Research device and method for aging mechanism of wire insulating material

Abstract

The invention relates to a research device and method for an aging mechanism of a wire insulating material, and aims to carry out accurate identification. The device comprises an optical fiber tension and temperature composite sensor and a three-way shell, wherein the optical fiber tension and temperature composite sensor is electrically connected to a wire power frequency voltage generator and attached to the outside of each test section of the wire; the middle part of the three-way shell is detachably connected with a cable side pulling mechanism; the cable side pulling mechanism is used for adjusting the pulling force on the wire; a first cable positioning connector and a second cable positioning connector are arranged at wire openings in the two ends of the three-way shell respectively. A plurality of independent heat exchange chambers are arranged in the three-way shell, each heat exchange chamber is connected with a heating medium circulating pipeline through an independent heating medium inlet and an independent heating medium outlet, and the temperature of the three-way shell is adjusted through a heating medium; a plurality of ultraviolet lamp holders are arranged on one side of the three-way shell and are symmetrically distributed relative to the opening in the middle of the three-way shell. According to the invention, various factor experiments or comparison experiments of single influence factor and different conditions can be carried out on different sections of the wire, and the test efficiency is improved.

Description

Technical Field

[0001] The invention relates to the field of wire insulation material aging detection devices, and in particular to a research device and method for the aging mechanism of wire insulation materials. Background Art

[0002] The wire aging performance test is to evaluate the performance changes of the wire in long-term operation through a series of experiments and detection methods to determine its aging degree and remaining life. In the prior art, a patented aircraft power supply system cable multi-field coupling insulation aging test device provides a stress environment of three coupling fields: mechanical stress, thermal stress, and electric field. The mechanical stress includes tensile stress and bending stress. The tensile stress is generated by the tensile stress loading device, and the bending stress is generated by the cable bending stress loader; the thermal stress is generated by the thermal stress loading program-controlled high and low temperature alternating test box; the electric field is generated by the internal high-voltage power supply of the insulation resistance measuring instrument. One end of the test cable is fixed to the fixed end bracket through the test cable variable position clamp, and the other end passes through the cable bending stress loader. The cable bending stress loader is inserted into the silicon corundum heating tube inside the thermal stress loading program-controlled high and low temperature alternating test box for heating. The insulation aging test temperature is the direct measurement of the temperature sensor inside the thermal stress loading program-controlled high and low temperature alternating test box. The heating process of the thermal stress loading program-controlled high and low temperature alternating test box is directly controlled by the host computer PC and the real-time temperature is collected. One end of the test cable output heating tube is fixed to the force sensor through the test cable variable position fixture to measure the tensile stress of the test cable during the insulation aging test. Although it provides a comprehensive coupling of multiple influencing factors, it lacks the ability to compare multiple factors and the test efficiency is low. Summary of the invention

[0003] In order to solve the above technical problem or at least partially solve the above technical problem, the present invention provides a device and method for studying the aging mechanism of wire insulation material.

[0004] In a first aspect, the present invention provides a device for studying the aging mechanism of wire insulation materials, comprising:

[0005] A three-way housing, wherein an opening in the middle of the three-way housing is detachably connected to a cable side-pull mechanism, and the cable side-pull mechanism is connected to a wire to adjust the tension on the wire;

[0006] Two wire openings are arranged opposite to each other at two ends of the three-way housing, and a first cable positioning joint and a second cable positioning joint are arranged at the two wire openings respectively; at least one of the first cable positioning joint and the second cable positioning joint is arranged at the wire opening through a cap, and the first cable positioning joint and the second cable positioning joint are used to clamp the wire;

[0007] A plurality of independent heat exchange chambers are arranged inside the three-way shell, and each heat exchange chamber is connected to a heat medium circulation pipeline through an independent heat medium inlet and heat medium outlet, so as to support the temperature adjustment of the three-way shell by heat medium; a plurality of ultraviolet lamp heads driven by a multi-channel ultraviolet light source are arranged on one side of the three-way shell, and the ultraviolet lamp heads are symmetrically distributed about the central opening of the three-way shell;

[0008] The optical fiber tension-temperature composite sensor is electrically connected to the conductor power frequency voltage generator and attached to the outside of each test section of the conductor. The optical fiber tension-temperature composite sensor is connected to the laser and the spectrometer.

[0009] Furthermore, the cable side-pulling mechanism includes: a fixed cylinder detachably connected to the middle opening of the three-way shell, one end of the fixed cylinder is rotatably connected to a screw drive sleeve, a threaded hole is provided on the screw drive sleeve, a screw is provided in the threaded hole, a slide groove is provided along the length direction of the screw, a pin is provided in the fixed cylinder, the pin is embedded in the slide groove to limit the screw from rotating with the screw drive sleeve, a connecting ring is provided at the end of the screw, a rope is connected to the connecting ring, and the rope is connected to the cable sleeve.

[0010] Furthermore, the first cable positioning connector includes: a connector seat, an elastic clamp is arranged in the connector seat, an elastic sleeve is arranged at the end of the connector seat, the elastic sleeve is connected to the adjustment sleeve, the adjustment sleeve is slidably arranged on a guide sleeve fixed in the connector seat, when the adjustment sleeve is pushed to move along the guide sleeve toward the clamp, it will push the clamp to release the wire it clamps, otherwise, the elastic sleeve will reset the adjustment sleeve, and the clamp will bite the insulation layer of the wire.

[0011] A sealing ring is arranged in the joint seat, and the sealing ring is arranged between the clamp and the three-way housing.

[0012] Furthermore, one of the two ends of the three-way shell is provided with an air intake chamber, and the air intake chamber is connected to the interior of the three-way shell through a wire opening and an air vent surrounding the outer periphery of the wire opening; an exhaust hole is provided at one of the two ends of the three-way shell, and an air intake connector connected to the air intake chamber is provided on the cap, and the air intake connector is connected to an air compressor; a humidifier is connected to the pipeline between the air intake connector and the air compressor through an induced jet nozzle, and a humidity sensor is provided in the three-way shell.

[0013] Furthermore, the optical fiber tension temperature composite sensor comprises: a first optical fiber Bragg grating having two ends fixed outside the conductor, and a second optical fiber Bragg grating having one end fixed outside the conductor and having the same specifications. When the broadband light provided by the laser passes through the optical fiber through the optical fiber Bragg grating, the light of the set wavelength will be reflected, and the light of the remaining wavelengths will be transmitted. The formula for the wavelength of the reflected light of the optical fiber Bragg grating is: in: is the intrinsic reflection wavelength of the fiber Bragg grating, is the intrinsic effective refractive index of the fiber Bragg grating, Λ 1 is the intrinsic grating period of the fiber Bragg grating;

[0014] The first fiber Bragg grating is affected by tension and temperature, and the formula for the change of the reflected light wavelength is:

[0015]

[0016] Wherein, ΔL is the length change of the first fiber Bragg grating, corresponding to the tension; L is the length of the first fiber Bragg grating, p e is the photoelastic coefficient of the first fiber Bragg grating, α is the thermal expansion coefficient of the first fiber Bragg grating, β is the thermo-optic coefficient of the first fiber Bragg grating, the thermal expansion coefficient and thermo-optic coefficient of the second fiber Bragg grating are consistent with those of the first fiber Bragg grating, and ΔT is the temperature change relative to the intrinsic state temperature;

[0017] The second fiber Bragg grating is affected by temperature, and the formula for the change of the reflected light wavelength is:

[0018]

[0019] but,

[0020] The tension and temperature are determined according to the change in wavelength of reflected light of the first fiber Bragg grating and the second fiber Bragg grating detected by the spectrometer.

[0021] Furthermore, a dielectric loss tester, an insulation resistance tester, an LCR meter, a UTM tester and a shear tester are used to detect the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship of the insulation layer of each test section of the conductor, and the degree of aging is determined by the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship.

[0022] In a second aspect, the present invention provides a method for studying the aging mechanism of wire insulation materials, and a device for studying the aging mechanism of wire insulation materials using the device comprises: controlling one variable among electric field, stress, temperature, and ultraviolet light as a single variable through a power frequency voltage generator, a cable side pulling mechanism, a heat medium, and an ultraviolet light source, and keeping the other variables constant, and fitting a model in which a single variable affects the aging characteristics of the insulation material:

[0023] Combined with the model of single variable affecting the aging characteristics of insulation materials, a target aging model of insulation materials is constructed;

[0024] Through the power frequency voltage generator, cable side pulling mechanism, heat medium, and ultraviolet light source drive, various factors are tested on different sections of the conductor, and the measured data is used to fit the target aging model. Furthermore, the model of temperature affecting the aging characteristics of insulation materials is:

[0025]

[0026] Among them, the life of S1 conductor insulation material under the influence of operating temperature T, is the reference life of the wire insulation material at the reference temperature T0, E a is the activation energy of the wire insulation material, k B is the Boltzmann constant;

[0027] The model of the electric field affecting the aging characteristics of insulating materials is:

[0028]

[0029] Among them, the life of the S2 conductor insulation material under the influence of the operating electric field E is is the life of the wire insulation material under the reference electric field E0, and n is the influence factor of the electric field strength;

[0030] The model of stress affecting the aging characteristics of insulation materials is:

[0031]

[0032] Among them, S3 is the life of the conductor insulation material under the influence of operating stress σ, is the life of the wire insulation material under the reference stress σ0, and m is the stress influence factor;

[0033] The model of UV light affecting the aging characteristics of insulation materials is:

[0034]

[0035] Where S is the life of the wire insulation material under the influence of ultraviolet light, P is the performance coefficient of the wire insulation material, k is the degradation rate constant, and I UV is the intensity of ultraviolet light, and z is the factor affecting the intensity of ultraviolet light.

[0036] Furthermore, a target aging model of insulating materials is constructed by combining the model that affects the aging characteristics of insulating materials: S=f(S1, S2, S3, S4), where f(S1, S2, S3) is the weighted product of temperature, electric field, stress factors and ultraviolet light factors.

[0037] The above technical solution provided by the embodiment of the present invention has the following advantages compared with the prior art:

[0038] In the present application, the ultraviolet lamp holders are symmetrically distributed about the middle opening of the three-way shell; the cable side pulling mechanism is arranged at the middle opening of the three-way shell, and the stress conditions of the wires on both sides of the middle opening are symmetrical, that is, the stress conditions at the wires corresponding to the ultraviolet lamp holders symmetrical about the middle opening are symmetrical; the stress conditions at the wires corresponding to different ultraviolet lamp holders on the same side of the middle opening are different, which is mainly reflected in the difference in bending stress. The independent heat exchange chamber supports independent temperature regulation, which can be in different temperature zones. The above characteristics enable the research device of the aging mechanism of the wire insulation material of the present application to implement multiple factors or comparative experiments of different situations of a single influencing factor on different sections of the wire, thereby improving the test efficiency. The proposed research method of the aging mechanism of the wire insulation material studies the influence of changes in different characteristic parameters on the aging degree of the insulation material through single variable and multi-variable coupling, obtains the effect of different variables on material aging, and fits the insulation aging characteristic parameters and characteristic formulas of multiple variables, providing support for subsequent material life prediction. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0040] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0041] Figure 1 A schematic diagram of a device for studying the aging mechanism of wire insulation materials provided by an embodiment of the present invention;

[0042] Figure 2 A schematic diagram of a cable side-pull mechanism provided by an embodiment of the present invention;

[0043] Figure 3 A schematic diagram of a first cable positioning connector provided by an embodiment of the present invention;

[0044] Figure 4 A schematic diagram of a method for studying the aging mechanism of wire insulation materials provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0045] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0046] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or device including the element.

[0047] Example 1

[0048] like Figure 1 As shown, the technology of the present invention realizes a research device for the aging mechanism of wire insulation materials, including:

[0049] A three-way housing 1, the opening of which is detachably connected to a cable side-pull mechanism 8, wherein the cable side-pull mechanism 8 is connected to a wire and is used to adjust the tension on the wire.

[0050] In the specific implementation process, Figure 2 As shown, the cable side-pulling mechanism 8 includes: a fixed cylinder 81 detachably connected to the middle opening of the three-way shell 1, one end of the fixed cylinder 81 is rotatably connected to a screw drive sleeve 82, a threaded hole is provided on the screw drive sleeve 82, a screw 83 is provided in the threaded hole, a slide groove is provided along the length direction of the screw 83, a pin 84 is provided in the fixed cylinder, and the pin 84 is embedded in the slide groove to limit the screw 83 from rotating with the screw drive sleeve 82, a connecting ring is provided at the end of the screw 83, a rope 85 is connected to the connecting ring, and the rope 85 is connected to the cable sleeve 86.

[0051] Two wire openings are arranged at opposite ends of the three-way housing 1; a first cable positioning joint 3 and a second cable positioning joint 7 are arranged at the two wire openings respectively; at least one of the first cable positioning joint 3 and the second cable positioning joint 7 is arranged at the wire opening through a cap 2 to ensure that at least one cable positioning joint is detachable, which facilitates the loading and unloading of the wire in the research device for the aging mechanism of the wire insulation material. Figure 1As shown, the wire opening at the top of the three-way housing 1 can be detachably mounted on the cap 2, a through hole is provided on the cap 2, a first cable positioning joint 3 is fixedly arranged at a position corresponding to the through hole on the cap 2, and a second cable positioning joint 7 is fixedly arranged at the wire opening at the top of the three-way housing 1. The first cable positioning joint 3 and the second cable positioning joint 7 are used to clamp the wires.

[0052] The structures of the first cable positioning joint 3 and the second cable positioning joint 7 are consistent. The structure of the cable positioning joint is described by taking the first cable positioning joint 3 as an example. Figure 3 As shown, the first cable positioning connector 3 includes a connector seat 36, in which an elastic clamp 33 is arranged, an elastic sleeve 32 is arranged at the end of the connector seat 36, and the elastic sleeve 32 is connected to the adjustment sleeve 31, and the adjustment sleeve 31 is slidably arranged on a guide sleeve 34 fixed in the connector seat 36. When the adjustment sleeve 31 is pushed to move along the guide sleeve 34 toward the clamp 33, the clamp 33 will be pushed to release the wire it clamps, otherwise, the elastic sleeve 32 will reset the adjustment sleeve 31, and the clamp 33 will bite the insulation layer of the wire. In the specific implementation process, a sealing ring 35 is arranged in the connector seat 36.

[0053] A plurality of independent heat exchange chambers 11 are arranged inside the three-way shell 1, and the plurality of heat exchange chambers 11 are symmetrically distributed about the opening in the middle of the three-way shell 1. Each heat exchange chamber 11 is connected to a heat medium circulation pipeline through an independent heat medium inlet and heat medium outlet, so as to support the temperature adjustment of the three-way shell 1 by heat medium. An exemplary heat medium is water, and a heater and a water pump are arranged in the heat medium circulation pipeline. Of course, in the specific implementation process, a temperature control structure with higher control accuracy but relatively higher cost can be used, such as a semiconductor temperature control device.

[0054] A plurality of ultraviolet lamp heads 51 driven by a multi-channel ultraviolet light source driver 5 are disposed on one side of the three-way housing 1 , and the ultraviolet lamp heads 51 are symmetrically distributed about the central opening of the three-way housing 1 .

[0055] The present application also includes an optical fiber tension-temperature composite sensor 4 electrically connected to the conductor power frequency voltage generator and attached to the outside of each test section of the conductor. The optical fiber tension-temperature composite sensor 4 is connected to a laser and a spectrometer 42 .

[0056] The optical fiber tension temperature composite sensor 4 comprises: a first optical fiber Bragg grating with both ends fixed outside the conductor, and a second optical fiber Bragg grating with the same specifications fixed outside the conductor at one end. When the broadband light provided by the laser passes through the optical fiber through the optical fiber Bragg grating, the light of the set wavelength will be reflected, and the light of the remaining wavelengths will be transmitted. The formula for the wavelength of the reflected light of the optical fiber Bragg grating is: in: is the intrinsic reflection wavelength of the fiber Bragg grating, is the intrinsic effective refractive index of the fiber Bragg grating, Λ 1 is the intrinsic grating period of the fiber Bragg grating;

[0057] The first fiber Bragg grating is affected by tension and temperature, and the formula for the change of the reflected light wavelength is:

[0058]

[0059] Wherein, ΔL is the length change of the first fiber Bragg grating, corresponding to the tension; L is the length of the first fiber Bragg grating, p e is the photoelastic coefficient of the first fiber Bragg grating, α is the thermal expansion coefficient of the first fiber Bragg grating, β is the thermo-optic coefficient of the first fiber Bragg grating, the thermal expansion coefficient and thermo-optic coefficient of the second fiber Bragg grating are consistent with those of the first fiber Bragg grating, and ΔT is the temperature change relative to the intrinsic state temperature;

[0060] The second fiber Bragg grating is affected by temperature, and the formula for the change of the reflected light wavelength is:

[0061]

[0062] but,

[0063] The tension and temperature are determined according to the change in wavelength of the reflected light of the first fiber Bragg grating and the second fiber Bragg grating detected by the spectrometer. The optical fiber tension temperature composite sensor 4 is applied to solve the problem that electronic signal sensors are easily interfered, easily damaged, have a short lifespan, and are prone to errors in measurement data in complex situations.

[0064] The dielectric loss tester, insulation resistance tester, LCR meter, UTM tester and shear tester are used to detect the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship of the insulation layer of each test section of the conductor. The degree of aging is determined by the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship.

[0065] In the specific implementation process, one of the two ends of the three-way housing 1 is provided with an air inlet chamber 12, and the air inlet chamber 12 is connected to the inside of the three-way housing 1 through the wire opening and the vent hole surrounding the outer periphery of the wire opening; one of the two ends of the three-way housing 1 is provided with an exhaust hole 13. The cap 2 is provided with an air inlet connector 21 connected to the air inlet chamber 12, and the air inlet connector 21 is connected to an air compressor; the pipeline between the air inlet connector 21 and the air compressor is connected to a humidifier through an ejection jet nozzle, and a humidity sensor is provided in the three-way housing 1.

[0066] How this application works is:

[0067] First, remove the cable side-pull mechanism 8 and the cap 2, and pass the optical fiber tension temperature composite sensor 4 through the first cable positioning joint 3 and the cap 2. When fixing the wire, press the adjustment sleeve of the second cable positioning joint 7, insert one end of the wire from the second cable positioning joint 7 into the three-way housing 1, and pass one end of the wire inserted into the three-way housing 1 through the cable sleeve 86, and then pass through the wire opening of the three-way housing 1 to pass through the three-way housing 1, and pass through the first cable positioning joint 3 from the inside of the cap 2, and fix the optical fiber tension temperature composite sensor 4 on the wire along the length direction of the wire. The two ends of the first fiber Bragg grating are fixed outside the wire, and one end of the second fiber Bragg grating is fixed outside the wire. After the installation of the optical fiber tension temperature composite sensor 4 is completed, fix the cap 2 at the end of the three-way housing 1, adjust the wire position, and fix it through the first cable positioning joint 3 and the second cable positioning joint 7, and then install the cable side-pull mechanism 8 on the three-way housing 1. Each heat exchange chamber 11 is connected to a heat medium circulation pipeline through an independent heat medium inlet and heat medium outlet, supporting the temperature of the three-way housing 1 to be adjusted by heat medium. The air inlet connector 21 is connected to an air compressor. The wire is connected to an industrial frequency voltage generator.

[0068] When adjusting the tension, the screw drive sleeve 82 is rotated to control the screw 83 to move closer to or farther from the wire. The tension adjustment is fed back through the optical fiber tension temperature composite sensor 4. When adjusting the ultraviolet light intensity, the intensity of the ultraviolet light emitted by each ultraviolet lamp head is independently adjusted through the ultraviolet light driver 5. When adjusting the temperature, the heat medium circulation is controlled to adjust the temperature, and the temperature adjustment is fed back through the optical fiber tension temperature composite sensor 4.

[0069] In the present application, the ultraviolet lamp holder 51 is symmetrically distributed about the middle opening of the three-way shell 1; the cable side pulling mechanism 8 is arranged at the middle opening of the three-way shell 1, and the stress conditions of the wires on both sides of the middle opening are symmetrical, that is, the stress conditions at the wires corresponding to the ultraviolet lamp holder 51 symmetrical about the middle opening are symmetrical; the stress conditions at the wires corresponding to different ultraviolet lamp holders on the same side of the middle opening are different, which is mainly reflected in the difference in bending stress. The independent heat exchange chamber 11 supports independent temperature regulation, which can be in different temperature zones. The above characteristics enable the research device for the aging mechanism of the wire insulation material of the present application to implement multiple factors influence experiments or comparative experiments of different situations of a single influencing factor on different sections of the wire, thereby improving the test efficiency.

[0070] Example 2

[0071] See also Figure 4 As shown, an embodiment of the present invention provides a method for studying the aging mechanism of wire insulation materials, and a device for studying the aging mechanism of wire insulation materials using the method includes:

[0072] Through the power frequency voltage generator, cable side pulling mechanism, heat medium and ultraviolet light source drive, one variable among the electric field, stress, temperature and ultraviolet light is controlled as a single variable, and the other variables are kept constant, and a model of the influence of single variable on the aging characteristics of insulation materials is fitted.

[0073] The model of temperature affecting the aging characteristics of insulation materials is:

[0074]

[0075] Among them, the life of S1 conductor insulation material under the influence of operating temperature T, is the reference life of the wire insulation material at the reference temperature T0, E a is the activation energy of the wire insulation material, k B is the Boltzmann constant;

[0076] The model of the electric field affecting the aging characteristics of insulating materials is:

[0077]

[0078] Among them, the life of the S2 conductor insulation material under the influence of the operating electric field E is is the life of the wire insulation material under the reference electric field E0, and n is the influence factor of the electric field strength;

[0079] The model of stress affecting the aging characteristics of insulation materials is:

[0080]

[0081] Among them, S3 is the life of the conductor insulation material under the influence of operating stress σ, is the life of the wire insulation material under the reference stress σ0, and m is the stress influence factor;

[0082] The model of UV light affecting the aging characteristics of insulation materials is:

[0083]

[0084] Where, S4 is the life of the wire insulation material under the influence of ultraviolet light, P is the performance coefficient of the wire insulation material, k is the degradation rate constant, I UV is the intensity of ultraviolet light, and z is the factor affecting the intensity of ultraviolet light.

[0085] The target aging model of insulating materials is constructed by combining the model of single variable affecting the aging characteristics of insulating materials: S = f(S1, S2, S3, S4), where f(S1, S2, S3) is the weighted product of temperature, electric field, stress factors and ultraviolet light factors.

[0086] Through the power frequency voltage generator, cable side pulling mechanism, heat medium and ultraviolet light source driving, various factors influence experiments are carried out on different sections of the conductor, and the measured data are used to fit the target aging model.

[0087] In the embodiments provided by the present invention, it should be understood that the disclosed structures and methods can be implemented in other ways. For example, the structural embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, structures or units, which can be electrical, mechanical or other forms.

[0088] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0089] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0090] The foregoing is merely a specific embodiment of the present invention, which enables those skilled in the art to understand or implement the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A device for studying the aging mechanism of wire insulation materials, characterized in that: include: A three-way housing (1), wherein an opening in the middle of the three-way housing (1) is detachably connected to a cable side-pull mechanism (8), and the cable side-pull mechanism (8) is connected to a wire to adjust the tension on the wire; Two wire openings are arranged opposite to each other at two ends of the three-way housing (1), and a first cable positioning joint (3) and a second cable positioning joint (7) are arranged at the two wire openings respectively; at least one of the first cable positioning joint (3) and the second cable positioning joint (7) is arranged at the wire opening through a cap (2), and the first cable positioning joint (3) and the second cable positioning joint (7) are used to clamp the wire; A plurality of independent heat exchange chambers (11) are arranged inside the three-way shell (1), and each heat exchange chamber (11) is connected to a heat medium circulation pipeline via an independent heat medium inlet and a heat medium outlet, so as to support the temperature adjustment of the three-way shell (1) via the heat medium; a plurality of ultraviolet lamp heads (51) driven by a multi-channel ultraviolet light source driver (5) are arranged on one side of the three-way shell (1), and the ultraviolet lamp heads (51) are symmetrically distributed with respect to the central opening of the three-way shell (1); An optical fiber tension-temperature composite sensor (4) is electrically connected to a conductor power frequency voltage generator and adhered to the outside of each test section of the conductor. The optical fiber tension-temperature composite sensor (4) is connected to a laser and a spectrometer (42).

2. The device for studying the aging mechanism of wire insulation materials according to claim 1, characterized in that: The cable side-pull mechanism (8) comprises: a fixed cylinder (81) detachably connected to the middle opening of the three-way shell (1); one end of the fixed cylinder (81) is rotatably connected to a screw drive sleeve (82); a threaded hole is provided on the screw drive sleeve (82); a screw (83) is provided in the threaded hole; a slide groove is provided along the length direction of the screw (83); a pin (84) is provided in the fixed cylinder; the pin (84) is embedded in the slide groove to limit the screw (83) from rotating with the screw drive sleeve (82); a connecting ring is provided at the end of the screw (83); a rope (85) is connected to the connecting ring; and the rope (85) is connected to a cable sleeve (86).

3. The device for studying the aging mechanism of wire insulation materials according to claim 1, characterized in that: The first cable positioning connector (3) comprises: a connector seat (36), a flexible clamp (33) is arranged in the connector seat (36), an elastic sleeve (32) is arranged at the end of the connector seat (36), the elastic sleeve (32) is connected to the adjustment sleeve (31), the adjustment sleeve (31) is slidably arranged on a guide sleeve (34) fixed in the connector seat (36), when the adjustment sleeve (31) is pushed to move along the guide sleeve (34) toward the clamp (33), the clamp (33) is pushed to release the wire clamped therein, otherwise, the elastic sleeve (32) resets the adjustment sleeve (31), and the clamp (33) bites the insulation layer of the wire.

4. The device for studying the aging mechanism of wire insulation materials according to claim 3, characterized in that: A sealing ring (35) is arranged in the joint seat (36), and the sealing ring (35) is arranged between the clamp (33) and the three-way housing (1).

5. The device for studying the aging mechanism of wire insulation materials according to claim 1, characterized in that: One of the two ends of the three-way shell (1) is provided with an air intake chamber (12), and the air intake chamber (12) is connected to the interior of the three-way shell (1) through a wire opening and a vent hole surrounding the outer periphery of the wire opening; one of the two ends of the three-way shell (1) is provided with an exhaust hole (13), and the cap (2) is provided with an air intake connector (21) connected to the air intake chamber (12), and the air intake connector (21) is connected to an air compressor; the pipeline between the air intake connector (21) and the air compressor is connected to a humidifier through an ejection jet nozzle, and a humidity sensor is provided in the three-way shell (1).

6. The device for studying the aging mechanism of wire insulation materials according to claim 1, characterized in that: The optical fiber tension temperature composite sensor (4) comprises: a first optical fiber Bragg grating with two ends fixed outside the conductor, and a second optical fiber Bragg grating with the same specifications fixed outside the conductor at one end. When the broadband light provided by the laser passes through the optical fiber Bragg grating, the light of the set wavelength will be reflected, and the light of the remaining wavelengths will be transmitted. The formula for the wavelength of the reflected light of the optical fiber Bragg grating is: in: is the intrinsic reflection wavelength of the fiber Bragg grating, is the intrinsic effective refractive index of the fiber Bragg grating, Λ 1 is the intrinsic grating period of the fiber Bragg grating; The first fiber Bragg grating is affected by tension and temperature, and the formula for the change of the reflected light wavelength is: Wherein, ΔL is the length change of the first fiber Bragg grating, corresponding to the tension; L is the length of the first fiber Bragg grating, p e is the photoelastic coefficient of the first fiber Bragg grating, α is the thermal expansion coefficient of the first fiber Bragg grating, β is the thermo-optic coefficient of the first fiber Bragg grating, the thermal expansion coefficient and thermo-optic coefficient of the second fiber Bragg grating are consistent with those of the first fiber Bragg grating, and ΔT is the temperature change relative to the intrinsic state temperature; The second fiber Bragg grating is affected by temperature, and the formula for the change of the reflected light wavelength is: but, The tension and temperature are determined according to the change in wavelength of reflected light of the first fiber Bragg grating and the second fiber Bragg grating detected by the spectrometer.

7. The device for studying the aging mechanism of wire insulation materials according to claim 1, characterized in that: The dielectric loss tester, insulation resistance tester, LCR meter, UTM tester and shear tester are used to detect the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship of the insulation layer of each test section of the conductor. The degree of aging is determined by the dielectric loss tangent value, insulation resistance, capacitance and dielectric constant, tensile stress-strain relationship and shear stress-strain relationship.

8. A method for studying the aging mechanism of wire insulation materials, using the device for studying the aging mechanism of wire insulation materials according to any one of claims 1 to 7, characterized in that: include: Through the power frequency voltage generator, cable side pulling mechanism, heat medium, and ultraviolet light source drive, one variable among the electric field, stress, temperature, and ultraviolet light is controlled as a single variable, and the other variables are kept constant, and a model of the influence of a single variable on the aging characteristics of the insulation material is fitted: The target aging model of insulation materials is constructed by combining the model of single variable affecting the aging characteristics of insulation materials; Through the power frequency voltage generator, cable side pulling mechanism, heat medium and ultraviolet light source driving, various factors influence experiments are carried out on different sections of the conductor, and the measured data are used to fit the target aging model.

9. The method for studying the aging mechanism of wire insulation material according to claim 8, characterized in that: The model of temperature affecting the aging characteristics of insulation materials is: Among them, the life of S1 conductor insulation material under the influence of operating temperature T, is the reference life of the wire insulation material at the reference temperature T0, E a is the activation energy of the wire insulation material, k B is the Boltzmann constant; The model of the electric field affecting the aging characteristics of insulating materials is: Among them, the life of the S2 conductor insulation material under the influence of the operating electric field E is is the life of the wire insulation material under the reference electric field E0, and n is the influence factor of the electric field strength; The model of stress affecting the aging characteristics of insulation materials is: Among them, S3 is the life of the conductor insulation material under the influence of operating stress σ, is the life of the wire insulation material under the reference stress σ0, and m is the stress influence factor; The model of UV light affecting the aging characteristics of insulation materials is: Where S is the life of the wire insulation material under the influence of ultraviolet light, P is the performance coefficient of the wire insulation material, k is the degradation rate constant, and I UV is the intensity of ultraviolet light, and z is the factor affecting the intensity of ultraviolet light.

10. The method for studying the aging mechanism of wire insulation material according to claim 9, characterized in that: The target aging model of insulating materials is constructed by combining the model that affects the aging characteristics of insulating materials: S = f(S1, S2, S3, S4), where f(S1, S2, S3) is the weighted product of temperature, electric field, stress factors and ultraviolet light factors.

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