Antenna test method and antenna test system

Abstract

The invention provides an antenna test method and an antenna test system. The antenna test method comprises the following steps: acquiring test parameters of n to-be-tested products; the test parameters comprise any one of return loss, voltage standing wave ratio and reflection coefficient; determining a feature mean value of the n to-be-tested products based on the test parameters of the n to-be-tested products; determining a feature deviation mean value of the pth to-be-tested product based on the test parameters and the feature mean value of the pth to-be-tested product in the n to-be-tested products; if the characteristic deviation mean value is greater than or equal to a first preset value, determining that the pth to-be-detected product does not meet a preset requirement; n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1 and less than or equal to n. According to the application, the test parameters of the n to-be-tested products are introduced into the test evaluation of the pth to-be-tested product to obtain the feature deviation mean value of the pth to-be-tested product, so that the accuracy of the test result and the consistency of the to-be-tested products can be improved.

Description

Technical Field

[0001] The present application relates to the field of antennas, and in particular to an antenna testing method and an antenna testing system. Background Art

[0002] In some communication devices, the metal frame of the product is also used as an antenna to receive and send signals. For example, the metal frame on the side of a mobile phone is connected to the circuit board inside the phone to achieve the function of transmitting / receiving signals.

[0003] The inner cavity structure of the mobile phone frame has defects, which will cause abnormalities in the basic communication functions of the mobile phone, resulting in a poor user experience. Some defects in the inner cavity structure of the product can be detected through product disassembly, direct current impedance (DCR) detection, automatic X-ray detection and other detection methods. However, product disassembly detection is prone to scratches on the product structure surface and surface functional areas, which cannot be restored. In the direct current impedance (DCR) detection, due to the problem of the inner cavity structure morphology of the product, it is easy to cause the DCR measurement value to be infinite (in circuit theory, it is an open circuit state). In the automatic X-ray detection, there is a situation where the automatic X-ray detection passes, but it fails during the functional verification. The current detection method cannot effectively detect the structural defects of the inner cavity of the mobile phone frame antenna. Summary of the invention

[0004] In order to solve the problems in the prior art, the present application provides an antenna testing method and an antenna testing system to realize the detection of structural defects in the antenna cavity.

[0005] The present application provides an antenna testing method, the antenna testing method comprising: Obtaining values ​​of test parameters of n products to be tested; the types of the test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient; Determining characteristic means of the n products to be tested based on the test parameters of the n products to be tested; Determine a characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean; If the characteristic deviation mean is greater than or equal to a first preset value, it is determined that the pth product to be tested does not meet the preset requirements; both n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1, and less than or equal to n.

[0006] In one embodiment, obtaining the test parameters of n products to be tested includes: Obtaining test parameters of the m+1th to be tested product to the m+nth to be tested product; wherein m is an integer greater than or equal to 0; Alternatively, the test parameters of the 1st to m+nth products to be tested are obtained.

[0007] In one embodiment, the product to be tested includes a plurality of test areas; and obtaining the test parameters of n products to be tested includes: Obtaining test parameters of the i-th test area among the n products to be tested; The determining the characteristic means of the n products to be tested based on the test parameters of the n products to be tested includes: Determine, based on the test parameters of the i-th test area among the n products to be tested, the characteristic mean of the n products to be tested in the i-th test area; The determining the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean, comprises: Based on the test parameters of the ith test area in the pth product to be tested and the characteristic mean, a characteristic deviation mean of the ith test area in the pth product to be tested is determined.

[0008] In one embodiment, determining the feature means of the n products to be tested based on the test parameters of the n products to be tested includes: Calculate the arithmetic mean of the test parameters of the n products to be tested to obtain the characteristic mean of the n products to be tested.

[0009] In one embodiment, obtaining the test parameters of n products to be tested includes: Conduct multiple tests on each product to be tested to obtain multiple sets of test parameters; The determining the characteristic means of the n products to be tested based on the test parameters of the n products to be tested includes: Conduct multiple tests on each product to be tested to obtain multiple sets of test parameters; Calculating the arithmetic mean of the multiple groups of test parameters to obtain a first characteristic value of each product to be tested; Calculate the arithmetic mean of the first characteristic values ​​of the n products to be tested to obtain a characteristic mean.

[0010] In one embodiment, determining the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean includes: Calculate the difference between the test parameter of the pth product to be tested and the characteristic mean to obtain a first difference; The first difference is divided by (n-1) to obtain the characteristic deviation mean.

[0011] In one embodiment, the antenna testing method further includes: The difference between the maximum value and the standard maximum value of the test parameters of the n products to be tested is calculated to obtain the first preset value.

[0012] In one embodiment, the antenna testing method further includes: If the characteristic deviation mean of the pth product to be tested is greater than or equal to a second preset value, a warning signal is output; and the second preset value is less than the first preset value.

[0013] In one embodiment, after determining the characteristic deviation mean of the p-th product to be tested, the antenna testing method further includes: Performing a square operation on the characteristic deviation mean to obtain a standard deviation value; Performing a square operation on the first preset value to obtain a first standard value; Displaying the standard deviation value and the first standard value on a test interface; If the standard deviation value is greater than or equal to the first standard value, it is determined that the pth product to be tested does not meet the preset requirements.

[0014] In one embodiment, before determining the characteristic mean values ​​of the n products to be tested based on the test parameters of the n products to be tested, the antenna testing method further includes: Determine whether the test parameters of the product to be tested are within the preset range. If the test parameters of the product to be tested are outside the preset range, determine that the product to be tested does not meet the preset requirements. If the test parameters of the product to be tested are within the preset range, determine that the product to be tested meets the preset requirements. Select the test parameters of the n products to be tested that are within the preset range, and determine the characteristic means of the n products to be tested.

[0015] In one embodiment, n is greater than or equal to 32.

[0016] The present application also proposes an antenna testing system, the antenna testing system comprising: A vector analyzer, the vector analyzer having a signal transmitting end and a signal receiving end; the signal transmitting end is spaced apart from the product to be tested, and is used to transmit an excitation signal; the signal receiving end is spaced apart from the product to be tested, and is used to receive a response signal generated by the product to be tested based on the excitation signal; the vector analyzer is used to determine the test parameters of n products to be tested based on the response signal; the test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient; A main control module, the main control module is used to determine the test parameters of n products to be tested based on the response signal; the test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient; The main control module is further used to determine the characteristic mean of the n products to be tested based on the test parameters of the n products to be tested; and determine the characteristic deviation mean of the pth product to be tested based on the test parameters of the pth product to be tested among the n products to be tested and the characteristic mean; The main control module is also used to determine that the pth product to be tested does not meet the preset requirements when the mean value of the characteristic deviation is greater than or equal to a first preset value; both n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1 and less than or equal to n.

[0017] The antenna testing method and antenna testing system of the present application calculate the test parameters of n products to be tested to obtain the characteristic mean of n products to be tested. The characteristic deviation mean of the p-th product to be tested is obtained by calculating the characteristic mean and the test parameters of the p-th product to be tested, and when the characteristic deviation mean is greater than or equal to a first preset value, the p-th product to be tested is determined to be unqualified. In this way, the test parameters of the n products to be tested are introduced into the test evaluation of the p-th product to be tested to obtain the characteristic deviation mean of the p-th product to be tested, which can improve the accuracy of the test results and the consistency of the products to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 FIG. 1 is a schematic diagram of a module architecture of an antenna testing system according to an embodiment of the present application.

[0019] Figure 2 This is a flow chart of an embodiment of an antenna testing method of the present application.

[0020] Figure 3 This is a flow chart of an embodiment of obtaining test parameters of the present application.

[0021] Figure 4 This is a flowchart of another embodiment of obtaining test parameters of the present application.

[0022] Figure 5 This is a flow chart of another embodiment of the antenna testing method of the present application.

[0023] Figure 6 This is a schematic diagram of an embodiment of multiple test areas of a product to be tested in the present application.

[0024] Figure 7 This is a flow chart of an embodiment of calculating feature mean values ​​in the present application.

[0025] Figure 8 This is a flow chart of another embodiment of calculating feature mean value in the present application.

[0026] Fig. 9 This is a flow chart of an embodiment of calculating the characteristic screen deviation mean value of the present application.

[0027] Fig.10 This is a flow chart of another embodiment of the antenna testing method of the present application.

[0028] Fig.11 This is a flow chart of another embodiment of the antenna testing method of the present application.

[0029] Fig.12 This is a flow chart of another embodiment of the antenna testing method of the present application.

[0030] Description of the symbols of the main components: antenna test system-100; vector analyzer-111; signal transmitting end-111; signal receiving end-112; main control module-130.

[0031] The following specific implementation methods will further illustrate the present application in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0032] The following description will refer to the accompanying drawings to more fully describe the content of the present application. Shown in the accompanying drawings are exemplary embodiments of the present application. However, the present application can be implemented in many different forms and should not be construed as being limited to the exemplary embodiments set forth herein. These exemplary embodiments are provided to make the present application thorough and complete, and to fully convey the scope of the present application to those skilled in the art. Similar reference numerals represent identical or similar components.

[0033] The terms used herein are only used for the purpose of describing specific exemplary embodiments and are not intended to limit the present application. As used herein, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to also include the plural forms. In addition, when used herein, "including" and / or "comprising" and / or "having", integers, steps, operations, components and / or components, but do not exclude the existence or addition of one or more other features, regions, integers, steps, operations, components and / or groups thereof.

[0034] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this application belongs. In addition, unless explicitly defined herein, terms such as those defined in general dictionaries should be interpreted as having a meaning consistent with their meaning in the relevant technology and the content of this application, and will not be interpreted as an idealized or overly formal meaning.

[0035] The following will describe exemplary embodiments in conjunction with the accompanying drawings. It should be noted that the components depicted in the reference drawings are not necessarily shown to scale; and the same or similar components will be given the same or similar reference numerals or similar technical terms.

[0036] Reference Figure 1The present application proposes an antenna testing system 100, which includes a vector analyzer 110 and a main control module 130. The vector analyzer 110 has a signal transmitting end 111 and a signal receiving end 112. The signal transmitting end 111 is spaced apart from the product to be tested, and is used to transmit an excitation signal. The signal receiving end 112 is spaced apart from the product to be tested, and is used to receive a response signal generated by the product to be tested based on the excitation signal. The vector analyzer 110 can control the signal transmitting end 111 to transmit the excitation signal, and receive the response signal. The vector analyzer 110 is also used to determine the test parameters of n products to be tested based on the response signal.

[0037] In this embodiment, the signal transmitting end 111 can be a microwave coupled directional transmitter, and the signal receiving end 112 can be a microwave receiver. The main control module 130 can be a host computer, a controller, etc. The product to be tested can be an antenna component or a product including an antenna component, for example, a frame antenna, a built-in flat cable, etc. The main control module 130 can be electrically connected to the vector analyzer 110, and analyze the product to be tested based on the test parameters output by the vector analyzer 110. Alternatively, the main control module can be integrated into the vector analyzer 110, and directly output the test results after analyzing the product to be tested based on the received test parameters.

[0038] The signal transmitting end 111 can continuously transmit an excitation signal of a specific frequency band to the product under test to excite the product under test. The signal receiving end 112 can receive a response signal of the product under test based on the excitation signal, and analyze the excitation signal and the response signal through the vector analyzer 110 to determine the test parameters such as the return loss, voltage standing wave ratio, and reflection coefficient of the product under test. Among them, the frequency of the excitation signal can be set according to actual needs and is not limited here. For example, for a product under test for 5G communication, it can be set to 600MHz~5GHz.

[0039] The distance between the signal transmitting end 111 and the signal receiving end 112 and the product to be tested can be set according to the actual application. For example, it can be set to 3-5 mm. In this way, it can avoid that the signal transmitting end 111 and the signal receiving end 112 contact with the product to be tested and damage the product to be tested, and it can also reduce interference and loss in signal transmission.

[0040] In one embodiment, the types of test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient. Return loss is the proportion of response signal generated due to impedance mismatch in the transmission line. Voltage standing wave ratio refers to the ratio of the transmitted voltage standing wave and the reflected voltage standing wave in the transmission line. Reflection coefficient refers to the ratio of the reflected voltage to the incident voltage. Return loss, voltage standing wave ratio, and reflection coefficient can be used to evaluate the performance of the antenna.

[0041] In one embodiment, the main control module 130 is further used to determine the characteristic mean of the n products to be tested based on the values ​​of the test parameters of the n products to be tested; and, based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean, determine the characteristic deviation mean of the p-th product to be tested. The main control module 130 is also used to determine that the p-th product to be tested does not meet the preset requirements when the characteristic deviation mean is greater than or equal to a first preset value; n and p are both integers, n is greater than or equal to 2, p is greater than or equal to 1, and less than or equal to n.

[0042] For example, taking return loss as an example, the value of the test parameter may be a return loss extreme difference value, that is, a maximum return loss value; or the value of the test parameter may be an optimal value of return loss, that is, a minimum return loss value; or the value of the test parameter may be any value between the maximum value and the minimum value of return loss. In this embodiment, taking the return loss extreme difference value as an example, by testing n products to be tested, n return loss extreme difference values ​​may be obtained.

[0043] By transmitting an excitation signal to the product to be tested, a response signal can be obtained at the end sensitive position of the product to be tested. The excitation signal and the response signal can characterize the loss condition of the product to be tested. By analyzing the excitation signal and the response signal, the signal is converted into a return loss value, and n return loss extreme values ​​are calculated to obtain the characteristic mean of the n products to be tested. The characteristic mean can characterize the average state of the n parameters to be tested.

[0044] By calculating the return loss extreme value and characteristic mean of the pth product to be tested, the characteristic deviation mean of the pth product to be tested is obtained. The characteristic deviation mean can reflect the degree of difference between the pth product to be tested and the other n-1 products to be tested. Then, the loss condition of the product to be tested can be automatically evaluated based on the characteristic deviation mean.

[0045] If the characteristic deviation mean is greater than or equal to the first preset value, the pth product to be tested is determined to be unqualified. The first preset value may be set as a fixed standard value according to actual application, or the first preset value may be determined according to the test parameters of the n products to be tested.

[0046] The present application achieves contactless testing of the product to be tested by spacing the signal transmitting end 111 and the signal receiving end 112 from the product to be tested, thereby avoiding damage to the product to be tested. The signal data of the product to be tested is obtained by transmitting an excitation signal and receiving a response signal, and then the test parameters of the product to be tested are determined based on the excitation signal and the response signal, and the test parameters of multiple products to be tested are calculated to obtain the characteristic deviation mean that characterizes the antenna loss condition. In this way, the characteristic deviation mean obtained based on the transmission signal and the response signal can accurately reflect the radiation performance of the antenna, so that the loss condition of the product to be tested can be automatically evaluated.

[0047] Reference Figure 2 The present application also proposes an antenna testing method, which is applied to the above-mentioned antenna testing system 100. The antenna testing method includes: S1: Obtain values ​​of test parameters of n products to be tested; the types of the test parameters include at least one of return loss, voltage standing wave ratio, and reflection coefficient.

[0048] For example, the test parameter may be a return loss extreme difference value, i.e., a maximum return loss value, or an optimal return loss value, i.e., a minimum return loss value, or an intermediate value between the maximum return loss value and the minimum return loss value. In this embodiment, taking the return loss extreme difference value as an example, n return loss extreme difference values ​​may be obtained by testing n products to be tested.

[0049] S2: Determine characteristic means of the n products to be tested based on the test parameters of the n products to be tested.

[0050] S3: Determine the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean.

[0051] By transmitting an excitation signal to the product to be tested, a response signal can be obtained at the end sensitive position of the product to be tested. The excitation signal and the response signal can characterize the loss condition of the product to be tested. By analyzing the excitation signal and the response signal, the signal is converted into a return loss value, and n return loss extreme values ​​are calculated to obtain the characteristic mean of the n products to be tested. The characteristic mean can characterize the average state of the n parameters to be tested. The characteristic mean can be any one of the arithmetic mean, the root mean square mean, and the geometric mean.

[0052] By calculating the return loss extreme value and characteristic mean of the pth product to be tested, the characteristic deviation mean of the pth product to be tested is obtained. The characteristic deviation mean can reflect the degree of difference between the pth product to be tested and the other n-1 products to be tested. Then, the loss condition of the product to be tested can be automatically evaluated based on the characteristic deviation mean.

[0053] S4: If the characteristic deviation mean is greater than or equal to a first preset value, it is determined that the pth product to be tested does not meet the preset requirements; both n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1 and less than or equal to n.

[0054] The first preset value may be set as a fixed standard value according to actual application, or the first preset value may be determined according to test parameters of n products to be tested.

[0055] The present application calculates the test parameters of n products to be tested to obtain the characteristic mean of n products to be tested. By calculating the characteristic mean and the test parameters of the pth product to be tested, the characteristic deviation mean of the pth product to be tested is obtained, and when the characteristic deviation mean is greater than or equal to the first preset value, the pth product to be tested is determined to be unqualified. In this way, the test parameters of n products to be tested are introduced into the test evaluation of the pth product to be tested to obtain the characteristic deviation mean of the pth product to be tested, which can improve the accuracy of the test results and the consistency of the products to be tested.

[0056] In one embodiment, n is greater than or equal to 32. By using the test parameters of greater than or equal to 32 samples to be tested to calculate the characteristic deviation mean, a more accurate test result can be obtained.

[0057] Reference Figure 3 In one embodiment, step S1 includes: S11: Acquire test parameters of the m+1th to m+nth products to be tested, where m is an integer greater than or equal to 0.

[0058] For example, n is 32. When testing the 32nd product to be tested, the test parameters of the 1st to 32nd products to be tested are obtained respectively, and the characteristic deviation mean of the 32nd product to be tested is calculated based on the test parameters of the 1st to 32nd products to be tested. When testing the 33rd product to be tested, the test parameters of the 2nd to 33rd products to be tested are obtained respectively, and the characteristic deviation mean of the 33rd product to be tested is calculated based on the test parameters of the 2nd to 33rd products to be tested... When testing the m+1th product to be tested, the test parameters of the mth to m+32th products to be tested are obtained respectively, and the characteristic deviation mean of the m+32th product to be tested is calculated based on the test parameters of the mth to m+32th products to be tested. In this way, the number of test parameters involved in calculating the characteristic deviation mean is maintained at 32, and an accurate characteristic deviation mean can be calculated based on the test parameters of the product to be tested currently being tested. The other 31 products to be tested can use the same method to calculate the characteristic deviation mean values, and then compare them with the first preset value to complete the test. Alternatively, a standard sample can be selected to participate in the test of the 32nd product to be tested.

[0059] Reference Figure 4 In one embodiment, step S1 includes: S12: Obtain test parameters of the first to m+nth products to be tested.

[0060] For example, the number n in the acquisition of test parameters of n products to be tested can be increased as the number of tests increases. For example, when testing the 32nd product to be tested, the test parameters of the 1st to 32nd products to be tested are acquired respectively, and the characteristic deviation mean of the 32nd product to be tested is calculated based on the test parameters of the 1st to 32nd products to be tested. When testing the 33rd product to be tested, the test parameters of the 1st to 33rd products to be tested are acquired respectively, and the characteristic deviation mean of the 33rd product to be tested is calculated based on the test parameters of the 1st to 33rd products to be tested... When testing the m+1th product to be tested, the test parameters of the 1st to m+32nd products to be tested are acquired respectively, and the characteristic deviation mean of the m+32th product to be tested is calculated based on the test parameters of the 1st to m+32nd products to be tested. In this way, the test parameters of each product to be tested can be used to update the characteristic deviation mean, which can improve the accuracy of the characteristic deviation mean. The other m+31 products to be tested can use the same method to calculate the characteristic deviation mean, and then compare it with the first preset value to complete the test. Alternatively, a standard sample is selected to participate in the test of the m+32th product to be tested.

[0061] Reference Figure 5 In one embodiment, the product to be tested includes a plurality of test areas, and step S1 includes: S13: Obtain test parameters of the i-th test area among the n products to be tested.

[0062] Step S2 includes: S21: Determine a characteristic mean value of the n products to be tested in the i-th test area based on the test parameters of the i-th test area among the n products to be tested.

[0063] Step S3 includes: S31: Determining the characteristic deviation mean of the ith test area in the pth product to be tested based on the test parameters of the ith test area in the pth product to be tested and the characteristic mean.

[0064] In this embodiment, the product to be tested may be tested in different regions according to its structure to obtain more accurate test data.

[0065] For example, refer to Figure 6, the product to be tested can be divided into four test areas: upper left, lower left, upper right, and lower right. Align the signal transmitting end 111 and the signal receiving end 112 with the upper left test area and keep it for 10s. The signal transmitting end 111 transmits a radio frequency signal to the upper left test area, and the signal receiving end 112 receives a response signal from the upper left test area. Based on the radio frequency signal and the response signal in the upper left test area, the return loss of the product to be tested in the upper left test area can be determined. Similarly, the return losses of the first product to be tested to the pth product to be tested in the upper left test area are obtained respectively, and the mean characteristic deviation of the pth product to be tested in the upper left test area is calculated. The testing principles of the lower left, upper right, and lower right test areas are the same as those of the upper left test area, and will not be repeated here. If the mean characteristic deviation of any of the four test areas of the upper left, lower left, upper right, and lower right in the pth product to be tested is greater than or equal to the first preset value, it means that the pth product to be tested is unqualified.

[0066] Reference Figure 7 In one embodiment, step S2 includes: S22: Calculate the arithmetic mean of the test parameters of the n products to be tested to obtain a characteristic mean.

[0067] For example, the test parameter may be the return loss range, and the characteristic mean may be the return loss range mean. The arithmetic mean of the return loss ranges of n products to be tested is calculated, that is, the sum of the return loss ranges of n products to be tested is calculated and then divided by n to obtain the return loss range mean: ,in, is the mean of the range of n products to be tested, is the return loss extreme value of the i-th product to be tested. In addition, the return loss optimal value, return loss center value, etc. can also be used to calculate the characteristic mean value, which is not limited in this application.

[0068] Reference Figure 8 In one embodiment, step S1 includes: S14: Perform multiple tests on each product to be tested to obtain multiple groups of test parameters.

[0069] Step S2 includes: S23: Calculate the arithmetic mean of multiple groups of test parameters to obtain the first characteristic value of each product to be tested.

[0070] S24: Calculate the arithmetic mean of the first characteristic values ​​of the n products to be tested to obtain a characteristic mean.

[0071] For example, the test parameter can be the return loss range value, and the characteristic mean can be the return loss range mean value. Each product to be tested is tested three times to obtain three groups of return loss range values. The arithmetic mean of the three groups of return loss range values ​​is calculated to obtain the first characteristic value: ,in, is the first characteristic value of the i-th product to be tested, is the return loss extreme value obtained in the first test, is the return loss extreme value obtained from the second test, This is the extreme value of return loss obtained from the third test.

[0072] Then calculate the sum of the first characteristic values ​​of the 32 products to be tested, divide the sum by n, and get the mean return loss range: .

[0073] In this way, by calculating the average value of multiple test results to determine the first eigenvalue, the accuracy of the first eigenvalue can be improved, and the error of one test can be prevented from affecting the first eigenvalue.

[0074] Reference Fig. 9 In one embodiment, step S3 includes: S32: Calculate the difference between the test parameter of the nth product to be tested and the characteristic mean value to obtain a first difference.

[0075] For example, ,in, is the first difference value of the nth product to be tested.

[0076] S33: Divide the first difference by (n-1) to obtain the characteristic deviation mean.

[0077] For example, ,in, is the mean of the range deviation of the nth product to be tested.

[0078] In this way, the mean value of the range deviation that characterizes the deviation between the pth product to be tested and the other n-1 products to be tested can be obtained. The mean value of the range deviation is then compared with the first preset value. If the mean value of the range deviation is greater than or equal to the first preset value, it means that the return loss range of the pth product to be tested is poor, that is, the pth product to be tested is unqualified.

[0079] In one embodiment, the antenna testing method further includes: S5: Calculate the difference between the maximum value and the standard maximum value of the test parameters of the n products to be tested to obtain a first preset value.

[0080] For example, the worst value, that is, the maximum value, among the return loss extreme values ​​of the n products to be tested is calculated, and the difference between the worst value, that is, the maximum value, and the standard return loss extreme value is calculated as the first preset value. The standard return loss extreme value can be obtained by testing a standard sample. For example, the return loss of the standard sample is tested to obtain the maximum return loss value as the standard return loss extreme value.

[0081] Reference Fig.10 In one embodiment, the antenna testing method further includes: S6: If the characteristic deviation mean of the p-th product to be tested is greater than or equal to a second preset value, output a warning signal; the second preset value is less than the first preset value.

[0082] In this embodiment, the second preset value can be obtained by calculating the characteristic mean. For example, the difference between the maximum value and the mean value of the return loss extreme values ​​of n products to be tested is calculated as the second preset value. Alternatively, the second preset value can also be set according to actual experience. If it is greater than or equal to the second preset value, it means that there is a risk in the pth product to be tested, and a warning signal is output to remind the tester.

[0083] Reference Fig.11 In one embodiment, the antenna testing method further includes: S7: Root or square the characteristic deviation mean to obtain a standard deviation value.

[0084] S8: Root or square the first preset value to obtain a first standard value.

[0085] S9: Displaying the standard deviation value and the first standard value on a test interface.

[0086] S10: If the standard deviation value is greater than or equal to the first standard value, it is determined that the pth product to be tested does not meet the preset requirement.

[0087] In this embodiment, since the test parameters obtained during the test have an imaginary part, the characteristic deviation mean value obtained also has an imaginary part, which is not convenient for viewing and displaying. Therefore, by performing a square operation on both the characteristic deviation mean value and the first preset value, the imaginary part is eliminated, and then the comparison and display are performed.

[0088] Reference Fig.12 In one embodiment, the antenna testing method further includes: S20: If the test parameters of the product to be tested are outside a preset range, it is determined that the product to be tested is unqualified.

[0089] In this embodiment, before calculating the test parameters, the test parameters are first compared. If the test parameters are outside the preset range, it means that the corresponding product to be tested has obvious defects, and the corresponding product to be tested is eliminated to prevent unqualified products to be tested from affecting the test of the entire group of products to be tested. Among them, the preset range can be determined according to the actual test product performance. For example, the preset range of return loss can be set to -1dB~-2dB. If the return loss of the product to be tested is greater than -1dB or less than -2dB, it means that the product to be tested is unqualified.

[0090] In the above, the specific implementation of the present application is described with reference to the accompanying drawings. However, those skilled in the art will appreciate that various changes and substitutions may be made to the specific implementation of the present application without departing from the spirit and scope of the present application. These changes and substitutions are all within the scope defined by the present application.

Claims

1. An antenna testing method, characterized in that: The antenna testing method comprises: Obtaining test parameters of n products to be tested; the types of the test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient; Determining characteristic means of the n products to be tested based on the test parameters of the n products to be tested; Determine a characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean; If the characteristic deviation mean is greater than or equal to a first preset value, it is determined that the pth product to be tested does not meet the preset requirements; both n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1, and less than or equal to n.

2. The antenna testing method according to claim 1, characterized in that: The step of obtaining the test parameters of n products to be tested includes: Obtaining test parameters of the m+1th to be tested product to the m+nth to be tested product; wherein m is an integer greater than or equal to 0; Alternatively, the test parameters of the 1st to m+nth products to be tested are obtained.

3. The antenna testing method according to claim 1, characterized in that: The product to be tested includes multiple test areas; and obtaining the test parameters of n products to be tested includes: Obtaining test parameters of the i-th test area among the n products to be tested; The determining the characteristic means of the n products to be tested based on the test parameters of the n products to be tested includes: Determine, based on the test parameters of the i-th test area among the n products to be tested, the characteristic mean of the n products to be tested in the i-th test area; The determining the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean, comprises: Based on the test parameters of the ith test area in the pth product to be tested and the characteristic mean, a characteristic deviation mean of the ith test area in the pth product to be tested is determined.

4. The antenna testing method according to claim 1, characterized in that: The determining the characteristic means of the n products to be tested based on the test parameters of the n products to be tested includes: Calculate the arithmetic mean of the test parameters of the n products to be tested to obtain the characteristic mean of the n products to be tested.

5. The antenna testing method according to claim 1, characterized in that: The step of obtaining the test parameters of n products to be tested includes: Conduct multiple tests on each product to be tested to obtain multiple sets of test parameters; The determining the characteristic means of the n products to be tested based on the test parameters of the n products to be tested includes: Conduct multiple tests on each product to be tested to obtain multiple sets of test parameters; Calculating the arithmetic mean of the multiple groups of test parameters to obtain a first characteristic value of each product to be tested; Calculate the arithmetic mean of the first characteristic values ​​of the n products to be tested to obtain a characteristic mean.

6. The antenna testing method according to claim 4 or 5, characterized in that: The determining the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean, comprises: Calculate the difference between the test parameter of the pth product to be tested and the characteristic mean to obtain a first difference; The first difference is divided by (n-1) to obtain the characteristic deviation mean.

7. The antenna testing method according to claim 1, characterized in that: The antenna testing method further includes: The difference between the maximum value and the standard maximum value of the test parameters of the n products to be tested is calculated to obtain the first preset value.

8. The antenna testing method according to claim 1, characterized in that: The antenna testing method further includes: If the characteristic deviation mean of the pth product to be tested is greater than or equal to a second preset value, a warning signal is output; and the second preset value is less than the first preset value.

9. The antenna testing method according to claim 1, characterized in that: After determining the characteristic deviation mean of the pth product to be tested, the antenna testing method further includes: Performing a square operation on the characteristic deviation mean to obtain a standard deviation value; Performing a square operation on the first preset value to obtain a first standard value; Displaying the standard deviation value and the first standard value on a test interface; If the standard deviation value is greater than or equal to the first standard value, it is determined that the pth product to be tested does not meet the preset requirements.

10. The antenna testing method according to claim 1, characterized in that: Before determining the characteristic mean values ​​of the n products to be tested based on the test parameters of the n products to be tested, the antenna testing method further includes: Determine whether the test parameters of the product to be tested are within the preset range. If the test parameters of the product to be tested are outside the preset range, determine that the product to be tested does not meet the preset requirements. If the test parameters of the product to be tested are within the preset range, determine that the product to be tested meets the preset requirements. Select the test parameters of the n products to be tested that are within the preset range, and determine the characteristic means of the n products to be tested.

11. The antenna testing method according to claim 1, characterized in that: The n is greater than or equal to 32.

12. An antenna testing system, characterized in that: The antenna testing system comprises: A vector analyzer, the vector analyzer having a signal transmitting end and a signal receiving end; the signal transmitting end is spaced apart from the product to be tested, and is used to transmit an excitation signal; the signal receiving end is spaced apart from the product to be tested, and is used to receive a response signal generated by the product to be tested based on the excitation signal; the vector analyzer is used to determine the test parameters of n products to be tested based on the response signal; the test parameters include any one of return loss, voltage standing wave ratio, and reflection coefficient; A main control module, the main control module is used to determine the characteristic mean of the n products to be tested based on the test parameters of the n products to be tested; and determine the characteristic deviation mean of the p-th product to be tested based on the test parameters of the p-th product to be tested among the n products to be tested and the characteristic mean; The main control module is also used to determine that the pth product to be tested does not meet the preset requirements when the mean value of the characteristic deviation is greater than or equal to a first preset value; both n and p are integers, n is greater than or equal to 2, and p is greater than or equal to 1, and less than or equal to n.

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