Electromagnetic scattering and transmission test system, equipment and test method

Abstract

The invention discloses an electromagnetic scattering and transmission test system, device and method, and the system comprises a support which is disposed in a darkroom; the sample table is arranged in the support, the plane where the arc of the support is located is perpendicular to the plane where the sample table is located, and the circle center of the arc coincides with the center of the sample table; the horn antennas are fixedly installed on the support, and the caliber of each horn antenna points to the center of the arc; the control module is connected with the horn antenna and used for controlling the horn antenna to transmit or receive the electromagnetic wave signal; and the data processing module is connected with the horn antenna and is used for processing the collected electromagnetic wave signals to obtain various electromagnetic scattering parameters of the sample to be detected. The circuit can be widely applied to the technical field of electronic circuits.

Description

Technical Field

[0001] The present application relates to the field of microwave testing technology, and in particular to an electromagnetic scattering and transmission testing system, equipment and testing method. Background Art

[0002] With the rapid development of microwave technology, various microwave devices and materials have been widely used in the fields of communication and radar. Microwave scattering characteristics refer to the reflection, refraction, scattering and other phenomena that occur when a signal interacts with a medium or object, mainly including scattering loss, scattering influence and scattering gain, etc., which are inevitable topics in the research and design of carrier stealth and electromagnetic structure. Therefore, accurately measuring the microwave scattering and transmission characteristics of the material surface is of great help in improving the efficiency and accuracy of microwave device design.

[0003] In existing test systems, there are generally only two probes for transmitting and receiving scattered signals, and some multi-probe systems can only be maintained in one plane or a limited angle, which makes it difficult to meet the current full three-dimensional testing needs. Although the test system formed by methods such as a turntable can cover multiple angle planes, it cannot take into account the application requirements of simultaneous testing. Therefore, there are still technical problems that need to be solved in the relevant technology. Summary of the invention

[0004] The purpose of this application is to solve one of the technical problems existing in the prior art to at least a certain extent.

[0005] To this end, an object of an embodiment of the present application is to provide an electromagnetic scattering and transmission testing system, equipment and testing method, the architecture and implementation method of which can improve the practicality of the system and the accuracy of the test.

[0006] In order to achieve the above-mentioned technical objectives, the technical solutions adopted in the embodiments of the present application include: an electromagnetic scattering and transmission testing system, including: a bracket, arranged in a darkroom; a sample stage, arranged inside the bracket, and the plane where the arc of the bracket is located is perpendicular to the plane where the sample stage is located, and the center of the arc coincides with the center of the sample stage; a plurality of horn antennas, fixedly mounted on the bracket, and the aperture of each horn antenna points to the center of the arc; a control module, connected to the horn antenna, for controlling the horn antenna to transmit or receive electromagnetic wave signals; a data processing module, connected to the horn antenna, for processing the collected electromagnetic wave signals to obtain a variety of electromagnetic scattering parameters of the sample to be tested.

[0007] The present application can realize the collection process of electromagnetic scattering parameters in a darkroom through several horn antennas arranged on a bracket in a darkroom, a control module that controls the horn antenna to transmit or receive electromagnetic wave signals, and a data processing module that can process electromagnetic wave signals. At the same time, the collection of electromagnetic scattering parameters at multiple angles can be realized through several horn antennas arranged on a bracket. The present application can improve the accuracy of the test system and the practicality of the test system.

[0008] In addition, the electromagnetic scattering and transmission testing system according to the above embodiment of the present application may also have the following additional technical features:

[0009] Furthermore, in the embodiment of the present application, the bracket is spherical or hemispherical.

[0010] Furthermore, in the embodiment of the present application, the number of the horn antennas is 5-200.

[0011] Furthermore, in an embodiment of the present application, the horn antenna includes a transmitting antenna and a plurality of receiving antennas; the transmitting antenna is arranged at the top of the bracket and the transmitting antenna is arranged opposite to the sample stage; the center of the transmitting antenna coincides with the center of the sample stage in a direction perpendicular to the placement direction of the sample stage.

[0012] Furthermore, in an embodiment of the present application, the support includes a plurality of arch-shaped structure supports; and the spacing angle between any two of the arch-shaped structure supports is 5-90 degrees.

[0013] Furthermore, in the embodiment of the present application, the outside of any one of the arch-shaped structure supports is wrapped with a layer of absorbing material; the absorbing material is used to absorb electromagnetic waves.

[0014] Furthermore, in an embodiment of the present application, the absorbing material is provided with an opening at a corresponding position of any installation location of the horn antenna, and the shape of the opening is the same as the shape of the aperture of the horn antenna, and the size of the opening is equal to the aperture of the horn antenna.

[0015] Furthermore, in the embodiment of the present application, the horn antenna is a dual-polarization horn.

[0016] In addition, the present application also provides an electromagnetic scattering and transmission testing device, including any of the electromagnetic scattering and transmission testing systems described above.

[0017] In addition, the present application also provides an electromagnetic scattering and transmission test method, which is implemented by the electromagnetic scattering and transmission test system described in any of the above items, and the method includes:

[0018] Place the sample to be tested on the sample stage in the dark room;

[0019] The control module sends a control signal to a plurality of horn antennas arranged on the bracket so that the horn antennas emit electromagnetic wave signals, and collects the electromagnetic wave signals reflected and scattered by the sample to be tested and sends them to the data processing module;

[0020] The data processing module processes the electromagnetic wave signal to obtain electromagnetic scattering parameters of the sample to be tested in multiple directions.

[0021] The advantages and benefits of the present application will be partially given in the following description, and partially become apparent from the following description, or be understood through the practice of the present application:

[0022] The present application can realize the collection process of electromagnetic scattering parameters in a darkroom through several horn antennas arranged on a bracket in a darkroom, a control module that controls the horn antenna to transmit or receive electromagnetic wave signals, and a data processing module that can process electromagnetic wave signals. At the same time, the collection of electromagnetic scattering parameters at multiple angles can be realized through several horn antennas arranged on a bracket. The present application can improve the accuracy of the test system and the practicality of the test system. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a schematic diagram of a spherical testing system based on multiple probes in an embodiment of the present invention;

[0024] Figure 2 is a connection diagram of a spherical test system based on multiple probes in an embodiment of the present invention;

[0025] Figure 3 is a schematic diagram of a horn antenna transmitting and receiving signals in an embodiment of the present invention;

[0026] Figure 4 is a schematic structural diagram of a hemispherical antenna support in an embodiment of the present invention that is not wrapped with absorbing material;

[0027] Figure 5 It is a schematic diagram of a spherical testing system composed of two hemispherical testing systems with multiple probes according to an embodiment of the present invention. DETAILED DESCRIPTION

[0028] The embodiments of the present invention are described in detail below with reference to the accompanying drawings to illustrate the principles and processes of the electromagnetic scattering and transmission testing system, equipment and testing method in the embodiments of the present invention.

[0029] Reference Figure 1 as well as Figure 2, the present application provides an electromagnetic scattering and transmission test system. The system includes an antenna bracket 1, a dual-polarized horn antenna 2 fixed inside the antenna bracket, and the antenna bracket can be spherical or hemispherical. The horn antennas are fixed at positions of 15 degrees, 30 degrees, 45 degrees, 60 degrees, 75 degrees and 90 degrees to the horizontal plane, respectively, and their apertures point to the center of the arc. The sample stage 3 is fixed inside the hemispherical antenna bracket, and the center of the sample stage coincides with the center of the arc of the hemispherical antenna bracket, thereby ensuring the test requirements and improving the measurement accuracy. All horn antennas are connected to the control module 5 through a bus 4. In the control module 5, the matrix switch, as an intermediate stage, connects the vector network analyzer and the above-mentioned horn antenna through a coaxial line, and controls the horn antenna to radiate or receive electromagnetic wave signals. The computer controls the matrix switch and the vector network analyzer, reads the measured data, and processes and analyzes it with the data processing module. Among them, Figure 2 VNA stands for Vector Network Analyzer, and PC stands for Computer.

[0030] As an optional implementation, the outside of the hemispherical antenna bracket is wrapped with an absorbing material, which has good absorbing properties and can absorb interfering electromagnetic waves in space, while preventing the hemispherical antenna bracket from reflecting the electromagnetic wave signal emitted by the horn antenna and affecting the accuracy of the experiment. The above material should completely wrap the entire antenna bracket, and a small hole with the same diameter as the horn antenna should be made at the location where the horn antenna is installed for installing the horn antenna.

[0031] As an optional implementation, the horn antenna adopts coaxial back-feed excitation and can emit horizontal and vertical polarized electromagnetic waves. The horn antenna is fixed inside the hemispherical antenna bracket through a flange and an end plate.

[0032] As a further optional implementation, the matrix switch serves as an intermediate stage to connect the vector network analyzer and the dual-polarization horn antenna, and controls the horn antenna to transmit or receive electromagnetic waves.

[0033] In this embodiment, multiple dual-polarized horn antennas are installed on the arc part of the hemispherical antenna bracket, which are 15 degrees, 30 degrees, 45 degrees, 60 degrees, 75 degrees and 90 degrees to the horizontal plane, and the absorbing material with good absorbing characteristics is wrapped on the outside of the hemispherical antenna bracket to reduce the interference of external electromagnetic waves. At the same time, on the sample stage inside the hemispherical antenna bracket, the horn antenna is controlled to transmit and receive electromagnetic waves by using a matrix switch, and the received signals are processed and analyzed by data processing software. Thus, a test system based on a hemispherical antenna array that can measure the scattering characteristics of absorbing materials is realized.

[0034] This embodiment is based on the scattering characteristic test method of the multi-probe multi-function bow frame test system, which can realize the measurement of electromagnetic wave reflection, transmission, and scattering parameters of the sample in multiple directions in space; the specific implementation case is as follows:

[0035] Example 1: Measuring the scattering properties of a material

[0036] Test the scattering properties of the test material, such as Figure 3 shown.

[0037] 1) First, place a calibration metal plate on the sample stage 3, and control the top horn antenna of the hemispherical antenna bracket to transmit signals and the remaining horn antennas to receive signals through the matrix switch;

[0038] 2) Under the condition of testing an empty darkroom, calibrate the background of the microwave darkroom on the software;

[0039] 3) After completing the calibration of all horn antennas, replace the calibration metal plate with the sample to be tested, control the horn antenna to transmit and receive signals through the matrix switch, and record the scattered signals of the test material in all directions in space;

[0040] 4) Calculate and restore the scattering characteristics of the sample to be tested to electromagnetic waves in all directions in space through the test value of the test material.

[0041] The scattering characteristics of the material tested by this method are related to the working frequency of the horn antenna and the surface shape of the material. During the test of this method, due to the large size of the hemispherical antenna bracket and the fact that part of the signal power is transmitted along the mirror reflection or absorbed by the material, there may be a problem that the signal received by the receiving horn antenna is very weak, and it may even be difficult to detect accurately. As an optional implementation, a power amplifier and an isolator can be added to the transmitting end of the vector network analyzer, and a swept frequency time domain method can be used to make the transmitting antenna transmit a high-power frequency step signal, thereby obtaining the scattering response of the material to be tested to different frequencies. Next, necessary data processing can be performed. The specific idea is to add a time domain gate through the conversion of "frequency domain → time domain → frequency domain", filter out other interference signals, and finally obtain the scattering signals and their laws of the dielectric material to be tested at different frequencies and in all directions. The test frequency range in this method is determined by the working range of the vector network analyzer.

[0042] During the test process of this method, due to the large interval between the hemispherical antenna brackets, there may be scattered signals at some angles that are not captured by the horn antenna, resulting in a low accuracy in restoring the microwave scattering characteristics of the sample to be tested. Furthermore, if it is necessary to obtain a more accurate and comprehensive test and restoration of the scattering characteristics of the dielectric material to be tested in all directions, as an optional implementation, the sample stage can be replaced with an automated sample stage that can rotate around the normal of the sample stage. After one round of the test process in the above embodiment 1 is completed, the automated sample stage is rotated a certain angle as required, and the angle range is between 0-60 degrees. Then the test process in the above embodiment 1 is repeated to obtain the signals that were not captured in the previous round of testing. This operation can select a suitable rotation angle according to the needs and perform multiple step tests until the information obtained meets the test accuracy requirements.

[0043] As an optional implementation, Figure 5 As shown, two hemispherical antennas of the same size can be combined and connected to form a complete spherical multi-probe spherical electromagnetic scattering and transmission test system to simultaneously measure the omnidirectional reflection, scattering and projection performance of the material. Figure 1 The absorbing material shown, Figure 5 The above-mentioned absorbing material is not drawn in order to show the support structure.

[0044] In summary, the test system of this embodiment has the following beneficial effects compared with the prior art:

[0045] (1) This embodiment uses multiple dual-polarized horn antennas to achieve multi-directional and multi-angle spatial measurement.

[0046] (2) In this embodiment, the bracket body is wrapped with absorbing material, which can reduce the influence of the device itself on the measurement results.

[0047] (3) The spherical electromagnetic scattering and transmission test system of this embodiment can realize the function of measuring multiple electromagnetic parameters.

[0048] This embodiment also provides a testing method, which is applied to a multi-probe bow frame testing system, comprising the following steps:

[0049] S1. Place the sample to be tested on the automated sample stage;

[0050] S2, controlling the vector network analyzer to generate electromagnetic wave signals, controlling the horn antenna to transmit electromagnetic wave signals and receive electromagnetic wave signals reflected and scattered by the sample to be tested through the matrix switch;

[0051] S3. Based on the processing of the collected electromagnetic wave signals, multiple electromagnetic parameters such as reflection, transmission, and scattering of the material in multiple directions are obtained.

[0052] In addition, in some embodiments of the present application, an electromagnetic scattering and transmission testing device is also provided, which may include one or more testing systems and a display device, and the test results of the multiple testing systems may be displayed on the display device.

[0053] In some optional embodiments, the function / operation mentioned in the block diagram may not occur in the order mentioned in the operation diagram. For example, depending on the function / operation involved, the two boxes shown in succession can actually be executed substantially simultaneously or the boxes can sometimes be executed in reverse order. In addition, the embodiment presented and described in the flow chart of the application is provided by way of example, for the purpose of providing a more comprehensive understanding of technology. The disclosed method is not limited to the operation and logic flow presented herein. Optional embodiments are expected, wherein the order of various operations is changed and the sub-operation described as a part of a larger operation is performed independently.

[0054] In addition, although the present application is described in the context of functional modules, it should be understood that, unless otherwise specified, one or more of the functions and / or features can be integrated into a single physical device and / or software module, or one or more functions and / or features can be implemented in a separate physical device or software module. It is also understood that a detailed discussion of the actual implementation of each module is unnecessary for understanding the present application. More specifically, in view of the properties, functions, and internal relationships of the various functional modules in the device disclosed herein, the actual implementation of the module will be understood within the conventional techniques of the engineer. Therefore, those skilled in the art can implement the present application set forth in the claims without excessive experimentation using ordinary techniques. It is also understood that the specific concepts disclosed are merely illustrative and are not intended to limit the scope of the present application, which is determined by the full scope of the attached claims and their equivalents.

[0055] The logic and / or steps represented in the flowchart or otherwise described herein, for example, may be considered as an ordered list of executable programs for implementing the logical functions, and may be embodied in any computer-readable medium for use by a program execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch and execute a program from a program execution system, device or apparatus), or in conjunction with such program execution systems, devices or apparatuses. For purposes of this specification, a "computer-readable medium" may be any device that can contain, store, communicate, propagate or transmit a program for use by a program execution system, device or apparatus, or in conjunction with such program execution systems, devices or apparatuses.

[0056] In the above description of this specification, the description with reference to the terms "one embodiment / example", "another embodiment / example" or "certain embodiments / examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0057] Although the embodiments of the present application have been shown and described, those skilled in the art will appreciate that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present application, and that the scope of the present application is defined by the claims and their equivalents.

[0058] The above is a specific description of the preferred implementation of the present application, but the present application is not limited to the described embodiments. Technical personnel familiar with the field may make various equivalent modifications or substitutions without violating the spirit of the present application. These equivalent modifications or substitutions are all included in the scope defined by the claims of the present application.

Claims

1. An electromagnetic scattering and transmission test system, characterized in that: include: A bracket is arranged in a dark room; A sample stage is arranged inside the bracket, and the plane where the arc of the bracket is located is perpendicular to the plane where the sample stage is located, and the center of the arc coincides with the center of the sample stage; A plurality of horn antennas are fixedly mounted on the bracket, and the aperture of each horn antenna points to the center of the arc; A control module, connected to the horn antenna, and used to control the horn antenna to transmit or receive electromagnetic wave signals; The data processing module is connected to the horn antenna and is used to process the collected electromagnetic wave signals to obtain a variety of electromagnetic scattering parameters of the sample to be tested.

2. The electromagnetic scattering and transmission testing system according to claim 1, characterized in that: The bracket is spherical or hemispherical.

3. The electromagnetic scattering and transmission testing system according to claim 1, characterized in that: The number of the horn antennas is 5-200.

4. The electromagnetic scattering and transmission testing system according to claim 1, characterized in that: The horn antenna includes a transmitting antenna and a plurality of receiving antennas; the transmitting antenna is arranged on the top of the bracket and is arranged opposite to the sample stage; the center of the transmitting antenna coincides with the center of the sample stage in a direction perpendicular to the placement direction of the sample stage.

5. The electromagnetic scattering and transmission testing system according to claim 1, characterized in that: The support comprises a plurality of arch-shaped structure supports; the interval angle between any two of the arch-shaped structure supports is 5-90 degrees.

6. The electromagnetic scattering and transmission testing system according to claim 5, characterized in that: The outside of any one of the arch-shaped structure supports is wrapped with a layer of absorbing material; the absorbing material is used to absorb electromagnetic waves.

7. The electromagnetic scattering and transmission testing system according to claim 6, characterized in that: The absorbing material is provided with an opening at a corresponding position of any installation position of the horn antenna, and the shape of the opening is the same as the shape of the aperture of the horn antenna, and the size of the opening is equal to the aperture of the horn antenna.

8. The electromagnetic scattering and transmission testing system according to claim 1, characterized in that: The horn antenna is a dual-polarization horn.

9. An electromagnetic scattering and transmission testing device, characterized in that: The electromagnetic scattering and transmission testing system comprises one or more of claims 1-8.

10. An electromagnetic scattering and transmission test method, characterized in that: The method is implemented by the electromagnetic scattering and transmission testing system according to any one of claims 1 to 8, and comprises: Place the sample to be tested on the sample stage in the dark room; The control module sends a control signal to a plurality of horn antennas arranged on the bracket so that the horn antennas emit electromagnetic wave signals, and collects the electromagnetic wave signals reflected and scattered by the sample to be tested and sends them to the data processing module; The data processing module processes the electromagnetic wave signal to obtain electromagnetic scattering parameters of the sample to be tested in multiple directions.

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