Rapid batch detection system for output characteristics of semiconductor laser
By designing a fast batch inspection system and automated loading and inspection, the problems of slow speed and low efficiency of semiconductor laser detection equipment in the prior art are solved, efficient and accurate detection and quality consistency are achieved, and labor costs are reduced.
Patent Information
- Application Number
- CN202510103145.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-22
- Publication Date
- 2025-05-09
AI Technical Summary
In the prior art, the detection equipment of semiconductor lasers relies on manual feeding to load one by one, with slow speed, low efficiency, poor stability, and greatly affected by ambient light, making it difficult to achieve rapid production in large quantities.
A fast batch detection system for the output characteristics of semiconductor lasers is designed, including a loading module, a beam collimation module, an azimuth adjustment module, a comparison and analysis module and a batch detection module. Through automatic loading and detection, the beam quality, output energy and wavelength characteristics of semiconductor lasers can be quickly and accurately detected.
It realizes efficient and accurate detection of semiconductor laser performance, greatly improves detection efficiency, ensures the consistency of the quality of lasers in mass production, greatly reduces labor costs, and improves screening efficiency.
Smart Images
Figure CN119965661A_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of photoelectric detection, and in particular to a fast batch detection system for output characteristics of semiconductor lasers. Background Art
[0002] In the optoelectronic industry, semiconductor lasers are an important and widely used laser light source. In the field of laser ranging, the performance of semiconductor lasers is directly related to the key performance of the maximum range and accuracy of the whole machine. In the mass production process, batch and rapid screening and testing of semiconductor lasers is the key to ensuring a high yield rate of the whole machine. It is of great significance in the mass production process.
[0003] At present, the inspection equipment for semiconductor lasers adopts the method of loading materials one by one and relies on manual work, which is slow, inefficient, unstable, and has high labor costs. At the same time, it is greatly affected by ambient light and is not conducive to large-scale rapid production. Therefore, it is necessary to provide a technical means to solve the above defects. Summary of the invention
[0004] The main purpose of the present invention is to provide a fast batch detection system for output characteristics of semiconductor lasers to solve the technical problems involved in the above prior art.
[0005] In order to solve the above technical problems, the technical solution adopted by the present invention is: a rapid batch detection system for the output characteristics of semiconductor lasers, comprising the following modules: a mounting base module, used to install various devices and level and stabilize the entire system base, and a loading module is deployed on the mounting base module; A loading module includes a loading bin, in which a plurality of lasers are connected, and is used to sequentially transfer the semiconductor lasers to the detection position; The beam collimation module is used to collimate the fast axis and slow axis of the beam so that the vertical and horizontal divergence angles of the semiconductor laser are smaller than the preset threshold angles; The azimuth adjustment module is set corresponding to the laser to be tested, and is used to adjust the direction of each laser to ensure that the direction of the laser received by each laser is the same. After passing through the semi-transparent and semi-reflective mirrors and the full-reflective mirror, the laser is incident on the laser energy meter, the infrared camera and the wavelength detector, so as to detect the output characteristics; A comparison and analysis module is used to sequentially transmit the semiconductor lasers to the detection positions and to compare and analyze them with two reference lasers; The batch detection module is used to obtain the comparative analysis data of the comparative analysis module, analyze the beam quality, output energy and wavelength characteristics of all lasers to be tested, and output the final detection results.
[0006] In a preferred embodiment, the loading module also includes a stepper motor, a stepper motor driver, a limit switch, a screw conveyor and a belt conveyor light, which are used to sequentially convey multiple lasers in the laser batch loading bin to a preset detection position.
[0007] In a preferred embodiment, the azimuth adjustment module includes a pulse laser driver, which is electrically connected to the laser electrical connector, the laser pitch adjuster and the azimuth adjuster; Among them, the laser electrical connector is used to place a single semiconductor laser tube; The azimuth adjustment module is arranged on an adaptive adjustment frame, and the adaptive adjustment frame is provided with four adjustable adjustment columns of different lengths in the same direction, which are uniformly controlled by a pulse laser driver; Each adjustment column is connected to the bearing shaft through a lever. A positioning rod is provided on the bearing shaft. A hinge is provided at the end of the positioning rod to ensure that when the angle of the semiconductor laser tube is adjusted, the spatial position of the semiconductor laser tube intersecting with the light beam remains unchanged. The bearing shaft is connected to the base through the main bracket below. The base can move slightly on the slide rail, and the data is transmitted to the pulse laser driver through the control line. The base is provided with a water inlet and outlet to maintain the temperature stability of the semiconductor laser single tube.
[0008] In the preferred solution, the infrared camera in the azimuth adjustment module is used to capture the light spot on the optical screen, and transmit the video to the batch detection module via a USB cable, and detect the energy distribution of the light spot by image processing, so as to perform detection and screening; Among them, the wavelength detector is used to detect the wavelength of the semiconductor laser and is connected to the batch detection module via a USB cable; the laser energy meter can automatically detect the energy of this semiconductor laser and is connected to the batch detection module via an RS232 interface.
[0009] In the preferred embodiment, the threshold angle preset in the beam collimation module is 0.1 degrees; When the semiconductor laser to be tested is transmitted to the detection position in turn, the laser is driven to emit light through the driver. After the semiconductor laser beam emitted by the semiconductor laser single tube is emitted, the fast axis and slow axis of the beam are collimated by a fast axis collimator and a slow axis collimator respectively, so that the divergence angles in both directions are smaller than the preset threshold angle.
[0010] In the preferred embodiment, one of the two reference semiconductor lasers in the comparison and analysis module is in a light-emitting state, and the light beams sequentially pass through two semi-transparent and semi-reflective mirrors with a reflectivity of 1% and a total reflective mirror with a reflectivity of 100%, and the three reflected light beams are respectively received by an infrared camera, a wavelength detector, a laser energy meter, and a photoelectric probe; the other is in a non-light-emitting state, and the light beams sequentially pass through a total reflective mirror with a reflectivity of 100% and are received by an infrared camera; The infrared camera superimposes the light spots of two reference semiconductor lasers to eliminate the influence of ambient light, and then compares and analyzes them with multiple lasers to be tested. When the collected output characteristics of the laser to be tested and the reference error are within the preset reference range, it means that the laser meets the finished product standards, otherwise it is waste.
[0011] In a preferred embodiment, the central axis of each optical lens coincides with the central axis of the light beam, and each optical lens is coated with an anti-reflection film corresponding to the output wavelength of the semiconductor laser unit.
[0012] In the preferred embodiment, except for the semiconductor laser pitch azimuth adjuster, the remaining optical elements are fixed at the optimal position and angle; The optimal position and angle are specifically as follows: using a helium-neon laser for indication to adjust the coaxial axis, adjusting the semi-transparent and semi-reflective mirror, the total reflective mirror, the infrared camera, the wavelength detector and the photoelectric probe to the same level to ensure the accuracy of the optical path.
[0013] The preferred solution also includes an alarm module. When the detection result received from the batch detection module is unqualified, a red light is turned on, the mechanical control system is paused, and an audible and visual alarm is issued.
[0014] In the preferred solution, the azimuth adjustment module can also adjust the angle of the semiconductor laser pitch azimuth adjuster in real time according to the energy characteristic parameters of the output light beam, including the following steps: Step 1: The laser energy meter receives the energy signal of the semiconductor laser to be measured; Step 2: The semiconductor laser pitch azimuth regulator adjusts the angle, and the laser energy meter monitors the energy signal of the semiconductor laser to be tested in real time; Step 3: When the energy signal of the semiconductor laser to be measured received by the laser energy meter is the largest, it is the optimal angle of the semiconductor laser pitch azimuth adjuster.
[0015] The present invention provides a fast batch detection system for the output characteristics of semiconductor lasers, which is directly deployed on the mounting base module through a loading module. The laser enters the system through the loading module, and the semiconductor laser is sequentially transmitted to the detection position and the beam collimation module, and the fast axis and slow axis of the light beam emitted by the semiconductor laser are collimated to ensure that the divergence angle of the light beam in the vertical and horizontal directions is less than the preset threshold angle. Subsequently, the light beam is guided to the azimuth adjustment module to adjust the direction of each laser to be tested to ensure that the direction of the light beam of each laser is consistent. Finally, after comparison analysis and batch detection module, the performance detection results of each laser are output, and the efficient and accurate detection of the performance of the semiconductor laser is realized, which greatly improves the detection efficiency, ensures the quality consistency of the laser in batch production, greatly reduces the labor cost, and improves the screening efficiency.
[0016] Compared with the prior art, the above technical solution conceived by the present invention can achieve the following beneficial effects. The rapid batch detection system provided by the present invention can detect more than 50 lasers at a time through a batch loading bin and an automatic loader, which greatly reduces labor costs and improves screening efficiency. The present invention can test the beam quality, output energy, and wavelength characteristics of semiconductor lasers at one time by using a semi-transparent and semi-reflective mirror and a fully reflective mirror, combining the three steps in the traditional detection scheme into one, thereby reducing the testing cost. The present invention can monitor the characteristic parameters such as the energy, wavelength, and line width of the output light beam in real time, and adjust the angle of the semiconductor laser pitch azimuth regulator in real time after processing by the host computer, thereby reducing the steps of manually adjusting the optical path, which is of great significance to applications in the fields of laser ranging. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] The present invention will be further described below in conjunction with the accompanying drawings and embodiments: Figure 1 It is a structural diagram of the rapid batch detection system of the present invention; Figure 2 It is a diagram of a semiconductor laser pitch azimuth regulator of the present invention; Figure 3 is a collimation diagram of a semiconductor laser of the present invention; Figure 4 It is a working principle diagram of the rapid batch detection software of the present invention.
[0018] In the figure: counterweight base 1; level bubble 2; adjustment foot nail 3; loading bin 4; azimuth adjuster 5; stepper motor 6; stepper motor driver 7; limit switch 8; screw conveyor 9; belt conveyor light 10; semiconductor laser single tube 11; fast axis collimator 12; slow axis collimator 13; adaptive adjustment frame 37; semi-transparent and semi-reflective mirror 14; full reflective mirror 15; infrared camera 16; wavelength detector 17; photoelectric probe 18; USB cable 19; USB cable 20; RS232 interface 21; pulse laser driver 22; laser electrical connector 23; first adjustment column 24; second adjustment column 25; third adjustment column 26; fourth adjustment column 27; load-bearing shaft 28; main bracket 29; base 30; slide rail 31; positioning rod 32; hinge 33; control line 34; water inlet 35; water outlet 36. DETAILED DESCRIPTION
[0019] Example 1 like Figure 1-4 As shown, a fast batch detection system for semiconductor laser output characteristics includes the following modules: An installation base module is used to install various devices and level and stabilize the entire system base, and the loading module is deployed on the installation base module; A loading module, comprising a loading bin 4, wherein a plurality of lasers are connected to the loading bin 4, and is used to sequentially transfer the semiconductor lasers to the detection position; The beam collimation module is used to collimate the fast axis and slow axis of the beam so that the vertical and horizontal divergence angles of the semiconductor laser are smaller than the preset threshold angles; The azimuth adjustment module is set corresponding to the laser to be tested, and is used to adjust the direction of each laser to ensure that the direction of the laser received by each laser is the same. After passing through the semi-transparent and semi-reflective mirrors and the full-reflective mirror, the laser is incident on the laser energy meter, the infrared camera and the wavelength detector, so as to detect the output characteristics; A comparison and analysis module is used to sequentially transmit the semiconductor lasers to the detection positions and to compare and analyze them with two reference lasers; The batch detection module is used to obtain the comparative analysis data of the comparative analysis module, analyze the beam quality, output energy and wavelength characteristics of all lasers to be tested, and output the final detection results.
[0020] In this embodiment, the loading module is directly deployed on the mounting base module, the laser enters the system through the loading module, the semiconductor laser is sequentially transmitted to the detection position, and then transmitted to the beam collimation module, and the fast axis and slow axis of the light beam emitted by the semiconductor laser are collimated to ensure that the divergence angle of the light beam in the vertical and horizontal directions is less than the preset threshold angle. Subsequently, the light beam is guided to the azimuth adjustment module to adjust the direction of each laser to be tested to ensure that the direction of the light beam of each laser is consistent. Finally, after comparison analysis and batch detection module, the performance detection results of each laser are output, realizing efficient and accurate detection of semiconductor laser performance, greatly improving detection efficiency, ensuring the quality consistency of lasers in mass production, greatly reducing labor costs, and improving screening efficiency.
[0021] like Figure 1 As shown, in this embodiment, the entire system base is leveled and stabilized through the platform base assembly, including a counterweight base 1, a level bubble 2, and an adjustment foot nail 3. The laser to be tested enters the detection system through a laser batch loading bin 4, which includes 50 laser loading and installation electrical connectors. The operator can install 50 semiconductor lasers on 50 electrical connectors at a time, thereby starting a batch detection action.
[0022] In the preferred embodiment, the loading module also includes a stepper motor 6, a stepper motor driver 7, a limit switch 8, a screw conveyor 9 and a belt conveyor light 10, which are used to sequentially convey multiple lasers in the laser batch loading bin 4 to the preset detection position.
[0023] In this embodiment, when the system receives an instruction to start detection, the stepper motor driver 7 receives a control signal and starts the stepper motor 6. The motor rotates to drive the screw conveyor 9 to work, pushing the laser to move on the belt conveyor. At the same time, the limit switch monitors the position of the laser in real time to ensure its precise positioning during the transmission process. When the laser reaches the preset detection position, the system stops the operation of the motor and prepares for the next step of detection, which improves the detection efficiency and ensures the accuracy and reliability of the detection results.
[0024] In this embodiment, the azimuth adjustment module makes each semiconductor laser to be tested equipped with a semiconductor laser pitch azimuth adjuster 5, including a laser electrical connector, a laser pitch adjuster, and an azimuth adjuster. The direction of each semiconductor laser is adjusted so that the light emission direction is roughly the same, with the purpose of irradiating the light spot onto the photoelectric probe with a diameter of 10 mm of the front laser energy meter according to the angle requirement. Another purpose is to enable the light spot of the semiconductor laser to irradiate the target plate, so as to use an infrared camera to perform beam quality detection. Each TO-packaged semiconductor laser corresponds to a pitch azimuth adjuster 5 and is directly inserted into the work.
[0025] like Figure 2 As shown, the components except the semiconductor laser tube 11 are components of the semiconductor laser pitch azimuth adjuster 5 .
[0026] In the preferred embodiment, the azimuth adjustment module includes a pulse laser driver 22, which is electrically connected to the laser electrical connector 23, the laser pitch adjuster and the azimuth adjuster 5; The laser electrical connector 23 is used to place the semiconductor laser tube 11; The azimuth adjustment module is arranged on the adaptive adjustment frame 37, and the adaptive adjustment frame 37 is provided with four adjustment columns of adjustable length in the same direction, which are uniformly controlled by the pulse laser driver 22; Each adjusting column is connected to the bearing shaft 28 through a lever. A positioning rod 32 is provided on the bearing shaft 28. A hinge 33 is provided at the end of the positioning rod 32 to ensure that when the angle of the semiconductor laser tube 11 is adjusted, the spatial position of the semiconductor laser tube 11 intersecting with the light beam remains unchanged. The bearing shaft 28 is connected to the base 30 through the main bracket 29 below. The base 30 can move slightly on the slide rail 31, and the data is transmitted to the pulse laser driver 22 through the control line 34.
[0027] In this embodiment, the pulse laser driver 22 receives control signals from the system and generates corresponding drive current or voltage according to these signals to control the movement of other components (such as laser electrical connectors, pitch adjusters, azimuth adjusters, etc.). The adaptive adjustment frame 37 is provided with four length-adjustable adjustment columns in the same direction to achieve precise fine-tuning of the length. The azimuth adjustment module achieves precise control of the angle of the semiconductor laser tube through the above components, which not only ensures the stability and accuracy of the laser beam during the detection process, but also improves the performance and reliability of the entire detection system.
[0028] In the preferred embodiment, a water inlet 35 and a water outlet 36 are provided on the base 30 to maintain the temperature of the semiconductor laser tube 11 stable.
[0029] like Figure 3 As shown, the semiconductor laser beam emitted by the semiconductor laser tube 11 has different divergence angles in the fast axis and slow axis directions, and is difficult to be collimated by a single collimator. In this embodiment, the beam is collimated in both the fast axis and slow axis directions.
[0030] In the preferred embodiment, the threshold angle preset in the beam collimation module is 0.1 degrees; When the semiconductor laser to be tested is sequentially transferred to the detection position, the laser is driven to emit light by the driver. After the semiconductor laser light beam emitted by the semiconductor laser tube 11 is emitted, the fast axis and slow axis of the light beam are collimated by the fast axis collimator 12 and the slow axis collimator 13 respectively, so that the divergence angles in both directions are smaller than the preset threshold angle.
[0031] The light beams sequentially pass through two semi-transparent and semi-reflective mirrors 14 with a reflectivity of 1% and a total reflective mirror 15 with a reflectivity of 100%. The three reflected light beams are received by an infrared camera 16, a wavelength detector 17, a laser energy meter and a photoelectric probe 18 respectively.
[0032] In this embodiment, 1) the fast axis collimator 12 is used to collimate the fast axis direction of the laser beam. The fast axis direction is usually the direction with the largest divergence angle of the laser beam. The focusing effect of the fast axis collimator can significantly reduce the divergence angle in the fast axis direction. 2) The slow axis collimator 13 is used to collimate the slow axis direction of the laser beam. Although the divergence angle in the slow axis direction is relatively small, it also needs to be collimated to ensure the quality of the beam.
[0033] After being collimated by the beam collimation module, the divergence angles of the laser beam in both directions are less than the preset threshold angle of 0.1 degrees.
[0034] Beam splitting and detection: The laser beam first encounters two semi-transparent and semi-reflective mirrors with a reflectivity of 1%. The two mirrors split the beam into three paths, each of which contains a portion of the energy of the original beam; the third beam is completely reflected when it encounters the full reflective mirror 15, changes direction and continues to move forward.
[0035] Beam reception and detection: The first beam is received by an infrared camera to monitor the intensity and stability of the laser beam. The second beam is received by a wavelength detector to measure the wavelength of the laser beam. The third beam is used to measure the energy of the laser beam.
[0036] In the preferred embodiment, the infrared camera in the azimuth adjustment module is used to capture the light spot on the optical screen, and transmit the video to the batch detection module via the USB cable 19, and detect the energy distribution of the light spot by image processing, so as to perform detection and screening; The wavelength detector is used to detect the wavelength of the semiconductor laser and is connected to the batch detection module via a USB cable 20 ; the laser energy meter can automatically detect the energy of the semiconductor laser and is connected to the batch detection module via an RS232 interface 21 .
[0037] In the preferred embodiment, one of the two reference semiconductor lasers in the comparison and analysis module is in a light-emitting state, and the light beams pass through two semi-transparent and semi-reflective mirrors 14 with a reflectivity of 1% and a total reflective mirror 15 with a reflectivity of 100% in sequence, and the three reflected light beams are respectively received by the infrared camera 16, the wavelength detector 17, the laser energy meter and the photoelectric probe 18; the other one is in a non-light-emitting state, and the light beams pass through the total reflective mirror 15 with a reflectivity of 100% in sequence and are received by the infrared camera 16.
[0038] The infrared camera superimposes the light spots of two reference semiconductor lasers to eliminate the influence of ambient light, and then compares and analyzes them with multiple lasers to be tested. When the collected output characteristics of the laser to be tested and the reference error are within the preset reference range, it means that the laser meets the finished product standards, otherwise it is waste.
[0039] In this embodiment, the preset reference range is no more than 1%. 50 lasers to be detected are compared and analyzed with the reference laser, so as to perform detection and screening. The pulse laser driver 22 is used to drive the pulse laser.
[0040] In this embodiment, the infrared camera 16 transmits the captured video signal to the batch detection module in real time via the USB cable 19, ensuring the fast and lossless transmission of image information; the image processing algorithm embedded in the batch detection module processes the received video signal, and by comparing with the preset standard or threshold, the system can automatically determine whether the performance of the semiconductor laser meets the standard, thereby achieving comprehensive and efficient detection of the performance of the semiconductor laser and improving the accuracy and reliability of the detection.
[0041] In a preferred embodiment, the central axis of each optical lens coincides with the central axis of the light beam, and each optical lens is coated with an anti-reflection film corresponding to the output wavelength of the semiconductor laser unit.
[0042] In this embodiment, when the central axis of the optical lens completely coincides with the central axis of the light beam, the light beam can pass through the lens with minimal loss and deviation, and precise alignment ensures that the focusing, collimation or any other required optical transformation of the light beam can be achieved in the best state.
[0043] The use of anti-reflection coating can significantly reduce the reflection loss of light before and after the lens, allowing more light to penetrate the lens and continue its propagation path, improving the luminous flux of the system and reducing stray light and thermal effects caused by reflection.
[0044] In the preferred embodiment, except for the semiconductor laser pitch azimuth adjuster, the remaining optical elements are fixed at the optimal position and angle; The optimal position and angle are as follows: using a helium-neon laser for indication to adjust the coaxial axis, the semi-transparent and semi-reflective mirror 14, the total reflective mirror 15, the infrared camera 16, the wavelength detector 17 and the photoelectric probe 18 are adjusted to the same level to ensure the accuracy of the optical path.
[0045] In the preferred embodiment, an alarm module is also included. When the test result of the batch detection module is not qualified, a red light is turned on, the mechanical control system is suspended, and an audible and visual alarm is issued; Furthermore, other detectors, such as a spectrometer, an oscilloscope, etc., are included to measure parameters such as the line width of the continuous output of the semiconductor laser and the pulse width of the pulse output.
[0046] like Figure 4 As shown in the working principle diagram of the rapid batch detection function, this embodiment compares and analyzes the laser to be detected with the reference object: the emitting laser and the non-emitting laser. After acquiring the data, it enters the data processing module for further comparison and analysis to obtain the current detection result, which is specifically: 1) By controlling the automatic feeder, limit switch, stepper motor, and 14ma stepper motor drive, the mechanical transportation and positioning of the semiconductor laser to be tested are realized.
[0047] 2) By accessing the video signal of the infrared camera and using the spot energy distribution analysis algorithm in the self-developed software, the spot distribution analysis of the semiconductor laser spot to be detected is realized. At the same time, the spot distribution of the two reference semiconductor lasers is compared and analyzed with the 50 semiconductor lasers to be detected, and the automatic detection is implemented using the detection parameter range manually input by the software. If qualified, the system indicator light is green, if unqualified, it is red, and the mechanical control system is suspended, and an audible and visual alarm is issued.
[0048] 3) Use a laser energy meter and a photoelectric probe to calculate the energy of the semiconductor laser to be tested, and use the test parameter range manually input by the software to implement automatic testing. If qualified, the system indicator light will be green, if unqualified, it will be red, and the mechanical control system will be suspended and an audible and visual alarm will be issued.
[0049] Example 2 Further described in conjunction with Example 1, the azimuth adjustment module can also adjust the angle of the semiconductor laser pitch azimuth adjuster in real time according to the energy characteristic parameters of the output light beam, including the following steps: Step 1: The laser energy meter receives the energy signal of the semiconductor laser to be measured; Step 2: The semiconductor laser pitch azimuth regulator adjusts the angle, and the laser energy meter monitors the energy signal of the semiconductor laser to be tested in real time; Step 3: When the energy signal of the semiconductor laser to be measured received by the laser energy meter is the largest, it is the optimal angle of the semiconductor laser pitch azimuth adjuster.
[0050] When in use, the fast batch detection system provided by the present invention, through the batch loading bin and the automatic loading machine, by using the semi-transparent semi-reflective mirror and the full-reflective mirror, tests the beam quality, output energy, and wavelength characteristics of the semiconductor laser at one time, and finally obtains the test result by real-time monitoring of the characteristic parameters such as the energy, wavelength, and line width of the output beam, and adjusting the angle of the semiconductor laser pitch azimuth regulator in real time after processing by the host computer. The fast batch detection system provided by the present invention. It is capable of detecting more than 50 lasers at one time, greatly reducing the labor cost, improving the screening efficiency, and reducing the steps of manually adjusting the optical path. It combines the three steps in the traditional detection scheme into one, reducing the test cost, and is widely applicable to application fields such as laser ranging.
[0051] The above embodiments are only preferred technical solutions of the present invention and should not be regarded as limiting the present invention. The protection scope of the present invention shall be the technical solutions recorded in the claims, including equivalent replacement solutions of the technical features in the technical solutions recorded in the claims. That is, equivalent replacement improvements within this scope are also within the protection scope of the present invention.
Claims
1. A fast batch detection system for semiconductor laser output characteristics, characterized in that: The system comprises the following modules: a mounting base module for mounting various devices and leveling and stabilizing the entire system base, and a loading module is deployed on the mounting base module; A loading module, comprising a loading bin (4), wherein a plurality of lasers are connected to the loading bin (4) and are used to sequentially transfer the semiconductor lasers to the detection position; The beam collimation module is used to collimate the fast axis and slow axis of the beam so that the vertical and horizontal divergence angles of the semiconductor laser are smaller than the preset threshold angles; The azimuth adjustment module is set corresponding to the laser to be tested, and is used to adjust the direction of each laser to ensure that the direction of the laser received by each laser is the same. After passing through the semi-transparent and semi-reflective mirrors and the full-reflective mirror, the laser is incident on the laser energy meter, the infrared camera and the wavelength detector, so as to detect the output characteristics; A comparison and analysis module is used to sequentially transmit the semiconductor lasers to the detection positions and to compare and analyze them with two reference lasers; The batch detection module is used to obtain the comparative analysis data of the comparative analysis module, analyze the beam quality, output energy and wavelength characteristics of all lasers to be tested, and output the final detection results.
2. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: The loading module also includes a stepper motor (6), a stepper motor driver (7), a limit switch (8), a screw conveyor (9) and a belt conveyor light (10), which are used to sequentially convey a plurality of lasers in a laser batch loading bin (4) to a preset detection position.
3. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: The azimuth adjustment module comprises a pulse laser driver (22), and the pulse laser driver (22) is electrically connected to a laser electrical connector (23), a laser pitch adjuster, and an azimuth adjuster (5); Wherein, the laser electrical connector (23) is used to place the semiconductor laser single tube (11); The azimuth adjustment module is arranged on an adaptive adjustment frame (37), and the adaptive adjustment frame (37) is provided with four adjustment columns of adjustable length in the same direction, which are uniformly controlled by a pulse laser driver (22); Each adjustment column is connected to the bearing shaft (28) via a lever, and a positioning rod (32) is provided on the bearing shaft (28). A hinge (33) is provided at the end of the positioning rod (32) to ensure that when the angle of the semiconductor laser tube (11) is adjusted, the spatial position of the semiconductor laser tube (11) intersecting with the light beam remains unchanged; The bearing shaft (28) is connected to the base (30) via the main bracket (29) below. The base (30) can move slightly on the slide rail (31), and data is transmitted to the pulse laser driver (22) via the control line (34). The base (30) is provided with a water inlet (35) and a water outlet (36) for maintaining the temperature of the semiconductor laser tube (11) stable.
4. The fast batch detection system for semiconductor laser output characteristics according to claim 3, characterized in that: The infrared camera in the azimuth adjustment module is used to capture the light spot on the optical screen, and transmit the video to the batch detection module via a USB cable (19), and detect the energy distribution of the light spot by image processing, so as to perform detection and screening; The wavelength detector is used to detect the wavelength of the semiconductor laser and is connected to the batch detection module via a USB cable (20); the laser energy meter can automatically detect the energy of the semiconductor laser and is connected to the batch detection module via an RS232 interface (21).
5. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: The preset threshold angle in the beam collimation module is 0.1 degrees; When the semiconductor lasers to be tested are sequentially transferred to the detection position, the lasers are driven to emit light by a driver, and after the semiconductor laser light beam emitted by the semiconductor laser single tube (11) is emitted, the fast axis and the slow axis of the light beam are collimated by a fast axis collimator (12) and a slow axis collimator (13) respectively, so that the divergence angles in both directions are smaller than a preset threshold angle.
6. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: One of the two reference semiconductor lasers in the comparison and analysis module is in a light-emitting state, and its light beams sequentially pass through two semi-transparent and semi-reflective mirrors (14) with a reflectivity of 1% and a full-reflective mirror (15) with a reflectivity of 100%, and the three reflected light beams are respectively received by an infrared camera (16), a wavelength detector (17), a laser energy meter, and a photoelectric probe (18); the other is in a non-light-emitting state, and its light beams sequentially pass through the full-reflective mirror (15) with a reflectivity of 100% and are received by the infrared camera (16); The infrared camera superimposes the light spots of two reference semiconductor lasers to eliminate the influence of ambient light, and then compares and analyzes them with multiple lasers to be tested. When the collected output characteristics of the laser to be tested and the reference error are within the preset reference range, it means that the laser meets the finished product standards, otherwise it is waste.
7. The fast batch detection system for semiconductor laser output characteristics according to claim 6, characterized in that ,The central axis of each optical lens coincides with the central axis of the light beam, and is coated with an anti-reflection film corresponding to the output wavelength of the semiconductor laser unit.
8. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: Except for the semiconductor laser pitch azimuth adjuster, the other optical components are fixed at the optimal position and angle; The optimal position and angle are specifically as follows: using a helium-neon laser for indication to perform coaxial adjustment, the semi-transparent and semi-reflective mirror (14), the full-reflective mirror (15), the infrared camera (16), the wavelength detector (17) and the photoelectric probe (18) are adjusted to the same level to ensure the accuracy of the optical path.
9. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: It also includes an alarm module. When the detection result of the batch detection module is unqualified, a red light is turned on, the mechanical control system is suspended, and an audible and visual alarm is issued.
10. The fast batch detection system for semiconductor laser output characteristics according to claim 1, characterized in that: The azimuth adjustment module can also adjust the angle of the semiconductor laser pitch azimuth adjuster in real time according to the energy characteristic parameters of the output light beam, including the following steps: Step 1: The laser energy meter receives the energy signal of the semiconductor laser to be measured; Step 2: The semiconductor laser pitch azimuth regulator adjusts the angle, and the laser energy meter monitors the energy signal of the semiconductor laser to be tested in real time; Step 3: When the energy signal of the semiconductor laser to be measured received by the laser energy meter is the largest, it is the optimal angle of the semiconductor laser pitch azimuth adjuster.