Metal impurity detection device and method and computer equipment

Abstract

The invention relates to the technical field of detection of metal impurities in water, in particular to a metal impurity detection method which comprises the following steps: putting a titanium metal electrode plate into liquid to be detected, and performing capacitance measurement by a capacitance detection module through the titanium metal electrode plate; a B spline curve is adopted to construct a mathematical model of dielectric constant variation of impurity water and metal impurity content, a metal impurity measuring and processing module evaluates the metal content through the B spline curve mathematical model according to capacitance change, and corresponding indicator light change and sound reminding are made according to the obtained metal content. The water quality of water circulation of the mold temperature controller is effectively monitored, so that the product quality is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of metal impurity detection in water, and in particular to a metal impurity detection device, method and computer equipment. Background Art

[0002] In the process of testing the water quality of the mold temperature controller water circulation, TDS test pens are often used to test the water quality. TDS refers to total dissolved solids (Total Dissolved Solids), and the unit of measurement is milligrams per liter (mg / L), indicating how many milligrams of dissolved solids are contained in 1 liter of water, including soluble salts (calcium ions, magnesium ions, etc.), ionic organic matter (ammonium acetate, sodium sulfate, etc.), and some heavy metal ions (chromium, zinc, lead, copper, etc.). During the operation of the mold temperature controller, the contact between water and the mold causes the mold to oxidize, resulting in rust floating in the water, but TDS cannot give data on suspended rust, and the water quality of the mold temperature controller water circulation cannot be effectively controlled, thus affecting product quality and the service life of the mold temperature controller.

[0003] In view of this, we propose a metal impurity detection device, method and computer equipment to solve the existing problems. Summary of the invention

[0004] The object of the present invention is to provide a metal impurity detection device, method and computer equipment to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a metal impurity detection device, comprising a metal impurity measurement and processing module, a capacitance detection module, a power management module, a display module and a rust-proof and corrosion-resistant titanium metal electrode sheet; the data input end of the capacitance detection module is connected to the rust-proof and corrosion-resistant titanium metal electrode sheet, and the data output end of the capacitance detection module is connected to the metal impurity measurement and processing module; wherein the metal impurity measurement and processing module comprises a dielectric constant calculation unit, a B-spline curve construction unit and a metal impurity evaluation unit.

[0006] Furthermore, the display module includes an LED and a speaker module, and the capacitance detection module is connected to the titanium metal electrode sheet via a wiring harness with an interference shielding function.

[0007] A metal impurity detection method is used in a metal impurity detection device, wherein a capacitance detection module collects capacitance of a to-be-detected object between two electrode sheets, and a metal impurity measurement processing module calculates the collected capacitance data; wherein a dielectric constant calculation unit calculates a dielectric constant based on the capacitance data, and a metal impurity evaluation unit evaluates the content of metal impurities based on a change in the dielectric constant through a B-spline curve construction unit.

[0008] Furthermore, one portion of pure water and several portions of impure water are used as samples to obtain parameters of the B-spline curve construction unit.

[0009] Furthermore, the parameter obtaining step of the B-spline curve construction unit includes:

[0010] A1: Prepare one portion of pure water and several portions of impure water as samples. The metal impurity content of each sample is different.

[0011] A2: The capacitance detection module collects the capacitance data of each sample and obtains the difference between the capacitance data of several impure water and the capacitance data of pure water;

[0012] A3: The change in dielectric constant is obtained by using a number of capacitance differences, and the B-spline curve construction unit constructs a mathematical model based on the change in dielectric constant of each portion of impure water and the metal impurity content.

[0013] Furthermore, the steps of detecting the metal impurity content of the water to be tested include:

[0014] S1: The capacitance detection module collects the capacitance data of pure water at the water inlet to obtain the ideal capacitance data;

[0015] S2: Save the ideal capacitance data as the reference data;

[0016] S3: The capacitance detection module collects the capacitance data of the water to be tested at the outlet after circulating through the mold temperature controller;

[0017] S4: The dielectric constant calculation unit calculates the change in dielectric constant through the reference data and the capacitance data of the water to be tested;

[0018] S5: The metal impurity evaluation unit evaluates the content of the metal impurities according to the change in the dielectric constant through the B-spline curve construction unit.

[0019] A metal impurity detection computer device is used for a metal impurity detection method, comprising a memory and a processor. The memory stores a computer program, and the processor executes the computer program to implement the metal impurity detection device to complete the metal impurity detection method.

[0020] Further, the operation is performed in coordination with sensor hardware, and the sensor hardware implements the computer program of the software and algorithm.

[0021] Furthermore, the computer equipment acting on the metal impurity measurement processing module includes CPU, RAM, ROM, NVM, SPI, IO, and UART.

[0022] Furthermore, the working mode of the computer device acting on the metal impurity measurement processing module includes: the CPU executes the program instructions stored in the ROM, the ROM stores the algorithm program of the capacitance measurement data, the RAM stores the temporary data during the program running process, the NVM saves the benchmark data and the program algorithm parameters, the SPI and UART realize the data interaction with other modules, and the IO drives the LED and speaker functions of the display module.

[0023] Compared with the prior art, the present invention has the following beneficial effects:

[0024] The present invention places a titanium metal electrode sheet into a liquid to be tested, and a capacitance detection module performs capacitance measurement through the titanium metal electrode sheet. A mathematical model of a dielectric constant change of impure water and a metal impurity content is constructed using a B-spline curve. A metal impurity measurement and processing module evaluates the metal content through a B-spline curve mathematical model according to a change in capacitance, and makes corresponding indicator light changes and sound reminders according to the obtained metal content, thereby achieving effective monitoring of the water quality of the water circulation of the mold temperature controller, thereby improving product quality. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 It is a structural schematic diagram of a metal impurity detection device of the present invention;

[0026] Figure 2 A flow chart of the steps of a metal impurity detection method of the present invention;

[0027] Figure 3 It is a structural schematic diagram of the computer equipment acting on the metal impurity measurement processing module of the present invention. DETAILED DESCRIPTION

[0028] The technical solution of the present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0029] Embodiment 1

[0030] like Figure 1 As shown, a metal impurity detection device includes a metal impurity measurement processing module, a capacitance detection module, a power management module, a display module, and a rust-proof and corrosion-proof titanium metal electrode sheet. The power management module is responsible for providing a stable power supply for the metal impurity measurement processing module and the capacitance detection module. The metal impurity measurement processing module controls the display module through the IO mode or the PWM mode, and obtains the capacitance data of the capacitance detection module through the SPI mode. The display module includes an LED and a speaker module, which are used to warn the operator to inspect the water circulation of the mold temperature controller. The capacitance detection module and the titanium metal electrode sheet are connected through a wiring harness with interference shielding function.

[0031] like Figure 2As shown, a method for detecting metal impurities includes the following steps:

[0032] S1: The capacitance detection module collects the capacitance data of pure water at the water inlet to obtain the ideal capacitance data;

[0033] S2: Save the ideal capacitance data as the reference data;

[0034] S3: The capacitance detection module collects the capacitance data of the water to be tested at the outlet after circulating through the mold temperature controller;

[0035] S4: The dielectric constant calculation unit calculates the change in dielectric constant through the reference data and the capacitance data of the water to be tested;

[0036] S5: The metal impurity evaluation unit evaluates the content of the metal impurities according to the change in the dielectric constant through the B-spline curve construction unit.

[0037] like Figure 3 As shown, the computer equipment acting on the metal impurity measurement processing module includes CPU, RAM, ROM, NVM, SPI, IO, and UART. The CPU executes program instructions stored in the ROM, the ROM stores the algorithm program of the capacitance measurement data, the RAM stores temporary data during the program operation, the NVM saves the benchmark data and program algorithm parameters, the SPI and UART realize data interaction with other modules, and the IO drives the LED and speaker functions of the display module.

[0038] The working principle of a metal impurity detection device, method and computer equipment based on the first embodiment is:

[0039] The data input end of the capacitance detection module is connected to the rust-proof and corrosion-resistant titanium metal electrode sheet, and the data output end of the capacitance detection module is connected to the metal impurity measurement and processing module; wherein the metal impurity measurement and processing module includes a dielectric constant calculation unit, a B-spline curve construction unit and a metal impurity evaluation unit.

[0040] The capacitance detection module collects the capacitance of the object to be tested between the two electrode sheets, and the metal impurity measurement processing module calculates the collected capacitance data; wherein, the dielectric constant calculation unit calculates the dielectric constant based on the capacitance data, and the metal impurity evaluation unit evaluates the content of metal impurities based on the change in the dielectric constant through the B-spline curve construction unit.

[0041] One portion of pure water and several portions of impure water are used as samples to obtain the parameters of the B-spline curve construction unit.

[0042] The parameter obtaining step of the B-spline curve construction unit includes:

[0043] A1: Prepare one portion of pure water and several portions of impure water as samples. The metal impurity content of each sample is different.

[0044] A2: The capacitance detection module collects the capacitance data of each sample and obtains the difference between the capacitance data of several impure water and the capacitance data of pure water;

[0045] A3: The change in dielectric constant is obtained by using a number of capacitance differences, and the B-spline curve construction unit constructs a mathematical model based on the change in dielectric constant of each portion of impure water and the metal impurity content.

[0046] Assume that the metal impurity content of N impure water samples is H 1 , H 2 , ..., H N , the capacitance data of pure water sample is C 0 , the capacitance data of N impure water samples is C 1 , C 2 , ..., C N The capacitance calculation formula is: Where C is capacitance, ε is dielectric constant, S is plate area, d is plate spacing, and k is electrostatic force constant. When the plate area S and plate spacing d are fixed, capacitance C is proportional to dielectric constant ε. The content of metal impurities in water affects the dielectric constant of water. Therefore, the metal impurity measurement and processing module of this device reflects the change of dielectric constant through the change of capacitance, and then infers the content of metal impurities in water.

[0047] The algorithm formula for the n-order m-segment B-spline curve is:

[0048]

[0049] Where: P i,n (t) is the value of the i-th segment after the n-th B-spline curve transformation, where i = 1, 2, 3, ..., m; t is the value before the B-spline curve transformation, and for each point of the curve segment, 0 ≤ t ≤ 1 is satisfied, t = 0 represents the beginning node of the i-th segment, and t = 1 represents the end node of the i-th segment; p i+k-1 is the control point of the i-th segment of the B-spline curve; F k,n (t) is a piecewise mixing function of an n-order B-spline curve, where 0≤t≤1, k=0,1,2,...,n.

[0050] The change in dielectric constant of N impure water samples is Δε 1 , Δε 2 , ..., Δε N , Where n = 1, 2, ..., N. Let Δε T is Δε 1 , Δε2 , ..., Δε N The collection of H T H 1 , H 2 , ..., H N The set of (Δε n ,H n ) is used as the node to construct the B-spline curve model, F(Δε T )·P=H T , F(Δε T ) is Δε T The piecewise mixed function of the B-spline curve is used to obtain the control point set P of the B-spline curve. The mathematical model of the B-spline curve constructed based on P is H=F(Δε)·P, where Δε is the change in dielectric constant and H is the metal impurity content in water.

[0051] In the process of detecting the metal impurity content of the water to be tested, the capacitance data of the pure water at the water inlet is assumed to be C r , taking this as the reference data, the capacitance data of the water to be tested at the outlet after circulating through the mold temperature controller is C t , the change in dielectric constant Metal content H t =F(Δε t )·P.

[0052] The above-mentioned specific embodiments are only several preferred embodiments of the present invention. Based on the technical solutions of the present invention and the relevant inspirations of the above-mentioned embodiments, those skilled in the art can make various alternative improvements and combinations to the above-mentioned specific embodiments.

Claims

1. A metal impurity detection device, characterized in that: It includes a metal impurity measurement and processing module, a capacitance detection module, a power management module, a display module and a rust-proof and corrosion-proof titanium metal electrode sheet; the data input end of the capacitance detection module is connected to the rust-proof and corrosion-proof titanium metal electrode sheet, and the data output end of the capacitance detection module is connected to the metal impurity measurement and processing module; wherein the metal impurity measurement and processing module includes a dielectric constant calculation unit, a B-spline curve construction unit and a metal impurity evaluation unit.

2. A metal impurity detection device according to claim 1, characterized in that: The display module includes an LED and a speaker module, and the capacitance detection module is connected to the titanium metal electrode sheet through a wiring harness with interference shielding function.

3. A metal impurity detection method, according to a metal impurity detection device according to claim 1 or 2, characterized in that: The capacitance detection module collects the capacitance of the object to be tested between the two electrode sheets, and the metal impurity measurement processing module calculates the collected capacitance data; wherein, the dielectric constant calculation unit calculates the dielectric constant based on the capacitance data, and the metal impurity evaluation unit evaluates the content of metal impurities based on the change in the dielectric constant through the B-spline curve construction unit.

4. A metal impurity detection method according to claim 3, characterized in that: One portion of pure water and several portions of impure water are used as samples to obtain the parameters of the B-spline curve construction unit.

5. A metal impurity detection method according to claim 4, characterized in that: The steps of obtaining parameters of the B-spline curve construction unit include: A1: Prepare one portion of pure water and several portions of impure water as samples. The metal impurity content of each sample is different. A2: The capacitance detection module collects the capacitance data of each sample and obtains the difference between the capacitance data of several impure water and the capacitance data of pure water; A3: The change in dielectric constant is obtained by using a number of capacitance differences, and the B-spline curve construction unit constructs a mathematical model based on the change in dielectric constant of each portion of impure water and the metal impurity content.

6. A method for detecting metal impurities according to claim 3, characterized in that: The steps for detecting the metal impurity content of the water to be tested include: S1: The capacitance detection module collects the capacitance data of pure water at the water inlet to obtain the ideal capacitance data; S2: Save the ideal capacitance data as the reference data; S3: The capacitance detection module collects the capacitance data of the water to be tested at the outlet after circulating through the mold temperature controller; S4: The dielectric constant calculation unit calculates the change in dielectric constant through the reference data and the capacitance data of the water to be tested; S5: The metal impurity evaluation unit evaluates the content of the metal impurities according to the change in the dielectric constant through the B-spline curve construction unit.

7. A metal impurity detection computer device, used in a metal impurity detection method according to any one of claims 3 to 6, characterized in that: The invention comprises a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the metal impurity detection device to complete the metal impurity detection method.

8. A metal impurity detection computer device according to claim 7, characterized in that: The computer program operates in conjunction with sensor hardware that implements the software and algorithms.

9. A metal impurity detection computer device according to claim 7, characterized in that: The computer equipment acting on the metal impurity measurement processing module includes CPU, RAM, ROM, NVM, SPI, IO, and UART.

10. A metal impurity detection computer device according to claim 9, characterized in that: The working mode of the computer device acting on the metal impurity measurement processing module includes: the CPU executes the program instructions stored in the ROM, the ROM stores the algorithm program of the capacitance measurement data, the RAM stores the temporary data during the program running process, the NVM saves the benchmark data and the program algorithm parameters, the SPI and UART realize the data interaction with other modules, and the IO drives the LED and speaker functions of the display module.

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