Data storage method and system for bus voltage withstanding test equipment

Abstract

The invention relates to the technical field of data storage, and relates to a data storage method and system for bus voltage withstanding test equipment, and the method comprises the steps: collecting the test data of each bus, and enabling the test data of each bus to be the same in length; carrying out first data partitioning on the test data of the bus to obtain n data blocks with the same length, and determining that the serial number of the ith data block of the bus on the time sequence is i; calculating the similarity between the data blocks with the same serial numbers of all the buses, and taking the mean value of the similarity between the data blocks and all the data blocks with the same serial numbers as the stable value of the data blocks; calculating the outlier degree of each bus; performing data partitioning on the test data of the bus for the second time, and then performing duplicate removal on the test data; and encrypting and storing the deduplicated test data of each bus. According to the invention, the contradiction between the deduplication rate and the storage space saving in the traditional deduplication method is avoided.

Description

Technical Field

[0001] The present invention generally relates to the field of data storage technology, and more specifically, to a data storage method and system for busbar withstand voltage testing equipment. Background Art

[0002] The busbar withstand voltage test equipment is a special equipment used to detect the withstand voltage capacity and insulation performance of the insulation material of the busbar (conductive component in the power system). For example, the HCDJC series voltage breakdown tester can test the withstand voltage time under power frequency voltage. The quality of the busbar insulation material directly affects the performance and life of the electrical system, and the voltage breakdown tester can timely detect potential defects or aging of the insulation material. Therefore, performing a voltage breakdown test on the busbar can ensure the safe operation of the power system. When performing a busbar withstand voltage test (or busbar AC withstand voltage test), it is necessary to determine the test voltage (which is greater than the rated voltage), the test frequency and the test time, and then test whether the busbar fails (such as resistance changes or leakage current is large) when the test voltage is connected for a continuous test time.

[0003] Some standards (such as GB 50150-2016) require that busbar withstand voltage test data be kept for at least 1 to 3 years to facilitate traceability throughout the equipment life cycle. If a busbar or system fails (such as breakdown or fire), the relevant test data must be kept for a long time. Therefore, the storage of busbar withstand voltage test equipment data is crucial. When storing data of busbar withstand voltage test equipment, the prior art usually performs hierarchical storage, block-level deduplication, and data encryption, wherein block-level deduplication is performed on the data to reduce redundant data, thereby reducing computing overhead. A Chinese patent application document with publication number CN118210718A discloses a testing method and device, which deduplicates duplicate test data to improve the efficiency and accuracy of the test.

[0004] Conventional deduplication methods, such as block-level deduplication technology (or block-level deduplication), identify and delete duplicate data blocks through block division and hash operations. If the data blocks obtained after block division are large, the deduplication rate is low, and the storage space saved is large, but the larger data blocks cover more data content, so they reflect more data features; if the data blocks obtained after block division are taller, the deduplication rate is high, but the smaller data blocks reflect fewer data features. Therefore, the existing technology has the problem of difficulty in balancing the size of the data block and the deduplication rate. Summary of the invention

[0005] In order to solve the technical problem of the difficulty in balancing the size of data blocks and the deduplication rate when performing data deduplication, the present invention provides solutions in the following aspects.

[0006] In a first aspect, a data storage method for a busbar withstand voltage test device includes: collecting the resistance value or differential voltage value of each busbar at each moment in a preset time period under a preset voltage, recording it as test data, the length of the test data of each busbar being the same; firstly dividing the test data of the busbar into blocks to obtain a plurality of data blocks of the same length, determining the first data block of the busbar in time sequence, and finally determining the first data block of the busbar in time sequence. i The sequence number of the data block is i ; Calculate the similarity between all data blocks with the same serial number on the bus, and take the average similarity between a data block and all data blocks with the same serial number as the stable value of the data block; Calculate the j The outlier degree of the bus : ,in For the j The serial number of the bus test data is i The stable value of the data block, For the j The minimum value of the stable value of all data blocks in the bus test data, m is the number of all buses, except for j The serial number outside the busbar is i The data block, For the k The stable value corresponding to the busbar is n is the number of data blocks after block division; after the second data block division of the test data of the bus, the test data is deduplicated, wherein the outlier degree of the bus is negatively correlated with the number of data blocks obtained by the second data block division; the deduplicated test data of each bus is encrypted and stored.

[0007] The beneficial effect is as follows: after the present invention divides the test data of the bus into blocks, the similarity of each data block compared to the data blocks of other bus test data is obtained, and the outlier degree of the test data of the bus compared to the test data of other buses is calculated based on the similarity of each data block of the bus. When the outlier degree corresponding to the bus is large, the length of the data block obtained by block when deduplication is performed on the test data of the bus is small; when the outlier degree corresponding to the bus is small, the length of the data block obtained by block when deduplication is performed on the test data of the bus is large. Based on this, the present invention makes the deduplication effect of the data block more refined and intelligent by dynamically adjusting the length of the data block in combination with the outlier degree, reduces the cost of storing data, and retains the necessary characteristics of the bus test data, avoiding the contradiction between the deduplication rate and the storage space saving in the traditional deduplication method, and providing a more efficient and flexible data processing solution for practical applications.

[0008] Preferably, calculating the similarity between two data blocks with different buses and the same serial number includes: in response to the hash values ​​between the two data blocks being the same, determining that the similarity between the two data blocks is 1; in response to the hash values ​​between the two data blocks being different and the test data being a resistance value within a preset time period under a preset voltage, calculating the similarity between the two data blocks, wherein the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values ​​between the two data blocks being different and the test data being a differential voltage value within a preset time period under a preset voltage, determining that the similarity between the two data blocks is the cosine similarity between the two data blocks.

[0009] The beneficial effect is that the hash value is used to determine whether the data blocks are completely the same, thereby improving the computing efficiency and reducing the resource consumption.

[0010] Preferably, judge p The busbar and q Whether the hash values ​​of the data blocks with serial number i of the buses are the same includes: using the SHA250 algorithm to check the p The data block with the serial number i of the bus is hashed to obtain the first hash value; the first hash value is hashed by the SHA256 algorithm q The data block with the serial number i of the bus is hashed to obtain a second hash value; in response to the first hash value being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with serial numbers i of the buses are the same; in response to the first hash value not being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with sequence number i on the buses are different.

[0011] The SHA256 algorithm used in the present invention can ensure data consistency, provide strong anti-collision capabilities, ensure data security, and improve efficiency.

[0012] Preferably, calculate p The busbar and q The serial number of the busbar is i The cosine similarity between the data blocks The formula is: ,in for p The serial number of the busbar is i In the data block g The differential voltage value at time For the q The serial number of the busbar is i In the data block g The differential voltage value at time p, q , g is a positive integer, t is the number of all moments in the data block.

[0013] Preferably, in response to the hash values ​​between the two data blocks being different, and the test data being a resistance value within a preset time period under a preset voltage, calculating the p The busbar and q The formula for the similarity between the data blocks with sequence number i in the bus is: ,in for p The serial number of the busbar is i In the data block g The resistance value at the moment, For the q The serial number of the busbar is i In the data block g The resistance value at the moment, p , q , g is a positive integer, t is the number of all moments in the data block, norm is the standard normalization function.

[0014] Preferably, the number of data blocks obtained by the second data segmentation of the j-th bus is calculated The formula is: ,in is the maximum outlier degree of all busbars, is the median of the outliers of all bus lines, It is a rounding function, which is used to round the value in brackets.

[0015] Preferably, j After the test data of the bus is divided into blocks for the second time, j Deduplication of the test data of the busbar includes: j The test data of the busbars is divided into blocks for the second time to obtain target data blocks; calculating the hash value of each target data block; in response to the hash values ​​of at least two target data blocks being the same, retaining one of the target data blocks and deleting the other data blocks to achieve the first j Deduplication of test data for each bus.

[0016] Preferably, encrypting and storing the deduplicated test data of each bus includes: obtaining a key, and encrypting the deduplicated test data of each bus according to the key to obtain encrypted data; and storing the encrypted data.

[0017] Preferably, the key is constructed by an AES encryption algorithm.

[0018] The AES encryption algorithm used in the present invention can provide high-intensity encryption protection and good performance efficiency.

[0019] In a second aspect, a data storage system for a busbar withstand voltage test device comprises a processor and a memory, wherein the memory stores a computer program, and the processor executes the computer program to implement a data storage method for a busbar withstand voltage test device as described in any one of the above-mentioned invention contents.

[0020] The beneficial effects of the present invention are: For the test data of the bus with high outliers (i.e., high probability of failure during the use phase of the life cycle), the present invention increases the data length of the data block obtained by data segmentation during the deduplication process to increase the data characteristics; for the test data of the bus with low outliers (i.e., high probability of failure during the use phase of the life cycle), the present invention reduces the data length of the data block obtained by data segmentation during the deduplication process to increase the deduplication rate and reduce the data storage cost. Based on this, the present invention reduces the cost of storing data as much as possible by dynamically adjusting the length of the data block, while retaining the necessary characteristics of the bus test data, avoiding the contradiction between the deduplication rate and storage space saving in the traditional deduplication method. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] By reading the following detailed description with reference to the accompanying drawings, the above and other objects, features and advantages of the exemplary embodiments of the present invention will become readily understood. In the accompanying drawings, several embodiments of the present invention are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein: Figure 1 is a flowchart schematically illustrating a method for storing data in a busbar withstand voltage test device according to an embodiment of the present invention; Figure 2 Schematically shows a structural block diagram of a data storage system for a busbar withstand voltage test device according to this embodiment. DETAILED DESCRIPTION

[0022] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0023] The specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0024] Figure 1 It is a flowchart schematically showing the steps of a data storage method for a busbar withstand voltage test device according to an embodiment of the present invention.

[0025] like Figure 1 As shown, a data storage method for busbar withstand voltage testing equipment includes steps S1 to S6.

[0026] Step S1: collecting the resistance value or differential voltage value of each bus at each moment in a preset time period under a preset voltage, and recording it as test data.

[0027] The length of the test data of each bus is the same.

[0028] It should be noted that the equipment for voltage withstand testing on the busbar will apply a voltage higher than the rated voltage of the busbar for a certain period of time to check the electrical characteristics and tolerance of the busbar when subjected to high voltage.

[0029] In one embodiment, for a high-voltage busbar with a rated voltage of 10KV and a model of TMY-3, the withstand voltage test equipment applies a test voltage of 42KV (i.e., a preset voltage) to it for 60s (i.e., a preset time period). The resistance value of A relative to phase B, the resistance value of A relative to phase C, and the resistance value of A relative to ground (insulation resistance value) of the busbar at each moment are collected, and the differential voltage of the busbar at each moment is collected. The resistance value used to calculate the similarity is any one of the resistance value of A relative to phase B, the resistance value of A relative to phase C, and the resistance value of A relative to ground.

[0030] In other embodiments, the resistance value of the busbar at each moment is collected: the resistance value of B relative to A phase, the resistance value of B relative to C phase, and the resistance value of B relative to ground (insulation resistance value) at each moment, or the resistance value of C relative to A phase, the resistance value of C relative to B phase, and the resistance value of C relative to ground (insulation resistance value) at each moment.

[0031] It should be noted that the purpose of collecting the resistance value of the busbar is to determine the insulation performance of the busbar under high voltage and ensure the safe operation of the busbar under high voltage; the purpose of collecting the differential voltage of the busbar is to monitor the voltage balance and system stability and help to timely discover potential electrical faults or imbalance problems. In the embodiment of the present invention, the test data of each busbar are all values ​​within the normal range.

[0032] Step S2: first divide the test data of the bus into blocks to obtain multiple data blocks of the same length, and determine the first data block of the bus in the timing sequence. i The sequence number of the data block is i ; It should be noted that the test data for a bus nData blocks are arranged from left to right. The first data block on the left is numbered 1, the second data block on the left is numbered 2, and so on.

[0033] In one embodiment, the test data is divided into blocks. n The length of each data block is 4KB (or in the range of 3KB to 4KB). That is, in this embodiment, the preset value is determined according to the data length of the test data. n For example, if the test data length is 64KB, then n is 16.

[0034] Step S3: Calculate the similarity between all data blocks with the same serial number on the bus, and take the average of the similarities between a data block and all data blocks with the same serial number as the stable value of the data block.

[0035] It should be noted that since the busbars have the same model, that is, the busbars have very similar designs, materials, and electrical properties, even if they are different busbars, the electrical characteristics shown in the data blocks with the same serial number will be highly similar. In quality inspection, potential defects are usually discovered by comparing the data with other qualified busbars. If the electrical performance of a busbar under the same inspection conditions is significantly different from that of other busbars, even if the busbar has passed the inspection and has not been determined to be a fault, it may still have potential instability. For example, although the busbar has passed the inspection as a whole, there may be minor defects or unevenness in the local area. These defects may gradually increase under long-term operation or certain specific load conditions, causing the busbar to exhibit unstable electrical performance. Based on this, the mean similarity of a data block with all data blocks with the same serial number (i.e., the stability value of the data block) reflects the difference in electrical performance of the data block compared with other busbars. The larger the stability value of the data block, the smaller the probability of its potential defects and the more stable its performance.

[0036] In one embodiment, calculating the similarity between two data blocks with different buses and the same serial number includes: in response to the hash values ​​between the two data blocks being the same, determining that the similarity between the two data blocks is 1; in response to the hash values ​​between the two data blocks being different and the test data being a resistance value within a preset time period at a preset voltage, calculating the similarity between the two data blocks, wherein the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values ​​between the two data blocks being different and the test data being a differential voltage value within a preset time period at a preset voltage, determining that the similarity between the two data blocks is the cosine similarity between the two data blocks.

[0037] It should be noted that by comparing the hash values ​​of two data blocks, it is determined whether the two data blocks (the two data blocks need to be the same) are completely consistent, and the similarity of the completely consistent data blocks is determined to be one, which reduces the subsequent calculation amount and does not require further detailed calculation of the data to confirm that the two data blocks are exactly the same.

[0038] Among them, judging p The busbar and q Whether the hash values ​​of the data blocks with serial number i of the buses are the same includes: using the SHA250 algorithm to check the p The data block with the serial number i of the bus is hashed to obtain the first hash value; the first hash value is hashed by the SHA256 algorithm q The data block with the serial number i of the bus is hashed to obtain a second hash value; in response to the first hash value being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with serial numbers i of the buses are the same; in response to the first hash value not being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with sequence number i on the buses are different.

[0039] It should be noted that SHA-256 (Secure Hash Algorithm 256-bit) is a cryptographic hash algorithm that belongs to the SHA-2 (Secure Hash Algorithm 2) family. It converts the input data (regardless of the length of the data) into a fixed-length 256-bit (32-byte) hash value.

[0040] Among them, calculate the p The busbar and q The serial number of the busbar is i The cosine similarity between the data blocks The formula is: ,in for p The serial number of the busbar is i In the data block g The differential voltage value at time For the q The serial number of the busbar is i In the data block g The differential voltage value at time p , q , g is a positive integer, t is the number of all moments in the data block, norm is the standard normalization function.

[0041] It should be noted that any data with any serial number in any bus test data corresponds to a stable value. In one embodiment, there are m groups of bus test data in total, and the stable value of the data block with serial number i in the jth (group) bus test data is calculated. The formula is: .

[0042] in is the stable value of the data block with sequence number i of the j-th (group) bus test data; The bus test data other than the j-th bus test data are recorded as target data, and there are m-1 target data, that is, m-1 represents the number of target data; is the similarity between the data block with sequence number i in the j-th (group) bus test data and the data block with sequence number i in the x-th group of target data.

[0043] The calculation of the similarity between any two data blocks with the same sequence number and not belonging to the same bus test data has been explained above when it is 1, the Euclidean distance between data blocks, or the cosine similarity between data blocks, so it will not be repeated here.

[0044] It should be noted that cosine similarity ignores amplitude and focuses more on the change trend. Therefore, taking the cosine similarity between the data blocks as the similarity between the two can better reflect the similarity of the change trend of the differential voltage between the two. The greater the cosine similarity between the two data blocks, the more similar the change trend of the differential voltage between the two is.

[0045] In response to the hash values ​​between the two data blocks being different, and the test data being the resistance value within a preset time period under a preset voltage, calculating the p The busbar and q The serial number of the busbar is i The formula for the similarity between data blocks is: ,in for p The serial number of the busbar is i In the data block g The resistance value at the moment, For the q The serial number of the busbar is i In the data block g The resistance value at the moment, p , q , g is a positive integer, t is the number of all moments in the data block. For the p The busbar and q The serial number of the busbar is i The Euclidean distance between data blocks.

[0046] It should be noted that the Euclidean distance is sensitive to the absolute value difference, so the Euclidean distance calculated based on all the resistance values ​​of the two data blocks can more accurately reflect the abnormal resistance value caused by insulation degradation. The larger the Euclidean distance between the two data blocks, the smaller the similarity between the two, and the more similar the insulation performance of the busbar reflected by the two.

[0047] Step S4: Calculate the outlier degree of each busbar.

[0048] Among them, calculate the j The outlier degree of the bus : ,in For the j The serial number of the bus test data is i The stable value of the data block, For the j The minimum value of the stable value of all data blocks in the bus test data, m is the number of all buses, except for j The serial number outside the busbar is i The data block, For the k The stable value corresponding to the busbar is n is the number of data blocks after segmentation.

[0049] It should be noted that the mean similarity between a data block and all data blocks with the same serial number reflects the difference in electrical performance of the data block compared with other busbars (insulation capacity or current stability after power-on). Therefore, the minimum value of the stability value of all data blocks in the busbar test data reflects the worst electrical performance of the busbar under the test conditions. j The greater the possibility of subsequent failure of a busbar, the more likely it is that the busbar will fail. j The greater the possibility of detection data for a bus, when the data of the bus is divided into blocks and deduplication is performed, a data block with a longer data length should be set to retain the data characteristics of the data block to a greater extent.

[0050] For the j A busbar and a busbar other than itself k The average of the differences in the stability values ​​of all data blocks with the same sequence number of the busbars reflects the difference in the stability of the detection data of the two busbars. Reflects the j The difference between the stability of a busbar and all buses except itself. The larger the difference, the greater the stability of the busbar. j The greater the outlier degree of the detection data of the jth busbar, that is, the greater the difference in electrical stability between the jth busbar and the general busbar, the greater the difference in electrical stability between the jth busbar and the general busbar.j The greater the possibility of subsequent failure of a busbar, the more likely it is that the busbar will fail. j The greater the possibility of detection data for a bus, when the data of the bus is divided into blocks and deduplication is performed, a data block with a longer data length should be set to retain the data characteristics of the data block to a greater extent.

[0051] In summary, The bigger, The smaller, the j The outlier degree of the bus The bigger, the j The greater the probability of a bus failing in its subsequent life cycle, the longer the data block length needs to be when the data of the bus is subsequently segmented and deduplicated.

[0052] Step S5: After the second data block division of the test data of the bus, the test data is deduplicated.

[0053] Among them, the outlier degree of the mother line is negatively correlated with the number of data blocks obtained by the second data segmentation.

[0054] In one embodiment, the calculation j The number of data blocks obtained by the second data segmentation of the bus The formula is: ,in is the maximum outlier degree of all busbars, is the median of the outliers of all bus lines, It is a rounding function, which is used to round the value in brackets.

[0055] When explanation is needed, The median of the outliers of all buses reflects the stability of the electrical performance of most buses. Therefore, if the outlier of a bus is higher than the median, it means that the performance or state of the bus has large fluctuations or anomalies, and there may be a potential risk of failure. Its instability is higher, and the possibility of failure is also greater; if the outlier of a bus is lower than the median, it means that the state of the bus is relatively stable, and the performance is more consistent with other buses. Based on this, in an embodiment of the present invention, when the outlier of the bus is higher than the median, the number of data blocks obtained by the bus in the second data block is larger, and the length of the data blocks obtained by the bus in the second data block is shorter, and the deduplication rate is increased to reduce the storage cost; when the outlier of the bus is lower than the median, the number of data blocks obtained by the bus in the second data block is smaller, and the length of the data blocks obtained by the bus in the second data block is longer, and the characteristics of the test data of the stored bus are increased.

[0056] Step S6: encrypt and store the test data of each bus after deduplication.

[0057] In one embodiment, encrypting and storing the deduplicated test data of each bus includes: obtaining a key, and encrypting the deduplicated test data of each bus according to the key to obtain encrypted data; and storing the encrypted data. The key is constructed by an AES encryption algorithm. Specifically, the AES algorithm uses a key to encrypt and decrypt data, and the length of the key can be 128 bits, 192 bits, or 256 bits.

[0058] Figure 2 Schematically shows a structural block diagram of a data storage system for a busbar withstand voltage test device according to this embodiment.

[0059] The present invention also provides a data storage system for a busbar withstand voltage test device. Figure 2 As shown, the system includes a processor and a memory, wherein the memory stores computer program instructions, and when the computer program instructions are executed by the processor, a data storage method for a busbar withstand voltage test device according to the first aspect of the present invention is implemented.

[0060] In the present invention, the aforementioned memory may be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, apparatus or device. For example, a computer-readable storage medium may be any appropriate magnetic storage medium or magneto-optical storage medium, such as a resistive random access memory RRAM (Resistive Random Access Memory), a dynamic random access memory DRAM (Dynamic Random Access Memory), a static random access memory SRAM (Static Random-Access Memory), an enhanced dynamic random access memory EDRAM (Enhanced Dynamic Random Access Memory), a high-bandwidth memory HBM (High-Bandwidth Memory), a hybrid memory cube HMC (Hybrid Memory Cube), etc., or any other medium that can be used to store the required information and can be accessed by an application, a module, or both. Any such computer storage medium may be part of a device or accessible or connectable to a device. Any application or module described in the present invention may be implemented using computer-readable / executable instructions that may be stored or otherwise maintained by such a computer-readable medium.

[0061] In the description of this specification, "plurality" or "several" means at least two, such as two, three or more, etc., unless otherwise clearly and specifically defined.

[0062] Although this specification has shown and described a number of embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art will conceive of many modifications, changes and alternatives without departing from the ideas and spirit of the present invention. It should be understood that in the practice of the present invention, various alternatives to the embodiments of the present invention described herein may be employed.

Claims

1. A data storage method for busbar withstand voltage test equipment, characterized in that: include: Collect the resistance value or differential voltage value of each bus at each moment in a preset time period under a preset voltage, and record it as test data. The length of the test data of each bus is the same; The test data of the bus is first divided into blocks to obtain multiple data blocks of the same length, and the first data block of the bus in terms of timing is determined. i The sequence number of the data block is i ; Calculate the similarity between all data blocks with the same serial number on the bus, and take the average similarity between a data block and all data blocks with the same serial number as the stable value of the data block; Calculate the j The outlier degree of the bus : ,in For the j The serial number of the bus test data is i The stable value of the data block, For the j The minimum value of the stable value of all data blocks in the bus test data, m is the number of all buses, except for j The serial number outside the busbar is i The data block, For the k The stable value corresponding to the busbar is n is the number of data blocks after segmentation; After the test data of the bus is divided into blocks for the second time, the test data is deduplicated, wherein the outlier degree of the bus is negatively correlated with the number of data blocks obtained by the second data division; The test data of each bus after deduplication is encrypted and stored.

2. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: Calculating the similarity between two data blocks with the same sequence number but different buses includes: In response to the hash values ​​between the two data blocks being the same, determining that the similarity between the two data blocks is 1; In response to the hash values ​​between the two data blocks being different and the test data being a resistance value within a preset time period under a preset voltage, the similarity between the two data blocks is calculated, wherein the similarity between the two data blocks is negatively correlated with the Euclidean distance between the two data blocks; in response to the hash values ​​between the two data blocks being different and the test data being a differential voltage value within a preset time period under a preset voltage, the similarity between the two data blocks is determined to be the cosine similarity between the two data blocks.

3. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: Judgement p The busbar and q Whether the hash values ​​of the data blocks with serial number i of the buses are the same includes: The SHA256 algorithm is used to p The data block with the serial number i of the bus is hashed to obtain the first hash value; the first hash value is hashed by the SHA256 algorithm q Perform hash calculation on the data block with serial number i of the bus to obtain a second hash value; In response to the first hash value being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with serial number i on the buses are the same; In response to the first hash value not being equal to the second hash value, determining p The busbar and q The hash values ​​of the data blocks with sequence number i on the buses are different.

4. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: Calculate the p The busbar and q The serial number of the busbar is i The cosine similarity between the data blocks The formula is: ,in for p The serial number of the busbar is i In the data block g The differential voltage value at time For the q The serial number of the busbar is i In the data block g The differential voltage value at time p , q , g is a positive integer, t is the number of all moments in the data block, norm is the standard normalization function.

5. A data storage method for busbar withstand voltage test equipment according to claim 2, characterized in that: In response to the hash values ​​between the two data blocks being different, and the test data being a resistance value within a preset time period under a preset voltage, calculating the p The busbar and q The formula for the similarity between the data blocks with sequence number i in the bus is: ,in for p The serial number of the busbar is i In the data block g The resistance value at the moment, For the q The serial number of the busbar is i In the data block g The resistance value at the moment, p , q , g is a positive integer, t is the number of all moments in the data block.

6. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: Calculate the number of data blocks obtained by the second data segmentation of the jth bus The formula is: ,in is the maximum outlier degree of all busbars, is the median of the outliers of all busbars, It is a rounding function, which is used to round the value in brackets.

7. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: For j After the test data of the bus is divided into blocks for the second time, j The test data of each bus is deduplicated including: The said j The test data of the busbars is divided into blocks for the second time to obtain target data blocks; Calculate the hash value of each target data block; In response to at least two target data blocks having the same hash value, retaining one of the target data blocks and deleting the other data blocks to achieve the first j Deduplication of test data for each bus.

8. A data storage method for busbar withstand voltage test equipment according to claim 1, characterized in that: The encrypting and storing the test data after deduplication of each bus includes: Obtain a key, and encrypt the deduplicated test data of each bus according to the key to obtain encrypted data; The encrypted data is stored.

9. A data storage method for busbar withstand voltage test equipment according to claim 8, characterized in that: The key is constructed by the AES encryption algorithm.

10. A data storage system for a busbar withstand voltage test device, comprising a processor and a memory, wherein the memory stores a computer program, characterized in that: The processor executes the computer program to implement a data storage method for a busbar withstand voltage testing device as described in any one of claims 1 to 9.

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