A Performance Testing Method and System for a Hybrid Integrated Photonic Chip

Abstract

This application relates to the technical field of performance testing, and specifically relates to a performance testing method and system for a hybrid integrated photonic chip, which specifically includes: First, according to the temperature change trend of the same temperature data in the previous period under different states, a trend consistency factor of the same temperature data group is constructed; then, according to the consistency of the light source drive current data corresponding to the same temperature data group, a current consistency factor is constructed; finally, by calculating the average value of the accurate optical power data in each optical power data sequence, the average value represents the accurate optical power in each state, reducing the optical power deviation caused by the instability of the light source, and calculating the polarization-dependent loss of the photonic chip using the accurate optical power in each state; improving the measurement accuracy of the polarization-dependent loss and avoiding the problem that the deviation of the optical power acquisition caused by the instability of the light source affects the performance test accuracy of the photonic chip.

Description

Technical Field

[0001] This application relates to the technical field of performance testing, and specifically relates to a method and system for testing the performance of a hybrid integrated photonic chip. Background Art

[0002] A hybrid integrated photonic chip is a new type of optoelectronic integrated chip that integrates photonic devices and electronic devices on the same chip. It realizes high-speed data transmission and processing, and has the advantages of high speed, low power consumption, small size, etc. Conducting performance testing during the production of photonic chips is crucial for controlling product quality.

[0003] Polarization-dependent loss (PDL) is one of the important indicators in the performance testing of photonic chips. The polarization-dependent loss of a photonic chip refers to the maximum change in the optical power output from each output port of the photonic chip during a 360° change in the polarization state of the transmitted optical signal. It is a parameter that measures the sensitivity of the device to the polarization state of the transmitted optical signal. In practical applications, since changes in the polarization state of optical signals often occur, it is required that the device has a sufficiently small polarization-dependent loss, otherwise it will directly affect the use effect of the photonic chip. Common PDL measurement methods include the polarization scrambling / scanning measurement method, the maximum / minimum search method, and the Mueller matrix method. Among them, the maximum / minimum search method needs to traverse each polarization state, consuming a large amount of time and having low efficiency; the Mueller matrix method measures the input and output optical transmission characteristics under four different polarization states, calculates the matrix through calculation, and then calculates the polarization-dependent loss value according to the matrix. Although this method has high efficiency, it has low accuracy. In addition, during the measurement of polarization-dependent loss, the instability of the light source will affect the measurement accuracy of polarization-dependent loss. Therefore, a method capable of accurately measuring the polarization-dependent loss of a photonic chip is needed. Summary of the Invention

[0004] In order to solve the above technical problems, the purpose of this application is to provide a method and system for testing the performance of a hybrid integrated photonic chip, and the specific technical solutions adopted are as follows:

[0005] In the first aspect, an embodiment of this application provides a method for testing the performance of a hybrid integrated photonic chip, and the method includes the following steps:

[0006] Obtain the optical power data, the temperature data of the internal components of the light source, and the drive current data of the light source at each moment in each state; where the each state includes the states of connecting and not connecting the photonic chip to be tested under each polarization state; construct the optical power data sequence and the temperature data sequence in each state;

[0007] Construct each same-temperature data group based on the occurrence of temperature values in all temperature data sequences; analyze the change of adjacent data of each temperature data in the temperature data sequence, and construct the trend consistency factor of each same-temperature data group based on the difference between the changes of the adjacent data of different temperature data in the same-temperature data group;

[0008] Construct the current consistency factor of each same-temperature data group based on the mode and variance of the drive current corresponding to all temperature data in the same-temperature data group, and combine the trend consistency factor to construct the comparable weight of the optical power data corresponding to each same-temperature data group; screen the accurate optical power data in the optical power data sequence based on the comparable weight;

[0009] Based on all the accurate optical power data in the optical power data sequence, and combined with the polarization analysis algorithm, obtain the polarization-related loss of the photon chip to be measured.

[0010] In one embodiment, the process of obtaining each same-temperature data group is as follows:

[0011] For any temperature value, if the any temperature value appears in all temperature data sequences, then all elements with the same value as the any temperature value in all temperature data sequences are used as a group of same-temperature data group.

[0012] In one embodiment, the process of obtaining the trend consistency factor of each same-temperature data group is as follows:

[0013] For any temperature data in each temperature data sequence, record the sequence composed of the first preset number of temperature data before the any temperature data as the adjacent temperature sequence of the any temperature data, and record the mean value of all elements in the first-order difference sequence of the adjacent temperature sequences of each temperature data as the first mean value; construct the trend rising weight of each temperature data based on the first mean value and the number of positive and negative numbers in the first-order difference sequence;

[0014] Calculate the variance of the trend rising weights of all temperature data in each same-temperature data group, denoted as the first variance; calculate the DTW distance between the adjacent temperature sequences of each temperature data and the temperature data after it in each same-temperature data group; calculate the trend consistency factor of each same-temperature data group based on the first variance and the DTW distance.

[0015] In one embodiment, the expression of the trend rising weight is:

[0016] , where represents the trend rising weight of the s-th temperature data in the j-th same-temperature data group; represents the first mean value of the s-th temperature data in the j-th same-temperature data group; , respectively represent the number of positive numbers and the number of negative numbers in the first-order difference sequence of the neighboring temperature sequence of the sth temperature data in the jth group of same-temperature data groups.

[0017] In one embodiment, the expression of the trend consistency factor is:

[0018] , where represents the trend consistency factor of the jth group of same-temperature data groups; represents the first variance of the jth group of same-temperature data groups; , respectively represent the neighboring temperature sequences of the sth and (s + 1)th temperature data in the jth group of same-temperature data groups; represents calculating the DTW distance.

[0019] In one embodiment, the process of obtaining the current consistency factor of each same-temperature data group is as follows:

[0020] Denote the sequence composed of the drive currents corresponding to all temperature data in each group of same-temperature data groups as the first current sequence; denote the total number of modes in the first current sequence of the jth group of same-temperature data groups as ;

[0021] Denote the variance of all elements in the first current sequence of the jth group of same-temperature data groups as ;

[0022] Denote the current consistency factor of the jth group of same-temperature data groups as , The expression of is: .

[0023] In one embodiment, the comparable weight of the optical power data corresponding to each same-temperature data group is: the product of the trend consistency factor and the current consistency factor of each same-temperature data group.

[0024] In one embodiment, the process of obtaining the accurate optical power data is as follows:

[0025] Take the comparable weights of all groups of same-temperature data groups as the input of the threshold segmentation algorithm, and the output is the segmentation threshold. Take the same-temperature data groups with comparable weights greater than the segmentation threshold as each effective same-temperature data group, take all temperature data in each group of effective same-temperature data groups as the final temperature data, and take the optical power data corresponding to the final temperature data as the accurate optical power data.

[0026] In one embodiment, the process of obtaining the polarization-dependent loss of the photon chip to be measured is:

[0027] Take the average value of all the accurate optical power data in each optical power data sequence as the accurate optical power corresponding to the state of each optical power data sequence. Use the accurate optical powers in all states as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. Substitute all the coefficients of the Mueller matrix method into the calculation formula of polarization-dependent loss to obtain the polarization-dependent loss of the photon chip to be measured.

[0028] In a second aspect, an embodiment of the present application also provides a performance test system for a hybrid integrated photon chip, including a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, the steps of the method described in any one of the above are implemented.

[0029] The embodiments of the present application at least have the following beneficial effects:

[0030] The present application first constructs a trend consistency factor for the same temperature data group according to the temperature change trend of the same temperature data in the previous period under different states, which can screen out the optical power data with consistent temperature and similar temperature change trends in the optical power data, making the obtained optical power data more comparable and conducive to improving the detection accuracy of the photon chip. Then, according to the consistency of the light source drive current data corresponding to the same temperature data group, a current consistency factor is constructed, making the finally obtained optical power data more comparable. Finally, by calculating the average value of the accurate optical power data in each optical power data sequence and using the average value to represent the accurate optical power in each state, the optical power deviation caused by the instability of the light source is reduced. The polarization-dependent loss of the photon chip is calculated using the accurate optical powers in each state, improving the measurement accuracy of the polarization-dependent loss and avoiding the problem that the deviation of the optical power acquisition caused by the instability of the light source affects the performance test accuracy of the photon chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required to be used in the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0032] Figure 1 It is a flowchart of the steps of a performance test method for a hybrid integrated photon chip provided by an embodiment of the present application;

[0033] Figure 2 It is a schematic diagram of the component connection method when connecting the photon chip;

[0034] Figure 3 It is a schematic diagram of the component connection method when the photon chip is not connected. Specific embodiments

[0035] In order to further elaborate on the technical means and effects adopted by this application to achieve the intended invention purpose, the following combines the accompanying drawings and preferred embodiments to specifically describe the performance testing method and system of a hybrid integrated photon chip proposed according to this application, including its specific embodiments, structures, features, and effects, as detailed below. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which this application belongs.

[0037] The following specifically describes the specific solution of the performance testing method and system of a hybrid integrated photon chip provided by this application with reference to the accompanying drawings.

[0038] Please refer to Figure 1 , which shows a flowchart of the steps of a performance testing method of a hybrid integrated photon chip provided by an embodiment of this application. The method includes the following steps:

[0039] Step S1, obtaining the optical power data, temperature data of the internal components of the light source, and driving current data of the light source at each moment in each state; where each state includes the states of connecting and not connecting the photon chip to be tested under each polarization state; constructing the optical power data sequence and temperature data sequence in each state.

[0040] The polarization state generator can generate four fixed polarization states, including linear horizontal polarization (LHP), linear vertical polarization (LVP), linear +45° polarization (L +45°), and right-handed circular polarization (RHC).

[0041] Connect the light source to the polarization state generator, and use an optical power meter to respectively collect the optical power data when connecting and not connecting the photon chip to be tested under each polarization state of the polarization state generator. The schematic diagram of the component connection method when connecting the photon chip is as shown in Figure 2 , and the schematic diagram of the component connection method when not connecting the photon chip is as shown in Figure 3 ; at the same time, when collecting the optical power data in each state, a temperature sensor is set at the light source to collect the temperature data of the internal components of the light source in this state, and a current sensor is installed in the driving circuit of the light source to collect the driving current data of the light source in this state.

[0042] For the collection of optical power data in each state, preferably, in the embodiment of the present application, the data collection time length is set to 10 seconds, and the data collection frequency is set to 15kHz. For the collection of temperature data and drive current data in each state, preferably, in the embodiment of the present application, the data collection frequency is set to 50Hz, and the collection time lengths of temperature data and drive current data are the same as the collection time length of optical power data. As other embodiments of the present application, the implementer can set the data collection time length and data collection frequency according to actual conditions.

[0043] Thus, the optical power data under 8 states, as well as the temperature data of the internal components of the light source and the driving current data of the light source under each state are obtained. The sequence of all optical power data under each state in ascending time order is recorded as each optical power data sequence, among which the optical power data sequences obtained when the photon chip to be tested is not connected under the four polarization states are recorded as , , and , the optical power data sequences obtained when connecting the photonic chip to be tested under four polarization states are recorded as , , and .

[0044] At the same time, the time series of all temperature data in each state is recorded as each temperature data series, and the time series of all driving current data in each state is recorded as each current data series.

[0045] Each temperature data sequence and each current data sequence are interpolated by linear interpolation, so that the number of data in each temperature data sequence and the number of data in each current data sequence are the same as the number of data in each optical power data sequence, so that each optical power data in each state has a corresponding temperature data and driving current data. The linear interpolation method is a well-known technology, and the specific process is not repeated here.

[0046] Step S2, constructing each same temperature data group based on the occurrence of temperature values in all temperature data sequences; analyzing the changes in adjacent data of each temperature data in the temperature data sequence, and constructing the trend consistency factor of each same temperature data group based on the difference between the changes in adjacent data of different temperature data in the same temperature data group.

[0047] In each optical power data sequence, the optical power data fluctuates with time, and the characteristics of the fluctuation depend on the characteristics of the light source. The reasons for the instability of the light source are usually the temperature fluctuation and current fluctuation inside the light source. The temperature fluctuation will cause the performance change of the light-emitting element inside the light source, thus affecting the optical power output. When the temperature rises, the optical power of the light source will decrease, because in a high-temperature environment, the thermal expansion of the material, the photon attenuation of the luminescent material, etc. will reduce the optical power of the light source. Therefore, when comparing the optical power data in different optical power data sequences, if the temperature data corresponding to the optical power data to be compared is inconsistent, then the optical power data is not comparable. So it is necessary to select the optical power data at the same temperature level from each optical power data sequence. In addition, for two optical power data at the same temperature, if the temperature change trends in the previous period of the two data are different, then the two optical power data are not comparable. For example, when the temperatures corresponding to the optical power data e1 and the optical power data e2 are equal, if the temperature of e1 rises from 20 degrees to 30 degrees in the previous period, and the temperature of e2 drops from 40 degrees to 30 degrees in the previous period, then although the temperatures corresponding to the two optical power data are equal, the two optical power data have experienced different temperature change trends in the previous period, so the two optical power data may not be equal. Therefore, when comparing whether two optical power data in two polarization states are comparable, not only the temperatures corresponding to the two optical power data need to be equal, but also the temperature change trends in the previous period of the two optical power data need to be similar.

[0048] Therefore, first, according to the occurrence of temperature values in all temperature data sequences, each group of same-temperature data is constructed, specifically as follows:

[0049] The sequence composed of all types of temperature values that have appeared in all temperature data sequences is recorded as the first sequence. For each temperature value in the first sequence, if the temperature value appears in all eight temperature data sequences, then all elements with the same value as the temperature value in the eight temperature data sequences are used as a group of same-temperature data.

[0050] Then, in each group of same-temperature data, it is judged whether the change trends of different temperature data in the previous period are similar, and the trend consistency factor of each group of same-temperature data is constructed to characterize the consistency degree of the temperature data change trends of the elements in each group of same-temperature data in the previous period, specifically as follows:

[0051] For each temperature data in each temperature data sequence, taking the y-th temperature data in the x-th temperature data sequence as an example, the sequence composed of the first N data of the temperature data is recorded as the temperature data For the adjacent temperature sequence, obtain the mean value of all elements in the first-order difference sequence of the adjacent temperature sequence, denoted as the first mean value; where if the number of data before each temperature data in the temperature data sequence is less than N, the sequence composed of the actually existing data before each temperature data is denoted as the adjacent temperature sequence of each temperature data.

[0052] Calculate the trend upward weight of each temperature data in each group of same-temperature data, and the expression is:

[0053]

[0054] In the formula, represents the trend upward weight of the s-th temperature data in the j-th group of same-temperature data, and is used to characterize the possibility that the temperature change trend of this temperature data in the previous period of time is an upward trend; represents the first mean value of the s-th temperature data in the j-th group of same-temperature data; represents the number of positive numbers in the first-order difference sequence of the adjacent temperature sequence of the s-th temperature data in the j-th group of same-temperature data; represents the number of negative numbers in the first-order difference sequence of the adjacent temperature sequence of the s-th temperature data in the j-th group of same-temperature data.

[0055] When the larger the value is, it indicates that the temperature upward trend of the s-th temperature data in the j-th group of same-temperature data in the previous period of time is more obvious; when the larger the value is, it indicates that in the previous period of time of the s-th temperature data in the j-th group of same-temperature data, there are more temperature rising moments and fewer temperature falling moments, so the temperature change trend of the s-th temperature data in the j-th group of same-temperature data in the previous period of time is more likely to be an upward trend. The larger the value of, it indicates that the possibility that the temperature of the s-th temperature data in the j-th group of same-temperature data in the previous period of time is an upward trend is greater; The smaller the value of, it indicates that the possibility that the temperature of the s-th temperature data in the j-th group of same-temperature data in the previous period of time is a downward trend is greater.

[0056] Furthermore, calculate the variance of the trend upward weights of all temperature data in each group of same-temperature data, denoted as the first variance; calculate the DTW distance between each temperature data in each group of same-temperature data and the adjacent temperature sequence of its subsequent temperature data; where the calculation of the DTW distance is a well-known technology, and the specific process will not be elaborated here;

[0057] The expression for calculating the trend consistency factor of each group of same-temperature data is:

[0058]

[0059] In the formula, represents the trend consistency factor of the j-th group of same-temperature data groups; represents the first variance of the j-th group of same-temperature data groups; represents the adjacent temperature sequence of the s-th temperature data in the j-th group of same-temperature data groups; represents the adjacent temperature sequence of the (s + 1)-th temperature data in the j-th group of same-temperature data groups; represents calculating the DTW distance.

[0060] The smaller the variance of the trend rising weights of all temperature data in the j-th group of same-temperature data groups, the more similar the values of the trend rising weights of all temperature data in this group of same-temperature data groups, indicating that the change trends of the temperature data in this group of same-temperature data groups in the previous period are more similar, and then the optical power data corresponding to the j-th group of same-temperature data groups is more comparable. When is smaller, it indicates that the adjacent temperature sequences of the temperature data in the j-th group of same-temperature data groups are more similar, and then the optical power data corresponding to the j-th group of same-temperature data groups is more comparable.

[0061] Step S3: Based on the mode and variance of the drive currents corresponding to all temperature data in the same-temperature data groups, construct the current consistency factor of each same-temperature data group, and combine the trend consistency factor to construct the comparable weight of the optical power data corresponding to each same-temperature data group; Screen the accurate optical power data in the optical power data sequence based on the comparable weight.

[0062] Since the quality of the optical components inside the light source will affect the stability of the drive current, and external electromagnetic interference and vibration may also affect the stability of the drive current, resulting in random fluctuations in the drive current of the light source. The fluctuations in the drive current will cause deviations in the measured optical power, and the measured optical power will also be different under different drive currents. There is usually a linear relationship between the drive current and the optical power of the light source. When the drive current increases, the optical power will also increase accordingly. Conversely, when the drive current decreases, the optical power will also decrease accordingly. If the optical power when the current is relatively large in one polarization state is compared with the optical power when the current is relatively small in another polarization state, it is obviously not comparable. Therefore, when selecting the optical power data in each polarization state, not only the consistency of the temperature change trend should be considered, but also the consistency of the drive current data should be considered.

[0063] Each temperature data corresponds to a drive current data in the same state and at the same acquisition moment. The sequence composed of the drive current data corresponding to all temperature data in each group of same-temperature data groups is recorded as the first current sequence; Obtain the total number of modes in the first current sequence of each group of same-temperature data groups, and record it as the first mode number;

[0064] Denote the variance of all elements in the first current sequence of each group of same-temperature data groups as the first current variance;

[0065] Based on the above analysis, construct the current consistency factor for each group of same-temperature data groups, which is used to characterize the consistency degree of the drive current data corresponding to each temperature data in each group of same-temperature data groups. Among them, the current consistency factor of each group of same-temperature data groups is positively correlated with the first mode number and negatively correlated with the first current variance.

[0066] Preferably, in the embodiments of the present application, the expression of the current consistency factor of each group of same-temperature data groups is: , where in the formula, represents the current consistency factor of the j-th group of same-temperature data groups; represents the first mode number of the j-th group of same-temperature data groups; represents the first current sequence of the j-th group of same-temperature data groups; is the variance function.

[0067] When is smaller, it indicates that the drive current data corresponding to the j-th group of same-temperature data groups is more consistent, and then the optical power data corresponding to the j-th group of same-temperature data groups is more comparable. When is larger, it indicates that there are more identical values in the drive current data corresponding to the j-th group of same-temperature data groups, and then the optical power data corresponding to the j-th group of same-temperature data groups is more comparable.

[0068] Furthermore, according to the trend consistency factor and the current consistency factor of each group of same-temperature data groups, construct the comparable weight of the optical power data corresponding to each group of same-temperature data groups, which is used to characterize the comparability strength of the optical power data corresponding to the j-th group of same-temperature data groups. Among them, the comparable weights of each group of same-temperature data groups are positively correlated with the trend consistency factor and the current consistency factor respectively.

[0069] Preferably, in the embodiments of the present application, the expression of the comparable weight of the optical power data corresponding to each group of same-temperature data groups is: , where in the formula, is the comparable weight of the optical power data corresponding to the j-th group of same-temperature data groups; represents the trend consistency factor of the j-th group of same-temperature data groups; represents the current consistency factor of the j-th group of same-temperature data groups.

[0070] The more consistent the temperature change trend of each group of same-temperature data groups is, and the more consistent the drive current data corresponding to this group of same-temperature data groups is, then the more comparable the optical power data corresponding to this group of same-temperature data groups is.

[0071] Further, the comparable weights of all groups of same-temperature data groups are used as the input of the Otsu method, and the output is the segmentation threshold. Each same-temperature data group with a comparable weight greater than the segmentation threshold is used as each group's effective same-temperature data group, and all temperature data in each group's effective same-temperature data group are used as the final temperature data. Among them, the Otsu method is a well-known technology, and the specific process will not be elaborated here.

[0072] It should be noted that for the acquisition of the segmentation threshold of the comparable weights of all groups of same-temperature data groups, this application only provides a threshold segmentation method. There are many existing threshold segmentation methods, and implementers can also use other threshold segmentation algorithms to obtain the segmentation threshold of the comparable weights. This application does not make specific restrictions.

[0073] The optical power data corresponding to the final temperature data is used as the accurate optical power data. Thus, the accurate optical power data of each optical power data sequence is obtained.

[0074] Step S4: Based on the accurate optical power data in all optical power data sequences, combined with the polarization analysis algorithm, the polarization-related loss of the photon chip to be measured is obtained.

[0075] The average value of all the accurate optical power data in each optical power data sequence is used as the accurate optical power corresponding to each state of the optical power data sequence. Among them, the accurate optical powers corresponding to the states of the optical power sequences , , , , , , and are respectively denoted as , , , , , , and . By calculating the average value, the error caused by the data with large deviations in the original optical power data can be reduced, so that the accurate optical power can more accurately represent the optical power in each state.

[0076] Further, the accurate optical powers in all states are used as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. The coefficient calculation method of the Mueller matrix method is:

[0077]

[0078] In the formula, , , and respectively represent the four coefficients of the Mueller matrix method; , , and respectively represent the accurate optical powers of the optical power meter in four polarization states when connecting to the photon chip to be measured; , , and respectively represent the accurate optical powers of the optical power meter in four polarization states when not connecting to the photon chip to be measured. Among them, the Mueller matrix method and its coefficient calculation method are well-known technologies, and the specific process will not be elaborated.

[0079] Furthermore, the polarization-dependent loss (PDL) can be obtained:

[0080] , where in the formula, is the polarization-dependent loss of the photon chip to be measured. Among them, the calculation of the polarization-dependent loss is a well-known technology, and the specific acquisition process will not be elaborated.

[0081] Thus, the polarization-dependent loss of the photon chip to be measured is obtained.

[0082] A performance test system for a hybrid integrated photon chip includes: a data acquisition module, a data processing module, an optical power calculation module, and a PDL calculation module. Among them, the data acquisition module includes using an optical power meter, a temperature sensor, and a current sensor to collect optical power data, temperature data, and current data in different polarization states; the data processing module is responsible for aligning the collected data by using the interpolation method so that one optical power data corresponds to one temperature data and one current data; the optical power calculation module is responsible for screening out the data that can most accurately represent the optical power in each polarization state from the entire optical power data sequence according to the temperature data and the current data, and calculating the accurate optical power; the PDL calculation module is responsible for calculating the polarization-dependent loss of each photon chip to be measured by using the Mueller matrix method.

[0083] Based on the same inventive concept as the above method, an embodiment of the present application also provides a performance test system for a hybrid integrated photon chip, including a memory, a processor, and a computer program stored in the memory and running on the processor. When the processor executes the computer program, it implements the steps of any one of the above methods for testing the performance of a hybrid integrated photon chip.

[0084] In summary, the embodiment of the present application provides a method for testing the performance of a hybrid integrated photonic chip. First, according to the temperature change trend of the same temperature data in the previous period under different states, a trend consistency factor of the same-temperature data group is constructed, which can screen out the optical power data with consistent temperature and similar temperature change trends in the optical power data, making the obtained optical power data more comparable and facilitating the improvement of the detection accuracy of the photonic chip. Then, according to the consistency of the light source drive current data corresponding to the same-temperature data group, a current consistency factor is constructed, making the finally obtained optical power data more comparable. Finally, by calculating the average value of the accurate optical power data in each optical power data sequence and using the average value to represent the accurate optical power in each state, the optical power deviation caused by the instability of the light source is reduced. The polarization-dependent loss of the photonic chip is calculated using the accurate optical power in each state, improving the measurement accuracy of the polarization-dependent loss and avoiding the problem that the deviation of the optical power acquisition caused by the instability of the light source affects the performance test accuracy of the photonic chip.

[0085] It should be noted that the above sequence of the embodiments of the present application is only for description and does not represent the superiority or inferiority of the embodiments. And the specific embodiments of the present application have been described above. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0086] Each embodiment in the present application is described in a progressive manner. The same or similar parts among the embodiments can be referred to each other, and the key point of each embodiment is to illustrate the differences from other embodiments.

[0087] The above are only the preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the principle of the present application shall be included in the protection scope of the present application.

Claims

1. A method for testing the performance of a hybrid integrated photonics chip, characterized in that, The method includes the following steps: Obtain the optical power data, temperature data of the internal components of the light source, and drive current data of the light source at each moment in each state; where the each state includes the states of connecting and not connecting the photon chip to be measured in each polarization state; construct the optical power data sequence and temperature data sequence in each state; Construct each same-temperature data group based on the occurrence of temperature values in all temperature data sequences; analyze the change of adjacent data of each temperature data in the temperature data sequence, and construct the trend consistency factor of each same-temperature data group based on the difference between the changes of adjacent data of different temperature data in the same-temperature data group; Construct the current consistency factor of each same-temperature data group based on the mode and variance of the drive current corresponding to all temperature data in the same-temperature data group, and combine the trend consistency factor to construct the comparable weight of the optical power data corresponding to each same-temperature data group; screen the accurate optical power data in the optical power data sequence based on the comparable weight; Based on the accurate optical power data in all optical power data sequences, and in combination with the polarization analysis algorithm, obtain the polarization-dependent loss of the photon chip to be measured.

2. The performance testing method of a hybrid integrated photon chip as described in claim 1, wherein The process of obtaining each same-temperature data group is as follows: For any temperature value, if the any temperature value appears in all temperature data sequences, then all elements with the same value as the any temperature value in all temperature data sequences are used as a group of same-temperature data.

3. The performance testing method of a hybrid integrated photonics chip according to claim 1, wherein, The process of obtaining the trend consistency factor of each same-temperature data group is as follows: For any temperature data in each temperature data sequence, record the sequence composed of the first preset number of temperature data before the any temperature data as the adjacent temperature sequence of the any temperature data, and record the mean value of all elements in the first-order difference sequence of the adjacent temperature sequences of each temperature data as the first mean value; construct the trend rising weight of each temperature data based on the first mean value and the number of positive and negative numbers in the first-order difference sequence; Calculate the variance of the trend rising weights of all temperature data in each same-temperature data group, and record it as the first variance; Calculate the DTW distance between each temperature data in each same-temperature data group and its adjacent temperature sequence of the subsequent temperature data; calculate the trend consistency factor of each same-temperature data group based on the first variance and the DTW distance.

4. The performance testing method of a hybrid integrated photonic chip as claimed in claim 3, wherein The expression of the trend rising weight is: , where represents the upward trend weight of the s-th temperature data in the j-th group of same-temperature data groups; represents the first mean value of the s-th temperature data in the j-th group of same-temperature data groups; and respectively represent the number of positive numbers and the number of negative numbers in the first-order difference sequence of the neighboring temperature sequence of the s-th temperature data in the j-th group of same-temperature data groups.

5. The performance testing method of a hybrid integrated photonics chip according to claim 3, characterized in that The expression of the trend consistency factor is: , where represents the trend consistency factor of the j-th group of same-temperature data groups; represents the first variance of the j-th group of same-temperature data groups; , respectively represent the adjacent temperature sequences of the s-th and (s + 1)-th temperature data in the j-th group of same-temperature data groups; represents calculating the DTW distance.

6. The performance testing method of a hybrid integrated photonics chip according to claim 1, characterized in that The process of obtaining the current consistency factor of each same-temperature data group is as follows: Denote the sequence formed by the drive currents corresponding to all temperature data in each group of same-temperature data groups as the first current sequence; Denote the total number of modes in the first current sequence of the j-th group of same-temperature data groups as ; Denote the variance of all elements in the first current sequence of the j-th group of same-temperature data groups as ; Denote the current consistency factor of the j-th group of data at the same temperature as , The expression of is as follows: .

7. The performance testing method of a hybrid integrated photon chip as claimed in claim 1, wherein The comparable weight of the optical power data corresponding to each same-temperature data group is: the product of the trend consistency factor and the current consistency factor of each same-temperature data group.

8. The performance testing method of a hybrid integrated photon chip according to claim 1, characterized in that, The process of obtaining the accurate optical power data is as follows: Use the comparable weights of all groups of same-temperature data groups as the input of the threshold segmentation algorithm, and the output is the segmentation threshold. Use the same-temperature data groups with comparable weights greater than the segmentation threshold as each effective same-temperature data group. Use all temperature data in each group of effective same-temperature data groups as the final temperature data, and use the optical power data corresponding to the final temperature data as the accurate optical power data.

9. The performance testing method of a hybrid integrated photonic chip according to claim 1, characterized in that The process of obtaining the polarization-dependent loss of the photon chip to be measured is: The average value of all the accurate optical power data in each optical power data sequence is used as the accurate optical power corresponding to the state of each optical power data sequence. The accurate optical powers in all states are used as the input of the Mueller matrix method to obtain the coefficients of the Mueller matrix method. All the coefficients of the Mueller matrix method are substituted into the calculation formula of polarization-dependent loss to obtain the polarization-dependent loss of the photon chip to be measured.

10. A performance test system for a hybrid integrated photonics chip, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1-9.

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