System and method for testing devices on production line
By combining self-testing protocols and light emitting diodes (LEDs), coded signals are generated to indicate the device status, which solves the problem that devices on the production line are shielded or sealed components are difficult to test, and convenient and efficient functional self-testing is achieved, improving testing efficiency and accuracy.
Patent Information
- Application Number
- CN202380068766.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2022-07-26
- Filing Date
- 2023-07-26
- Publication Date
- 2025-05-06
AI Technical Summary
The prior art is difficult to perform effective functional testing on shielded or sealed components in a production line device, especially in the absence of electrical connections or radio communications of the components.
A system that combines a self-test protocol with a light emitting diode (LED) is used. The self-test protocol performs functional testing of multiple components in the device and generates test data. The LED generates an encoded signal corresponding to the test data, and indicates the device status to the terminal user through user interaction. The reader decodes the encoded signal to provide functional test analysis.
It realizes convenient functional self-testing of the equipment on the production line, allowing the personnel on the production line to easily detect faults during the production process of the equipment, improves testing efficiency and accuracy, and does not require additional hardware, saving costs and space.
Smart Images
Figure CN119948888A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to production line manufacturing. In particular, but not exclusively, the present invention relates to a system and method for performing functional testing on devices on a production line. Background Art
[0002] Typically, during the production phase of various devices and equipment, a number of functional or quality tests are performed to check whether the devices and equipment function properly. Such testing of devices and equipment is essential before the items are shipped for sale.
[0003] Typically, in order to perform such tests, devices and equipment are equipped with some test protocols that can perform functional tests on various components in the devices and equipment. However, typically, many of these components are shielded within the devices and equipment themselves or the devices are sealed. Therefore, it becomes difficult to perform tests on such shielded components or shielded devices as a whole. In addition, in some scenarios, the components may not have any electrical connections or radio communications to transmit the results of the functional tests.
[0004] Therefore, in light of the foregoing discussion, there exists a need to overcome the above-mentioned disadvantages associated with performing functional testing on devices on a production line. Summary of the invention
[0005] A first aspect of the present invention provides a system for performing a functional test on a device on a production line, wherein the system comprises:
[0006] - a self-test protocol configured to perform a functional test on a plurality of components in the device and to generate test data corresponding to the results of the functional test;
[0007] - one or more light emitting diodes, configured as
[0008] - generating an encoded signal corresponding to the generated test data, and
[0009] - providing a user interface for indicating one or more states of the device to an end user; and
[0010] - a reader configured to read and decode the encoded signal to provide a functional test analysis of the device.
[0011] Suitably, the above-described system of the present disclosure is intended to perform functional self-tests on devices on a production line in a manner that allows personnel on the production line to easily detect any faults in the device during production of the device itself.
[0012] In this document, the term "device" refers to a machine configured to perform a specific set of functions. Optionally, the device can be a mechanical device, an electrical or electronic device. Some examples of devices can be mobile phones, laptops, wearable smart devices, refrigerators, air conditioners, etc. In addition, the system of the present disclosure is used to perform functional testing on devices on a production line, that is, when the device is manufactured or after the device is assembled but before the device is packaged for shipment.
[0013] In this article, the term "self-test protocol" refers to a protocol (or algorithm) performed by the arrangement of components required for running functional tests and providing results and feedback based on the functional tests of the device. Optionally, a self-test integrated circuit can be used to perform the self-test protocol. In this article, the self-test protocol can perform self-tests, that is, the ability to test without any external help. In addition, multiple components are installed in the device, wherein each component in the multiple components installed is used for a specific purpose in the device. To this end, the self-test integrated circuit can be connected to the multiple components installed in the device.
[0014] In addition, the self-test protocol is configured to perform functional tests on multiple components and generate test data corresponding to the results of the functional tests. In this article, the term "functional test" collectively refers to a self-test performed by a self-test integrated circuit to test the functionality of multiple components installed in a device, wherein the functional test will generate results about the functionality of multiple components referred to as "test data". Optionally, the results of the test data can be in the form of a "yes" or "no" statement. Alternatively, the test data can include data based on numbers or percentages.
[0015] Optionally, the functional test analysis includes: the identity of the device, an indication of the functional pass or fail of the device, the nature of the failure of the device, the threshold of the pass or fail of the device, and the missing or mismatched components in the device. In this article, the identity of the device may include an identity code or number of the authentication device, the indication of the functional pass or fail of the device may indicate whether the device passed the functional test performed, the nature of the failure of the device may include the type of failure in the device, the threshold of the pass or fail of the device may include the degree or how serious the failure is, the missing components may include details of the components that are missing or not functioning as expected in the device, and the mismatch in the device may include whether any other components in the device have replaced the correct components. Therefore, the functional test analysis includes a detailed analysis report that classifies the functionality of the device for various parameters.
[0016] The system includes one or more light emitting diodes or other light emitting devices configured to generate coded signals corresponding to the generated test data and provide a user interaction means for indicating one or more states of the device to an end user. In this document, generally, the one or more light emitting diodes or other light emitting devices are activated when current passes through them, and in response, electrical energy is thereby converted into visible light.
[0017] In addition, for the test data of the generated multiple components, the one or more light emitting diodes (LEDs) or other light emitting devices generate a coded signal. In this article, the term "coded signal" refers to a readable pattern of a light signal emitted by one or more LEDs or other light emitting devices, and the readable pattern of the light signal contains data corresponding to the generated test data in an encoded manner. In this regard, the one or more LEDs or other light emitting devices used to generate the coded signal are already pre-installed in the device, thereby ensuring that no additional components or hardware are to be installed in the device, making the system cost-effective. In addition, the coded signal will have a signal-to-space ratio that is independent of the generated test data to be sent, that is, the content of the generated test data will not change the lighting performance of the one or more LEDs or other light emitting devices, thereby making the one or more LEDs or other light emitting devices appear to be a constant apparent brightness for the end user.
[0018] In addition, the one or more light emitting diodes or other light emitting devices are configured to provide a user interaction means for indicating one or more states of the device to an end user. In this regard, one or more LEDs or other light emitting devices pre-installed in the device can be configured to perform the primary function of providing a user interaction means to an end user of the device, or for any other user interaction.
[0019] Optionally, the one or more light emitting diodes or other light emitting devices are selected from at least one of the following: organic light emitting diodes, light emitting polymers, electroluminescent panels, laser diodes, quantum dot displays, incandescent lamps and fluorescent lamps, and the one or more light emitting diodes or other light emitting devices are configured to indicate one or more states of the device selected from the following: the charging state or operating mode of the device or other user interaction means functions. Generally, light emitting diodes (LEDs) are semiconductor devices that are energy-saving, have long life, compact size and fast response time, and emit light (convert electrical energy into visible light) when current passes through them. Therefore, in the present disclosure, LEDs are used as indicators of the functionality of the device without requiring a lot of space or frequent replacement. Beneficially, LEDs are available in various colors (including white, red, green, blue, etc.), and therefore, in this article, LEDs can be combined in different color combinations to uniquely indicate different states of the device.
[0020] Optionally, one or more light emitting devices are selected from at least one of the following: organic light emitting diodes, light emitting polymers, electroluminescent panels, laser diodes, quantum dot displays, incandescent lamps and fluorescent lamps. Organic light emitting diodes (OLEDs) and light emitting polymers (LEPs) use organic compounds and polymers as luminescent materials, respectively, rather than inorganic semiconductor materials as used in LEDs, and can emit light when an electric current is applied thereto. Similarly, electroluminescent (EL) panels emit light when an electric field is applied to them. Laser diodes are semiconductor devices that emit coherent light (lasers) when electrically biased. Plasma display panels (PDPs) use ionized gases (plasmas) to emit light and produce images.
[0021] Incandescent lamps emit light by heating a metal filament to a high temperature until it glows. Fluorescent lamps emit light when electricity excites mercury vapor and causes the phosphor coating inside the lamp to fluoresce. Quantum dot displays use quantum dots, which are semiconductor nanocrystals. Similar to LEDs, one or more of the aforementioned light emitting devices can be employed in different combinations with different activation modes to serve as indicators of the functionality of the device.
[0022] In this article, a user interaction means pre-installed with one or more light-emitting diodes or other light-emitting devices can be used to display the charging status of the device to the end user of the device, that is, the amount of energy remaining in the device. In addition, the user interaction means can be used to display the working mode of the device to the end user of the device, that is, the device can have the ability to work in more than one mode and display the working mode in which the device is currently working to the end user. Optionally, the working mode may include information corresponding to the startup of the device, such as active mode, sleep mode, inactive mode, etc.; the network connection state of the device, such as connected state, disconnected state, connecting state, limited connection state, no signal state, flight mode, etc.; the pairing state of the device, such as pairing mode on state, pairing mode off state, device discovery state, pairing initiation state, pairing confirmation state, etc. In addition, one or more light-emitting diodes (LEDs) or other light-emitting devices are configured to provide user interaction means for indicating other information (such as error or warning indicators, notifications, audio levels, time, date, temperature or environmental conditions, etc.).
[0023] In addition, the one or more light emitting diodes or other light emitting devices are configured to provide a user interaction means for indicating the pass or fail of the device. In this regard, the one or more light emitting diodes or other light emitting devices can be activated in a defined manner to indicate the functional pass or fail of the device, the threshold of the pass or fail of the device, the nature of the failure of the device, etc. Specifically, information related to the device on the production line is transmitted by a rapidly changing digital signal encoded in the pulse of one or more light emitting diodes or other light emitting devices.
[0024] Optionally, the coded signal is generated according to a coding scheme. In this document, the term "coding scheme" refers to a manner of representing binary bits of the generated test data, which is used by one or more LEDs to generate a corresponding coded signal. In this document, using a coding scheme to represent the generated test data allows any redundancy to be removed from the generated test data, and thus reduces the final size of the generated test data.
[0025] Optionally, the coding scheme is selected from at least one of the following: Manchester line coding, return to zero (RZ) line coding, non-return to zero (NRZ) line coding. In this article, Manchester line coding, return to zero (RZ) line coding and non-return to zero (NRZ) line coding are different ways to represent the binary bits of the generated test data, which can be used by one or more LEDs to generate corresponding coded signals. In this regard, Manchester line coding encodes each data as low then high or high then low, and the high and low last for equal time to control the phase of the square wave carrier. It is worth noting that Manchester line coding can have a jump in the middle or beginning of each bit period. Return to zero (RZ) line coding is a binary coding in which the signal drops to 0 between each pulse (usually halfway through each bit), where zero is a neutral or static state between valid binary codes representing 1 and 0 bits. It is worth noting that RZ line coding always starts and ends with 0. For example, non-return to zero (NRZ) line coding is a binary coding in which 1 describes a positive voltage and 0 describes a negative voltage or a neutral state. It is worth noting that NRZ line coding may or may not start and end with 0, it may also have 0 in the middle. In addition, NRZ line coding has more energy than RZ line coding, but requires lower bandwidth than RZ line coding and Manchester line coding. It will be appreciated that there may be other serial data encoding schemes known to those skilled in the art that may also be used.
[0026] It should be noted that by using Manchester encoding or any other encoding scheme where the mark-space ratio (average ratio of ones and zeros) of the data is independent of the data being transmitted, the content of the data will not change the visual state of the LEDs and they will appear as a constant apparent brightness. In other words, the data rate used is faster than the data rate perceived by the human eye.
[0027] Thus, test information can be communicated using the same set of LEDs that are also used to provide a visual indication to an end user of the device. Advantageously, this saves cost and space as no additional hardware is required in the device to implement this feature.
[0028] Optionally, the coded signal is implemented as a lighting pattern corresponding to the electrical signal of the single-wire serial interface. Typically, the single-wire serial interface requires only a single conductor (physical line) for bidirectional data transmission such as via an electrical signal between two or more devices. To this end, the electrical signal represents the binary data being transmitted to allow reliable communication using a single line for data transmission and reception. In essence, the bits of the generated test data represented by the coding scheme are used to generate a corresponding coded signal in the form of a lighting pattern in a serial manner one by one. The electrical signal containing the data to be sent modulates the intensity of the light emitted by one or more LEDs or other light-emitting devices. Modulation is achieved by changing the current applied to the one or more LEDs or other light-emitting devices in proportion to the binary data being transmitted. As the current changes, the intensity of the light also changes. Therefore, the use of a single-wire serial interface ensures that the system is cost-effective to install, because only a single line is required for the purpose of generating a coded signal according to the coding scheme.
[0029] In addition, the term "reader" refers to a component capable of reading a coded signal generated by one or more LEDs, and based on the reader's reading of the coded signal, the reader decodes the coded signal. Subsequently, based on the results achieved via the decoding of the coded signal, the reader provides a functional test analysis for the device to a production line worker responsible for verifying the functionality of the device. In this document, the term "functional test analysis" refers to a report containing the results and analysis of functional tests performed on multiple components in a device. In this document, the functional test analysis helps workers (i.e., production line workers) correctly authenticate whether the device is working effectively. Optionally, the reader is installed in a system separately from the device, preferably in a production line, so that the reader can read and decode coded signals from the device via one or more LEDs.
[0030] Optionally, the system further comprises a storage database configured to store the test data and the functional test analysis. In this context, the storage database may be a cloud-based database or an external device that stores the test data and the functional test analysis for future reference, or runs a detailed analysis of the stored test data and the functional test analysis for generating further inferences.
[0031] Thus, the system can compare functional test analyses of devices manufactured in more than two separate batches.
[0032] A second aspect of the present invention provides a method for performing a functional test on a device on a production line, wherein the method comprises:
[0033] - performing functional tests on a plurality of components in the device and generating test data corresponding to the results of the functional tests;
[0034] - generating an encoded signal corresponding to the generated test data;
[0035] - indicating one or more states of the device to an end user; and
[0036] - Read and decode coded signals to provide functional test analysis of the device.
[0037] The various embodiments and variations disclosed above apply mutatis mutandis to the method.
[0038] Suitably, the foregoing method is an efficient and robust method for providing functional analysis of the device itself as well as components installed in the device (which components may be shielded in the device).
[0039] Optionally, the functional test analysis includes: identity of the device, indication of functional pass or fail of the device, nature of failure of the device, pass or fail threshold of the device, missing or mismatched components in the device.
[0040] Optionally, the one or more states of the device are selected from: a charging state or an operating mode of the device or other user interaction means functions.
[0041] Optionally, the coded signal is generated according to a coding scheme.
[0042] Optionally, the coding scheme is selected from at least one of the following: Manchester line coding, return-to-zero (RZ) line coding, non-return-to-zero (NRZ) line coding.
[0043] Optionally, the coded signal is implemented as a lighting pattern corresponding to an electrical signal of the single-wire serial interface.
[0044] Optionally, the method further comprises storing the test data and the functional test analysis.
[0045] Throughout the description and claims of this specification, the words "comprise" and "contain" and variations of these words, such as "comprising" and "comprises" mean "including but not limited to", and do not exclude other components, integers or steps. In addition, unless the context requires otherwise, the singular includes the plural. In particular, where the indefinite article is used, the specification is to be understood as contemplating the plural as well as the singular, unless the context requires otherwise.
[0046] Preferred features of each aspect of the invention may be as described in conjunction with any other aspect. Within the scope of the present application, it is expressly intended that the various aspects, embodiments, examples and alternatives set forth in the above paragraphs, in the claims and / or in the following description and drawings, and in particular, their individual features, may be taken independently or in any combination. That is, all embodiments and / or features of any embodiment may be combined in any manner and / or combination, unless such features are incompatible. BRIEF DESCRIPTION OF THE DRAWINGS
[0047] One or more embodiments of the present invention will now be described, by way of example only, with reference to the accompanying drawings, in which:
[0048] Figure 1 is a block diagram of a system for performing functional testing on devices on a production line according to an embodiment of the present disclosure;
[0049] Figure 2 is a schematic diagram of a coded signal generated according to a coding scheme; and
[0050] Figure 3 is a flow chart depicting the steps of a method for performing functional testing on devices on a production line according to an embodiment of the present disclosure. DETAILED DESCRIPTION
[0051] refer to Figure 1 , which shows a block diagram of a system 100 for performing functional testing on a device 102 on a production line according to an embodiment of the present disclosure. In this document, the system 100 includes a self-test protocol 104, which is configured to perform functional testing on multiple components in the device 102 and generate test data corresponding to the results of the functional testing. In addition, the device 102 includes one or more light-emitting diodes or other light-emitting devices 106, which are configured to generate coded signals corresponding to the generated test data and provide a user interaction means for indicating one or more states of the device to the end user. In addition, the system 100 includes a reader 108, which is configured to read and decode the coded signal to provide a functional test analysis of the device 102.
[0052] refer to Figure 2, which shows a schematic diagram of a coded signal 200 generated according to a coding scheme 202. As shown, the coding scheme 202 is Manchester line coding for representing bits of test data 204 as a digital serial signal. In addition, based on the bits of the test data 204, one or more LEDs are used to generate the coded signal 200. In this context, during transmission, Manchester line coding allows the brightness of the LED to be a constant appearance illumination independent of the data being transmitted. In other words, the data rate used is faster than the data rate perceived by the human eye.
[0053] Thus, test information can be communicated using the same set of LEDs that are also used to provide a visual indication to an end user of the device. Advantageously, this saves cost and space as no additional hardware is required in the device to implement this feature.
[0054] It should be noted that encoding of test data 204 is the manner in which binary bits of test data 204 are represented by one or more LEDs to generate a corresponding encoded signal 200 , and decoding of encoded signal 202 is the manner in which the original bits of test data 204 encoded according to encoding scheme 202 are retrieved.
[0055] refer to Figure 3 , which shows a flow chart 300 of a method for performing functional testing on a device on a production line according to an embodiment of the present disclosure. In step 302, a plurality of components in the device are functionally tested, and test data corresponding to the results of the functional testing is generated. In step 304, a coded signal corresponding to the generated test data is generated. In step 306, one or more states of the device are indicated to an end user via a user interaction means. In step 308, the coded signal is read and decoded to provide a functional test analysis of the device.
[0056] Steps 302, 304, 306, and 308 are merely illustrative, and other alternatives may also be provided, wherein one or more steps may be added, one or more steps may be removed, or one or more steps may be provided in a different order without departing from the scope of the claims.
[0057] In view of the above, in the present invention, a specific encoding scheme such as Manchester encoding is used so that the self-test / diagnostic information can coexist and be transmitted to the end user without obvious changes. Due to the high speed of encoding, the self-test / diagnostic information is not visible to the end user. Therefore, the same set of LEDs can perform their common functions of providing visual indications to the end user (e.g., indicating the charging status, operating mode, or any other user action). The LEDs will appear to the user as a constant state, even though they are actually flashing at a very fast rate and encoding the self-test / diagnostic information. Advantageously, this saves cost and space because no additional hardware is required to implement this test / diagnostic functionality on the production line.
[0058] The embodiments of the present disclosure described above may be modified without departing from the scope of the present disclosure as defined by the appended claims. Expressions used to describe and claim the present disclosure, such as "including," "comprising," "combining," "having," and "being," are intended to be interpreted in a non-exclusive manner, i.e., allowing for the presence of items, components, or elements that are not explicitly described. Reference to the singular should also be interpreted as relating to the plural.
Claims
1. A system (100) for performing functional testing on a device (102) on a production line, wherein: The system comprises: - a self-test protocol (104) configured to perform a functional test on a plurality of components in the device and to generate test data corresponding to the results of the functional test; - one or more light emitting diodes or other light emitting devices (106) configured to - generate a coded signal (200) corresponding to the generated test data, and - providing user interaction means for indicating one or more states of the device to an end user; and - a reader (108) configured to read and decode the encoded signal to provide a functional test analysis of the device.
2. The system (100) according to claim 1, wherein: The functional test analysis includes: the identity of the device (102), an indication of a functional pass or fail of the device, the nature of the failure of the device, a pass or fail threshold for the device, missing or mismatched components in the device.
3. The system (100) according to claim 1 or 2, wherein: The one or more light-emitting diodes or other light-emitting devices (106) are selected from at least one of the following: an organic light-emitting diode, a light-emitting polymer, an electroluminescent panel, a laser diode, a quantum dot display, an incandescent lamp and a fluorescent lamp, and the one or more light-emitting diodes or other light-emitting devices are configured to indicate one or more states of the device selected from the following: a charging state or an operating mode of the device or other user interaction means function (102).
4. The system (100) according to any one of the preceding claims, wherein: The coded signal (200) is generated according to a coding scheme (202).
5. The system (100) according to claim 4, wherein: The coding scheme (202) is selected from at least one of the following: Manchester line coding, return-to-zero (RZ) line coding, non-return-to-zero (NRZ) line coding.
6. The system (100) according to claim 5, wherein: The coded signal (202) is implemented as a lighting pattern corresponding to an electrical signal of a single-wire serial interface.
7. The system (100) according to any one of the preceding claims, further comprising a storage database configured to store the test data and the functional test analysis.
8. A method for performing functional testing on a device on a production line, wherein: The method comprises: - performing functional tests on a plurality of components in the device and generating test data corresponding to the results of the functional tests; - generating at least one of: a coded signal corresponding to the generated test data; and optionally, indicating one or more states of the apparatus to an end user; and - reading and decoding the encoded signal to provide a functional test analysis of the device.
9. The method according to claim 8, wherein: The functional test analysis includes: the identity of the device, an indication of a functional pass or fail of the device, the nature of the failure of the device, a pass or fail threshold for the device, missing or mismatched components in the device.
10. The method according to claim 8, wherein: The one or more states of the device are selected from: a charging state or an operating mode of the device or other user interaction means functions.
11. The method according to claims 8-10, wherein: The coded signal is generated according to a coding scheme.
12. The method according to claim 11, wherein: The coding scheme is selected from at least one of the following: Manchester line coding, return-to-zero (RZ) line coding, non-return-to-zero (NRZ) line coding.
13. The method according to claim 12, wherein: The coded signal is implemented as a lighting pattern corresponding to the electrical signal of the single-wire serial interface.
14. The method of claims 8-13, further comprising storing the test data and the functional test analysis.