Impact dent equivalent method and device, electronic equipment and storage medium

Abstract

The present application relates to the technical field of impact crater, and particularly relates to an impact crater equivalent method and device, electronic equipment and a storage medium. Initial size information of a plurality of simulated impact craters generated by impact on a target object is acquired; the initial size information includes an initial depth and an initial radius; a maximum stress value corresponding to each simulated impact crater is acquired; a target equivalent relationship corresponding to the impact simulated impact crater is generated according to the relationship between the initial depth and the initial radius and each maximum stress value. The accuracy of the generated target equivalent relationship is ensured. Further, the impact simulated impact crater is equivalent. Thus, a quantitative relationship between the size and stress characteristics of the non-standard impact simulated impact crater defect and the standard impact simulated impact crater defect can be established according to the target equivalent relationship.

Description

Technical Field

[0001] This invention relates to the field of impact dent technology, and more specifically to impact dent quantification methods, apparatus, electronic devices, and storage media. Background Technology

[0002] In modern engineering, the performance and safety of mechanical load-bearing structural components are of paramount importance. Traditionally, the service life of structural components is determined using the safe life method, which is based on the assumption that the structure is in an ideal, defect-free state for design and evaluation. However, in reality, structural components inevitably suffer from defects throughout their entire lifecycle, from raw material processing to manufacturing and finally to use, due to various factors. The presence of these defects significantly impacts the performance and service life of the structural components and may even jeopardize structural safety.

[0003] The defect-tolerant safe-life design method has emerged as a more advanced and reliable design concept. Based on the safe-life design method, it fully considers defects and damage generated during the manufacturing process and during the service life of structural components, thus more closely reflecting actual working conditions and more effectively predicting the fatigue strength and service life of structural components. Among the many possible defect forms, impact defects are particularly common. Their main occurrence scenarios include accidental collisions during machining operations and accidental drops of tools during maintenance. These situations often lead to the formation of impact-simulated impact dents on the surface of parts.

[0004] The presence of impact crater defects in simulated impacts not only alters the geometry of a part's surface, but more importantly, it induces complex stress state changes in the localized defect area. Specifically, impact crater defects lead to localized residual stress, and due to the abrupt change in geometry, a stress concentration effect forms around the simulated impact crater. When the structural component is subjected to fatigue loads, the localized high stress field induced by the stress concentration effect superimposes with the residual stress field, jointly determining the local stress state of the simulated impact crater, and thus playing a crucial controlling role in the fatigue life of the material.

[0005] Therefore, how to quantify the impact dent in the impact simulation has become an urgent problem to be solved. Summary of the Invention

[0006] In view of this, the present invention provides a method, apparatus, electronic device and storage medium for quantifying impact dents to solve the problem of quantifying impact dents.

[0007] In a first aspect, the present invention provides a method for quantifying impact dents, the method comprising:

[0008] Obtain the initial size information of multiple simulated impact craters generated by impacting the target object; the initial size information includes the initial depth and initial radius;

[0009] Obtain the maximum stress value corresponding to each simulated impact crater;

[0010] Based on the relationship between the initial depth and initial radius and each maximum stress value, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated.

[0011] The impact dent equivalence method provided in this application obtains the initial size information of multiple simulated impact dents generated by impacting a target object; obtains the maximum stress value corresponding to each simulated impact dent; and generates a target equivalence relationship for the simulated impact dents based on the relationship between the initial depth and initial radius and each maximum stress value, ensuring the accuracy of the generated target equivalence relationship. This achieves the equivalence of simulated impact dents. Therefore, a quantitative relationship of size and stress characteristics between non-standard and standard simulated impact dent defects can be established based on the target equivalence relationship. In defect tolerance design, this method can unify complex and diverse simulated impact dent defects under standard dimensions for study and analysis, simplifying the research process and improving efficiency.

[0012] In one optional implementation, obtaining initial size information of multiple simulated impact dents generated by impacting a target object includes:

[0013] Obtain the target material corresponding to the target object;

[0014] Based on the target material, determine the corresponding material dynamic deformation constitutive parameters;

[0015] Based on the material dynamic deformation constitutive parameters, the target object is simulated to be impacted in the preset finite element analysis software, and various simulated impact dents are generated.

[0016] Obtain the initial size information corresponding to each simulated impact dent; the initial size information corresponding to each simulated impact dent is different.

[0017] The impact dent equivalence method provided in this application obtains the target material corresponding to the target object; based on the target material, it determines the dynamic deformation constitutive parameters of the target material, ensuring the accuracy of the determined dynamic deformation constitutive parameters. This ensures the accuracy and true value of each simulated impact dent generated by simulating impact on the target object in preset finite element analysis software based on the dynamic deformation constitutive parameters. The method also obtains the initial size information corresponding to each simulated impact dent, ensuring the accuracy of the obtained initial size information.

[0018] In one optional implementation, obtaining the maximum stress value corresponding to each simulated impact crater includes:

[0019] Obtain the maximum static load that the target object can withstand;

[0020] Apply the maximum static load to each simulated impact dent;

[0021] Obtain the defect stress field of each simulated impact crater under maximum static load conditions;

[0022] For each simulated impact dent, the stress field of the defect is analyzed to determine the maximum stress value corresponding to the simulated impact dent.

[0023] The impact dent quantification method provided in this application obtains the maximum static load that the target object can withstand; adds the maximum static load to each simulated impact dent; obtains the defect stress field of each simulated impact dent under the maximum static load condition; analyzes the defect stress field for each simulated impact dent, and determines the maximum stress value corresponding to the simulated impact dent, thus ensuring the accuracy of the determined maximum stress value corresponding to the simulated impact dent.

[0024] In one optional implementation, the stress field of the defect is analyzed to determine the maximum stress value corresponding to the simulated impact crater, including:

[0025] Based on the preset finite element analysis software, the defect stress field data of each simulated impact crater under the maximum static load condition are obtained; the defect stress field data includes the distribution information of each component of the stress tensor in the entire simulation area.

[0026] Data preprocessing is performed on the defect stress field data to generate target stress field data;

[0027] Based on the target stress field data, determine the nodal stress data corresponding to each node in the simulated impact crater;

[0028] By comparing the magnitudes of stress components at each node in different directions, the principal stress values ​​at each node are determined.

[0029] By comparing the principal stress values ​​corresponding to each node, the maximum principal stress value is determined to be the maximum stress value.

[0030] The impact dent equivalence method provided in this application, based on preset finite element analysis software, acquires defect stress field data of each simulated impact dent under maximum static load conditions, ensuring the accuracy of the acquired defect stress field data. Data preprocessing is performed on the defect stress field data to generate target stress field data, ensuring the accuracy of the generated target stress field data. Based on the target stress field data, the nodal stress data corresponding to each node in the simulated impact dent is determined, ensuring the accuracy of the determined nodal stress data. The magnitudes of stress components in different directions at each node are compared to determine the principal stress values ​​of each node, ensuring the accuracy of the determined principal stress values. Then, the principal stress values ​​corresponding to each node are compared, and the largest principal stress value is determined as the maximum stress value, ensuring the accuracy of the determined maximum stress value.

[0031] In one optional implementation, the target equivalent relationship for the impact crater in the impact simulation is generated based on the relationship between the initial depth and initial radius and each maximum stress value, including:

[0032] Normalize each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value;

[0033] Based on the relationship between the target depth and target radius and the maximum stress value of each target, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated.

[0034] The impact crater equivalence method provided in this application normalizes each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value, ensuring the accuracy of the generated target depths, radius, and maximum stress values. Based on the relationship between the target depths and radii and each target maximum stress value, a target equivalence relationship corresponding to the simulated impact crater is generated, ensuring the accuracy of the generated target equivalence relationship for the simulated impact crater.

[0035] In one optional implementation, based on the relationship between the target depth and target radius and the maximum stress value of each target, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated, including:

[0036] Based on the relationship between the depth of each target and the maximum stress value of each target, the depth of each target and the maximum stress value of each target are fitted to generate the first equivalent relationship function between the depth and the maximum stress value.

[0037] Based on the relationship between the radius of each target and the maximum stress value of each target, the radius of each target and the maximum stress value of each target are fitted to generate a second equivalent relationship function between the radius and the maximum stress value;

[0038] The target equivalent relationship is generated based on the first equivalent relationship function and the second equivalent relationship function.

[0039] The impact dent equivalence method provided in this application, based on the relationship between the depth and maximum stress value of each target, fits the depth and maximum stress value of each target to generate a first equivalent relationship function between the depth and the maximum stress value, ensuring the accuracy of the generated first equivalent relationship function. Based on the relationship between the radius and maximum stress value of each target, it fits the radius and maximum stress value of each target to generate a second equivalent relationship function between the radius and the maximum stress value, ensuring the accuracy of the generated second equivalent relationship function. Based on the first and second equivalent relationship functions, a target equivalent relationship is generated, ensuring the accuracy of the generated target equivalent relationship.

[0040] In one optional implementation, generating a target equivalent relationship based on a first equivalent relationship function and a second equivalent relationship function includes:

[0041] The target equivalent relationship is generated by multiplying the first equivalent relationship function and the second equivalent relationship function.

[0042] The impact dent equivalence method provided in this application multiplies the first equivalence relationship function and the second equivalence relationship function to generate the target equivalence relationship, thus ensuring the accuracy of the generated target equivalence relationship.

[0043] In a second aspect, the present invention provides an impact dent equivalent device, the device comprising:

[0044] The first acquisition module is used to acquire the initial size information of multiple simulated impact craters generated by impacting the target object; the initial size information includes the initial depth and the initial radius;

[0045] The second acquisition module is used to acquire the maximum stress value corresponding to each simulated impact dent.

[0046] The generation module is used to generate the target equivalent relationship for the impact crater in the impact simulation based on the relationship between the initial depth and initial radius and each maximum stress value.

[0047] Thirdly, the present invention provides an electronic device, comprising: a memory and a processor, the memory and the processor being communicatively connected to each other, the memory storing computer instructions, and the processor executing the computer instructions to perform the impact dent quantification method of the first aspect or any corresponding embodiment described above.

[0048] Fourthly, the present invention provides a computer-readable storage medium storing computer instructions for causing a computer to perform the impact dent equivalence method of the first aspect or any corresponding embodiment thereof.

[0049] Fifthly, the present invention provides a computer program product, including computer instructions for causing a computer to execute the impact dent equivalence method of the first aspect or any corresponding embodiment thereof. Attached Figure Description

[0050] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0051] Figure 1 This is a flowchart illustrating the impact dent quantification method according to an embodiment of the present invention;

[0052] Figure 2 This is a flowchart illustrating another impact dent quantification method according to an embodiment of the present invention;

[0053] Figure 3 This is a flowchart illustrating another impact dent equivalence method according to an embodiment of the present invention;

[0054] Figure 4 This is a schematic diagram of the finite element simulation results of the impact dent impact process according to an embodiment of the present invention;

[0055] Figure 5 This is a schematic diagram of the finite element simulation results of impact followed by monotonic tension according to an embodiment of the present invention;

[0056] Figure 6 This is a schematic diagram of the fitting results of the "normalized size-normalized stress characteristics" according to an embodiment of the present invention;

[0057] Figure 7 This is a structural block diagram of the impact dent equalization device according to an embodiment of the present invention;

[0058] Figure 8 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0059] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0060] In modern engineering, the performance and safety of mechanical load-bearing structural components are of paramount importance. Traditionally, the service life of structural components is determined using the safe life method, which is based on the assumption that the structure is in an ideal, defect-free state for design and evaluation. However, in reality, structural components inevitably suffer from defects throughout their entire lifecycle, from raw material processing to manufacturing and finally to use, due to various factors. The presence of these defects significantly impacts the performance and service life of the structural components and may even jeopardize structural safety.

[0061] The defect-tolerant safe-life design method has emerged as a more advanced and reliable design concept. Based on the safe-life design method, it fully considers defects and damage generated during the manufacturing process and during the service life of structural components, thus more closely reflecting actual working conditions and more effectively predicting the fatigue strength and service life of structural components. Among the many possible defect forms, impact defects are particularly common. Their main occurrence scenarios include accidental collisions during machining operations and accidental drops of tools during maintenance. These situations often lead to the formation of impact-simulated impact dents on the surface of parts.

[0062] The main defect types considered in defect tolerance design include impact, scratches, corrosion, and combined defects. Among these, impact defects are primarily caused by tool drops during machining and repair, resulting in impact-simulated impact dents on the part surface. These impact-simulated dents lead to localized residual stress and stress concentration effects. Under fatigue loading, the localized stress field caused by stress concentration and the residual stress field superimpose to jointly determine the local stress state of the simulated impact dent and control the fatigue life of the material.

[0063] The presence of impact crater defects in simulated impacts not only alters the geometry of a part's surface, but more importantly, it induces complex stress state changes in the localized defect area. Specifically, impact crater defects lead to localized residual stress, and due to the abrupt change in geometry, a stress concentration effect forms around the simulated impact crater. When the structural component is subjected to fatigue loads, the localized high stress field induced by the stress concentration effect superimposes with the residual stress field, jointly determining the local stress state of the simulated impact crater, and thus playing a crucial controlling role in the fatigue life of the material.

[0064] However, the morphology and size of impact-simulated impact dents in structural components during service are not fixed but are influenced by a combination of factors. Different impactor geometries, such as spherical, cylindrical, or conical impactors, will leave simulated impact dents of different shapes on the component surface; variations in the impact angle will cause differences in the shape and depth distribution of the simulated impact dents; and the impact velocity directly affects the depth and size of the simulated impact dents. These factors intertwine, resulting in a great deal of diversity in the morphology and size of impact-simulated impact dents between different structural components, and even within the same structural component under different service conditions. Given this complex and diverse range of impact-simulated impact dent defects, studying each and every real-world impact-simulated impact dent individually would be virtually impossible, considering time, economic costs, and research feasibility.

[0065] Within the research framework of defect-tolerant design methods, a standardized defect model is urgently needed to simplify the research process and improve efficiency. Extensive research and practice have revealed that spherical impact crater defects, due to their relatively regular geometry and ease of analysis and simulation, have been identified as a standard defect shape suitable for defect-tolerant design research. By establishing an equivalence method for impact crater defects, various actual impact crater defects of different sizes and shapes can be equivalently converted into spherical impact crater defects with a specified depth or radius. This allows researchers to obtain the defect tolerance characteristics of materials or structures by focusing on this standard defect, without the need for tedious and impractical individual studies of all possible sized defects. The establishment of this method is of great significance for promoting the development of defect-tolerant design research and improving the design reliability and safety of structural components.

[0066] It should be noted that the impact dent equivalence method provided in this application embodiment can be executed by an impact dent equivalence device. This device can be implemented as part or all of an electronic device through software, hardware, or a combination of both. The electronic device can be a server or a terminal. In this application embodiment, the server can be a single server or a server cluster composed of multiple servers. The terminal in this application embodiment can be a smartphone, personal computer, tablet computer, wearable device, or other intelligent hardware device such as an intelligent robot. The following method embodiments will use an electronic device as the execution subject for illustration.

[0067] According to an embodiment of the present invention, an embodiment of the impact dent equivalence method is provided. It should be noted that the steps shown in the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions. Furthermore, although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in a different order than that shown here.

[0068] This embodiment provides a method for quantifying impact dents, which can be used in the aforementioned electronic devices. Figure 1 This is a flowchart of the impact dent equivalence method according to an embodiment of the present invention, such as... Figure 1 As shown, the process includes the following steps:

[0069] Step S101: Obtain the initial size information of multiple simulated impact dents generated by impacting the target object.

[0070] The initial size information includes the initial depth and the initial radius.

[0071] Specifically, the electronic device can receive initial size information of multiple simulated impact dents generated by impacting a target object, input by a user, or it can receive initial size information of multiple simulated impact dents generated by impacting a target object, sent by other devices. The electronic device can also simulate impacting the target object to generate multiple simulated impact dents and obtain the initial size information of multiple simulated impact dents.

[0072] This application does not specifically limit the method by which the electronic device obtains the initial size information of multiple simulated impact dents generated by impacting a target object.

[0073] Optionally, the electronic device can receive user input determining the standard dimensions of the simulated impact crater defect based on the implementation context, namely, the standard depth and standard radius of the simulated impact crater defect. Then, the electronic device can acquire multiple simulated impact craters, which may include at least one simulated impact crater with an initial depth equal to the standard depth and an initial radius greater than the standard radius; at least one simulated impact crater with an initial depth equal to the standard depth and an initial radius equal to the standard radius; at least one simulated impact crater with an initial depth equal to the standard depth and an initial radius less than the standard radius; at least one simulated impact crater with an initial depth greater than the standard depth and an initial radius equal to the standard radius; and at least one simulated impact crater with an initial depth less than the standard depth and an initial radius equal to or greater than the standard radius.

[0074] This step will be explained in detail below.

[0075] Step S102: Obtain the maximum stress corresponding to each simulated impact dent.

[0076] Specifically, the electronic device can receive the maximum stress corresponding to each simulated impact dent input by the user, and the electronic device can also receive the maximum stress corresponding to each simulated impact dent sent by other devices. The electronic device can also calculate the maximum stress corresponding to each simulated impact dent based on the simulated impact dents obtained from the simulation.

[0077] The embodiments of this application do not specifically limit the method by which the electronic device obtains the maximum stress corresponding to each simulated impact dent.

[0078] This step will be explained in detail below.

[0079] Step S103: Based on the relationship between the initial depth and initial radius and each maximum stress value, generate the target equivalent relationship corresponding to the impact crater in the impact simulation.

[0080] Specifically, the electronic device can fit the functional relationship between the initial depth and the maximum stress value, as well as the functional relationship between the initial radius and each maximum stress value, respectively. Then, based on the obtained functional relationship between the initial depth and the maximum stress value, as well as the functional relationship between the initial radius and each maximum stress value, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated.

[0081] This step will be explained in detail below.

[0082] The impact dent equivalence method provided in this application obtains the initial size information of multiple simulated impact dents generated by impacting a target object; obtains the maximum stress value corresponding to each simulated impact dent; and generates a target equivalence relationship for the simulated impact dents based on the relationship between the initial depth and initial radius and each maximum stress value, ensuring the accuracy of the generated target equivalence relationship. This achieves the equivalence of simulated impact dents. Therefore, a quantitative relationship of size and stress characteristics between non-standard and standard simulated impact dent defects can be established based on the target equivalence relationship. In defect tolerance design, this method can unify complex and diverse simulated impact dent defects under standard dimensions for study and analysis, simplifying the research process and improving efficiency.

[0083] This embodiment provides a method for quantifying impact dents, which can be used in the aforementioned electronic devices. Figure 2 This is a flowchart of the impact dent equivalence method according to an embodiment of the present invention, such as... Figure 2 As shown, the process includes the following steps:

[0084] Step S201: Obtain the initial size information of multiple simulated impact dents generated by impacting the target object.

[0085] The initial size information includes the initial depth and the initial radius.

[0086] Specifically, step S201 above may include the following steps:

[0087] Step S2011: Obtain the target material corresponding to the target object.

[0088] Specifically, electronic devices can receive target materials corresponding to target objects input by users, or they can receive target materials corresponding to target objects sent by other devices.

[0089] Step S2012: Determine the dynamic deformation constitutive parameters of the target material based on the target material.

[0090] Specifically, electronic devices can query the dynamic deformation constitutive parameters of the target material from the deformation constitutive parameter database.

[0091] Step S2013: Based on the material dynamic deformation constitutive parameters, simulate the impact on the target object in the preset finite element analysis software to generate simulated impact dents.

[0092] Specifically, electronic devices can create geometric models using pre-defined 3D modeling software (such as SolidWorks, CATIA, etc.) based on the actual shape and size of the target object. During the modeling process, the electronic devices can fully consider the structural features of the target object, including complex surfaces, holes, chamfers, and other details, ensuring that the geometric model accurately reflects the true form of the target object. For example, for aero-engine components with complex internal flow channels, the geometry of the flow channels needs to be constructed in detail to ensure the accuracy of subsequent simulations.

[0093] Then, the electronic device imports the constructed geometric model into a preset finite element analysis software (such as Abaqus, ANSYS, etc.). Within this software environment, the electronic device repairs and simplifies the geometric model corresponding to the target material. It repairs potential geometric defects (such as gaps, overlapping surfaces, etc.) to ensure smooth finite element mesh generation. Simultaneously, based on the focus of the analysis and the limitations of computational resources, it appropriately simplifies some detailed features that have a minor impact on the overall mechanical behavior, improving computational efficiency without significantly affecting accuracy.

[0094] In finite element analysis software, the electronic device assigns corresponding material properties to the geometric model based on the pre-determined constitutive parameters of the target material's dynamic deformation. Besides constitutive parameters, other basic physical properties of the material, such as density and Poisson's ratio, also need to be set. For anisotropic materials, material parameters in different directions must be accurately input to realistically simulate the differences in mechanical properties across these directions. Considering the dynamic response characteristics of the material during impact, corresponding material behavior descriptions are set in the software based on the material's dynamic deformation constitutive model. For example, for materials using the Johnson-Cook constitutive model, various parameters from the model (yield strength, hardening coefficient, strain rate sensitivity coefficient, temperature softening coefficient, etc.) need to be input into the software to ensure the finite element model can accurately simulate the dynamic deformation and stress-strain relationship of the material under impact loading.

[0095] Next, the electronic device performs finite element mesh generation on the geometric model of the target object based on a preset mesh generation algorithm and element type. Different mesh density strategies are adopted according to the structural characteristics and stress distribution of the target object. A finer mesh is used in areas of expected stress concentration (such as areas where impact craters may form in impact simulations, or locations of structural abrupt changes) to accurately capture stress changes; in areas with relatively gentle stress changes, the mesh size is appropriately increased to reduce computational load while maintaining accuracy. The mesh quality is checked and optimized to ensure that quality indicators such as distortion rate and aspect ratio meet computational requirements. A high-quality mesh helps improve the stability and accuracy of finite element calculations, avoiding deviations or non-convergence in calculation results due to mesh quality issues. For example, the mesh quality in critical areas can be improved by adjusting the mesh node distribution, localizing mesh refinement, or re-meshing.

[0096] Electronic devices determine the type of impact load (such as concentrated force, distributed force, impact velocity, etc.) and the loading method based on the actual impact conditions. If actual measured impact load data is available (such as data obtained by sensors in similar impact tests), it can be directly converted into load boundary conditions in the finite element model. If actual data is lacking, the magnitude, direction, and duration of the impact load are reasonably set based on experience or relevant standards. For example, in a tool drop impact scenario, the impact velocity can be calculated based on parameters such as the tool's mass and drop height, and then applied as a concentrated force to the corresponding position of the target object. Considering the dynamic characteristics of the impact load, a suitable loading curve is used to describe the load's change over time. Common loading curves include half-sine waves, triangular waves, and trapezoidal waves. The appropriate waveform is selected based on the actual characteristics of the impact, and its amplitude, period, and other parameters are determined. For example, for instantaneous impact events, a half-sine wave loading curve can be used, where the amplitude represents the maximum impact load, and the period reflects the impact duration.

[0097] Furthermore, the electronic device applies accurate boundary conditions in the finite element model based on the constraints of the target object during the actual impact process. If the target object is subject to fixed constraints in a certain direction (e.g., a structural component mounted on a base cannot move in that direction), the displacement constraint in that direction is set to zero; for cases with partially restricted degrees of freedom (e.g., only able to rotate around a certain axis), corresponding rotational constraints are applied. Considering potential contact issues during the impact process, reasonable contact algorithms and parameters are set. If there is collision or contact between the target object and other components, contact pairs are defined, and contact properties are set, including parameters such as the friction coefficient and contact stiffness. For example, when simulating an impact collision between two metal parts, a suitable friction coefficient is determined based on the material surface condition and lubrication to accurately simulate the influence of friction on the impact response during the contact process.

[0098] After the electronic equipment completes the finite element model setup, it uses high-performance computing resources (such as cluster computing, cloud computing, etc.) to perform simulation calculations and generate various simulated impact craters.

[0099] Step S2014: Obtain the initial size information corresponding to each simulated impact dent.

[0100] The initial dimensions of each simulated impact crater are different.

[0101] Specifically, after completing the impact simulation and generating the simulated impact crater, the electronic device extracts the node coordinates and element information related to the simulated impact crater from the preset finite element model.

[0102] Then, based on material deformation and stress distribution, the surface extent of the simulated impact crater is determined. In the finite element model, nodes and elements on the simulated impact crater surface are identified by setting criteria such as stress thresholds, deformation thresholds, or geometric features. For example, the area where the stress exceeds a certain multiple of the material's yield strength is defined as the simulated impact crater surface, or the simulated impact crater surface is determined based on node displacement exceeding a specific value. The identified nodes and elements on the simulated impact crater surface are marked to provide basic data for subsequent calculations of the simulated impact crater's dimensions.

[0103] The electronic device determines a reference plane for calculating the depth of the simulated impact crater based on the geometry of the target object and the impact direction. Typically, a plane perpendicular to the impact direction and passing through the original surface of the target object is chosen as the reference plane. For complex-shaped targets, a more appropriate plane may need to be selected to ensure the accuracy and clear physical meaning of the depth calculation. The electronic device then calculates the distances from nodes to the reference plane: for each node on the simulated impact crater surface, its perpendicular distance to the reference plane is calculated. The distance value can be calculated using spatial geometric relationships through the node coordinates and the equation of the reference plane. During the calculation, attention must be paid to the consistency of the coordinate system and the control of calculation accuracy. The electronic device sorts the distances from all nodes on the simulated impact crater surface to the reference plane and takes the maximum value as the depth value of the simulated impact crater. The node position corresponding to this maximum value is usually located at the deepest point of the simulated impact crater, and its distance to the reference plane represents the maximum indentation degree of the simulated impact crater in that direction, reflecting the depth characteristics of the simulated impact crater.

[0104] Furthermore, the electronic device calculates the center position of the simulated impact crater based on the distribution of nodes on the surface. A common method is to calculate the average coordinates of the nodes on the simulated impact crater surface as an approximate estimate of the center position. For simulated impact craters with relatively regular shapes, this method can provide a more accurate center position; for irregular craters, more complex geometric algorithms can be used, such as least squares-based fitting methods, to find the center of an optimally fitted circle as the crater center.

[0105] Then, for each node on the simulated impact crater surface, the distance to the center of the simulated impact crater is calculated. This is done using the node coordinates and the center coordinates, according to the distance formula between two points. The distances from all nodes on the simulated impact crater surface to the center are sorted, and the maximum value is taken as the radius of the simulated impact crater. The node corresponding to this maximum value is usually located at the farthest edge of the simulated impact crater, and its distance to the center is approximately the radius of the crater, reflecting the dimensional characteristics of the crater in the planar direction. For non-circular craters, characteristic dimensions in multiple directions (such as the length of the major axis and minor axis) can be calculated to describe their shape and dimensional characteristics.

[0106] Step S202: Obtain the maximum stress corresponding to each simulated impact dent.

[0107] Specifically, step S202 above may include the following steps:

[0108] Step S2021: Obtain the maximum static load that the target object can withstand.

[0109] Specifically, the electronic device can receive the maximum static load that the target object can withstand, input by the user, and can also calculate the maximum static load that the target object can withstand based on the material characteristics and structural characteristics of the target object.

[0110] Step S2022: Add the maximum static load to each simulated impact dent.

[0111] Specifically, in finite element analysis software, electronic devices can apply the obtained maximum static load to the simulated impact crater model in an appropriate manner. If the maximum static load is a concentrated force, it can be applied directly to the crater surface or related critical parts; if it is a distributed force, it can be uniformly or non-uniformly distributed in the corresponding area according to the actual load distribution.

[0112] In this model, electronic devices can define the direction and mode of application of the maximum static load to match the stress conditions experienced by the target object in actual use. For example, if the target object is subjected to vertical pressure in reality, the maximum static load should also be applied in the vertical direction in the finite element model. Furthermore, considering the loading rate, a slow loading method is generally used for static loads to avoid the influence of dynamic effects.

[0113] Step S2023: Obtain the defect stress field of each simulated impact crater under maximum static load conditions.

[0114] Specifically, the electronic device performs calculations on the simulated impact crater model after applying the maximum static load. During the calculation, the electronic device can solve the equilibrium equations of the structure based on the model's material properties, geometry, boundary conditions, and loading conditions to obtain the displacement and stress fields of the simulated impact crater under the maximum static load.

[0115] Step S2024: For each simulated impact dent, analyze the stress field of the defect to determine the maximum stress value corresponding to the simulated impact dent.

[0116] Specifically, the step S2024 above, "analyzing the stress field of the defect and determining the maximum stress value corresponding to the simulated impact crater," may include the following steps:

[0117] Step a1: Based on the preset finite element analysis software, obtain the defect stress field data of each simulated impact crater under the maximum static load condition.

[0118] The defect stress field data includes the distribution information of each component of the stress tensor throughout the simulation region.

[0119] Specifically, the electronic device can add appropriate calculation parameters to the preset finite element analysis software, including solver type (such as implicit or explicit solver, selected according to the nonlinearity and dynamic characteristics of the problem), iterative algorithm (such as the Newton-Raphson iteration method), convergence criteria (such as stress convergence criteria, displacement convergence criteria, etc., to ensure the accuracy and stability of the calculation results), and time step (for dynamic or nonlinear problems, a reasonable time step is selected to ensure a balance between calculation accuracy and calculation efficiency). Then, based on the finite element theory and the set calculation parameters, numerical calculations are performed on the geometric model corresponding to the simulated impact crater to obtain the defect stress field data of the simulated impact crater under the maximum static load condition.

[0120] Step a2: Perform data preprocessing on the defect stress field data to generate target stress field data.

[0121] Specifically, the electronic equipment checks the acquired defect stress field data to see if there are any missing data, outliers (such as stress values ​​that are too large or too small, exceeding the reasonable range), or data discontinuities. For nodes or elements with missing data, interpolation algorithms (such as linear interpolation, cubic spline interpolation, etc.) are used to reasonably supplement the data based on the stress distribution of surrounding nodes. For outliers, the data is judged by comparing them with the stress values ​​of adjacent nodes and combining them with the physical model. If the data is determined to be erroneous, an appropriate method is used to correct it (such as taking the average stress of adjacent nodes to replace the outlier) to ensure the integrity and reliability of the data.

[0122] To reduce fluctuations in stress field data caused by computational errors and discretization effects, electronic devices can employ data smoothing and filtering techniques to process the raw data. For example, moving averages and Gaussian filtering can be used to smooth stress field data, reducing noise levels and making the stress distribution more continuous and smoother without altering the overall trend and characteristics of the stress field. This facilitates subsequent analysis and accurate identification of stress concentration areas.

[0123] Furthermore, electronic devices can perform coordinate transformations on stress field data as needed for the analysis. For example, if the local coordinate system used in the finite element model is inconsistent with the global coordinate system used in subsequent analyses, the components of the stress tensor in the local coordinate system need to be transformed to the global coordinate system to ensure compatibility and consistency of data across different analysis stages and software modules. Simultaneously, the processed data is converted into a unified data format to facilitate subsequent data reading, processing, and analysis.

[0124] Step a3: Based on the target stress field data, determine the nodal stress data corresponding to each node in the simulated impact crater.

[0125] Specifically, electronic devices can calculate the nodal stress data corresponding to each node in the simulated impact crater using preset calculation methods based on finite element theory. Preset calculation methods can include weighted average methods based on element stress and nodal stress calculation methods based on shape functions. The weighted average method weights and averages the element stress according to the size, shape, and connection relationship with the nodes, distributing the result to the nodes; the shape function-based method uses the values ​​of the element's shape function at the nodes to extrapolate the stress at the element integration point to the nodes. A suitable nodal stress calculation method is selected based on the characteristics of the model and the required calculation accuracy.

[0126] Specifically, the electronic device can traverse all nodes of the simulated impact crater according to a preset calculation method, calculating the stress components of each node. For each node, considering all adjacent elements, the stress values ​​(including normal stress and shear stress) of the node in various directions are calculated based on the stress state of the elements and the geometric relationship between the node and the elements. The calculated node stress values ​​are stored in an orderly manner according to the node number, forming a node stress data set. The stress data of each node contains the stress component information of that node in different directions, providing basic data for subsequent determination of principal stress values.

[0127] Step a4: Compare the stress components of each node in different directions to determine the principal stress value of each node.

[0128] Specifically, the magnitude and direction of the principal stresses can be determined by solving for the eigenvalues ​​and eigenvectors of the stress tensor. For a three-dimensional stress state, let the stress tensor be... Its principal stresses σ1, σ2, and σ3 satisfy the characteristic equation |σ-λI|=0 (where λ is the principal stress value and I is the identity matrix). Solving this equation yields the three principal stress values.

[0129] For each node, the electronic device substitutes the nodal stress components into the aforementioned characteristic equation to obtain three principal stress values ​​σ1, σ2, and σ3 (arranged in descending order). Simultaneously, the direction of the principal stresses can be determined by solving for the eigenvectors, which represent the direction cosines of the principal stress directions relative to the original coordinate system. In practical calculations, numerical methods (such as the Jacobi iteration method and QR decomposition method) can be used to solve the eigenvalue and eigenvector problems, ensuring the accuracy and efficiency of the calculation. The calculated principal stress values ​​and corresponding direction information are associated with the node numbers and stored for subsequent analysis and comparison.

[0130] Step a5: Compare the principal stress values ​​corresponding to each node, and determine the maximum principal stress value as the maximum stress value.

[0131] Specifically, the electronic device can compare the principal stress values ​​corresponding to each node and determine the maximum principal stress value as the maximum stress value.

[0132] Step S203: Based on the relationship between the initial depth and initial radius and each maximum stress value, generate the target equivalent relationship corresponding to the impact crater in the impact simulation.

[0133] Please refer to the above description of step S103 for details on this step, which will not be repeated here.

[0134] The impact dent equivalence method provided in this application obtains the target material corresponding to the target object; based on the target material, it determines the dynamic deformation constitutive parameters of the target material, ensuring the accuracy of the determined dynamic deformation constitutive parameters. This ensures the accuracy and true value of each simulated impact dent generated by simulating impact on the target object in a preset finite element analysis software based on the dynamic deformation constitutive parameters. It obtains the initial size information corresponding to each simulated impact dent, ensuring the accuracy of the obtained initial size information. It obtains the maximum static load that the target object can withstand; adds the maximum static load to each simulated impact dent; obtains the defect stress field of each simulated impact dent under the maximum static load condition; for each simulated impact dent, based on the preset finite element analysis software, it obtains the defect stress field data of each simulated impact dent under the maximum static load condition, ensuring the accuracy of the obtained defect stress field data. It preprocesses the defect stress field data to generate target stress field data, ensuring the accuracy of the generated target stress field data. Based on the target stress field data, it determines the nodal stress data corresponding to each node in the simulated impact dent, ensuring the accuracy of the determined nodal stress data. By comparing the stress components at each node in different directions, the principal stress values ​​of each node are determined, ensuring the accuracy of the determined principal stress values. Then, the principal stress values ​​corresponding to each node are compared, and the largest principal stress value is determined as the maximum stress value, ensuring the accuracy of the determined maximum stress value.

[0135] This embodiment provides a method for quantifying impact dents, which can be used in the aforementioned electronic devices. Figure 3 This is a flowchart of the impact dent equivalence method according to an embodiment of the present invention, such as... Figure 3 As shown, the process includes the following steps:

[0136] Step S301: Obtain the initial size information of multiple simulated impact dents generated by impacting the target object.

[0137] The initial size information includes the initial depth and the initial radius.

[0138] Please refer to the above description of step S201 for details on this step, which will not be repeated here.

[0139] Step S302: Obtain the maximum stress corresponding to each simulated impact dent.

[0140] Please refer to the above description of step S202 for details on this step, which will not be repeated here.

[0141] Step S303: Based on the relationship between the initial depth and initial radius and each maximum stress value, generate the target equivalent relationship corresponding to the impact crater in the impact simulation.

[0142] Specifically, step S303 above may include the following steps:

[0143] Step S3031: Normalize each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value.

[0144] Specifically, the electronic device can normalize each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value.

[0145] For example, let the depth and radius of a standard simulated impact crater be h0 and r0, respectively, and let the depth and radius of a non-standard simulated impact crater be h and r, respectively. Then the normalized depth and radius of the impact crater defect are respectively... The normalized depth and radius of the standard simulated impact crater are respectively Let σ0 be the maximum stress value of the standard simulated impact dent, and σ be the maximum stress value of the non-standard simulated impact dent. Then the normalized stresses of the impact dent defects are respectively... The normalized stress of a standard simulated impact dent is

[0146] Step S3032: Based on the relationship between the target depth and target radius and the maximum stress value of each target, generate the target equivalent relationship corresponding to the impact crater in the impact simulation.

[0147] Specifically, step S3032 above may include the following steps:

[0148] Step b1: Based on the relationship between the depth of each target and the maximum stress value of each target, fit the depth of each target and the maximum stress value of each target to generate the first equivalent relationship function between the depth and the maximum stress value.

[0149] Specifically, the electronic device can use a preset fitting method to fit the depth of each target and the maximum stress value of each target based on the relationship between the depth of each target and the maximum stress value of each target, and generate a first equivalent relationship function between the depth and the maximum stress value.

[0150] The preset fitting method can be the least squares fitting method or other multiplication fitting methods.

[0151] For example, the electronic device fits the depth of each target and the maximum stress value of each target using the least squares fitting method, generating a first equivalent relationship function between the depth and the maximum stress value.

[0152] Step b2: Based on the relationship between the radius of each target and the maximum stress value of each target, fit the radius of each target and the maximum stress value of each target to generate a second equivalent relationship function between the radius and the maximum stress value.

[0153] Specifically, the electronic device can use a preset fitting method to fit the radius of each target and the maximum stress value of each target based on the relationship between the radius of each target and the maximum stress value of each target, and generate a second equivalent relationship function between the radius and the maximum stress value.

[0154] The preset fitting method can be the least squares fitting method or other multiplication fitting methods.

[0155] For example, the electronic device fits the radius and maximum stress value of each target using the least squares fitting method, generating a second equivalent relationship function between the radius and the maximum stress value.

[0156] Step b3: Generate the target equivalent relationship based on the first equivalent relationship function and the second equivalent relationship function.

[0157] Specifically, step b3 above may include the following steps:

[0158] The target equivalent relationship is generated by multiplying the first equivalent relationship function and the second equivalent relationship function.

[0159] Specifically, the electronic device can multiply the first equivalent relation function and the second equivalent relation function to generate the target equivalent relation.

[0160] For example, the sub-device can multiply the first equivalent relation function and the second equivalent relation function to generate the target equivalent relation.

[0161] The impact dent equivalence method provided in this application normalizes each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value, ensuring the accuracy of the generated target depths, radii, and maximum stress values. Then, based on the relationship between each target depth and each target maximum stress value, the method fits each target depth and each target maximum stress value to generate a first equivalent relationship function between depth and maximum stress value, ensuring the accuracy of the generated first equivalent relationship function. Based on the relationship between each target radius and each target maximum stress value, the method fits each target radius and each target maximum stress value to generate a second equivalent relationship function between radius and maximum stress value, ensuring the accuracy of the generated second equivalent relationship function. Finally, the first and second equivalent relationship functions are multiplied to generate the target equivalent relationship, ensuring the accuracy of the generated target equivalent relationship.

[0162] To better illustrate the impact dent equivalence method provided in this application, a specific embodiment is provided.

[0163] This embodiment describes the equivalent dimpling defect of TC4 titanium alloy. TC4 titanium alloy is a commonly used structural material in the aerospace industry, with applications including load-bearing components in aircraft and helicopters, and blades and casings of aero-engine fans and compressors. For these applications, titanium alloy components are prone to impact dimpling due to service and maintenance, presenting a defect tolerance issue. Therefore, in this example, TC4 titanium alloy is chosen for a detailed description of the invention.

[0164] Step 1: Selecting the defect tolerance design of the helicopter transmission system as the background, we can determine that the standard impact pit defect size of TC4 titanium alloy is 6mm in diameter and 0.25mm in depth.

[0165] Step 2: Use the Johnson-Cook constitutive model to describe the dynamic deformation behavior of TC4 titanium alloy. According to published literature, the Johnson-Cook constitutive model of TC4 titanium alloy includes several parameters: parameter A = 954.74: quasi-static initial yield stress of the material; parameter B = 340.4: hardening factor; parameter n = 0.49: hardening exponent; parameter C = 0.0503: strain rate sensitive parameter; and temperature softening control parameter m = 0.52.

[0166] Step 3: Perform explicit finite element analysis (FEM) simulation of the impact process using Abaqus / Explicit. Using punches with radii of 1mm, 2mm, 3mm, 4mm, and 5mm and impact velocities of 1.08m / s, 1.55m / s, 1.95m / s, 2.35m / s, and 2.55m / s (corresponding to impact crater depths of 0.16mm, 0.2mm, 0.25mm, 0.3mm, and 0.345mm, respectively), FEM simulations were performed to obtain impact crater defects of different sizes and the corresponding residual stress fields. For example,... Figure 4 The figure shows the finite element simulation results of the impact dent process.

[0167] Step 4: Perform a post-impact monotonic tensile finite element simulation using Abaqus / Standard. Use the Predefined Field method in Abaqus to read the residual stress field from Step 3. Use the Import Model method in Abaqus to read the geometry of the material containing impact defects from Step 3. Perform a static finite element simulation using the maximum load in the fatigue load to obtain the stress field of the metamaterial containing impact pit defects. For example,... Figure 5 The figure shows the finite element simulation results of monotonic tension after impact.

[0168] Step 5: In the finite element calculation results, select the first principal stress as the display object. This will identify the node with the maximum first principal stress in the stress field and record the node number.

[0169] Step 6: Extract the first principal stress of the node from Step 5.

[0170] Step 7: Divide the depth of the impact crater obtained from the finite element simulation of the impact process by the standard depth to obtain the normalized depth, and divide the radius of the impact crater by the standard radius to obtain the normalized radius. The normalized depths of the impact crater are 0.65, 0.8, 1.0, 1.2, and 1.4, and the normalized radii are 0.333, 0.667, 1.0, 1.33, and 1.667, respectively.

[0171] Step 8: Divide the stress characteristics obtained from the subsequent monotonic tensile finite element simulation after impact by the stress characteristics of the standard impact crater defect to obtain normalized stress characteristics, which are 1.71, 1.65, 1.62, 1.66, 1.8, 1.66, 1.61, 1.62, 1.69, and 1.76, respectively.

[0172] Step 9: Use a cubic polynomial function Least squares fitting was performed on the "normalized depth-normalized stress characteristics" data, also using a cubic polynomial function. Least squares fitting was performed on the "normalized radius-normalized stress characteristic" data to obtain the coefficients and constants of the cubic function. The cubic polynomial function of the "normalized depth-normalized stress characteristic" is as follows: The cubic polynomial function of the "normalized radius-normalized stress characteristic" is:

[0173] Step 10: Multiply the two polynomial functions obtained in Step 9 to construct the mathematical expression for "normalized size-normalized stress characteristics". Using the coefficients and constants of the two polynomial functions obtained in Step 9 as the initial points for fitting, use least squares fitting to obtain the coefficients and constants in the mathematical expression for "normalized size-normalized stress characteristics". The resulting mathematical expression for "normalized size-normalized stress characteristics" is:

[0174]

[0175] The above formula is the established equivalence formula. For example, as shown below... Figure 6 The figure shows the fitting results of "normalized size-normalized stress characteristics".

[0176] For example, given a non-standard defect with a depth of h = 0.18 mm and a radius of r = 2 mm, the equivalent defect obtained by quantization using the above formula has an equivalent radius of r = 3 mm and a depth of h = 0.1884 mm. Additionally, given a non-standard defect with a depth of h = 0.32 mm and a radius of r = 2 mm, the equivalent defect obtained by quantization using the above formula has an equivalent radius of r = 3 mm and a depth of h = 0.3151 mm.

[0177] This embodiment also provides an impact dent equivalence device, which is used to implement the above embodiments and preferred embodiments, and will not be repeated as already described. As used below, the term "module" can be a combination of software and / or hardware that implements a predetermined function. Although the device described in the following embodiments is preferably implemented in software, hardware implementation, or a combination of software and hardware, is also possible and contemplated.

[0178] This embodiment provides an impact dent equivalent device, such as... Figure 7 As shown, it includes:

[0179] The first acquisition module 401 is used to acquire the initial size information of multiple simulated impact craters generated by impacting the target object; the initial size information includes the initial depth and the initial radius;

[0180] The second acquisition module 402 is used to acquire the maximum stress value corresponding to each simulated impact dent.

[0181] The generation module 403 is used to generate the target equivalent relationship corresponding to the impact crater in the impact simulation based on the relationship between the initial depth and the initial radius and each maximum stress value.

[0182] In some optional implementations, the first acquisition module 401 is specifically used to acquire the target material corresponding to the target object; determine the material dynamic deformation constitutive parameters corresponding to the target material based on the target material; simulate impact on the target object in a preset finite element analysis software based on the material dynamic deformation constitutive parameters to generate each simulated impact dent; and acquire the initial size information corresponding to each simulated impact dent; wherein the initial size information corresponding to each simulated impact dent is different.

[0183] In some optional implementations, the second acquisition module 402 is specifically used to acquire the maximum static load that the target object can withstand; add the maximum static load to each simulated impact dent; acquire the defect stress field of each simulated impact dent under the maximum static load condition; and analyze the defect stress field for each simulated impact dent to determine the maximum stress value corresponding to the simulated impact dent.

[0184] In some optional implementations, the second acquisition module 402 is specifically used to acquire the defect stress field data of each simulated impact crater under maximum static load conditions based on a preset finite element analysis software; the defect stress field data includes the distribution information of each component of the stress tensor throughout the entire simulation area; perform data preprocessing on the defect stress field data to generate target stress field data; determine the nodal stress data corresponding to each node in the simulated impact crater based on the target stress field data; compare the magnitudes of the stress components of each node in different directions to determine the principal stress values ​​of each node; compare the principal stress values ​​corresponding to each node to determine the maximum principal stress value as the maximum stress value.

[0185] In some optional implementations, the generation module 403 is specifically used to normalize each initial depth, each initial radius, and each maximum stress value to generate each target depth, each target radius, and each target maximum stress value; and to generate the target equivalent relationship corresponding to the impact crater in the impact simulation based on the relationship between the target depth and the target radius and each target maximum stress value.

[0186] In some optional implementations, the generation module 403 is specifically used to fit the depth of each target and the maximum stress value of each target according to the relationship between the depth of each target and the maximum stress value of each target, and generate a first equivalent relationship function between the depth and the maximum stress value; to fit the radius of each target and the maximum stress value of each target according to the relationship between the radius of each target and the maximum stress value of each target, and generate a second equivalent relationship function between the radius and the maximum stress value; and to generate a target equivalent relationship according to the first equivalent relationship function and the second equivalent relationship function.

[0187] In some optional implementations, the generation module 403 is specifically used to multiply the first equivalent relationship function and the second equivalent relationship function to generate the target equivalent relationship.

[0188] Further functional descriptions of the above modules and units are the same as those in the corresponding embodiments described above, and will not be repeated here.

[0189] In this embodiment, the impact dent quantification device is presented in the form of a functional unit. Here, a unit refers to an ASIC (Application Specific Integrated Circuit) circuit, a processor and memory that execute one or more software or fixed programs, and / or other devices that can provide the above functions.

[0190] This invention also provides an electronic device having the above-described features. Figure 7 The impact dent shown is equivalent to a quantizing device.

[0191] Please see Figure 8 , Figure 8 This is a schematic diagram of the structure of an electronic device provided in an optional embodiment of the present invention, such as... Figure 8 As shown, the electronic device includes one or more processors 10, memory 20, and interfaces for connecting the components, including high-speed interfaces and low-speed interfaces. The components communicate with each other via different buses and can be mounted on a common motherboard or otherwise as required. The processors can process instructions executed within the electronic device, including instructions stored in or on memory to display graphical information of a GUI on external input / output devices (such as display devices coupled to the interfaces). In some alternative implementations, multiple processors and / or multiple buses can be used with multiple memories and multiple memory modules, if desired. Similarly, multiple electronic devices can be connected, each providing some of the necessary operations (e.g., as a server array, a group of blade servers, or a multiprocessor system). Figure 8 Take a processor 10 as an example.

[0192] Processor 10 may be a central processing unit, a network processor, or a combination thereof. Processor 10 may further include a hardware chip. The hardware chip may be an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The programmable logic device may be a complex programmable logic device (CAMP), a field-programmable gate array (FPGA), a general-purpose array logic (GPA), or any combination thereof.

[0193] The memory 20 stores instructions executable by at least one processor 10 to cause at least one processor 10 to perform the method shown in the above embodiments.

[0194] The memory 20 may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created based on the use of the electronic device. Furthermore, the memory 20 may include high-speed random access memory and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some alternative embodiments, the memory 20 may optionally include memory remotely located relative to the processor 10, and these remote memories may be connected to the electronic device via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

[0195] The memory 20 may include volatile memory, such as random access memory; the memory may also include non-volatile memory, such as flash memory, hard disk or solid-state drive; the memory 20 may also include a combination of the above types of memory.

[0196] The electronic device also includes an input device 30 and an output device 40. The processor 10, memory 20, input device 30, and output device 40 can be connected via a bus or other means. Figure 8 Taking the example of a connection between China and Israel via a bus.

[0197] Input device 30 can receive input numerical or character information, and generate key signal inputs related to user settings and function control of the electronic device, such as a touch screen, keypad, mouse, trackpad, touchpad, joystick, one or more mouse buttons, trackball, joystick, etc. Output device 40 may include display devices, auxiliary lighting devices (e.g., LEDs), and haptic feedback devices (e.g., vibration motors). The aforementioned display devices include, but are not limited to, liquid crystal displays, light-emitting diodes, displays, and plasma displays. In some alternative embodiments, the display device may be a touch screen.

[0198] This invention also provides a computer-readable storage medium. The methods described above according to embodiments of the invention can be implemented in hardware or firmware, or implemented as computer code that can be recorded on a storage medium, or implemented as computer code downloaded via a network and originally stored on a remote storage medium or a non-transitory machine-readable storage medium and then stored on a local storage medium. Thus, the methods described herein can be processed by software stored on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. The storage medium can be a magnetic disk, optical disk, read-only memory, random access memory, flash memory, hard disk, or solid-state drive, etc.; further, the storage medium can also include combinations of the above types of memory. It is understood that computers, processors, microprocessor controllers, or programmable hardware include storage components capable of storing or receiving software or computer code, which, when accessed and executed by the computer, processor, or hardware, implements the methods shown in the above embodiments.

[0199] A portion of this invention can be applied as a computer program product, such as computer program instructions, which, when executed by a computer, can invoke or provide the methods and / or technical solutions according to the invention through the operation of the computer. Those skilled in the art will understand that the forms in which computer program instructions exist in a computer-readable medium include, but are not limited to, source files, executable files, installation package files, etc. Correspondingly, the ways in which computer program instructions are executed by a computer include, but are not limited to: the computer directly executing the instructions, or the computer compiling the instructions and then executing the corresponding compiled program, or the computer reading and executing the instructions, or the computer reading and installing the instructions and then executing the corresponding installed program. Here, the computer-readable medium can be any available computer-readable storage medium or communication medium accessible to a computer.

[0200] Although embodiments of the invention have been described in conjunction with the accompanying drawings, those skilled in the art can make various modifications and variations without departing from the spirit and scope of the invention, and such modifications and variations all fall within the scope defined by the appended claims.

Claims

1. A method for quantifying impact dents, characterized in that, The method includes: Obtain the initial size information of multiple simulated impact craters generated by impacting a target object; the initial size information includes the initial depth and the initial radius; Obtain the maximum stress value corresponding to each of the simulated impact dents; Based on the relationship between the initial depth and the initial radius and each of the maximum stress values, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated. The step of obtaining the maximum stress value corresponding to each of the simulated impact dents includes: Obtain the maximum static load that the target object can withstand; The maximum static load is applied to the simulated impact crater model in an appropriate manner; and the direction and mode of action of the maximum static load are defined to match the stress conditions of the target object in actual use. Based on the material properties, geometry, boundary conditions, and loading conditions of the simulated impact crater model, the equilibrium equations of the structure are solved to obtain the displacement field and defect stress field of the simulated impact crater model under the maximum static load. For each of the simulated impact dents, the stress field of the defect is analyzed to determine the maximum stress value corresponding to the simulated impact dent; The step of analyzing the stress field of the defect to determine the maximum stress value corresponding to the simulated impact crater includes: Based on a pre-set finite element analysis software, the defect stress field data of each of the simulated impact dents under the maximum static load condition are obtained; the defect stress field data includes the distribution information of each component of the stress tensor throughout the entire simulation area. The defect stress field data is preprocessed to generate target stress field data; Based on the finite element theory, all nodes of the simulated impact crater are traversed through a preset calculation method to calculate the stress components of each node. For each node, consider all adjacent elements and calculate the stress values ​​of that node in each direction based on the stress state of the elements and the geometric relationship between the node and the elements. The calculated nodal stress values ​​are stored in an orderly manner according to the node number to form nodal stress data; By comparing the magnitudes of the stress components of each node in different directions, the principal stress values ​​of each node are determined. The principal stress values ​​corresponding to each node are compared, and the largest principal stress value is determined to be the maximum stress value.

2. The method according to claim 1, characterized in that, The process of obtaining the initial size information of multiple simulated impact dents generated by impacting the target object includes: Obtain the target material corresponding to the target object; Based on the target material, determine the material dynamic deformation constitutive parameters corresponding to the target material; Based on the material's dynamic deformation constitutive parameters, the target object is simulated to be impacted in a preset finite element analysis software to generate each of the simulated impact dents. Obtain the initial size information corresponding to each of the simulated impact dents; wherein the initial size information corresponding to each of the simulated impact dents is different.

3. The method according to claim 1, characterized in that, The step of generating the target equivalent relationship for the impact crater in the impact simulation based on the relationship between the initial depth and the initial radius and each of the maximum stress values ​​includes: Normalize each of the initial depths, initial radii, and maximum stress values ​​to generate each target depth, target radius, and target maximum stress value. Based on the relationship between the target depth and the target radius and the maximum stress value of each target, the target equivalent relationship corresponding to the impact crater in the impact simulation is generated.

4. The method according to claim 3, characterized in that, The step of generating the target equivalent relationship for the impact crater in the impact simulation based on the relationship between the target depth and the target radius and the maximum stress value of each target includes: Based on the relationship between each target depth and each target maximum stress value, the target depth and each target maximum stress value are fitted to generate a first equivalent relationship function between depth and maximum stress value; Based on the relationship between each target radius and each target maximum stress value, the target radius and each target maximum stress value are fitted to generate a second equivalent relationship function between the radius and the maximum stress value; The target equivalent relationship is generated based on the first equivalent relationship function and the second equivalent relationship function.

5. The method according to claim 4, characterized in that, The step of generating the target equivalent relationship based on the first equivalent relationship function and the second equivalent relationship function includes: The target equivalent relationship is generated by multiplying the first equivalent relationship function and the second equivalent relationship function.

6. An impact dent quantification device, characterized in that, The device includes: The first acquisition module is used to acquire the initial size information of multiple simulated impact craters generated by impacting a target object; the initial size information includes initial depth and initial radius; The second acquisition module is used to acquire the maximum stress value corresponding to each of the simulated impact dents; wherein, acquiring the maximum stress value corresponding to each of the simulated impact dents includes: acquiring the maximum static load that the target object can withstand; applying the maximum static load to the simulated impact dent model in a suitable manner; and defining the direction and mode of action of the maximum static load so that it matches the stress condition of the target object in actual use; solving the equilibrium equation of the structure according to the material properties, geometry, boundary conditions and loading conditions of the simulated impact dent model to obtain the displacement field and defect stress field of the simulated impact dent model under the action of the maximum static load; analyzing the defect stress field for each of the simulated impact dents to determine the maximum stress value corresponding to the simulated impact dent; the analysis of the defect stress field to determine the maximum stress value corresponding to the simulated impact dent includes: based on a preset... Finite element analysis software is used to acquire the defect stress field data of each simulated impact crater under the maximum static load condition. The defect stress field data includes the distribution information of each component of the stress tensor throughout the simulation area. The defect stress field data is preprocessed to generate target stress field data. According to finite element theory, all nodes of the simulated impact crater are traversed using a preset calculation method to calculate the stress component of each node. For each node, all adjacent elements are considered, and the stress value of the node in each direction is calculated based on the stress state of the elements and the geometric relationship between the node and the elements. The calculated node stress values ​​are stored in an orderly manner according to the node number to form node stress data. The magnitudes of the stress components of each node in different directions are compared to determine the principal stress value of each node. The principal stress values ​​corresponding to each node are compared, and the largest principal stress value is determined as the maximum stress value. The generation module is used to generate the target equivalent relationship corresponding to the impact crater in the impact simulation based on the relationship between the initial depth and the initial radius and each of the maximum stress values.

7. An electronic device, characterized in that, include: A memory and a processor are communicatively connected, the memory storing computer instructions, and the processor executing the computer instructions to perform the impact dent equivalence method according to any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions for causing the computer to perform the impact dent equivalence method according to any one of claims 1 to 5.

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