioning plate, the slide slides through the second slide hole, a roller is installed at the bottom end of the slide, the roller overlaps the inclined surface of the tilting block, a first spring is fixedly connected between the slide and the inner wall of the annular cylinder, two limit rods are fixed below the outer wall of the positioning plate, and the limit rods are slidably connected in the limit hole.

[0011] As a further solution of the present invention, the test assembly includes a sensor, which is installed on the top of the inner wall of the fixed seat. A test jumper is plugged into the bottom of the sensor. A partition is provided outside the test jumper. The partition is slidably connected in the fixed seat, and a second spring is installed between the partition and the sensor.

[0012] As a further solution of the present invention, the adjustment assembly includes a motor, a screw is fixed on the output shaft of the motor, the screw is installed inside the workbench, nuts are threadedly connected on both sides of the screw, and the top of the nut is fixedly connected to the bottom of the storage plate.

[0013] As a further solution of the present invention, sliders are fixedly connected on both sides of the bottom of the storage plate, two slides and two slide grooves are provided on the workbench, the nut is slidably connected in the slide, the slider is slidably connected in the slide groove, universal wheels are respectively installed at the four corners of the bottom of the high and low temperature test box, and a glass window is installed on one side of the high and low temperature test box.

[0014] A method for using a high and low temperature test device for an optical module, the method comprising the following steps:

[0015] When performing high and low temperature tests on the optical module, the optical module is placed on the support table on the placement plate to facilitate subsequent correction of the position of the optical module. Secondly, the motor is controlled to drive the screw to rotate. During the rotation of the screw, the two nuts are driven to slide in the slideway, and the two nuts drive the two placement plates to move on the workbench. The placement plate on which the optical module is placed is moved into the high and low temperature test box, and the other placement plate and the upper sealing plate are moved out of the entrance and exit holes of the high and low temperature test box, so that the sealing plate in the middle of the two placement plates can seal one of the entrance and exit holes, and the sealing plate above the placement plate on which the optical module is placed seals the entrance and exit holes on the other side of the high and low temperature test box, so that the purpose of sealing the high and low temperature test box can be achieved, which is conducive to improving the subsequent test results;

[0016] After the optical module is moved to the high and low temperature test box, and the test assembly is located above multiple optical modules, the high and low temperature test box can heat and cool the optical module and detect the temperature through the TEC temperature control device to ensure the temperature in the high and low temperature test box, and the control panel has a temperature display function to ensure that the temperature in the high and low temperature test box meets the standard. The multi-stage electric hydraulic rod is extended to drive the top plate to move downward, and the top plate drives the test assembly to move downward through four fixed seats. The fixed seat drives the push assembly to move downward through the support assembly and contact the storage plate. At this time, the optical module is located Inside the annular cylinder, the pressure ring in the pushing assembly will drive the tilting block to move upward through multiple slide bars after being compressed. Because the inclined surface of the tilting block contacts the roller in the locking assembly, the roller can drive the slide to slide in the second slide hole during the process of squeezing the roller. The slide drives the positioning plate to approach the optical module. The four positioning plates move synchronously, so that the four positioning plates can push the optical module to the center position of the support, so as to achieve the purpose of calibrating the center of the optical module, so that the test assembly inside the fixing seat corresponds to the port at the top of the optical module. As the positioning plates continue to close, the optical module can be locked.

[0017] During the downward movement of the annular cylinder in the support assembly, the fixed seat drives the test jumper to move down through the sensor and contact the port at the top of the optical module. After the test jumper is compressed, it can drive the partition to move upward and squeeze the second spring, and the test jumper can slide at the port at the bottom of the sensor. The elastic force of the second spring elastically supports the partition, which can provide a downward supporting force to the partition and the test jumper, buffering the test jumper so that the test jumper can be stably inserted into the optical module for testing. At the same time, it prevents the test jumper from being damaged by hard contact with the optical module. The test data is transmitted to the control panel through the sensor, so as to facilitate regulation and analysis outside the high and low temperature test box.

[0018] After completing the test of the optical module on one of the placement plates, the optical module is placed on the placement plate outside the high and low temperature test chamber in advance, the multi-stage electric hydraulic rod is controlled to contract and the multiple fixing seats are driven to move upward through the top plate, so that the fixing seats drive the pushing assembly to move upward through the supporting assembly. When the pressure ring in the pushing assembly is away from the placement plate, the slide is supported by the elastic force of the first spring, so that the slide drives the positioning plate away from the optical module, and the four positioning plates move synchronously, which can release the locking state of the optical module, and adjust the pushing assembly to above the sealing plate;

[0019] By controlling the motor to drive the screw to rotate, the two nuts drive the two placement plates to move respectively. One of the placement plates can move the optical module after the test out of the high and low temperature test box, and the other placement plate can move the optical module to be tested into the high and low temperature test box, thereby achieving the purpose of continuous testing of batch optical modules. Moreover, when switching the workstations of the optical module that has completed the test and the optical module to be tested, the two adjacent sealing plates on the placement plates can seal the entry and exit holes on both sides of the high and low temperature test box to prevent the heat inside the high and low temperature test box from dissipating too quickly.

[0020] Compared with the prior art, the present invention has the following beneficial effects:

[0021] 1. The present invention moves the optical module to the high and low temperature test box, and the high and low temperature test box can heat up the optical module when it is working. The multi-stage electric hydraulic rod is controlled to extend to drive the top plate to move downward, and the top plate drives the test assembly to move downward through four fixed seats, and the fixed seat drives the push assembly to move downward through the support assembly and contact the storage plate. At this time, the optical module is located inside the annular cylinder, and the pressure ring in the push assembly is pressed and drives the tilting block to move upward through multiple sliding rods. Because the inclined surface of the tilting block contacts the roller in the locking assembly, the tilting block is in the process of squeezing the roller. In the middle, the roller can drive the slide to slide in the second slide hole, and the slide drives the positioning plate to approach the optical module. The four positioning plates move synchronously, so that the four positioning plates can push the optical module to the center position of the support, so as to achieve the purpose of calibrating the center of the optical module, so that the test component inside the fixing seat corresponds to the port at the top of the optical module. As the positioning plate continues to retract, the optical module can be locked, and the test jumper is moved down and contacts with the port at the top of the optical module to test the optical module, thereby effectively correcting the optical module to prevent the deviation of the fixing point of the optical module from affecting the test accuracy.

[0022] 2. The present invention controls the operation of the motor to drive the screw to rotate, so that the two nuts respectively drive the two placement plates and multiple sealing plates to move, wherein one placement plate can move the optical module after the test is completed out of the high and low temperature test box, and the other placement plate can move the optical module to be tested into the high and low temperature test box, thereby achieving the purpose of continuous testing of batch optical modules, and when the work stations of the optical modules that have completed the test and the optical modules to be tested are switched, the two adjacent sealing plates on the placement plate can seal the entry and exit holes on both sides of the high and low temperature test box to prevent the internal heat of the high and low temperature test box from dissipating too quickly and affecting the heating speed of the optical module, thereby improving the test efficiency.

[0023] 3. The present invention drives the test jumper to move down through the sensor and contact with the port at the top of the optical module. After the test jumper is compressed, it can drive the partition to move upward and squeeze the second spring, and the test jumper can slide at the port at the bottom of the sensor. The elastic force of the second spring elastically supports the partition, and a downward supporting force can be provided to the partition and the test jumper to buffer the test jumper, so that the test jumper can be stably inserted into the optical module for testing. At the same time, the test jumper is prevented from being damaged by hard contact with the optical module.

[0024] 4. The present invention controls the contraction of the multi-stage electric hydraulic rod and drives multiple fixed seats to move upward through the top plate, so that the fixed seat drives the pushing assembly to move upward through the supporting assembly. When the pressure ring in the pushing assembly is away from the storage plate, the slide is supported by the elastic force of the first spring, so that the slide drives the positioning plate away from the optical module, and the four positioning plates move synchronously, thereby facilitating the release of the locking state of all optical modules on the storage plate, without the need for human assistance, thereby improving the convenience of operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for describing the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0026] Figure 1 It is a three-dimensional structural schematic diagram of the present invention;

[0027] Figure 2 It is a schematic diagram of the structure of the present invention partially viewed from above;

[0028] Figure 3 It is a schematic diagram of the structure of the connection between the workbench and the storage plate of the present invention;

[0029] Figure 4 It is a structural schematic diagram of the cross section of the workbench of the present invention;

[0030] Figure 5 It is a structural schematic diagram of the connection between the fixing seat and the top plate of the present invention;

[0031] Figure 6 It is a schematic diagram of the structure of the connection between the support assembly and the fixing seat of the present invention;

[0032] Figure 7 It is a structural schematic diagram of the pushing assembly of the present invention;

[0033] Figure 8 It is a structural schematic diagram of the locking assembly of the present invention;

[0034] Fig. 9It is a structural schematic diagram of the test assembly of the present invention;

[0035] Fig.10 It is a structural schematic diagram of the cross section of the support assembly of the present invention.

[0036] In the accompanying drawings, the components represented by the reference numerals are listed as follows:

[0037] 1. High and low temperature test chamber; 2. Inlet and outlet holes; 3. Workbench; 4. Control panel; 5. Support assembly; 501. Annular cylinder; 502. First sliding hole; 503. Roller; 504. Second sliding hole; 505. Limiting hole; 6. Fixed seat; 7. Top plate; 8. Multi-stage electric hydraulic rod; 9. Push assembly; 901. Press ring; 902. Slide rod; 903. Tilt block; 10. Locking assembly; 101. Positioning plate; 102. Slide; 103. Roller; 104 , first spring; 105, limit rod; 11, test assembly; 111, sensor; 112, test jumper; 113, partition; 114, second spring; 12, storage plate; 13, support platform; 14, cover plate; 15, slider; 16, slideway; 17, slideway; 18, adjustment assembly; 181, motor; 182, lead screw; 183, nut; 19, universal wheel; 20, TEC temperature control device; 21, temperature sensor module; 22, glass window. DETAILED DESCRIPTION

[0038] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] See also Figure 1-Figure 10 , the present invention provides a technical solution:

[0040] A high and low temperature test device for an optical module comprises a high and low temperature test box 1, inlet and outlet holes 2 are respectively opened on both sides of the high and low temperature test box 1, a workbench 3 is installed at the bottom of the inner wall of the high and low temperature test box 1, a control panel 4 and a TEC temperature control device 20 are installed on the top of the high and low temperature test box 1, a plurality of support components 5 are arranged in the high and low temperature test box 1, a fixed seat 6 is fixedly connected to the support component 5, a plurality of top plates 7 are fixedly connected to the fixed seats 6, a multi-stage electric hydraulic rod 8 is fixedly connected to the top plate 7, the top of the multi-stage electric hydraulic rod 8 is fixed to the top of the inner wall of the high and low temperature test box 1, a pushing component 9 is installed at the bottom of the support component 5, four locking components 10 are connected to the top of the pushing component 9, the locking component 10 passes through the inner side of the support component 5, a test component 11 is arranged between the four locking components 10, the test component 11 is installed in the fixed seat 6, the pushing component 9 pushes up and down to drive the locking component 10 to move horizontally to clamp the optical module, and then the test component 11 performs a test operation on the optical module.

[0041] As a further solution of the present invention, the support component 5 includes an annular cylinder 501, and four first sliding holes 502 are opened at the bottom of the annular cylinder 501. The pushing component 9 includes a pressure ring 901, and four sliding rods 902 are fixedly connected to the pressure ring 901. The sliding rods 902 are slidably connected in the first sliding holes 502, and the top of the sliding rods 902 is fixedly connected to the tilting block 903; a plurality of rolling rods 503 are provided at the top of the inner wall of the annular cylinder 501 corresponding to the position of the first sliding holes 502, and four limiting holes 505 and four second sliding holes 504 are opened on the inner wall of the annular cylinder 501. The locking component 10 slides through the limiting holes 505 and the second sliding holes 504; the locking assembly 10 includes a positioning plate 101, the inner wall of the positioning plate 101 is provided with anti-slip patterns, an L-shaped slide 102 is fixed to the outer wall of the positioning plate 101, the slide 102 slides through the second slide hole 504, a roller 103 is installed at the bottom end of the slide 102, the roller 103 overlaps the inclined surface of the tilting block 903; a first spring 104 is fixedly connected between the slide 102 and the inner wall of the annular cylinder 501, two limit rods 105 are fixed below the outer wall of the positioning plate 101, the limit rods 105 are slidably connected in the limit hole 505, and the bottom of the roller 503 overlaps the top of the slide 102.

[0042] During operation, after the pressure ring 901 is compressed, it will drive the tilting block 903 to move upward through multiple sliding rods 902. Because the inclined surface part of the tilting block 903 contacts the roller 103 in the locking assembly 10, the inclined surface part of the tilting block 903 contacts the roller 103. When the tilting block 903 moves upward, the roller 103 can roll on the tilting block 903, thereby reducing the friction force generated by the roller 103 driving the slide 102 to move; in the process of squeezing the roller 103 by the tilting block 903, the roller 103 can drive the slide 102 to slide in the second sliding hole 504, and by changing the direction of force transmission, it is convenient to adjust the positioning plate 101 horizontally to achieve positioning, locking or unlocking the optical module; in the process of moving the positioning plate 101, it can drive the limiting rod 105 to slide in the limiting hole 505, which can play a role in supporting and limiting the positioning plate 101, thereby improving the stability of the horizontal movement of the positioning plate 101.

[0043] A roller rod 503 is installed at the top of the inner wall of the annular cylinder 501, and can move at the bottom of the roller rod 503 during the movement of the slide 102, thereby reducing the friction generated when the slide 102 moves, and cooperating with the second sliding hole 504 to limit the positioning plate 101, thereby improving the stability of the horizontal movement of the locking assembly 10.

[0044] When the pressure ring 901 in the pushing assembly 9 is away from the storage plate 12, the slide 102 is supported by the elastic force of the first spring 104, so that the slide 102 drives the positioning plate 101 away from the optical module, and the four positioning plates 101 move synchronously, which facilitates the unlocking of the optical module.

[0045] As a further solution of the present invention, the test assembly 11 includes a sensor 111, which is mounted on the top of the inner wall of the fixing seat 6, and a test jumper 112 is plugged into the bottom of the sensor 111. A partition 113 is provided outside the test jumper 112, and the partition 113 is slidably connected in the fixing seat 6 and can slide up and down internally, and a second spring 114 is installed between the partition 113 and the sensor 111. The test jumper 112 can slide in the port at the bottom of the sensor 111, and the partition 113 is elastically supported by the elastic force of the second spring 114, which can provide a downward supporting force to the partition 113 and the test jumper 112, and buffer the test jumper 112 to prevent the test jumper 112 from being damaged by hard contact with the optical module.

[0046] As a further solution of the present invention, the two sides of the workbench 3 are connected with storage plates 12, and the positions of the storage plates 12 corresponding to the support components 5 are provided with a support platform 13, and the support platform 13 is provided with a temperature sensor module 21. The middle of the two storage plates 12 and the side of the two storage plates 12 away from each other are respectively installed with sealing plates 14, wherein the two sealing plates 14 are respectively installed in the inlet and outlet holes 2 on both sides of the high and low temperature test box 1, and the bottom of the two storage plates 12 is provided with an adjustment component 18, and the adjustment component 18 is installed in the workbench 3. The optical module can be pushed to the center position of the support platform 13 by the synchronously moving locking component 10, so as to achieve the purpose of calibrating the center of the optical module, so that the test component 11 corresponds to the port at the top of the optical module, and the optical module can be locked as the four locking components 10 are continuously retracted, thereby improving the stability of the optical module test.

[0047] The adjustment assembly 18 includes a motor 181, on the output shaft of the motor 181 is fixed a screw rod 182, the screw rod 182 is installed inside the workbench 3, and the two sides of the screw rod 182 are respectively threadedly connected with nuts 183, and the top of the nut 183 is fixedly connected to the bottom of the storage plate 12. The two sides of the bottom of the storage plate 12 are respectively fixedly connected with sliders 15, and two slideways 16 and two slide grooves 17 are provided on the workbench 3. The nut 183 is slidably connected in the slideway 16, and the slider 15 is slidably connected in the slide groove 17. Universal wheels 19 are respectively installed at the four corners of the bottom of the high and low temperature test box 1, and a glass window 22 is installed on one side of the high and low temperature test box 1. The glass window 22 is provided to observe the internal conditions of the high and low temperature test box 1;

[0048] During the rotation of the screw rod 182, the two nuts 183 will slide in the slideway 16, and the two nuts 183 will drive the two storage plates 12 to move on the workbench 3, so that the position of the optical module on the storage plate 12 can be adjusted, which is convenient for taking and placing the optical module. The slider 15 is limited by the slide groove 17, and the slider 15 is T-shaped to improve the stability of the horizontal movement of the storage plate 12, and the slideway 16 can limit the nut 183, so that the nut 183 will not rotate synchronously during the rotation of the screw rod 182, which is convenient for adjusting the position of the nut 183, and the setting of the universal wheel 19 is convenient for transferring the test equipment.

[0049] A method for using a high and low temperature test device for an optical module, the method comprising the following steps:

[0050] When the optical module is subjected to a high and low temperature test, the optical module is placed on the support 13 on the placement plate 12 to facilitate subsequent correction of the optical module. Next, the motor 181 is controlled to drive the screw 182 to rotate. During the rotation of the screw 182, the two nuts 183 are driven to slide in the slideway 16. The two nuts 183 drive the two placement plates 12 to move on the workbench 3. The placement plate 12 on which the optical module is placed is moved into the high and low temperature test box 1. The other placement plate 12 and the sealing plate 14 above are moved out of the inlet and outlet holes 2 of the high and low temperature test box 1, so that the sealing plates 14 in the middle of the two placement plates 12 can seal one of the inlet and outlet holes 2. The sealing plate 14 above the placement plate 12 on which the optical module is placed seals the inlet and outlet holes 2 on the other side of the high and low temperature test box 1, so that the purpose of sealing the high and low temperature test box 1 can be achieved, which is conducive to improving the subsequent test effect.

[0051] After the optical module is moved to the high and low temperature test box 1, and the test assembly 11 is located above the multiple optical modules, the high and low temperature test box 1 can heat and cool the optical module and detect the temperature through the TEC temperature control device 20 to ensure the temperature in the high and low temperature test box 1, and the control panel 4 has a temperature display function to ensure that the temperature in the high and low temperature test box 1 meets the standard, and the multi-stage electric hydraulic rod 8 is controlled to extend to drive the top plate 7 to move downward, and the top plate 7 drives the test assembly 11 to move downward through the four fixed seats 6, and the fixed seat 6 drives the push assembly 9 to move downward through the support assembly 5 and contact with the storage plate 12. At this time, the optical module is located inside the annular cylinder 501, and the pressure ring in the push assembly 9 After being compressed, 901 will drive the tilting block 903 to move upward through multiple slide bars 902. Because the inclined surface of the tilting block 903 contacts the roller 103 in the locking assembly 10, the tilting block 903 is in the process of squeezing the roller 103, and the roller 103 can drive the slide 102 to slide in the second slide hole 504. The slide 102 drives the positioning plate 101 to approach the optical module. The four positioning plates 101 move synchronously, so that the four positioning plates 101 can push the optical module to the center position of the support 13, so as to achieve the purpose of calibrating the center of the optical module, so that the test assembly 11 inside the fixing seat 6 corresponds to the port at the top of the optical module, and the optical module can be locked as the positioning plates 101 continue to be retracted;

[0052] During the downward movement of the annular cylinder 501 in the support assembly 5, the fixing seat 6 drives the test jumper 112 to move downward through the sensor 111 and contact the port at the top of the optical module. After the test jumper 112 is compressed, it can drive the partition 113 to move upward and squeeze the second spring 114, and the test jumper 112 can slide at the port at the bottom of the sensor 111. The partition 113 is elastically supported by the elastic force of the second spring 114, and a downward supporting force can be provided to the partition 113 and the test jumper 112, so as to buffer the test jumper 112, so that the test jumper 112 can be stably inserted into the optical module for testing. At the same time, the test jumper 112 is prevented from being damaged by hard contact with the optical module. The test data is transmitted to the control panel 4 through the sensor 111, so as to facilitate regulation and analysis outside the high and low temperature test box 1;

[0053] After completing the test of the optical module on one of the storage plates 12, the optical module is placed on the storage plate 12 outside the high and low temperature test box 1 in advance, the multi-stage electric hydraulic rod 8 is controlled to contract and the multiple fixing seats 6 are driven to move upward through the top plate 7, so that the fixing seats 6 drive the pushing assembly 9 to move upward through the supporting assembly 5. When the pressure ring 901 in the pushing assembly 9 is away from the storage plate 12, the slide 102 is supported by the elastic force of the first spring 104, so that the slide 102 drives the positioning plate 101 away from the optical module, and the four positioning plates 101 move synchronously, which can release the locking state of the optical module, and adjust the pushing assembly 9 to the top of the sealing plate 14;

[0054] By controlling the motor 181 to work and drive the screw rod 182 to rotate, the two nuts 183 respectively drive the two placement plates 12 to move, one of the placement plates 12 can move the optical module after the test out of the high and low temperature test box 1, and the other placement plate 12 moves the optical module to be tested into the high and low temperature test box 1, thereby achieving the purpose of continuity testing of batch optical modules, and when the work stations of the optical modules that have completed the test and the optical modules to be tested are switched, the two adjacent sealing plates 14 on the placement plate 12 can seal the inlet and outlet holes 2 on both sides of the high and low temperature test box 1 to prevent the internal heat of the high and low temperature test box 1 from dissipating too quickly.

Claims

1. A high and low temperature test device for an optical module, comprising a high and low temperature test box (1), characterized in that: The high and low temperature test box (1) is provided with inlet and outlet holes (2) on both sides, a workbench (3) is installed at the bottom of the inner wall of the high and low temperature test box (1), a control panel (4) and a TEC temperature control device (20) are installed on the top of the high and low temperature test box (1), and a plurality of support components (5) are provided in the high and low temperature test box (1), a fixing seat (6) is fixedly connected to the support component (5), a plurality of fixing seats (6) are fixedly connected to a top plate (7), and the top plate (7) is A multi-stage electric hydraulic rod (8) is fixedly connected to the top, the top of the multi-stage electric hydraulic rod (8) is fixed to the top of the inner wall of the high and low temperature test box (1), a pushing assembly (9) is installed at the bottom of the support assembly (5), and the top of the pushing assembly (9) is connected to four locking assemblies (10), the locking assembly (10) passes through the inner side of the support assembly (5), and a test assembly (11) is arranged between the four locking assemblies (10), and the test assembly (11) is installed in the fixing seat (6); The two sides of the workbench (3) are respectively connected to storage plates (12); a support platform (13) is provided on the storage plates (12) at positions corresponding to the support components (5); a temperature sensing module (21) is provided on the support platform (13); sealing plates (14) are respectively installed in the middle of the two storage plates (12) and on the sides of the two storage plates (12) away from each other, wherein the two sealing plates (14) are respectively installed in the inlet and outlet holes (2) on both sides of the high and low temperature test box (1); and an adjustment component (18) is provided at the bottom of the two storage plates (12); and the adjustment component (18) is installed in the workbench (3).

2. The high and low temperature testing equipment for optical modules according to claim 1, characterized in that: The support assembly (5) comprises an annular cylinder (501), the bottom of which is provided with four first sliding holes (502), the pushing assembly (9) passes through and slides in the four first sliding holes (502), a plurality of rollers (503) are provided at the top of the inner wall of the annular cylinder (501) at positions corresponding to the first sliding holes (502), the bottom of the rollers (503) overlaps with the top of the locking assembly (10), the inner wall of the annular cylinder (501) is provided with four limiting holes (505) and four second sliding holes (504), the locking assembly (10) passes through and slides in the limiting holes (505) and the second sliding holes (504).

3. The high and low temperature testing equipment for optical modules according to claim 2, characterized in that: The pushing assembly (9) comprises a pressing ring (901), four sliding rods (902) are fixedly connected to the pressing ring (901), the sliding rods (902) are slidably connected in the first sliding hole (502), the top of the sliding rod (902) is fixedly connected to a tilting block (903), and the top of the tilting block (903) overlaps with the locking assembly (10).

4. The high and low temperature testing equipment for optical modules according to claim 3, characterized in that: The locking assembly (10) comprises a positioning plate (101), the inner wall of the positioning plate (101) is provided with anti-slip grooves, a slide (102) is fixed to the outer wall of the positioning plate (101), the slide (102) slides through the second slide hole (504), a roller (103) is installed at the bottom end of the slide (102), the roller (103) overlaps the inclined surface part of the tilting block (903), a first spring (104) is fixedly connected between the slide (102) and the inner wall of the annular cylinder (501), and two limiting rods (105) are fixed below the outer wall of the positioning plate (101), and the limiting rods (105) are slidably connected in the limiting hole (505).

5. The high and low temperature testing equipment for optical modules according to claim 1, characterized in that: The test assembly (11) comprises a sensor (111), wherein the sensor (111) is mounted on the top of the inner wall of a fixing seat (6), a test jumper (112) is plugged into the bottom of the sensor (111), a partition (113) is arranged outside the test jumper (112), the partition (113) is slidably connected in the fixing seat (6), and a second spring (114) is installed between the partition (113) and the sensor (111).

6. The high and low temperature testing equipment for optical modules according to claim 1, characterized in that: The adjustment assembly (18) comprises a motor (181), a screw rod (182) being fixed on the output shaft of the motor (181), the screw rod (182) being installed inside the workbench (3), nuts (183) being threadedly connected on both sides of the screw rod (182), and the top of the nut (183) being fixedly connected to the bottom of the storage plate (12).

7. The high and low temperature testing equipment for optical modules according to claim 6, characterized in that: Slide blocks (15) are fixedly connected to both sides of the bottom of the storage plate (12), two slideways (16) and two slide grooves (17) are provided on the workbench (3), the nut (183) is slidably connected in the slideway (16), the slide block (15) is slidably connected in the slide groove (17), universal wheels (19) are respectively installed at the four corners of the bottom of the high and low temperature test box (1), and a glass window (22) is installed on one side of the high and low temperature test box (1).

8. A method for using a high and low temperature test device for an optical module, according to the high and low temperature test device for an optical module according to claims 1-7, characterized in that: The method of use comprises the following steps: When the optical module is subjected to a high and low temperature test, the optical module is placed on a support platform (13) on the placement plate (12) to facilitate subsequent correction of the optical module. Then, the motor (181) is controlled to work so as to drive the screw rod (182) to rotate. During the rotation of the screw rod (182), two nuts (183) are driven to slide in the slideway (16). The two nuts (183) drive the two placement plates (12) to move on the workbench (3). The placement plate (12) on which the optical module is placed is moved to In the high and low temperature test box (1), another storage plate (12) and the sealing plate (14) above are moved out of the inlet and outlet holes (2) of the high and low temperature test box (1), so that the sealing plate (14) in the middle of the two storage plates (12) can seal one of the inlet and outlet holes (2), and the sealing plate (14) above the storage plate (12) on which the optical module is placed seals the inlet and outlet holes (2) on the other side of the high and low temperature test box (1), thereby achieving the purpose of sealing the high and low temperature test box (1), which is conducive to improving the subsequent test results; After the optical module is moved to the high and low temperature test box (1), and the test assembly (11) is located above the plurality of optical modules, the high and low temperature test box (1) can heat and cool the optical module and detect the temperature through the TEC temperature control device (20) to ensure the temperature inside the high and low temperature test box (1), and the control panel (4) has a temperature display function to ensure that the temperature inside the high and low temperature test box (1) meets the standard. The multi-stage electric hydraulic rod (8) is controlled to extend so as to drive the top plate (7) to move downward, and the top plate (7) drives the test assembly (11) to move downward through the four fixing seats (6), and the fixing seat (6) drives the push assembly (9) to move downward through the support assembly (5) and contact the storage plate (12). At this time, the optical module is located inside the annular cylinder (501), and the pressure ring ( After being compressed, the tilting block (901) will drive the tilting block (903) to move upward through the multiple slide bars (902). Because the inclined surface of the tilting block (903) contacts the roller (103) in the locking assembly (10), the roller (103) can drive the slide (102) to slide in the second slide hole (504) during the squeezing of the roller (103). The slide (102) drives the positioning plate (101) to approach the optical module. The four positioning plates (101) move synchronously, so that the four positioning plates (101) can push the optical module to the center position of the support platform (13), so as to achieve the purpose of calibrating the center of the optical module, so that the test assembly (11) inside the fixing seat (6) corresponds to the port at the top of the optical module. As the positioning plates (101) continue to be retracted, the optical module can be locked. During the downward movement of the annular cylinder (501) in the support assembly (5), the fixed seat (6) drives the test jumper (112) to move downward through the sensor (111) and contact the port at the top of the optical module. After being compressed, the test jumper (112) can drive the partition (113) to move upward and squeeze the second spring (114), and the test jumper (112) can slide at the port at the bottom of the sensor (111). The partition (113) is elastically supported by the elastic force of the second spring (114), and a downward supporting force can be provided to the partition (113) and the test jumper (112), so as to buffer the test jumper (112) so that the test jumper (112) can be stably inserted into the optical module for testing. At the same time, the test jumper (112) is prevented from being damaged by hard contact with the optical module. The test data is transmitted to the control panel (4) through the sensor (111) so as to facilitate regulation and analysis outside the high and low temperature test box (1); After completing the test of the optical module on one of the storage plates (12), the optical module is placed on the storage plate (12) outside the high and low temperature test box (1) in advance, the multi-stage electric hydraulic rod (8) is controlled to contract and drive the plurality of fixing seats (6) to move upward through the top plate (7), so that the fixing seats (6) drive the pushing assembly (9) to move upward through the supporting assembly (5), and when the pressure ring (901) in the pushing assembly (9) is away from the storage plate (12), the slide (102) is supported by the elastic force of the first spring (104), so that the slide (102) drives the positioning plate (101) away from the optical module, and the four positioning plates (101) move synchronously, so that the locking state of the optical module can be released, and the pushing assembly (9) is adjusted to be above the sealing plate (14); By controlling the motor (181) to work and drive the lead screw (182) to rotate, the two nuts (183) respectively drive the two placement plates (12) to move, one of the placement plates (12) can move the optical module after the test out of the high and low temperature test box (1), and the other placement plate (12) can move the optical module to be tested into the high and low temperature test box (1), thereby achieving the purpose of continuous testing of batch optical modules, and when the workstations of the optical modules that have been tested and the optical modules to be tested are switched, the two adjacent sealing plates (14) on the placement plate (12) can seal the inlet and outlet holes (2) on both sides of the high and low temperature test box (1), so as to prevent the heat inside the high and low temperature test box (1) from being dissipated too quickly.

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