Image detection device for substrate

Abstract

The invention discloses an image detection device for a substrate. The image detection device is used for jacking up the substrate; the image detection device comprises a backlight machine table, a photosensitive module suspended above the backlight machine table and a clamping arm mechanism used for clamping a substrate, the backlight machine table comprises a base, a backlight module arranged on the base, a light guide plate arranged on the base and located above the backlight module and a driving table arranged on the base and located below the backlight module, and the driving table comprises a driver and a plurality of jacking supports driven by the driver to move up and down. When each jacking support is driven by the driver to move and jack upwards, the clamping arm mechanism clamps and turns over the substrate horizontally arranged on the light guide plate through the backlight module and the light guide plate. Therefore, the device can be applied to automatic production, and can automatically carry out detection operation on the substrate after the substrate is turned over.

Description

Technical Field

[0001] The invention relates to a copper plate automatic detection technology, in particular to an image detection device for a substrate. Background Art

[0002] The existing copper foil or ceramic substrates used in the production of circuit boards are mostly inspected manually after the substrate is taken, and then inspected using instruments such as high-power microscopes or magnifying glasses, or using instruments such as copper thickness gauges to measure the thickness and other values. In particular, when the substrate needs to be turned over, although the existing equipment can be inspected by instruments, the action of turning the substrate over still requires manual work.

[0003] However, this is no longer sufficient for today’s automated production. On the one hand, most other processes have already adopted automated methods for production and related testing processes. If manual methods are needed in the middle of the process, it will not only waste manpower, but also reduce production efficiency; on the other hand, manual testing is more prone to human errors, and the reliability of the test results is not as good as that of mechanical equipment.

[0004] In view of this, the inventors have devoted themselves to research and applied theories to improve and solve the above-mentioned deficiencies, and finally proposed the present invention which has a reasonable design and effectively improves the above-mentioned deficiencies. Summary of the invention

[0005] The main purpose of the present invention is to provide an image detection device for a substrate, which can be applied to automated production and can automatically perform detection operations on the substrate after turning it over.

[0006] In order to achieve the above-mentioned purpose, the present invention provides an image detection device for a substrate, which is used to lift up a substrate; the image detection device includes a backlight machine, a photosensitive module suspended above the backlight machine and used to detect the substrate, and a clamping arm mechanism for clamping the substrate. The backlight machine includes a base, a backlight module arranged on the base, a light guide plate arranged on the base and located above the backlight module, and a driving platform arranged on the base and located below the backlight module. The driving platform includes a driver and a plurality of lifting brackets driven by the driver to move up and down. When each lifting bracket is driven by the driver to lift up, it passes through the backlight module and the light guide plate, so that the clamping arm mechanism can clamp and flip the substrate placed flat on the light guide plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] Figure 1 It is a plan view of the present invention.

[0008] Figure 2 It is a top view schematic diagram of placing a substrate on the backlight machine in the present invention.

[0009] Figure 3 It is a schematic diagram of the action of the backlight machine in the present invention lifting the substrate upward.

[0010] Figure 4 The figure is a schematic diagram of the action of the clamping arm mechanism moving toward the substrate according to the present invention.

[0011] Figure 5 The figure is a schematic diagram of the action of using the clamping arm mechanism to clamp a substrate in the present invention.

[0012] Figure 6 The figure is a schematic diagram of the present invention in which the clamping arm mechanism is used to flip the substrate.

[0013] Figure 7 This is another schematic diagram of the present invention in which the clamping arm mechanism is used to flip the substrate.

[0014] Figure 8 It is a schematic diagram of the action of placing the substrate downward on the backlight machine table of the present invention.

[0015] Fig. 9 This is a plan view of the invention in which a thickness measuring device is added to the clamping arm mechanism.

[0016] 1: Image detection device;

[0017] 10: Backlight machine;

[0018] 100: base;

[0019] 100a: a first supporting structure;

[0020] 100b: second supporting structure;

[0021] 101: backlight module;

[0022] 101a: circuit board;

[0023] 101b: light emitting component;

[0024] 102: light guide plate;

[0025] 102a: perforation;

[0026] 103: driving platform;

[0027] 103a: driver;

[0028] 103b: Lifting the bracket;

[0029] 103c: carrier;

[0030] 11: photosensitive module;

[0031] 110: track;

[0032] 12: Clamping arm mechanism;

[0033] 120: cantilever;

[0034] 120a: Rotation motor;

[0035] 120b: rotating shaft;

[0036] 121: first clamping arm;

[0037] 121a: first clamping end;

[0038] 121b: first active end;

[0039] 121c: movable rod;

[0040] 122: second clamping arm;

[0041] 122a: second clamping end;

[0042] 122b: second active end;

[0043] 122c: elastic component;

[0044] 123: horizontal loading part;

[0045] 124: pusher;

[0046] 124a: putter;

[0047] 124b: crank;

[0048] 13: thickness measuring device;

[0049] 130: sensing probe;

[0050] 131: Ontology;

[0051] 2: Substrate. DETAILED DESCRIPTION

[0052] In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and drawings of the present invention. However, the drawings are only provided for reference and illustration and are not intended to limit the present invention.

[0053] See also Figure 1 , which is a plan view of the present invention. The present invention provides an image detection device for a substrate, wherein the image detection device 1 is used to detect a substrate 2, and can intercept an image of the surface of the substrate 2 and then interpret it through a system. The image detection device 1 includes a backlight machine 10, a photosensitive module 11 suspended above the backlight machine 10, and a clamping arm mechanism 12, wherein the photosensitive module 11 is used to intercept an image of the substrate 2 placed flat on the backlight machine 10; wherein:

[0054] The backlight machine 10 may include a base 100, a backlight module 101 disposed on the base 100, a light guide plate 102 disposed on the base 100 and located above the backlight module 101, and a driving platform 103 disposed on the base 100 and located below the backlight module 101. The base 10 is used to carry the above components and has a first supporting structure 100a and a second supporting structure 100b for fixing the backlight module 101 and the light guide plate 102. The first support structure 100a and the second support structure 100b can both be disposed on the inner wall of the base 100 in a surrounding shape, and the first support structure 100a is located below the second support structure 100b, so that the backlight module 101 is fixed to the first support structure 100a and is located below the light guide plate 102, or the light guide plate 102 is fixed to the second support structure 100b and is located above the backlight module 101. In addition, the driving platform 103 is disposed in the base 100 and is located below the backlight module 101.

[0055] like Figure 1 and Figure 2 As shown, the backlight module 101 can be several and arranged at intervals on the horizontal plane of the first supporting structure 100a, so as to have several circuit boards 101a and several light-emitting components 101b arranged on each circuit board 101a; or only a single circuit board 101a can be arranged on the horizontal plane of the first supporting structure 100a, so that several light-emitting components 101b can be arranged on the circuit board 101a, and a structure such as a hole is arranged on the circuit board 101a as the aforementioned interval. The light guide plate 102 is used for the substrate 2 to be placed flat on it, and the light guide plate 102 can also be several and arranged at intervals on the horizontal plane of the second supporting structure 100b; or only a single light guide plate 102 can be arranged on the horizontal plane of the second supporting structure 100b, and a through hole 102a is arranged on the light guide plate 102 to correspond to the aforementioned interval or hole structure of the backlight module 101. In addition, the light guide plate 102 may be frosted glass (or ground glass), or a frosted glass surface or a frosted surface may be formed on at least one side of the light guide plate 102 to be suitable for the inspection operation of the surface of the substrate 2 .

[0056] like Figures 1 to 3As shown, the driving platform 103 includes a driver 103a and a plurality of lifting brackets 103b driven by the driver 103a to move up and down. The plurality of lifting brackets 103b correspond to the through holes 102a of the light guide plate 102, respectively, and can pass through the spacing or holes of the backlight module 101, so that when the driver 103a drives the plurality of lifting brackets 103b upward, the substrate 2 placed flat on the light guide plate 102 can be lifted upward. Further, the plurality of lifting brackets 103b can be jointly arranged on a horizontal carrier 103c, and then the driver 103a drives the carrier 103c to move up and down, and then the carrier 103c can simultaneously drive the plurality of lifting brackets 103b to move up and down.

[0057] like Figure 1 As shown, the photosensitive module 11 may be a charge coupled device (CCD), and may be suspended by a track 110 hung above the backlight machine 10, so that the photosensitive module 11 may be displaced on the track 110, thereby performing a detection operation on any surface of the substrate 2 placed flat on the light guide plate 102. Figure 3 As shown, when any of the above-mentioned inspection operations are completed on one surface of the substrate 2 and the inspection operation is to be performed on the other surface, the driver 103a of the driving platform 103 can drive each lifting bracket 103b to lift the substrate 2 upward, and then a clamping arm mechanism 12 can clamp the substrate 2 through the spacing between the lifting brackets 103b, that is, Figure 4 and Figure 5 In this way, the substrate 2 can be turned over by the automated clamping arm mechanism 12, so that the other surface of the substrate 2 can be inspected easily.

[0058] like Figure 5As shown, further, the clamping arm mechanism 12 may include a cantilever 120 and a first clamping arm 121 and a second clamping arm 122 pivotally mounted on the cantilever 120. The cantilever 120 is provided with a rotary motor 120a, which may be a stepping motor and has a rotating shaft 120b connected to the first clamping arm 121 and the second clamping arm 122. The first clamping arm 121 and the second clamping arm 122 may be further assembled on a cross-carrying portion 123 and extend forward, so that the rotating shaft 120b is first connected to the cross-carrying portion 123 to indirectly drive the first clamping arm 121 and the second clamping arm 122. The first clamping arm 121 has a first clamping end 121a and a first movable end 121b, and at least one movable rod 121c is provided on the first clamping end 121a for the first movable end 121b to be movably arranged. The first clamping arm 121 is further provided with a pusher 124, and the pusher 124 can be a pneumatic cylinder or a hydraulic cylinder, and is linked to the first movable end 121b by a push rod 124a; when the pusher 124 pushes the push rod 124a to move forward, the push rod 124a can be connected to the first movable end 121b by the crank 124b, so that the first movable end 121b can be moved on the movable rod 121c to move away from the first clamping end 121a, so as to clamp the substrate 2 toward the second clamping arm 122.

[0059] As mentioned above, the second clamping arm 122 may also have a second clamping end 122a and a second movable end 122b, and the second clamping end 122a and the second movable end 122b are connected by an elastic component 122c; thus, when the first movable end 121b clamps the substrate 2 toward the second clamping arm 122, the second clamping arm 122 can clamp the substrate 2 more tightly by the elastic setting between the second clamping end 122a and the second movable end 122b, and can effectively reduce the damage to the substrate 2 during the clamping process.

[0060] like Figure 6 and Figure 7 As shown, after the clamping arm mechanism 12 is able to firmly clamp the substrate 2, the first clamping arm 121 and the second clamping arm 122 can be driven by the rotary motor 120a of the cantilever 120 to perform a 180° flipping rotation. In the embodiment of the present invention, two sets of first clamping arms 121 and two sets of second clamping arms 122 can extend from both ends of the cross-carrying portion 123 respectively to form a "U" shape.

[0061] Finally, if Figure 8 As shown, the turned-over substrate 2 is placed on the plurality of lifting brackets 103b through the clamping arm mechanism 12, and the driver 103a drives the carrier 103c to lower the substrate 2 onto the light guide plate 102, so that the photosensitive module 11 can perform the above-mentioned detection operation on the other side of the substrate 2.

[0062] In addition, if Fig. 9 As shown, the present invention can also set at least one thickness measuring device 13 on the first clamping arm 121 or the second clamping arm 122 of the clamping arm mechanism 12. The thickness measuring device 13 can be a laser measuring device or a pressure measuring device. If it is a pressure measuring device, the thickness measuring device 13 can have a plurality of sensing probes 130 and a body 131 for carrying the plurality of sensing probes 130, so that the thickness measuring device 13 can be placed on the first clamping arm 121 or the second clamping arm 122. The thickness measuring device 13 can measure the thickness of the substrate 2 when the clamping arm mechanism 12 is flipped to the upright state.

[0063] Therefore, by means of the above-mentioned structural composition, the image detection device for substrate of the present invention can be obtained.

[0064] The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. Therefore, all changes in equivalent technologies, means, etc. made using the description and drawings of the present invention are also included in the scope of the present invention and are hereby stated.

Claims

1. An image detection device for a substrate, used to lift a substrate; characterized in that: include: A backlight machine comprises a base, a backlight module arranged on the base, a light guide plate arranged on the base and located above the backlight module, and a driving platform arranged on the base and located below the backlight module; a photosensitive module, suspended above the backlight machine and used to detect the substrate; and A clamping arm mechanism for clamping the substrate; The driving platform includes a driver and several lifting brackets that are driven by the driver to move up and down. When the several lifting brackets are lifted up by the driver, they pass through the backlight module and the light guide plate so that the clamping arm mechanism can clamp and flip the substrate placed flat on the light guide plate.

2. The image detection device for substrate according to claim 1, characterized in that: The base of the backlight machine is provided with a first supporting structure for fixing the backlight module and a second supporting structure for fixing the light guide plate.

3. The image detection device for substrate according to claim 2, characterized in that: The first supporting structure and the second supporting structure are both arranged on the inner wall of the base and are in a surrounding shape.

4. The image detection device for substrate according to claim 2, characterized in that: The backlight modules are in plurality and are arranged at intervals on the horizontal plane of the first supporting structure.

5. The image detection device for substrate according to claim 2, characterized in that: There are several light guide plates which are arranged at intervals on the horizontal plane of the second supporting structure.

6. The image detection device for substrate according to claim 1, characterized in that: The backlight module and the light guide plate are both provided with spacing or hole structures for the plurality of lifting brackets to pass through.

7. The image detection device for substrate according to claim 1, characterized in that: The light guide plate is frosted glass, or a frosted glass surface is formed on at least one side of the light guide plate.

8. The image detection device for substrate according to claim 1, characterized in that: The plurality of jacking brackets are arranged together on a horizontally placed carrier, and the carrier is driven by the driver to move up and down.

9. The image detection device for substrate according to claim 1, characterized in that: The clamping arm mechanism comprises a cantilever, and a first clamping arm and a second clamping arm pivotally arranged on the cantilever.

10. The image detection device for substrate according to claim 9, characterized in that: At least one thickness measuring device is disposed on the first clamping arm or the second clamping arm.

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