Device replacement device to be debugged for optocoupler circuit

Abstract

The present application provides a device replacement device for an optocoupler circuit to be debugged. The present application relates to the technical field of optocouplers. The control circuit can receive a communication signal sent by a host computer. And, the control circuit can, according to the communication signal, control the first switching circuit to switch from a first target device to be debugged to a second target device to be debugged among a plurality of first devices to be debugged, so as to realize the replacement of the first device to be debugged, and / or control the second switching circuit to switch from a third target device to be debugged to a fourth target device to be debugged among a plurality of second devices to be debugged, so as to realize the replacement of the second device to be debugged. Furthermore, after replacing the first device to be debugged and / or the second device to be debugged, there is no need to restore to the rated conditions again and add different products to be debugged. Thus, the operation of replacing the first device to be debugged and / or the second device to be debugged can be simplified, and the versatility is strong, which is convenient for the debugging of the optocoupler circuit.

Description

Technical Field

[0001] The present application relates to the technical field of optocouplers, and particularly to a replacement device for a device to be debugged in an optocoupler circuit. Background Art

[0002] An optocoupler device is a device that transmits electrical signals through light. An optocoupler device usually encapsulates an infrared light-emitting diode used as a light emitter and a photosensitive semiconductor tube or a photosensitive resistor used as a light receiver in the same tube shell. When an electrical signal is applied to the input end of the optocoupler device, the light emitter emits light. In this way, a current is generated under the action of the light by the light receiver, and the current is output from the output end of the optocoupler device. Thus, the optocoupler device can achieve "electricity - light - electricity" conversion.

[0003] Since the optocoupler device plays a crucial role in the isolation transmission of signals in the optocoupler circuit. Therefore, the influence of factors such as temperature and current on the current transfer ratio (CTR) of the optocoupler device cannot be ignored. And, under rated conditions such as different temperatures and currents, there are also significant differences in the CTR of optocoupler devices of the same model. Thus, it is crucial to debug the optocoupler device under rated conditions to meet the requirements of the optocoupler circuit. During the debugging process, usually the optocoupler device and the devices connected to the optocoupler device are replaced, and then the comparison effects before and after the replacement are monitored through devices such as an oscilloscope. Among them, the CTR refers to the ratio between the output current and the input current of the optocoupler device.

[0004] Currently, there are two ways to debug the optocoupler device. The first way is to replace the optocoupler device or the devices connected to the optocoupler device on the circuit board where the optocoupler circuit is located by welding. The second way is to increase the products to be debugged with different optocoupler devices or the devices connected to the optocoupler device and debug them simultaneously.

[0005] However, the first way is time-consuming and laborious during the replacement process, and under rated conditions of different temperatures, if it is necessary to replace the optocoupler device or the devices connected to the optocoupler device, it is necessary to wait for the temperature to recover before debugging, resulting in problems of complex operation and poor versatility. In the second way, if it is necessary to increase different optocoupler devices or the devices connected to the optocoupler device, it is necessary to increase the corresponding products to be debugged, and the operation is too complex during the process of increasing the products to be debugged, resulting in problems of complex operation and poor versatility for the second way.

[0006] In summary, both the first way and the second way have problems of complex operation and poor versatility during the replacement process, which is not convenient for the debugging of the optocoupler circuit. Summary of the Invention

[0007] The present application provides a device replacement device for an optocoupler circuit, which is simple to operate and has strong versatility during the process of replacing an optocoupler device or a device connected to the optocoupler device, facilitating the debugging of the optocoupler circuit.

[0008] In a first aspect, the present application provides a device replacement device for an optocoupler circuit. The device replacement device for debugging includes: a control circuit, a first switching circuit, a second switching circuit, a plurality of first devices to be debugged, and a plurality of second devices to be debugged;

[0009] The control circuit is electrically connected to the control end of the first switching circuit and the control end of the second switching circuit respectively. The first end of the first switching circuit and the first end of the second switching circuit are both electrically connected to the product to be debugged, and the product to be debugged does not include the first device to be debugged and / or the second device to be debugged. The first device to be debugged is an optocoupler device, and the second device to be debugged is a device electrically connected to the optocoupler device. The second end of the first switching circuit is electrically connected to the plurality of first devices to be debugged, and the second end of the second switching circuit is electrically connected to the plurality of second devices to be debugged;

[0010] The control circuit is configured to receive a communication signal sent by a host computer, and according to the communication signal, control the first switching circuit to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged, and / or control the second switching circuit to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged.

[0011] Through the device replacement device for an optocoupler circuit provided in the first aspect, the control circuit can receive the communication signal sent by the host computer. Moreover, the control circuit can, according to the communication signal, control the first switching circuit to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged, realizing the replacement of the first device to be debugged, and / or control the second switching circuit to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged, realizing the replacement of the second device to be debugged. Furthermore, after replacing the first device to be debugged and / or the second device to be debugged, there is no need to restore to the rated conditions again and add different products to be debugged. Therefore, the operation of replacing the first device to be debugged and / or the second device to be debugged can be simplified, with strong versatility and facilitating the debugging of the optocoupler circuit.

[0012] In a possible design, the control circuit includes: a first terminal block and a microcontroller;

[0013] The communication terminal of the first wiring terminal is electrically connected to the communication terminal of the microcontroller. The first control terminal of the microcontroller is electrically connected to the control terminal of the first switching circuit. The second control terminal of the microcontroller is electrically connected to the control terminal of the second switching circuit;

[0014] The first wiring terminal is configured to receive the communication signal and transmit a control signal to the microcontroller according to the communication signal;

[0015] The microcontroller is configured to generate a first control signal and / or a second control signal according to the control signal. The first control signal is used to control the first switching circuit to switch from the first target debugging device to the second target debugging device. The second control signal is used to control the second switching circuit to switch from the third target debugging device to the fourth target debugging device.

[0016] In a possible design, the first switching circuit includes: a second wiring terminal, a first optocoupler control circuit, a second optocoupler control circuit, a first analog switch, and a second analog switch;

[0017] The product to be debugged is electrically connected to the common terminal of the first analog switch and the common terminal of the second analog switch through the second wiring terminal. The channel switching terminals of the first analog switch and the second analog switch are both electrically connected to the plurality of first devices to be debugged. The control terminal of the first analog switch is electrically connected to the output terminal of the first optocoupler control circuit. The control terminal of the second analog switch is electrically connected to the output terminal of the second optocoupler control circuit. The power supply terminal of the first analog switch is electrically connected to the power supply terminal of the first optocoupler control circuit. The power supply terminal of the second analog switch is electrically connected to the power supply terminal of the second optocoupler control circuit. The input terminals of the first optocoupler control circuit and the second optocoupler control circuit are both electrically connected to the first control terminal of the control circuit;

[0018] The first optocoupler control circuit is configured to receive the first control signal sent by the microcontroller and control the first analog switch to perform channel switching according to the first control signal, so as to switch from the first target debugging device to the second target debugging device;

[0019] The second optocoupler control circuit is configured to receive the first control signal sent by the microcontroller and control the second analog switch to perform channel switching according to the first control signal, so as to switch from the first target debugging device to the second target debugging device.

[0020] In a possible design, the first switching circuit further includes: a third wiring terminal;

[0021] The first power supply terminal of the third wiring terminal is electrically connected to the power supply terminal of the first optocoupler control circuit, and the second power supply terminal of the third wiring terminal is electrically connected to the power supply terminal of the second optocoupler control circuit;

[0022] The third wiring terminal is used to provide a power supply voltage.

[0023] In a possible design, the number of the first devices to be debugged among the multiple first devices to be debugged is 2, or 4, or 8, or 16;

[0024] When the number of the first devices to be debugged among the multiple first devices to be debugged is 2, both the first analog switch and the second analog switch are single-pole double-throw two-channel analog switches, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 2;

[0025] When the number of the first devices to be debugged among the multiple first devices to be debugged is 4, both the first analog switch and the second analog switch are single-pole four-throw two-channel analog switches, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 3;

[0026] When the number of the first devices to be debugged among the multiple first devices to be debugged is 8, both the first analog switch and the second analog switch are single-pole eight-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 4;

[0027] When the number of the first devices to be debugged among the multiple first devices to be debugged is 16, both the first analog switch and the second analog switch are single-pole sixteen-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 5.

[0028] In a possible design, the second switching circuit includes: a fourth wiring terminal, a third optocoupler control circuit, and a third analog switch;

[0029] The product to be debugged is electrically connected to the common terminal of the third analog switch through the common terminal of the fourth wiring terminal. The channel switching terminal of the third analog switch is electrically connected to the multiple second devices to be debugged. The control terminal of the third analog switch is electrically connected to the output terminal of the third optocoupler control circuit. The input terminal of the third optocoupler control circuit is electrically connected to the second control terminal of the control circuit. The power supply terminal of the fourth wiring terminal is electrically connected to the power supply terminal of the third analog switch and the power supply terminal of the third optocoupler control circuit respectively;

[0030] The third optocoupler control circuit is configured to receive the second control signal sent by the microcontroller and control the third analog switch to perform channel switching according to the second control signal, so as to switch from the third target debugging device to the fourth target debugging device.

[0031] In a possible design, the number of the second devices to be debugged among the multiple second devices to be debugged is 2, or 4, or 8, or 16;

[0032] When the number of the second devices to be debugged among the multiple second devices to be debugged is 2, the third analog switch is a single-pole double-throw single-channel analog switch, and the number of the third optocoupler control circuits is 2;

[0033] When the number of the second devices to be debugged among the multiple second devices to be debugged is 4, the third analog switch is a single-pole four-throw single-channel analog switch, and the number of the third optocoupler control circuits is 3;

[0034] When the number of the second devices to be debugged among the multiple second devices to be debugged is 8, the third analog switch is a single-pole eight-throw single-channel analog switch, and the number of the third optocoupler control circuits is 4;

[0035] When the number of the second devices to be debugged among the multiple second devices to be debugged is 16, the third analog switch is a single-pole sixteen-throw single-channel analog switch, and the number of the third optocoupler control circuits is 5.

[0036] In a possible design, the first optocoupler control circuit or the second optocoupler control circuit or the third optocoupler control circuit includes: a surface mount optocoupler, a first current limiting resistor, and a second current limiting resistor;

[0037] The first end of the first current limiting resistor is electrically connected to the first control end or the second control end of the control circuit. The second end of the first current limiting resistor is electrically connected to the first pin of the surface mount optocoupler. The second pin of the surface mount optocoupler is grounded. The third pin of the surface mount optocoupler is electrically connected to the control end of the first analog switch or the control end of the second analog switch or the control end of the third analog switch. The third pin of the surface mount optocoupler is also electrically connected to the first end of the second current limiting resistor. The second end of the second current limiting resistor is electrically connected to the ground end of the first analog switch or the ground end of the second analog switch or the ground end of the third analog switch or the ground end of the fourth terminal block. The fourth pin of the surface mount optocoupler is electrically connected to the power supply end of the first analog switch or the power supply end of the fourth terminal block.

[0038] In a possible design, the first optocoupler control circuit or the second optocoupler control circuit or the third optocoupler control circuit further includes: a surface mount light emitting diode;

[0039] The negative electrode of the surface-mounted light-emitting diode is grounded, and the positive electrode of the surface-mounted light-emitting diode is electrically connected to the third pin of the surface-mounted optocoupler.

[0040] In a possible design, each of the plurality of second devices to be debugged may include: a resistor, a capacitor, and a triode.

[0041] The above description is only an overview of the technical solution of the embodiments of the present application. In order to be able to understand the technical means of the embodiments of the present application more clearly, it can be implemented according to the content of the description. And in order to make the above and other purposes, features, and advantages of the embodiments of the present application more obvious and understandable, the following specifically describes the specific implementation manners of the present application. Description of the Drawings

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0043] Figure 1 Structural schematic diagram of a device replacement device for an optocoupler circuit provided by an embodiment of the present application;

[0044] Figure 2 For Figure 1 Structural schematic diagram of the control circuit in

[0045] Figure 3 For Figure 1 Structural schematic diagram of the first switching circuit in

[0046] Figure 4 For Figure 1 Structural schematic diagram of the second switching circuit in

[0047] Figure 5 For Figure 1 Structural schematic diagram of a plurality of second devices to be debugged in Detailed Description of the Invention

[0048] In this application, "at least one" means one or more, and "a plurality of" means two or more. "And / or" describes the relationship between associated objects and indicates that three relationships can exist. For example, A and / or B can mean: A exists alone, A and B exist simultaneously, or B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. "At least one of the following" or a similar expression refers to any combination of these items, including any combination of single item or plural items. For example, at least one of a alone, b alone, or c alone can mean: a alone, b alone, c alone, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b, and c, where a, b, and c can be single or multiple. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0049] The orientation or positional relationship indicated by terms such as "center", "longitudinal", "transverse", "upper", "lower", "left", "right", "front", "rear", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing this application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be construed as a limitation to this application.

[0050] The terms "connected" and "coupled" should be understood in a broad sense. For example, the "connection" or "coupling" of a circuit structure can refer not only to a physical connection but also to an electrical connection or a signal connection. For example, it can be a direct connection, that is, a physical connection, or it can be indirectly connected through at least one intermediate element, as long as the circuit is connected. It can also be the connection inside two elements; the signal connection can refer not only to the signal connection through a circuit but also to the signal connection through a media medium, such as radio waves. For those of ordinary skill in the art, the specific meanings of the above terms in this application can be understood according to specific situations.

[0051] Refer to Figure 1 , Figure 1 FIG. is a schematic structural diagram of a device replacement device for an optocoupler circuit to be debugged provided by an embodiment of this application. As Figure 1 shown, the device replacement device 100 for the device to be debugged may include: a control circuit 110, a first switching circuit 120, a second switching circuit 130, a plurality of first devices to be debugged 140, and a plurality of second devices to be debugged 150.

[0052] The control circuit 110 is electrically connected to the control end of the first switching circuit 120 and the control end of the second switching circuit 130 respectively. The first end of the first switching circuit 120 and the first end of the second switching circuit 130 are both electrically connected to the product to be debugged. The product to be debugged does not include the first device to be debugged and / or the second device to be debugged. The first device to be debugged is an optocoupler device, and the second device to be debugged is a device electrically connected to the optocoupler device. The second end of the first switching circuit 120 is electrically connected to a plurality of first devices to be debugged 140, and the second end of the second switching circuit 130 is electrically connected to a plurality of second devices to be debugged 150.

[0053] Among them, the control circuit 110, the first switching circuit 120, the second switching circuit 130, the plurality of first devices to be debugged 140, and the plurality of second devices to be debugged 150 can be separately arranged or integrally arranged. The embodiments of the present application do not make specific limitations on this.

[0054] The control circuit 110 is configured to receive a communication signal sent by the host computer, and according to the communication signal, control the first switching circuit 120 to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged 140, and / or control the second switching circuit 130 to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged 150.

[0055] Among them, the first device to be debugged among the plurality of first devices to be debugged 140 is fixed by an optocoupler test socket with a card seat structure, which is convenient for replacement without welding.

[0056] Among them, when the communication signal indicates replacing the optocoupler device, the control circuit 110 can, according to the communication signal, control the first switching circuit 120 to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged 140 to realize the replacement of the first device to be debugged. Or, when the communication signal indicates replacing the device electrically connected to the optocoupler device, the control circuit 110 can, according to the communication signal, control the second switching circuit 130 to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged 150 to realize the replacement of the second device to be debugged. Or, when the communication signal indicates replacing the optocoupler device and the device electrically connected to the optocoupler device, the control circuit 110 can, according to the communication signal, control the first switching circuit 120 to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged 140, and control the second switching circuit 130 to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged 150 to realize the replacement of the first device to be debugged and the second device to be debugged.

[0057] Among them, when the control circuit 110 controls the first switching circuit 120 to switch from the first target device under test to the second target device among multiple first devices under test 140, the product under test does not include the first device under test. When the control circuit 110 controls the second switching circuit 130 to switch from the third target device under test to the fourth target device among multiple second devices under test 150, the product under test does not include the second device under test. When the control circuit 110 controls to switch from the first target device to the second target device among multiple first devices under test 140, and controls to switch from the third target device to the fourth target device among multiple second devices under test 150, the product under test does not include the first device under test and the second device under test.

[0058] Among them, since the control circuit 110 can control the first switching circuit 120 to switch from the first target device under test to the second target device among multiple first devices under test 140 according to the communication signal, and / or control the second switching circuit 130 to switch from the third target device under test to the fourth target device among multiple second devices under test 150. Therefore, there is no need to interrupt the debugging process, and the rated conditions of the device replacement device under test and the product under test will not be damaged. Furthermore, after replacing the first device under test and / or the second device under test, there is no need to restore the environment where the device replacement device under test and the product under test are located to the rated conditions, and different products under test are added. Thus, the operation of replacing the first device under test and / or the second device under test can be simplified, with strong versatility and convenient for the debugging of the optocoupler circuit.

[0059] The device replacement device for the optocoupler circuit provided in this application can receive the communication signal sent by the host computer through the control circuit. And the control circuit can control the first switching circuit to switch from the first target device under test to the second target device among multiple first devices under test according to the communication signal, to realize the replacement of the first device under test, and / or control the second switching circuit to switch from the third target device under test to the fourth target device among multiple second devices under test, to realize the replacement of the second device under test. Furthermore, after replacing the first device under test and / or the second device under test, there is no need to restore to the rated conditions and add different products under test. Thus, the operation of replacing the first device under test and / or the second device under test can be simplified, with strong versatility and convenient for the debugging of the optocoupler circuit.

[0060] Based on the description of the above embodiments, exemplarily, a possible implementation manner of the control circuit 110. Refer to Figure 2 , Figure 2 is Figure 1 the structural schematic diagram of the control circuit in Figure 2As shown, the control circuit 110 may include: a first terminal block J1 and a microcontroller U1.

[0061] The communication terminal of the first terminal block J1 is electrically connected to the communication terminal of the microcontroller U1. The first control terminal of the microcontroller U1 is electrically connected to the control terminal of the first switching circuit 120. The second control terminal of the microcontroller U1 is electrically connected to the control terminal of the second switching circuit 130.

[0062] The first terminal block J1 is configured to receive a communication signal and transmit a control signal to the microcontroller U1 according to the communication signal.

[0063] The microcontroller U1 is configured to generate a first control signal and / or a second control signal according to the control signal. The first control signal is used to control the first switching circuit 120 to switch from a first target debugging device to a second target debugging device. The second control signal is used to control the second switching circuit 130 to switch from a third target debugging device to a fourth target debugging device.

[0064] Wherein, the first terminal block J1 is a 4P terminal block. The second pin and the third pin of the first terminal block J1 are the communication terminals of the first terminal block J1.

[0065] Exemplarily, as Figure 2 shown, the microcontroller U1 is a single-chip microcomputer. The forty-first pin and the forty-second pin of the single-chip microcomputer are the communication terminals of the microcontroller U1. The thirty-sixth pin, the thirty-fifth pin, the thirtieth pin and the twenty-ninth pin of the single-chip microcomputer are the first control terminals of the microcontroller U1. The twenty-second pin, the twenty-third pin and the twenty-fourth pin of the single-chip microcomputer are the second control terminals of the microcontroller U1.

[0066] In some examples, the control circuit 110 may further include: a download terminal 111, a first capacitor C1, a second capacitor C2, a first electrolytic capacitor CE1 and a resistor R3.

[0067] The second pin of the download terminal 111 is electrically connected to the thirty-fourth pin of the single-chip microcomputer. The third pin of the download terminal 111 is electrically connected to the thirty-third pin of the single-chip microcomputer. The fourth pin of the download terminal 111 is electrically connected to the thirty-second pin of the single-chip microcomputer. The fifth pin of the download terminal 111 is electrically connected to the thirty-first pin of the single-chip microcomputer. The upper plate of the first electrolytic capacitor CE1 is electrically connected to the first end of the resistor R3, the upper plate of the second capacitor C2, the twelfth pin of the single-chip microcomputer and the first pin of the download terminal 111 respectively. The second end of the resistor R3 is electrically connected to the upper plate of the first capacitor C1 and the tenth pin of the single-chip microcomputer respectively. The lower plates of the first capacitor C1, the second capacitor C2 and the first electrolytic capacitor CE1 are all grounded.

[0068] Among them, the voltage on the first electrolytic capacitor CE1 is used to supply power to the control circuit 110. Exemplarily, the voltage on the first electrolytic capacitor CE1 is +5V.

[0069] Among them, the download terminal 111 is used to download the program in the single-chip microcomputer.

[0070] Based on the description of the above embodiments, exemplarily, a possible implementation manner of the first switching circuit 120. Refer to Figure 3 , Figure 3 is Figure 1 the structural schematic diagram of the first switching circuit in Figure 3 As shown in

[0071] The product to be debugged is electrically connected to the common terminals of the first analog switch U2 and the second analog switch U3 through the second wiring terminal J2. The channel switching terminals of the first analog switch U2 and the second analog switch U3 are both electrically connected to a plurality of first devices to be debugged 140. The control terminal of the first analog switch U2 is electrically connected to the output terminal of the first optocoupler control circuit 121. The control terminal of the second analog switch U3 is electrically connected to the output terminal of the second optocoupler control circuit 122. The power supply terminal of the first analog switch U2 is electrically connected to the power supply terminal of the first optocoupler control circuit 121. The power supply terminal of the second analog switch U3 is electrically connected to the power supply terminal of the second optocoupler control circuit 122. The input terminals of the first optocoupler control circuit 121 and the second optocoupler control circuit 122 are both electrically connected to the first control terminal of the control circuit 110.

[0072] Among them, the input terminals of the first optocoupler control circuit 121 and the second optocoupler control circuit 122 are both the control terminals of the first switching circuit 120. The pins of the second wiring terminal J2 are the first end of the first switching circuit 120. The channel switching terminals of the first analog switch U2 and the second analog switch U3 are both the second ends of the first switching circuit 120.

[0073] Among them, the second wiring terminal J2 is a 4P wiring terminal.

[0074] The first optocoupler control circuit 121 is used to receive the first control signal sent by the microcontroller U1, and control the first analog switch U2 to perform channel switching according to the first control signal, so as to switch from the first target device to be debugged to the second target device to be debugged.

[0075] The second optocoupler control circuit 122 is configured to receive the first control signal sent by the microcontroller U1, and control the second analog switch U3 to perform channel switching according to the first control signal, so as to switch from the first target debugging device to the second target debugging device.

[0076] In some examples, the number of the first devices to be debugged 140 among the multiple first devices to be debugged is 2, or 4, or 8, or 16.

[0077] When the number of the first devices to be debugged 140 among the multiple first devices to be debugged is 2, both the first analog switch U2 and the second analog switch U3 are single-pole double-throw two-channel analog switches, and the number of the first optocoupler control circuits 121 and the number of the second optocoupler control circuits 122 are both 2.

[0078] When the number of the first devices to be debugged 140 among the multiple first devices to be debugged is 4, both the first analog switch U2 and the second analog switch U3 are single-pole four-throw two-channel analog switches, and the number of the first optocoupler control circuits 121 and the number of the second optocoupler control circuits 122 are both 3.

[0079] When the number of the first devices to be debugged 140 among the multiple first devices to be debugged is 8, both the first analog switch U2 and the second analog switch U3 are single-pole eight-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits 121 and the number of the second optocoupler control circuits 122 are both 4.

[0080] When the number of the first devices to be debugged 140 among the multiple first devices to be debugged is 16, both the first analog switch U2 and the second analog switch U3 are single-pole sixteen-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits 121 and the number of the second optocoupler control circuits 122 are both 5.

[0081] It should be noted that for the convenience of description, the embodiments of the present application are all described by taking the number of the first devices to be debugged 140 among the multiple first devices to be debugged as 2 as an example. Therefore, Figure 3 in, both the first analog switch U2 and the second analog switch U3 are schematically shown as single-pole double-throw two-channel analog switches, and the multiple first devices to be debugged 140 are schematically shown as two first devices to be debugged, which are respectively represented by reference numerals 141 and 142. Correspondingly, the number of the first optocoupler control circuits 121 is 2, which are respectively represented by reference numerals 121-1 and 121-2, and the number of the second optocoupler control circuits 122 is 2, which are respectively represented by reference numerals 122-1 and 122-2.

[0082] Figure 3, the sixth pin and the tenth pin of the first analog switch U2 are the common terminal of the first analog switch U2. The second pin, the fourth pin, the seventh pin and the ninth pin of the first analog switch U2 are the channel switching terminals of the first analog switch U2. The first pin and the fifth pin of the first analog switch U2 are the control terminals of the first analog switch U2. The eighth pin of the first analog switch U2 is the power supply terminal of the first analog switch U2. The sixth pin and the tenth pin of the second analog switch U3 are the common terminal of the second analog switch U3. The second pin, the fourth pin, the seventh pin and the ninth pin of the second analog switch U3 are the channel switching terminals of the second analog switch U3. The first pin and the fifth pin of the second analog switch U3 are the control terminals of the second analog switch U3. The eighth pin of the second analog switch U3 is the power supply terminal of the second analog switch U3.

[0083] Among them, when the first analog switch U2 and the second analog switch U3 are both single-pole double-throw dual-channel analog switches, under the action of the first control signal, the first analog switch U2 and the second analog switch U3 perform channel switching according to the truth table shown in Table 1.

[0084] Table 1 is the truth table corresponding to the single-pole double-throw dual-channel analog switch

[0085]

[0086] When both the first analog switch U2 and the second analog switch U3 are single-pole double-throw dual-channel analog switches, the models of the first analog switch U2 and the second analog switch U3 are, for example, COS5A23195.

[0087] Based on the description of the above embodiment, another possible implementation of the first switching circuit 120 is exemplified. Figure 3 As shown, the first switching circuit 120 may further include: a third wiring terminal J3.

[0088] A first power supply end of the third wiring terminal J3 is electrically connected to a power supply end of the first optocoupler control circuit 121 , and a second power supply end of the third wiring terminal J3 is electrically connected to a power supply end of the second optocoupler control circuit 122 .

[0089] The third terminal J3 is used to provide a power supply voltage.

[0090] The third wiring terminal J3 provides a power supply voltage O1L_VCC to the first analog switch U2 and the first optical coupling control circuit 121. The third wiring terminal J3 provides a power supply voltage O1T_VCC to the second analog switch U3 and the second optical coupling control circuit 122.

[0091] In addition, the power supply voltage O1L_VCC and the power supply voltage O1T_VCC are in different voltage domains.

[0092] Based on the description of the above embodiments, by way of example, a possible implementation of the second switching circuit 130. Refer to Figure 4 , Figure 4 is Figure 1 the schematic structural diagram of the second switching circuit in Figure 4 . As shown in

[0093] , the second switching circuit 130 may include: a fourth terminal block J4, a third optocoupler control circuit 131, and a third analog switch U4.

[0094] The product to be debugged is electrically connected to the common terminal of the third analog switch U4 through the common terminal of the fourth terminal block J4. The channel switching terminal of the third analog switch U4 is electrically connected to a plurality of second devices to be debugged 150. The control terminal of the third analog switch U4 is electrically connected to the output terminal of the third optocoupler control circuit 131. The input terminal of the third optocoupler control circuit 131 is electrically connected to the second control terminal of the control circuit 110. The power supply terminal of the fourth terminal block J4 is electrically connected to the power supply terminals of the third analog switch U4 and the third optocoupler control circuit 131 respectively.

[0094] Among them, an optocoupler device usually includes 4 pins. If the second debugging device electrically connected to 1 pin of the optocoupler device needs to be replaced, then 1 Figure 4 shown second switching circuit 130 is required. If the second debugging device electrically connected to 3 pins of the optocoupler device needs to be replaced, then 3 Figure 4 shown second switching circuit 130 is required. If the second debugging device electrically connected to 4 pins of the optocoupler device needs to be replaced, then 4 Figure 4 shown second switching circuit 130 is required.

[0095] Among them, the input terminal of the third optocoupler control circuit 131 is the control terminal of the second switching circuit 130. The pin of the fourth terminal block J4 is the first end of the second switching circuit 130. The channel switching terminal of the third analog switch U4 is the second end of the second switching circuit 130.

[0096] Among them, the fourth terminal block J4 is a 3P terminal block.

[0097] The third optocoupler control circuit 131 is configured to receive the second control signal sent by the microcontroller U1, and control the third analog switch U4 to perform channel switching according to the second control signal, so as to switch from the third target debugging device to the fourth target debugging device.

[0098] In some examples, the number of the second devices to be debugged among the plurality of second devices to be debugged 150 is 2, or 4, or 8, or 16.

[0099] When the number of the second devices to be debugged 150 among multiple second devices to be debugged is 2, the third analog switch U4 is a single-pole double-throw single-channel analog switch, and the number of the third optocoupler control circuits 131 is 2.

[0100] When the number of the second devices to be debugged 150 among multiple second devices to be debugged is 4, the third analog switch U4 is a single-pole four-throw single-channel analog switch, and the number of the third optocoupler control circuits 131 is 3.

[0101] When the number of the second devices to be debugged 150 among multiple second devices to be debugged is 8, the third analog switch U4 is a single-pole eight-throw single-channel analog switch, and the number of the third optocoupler control circuits 131 is 4.

[0102] When the number of the second devices to be debugged 150 among multiple second devices to be debugged is 16, the third analog switch U4 is a single-pole sixteen-throw single-channel analog switch, and the number of the third optocoupler control circuits 131 is 5.

[0103] Among them, when the third analog switch U4 is a single-pole four-throw single-channel analog switch, the model of the third analog switch U4 is, for example, MAX4634ETB-T.

[0104] It should be noted that for the convenience of description, the embodiments of the present application are all described by taking the number of the second devices to be debugged 150 among multiple second devices to be debugged as 4 as an example. Therefore, Figure 4 in, the third analog switch U4 is schematically shown as a single-pole four-throw single-channel analog switch, and the number of the third optocoupler control circuits 131 is schematically shown as 3, which are respectively represented by reference numerals 131-1, 131-2, and 131-3.

[0105] Figure 4 in, the eighth pin of the third analog switch U4 is the common terminal of the third analog switch U4. The second pin, the fourth pin, the seventh pin, and the ninth pin of the third analog switch U4 are the channel switching terminals of the third analog switch U4. The first pin, the fifth pin, and the tenth pin of the third analog switch U4 are the control terminals of the third analog switch U4. The sixth pin of the third analog switch U4 is the power supply terminal of the third analog switch U4.

[0106] Among them, when the third analog switch U4 is a single-pole four-throw single-channel analog switch, under the action of the second control signal, the third analog switch U4 performs channel switching according to the truth table shown in Table 2.

[0107] Table 2 is the truth table corresponding to the single-pole four-throw single-channel analog switch

[0108]

[0109] In Table 2, X represents any value, 0 represents a low level, and 1 represents a high level.

[0110] In some examples, the second switching circuit 130 may further include: a third capacitor C3.

[0111] The upper plate of the third capacitor C3 is electrically connected to the sixth pin of the third analog switch U4, and the lower plate of the third capacitor C3 is electrically connected to the ground end of the third wiring terminal J3.

[0112] The third capacitor C3 can be used for filtering, so that the second switching circuit 130 tends to be stable.

[0113] Based on the description of the above embodiments, illustratively, a possible implementation of the first optical coupling control circuit 121 or the second optical coupling control circuit 122 or the third optical coupling control circuit 131 is as follows. Figure 3 and Figure 4 As shown, the first optocoupler control circuit 121 or the second optocoupler control circuit 122 or the third optocoupler control circuit 131 may include: a chip optocoupler OC, a first current limiting resistor R1 and a second current limiting resistor R2.

[0114] The first end of the first current limiting resistor R1 is electrically connected to the first control end or the second control end of the control circuit 110, the second end of the first current limiting resistor R1 is electrically connected to the first pin of the chip optocoupler OC, the second pin of the chip optocoupler OC is grounded, the third pin of the chip optocoupler OC is electrically connected to the control end of the first analog switch U2 or the control end of the second analog switch U3 or the control end of the third analog switch U4, the third pin of the chip optocoupler OC is also electrically connected to the first end of the second current limiting resistor R2, the second end of the second current limiting resistor R2 is electrically connected to the ground end of the first analog switch U2 or the ground end of the second analog switch U3 or the ground end of the third analog switch U4 or the ground end of the fourth terminal J4, and the fourth pin of the chip optocoupler OC is electrically connected to the power supply end of the first analog switch U2 or the power supply end of the fourth terminal J4.

[0115] The chip optocoupler OC can be used to achieve power supply isolation between the third analog switch U4 and the microcontroller U1, and between the first analog switch U2 and the second analog switch U3 and the microcontroller U1.

[0116] In some examples, the first optocoupler control circuit 121 or the second optocoupler control circuit 122 or the third optocoupler control circuit 131 may further include: a chip light emitting diode LED.

[0117] The cathode of the SMD light emitting diode LED is grounded, and the anode of the SMD light emitting diode LED is electrically connected to the third pin of the SMD optocoupler OC.

[0118] Among them, when the first switching circuit 120 switches from the third target device to be debugged to the fourth target device among the multiple second devices to be debugged 150, the patch light-emitting diode LED can be used to determine whether the current switch is from the third target device to be debugged to the fourth target device. Thus, it can be determined whether the device currently being debugged is the third target device or the fourth target device.

[0119] Based on the description of the above embodiments, by way of example, a possible implementation of the multiple second devices to be debugged 150. Refer to Figure 5 , Figure 5 is Figure 1 the structural schematic diagram of the multiple second devices to be debugged in Figure 5 As shown, each of the multiple second devices to be debugged 150 may include: a resistor, a capacitor, and a triode.

[0120] Among them, for the sake of convenience of description, the embodiments of the present application are all described by taking the number of the second devices to be debugged in the multiple second devices to be debugged 150 as 4 as an example. Therefore, Figure 5 in

[0121] the multiple second devices to be debugged 150 are schematically shown by four second devices to be debugged, and are respectively represented by reference numerals 151, 152, 153, and 154.

[0122] Next, the principle of the device replacement device 100 for replacing the first device to be debugged will be described in detail. Among them, the first target device to be debugged is Figure 3 the first device to be debugged 141 among the multiple first devices to be debugged 140 shown in Figure 3 and the second target device to be debugged is

[0123] Under the rated conditions such as high and low temperature environment testing, remove the optocoupler device to be debugged in the product to be debugged, and put the product to be debugged and the device replacement device 100 to be debugged into the box together. The first pin and the fifth pin of the first analog switch U2, and the first pin and the fifth pin of the second analog switch U3 are all defaulted to low level. According to Table 1, the channels between the tenth pin and the ninth pin, the sixth pin and the seventh pin of the first analog switch U2, and the channels between the tenth pin and the ninth pin, the sixth pin and the seventh pin of the second analog switch U3 are all conducting. In this way, the first device to be debugged in the product to be debugged is electrically connected to the first pin, the second pin, the third pin and the fourth pin of the first target debugging device through the first pin, the second pin, the third pin and the fourth pin of the second terminal block J2 respectively. Furthermore, the current first device to be debugged is the first target debugging device, that is, the first target debugging device is currently being debugged. Among them, the rated conditions are achieved by changing the temperature of the box.

[0124] After obtaining the debugging data corresponding to the first target debugging device, when the microcontroller U1 receives the communication signal sent by the host computer and determines that the communication signal is used to indicate switching from the first target debugging device to the second target debugging device, the first pin and the fifth pin of the first analog switch U2 are pulled to high level through the first optocoupler control circuit 121-1 and the first optocoupler control circuit 121-2, and the first pin and the fifth pin of the second analog switch U3 are pulled to high level through the second optocoupler control circuit 122-1 and the second optocoupler control circuit 122-2. According to Table 1, the channels between the tenth pin and the second pin, the sixth pin and the fourth pin of the first analog switch U2, and the channels between the tenth pin and the second pin, the sixth pin and the fourth pin of the second analog switch U3 are all conducting. In this way, the second device to be debugged in the product to be debugged is electrically connected to the first pin, the second pin, the third pin and the fourth pin of the second target debugging device through the first pin, the second pin, the third pin and the fourth pin of the second terminal block J2 respectively. Furthermore, the current first device to be debugged is the second target debugging device, that is, the second target debugging device is currently being debugged. Thus, the first switching circuit 120 switches from the first target debugging device to the second target debugging device, so that the device replacement device 100 replaces the first device to be debugged among the multiple first devices to be debugged 140.

[0125] Next, the principle of the device replacement device 100 replacing the second device to be debugged will be described in detail. Among them, the third target debugging device is Figure 5 the second device to be debugged 151 among the multiple second devices to be debugged 150 shown, and the fourth target debugging device is Figure 5The second device to be debugged 152 among the multiple second devices to be debugged 150 shown.

[0126] Under the rated conditions such as high and low temperature environment testing, remove the resistor to be debugged in the product to be debugged, and put the product to be debugged and the device replacement device 100 to be debugged into the box together. The first pin and the tenth pin of the third analog switch U4 are defaulted to low level, and the fifth pin is defaulted to high level. According to Table 2, the channel between the eighth pin and the second pin of the third analog switch U4 is conducting. In this way, the second device to be debugged in the product to be debugged is electrically connected to the third target device to be debugged through the third pin of the fourth terminal block J4, making the current second device to be debugged the third target device to be debugged, that is, the third target device to be debugged is currently being debugged. Among them, the rated conditions are achieved by changing the temperature of the box.

[0127] After obtaining the debugging data corresponding to the third target device to be debugged, when the microcontroller U1 receives the communication signal sent by the host computer and determines that the communication signal is used to indicate switching from the third target device to be debugged to the fourth target device to be debugged, the first pin of the third analog switch U4 is pulled to high level through the third optocoupler control circuit 131-2. According to Table 2, the channel between the eighth pin and the ninth pin of the third analog switch U4 is conducting. In this way, the second device to be debugged in the product to be debugged is electrically connected to the fourth target device to be debugged through the third pin of the fourth terminal block J4, making the current second device to be debugged the fourth target device to be debugged, that is, the fourth target device to be debugged is currently being debugged. Thus, the second switching circuit 130 switches from the third target device to be debugged to the fourth target device to be debugged, enabling the device replacement device 100 to replace the second device to be debugged among the multiple second devices to be debugged 150.

[0128] Finally, it should be noted that: the above embodiments are only specific implementation manners of the present application, but the protection scope of the present application is not limited thereto. Any changes or substitutions within the technical scope disclosed in the present application should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A device replacement device to be debugged for an optocoupler circuit, characterized in that, The device replacement device to be debugged includes: a control circuit, a first switching circuit, a second switching circuit, a plurality of first devices to be debugged, and a plurality of second devices to be debugged; The control circuit is electrically connected to the control end of the first switching circuit and the control end of the second switching circuit respectively. The first end of the first switching circuit and the first end of the second switching circuit are both electrically connected to the product to be debugged. The product to be debugged does not include the first device to be debugged and / or the second device to be debugged. The first device to be debugged is an optocoupler device, and the second device to be debugged is a device electrically connected to the optocoupler device. The second end of the first switching circuit is electrically connected to the plurality of first devices to be debugged, and the second end of the second switching circuit is electrically connected to the plurality of second devices to be debugged; The control circuit is configured to receive a communication signal sent by a host computer, and according to the communication signal, control the first switching circuit to switch from a first target debugging device to a second target debugging device among the plurality of first devices to be debugged, and / or control the second switching circuit to switch from a third target debugging device to a fourth target debugging device among the plurality of second devices to be debugged; Wherein, the control circuit includes: a first wiring terminal and a microcontroller; The communication terminal of the first wiring terminal is electrically connected to the communication terminal of the microcontroller. The first control end of the microcontroller is electrically connected to the control end of the first switching circuit, and the second control end of the microcontroller is electrically connected to the control end of the second switching circuit; The first wiring terminal is configured to receive the communication signal and transmit a control signal to the microcontroller according to the communication signal; The microcontroller is configured to generate a first control signal and / or a second control signal according to the control signal. The first control signal is used to control the first switching circuit to switch from the first target debugging device to the second target debugging device, and the second control signal is used to control the second switching circuit to switch from the third target debugging device to the fourth target debugging device.

2. The device according to claim 1, wherein The first switching circuit includes: a second wiring terminal, a first optocoupler control circuit, a second optocoupler control circuit, a first analog switch, and a second analog switch; The product to be debugged is electrically connected to the common terminal of the first analog switch and the common terminal of the second analog switch through the second wiring terminal. The channel switching terminals of the first analog switch and the second analog switch are both electrically connected to the plurality of first devices to be debugged. The control terminal of the first analog switch is electrically connected to the output terminal of the first optocoupler control circuit, and the control terminal of the second analog switch is electrically connected to the output terminal of the second optocoupler control circuit. The power supply terminal of the first analog switch is electrically connected to the power supply terminal of the first optocoupler control circuit, and the power supply terminal of the second analog switch is electrically connected to the power supply terminal of the second optocoupler control circuit. The input terminals of the first optocoupler control circuit and the second optocoupler control circuit are both electrically connected to the first control end of the control circuit; The first optocoupler control circuit is configured to receive the first control signal sent by the microcontroller and, according to the first control signal, control the first analog switch to perform channel switching so as to switch from the first target debugging device to the second target debugging device; The second optocoupler control circuit is configured to receive the first control signal sent by the microcontroller and, according to the first control signal, control the second analog switch to perform channel switching so as to switch from the first target debugging device to the second target debugging device.

3. The device according to claim 2, wherein The first switching circuit further includes: a third wiring terminal; A first power terminal of the third wiring terminal is electrically connected to a power terminal of the first optocoupler control circuit, and a second power terminal of the third wiring terminal is electrically connected to a power terminal of the second optocoupler control circuit; The third wiring terminal is configured to provide a power supply voltage.

4. The device according to claim 2, characterized in that, The number of the first devices to be debugged among the multiple first devices to be debugged is 2, or 4, or 8, or 16; When the number of the first devices to be debugged among the multiple first devices to be debugged is 2, both the first analog switch and the second analog switch are single-pole double-throw two-channel analog switches, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 2; When the number of the first devices to be debugged among the multiple first devices to be debugged is 4, both the first analog switch and the second analog switch are single-pole four-throw two-channel analog switches, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 3; When the number of the first devices to be debugged among the multiple first devices to be debugged is 8, both the first analog switch and the second analog switch are single-pole eight-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 4; When the number of the first devices to be debugged among the multiple first devices to be debugged is 16, both the first analog switch and the second analog switch are single-pole sixteen-throw single-channel analog switches and the number is 2, and the number of the first optocoupler control circuits and the number of the second optocoupler control circuits are both 5.

5. The device according to claim 1, characterized in that, The second switching circuit includes: a fourth wiring terminal, a third optocoupler control circuit, and a third analog switch; The product to be debugged is electrically connected to a common terminal of the fourth wiring terminal through a common terminal of the third analog switch. A channel switching terminal of the third analog switch is electrically connected to the multiple second devices to be debugged. A control terminal of the third analog switch is electrically connected to an output terminal of the third optocoupler control circuit. An input terminal of the third optocoupler control circuit is electrically connected to a second control terminal of the control circuit. A power terminal of the fourth wiring terminal is electrically connected to a power terminal of the third analog switch and a power terminal of the third optocoupler control circuit respectively; The third optocoupler control circuit is configured to receive the second control signal sent by the microcontroller and, according to the second control signal, control the third analog switch to perform channel switching so as to switch from the third target debugging device to the fourth target debugging device.

6. The device according to claim 5, characterized in that, The number of the second devices to be debugged among the multiple second devices to be debugged is 2, or 4, or 8, or 16; When the number of the second devices to be debugged among the multiple second devices to be debugged is 2, the third analog switch is a single-pole double-throw single-channel analog switch, and the number of the third optocoupler control circuits is 2; When the number of the second devices to be debugged among the multiple second devices to be debugged is 4, the third analog switch is a single-pole four-throw single-channel analog switch, and the number of the third optocoupler control circuits is 3; When the number of the second devices to be debugged among the multiple second devices to be debugged is 8, the third analog switch is a single-pole eight-throw single-channel analog switch, and the number of the third optocoupler control circuits is 4; When the number of the second devices to be debugged among the multiple second devices to be debugged is 16, the third analog switch is a single-pole sixteen-throw single-channel analog switch, and the number of the third optocoupler control circuits is 5.

7. The device according to claim 2, characterized in that The first optocoupler control circuit or the second optocoupler control circuit includes: a surface mount optocoupler, a first current-limiting resistor, and a second current-limiting resistor; The first end of the first current-limiting resistor is electrically connected to the first control end of the control circuit, the second end of the first current-limiting resistor is electrically connected to the first pin of the surface mount optocoupler, the second pin of the surface mount optocoupler is grounded, the third pin of the surface mount optocoupler is electrically connected to the control end of the first analog switch or the control end of the second analog switch, the third pin of the surface mount optocoupler is also electrically connected to the first end of the second current-limiting resistor, the second end of the second current-limiting resistor is electrically connected to the ground end of the first analog switch or the ground end of the second analog switch, and the fourth pin of the surface mount optocoupler is electrically connected to the power supply end of the first analog switch.

8. The device according to claim 5, characterized in that, The third optocoupler control circuit includes: a surface mount optocoupler, a first current-limiting resistor, and a second current-limiting resistor; The first end of the first current-limiting resistor is electrically connected to the second control end of the control circuit, the second end of the first current-limiting resistor is electrically connected to the first pin of the surface mount optocoupler, the second pin of the surface mount optocoupler is grounded, the third pin of the surface mount optocoupler is electrically connected to the control end of the third analog switch, the third pin of the surface mount optocoupler is also electrically connected to the first end of the second current-limiting resistor, the second end of the second current-limiting resistor is electrically connected to the ground end of the third analog switch or the ground end of the fourth terminal, and the fourth pin of the surface mount optocoupler is electrically connected to the power supply end of the fourth terminal.

9. The device according to claim 7, characterized in that, The first optocoupler control circuit or the second optocoupler control circuit further includes: a surface mount light-emitting diode; The negative electrode of the surface mount light-emitting diode is grounded, and the positive electrode of the surface mount light-emitting diode is electrically connected to the third pin of the surface mount optocoupler.

10. The device according to any one of claims 1-6, characterized in that, Each of the second devices to be debugged among the multiple second devices to be debugged includes: a resistor, a capacitor, and a triode.

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