Dry burning prevention method, atomization driving circuit, electronic atomization device and related device

Abstract

The invention provides an anti-dry-burning method, an atomization driving circuit, an electronic atomization device and a related device. The anti-dry-burning method comprises the steps that a first temperature change parameter corresponding to an atomization element in a smoking time period is obtained, and a first over-temperature threshold value corresponding to the atomization element is obtained; wherein the first temperature change parameter is related to the temperature change trend of the atomization element in the smoking time period; and in response to the condition that the first temperature change parameter is greater than the first over-temperature threshold value in the smoking time period, performing corresponding operations, such as reducing / stopping power output to the atomization element, giving an alarm and the like, so that the problem of dry burning is avoided, and the user experience is improved.

Description

Technical Field

[0001] The present application relates to the field of atomization technology, and in particular to an anti-dry burning method, an atomization drive circuit, an electronic atomization device and related devices. Background Art

[0002] An electronic atomization device generally includes an atomizer and a power source, wherein the power source is used to provide electrical energy to the atomizer, and the atomizer is used to heat the atomization medium to generate an aerosol that can be used by the user. Among them, the electronic atomization device can be widely used in the fields of medical treatment, beauty, leisure smoking, etc.

[0003] However, during the atomization process, the existing low-cost electronic atomization devices do not have detection devices such as temperature sensors. As a result, the temperature inside the atomizer may be too high and cannot be effectively detected due to reasons such as poor liquid conduction of the atomization medium and exhaustion of the atomization medium. This can easily damage and decompose high-temperature-sensitive accessories in the atomizer and impurities in the atomization medium, generating odors and harmful gases, affecting the user experience. Summary of the invention

[0004] The present application provides a dry burning prevention method, an atomization drive circuit, an electronic atomization device and related devices, which can solve the problem that low-cost electronic atomization devices cannot effectively detect excessive temperatures in the atomizer.

[0005] To solve the above problem, a technical solution provided in the present application is: to provide a method for preventing dry burning for an electronic atomization device, comprising: obtaining a first temperature change parameter corresponding to an atomization element during a puffing time period, and obtaining a first over-temperature threshold corresponding to the atomization element; wherein the first temperature change parameter is related to the temperature change trend of the atomization element during the puffing time period; in response to the first temperature change parameter being greater than the first over-temperature threshold during the puffing time period, performing corresponding operations.

[0006] In one embodiment, the obtaining of the first temperature change parameter corresponding to the atomizing element in the puffing time period includes: obtaining a first detection value corresponding to the atomizing element at a first moment in the current puffing time period, and a second detection value corresponding to the atomizing element at a second moment in the current puffing time period, and determining a first detection reference value corresponding to the atomizing element in the current puffing time period based on the first detection value and the second detection value; determining the first temperature change parameter corresponding to the atomizing element in the current puffing time period based on the first detection reference value and the second detection reference value corresponding to the atomizing element obtained in a puffing learning time period; wherein the puffing learning time period is located before the puffing time period.

[0007] In one embodiment, obtaining the second detection reference value corresponding to the atomizer element within the puff learning time period includes: in response to a first number of reference puff time periods within the puff learning time period being greater than a first threshold; obtaining a first number of second detection reference values ​​corresponding to the atomizer element within the first number of reference puff time periods; selecting a second number of second detection reference values ​​with larger values ​​from the first number of second detection reference values ​​and calculating a first average value, and using the first average value as the second detection reference value corresponding to the atomizer element within the puff learning time period; wherein the second number is less than or equal to the first number.

[0008] In one embodiment, obtaining the second detection reference value corresponding to the atomizing element in each of the reference puff time periods includes: obtaining a third detection value corresponding to the atomizing element at a third moment in each of the reference puff time periods, and obtaining a fourth detection value corresponding to the atomizing element at a fourth moment in each of the reference puff time periods, and determining the second detection reference value corresponding to the atomizing element in each of the reference puff time periods based on the third detection value and the fourth detection value.

[0009] In one embodiment, before obtaining the first temperature change parameter corresponding to the atomizing element during the puffing time period and obtaining the first over-temperature threshold corresponding to the atomizing element, it also includes: detecting whether there is an atomizing medium in the atomizer in the electronic atomizing device; and performing corresponding operations in response to the absence of an atomizing medium in the atomizer.

[0010] In one embodiment, the detecting whether there is atomizing medium in the atomizer in the electronic atomization device includes: obtaining a fifth detection value corresponding to a fifth moment in a puff trigger time period, and a sixth detection value corresponding to a sixth moment in the puff trigger time period; wherein the puff trigger time period is before the puff learning time period; determining the first over-temperature judgment parameter corresponding to the atomizing element in the puff trigger time period based on the fifth detection value and the sixth detection value; in response to the first over-temperature judgment parameter corresponding to the atomizing element being greater than a second over-temperature threshold value in the puff trigger time period, determining that there is no atomizing medium in the atomizer.

[0011] In one embodiment, the detecting whether there is atomizing medium in the atomizer in the electronic atomization device also includes: in response to the presence of atomizing medium in the atomizer and the number of the first number of the reference puffing time periods being less than or equal to a first threshold; determining whether a second temperature change parameter corresponding to the atomizing element during the puffing learning time period is greater than the first over-temperature threshold, and determining whether a second over-temperature judgment parameter corresponding to the atomizing element during the puffing learning time period is greater than a third over-temperature threshold; in response to the second temperature change parameter corresponding to the atomizing element during the puffing learning time period being greater than the first over-temperature threshold, and the second over-temperature judgment parameter corresponding to the atomizing element during the puffing learning time period being greater than the third over-temperature threshold; determining that there is atomizing medium in the atomizer during the puffing learning time period and it has been consumed.

[0012] In one embodiment, determining the second temperature change parameter corresponding to the atomizing element during the puff learning time period includes: obtaining a first number of third detection reference values ​​corresponding to the atomizing element during a first number of reference puffing time periods during the puff learning time period; selecting a third detection reference value with the largest value among the first number of third detection reference values ​​as the third detection reference value corresponding to the atomizing element during the puff learning time period; obtaining a seventh detection value corresponding to the atomizing element at the seventh moment during the current reference puffing time period, and an eighth detection value corresponding to the atomizing element at the eighth moment during the current reference puffing time period, and determining a fourth detection reference value corresponding to the atomizing element during the current puff learning time period based on the seventh detection value and the eighth detection value; determining the second temperature change parameter corresponding to the atomizing element during the puff learning time period based on the third detection reference value and the fourth detection reference value.

[0013] In one embodiment, determining the second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period includes: obtaining the temperature corresponding to the atomizing element at different times within the puff learning time period and within the reference puff time period; determining the second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period based on the temperature corresponding to the atomizing element at different times.

[0014] In one embodiment, after the second detection reference value corresponding to the atomizer element is obtained during the puff learning time period, the method further includes: taking the second detection reference value corresponding to the atomizer element obtained during the puff learning time period as the current second detection reference value; in response to the difference between the initial resistance value of the atomizer element sampled during the current puff time period and the minimum resistance value of the atomizer element obtained being greater than a second threshold, calculating a second average value of the current second detection reference value and the second detection reference value corresponding to the atomizer element during the current puff time period, and taking the second average value as the second detection reference value for the next puff time period.

[0015] In one embodiment, before using the electronic atomization device, the method further includes: detecting whether the connection between an atomizer in the electronic atomization device and a power supply is reliable; in response to the reliable connection between the atomizer and the power supply, obtaining the first temperature change parameter corresponding to the atomization element during the puffing time period.

[0016] In one embodiment, detecting whether the connection between the atomizer in the electronic atomization device and the power supply is reliable includes: connecting the atomizer to the power supply, sampling the resistance of the atomizing element in the atomizer, thereby obtaining a detection value corresponding to the resistance of the atomizing element; calculating a third average value of a third number of detection values ​​obtained, and in response to the difference between the third number of detection values ​​obtained and the third average value being less than or equal to a third threshold, determining that the connection between the atomizer and the power supply is reliable.

[0017] In one embodiment, in response to the difference between at least one of the third number of detection values ​​obtained for the first time and the third average value being greater than the third threshold, and the number of times that the difference between at least one of the third number of detection values ​​obtained each time subsequently and the corresponding third average value is greater than the third threshold is greater than a fourth threshold, it is determined that the connection between the atomizer and the power supply is unreliable.

[0018] In one embodiment, before sampling the resistance of the atomizing element in the atomizer, the method further includes: after connecting the atomizer to the power supply, waiting for a first preset time, and sampling the resistance of the atomizing element in the atomizer after the first preset time.

[0019] To solve the above problems, another technical solution provided by the present application is: to provide an atomization driving circuit for an electronic atomization device, including: a driving module, including an atomization element, and the driving module is used to heat the atomization medium; a control module, connected to the driving module, used to obtain a first temperature change parameter corresponding to the atomization element during a puffing time period, and to obtain a first over-temperature threshold corresponding to the atomization element; wherein the control module also performs corresponding operations in response to the first temperature change parameter being greater than the first over-temperature threshold during the puffing time period.

[0020] In one embodiment, the control module includes an acquisition module and a control chip; the acquisition module is used to acquire a first detection value corresponding to the atomizer element at a first moment in the current puff time period, and a second detection value corresponding to the atomizer element at a second moment in the current puff time period, and the control chip determines a first detection reference value corresponding to the atomizer element in the current puff time period based on the first detection value and the second detection value; the acquisition module is also used to acquire a third detection value corresponding to the atomizer element at a third moment in each reference puff time period, and obtain a fourth detection value corresponding to the atomizer element at a fourth moment in each reference puff time period, and the control chip determines the second detection reference value corresponding to the atomizer element in each reference puff time period based on the third detection value and the fourth detection value; the control chip also determines the first temperature change parameter corresponding to the atomizer element in the puff time period based on the first detection reference value and the second detection reference value corresponding to the atomizer element in the puff learning time period, wherein the puff learning time period is located before the puff time period, and the second detection reference value corresponding to the atomizer element in the puff learning time period is determined based on the second detection reference value corresponding to the atomizer element in each reference puff time period.

[0021] To solve the above problems, another technical solution provided by the present application is: to provide an electronic atomization device, including a memory and a processor, the memory storing program instructions, and the processor calling the program instructions from the memory to execute any one of the anti-dry burning methods described.

[0022] To solve the above problems, another technical solution provided by the present application is: providing a computer-readable storage medium, wherein the computer-readable storage medium is used to store a control program, and when the control program is executed by a processor, it is used to implement the anti-dry burning method as described in any one of the items.

[0023] Different from the prior art, the beneficial effect of the present application is that the anti-dry burning method provided by the present application obtains a first temperature change parameter corresponding to the atomizing element during the puffing time period, and obtains a first over-temperature threshold corresponding to the atomizing element; wherein the first temperature change parameter is related to the temperature change trend of the atomizing element during the puffing time period; in response to the first temperature change parameter being greater than the first over-temperature threshold during the puffing time period, it is determined that the atomizing element has a tendency to dry burn, and corresponding operations are performed, such as reducing / stopping the power output to the atomizing element, and issuing an alarm, etc., thereby avoiding the dry burning problem of the atomizing element and improving the user experience. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work, among which:

[0025] Figure 1 A schematic diagram of a process flow of an embodiment of the anti-dry burning method provided in the present application;

[0026] Figure 2 for Figure 1 A schematic diagram of a flow chart of an embodiment of obtaining a first temperature change parameter corresponding to an atomizing element during a puffing period in step S1;

[0027] Figure 3 for Figure 2 A flowchart of an embodiment of obtaining a second detection reference value corresponding to the atomizing element within the puff learning time period in step S12;

[0028] Figure 4 for Figure 1 A schematic diagram of a flow chart of an embodiment before step S1;

[0029] Figure 5 for Figure 4 A schematic diagram of a flow chart of an embodiment of determining whether the atomizer is an empty atomizer in step S01;

[0030] Figure 6 for Figure 5 A flow chart of an embodiment of determining a second temperature change parameter corresponding to the atomizing element within the puff learning time period in step S014;

[0031] Figure 7 for Figure 5 A flowchart of an embodiment of determining a second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period in step S014;

[0032] Figure 8 for Figure 2 A flow chart of an embodiment after obtaining a second detection reference value corresponding to the atomizing element within the puff learning time period;

[0033] Fig. 9 A schematic diagram of a process flow of an embodiment before using the electronic atomization device;

[0034] Fig.10 for Fig. 9 Schematic diagram of a flow chart of an embodiment of step S001 in FIG.

[0035] Fig.11 A structural block diagram of an embodiment of the atomization drive circuit provided by the present application;

[0036] Fig.12 A structural block diagram of another embodiment of the atomization drive circuit provided by the present application;

[0037] Fig.13 A schematic diagram of the circuit structure of an embodiment of the atomization drive circuit provided in the present application;

[0038] Fig.14 A schematic diagram of the structure of an embodiment of the electronic atomization device provided in this application;

[0039] Fig.15 A module diagram of an embodiment of a computer-readable storage medium provided in the present application. DETAILED DESCRIPTION

[0040] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0041] The terms "first", "second", "third" and "fourth" in this application are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, the features defined as "first", "second", "third" and "fourth" can explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. All directional indications in the embodiments of the present application (such as up, down, first direction, second direction, etc.) are only used to explain the relative position relationship, movement, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication also changes accordingly. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions.

[0042] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0043] In order to improve their market competitiveness, some existing manufacturers have provided a low-cost electronic atomization device. For example, by removing detection elements such as temperature sensors in the device, the device cost is saved to a certain extent, thereby reducing the selling price, which is conducive to improving market competitiveness.

[0044] However, since the temperature sensors and other detection elements have been removed from the above-mentioned low-cost electronic atomization devices, the temperature inside the atomizer may be too high due to poor conduction of the atomization medium, exhaustion of the atomization medium, etc., and cannot be effectively detected. This may easily damage and decompose the high-temperature-sensitive accessories in the atomizer and the impurities in the atomization medium, generating odors and harmful gases, and affecting the user experience.

[0045] To solve this problem, the present application provides an anti-dry-burn method for an electronic atomization device, which can achieve anti-dry-burn detection of the electronic atomization device without setting up detection elements such as temperature sensors in the device, thereby improving the user experience.

[0046] The present application is described in detail below with reference to the accompanying drawings and embodiments.

[0047] See also Figure 1 , Figure 1 This is a flow chart of an embodiment of the anti-dry burning method provided by the present application. The anti-dry burning method provided by the present application includes:

[0048] Step S1: obtaining a first temperature variation parameter ΔdK1 corresponding to the atomizing element during a puffing period, and obtaining a first over-temperature threshold ΔdKx corresponding to the atomizing element.

[0049] Specifically, the electronic atomization device generally includes an atomizer and a power supply. The power supply is used to provide electrical energy to the atomizer. An atomizing element is provided in the atomizer. The atomizing element is used to heat the atomizing medium stored in the atomizer under power-on conditions to generate an aerosol that can be used by the user.

[0050] Among them, one puffing process is characterized by a puffing time period, the first temperature change parameter ΔdK1 is related to the temperature change trend of the atomizing element during the puffing time period, and the first over-temperature threshold ΔdKx is a limit value for judging whether the atomizing element is dry-burned (over-temperature) during the puffing time period. The first over-temperature threshold ΔdKx can be obtained in advance through experiments.

[0051] Step S2: In response to the first temperature change parameter △ dK1 is greater than the first over-temperature threshold ΔdKx, and corresponding operations are performed.

[0052] Specifically, in response to the first temperature change parameter △ If dK1 is greater than the first over-temperature threshold ΔdKx, it means that during the puffing period, the atomizer has a tendency to dry burn, or has already dry burned, so the atomizer needs to be operated accordingly, for example, reducing the output power of the power supply to the atomizer, stopping the power output of the power supply to the atomizer. At the same time, an alarm can also be issued, and the alarm methods include but are not limited to sound and light alarms, vibration alarms, etc., to remind the user, so as to avoid dry burning (over-temperature) of the atomizer, which may cause high temperature-resistant accessories in the atomizer and impurities in the atomization medium to be damaged and cracked by high temperature, produce odor and harmful gases, and affect the user experience.

[0053] Of course, in response to the first temperature change parameter △ If dK1 is less than or equal to the first over-temperature threshold ΔdKx, it means that during the puffing time period, the atomizing element has no tendency to dry burn and can be atomized normally, and the power supply can output power to the atomizing element normally.

[0054] See also Figure 2 , Figure 2 for Figure 1 A flow chart of an embodiment of obtaining a first temperature change parameter corresponding to the atomizing element during the puffing time period in step S1. In one embodiment, obtaining a first temperature change parameter corresponding to the atomizing element during the puffing time period △ dK1, including:

[0055] Step S11: Obtain a first detection value ADC1 corresponding to the atomizer element at the first moment in the current puff time period, and a second detection value ADC2 corresponding to the atomizer element at the second moment in the current puff time period, and determine a first detection reference value dK1 corresponding to the atomizer element in the current puff time period based on the first detection value ADC1 and the second detection value ADC2.

[0056] Specifically, in the circuit system composed of the atomizer and the power supply, the circuit system is designed with a resistance detection circuit, and the resistance calculation of the atomizer element satisfies Rx=R0+K*ADC, wherein Rx is the current resistance of the atomizer element, R0 is the initial resistance of the atomizer element, K is a coefficient determined by the actual circuit, the value range and type of R0 and K are not limited, and ADC is the detection value obtained when the resistance is sampled.

[0057] In addition, according to the TCR (temperature coefficient of resistance) characteristics of the resistor, during a puff period, the resistance of the atomizer element satisfies the following resistance calculation:

[0058] Current resistance = (current temperature - initial temperature) * initial resistance * TCR coefficient + initial resistance.

[0059] Among them, assuming that the current resistance is Rx, the current temperature is Tx, the initial resistance is R0, and the initial temperature is T0, the conversion is as follows:

[0060] Rx=(Tx-T0)*R0*TCR+R0, and Tx=(Rx-R0) / TCR / R0+T0.

[0061] Therefore, we obtain Rx=R0+K*ADC=(Tx-T0)*R0*TCR+R0.

[0062] Based on the above calculation principle, for example, in the current puffing time period, the resistance value at the first moment t1 is R1, the temperature is T1, and the corresponding detection value ADC is the first detection value ADC1, and the resistance value at the second moment t2 is R2, the temperature is T2, and the corresponding detection value ADC is the second detection value ADC2, wherein the second moment t2 is located after the first moment t1.

[0063] Then according to Rx=R0+K*ADCx=(Tx-T0)*R0*TCR+R0, we can get:

[0064] Expression 1: R1 = (T1 - T0) * R0 * TCR + R0 = R0 + K * ADC1;

[0065] Expression 2: R2 = (T2 - T0) * R0 * TCR + R0 = R0 + K * ADC2;

[0066] The first detection reference value dK1 is obtained by subtracting Expression 2 from Expression 1:

[0067] Expression 3: dK1=R2-R1=(T2-T1)*R0*TCR=K*(ADC2-ADC1).

[0068] Among them, based on Expression 3, it can be obtained that as long as the first detection value ADC1 corresponding to the atomizer element at the first moment t1 in the current puff time period and the second detection value ADC2 corresponding to the atomizer element at the second moment t2 in the current puff time period are obtained, the first detection reference value dK1 corresponding to the atomizer element in the current puff time period can be determined based on the first detection value ADC1 and the second detection value ADC2.

[0069] Step S12: Determine the first temperature change parameter corresponding to the atomizer element in the current puffing time period based on the first detection reference value dK1 and the second detection reference value dK2 corresponding to the atomizer element obtained during the puffing learning time period. △ dK1.

[0070] The second detection reference value dK2 has a learning process. Specifically, the user's multiple puffs are divided into at least two stages: a puff learning period and a puff period. The puff learning period is located before the puff period, and is used to obtain the second detection reference value dK2.

[0071] See also Figure 3 , Figure 3 for Figure 2 A flow chart of an embodiment of obtaining a second detection reference value corresponding to the atomizing element within the puff learning time period in step S12. In one embodiment, obtaining the second detection reference value dK2 corresponding to the atomizing element within the puff learning time period includes:

[0072] Step 121: in response to a first number of reference puffing time periods within the puffing learning time period being greater than a first threshold value X1, a first number of second detection reference values ​​dK2 corresponding to the atomizing element within the first number of reference puffing time periods are obtained.

[0073] Specifically, the puff learning time period includes a first number of reference puff time periods, and each reference puff time period represents a puff process. It can be understood that if the number of the first number of reference puff time periods in the puff learning time period is less than or equal to the set first threshold value X1, it means that the learning specimens in the puff learning time period cannot achieve the learning purpose; if the number of the first number of reference puff time periods in the puff learning time period is greater than the set first threshold value X1, it means that the learning specimens in the puff learning time period can achieve the learning purpose, then the first number of second detection reference values ​​dK2 corresponding to the atomizing element in the first number of reference puff time periods are obtained to determine the second detection reference value dK2 corresponding to the atomizing element in the puff learning time period.

[0074] In one embodiment, if the duration of the reference puff time period is shorter than the preset duration, the reference puff time period is considered invalid and the learning purpose cannot be achieved.

[0075] In one embodiment, the method of determining the second detection reference value dK2 corresponding to the atomizing element during the puff learning period is substantially the same as the method of obtaining the first detection reference value dK1 corresponding to the atomizing element during the puff period, and specifically includes:

[0076] The third detection value ADC3 corresponding to the atomizer element at the third moment in each reference puff time period is obtained, and the fourth detection value ADC4 corresponding to the atomizer element at the fourth moment in each reference puff time period is obtained, and the second detection reference value dK2 corresponding to the atomizer element in each reference puff time period is determined based on the third detection value ADC3 and the fourth detection value ADC4.

[0077] It should be noted that, in this step, each reference puffing time period is a valid puffing time period.

[0078] Taking a reference puffing time period as an example, within the reference puffing time period, the resistance value at the third moment t3 is R3, the temperature is T3, and the corresponding detection value ADC is the third detection value ADC3, and the resistance value at the fourth moment t4 is R4, the temperature is T4, and the corresponding detection value ADC is the fourth detection value ADC4. The fourth moment t4 is located after the third moment t3.

[0079] Then according to Rx=R0+K*ADCx=(Tx-T0)*R0*TCR+R0, we can get:

[0080] Expression 4: R3 = (T3 - T0) * R0 * TCR + R0 = R0 + K * ADC3;

[0081] Expression 5: R4 = (T4 - T0) * R0 * TCR + R0 = R0 + K * ADC4;

[0082] The second detection reference value dK2 is obtained by substituting Expression 5 for Expression 4:

[0083] Expression 6: dK2=R4-R3=(T4-T3)*R0*TCR=K*(ADC4-ADC3).

[0084] Among them, based on Expression 6, it can be obtained that as long as the third detection value ADC3 corresponding to the atomizer element at the third moment t3 in each reference puff time period and the fourth detection value ADC4 corresponding to the atomizer element at the fourth moment t4 in each reference puff time period are obtained, the second detection reference value dK2 corresponding to the atomizer element in each reference puff time period can be determined based on the third detection value ADC3 and the fourth detection value ADC4.

[0085] Step 122: Select a second number of second detection reference values ​​dK2 with larger values ​​from the first number of second detection reference values ​​dK2 and calculate a first average value, and use the first average value as the second detection reference value dK2; wherein the second number is less than or equal to the first number.

[0086] Specifically, the first number of second detection reference values ​​dK2 obtained are arranged from small to large or from large to small, and then the largest second number of second detection reference values ​​dK2 are selected in turn, and the second number of second detection reference values ​​dK2 are averaged as the first average value, and the first average value is used as the second detection reference value dK2 corresponding to the atomizing element during the puff learning time period.

[0087] Then, based on the first detection reference value dK1 corresponding to the atomizer element in the current puffing time period and the second detection reference value dK2 corresponding to the atomizer element in the puffing learning time period, the first temperature change parameter corresponding to the atomizer element in the current puffing time period is determined. △ dK1.

[0088] Specifically, the first temperature change parameter △ dK1 is obtained from formula 7:

[0089] Formula 7: ΔdK1=dK1 / dK2=(ADC2-ADC1) / (ADC4-ADC3)=(T2-T1) / (T4-T3).

[0090] Based on expression 7, we can get the first temperature change parameter: △ The value of dK1 has nothing to do with the TCR value of the atomizer element, has nothing to do with the initial resistance of the atomizer element, is not affected by the sampling error caused by the resistance detection circuit, and is not affected by the system error formed by the power supply and the atomizer. It only needs the resistance value to change to meet the changes in ADC acquisition.

[0091] See also Figure 4 , Figure 4 for Figure 1 The flowchart of an embodiment before step S1 in FIG. 1 is a schematic diagram of a flow chart of an embodiment before step S1. In one embodiment, before step S1, the process further includes:

[0092] Step S01: Detect whether there is atomizing medium in the atomizer of the electronic atomization device.

[0093] Specifically, before the puffing time period, over-temperature may occur in two situations: one is that the atomizer itself is an empty atomizer without liquid injection, and the other is that there is atomizing medium in the atomizer but it is consumed before the end of the puffing learning time period.

[0094] Step S02: In response to the absence of atomizing medium in the atomizer, perform corresponding operations.

[0095] In response to the atomizer itself being an empty atomizer without liquid injection, or being completely consumed before the end of the atomized medium suction learning period, the atomizer is operated accordingly, for example, reducing the output power of the power supply to the atomizer, stopping the power output of the power supply to the atomizer. At the same time, an alarm may also be issued, and the alarm methods include but are not limited to sound and light alarms, vibration alarms, etc., to remind the user, so as to avoid dry burning of the atomizer, which may cause high temperature-resistant accessories in the atomizer and impurities in the atomized medium to be damaged and cracked by high temperature, produce odor and harmful gases, and affect the user's experience.

[0096] See also Figure 5 , Figure 5 for Figure 4 FIG. 1 is a flow chart of an embodiment of determining whether the atomizer is an empty atomizer in step S01. In one embodiment, the step of determining whether the atomizer is an empty atomizer includes:

[0097] Step S011: obtaining a fifth detection value ADC5 corresponding to a fifth moment in the puff triggering time period, and a sixth detection value ADC6 corresponding to a sixth moment in the puff triggering time period.

[0098] The puff trigger time period is before the reference puff time period, for example, the time period when the user first puffs the atomizer. Then, the fifth detection value ADC5 corresponding to the fifth moment t5 in the puff trigger time period and the sixth detection value ADC6 corresponding to the sixth moment t6 in the puff trigger time period are obtained. The fifth moment t5 is prior to the sixth moment t6.

[0099] Step S012: Determine the first over-temperature judgment parameter corresponding to the atomizing element within the puff triggering time period based on the fifth detection value ADC5 and the sixth detection value ADC6 △ dK-1.

[0100] Specifically, the first over-temperature judgment parameter is obtained based on formula 8: △ dK-1:

[0101] Formula 8: ΔdK-1=ADC6 / ADC5

[0102] Step S013: In response to the first over-temperature judgment parameter corresponding to the atomizing element during the puff triggering time period △ dK-1 is greater than the second over-temperature threshold ΔdKy, and it is determined that there is no atomizing medium in the atomizer.

[0103] Specifically, the second over-temperature threshold ΔdKy is a fixed value, which is used to determine whether the atomizer is an empty atomizer within the puff triggering time period, and can be determined through experiments.

[0104] Among them, if within the suction trigger time period, the first over-temperature judgment parameter corresponding to the atomizer element△ If dK-1 is greater than the second over-temperature threshold ΔdKy, it is determined that there is no atomizing medium in the atomizer and it is an empty atomizer. △ If dK-1 is less than or equal to the second over-temperature threshold ΔdKy, it is determined that there is atomizing medium in the atomizer and the atomizer is not empty.

[0105] On the basis of determining that the atomizer is not an empty atomizer, it is also necessary to determine whether the atomizing medium in the atomizer is completely consumed before the end of the puff learning time period, that is, to determine whether the atomizer is an atomizer in which the atomizing medium is about to be consumed. This step includes:

[0106] Step S014: In response to the presence of atomized medium in the atomizer and the number of the first number of reference puffing time periods being less than or equal to the first threshold value X1; determining a second temperature change parameter corresponding to the atomizing element in the puffing learning time period △ Whether dK2 is greater than the first over-temperature threshold ΔdKx, and determining the second over-temperature judgment parameter corresponding to the atomizer element during the puff learning period △ Whether dK-2 is greater than the third over-temperature threshold.

[0107] Specifically, if the number of the first number of reference puffing time periods within the puffing learning time period is less than or equal to the first threshold value X1, the first number of reference puffing time periods is not sufficient to obtain the temperature change trend of the atomizer element during the puffing learning time period due to insufficient samples. Therefore, in this embodiment, determining whether dry burning occurs during the puffing learning time period requires satisfying two conditions. First, determining the second temperature change parameter corresponding to the atomizer element during the puffing learning time period. △ Whether dK2 is greater than the first over-temperature threshold ΔdKx, and secondly, determining the second over-temperature judgment parameter corresponding to the atomizer element during the puff learning period △ Whether dK-2 is greater than the third over-temperature threshold.

[0108] See also Figure 6 , Figure 6 for Figure 5 A flow chart of an embodiment of determining a second temperature change parameter corresponding to the atomizing element during the puff learning time period in step S014. In one embodiment, determining a second temperature change parameter corresponding to the atomizing element during the puff learning time period △ dK2 includes:

[0109] Step S0141: obtaining a first number of third detection reference values ​​dK3 corresponding to a first number of reference puffing time periods of the atomizing element within the puffing learning time period.

[0110] Specifically, the third detection reference value dK3 corresponding to the atomizing element in each reference puffing time period is obtained in the same manner as the aforementioned second detection reference value dK2, which will not be elaborated herein.

[0111] Step S0142: selecting a third detection reference value dK3 with the largest value from the first number of third detection reference values ​​dK3 as the third detection reference value dK3 corresponding to the atomizing element during the puff learning time period.

[0112] Specifically, the first number of third detection reference values ​​dK3 obtained are arranged from small to large or from large to small, and then a third detection reference value dK3 with the largest value is selected as the third detection reference value dK3 corresponding to the atomizing element during the puff learning time period.

[0113] Step S0143: Obtain the seventh detection value ADC7 corresponding to the atomizer element at the seventh moment in the current reference puff time period, and the eighth detection value ADC8 corresponding to the atomizer element at the eighth moment in the current reference puff time period, and determine the fourth detection reference value dK4 corresponding to the atomizer element in the current puff learning time period based on the seventh detection value ADC7 and the eighth detection value ADC8.

[0114] Specifically, the seventh detection value ADC7 corresponding to the seventh moment t7 in the current reference puff time period and the eighth detection value ADC8 corresponding to the eighth moment t8 in the puff trigger time period are obtained. The seventh moment t7 is prior to the eighth moment t8.

[0115] The fourth detection reference value dK4 is obtained according to formula 9:

[0116] Expression 9: dK4 = K*(ADC8-ADC7).

[0117] Step S0144: Determine the second temperature change parameter corresponding to the atomizing element during the puff learning period based on the third detection reference value dK3 and the fourth detection reference value dK4 △ dK2.

[0118] Specifically, the second temperature change parameter is obtained according to formula 10: △ dK2:

[0119] Formula 10: ΔdK2=dK4 / dK3.

[0120] Among them, the second temperature change parameter △ dK2 is related to the temperature trend of the atomizing element during the puff learning period.

[0121] See also Figure 7 , Figure 7 for Figure 5A flow chart of an embodiment of determining a second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period in step S014. In one embodiment, determining a second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period △ The steps of dK-2 include:

[0122] Step S0145: obtaining the corresponding temperatures of the atomizing element at different times within a reference puffing time period within a puffing learning time period.

[0123] For example, within a reference puffing time period, the temperature of the atomizing element corresponding to the ninth time t9, the temperature of the atomizing element corresponding to the tenth time t10, the temperature of the atomizing element corresponding to the eleventh time t11, and the temperature of the atomizing element corresponding to the twelfth time t12 are obtained.

[0124] Among them, the ninth moment t9 is earlier than the tenth moment t10, the tenth moment t10 is earlier than the eleventh moment t11, and the eleventh moment t11 ​​is earlier than the twelfth moment t12.

[0125] The temperature of the atomizing element at a corresponding moment can be determined according to the acquired detection value ADC, initial resistance value, TCR coefficient, etc. of the atomizing element at the corresponding moment.

[0126] Step S0146: Determine the second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period based on the temperature corresponding to the atomizing element at different times △ dK-2.

[0127] Specifically, the second over-temperature judgment parameter is obtained according to formula 11: △ dK-2:

[0128] ΔdK-2=(T12-T11) / (T10-T9).

[0129] Step S015: responding to the second temperature change parameter corresponding to the atomizing element during the puff learning period △ dK2 is greater than the first over-temperature threshold ΔdKx, and the second over-temperature judgment parameter corresponding to the atomizer element during the puff learning period △ dK-2 is greater than the third over-temperature threshold; it is determined that there is atomizing medium in the atomizer during the puff learning time period and it is completely consumed.

[0130] See also Figure 8 , Figure 8 for Figure 2 A flow chart of an embodiment after obtaining the second detection reference value dK2 corresponding to the atomizer element in the puff learning time period, in one embodiment, after obtaining the second detection reference value dK2 corresponding to the atomizer element in the puff learning time period, further comprising:

[0131] Step S123: taking the second detection reference value dK2 corresponding to the atomizing element obtained during the puff learning time period as the current second detection reference value dK2.

[0132] For example, the second detection reference value dK2 corresponding to the atomizing element obtained during the puff learning period is used as the second detection reference value dK2 during the first puff period.

[0133] Step S124: In response to the difference between the initial resistance value of the atomizing element sampled and the minimum resistance value of the atomizing element obtained during the current puffing time period being greater than the second threshold value X2, a second average value of the current second detection reference value dK2 and the second detection reference value dK2 corresponding to the atomizing element during the current puffing time period is calculated, and the second average value is used as the second detection reference value dK2 for the next puffing time period.

[0134] Specifically, the minimum resistance of the atomizing element is obtained, and after the second detection reference value dK2 is successfully obtained for the first time, in a subsequent puffing time period, when the initial resistance of the atomizing element is a certain value smaller than the previously obtained minimum resistance, the second average value of the current second detection reference value dK2 and the second detection reference value dK2 obtained during this puffing time period is calculated, and the second average value is used as the second detection reference value dK2 for the next puffing time period, and the initial resistance of the atomizing element in this puffing time period is updated to the latest minimum resistance, thereby realizing dynamic correction of the second detection reference value dK2.

[0135] See also Fig. 9 , Fig. 9 This is a flow chart of an embodiment before using the electronic atomization device. In one embodiment, before using the electronic atomization device, for example, before the user triggers the puffing behavior, it also includes:

[0136] Step S001: Detect whether the connection between the atomizer and the power supply in the electronic atomization device is reliable.

[0137] See also Fig.10 , Fig.10 for Fig. 9 FIG. 1 is a flow chart of an embodiment of step S001 in FIG. 1 . In one embodiment, step S001 includes:

[0138] Step S0011: Connect the atomizer to a power source, sample the resistance of the atomizing element in the atomizer, and obtain a detection value ADC corresponding to the resistance of the atomizing element.

[0139] Specifically, after the atomizer is connected to the power supply, the resistance of the atomizing element is sampled according to a preset acquisition frequency, so as to obtain detection values ​​ADC corresponding to the resistance values ​​of multiple atomizing elements according to the preset frequency.

[0140] Step S0012: Calculate a third average value of the third number of detection values ​​ADC obtained, and in response to the difference between the third number of detection values ​​ADC obtained and the third average value being less than or equal to the third threshold value X3, determine that the atomizer is reliably connected to the power supply.

[0141] Specifically, after the detection values ​​ADC corresponding to the resistance values ​​of the plurality of atomizing elements are obtained, a third average value is calculated for the third number of detection values ​​ADC obtained last.

[0142] If the differences between the acquired third number of detection values ​​ADC and the third average value are all less than or equal to the third threshold value X3, it is determined that the atomizer is reliably connected to the power supply.

[0143] Step S002: In response to the atomizer being reliably connected to the power supply, obtaining a first temperature change parameter corresponding to the atomizing element during the puffing period △ dK1.

[0144] In one embodiment, to avoid system errors, the embodiment further includes: in response to the difference between at least one of the third number of detection values ​​ADC acquired for the first time and the third average value being greater than the third threshold value X3, and the number of times that the difference between at least one of the third number of detection values ​​ADC acquired each time subsequently and the third average value corresponding to it is greater than the third threshold value X3 is greater than the fourth threshold value X4, it is determined that the connection between the atomizer and the power supply is unreliable.

[0145] Specifically, if the difference between any one of the third number of detection values ​​ADC obtained for the first time and the third average value calculated therefrom is greater than the third threshold value X3, the detection values ​​ADC obtained for subsequent multiple times are grouped into a third number of consecutive detection values ​​ADC, and a third average value corresponding to each group is calculated. If the difference between at least one detection value ADC in each group and the third average value corresponding thereto is greater than the third threshold value X3, and the number of groups of the third number of detection values ​​ADC exceeds the fourth threshold value X4, it is determined that the connection between the atomizer and the power supply is unreliable. Then, the subsequent anti-dry burning detection cannot be performed, and the user needs to reinstall the atomizer or perform corresponding connection troubleshooting.

[0146] In one embodiment, before sampling the resistance of the atomizing element in the atomizer, the method further includes: after connecting the atomizer to a power source, waiting for a first preset time, and sampling the resistance of the atomizing element in the atomizer after the first preset time.

[0147] Specifically, the purpose of waiting for the first preset time is to avoid parameter fluctuations when the atomizer is just plugged into the power supply, thereby avoiding affecting the accuracy of resistance sampling; in addition, waiting for the first preset time can avoid the residual temperature of the atomizer from affecting the resistance detection.

[0148] Specifically, the anti-dry burning method provided in the present application obtains the first temperature change parameter corresponding to the atomizing element during the puffing period. △ dK1, and obtain the first over-temperature threshold ΔdKx corresponding to the atomizing element; in response to the first temperature change parameter during the puffing time period △ When dK1 is greater than the first over-temperature threshold ΔdKx, it is determined that the atomizer element has a tendency to dry burn, and corresponding operations are performed, such as reducing / stopping the power output to the atomizer element and sounding an alarm, thereby avoiding the problem of dry burning of the atomizer element in the low-cost atomizer and improving the user experience.

[0149] See also Fig.11 , Fig.11 This is a structural block diagram of an embodiment of an atomization driving circuit provided in the present application. The present application also provides an atomization driving circuit 100 for an electronic atomization device, including a driving module 10 and a control module 20.

[0150] The driving module 10 includes an atomizing element, and the atomizing element is used to heat the atomizing medium.

[0151] The control module 20 is connected to the driving module 10 and is used to obtain the first temperature change parameter corresponding to the atomizing element during the puffing period. △ dK1, and obtain the first over-temperature threshold ΔdKx corresponding to the atomizing element; wherein the control module 20 also responds to the first temperature change parameter during the puffing time period △ When dK1 is greater than the first over-temperature threshold ΔdKx, corresponding operations are performed.

[0152] The control module 20 obtains the first temperature change parameter corresponding to the atomizing element during the puffing period. △ dK1 can refer to any embodiment of the above-mentioned anti-dry burning method to obtain the first temperature change parameter corresponding to the atomizing element during the puffing time period. △ dK1 method.

[0153] See also Fig.12 , Fig.12 This is a structural block diagram of another embodiment of the atomization drive circuit provided in the present application. In one embodiment, the control module 20 includes a collection module 21 and a control chip 22.

[0154] Among them, the acquisition module 21 forms a resistance detection circuit, which is used to collect the first detection value ADC1 corresponding to the atomizer element at the first moment in the current puff time period, and the second detection value ADC2 corresponding to the atomizer element at the second moment in the current puff time period. The control chip 22 determines the first detection reference value dK1 corresponding to the atomizer element in the current puff time period based on the first detection value ADC1 and the second detection value ADC2.

[0155] Among them, the acquisition module 21 is also used to collect the third detection value ADC3 corresponding to the atomizer element at the third moment in each reference puff time period, and obtain the fourth detection value ADC4 corresponding to the atomizer element at the fourth moment in each reference puff time period. The control chip 22 determines the second detection reference value dK2 corresponding to the atomizer element in each reference puff time period based on the third detection value ADC3 and the fourth detection value ADC4; wherein the reference puff time period is located before the puff time period.

[0156] The control chip 22 also determines the first temperature change parameter corresponding to the atomizing element in the puffing time period based on the first detection reference value dK1 and the second detection reference value dK2 corresponding to the atomizing element in the puffing learning time period. △ dK1, wherein the reference puffing time period is within the puffing time period, and the puffing learning time period is before the puffing time period, and the second detection reference value dK2 corresponding to the atomizing element within the puffing learning time period is determined based on the second detection reference value dK2 corresponding to the atomizing element within each reference puffing time period.

[0157] Specifically, in the atomization drive circuit 100 provided in the present application, the control module 20 obtains the first temperature change parameter corresponding to the atomization element during the puffing time period through the acquisition module 21. △ dK1, and obtain the first over-temperature threshold ΔdKx corresponding to the atomizing element; in response to the first temperature change parameter during the puffing time period △ When dK1 is greater than the first over-temperature threshold ΔdKx, it is determined that the atomizer element has a tendency to dry burn, and corresponding operations are performed, such as reducing / stopping the power output to the atomizer element and sounding an alarm, thereby avoiding the problem of dry burning of the atomizer element in the low-cost atomizer and improving the user experience.

[0158] See also Fig.13 , Fig.13 This is a schematic diagram of the circuit structure of an embodiment of the atomization drive circuit provided in the present application. In one embodiment, the drive module 10 includes a first switch Q1, an atomization element R and a first resistor R1, and the acquisition module 21 includes a second switch Q2, a comparator A, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, and a ninth resistor R9.

[0159] The first channel end of the first switch Q1, the first channel end of the second switch Q2, the first end of the first resistor R1, and the first end of the second resistor R2 are connected to the output end VCC BAT of the power supply, the second end of the first switch Q1 is connected to the first end of the atomizing element R, the second end of the atomizing element R is grounded, the second end of the first resistor R1 and the control end of the first switch Q1 are connected to the power output port PWM HEAT of the control chip 22, and the second end of the second resistor R2 and the control end of the second switch Q2 are connected to the switch reset port RES of the control chip 22 CHECK, the second path end of the second switch Q2 is connected to the first end of the third resistor R3, the second end of the third resistor R3 is connected to the first end of the fourth resistor R4 and the first end of the atomizing element R, the second end of the fourth resistor R4 is connected to the first input end of the comparator A, the second input end of the amplifier is connected to the first end of the fifth resistor R5 and the first end of the ninth resistor R9, the output end of the amplifier is connected to the second end of the ninth resistor R9 and the first end of the eighth resistor R8, the second end of the eighth resistor R8 is connected to the resistance detection port ADC of the control chip 22, the second end of the fifth resistor R5 is connected to the first end of the sixth resistor R6 and the first end of the seventh resistor R7, the second end of the sixth resistor R6 and the second end of the seventh resistor R7 are grounded.

[0160] In one embodiment, the atomization drive circuit 100 further includes a fault detection module 30. Specifically, the fault detection module 30 is used to detect whether a short circuit fault occurs in the atomization element R during heating. In one embodiment, the fault detection module 30 includes a tenth resistor R10, a first end of the tenth resistor R10 is connected to the fault detection port HETA V of the control chip 22, and a second end of the tenth resistor R10 is connected to the first end of the atomization element R.

[0161] See also Fig.14 , Fig.14 The electronic atomization device 200 includes a memory 201 and a processor 202. The memory 201 stores program instructions. The processor 202 retrieves program instructions from the memory 201 to execute the anti-dry burning method provided in any of the above embodiments.

[0162] The processor 202 may also be referred to as a CPU (Central Processing Unit). The processor 202 may be an integrated circuit chip having signal processing capabilities. The processor 202 may also be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components. A general-purpose processor may be a microprocessor or the processor 202 may also be any conventional processor, etc.

[0163] The memory 201 can be a memory stick, a TF card, etc., which can store all the information in the electronic device of the device, including the input raw data, computer programs, intermediate operation results and final operation results are all stored in the memory 201. It stores and retrieves information according to the location specified by the controller. With the memory 201, the electronic device has a memory function and can ensure normal operation. The memory 201 of the electronic device can be divided into main memory (internal memory) and auxiliary memory (external memory) according to its purpose, and there is also a classification method of dividing it into external memory and internal memory. External memory is usually a magnetic medium or an optical disk, etc., which can store information for a long time. Memory refers to the storage component on the motherboard, which is used to store the data and programs currently being executed, but it is only used to temporarily store programs and data. If the power is turned off or the power is cut off, the data will be lost.

[0164] See also Fig.15 , Fig.15 300 is a module diagram of an embodiment of a computer-readable storage medium provided by the present application. The present application also provides a computer-readable storage medium 300, which is used to store a control program 301. When the control program 301 is executed by the processor 202, it is used to implement the anti-dry burning method provided by any of the above embodiments.

[0165] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0166] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0167] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for preventing dry burning, used in an electronic atomization device, characterized in that: include: Obtaining a first temperature change parameter corresponding to the atomizing element during a puffing period, and obtaining a first over-temperature threshold corresponding to the atomizing element; wherein the first temperature change parameter is related to a temperature change trend of the atomizing element during the puffing period; In response to the first temperature change parameter being greater than the first over-temperature threshold value during the puffing time period, a corresponding operation is performed.

2. The method according to claim 1, characterized in that The obtaining of a first temperature change parameter corresponding to the atomizing element during the puffing period includes: Acquire a first detection value corresponding to the atomizing element at a first moment in the current puffing time period, and a second detection value corresponding to the atomizing element at a second moment in the current puffing time period, and determine a first detection reference value corresponding to the atomizing element in the current puffing time period based on the first detection value and the second detection value; Determine the first temperature change parameter corresponding to the atomizing element in the current puffing time period based on the first detection reference value and the second detection reference value corresponding to the atomizing element obtained in the puffing learning time period; The puff learning time period is located before the puff time period.

3. The method according to claim 2, characterized in that Acquiring the second detection reference value corresponding to the atomizing element during the puff learning time period includes: In response to a first number of reference puffing time periods within the puffing learning time period being greater than a first threshold, obtaining a first number of second detection reference values ​​corresponding to the atomizing element within the first number of reference puffing time periods; A second number of second detection reference values ​​with larger values ​​are selected from the first number of second detection reference values ​​and a first average value is calculated, and the first average value is used as the second detection reference value corresponding to the atomizing element during the puff learning time period; wherein the second number is less than or equal to the first number.

4. The method according to claim 3, characterized in that The obtaining of the second detection reference value corresponding to the atomizing element in each reference puffing time period includes: Obtain a third detection value corresponding to the atomizing element at a third moment in each of the reference puff time periods, and obtain a fourth detection value corresponding to the atomizing element at a fourth moment in each of the reference puff time periods, and determine the second detection reference value corresponding to the atomizing element in each of the reference puff time periods based on the third detection value and the fourth detection value.

5. The method according to claim 1, characterized in that: Before obtaining the first temperature change parameter corresponding to the atomizing element during the puffing time period and obtaining the first over-temperature threshold corresponding to the atomizing element, the method further includes: Detecting whether there is atomizing medium in the atomizer of the electronic atomization device; In response to the absence of atomizing medium in the atomizer, a corresponding operation is performed.

6. The method according to claim 5, characterized in that The detecting whether there is atomizing medium in the atomizer of the electronic atomizing device comprises: Acquire a fifth detection value corresponding to a fifth moment in a puff trigger time period, and a sixth detection value corresponding to a sixth moment in the puff trigger time period; wherein the puff trigger time period is before the puff learning time period; Determine the first over-temperature judgment parameter corresponding to the atomizing element within the puff triggering time period based on the fifth detection value and the sixth detection value; In response to the first over-temperature judgment parameter corresponding to the atomizing element being greater than a second over-temperature threshold value within the puff triggering time period, it is determined that there is no atomizing medium in the atomizer.

7. The method according to claim 6, characterized in that The detecting whether there is atomizing medium in the atomizer of the electronic atomizing device also includes: In response to the presence of atomized medium in the atomizer and the number of the first number of reference puffing time periods being less than or equal to a first threshold; determining whether a second temperature change parameter corresponding to the atomizing element in the puffing learning time period is greater than the first over-temperature threshold, and determining whether a second over-temperature judgment parameter corresponding to the atomizing element in the puffing learning time period is greater than a third over-temperature threshold; In response to the second temperature change parameter corresponding to the atomizing element during the puff learning time period being greater than the first over-temperature threshold, and the second over-temperature judgment parameter corresponding to the atomizing element during the puff learning time period being greater than the third over-temperature threshold; it is determined that the atomizing medium exists in the atomizer during the puff learning time period and is completely consumed.

8. The method according to claim 7, characterized in that Determining a second temperature change parameter corresponding to the atomizing element during the puff learning time period includes: Obtaining a first number of third detection reference values ​​corresponding to the atomizing element in a first number of the reference puffing time periods within the puffing learning time period; Selecting a third detection reference value with the largest value from the first number of the third detection reference values ​​as the third detection reference value corresponding to the atomizing element during the puff learning time period; Obtaining a seventh detection value corresponding to the atomizing element at a seventh moment in the current reference puffing time period, and an eighth detection value corresponding to the atomizing element at an eighth moment in the current reference puffing time period, and determining a fourth detection reference value corresponding to the atomizing element in the current puffing learning time period based on the seventh detection value and the eighth detection value; The second temperature change parameter corresponding to the atomizing element within the puff learning time period is determined based on the third detection reference value and the fourth detection reference value.

9. The method according to claim 7, characterized in that: The determining of the second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period includes: Acquire the temperature of the atomizing element at different times within the puff learning time period and within the reference puff time period; The second over-temperature judgment parameter corresponding to the atomizing element within the puff learning time period is determined based on the temperature corresponding to the atomizing element at different times.

10. The method according to claim 2, characterized in that After obtaining the second detection reference value corresponding to the atomizing element within the puff learning time period, the method further includes: taking the second detection reference value corresponding to the atomizing element obtained during the puff learning time period as the current second detection reference value; In response to the difference between the initial resistance value of the atomizing element sampled and the minimum resistance value of the atomizing element obtained being greater than a second threshold value during the current puff time period, a second average value of the current second detection reference value and the second detection reference value corresponding to the atomizing element during the current puff time period is calculated, and the second average value is used as the second detection reference value for the next puff time period.

11. The method according to any one of claims 1 to 10, characterized in that: Before using the electronic atomization device, the method further includes: Detecting whether the connection between the atomizer in the electronic atomization device and the power supply is reliable; In response to the atomizer being reliably connected to the power supply, the first temperature change parameter corresponding to the atomizing element during the puffing time period is obtained.

12. The method according to claim 11, characterized in that Detecting whether the connection between the atomizer in the electronic atomization device and the power supply is reliable includes: The atomizer is connected to a power source, and resistance sampling is performed on the atomizing element in the atomizer, so as to obtain a detection value corresponding to the resistance of the atomizing element; A third average value of the third number of detection values ​​obtained is calculated, and in response to the difference between the third number of detection values ​​obtained and the third average value being less than or equal to a third threshold, it is determined that the atomizer is reliably connected to the power supply.

13. The method according to claim 12, characterized in that In response to the fact that the difference between at least one of the third number of detection values ​​obtained for the first time and the third average value is greater than the third threshold, and the number of times that the difference between at least one of the third number of detection values ​​obtained each time subsequently and the corresponding third average value is greater than the third threshold is greater than a fourth threshold, it is determined that the connection between the atomizer and the power supply is unreliable.

14. The method according to claim 12, characterized in that Before sampling the resistance of the atomizing element in the atomizer, the method further includes: After the atomizer is connected to the power source, a first preset time is waited, and after the first preset time, a resistance value of the atomizing element in the atomizer is sampled.

15. An atomization drive circuit for an electronic atomization device, characterized in that: include: A driving module, including an atomizing element, wherein the driving module is used to heat the atomizing medium; The control module is connected to the driving module and is used to obtain a first temperature change parameter corresponding to the atomizing element during a puffing time period, and to obtain a first over-temperature threshold corresponding to the atomizing element; wherein the control module also performs corresponding operations in response to the first temperature change parameter being greater than the first over-temperature threshold during the puffing time period.

16. The atomization driving circuit according to claim 15, characterized in that: The control module includes an acquisition module and a control chip; The acquisition module is used to acquire a first detection value corresponding to the atomizing element at a first moment in the current puffing time period, and a second detection value corresponding to the atomizing element at a second moment in the current puffing time period, and the control chip determines a first detection reference value corresponding to the atomizing element in the current puffing time period based on the first detection value and the second detection value; The acquisition module is further used to acquire a third detection value corresponding to the atomizing element at a third moment in each reference puffing time period, and to acquire a fourth detection value corresponding to the atomizing element at a fourth moment in each reference puffing time period, and the control chip determines the second detection reference value corresponding to the atomizing element in each reference puffing time period based on the third detection value and the fourth detection value; The control chip also determines the first temperature change parameter corresponding to the atomizing element within the puffing time period based on the first detection reference value and the second detection reference value corresponding to the atomizing element within the puffing learning time period, wherein the puffing learning time period is located before the puffing time period, and the second detection reference value corresponding to the atomizing element within the puffing learning time period is determined based on the second detection reference value corresponding to the atomizing element within each reference puffing time period.

17. An electronic atomization device, characterized in that: The method comprises a memory and a processor, wherein the memory stores program instructions, and the processor retrieves the program instructions from the memory to execute the anti-dry burning method according to any one of claims 1 to 14.

18. A computer-readable storage medium, characterized in that: The computer-readable storage medium is used to store a control program, and when the control program is executed by a processor, it is used to implement the anti-dry burning method according to any one of claims 1 to 14.

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