Aging test method and device, equipment and storage medium

Abstract

The invention relates to the technical field of aging testing, and discloses an aging testing method, device and equipment and a storage medium, and the aging testing method comprises the steps: receiving a charging instruction of an upper computer, executing a charging process for an appliance, and obtaining a charging current and charging time in the charging process of the appliance; and judging whether to execute switching from the charging process to the aging process or not according to the charging current and the charging time. According to the technical scheme, the charging process is monitored and judged in real time, it is ensured that the device is smoothly switched to the aging process after being charged, switching between the charging process and the aging process is optimized, and the aging test efficiency and accuracy are improved. In addition, smooth switching between charging and aging is beneficial for improving the automation degree of the equipment, reducing human intervention and ensuring the stability and reliability of the test process.

Description

Technical Field

[0001] The present invention relates to the technical field of aging test, and in particular to an aging test method, device, equipment and storage medium. Background Art

[0002] At present, aging test equipment is widely used in the quality inspection and life assessment of electronic devices. By simulating the working conditions of the equipment in real-life use scenarios, its performance and durability are verified. However, existing aging equipment has the problem of large size, taking up a lot of space, which is not conducive to operation and centralized deployment of equipment. At the same time, since multiple working states need to be monitored and recorded in real time during the operation of the equipment, its system is prone to host computer jamming after long-term operation. In particular, the switching ability is weak at the end of different working processes, resulting in interruption of communication between the equipment and the equipment or loss of key parameter data. This situation makes the test results of the equipment in the aging state incomplete, affecting the reliability of the data and subsequent analysis. Summary of the invention

[0003] The embodiments of the present invention provide an aging test method, device, equipment and storage medium to solve the above technical problems.

[0004] A first aspect of an embodiment of the present invention provides an aging test method, which is applied to an aging test device, wherein the aging test device is connected to a host computer and an apparatus respectively, and the aging test method includes:

[0005] Receiving a charging instruction from the host computer and executing a charging process for the device, and obtaining a charging current and a charging time during the charging process of the device;

[0006] Whether to switch from the charging process to the aging process is determined according to the charging current and the charging time.

[0007] Optionally, the charging instruction includes a charging current threshold and a charging time threshold;

[0008] The continuing to execute the charging process or switching from the charging process to the aging process according to the charging current and the charging time includes:

[0009] When the charging current exceeds the charging current threshold and the charging time does not reach the charging time threshold, determining to continue the charging process;

[0010] When the charging current is less than the charging current threshold or the charging time reaches the charging time threshold, it is determined to switch from the charging process to the aging process.

[0011] Optionally, the determining execution switches from the charging process to the aging process, and then further includes:

[0012] Receiving an aging instruction sent by the host computer, and sending an information acquisition instruction to the device, receiving a first response and acquiring the aging times and interval time from the aging instruction;

[0013] An aging request instruction is sent to the device, a second response is received, and a heating module is called according to the aging number and the interval time to perform an aging test on the device.

[0014] Optionally, calling a heating module to age the device according to the aging times and the interval time further includes:

[0015] A preset temperature curve is obtained, and the heating module is controlled according to the preset temperature curve to perform an aging test on the device.

[0016] Optionally, the sending of the information acquisition instruction to the device further includes:

[0017] When the first response is not received within a first preset time, switching from the aging process to the charging process is performed.

[0018] Optionally, the sending of an aging request instruction to the device further includes:

[0019] When no second response is received and a charging request instruction is received, switching from the aging process to the charging process is executed;

[0020] When neither the second response nor the charging request instruction is received within the second preset time, switching from the aging process to the charging process is executed.

[0021] Optionally, the receiving the second response and calling the heating module to perform an aging test on the appliance according to the aging number and the interval time, further comprises:

[0022] Obtaining the number of aging times and the current time, sending a data collection instruction to the device and receiving a third response, wherein the data of the third response includes parameter information of the device;

[0023] The aging times, current time and parameter information of the device are sent to the host computer.

[0024] A second aspect of an embodiment of the present invention provides an electronic cigarette aging test device, comprising:

[0025] A parameter acquisition module, used to receive the control instruction of the host computer and execute the charging process for the device, and obtain the charging current and charging time during the charging process of the device;

[0026] A switching control module, used for judging whether to switch from the charging process to the aging process according to the charging current and the charging time;

[0027] A connection module, wherein the connection module is respectively connected to the host computer and the electronic cigarette to be tested, and the connection module enables one host computer to be connected to multiple electronic cigarettes to be tested through the connection module.

[0028] A third aspect of an embodiment of the present invention provides an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the method described in the first aspect when executing the computer program.

[0029] A fourth aspect of an embodiment of the present invention provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the method described in the first aspect is implemented.

[0030] The technical effect of the embodiment of the present invention is: by real-time monitoring and judgment of the charging process, it is ensured that the device is smoothly switched to the aging process after charging is completed. By obtaining the charging current and charging time, it is possible to accurately judge whether the battery is fully charged, and based on the combination of the charging current and charging time, it is judged whether to continue the charging process or enter the aging test. This method optimizes the switching between the charging process and the aging process, and improves the efficiency and accuracy of the aging test. In addition, the smooth transition between charging and aging helps to improve the automation of the equipment, avoid the loss of key data, reduce human intervention, and ensure the stability and reliability of the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative labor.

[0032] Figure 1 is a flow chart of an aging test method provided by Embodiment 1 of the present invention;

[0033] Figure 2 is a specific flow chart of step S20 in an aging test method provided in Embodiment 1 of the present invention;

[0034] Figure 3 is another flow chart after step S20 in an aging test method provided in the first embodiment of the present invention;

[0035] Figure 4is another flow chart after step S302 in an aging test method provided in the first embodiment of the present invention;

[0036] Figure 5 is another flow chart after step S20 in an aging test method provided in the first embodiment of the present invention;

[0037] Figure 6 It is a specific flow chart of a handshake process in an aging test method provided in the first embodiment of the present invention;

[0038] Figure 7 is a specific flow chart of a charging process in an aging test method provided in Embodiment 1 of the present invention;

[0039] Figure 8 is a specific flow chart of an aging process in an aging test method provided in Embodiment 1 of the present invention;

[0040] Fig. 9 is a specific flow chart of an offline process in an aging test method provided in Embodiment 1 of the present invention;

[0041] Fig.10 is a structural schematic diagram of an aging test device provided in Embodiment 2 of the present invention;

[0042] Fig.11 It is a schematic diagram of the structure of an electronic device in one embodiment of the present invention. DETAILED DESCRIPTION

[0043] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] It should be understood that the present invention can be implemented in different forms and should not be construed as being limited to the embodiments set forth herein. On the contrary, providing these embodiments will make the disclosure thorough and complete and fully convey the scope of the present invention to those skilled in the art. In the accompanying drawings, the sizes and relative sizes of layers and regions may be exaggerated for clarity. The same reference numerals throughout represent the same elements.

[0045] It should be understood that when an element or layer is referred to as being "on, adjacent to, connected to or coupled to other elements or layers, it may be directly on, adjacent to, connected to or coupled to other elements or layers, or there may be intervening elements or layers. In contrast, when an element is referred to as being "directly on, directly adjacent to, directly connected to or directly coupled to other elements or layers, there may be no intervening elements or layers. It should be understood that, although the terms first, second, third, etc. may be used to describe various elements, components, regions, layers and / or parts, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer or part from another element, component, region, layer or part. Therefore, without departing from the teachings of the present invention, the first element, component, region, layer or part discussed below may be represented as a second element, component, region, layer or part.

[0046] The purpose of the terms used herein is only to describe specific embodiments and is not intended to be limiting of the present invention. When used herein, the singular forms "one", "an" and "said / the" are also intended to include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "consisting of" and / or "comprising", when used in this specification, determine the presence of the features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or groups. When used herein, the term "and / or" includes any and all combinations of the relevant listed items.

[0047] In order to fully understand the present invention, detailed structures and steps will be presented in the following description to illustrate the technical solutions proposed by the present invention. The preferred embodiments of the present invention are described in detail below, but in addition to these detailed descriptions, the present invention may also have other implementations.

[0048] Embodiment 1

[0049] This embodiment provides an aging test method, such as Figure 1 As shown, it is applied to an aging test device, the aging test device is connected to a host computer and an apparatus respectively, and the aging test method includes:

[0050] Step S10: Receive the charging instruction from the host computer and execute the charging process for the device. During the charging process of the device, obtain the charging current and charging time.

[0051] Among them, the aging test device first receives the charging instruction from the host computer. The control instruction includes the basic requirements for the device to start the charging process, such as charging current, voltage, charging time, etc. According to the received charging instruction, the aging test device starts to execute the charging process, including starting the charging power supply, providing the required current and voltage to the device, and monitoring the battery status of the device in real time. During the charging process, the test device continuously obtains the real-time charging current and charging time. The charging current is used to monitor the battery charging status, while the charging time records the duration of charging. These data will be used to determine whether the device needs to continue charging or whether it should switch to the aging process. The device can be an electronic cigarette.

[0052] Step S20: Determine whether to switch from the charging process to the aging process according to the charging current and the charging time.

[0053] Among them, to determine whether to continue charging or switch the process, first detect whether the charging current has reached the set target current value. If the charging current is less than the preset current threshold, it means that the battery is full, and charging can be stopped and switched to the aging process. If the charging current is still large, it means that the battery is still charging and will continue to be charged. It can also be judged whether the charging has been long enough based on the charging time. If the charging time has exceeded the set charging time threshold, it is considered that the charging process has been completed and the aging process is switched to. It can also be determined by the combination of charging current and charging time. For example, if the charging current drops and lasts for a certain period of time, it means that the battery charging is almost complete and it will switch to the aging process. If the conditions in the charging process meet the switching requirements (such as the current is full or the charging time is sufficient), a signal will be sent to switch to the aging process. At this time, the charging module is turned off and the aging process is activated. The goal of the aging process is usually to perform certain heating, aging tests or other specific operations on the appliance to ensure that the performance of the appliance is stable after long-term use. If the charging current is still large and the charging time does not reach the set threshold, the system will continue to execute the charging process and obtain the charging current and charging time again until the conditions for switching to the aging process are met.

[0054] The technical effect of this embodiment is that by real-time monitoring and judgment of the charging process, it is ensured that the device is smoothly switched to the aging process after charging is completed. By obtaining the charging current and charging time, it is possible to accurately judge whether the battery is fully charged, and based on the combination of the charging current and charging time, it is judged whether to continue the charging process or enter the aging test. This method optimizes the switching between the charging process and the aging process, and improves the efficiency and accuracy of the aging test. In addition, the smooth transition between charging and aging helps to improve the automation of the equipment, avoid the loss of key data, reduce human intervention, and ensure the stability and reliability of the test process.

[0055] As an implementation method, Figure 2 As shown, the charging instruction includes a charging current threshold and a charging time threshold;

[0056] The step S20 of determining whether to switch from the charging process to the aging process according to the charging current and the charging time includes:

[0057] Step S201: When the charging current exceeds the charging current threshold and the charging time does not reach the charging time threshold, it is determined to continue the charging process.

[0058] Step S202: When the charging current is less than the charging current threshold or the charging time reaches the charging time threshold, it is determined to switch from the charging process to the aging process.

[0059] Among them, the charging current threshold refers to the preset minimum charging current value, which is used to determine whether to continue charging. The charging time threshold refers to the preset maximum charging time, which is used to control the maximum duration of the charging process. According to the real-time data of the charging current and charging time, it is compared with the above two thresholds to decide whether to continue charging or switch to the aging process. If the charging current value monitored in real time exceeds the preset charging current threshold, it means that the appliance is charging, indicating that the battery is not yet fully charged or the charging power is within a safe range. The charging current is less than the charging current threshold, indicating that the battery is fully charged or the battery has entered the charging completion stage. At this time, the current of the charging process should gradually decrease, indicating that the battery capacity is close to the maximum and no longer needs to be charged. If this condition is met, it is judged that the charging process has been basically completed. If the charging duration exceeds the set charging time threshold, even if the charging current does not fully reach the preset threshold, it means that the battery has been charged for a long enough time, and the charging will be judged to be completed. This condition prevents the charging process from being prolonged due to incomplete current matching.

[0060] The technical effect of this embodiment is that by setting the charging current threshold and the charging time threshold, and monitoring the charging current and charging time in real time, the charging status of the device can be intelligently judged and the switching logic of the charging process can be optimized. When the charging current is lower than the threshold, it can accurately identify that the battery is full or has entered the charging completion stage, so as to stop charging in time and avoid overcharging. At the same time, by setting the charging time threshold, even if the charging current does not fully reach the preset standard, it can ensure that the charging process is completed within a reasonable time, effectively preventing the extension of the charging time due to current fluctuations or equipment characteristics. This control method can improve the switching efficiency between charging and aging tests while ensuring charging safety, ensuring the continuity of the test process and the reliability of equipment performance.

[0061] As an implementation method, Figure 3 As shown, in step S202, it is determined to switch from the charging process to the aging process, and then it also includes:

[0062] Step S301: Receive an aging instruction sent by a host computer, send an information acquisition instruction to the device, receive a first response and obtain the aging times and interval time from the aging instruction.

[0063] Step S302: Send an aging request instruction to the device, receive a second response and call the heating module to perform an aging test on the device according to the aging times and interval time.

[0064] In step S301, after the host computer detects the switch from the charging process to the aging process, it sends an aging instruction to the control module in the aging test device. The control module receives the aging instruction sent by the host computer. The aging instruction usually contains the key parameter information of the aging test. The aging times and interval time are parsed from the aging instruction. The aging times refer to the number of aging cycles that the device needs to perform. The interval time refers to the waiting time between each two aging tests to ensure that the performance of the device can be restored or reach a stable state during the aging process. At the same time, an information acquisition instruction is sent to the device. When the first response sent by the device according to the information acquisition instruction is received, the following step S302 is executed.

[0065] In step S302, a specific aging instruction is sent to the device according to the aging parameters obtained from the host computer. The instruction is used to start the aging process of the device and send the aging test task to the device. After receiving the aging request instruction, the device will send a second response (i.e., a confirmation signal for the aging instruction). The second response ensures that the device has correctly received the aging instruction and is ready to perform the aging test. According to the obtained aging times and interval time, the heating module is called to perform an aging test on the device. According to the specified aging times and interval time, the aging test process is executed cyclically. After each aging is completed, it will wait for the set interval time, and then call the heating module again to perform the next aging until all aging times are completed.

[0066] The technical effect of this implementation is that by sending an aging request instruction to the host computer and receiving a response, the key parameters required for the aging test can be accurately obtained to ensure precise control of the aging process. By sending specific aging instructions to the device and receiving a confirmation response, it can be ensured that the device correctly enters the aging process and maintains reliable instruction interaction throughout the test process. The heating module is used to perform the aging test according to preset parameters, and the interval time is set in the aging cycle to ensure that the performance of the device is stable during the aging process and avoid the impact of excessive testing on the equipment. This implementation effectively improves the accuracy, reliability and efficiency of the aging test, and ensures the stability and service life of the equipment under long-term working conditions.

[0067] As an implementation manner, in step S302, calling the heating module to age the appliance according to the aging times and the interval time also includes:

[0068] Obtain a preset temperature curve, and control the heating module to perform an aging test on the device according to the preset temperature curve.

[0069] Among them, the preset temperature curve is a series of temperature change parameters set according to the requirements of the aging test, usually including the temperature rise rate, holding time, peak temperature and drop rate, etc. The temperature curve is usually stored in the system's memory (such as FLASH memory) and loaded at the beginning of the aging process. According to the preset temperature curve, the output power of the heating module is adjusted in real time to ensure that the temperature change of the test environment is consistent with the curve requirements, and the output power of the heating module is gradually increased so that the temperature of the device increases at the rising rate set by the curve. The heating module is controlled to maintain a specific temperature value for a period of time to test the stability of the device in a high temperature environment, reduce the output power of the heating module or completely turn off the heating module so that the temperature decreases at the drop rate of the curve. By executing the preset temperature curve, the device is subjected to multiple temperature cycles or constant temperature aging tests to verify the performance of the device under different temperature conditions.

[0070] The technical effect of this embodiment is that by obtaining a preset temperature curve and controlling the heating module to perform an aging test on the device, it is possible to accurately simulate and evaluate the performance of the device in a real usage environment, help discover potential problems, and improve the reliability and service life of the device.

[0071] As an implementation mode, in step S301, an information acquisition instruction is sent to the device, and then the following steps are further included:

[0072] When the first response is not received within the first preset time, switching from the aging process to the charging process is performed.

[0073] Among them, the first preset time is a set waiting time limit, which is used to determine whether the response of the host computer can be received normally. The first response refers to the feedback information of the host computer to the issued aging request instruction, which usually contains the key parameters required for aging (such as the number of aging times, interval time, etc.). Possible reasons for not receiving the first response include: communication abnormality: communication with the host computer is interrupted; host computer processing timeout: the host computer cannot timely feedback the aging request; system or equipment failure: hardware or software abnormality causes the inability to receive the response. When the first response is not received within the first preset time, it is determined that the aging process cannot be started or continued normally. For the sake of safety and process continuity, the current aging process is terminated and switched to the charging process to provide sufficient power for the device to ensure the smooth progress of the subsequent test process. Avoid the impact on the device due to the interruption of the aging process (such as continuing to heat when the power is insufficient may cause device abnormality). Keep the device in a safe state through the charging process and wait for the next instruction or response.

[0074] The technical effect of this implementation is that by setting the first preset time, when the first response from the host computer is not received within the specified time, it can be judged in time that the aging process cannot be started or continued normally, and switch to the charging process. This mechanism effectively avoids process stagnation caused by communication anomalies, timeouts or equipment failures, and ensures the continuity of the test process and the safety of the equipment. The charging process provides sufficient power for the device to prevent abnormal operation due to insufficient power, and prepares for subsequent tests, thereby improving the reliability and adaptability of the system.

[0075] As an implementation method, Figure 4 As shown, in step S302, an aging request instruction is sent to the device, and then the following steps are further included:

[0076] Step S401: When the second response is not received and a charging request instruction is received, switching from the aging process to the charging process is executed.

[0077] Among them, the second response refers to the confirmation feedback of the device to the aging instruction, which usually indicates that the device has correctly received the aging instruction and is ready to enter the aging process. Failure to receive the second response means that the device may not have correctly received the aging instruction and cannot start the aging process. The reasons may include communication abnormalities, the device’s failure to receive instructions normally, or internal equipment failure. The charging request instruction refers to a request actively sent by the device, indicating that it needs to be charged to maintain normal operation or complete subsequent processes. This instruction is usually triggered by the power monitoring mechanism inside the device, indicating that the power is insufficient or needs to be charged. If the second response of the device is not received, but the device actively sends a charging request instruction, it will immediately determine that the aging process cannot continue and switch to the charging process. Switching to the charging process helps avoid device abnormalities due to insufficient power and fully charges the device to continue subsequent tests.

[0078] Step S402: When neither the second response nor the charging request instruction is received within the second preset time, switching from the aging process to the charging process is executed.

[0079] Among them, the second preset time is a set waiting time used to detect the response of the device after receiving the aging instruction. If no feedback is received within this time, it will be judged that there may be a problem with the aging process. Similar to the first case, the failure to receive the second response indicates that the device has not entered the aging process correctly, which may be due to communication problems or equipment failure. If the charging request instruction of the device is not received within the second preset time, it may also indicate that the current state of the device is abnormal (for example, the communication is completely interrupted or the device status detection mechanism fails). Even if the device does not actively send a charging request instruction, it will still be forced to switch to the charging process for safety and process continuity considerations. The start of the charging process ensures that the device can continue to work when it is sufficiently charged and avoids uncertain risks caused by interruptions to the aging process.

[0080] The technical effect of this implementation is that through the logical switching mechanism of these two scenarios, it is possible to respond quickly when an abnormality occurs in the aging process and switch to the charging process to avoid process stagnation, power outage of the device or damage to the equipment, thereby improving the safety and operational reliability of the system and facilitating the smooth progress of subsequent tests.

[0081] As an implementation method, Figure 5 As shown, in step S302, the second response is received and the heating module is called according to the aging number and the interval time to perform an aging test on the appliance, and then the following is further included:

[0082] Step S501. Obtain the aging times and the current time, send a data collection instruction to the device and receive a third response, wherein the data of the third response includes parameter information of the device.

[0083] Step S502: Send the aging times, current time and parameter information of the device to the host computer.

[0084] Among them, the aging process is a round of heating or performance test operation for the device. When the aging test is completed, it will automatically enter the data recording stage. Reading the current time functions to record the timestamp of the end of aging, which is convenient for tracking the specific execution time of each round of aging test. Recording the number of aging cycles currently completed. After communicating with the device, the key information of the device is obtained, such as the GETTCR instruction, which is a command for communicating with the device and is used to obtain the key status parameters of the device. Through this instruction, the device is read and recorded from the device to ensure that the performance indicators of the device are mastered in time after the aging test is completed. The parameter information of the device includes the current resistance value, TCR (temperature coefficient), and battery power; the current resistance value refers to the resistance value after the device is aged, which is used to detect the performance changes of the device, especially the stability of the electrical characteristics. TCR refers to the ratio of the resistance value of the device to the temperature change, which is used to analyze the stability and reliability of the device under temperature changes. The battery power is used to monitor whether the device consumes too much power during the aging process and whether it needs to be charged. After each round of aging test, the system obtains the key status parameters of the device, including resistance, TCR, battery power, etc., by reading the time, aging times, and sending the GETTCR command. These data are used to monitor the performance status of the device in real time, ensure the effectiveness of the aging test, and provide a comprehensive reference for subsequent analysis. Through this process, the system can verify whether the performance of the device meets expectations and detect possible potential problems.

[0085] The present embodiment is described in detail below through a specific workflow:

[0086] like Figure 6 As shown, enter the handshake process:

[0087] Step S601: Send WAKEUP to the device;

[0088] Step S602: Determine whether a WAKEUP signal sent by the device is received; if the determination result is yes, enter the charging process;

[0089] Step S603: When the judgment result is no, wait for 1 second;

[0090] Step S604: Disconnect charging and re-execute step S601.

[0091] like Figure 7 As shown, enter the charging process:

[0092] Step S701: CMD turns on charging;

[0093] Step S702: Obtain TCR information;

[0094] Step S703: Record TCR and charging start time TC0;

[0095] Step S704: CMD obtains charging current;

[0096] Step S705: determine whether I is greater than the minimum current value Imin;

[0097] Step S706: When the result of step S705 is yes, determine whether I is greater than the maximum current value Imax;

[0098] Step S707: setting the charging time TC to T-TC0;

[0099] Step S708: determine whether TC is greater than the set time T0;

[0100] Step S709: When the judgment result of step S708 is no, wait for 10 seconds and return to execute step S704;

[0101] Step S710: When the judgment result of step S705 is no or the judgment result of step S708 is yes, send the command AGEDEV;

[0102] Step S711: Determine whether AGEDEV is received, if yes, enter the aging process, otherwise enter the offline process.

[0103] like Figure 8 As shown, enter the aging process:

[0104] Step S801: Get the current time;

[0105] Step S802: Receive and send CMD GTETTCR;

[0106] Step S803: Determine whether TCR information is received;

[0107] Step S804: When the result of step S803 is yes, obtain the current time: the aging start time;

[0108] Step S805: Sending aging CMD CMDAGE to the device;

[0109] Step S806: Determine whether a CMDAGE response is received;

[0110] Step S807: upon receiving CMDAGE, record TCR information;

[0111] Step S808: delay the set time and return to step S802;

[0112] Step S809: When the result of step S803 is no, check whether the TCR time is greater than 1 second; if the TCR time is greater than 1 second, start the charging process;

[0113] Step S810: If the TCR time is not greater than 1 second, execute step S802 after a delay of 0.1 second;

[0114] Step S811: when it is determined that CMDAGE is not received, it is determined whether REQCHG is received; if REQCHG is not received, the charging process is started;

[0115] Step S812: determine if REQCHG is not received, and check whether the aging failure time is greater than 1 second; if the aging failure time is greater than 1 second, enter the charging process;

[0116] Step S813: If the aging failure time is no more than 1 second, execute step S805 after a delay of 0.1 second.

[0117] like Fig. 9 As shown, enter the offline process:

[0118] Step S901: Send WAKEUP to the device;

[0119] Step S902: Determine whether a WAKEUP response is received;

[0120] Step S903: If the result of the judgment is yes, delay for 1 second and return to execute step S901;

[0121] Step S904: When the judgment result is no, send WAKEUP again;

[0122] Step S905: Determine whether a WAKEUP response is received; if the determination result is yes, execute step S903;

[0123] Step S906: When the result of step S904 is negative, delay 0.1 seconds;

[0124] Step S907: Determine whether the disconnection time is greater than 1 second; if the determination result is yes, enter the handshake process; if the determination result is no, execute step S904.

[0125] Embodiment 2

[0126] This second embodiment provides an electronic cigarette aging test device 100, such as Fig.10 As shown, the electronic cigarette aging test device 100 is connected to the host computer 200 and the electronic cigarette 300 to be tested, and the electronic cigarette aging test device 100 includes:

[0127] The parameter acquisition module 101 is used to receive the control instruction of the host computer and execute the charging process for the device, and obtain the charging current and charging time during the charging process of the device;

[0128] A process switching module 102, configured to continue executing the charging process or switch from the charging process to the aging process according to the charging current and the charging time;

[0129] The connection module 103 is connected to the host computer 200 and the electronic cigarette 300 to be tested respectively. The connection module 103 enables one host computer 200 to be connected to multiple electronic cigarettes 300 to be tested through the connection module 103 .

[0130] The present application also provides an electronic device, such as Fig.11 As shown, the electronic device 2 includes: at least one processor 20, a memory 21, and a computer program 22 stored in the memory 21 and executable on at least one processor 20. When the processor 20 executes the computer program, the steps in any of the above-mentioned method embodiments are implemented, or when the processor 20 executes the computer program, the functions of each module / unit in the above-mentioned device embodiments are implemented.

[0131] Exemplarily, the computer program may be divided into one or more modules / units, one or more modules / units are stored in a memory and executed by a processor to complete the present application. One or more modules / units may be a series of computer program instruction segments capable of completing a specific function, and the instruction segments are used to describe the execution process of the computer program in an electronic device.

[0132] Those skilled in the art will understand that Fig.11 These are merely examples of electronic devices and do not constitute a limitation of the electronic device. The electronic device may include more or fewer components than those shown in the figure, or a combination of certain components, or different components. For example, the electronic device may also include input and output devices, network access devices, buses, etc.

[0133] The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0134] The memory may be an internal storage unit of an electronic device, such as a hard disk or memory of the electronic device. The memory may also be an external storage device of the electronic device, such as a plug-in hard disk, a smart memory card (SmartMedia Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device. Furthermore, the memory may also include both an internal storage unit of the electronic device and an external storage device.

[0135] An embodiment of the present application further provides a readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0136] An embodiment of the present application provides a computer program product. When the computer program product is run on an electronic device, a mobile terminal can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0137] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may at least include: any entity or device that can carry the computer program code to the camera / terminal device, a recording medium, a computer memory, a read-only memory (ROM, Read-Only Memory), a random access memory (RAM, Random Access Memory), an electric carrier signal, a telecommunication signal, and a software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0138] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0139] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0140] In the embodiments provided in the present application, it should be understood that the disclosed devices / equipment and methods can be implemented in other ways. For example, the device / equipment embodiments described above are only schematic, for example, the division of modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0141] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0142] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. An aging test method, characterized in that: A control module applied to an aging test device, wherein the aging test device is connected to a host computer and an apparatus respectively, and the aging test method comprises: Receiving a charging instruction from the host computer and executing a charging process for the device, and obtaining a charging current and a charging time during the charging process of the device; Whether to switch from the charging process to the aging process is determined according to the charging current and the charging time.

2. The aging test method according to claim 1, characterized in that: The charging instruction includes a charging current threshold and a charging time threshold; The determining whether to switch from the charging process to the aging process according to the charging current and the charging time includes: When the charging current exceeds the charging current threshold and the charging time does not reach the charging time threshold, determining to continue the charging process; When the charging current is less than the charging current threshold or the charging time reaches the charging time threshold, it is determined to switch from the charging process to the aging process.

3. The aging test method according to claim 1, characterized in that: The determining execution switches from the charging process to the aging process, and then further includes: Receiving an aging instruction sent by the host computer, and sending an information acquisition instruction to the device, receiving a first response and acquiring the aging times and interval time from the aging instruction; An aging request instruction is sent to the device, a second response is received, and a heating module is called according to the aging number and the interval time to perform an aging test on the device.

4. The aging test method according to claim 3, characterized in that: The calling of the heating module to age the device according to the aging times and the interval time also includes: A preset temperature curve is obtained, and the heating module is controlled according to the preset temperature curve to perform an aging test on the device.

5. The aging test method according to claim 4, characterized in that: The sending of the information acquisition instruction to the device further includes: When the first response is not received within a first preset time, switching from the aging process to the charging process is performed.

6. The aging test method according to claim 4, characterized in that: The sending of the aging request instruction to the device further includes: When no second response is received and a charging request instruction is received, switching from the aging process to the charging process is executed; When neither the second response nor the charging request instruction is received within the second preset time, switching from the aging process to the charging process is executed.

7. The aging test method according to claim 1, characterized in that: The step of receiving the second response and calling the heating module to perform an aging test on the appliance according to the aging times and the interval time further comprises: Obtaining the number of aging times and the current time, sending a data collection instruction to the device and receiving a third response, wherein the data of the third response includes parameter information of the device; The aging times, current time and parameter information of the device are sent to the host computer.

8. An electronic cigarette aging test device, characterized in that: include: A parameter acquisition module, used to receive the control instruction of the host computer and execute the charging process for the device, and obtain the charging current and charging time during the charging process of the device; A switching control module, used for judging whether to switch from the charging process to the aging process according to the charging current and the charging time; A connection module, wherein the connection module is respectively connected to the host computer and the electronic cigarette to be tested, and the connection module enables one host computer to be connected to multiple electronic cigarettes to be tested through the connection module.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 7 is implemented.

10. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

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