A simulation driving method and system for improving power-on and power-off stability of multiple power supplies

Abstract

The application discloses a simulation driving method and system for improving power-on and power-off stability of a multi-power supply. The method comprises the following steps: firstly, determining the test scene required by the multi-power supply system to be tested; secondly, performing power-on test, setting different power-on time and voltage value, comprehensively testing and recording data; then, performing power-off test, setting different power-off amplitude and time, testing and recording data one by one; finally, analyzing the system stability according to the recorded data. The method can predict and solve power supply problems in the early stage of product design, reduce cost, improve efficiency, and ensure the performance and reliability of the final product.

Description

TECHNICAL FIELD

[0001] The present application relates to a simulation driving method for improving the power-on and power-off stability of a multi-power supply, and also relates to a corresponding simulation driving system, and belongs to the technical field of chip simulation design. BACKGROUND

[0002] In electronic devices, power supply stability is a key factor to ensure normal operation of the device. For example, electronic control units (ECU) are increasingly used in modern cars, and these units require a multi-power supply system to ensure stable and reliable power supply, especially in electric or hybrid vehicles. Because different circuits and peripherals in the ECU require different power supply voltages and currents, in order to provide more stable and reliable power supply, and to ensure the normal operation of the ECU, a multi-power supply system is also required.

[0003] The detection of power supply stability of a multi-power supply system relying on multiple power supplies is particularly critical. This is because each power supply may face different electrical and environmental challenges, such as voltage fluctuations, frequency deviations, and interference from the outside and inside, which can affect the reliability and performance of the device.

[0004] Traditional single power supply testing methods, although they can evaluate the impact of power quality, environmental factors and interference on device performance, are often limited to testing a single power supply. This method is insufficient when faced with a multi-power supply system, because there may be mutual influence between power supplies and complex power management strategies in a multi-power supply system.

[0005] The existing technology usually focuses on power-on and power-off testing and interference testing of a single power supply, which is usually carried out in the physical testing stage after the chip or device is completed. However, this method ignores the importance of evaluating power supply stability during the design and simulation stages. Simulation-level power supply testing can predict and solve potential power supply problems before actual manufacturing, thereby reducing costs, improving efficiency, and ensuring the performance and reliability of the final product.

[0006] Therefore, through simulation, it is increasingly important to detect the power supply stability of a multi-power supply device. This requires the development of more advanced testing methods that can comprehensively evaluate the stability of a multi-power supply system during the simulation stage to ensure that the device can operate stably in actual applications and meet the growing technical and performance requirements. SUMMARY

[0007] The primary technical problem to be solved by the present application is to provide a simulation driving method for improving the power-on and power-off stability of a multi-power supply.

[0008] Another technical problem to be solved by the present application is to provide a simulation driving system for improving the power-on and power-off stability of a multi-power supply.

[0009] To achieve the above technical purposes, the application adopts the following technical solutions:

[0010] According to a first aspect of the embodiment of the application, a simulation driving method for improving power-on and power-off stability of a multi-power supply system is provided, comprising the following steps:

[0011] S1: determining a test scene to be detected for the multi-power supply system to be detected;

[0012] S2: if the power-on test is selected, step S3 is entered; if the power-off test is selected, step S6 is entered;

[0013] S3: entering a power-on test state, selecting one power supply according to the test scene, setting different power-on time and power-on stable voltage values for the power supply, then changing the power-on stable voltage values and the power-on time of another power supply at different simulation time points according to a predetermined step, performing comprehensive power-on test, and recording data;

[0014] S4: configuring all power supplies to be powered on at the same time, configuring each power supply to be the same, and respectively setting different power-on time and different power-on stable voltage values, and traversing the test at a preset time step, and recording data;

[0015] S5: entering a power-off test state, setting the power-off amplitude and the power-off time of one power supply according to the test scene, configuring the remaining power supplies to be different power-off amplitudes and times, then sequentially powering on the power supplies and performing power-off test according to the set conditions;

[0016] S6: configuring all power supplies to be powered off at the same time, configuring each power supply to be the same, and respectively setting different power-off time and different power-off amplitude, and traversing the test at a preset time step, and recording data;

[0017] S7: performing stability analysis on the multi-power supply system to be detected according to the recorded data.

[0018] Preferably, in step S1, the corresponding test scene is generated by searching the keywords of the internal unit.

[0019] Preferably, the keywords are divided into five levels, including:

[0020] ① The highest level is the PWM control unit, and if the PWM related keywords are searched, all test scenes are selected for testing;

[0021] ② The second level is the OTP unit, and the test scenes of normal power-on and fast power-on are selected;

[0022] ③ The third level power supply is a secure area power supply, and only the power-on process is tested without testing the power-off process;

[0023] IV. The fourth level is for external power supply, only VDD is needed to be tested in three conditions of normal power-on, fast power-on and slow power-on;

[0024] V. The fifth level is for single power supply, only single power supply is tested.

[0025] Preferably, the comprehensive test of single power supply includes different combinations of VDD voltage, power-on speed and power-off speed.

[0026] Preferably, the VDD voltage is divided into normal voltage, VDDmin and VDDmax; the power-on speed is divided into normal power-on, fast power-on and slow power-on; and the power-off speed is divided into normal power-off, fast power-off and slow power-off.

[0027] Preferably, the test scene includes: two power supplies are set with different power-on stable voltage values; two power supplies are simultaneously powered on; two power supplies are simultaneously powered off; two power supplies are powered on at different rates; two power supplies are powered off at different rates; and one power supply is in a stable state while the other power supply is being powered on or powered off.

[0028] Preferably, the step S3 includes the following sub-steps:

[0029] S31: configuring one of the power supplies with power-on time, power-on stable voltage value and power-off time;

[0030] S32: judging whether the power-on time or power-on stable voltage value of the power supply is tested or not, if yes, jumping to step S4; if not, entering step S33;

[0031] S33: configuring the other power supply as one of VDDmax, VDD or VDDmin and entering step S34, until the three power-on stable voltage values are tested, then jumping to step S31;

[0032] S34: configuring the other power supply as normal power-on time and normal power-off time, starting power-on test and recording data, and traversing from 200 microseconds to 1 millisecond with a step of 100 microseconds until the end, then jumping to step S35;

[0033] S35: configuring the other power supply as slow power-on and normal power-off time, starting power-on, and traversing from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, then jumping to step S36;

[0034] S36: configuring the other power supply as fast power-on and normal power-off time, starting power-on, and traversing from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, then jumping to step S31.

[0035] Wherein preferably, in the fast power-on test process, data of 1 microsecond, 10 microseconds and 100 microseconds are all tested.

[0036] Wherein preferably, the step S5 comprises the following sub-steps:

[0037] S51: configuring the power-off time and the power-off amplitude for one of the power supplies;

[0038] S52: judging whether the power-off time or the power-off amplitude of the power supply is tested or not, if yes, jumping to step S6; if not, entering step S53;

[0039] S53: configuring the other power supply as one of the power-off amplitudes of VDDmax, VDD or VDDmin, and entering step S54, until the three power-off amplitudes are all tested, then jumping to S51;

[0040] S54: configuring the other power supply as the normal power-off time, starting the power-on test and recording the data, and traversing from 200 microseconds to 1 millisecond with a step of 100 microseconds until the end, and entering step S55;

[0041] S55: configuring the other power supply as the slow power-off, starting the power-on, and traversing from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, and entering step S56;

[0042] S56: configuring the other power supply as the fast power-off, starting the power-on, and traversing from 1 microsecond to 100 microseconds with a step of 10 microseconds until the end, and jumping to step S51.

[0043] Wherein preferably, in the fast power-off test process, data of 1 microsecond, 10 microseconds and 100 microseconds are all tested.

[0044] According to the second aspect of the embodiment of the present application, a simulation driving system for improving the power-on and power-off stability of multiple power supplies is provided, comprising a processor and a memory, which are coupled; wherein the memory is used for storing a computer program; and the processor is used for running the computer program stored in the memory to execute the simulation driving method for improving the power-on and power-off stability of multiple power supplies.

[0045] Compared with the prior art, the present application has the following technical effects:

[0046] 1) By constructing an environment consistent with the actual and rich application scenarios, the performance of the power supply under various conditions can be simulated in the virtual environment, which helps to find potential problems in the early stage of product design;

[0047] 2) Test in advance to the design of the initial, can be evaluated before the product has not been made out of power, so that the early stages of power-related problems can be identified and solved, reducing the cost and time of later modification;

[0048] 3) The traditional test method may only focus on the performance of a single power supply, while this method extends the test focus to multiple power supplies, considering their interaction and influence, which helps to ensure the stability and reliability of the entire power supply system in practical application;

[0049] 4) Pay special attention to the influence of power supply interference and working timing on the product, which means that the test is not only static, but also includes the power performance under dynamic conditions, which is crucial to ensure the stability of the product in complex environment;

[0050] 5) Comprehensive consideration of power quality, environmental factors, internal and external interference and mutual influence between power supplies, providing a more comprehensive power supply test scheme, which helps to improve the robustness and robustness of the product;

[0051] 6) Use simulation tools for testing, build a more comprehensive simulation method, fix the details of the test, so it can not only more fully check out the problems existing in the product, but also reduce the small differences caused by manual operation, and realize the automatic collection of simulation comparison, can accurately analyze a large amount of data, reduce the difference caused by different data precision. BRIEF DESCRIPTION OF DRAWINGS

[0052] Figure 1 For the first embodiment of the present application, the power-on and power-off test scene summary table of multiple power supplies;

[0053] Figure 2 For Figure 1 The specific operation diagram of the traversal in the embodiment;

[0054] Figure 3 For a test scene of power supply test, the schematic diagram of each process;

[0055] Figure 4 For double power supply, the test state diagram of power supply B slow power-on and the stable voltage value of power-on is VDDmax;

[0056] Figure 5 For double power supply, the test state diagram of power supply A slow power-on and the stable voltage value of power-on is VDDmax;

[0057] Figure 6 For double power supply, the test state diagram of power supply A and power supply B normal time power-on and the stable voltage value of power-on is VDD;

[0058] Figure 7Figure 2 is a schematic diagram of a test state in which power supply B slowly powers down and a stable voltage value VDD is started to be powered down in a dual power supply;

[0059] Figure 8 Figure 3 is a schematic diagram of a test state in which power supply A slowly powers down and a stable voltage value VDD is started to be powered down in a dual power supply;

[0060] Figure 9 Figure 4 is a schematic diagram of a test state in which both power supplies slowly power down and a stable voltage value VDD is started to be powered down in a dual power supply;

[0061] Figure 10 Figure 5 is a schematic diagram of a simulation driving system for improving the power-on and power-off stability of a multi-power supply in a second embodiment of the present application. DETAILED DESCRIPTION

[0062] The technical content of the present application will be described in detail below in combination with the drawings and specific embodiments.

[0063] The technical concept in the embodiment of the present application is to construct multiple interference and timing different scenarios in the simulation process, to classify all scenarios as typical scenarios for detection according to the actual application scenarios of the tested chip, so as to cover all application scenarios of multi-power supply and different timing with the least test scenarios, test times and time. Therefore, the simulation test method of the present application can ensure that the tested multi-power supply system can perform stably in different actual application scenarios.

[0064] First embodiment

[0065] As shown in Figure 1 and 2 The simulation driving method for improving the power-on and power-off stability of a multi-power supply provided by the first embodiment of the present application comprehensively evaluates the stability of a multi-power supply system in different test scenarios through simulation, including the following steps.

[0066] S1: Determine the test scenarios that need to be detected for the measured multi-power supply system.

[0067] Here, the determination of the test scenarios that need to be detected for the measured multi-power supply system can be in multiple ways. The first way can be to automatically read and find the corresponding test scenarios from the detection item table according to the model of the measured multi-power supply system. The second way can also determine the test scenarios according to the application scenarios of the measured multi-power supply system. The third way is to manually select the test scenarios that need to be detected for the measured multi-power supply system.

[0068] Selecting the test scenarios according to the types of power supplies means searching for the internal unit keywords in the simulation environment to generate corresponding test scenarios (for example, five levels in the keywords):

[0069] ①The highest level is PWM control unit, and the PWM related keywords are searched, so that all test scenes are selected for testing.

[0070] ②The second level is OTP unit, and the normal power-on and fast power-on test scenes in the selected scenes are selected.

[0071] ③The third level is the internal security area power supply, which is a power supply that will not be powered off, so only the power-on process needs to be tested, and the power-off process does not need to be tested (the signal after power-off is considered to be an error);

[0072] ④The fourth level is the external power supply, which only needs to be able to work normally, and the stability requirement is low, so only the power-on amplitude VDD needs to be tested, and the normal power-on, fast power-on and slow power-on scenes need to be traversed.

[0073] ⑤When only a single power supply is detected, only the single power supply is tested.

[0074] Different test scenes have different combinations of VDD voltage, power-on speed and power-off speed. Among them, the VDD voltage is divided into normal voltage, VDDmin and VDDmax; the power-on speed is divided into normal power-on, fast power-on and slow power-on; and the power-off speed is divided into normal power-off, fast power-off and slow power-off. Therefore, by changing (combining) the VDD voltage, power-on speed and power-off speed, a large number of test scenes can be realized. In order to illustrate the test method of the present application, only some of the scenes are taken as examples for illustration.

[0075] Figure 3 The figure shows multiple test processes under a test scene: power-on process, stable process and power-off process, hereinafter referred to as power-on and power-off. In addition, the power-on and power-off time of the power supply is not fixed for different needs of actual projects. The normal, slow and fast times given in the embodiments are only examples of typical values and do not represent all values. For example, the typical value of the normal power-off time is 200us, but the actual value may be 300us or even longer or shorter.

[0076] For each power supply, the following table 1 shows the power-on and power-off test scheme. Since each power supply is tested by time step, the power-on and power-off time relationship between different power supplies can be adjusted by adjusting the time step and simulation length, so as to test various use scenarios of multiple power supplies in actual working conditions. For example, all test scenarios include setting multiple power supplies as follows: two power supplies with different power-on voltage values; two power supplies with simultaneous power-on; two power supplies with simultaneous power-off; two power supplies with different power-on speeds; two power supplies with different power-off speeds; or one power supply in the stable period and the other power supply in the power-on or power-off period, etc. Therefore, the simulation test of the present application is comprehensive. In this paper, simultaneous power-on refers to the same power-on start time and the same power-on completion time (the same power-on process time) when reaching the stable voltage value of the power supply. Similarly, simultaneous power-off also refers to the same power-off process time.

[0077] Table 1: Single power supply power-on and power-off test

[0078]

[0079]

[0080] It should be noted that the voltage value of the stable power supply is not fixed (as shown in table 2), which is determined by different modules and working scenarios. The values listed in table 1 are for better understanding, but they do not constitute a limitation on the present application. For example, the typical value of VDD is 3.3V, and the typical value of the duration is 200us.

[0081] Table 2: Relationship table of different voltage values of power supply

[0082]

[0083] Based on the comprehensive test scenarios of the single power supply described above, Figure 1 and Figure 2 illustrate the multiple power supply test scenarios. As shown in Figure 1 , the power-on test scenarios of the multiple power supply system (two power supplies, power supply A and power supply B are taken as examples in the figure) include three categories: power supply A power-on, power supply B power-on and simultaneous power-on. That is, each power supply in the multiple power supply system is powered on one by one, or all power supplies are powered on at the same time. The corresponding multiple power supply power-off test scenarios also include power supply A power-off, power supply B power-off and simultaneous power-off.

[0084] In the scenario of power-on of a single power supply (power supply A), different test scenarios are obtained by changing the power-on test conditions (power-on stable voltage value and power-on time) of another power supply (power supply B). As shown in Table 1, the power-on stable voltage value of power supply B is respectively the maximum safe voltage VDDmax (VDDmax = 3.63V), the minimum voltage required for normal operation VDDmin (VDDmin = 3V) and VDD (3.3V); the power-on time of power supply B is respectively normal power-on time, slow power-on and fast power-on. Here, the time of slow power-on (e.g. 1-20ms) > normal power-on time > fast power-on time (e.g. 1-100us). In this embodiment, the normal power-on time is X1 (e.g. 200us to 1ms); the normal power-off time is also Y (e.g. 200us to 1ms). The specific values can be set according to actual needs. The time of slow power-off (e.g. 1-100us) > normal power-off time (e.g. 200us to 1ms) > fast power-off time (e.g. 1-20ms).

[0085] Similarly, in the scenario of power-on of power supply B, different power-on conditions (time and voltage) of power supply A are changed to obtain multiple power-on test scenarios.

[0086] Similarly, in the scenario of power-on of power supply A and power supply B, the power-on stable voltage value and power-on time of power supply A and power supply B are simultaneously changed to obtain multiple test scenarios Figure 2 which are shown in Table 2. Under the premise that the power-on / power-off amplitude of power supply A and power supply B is respectively VDDmin, VDD or VDDmax, power supply A and power supply B are simultaneously set to normal power-on time, fast power-on or slow power-on, as shown in Table 2. Figure 2

[0087] S2: If the power-on test is selected, go to step S3; if the power-off test is selected, go to step S5.

[0088] S3: Enter the power-on test state, select one power supply (e.g. power supply A) according to the test scenario, set different power-on time (normal power-on time, slow power-on time or fast power-on time) and power-on stable voltage value (VDD, VDDmin or VDDmax) for it, then change the power-on stable voltage value and power-on time of another power supply according to the predetermined step at different simulation time points, perform comprehensive power-on test, and record the data.

[0089] For example, power supply A is configured to have a power-on stable voltage value VDDmin = 3V and a normal power-on time of 200us, and power supply B is configured to have a power-on stable voltage value VDDmin and a power-on time of 200us for starting the power-on test; then the power-on test is performed by changing the power-on time of power supply B by a step of 100us, i.e. 300us, 400us, …, until 1ms.​

[0090] Then, power supply A is configured to different power-up stable voltage values (e.g. VDD = 3V) with normal power-up time 200us, and power supply B is configured to power-up stable voltage value VDDmin with power-up time 200us, and the power-up test is performed by traversing from 200us to 1ms with a predetermined step.

[0091] Then, power supply A is configured to different power-up stable voltage values (e.g. VDD = 3V) with normal power-up time 200us, and power supply B is configured to power-up stable voltage value VDDmin with power-up time 200us, and the power-up test is performed by traversing from 200us to 1ms with a predetermined step.

[0092] Then, power supply A is configured to different power-up stable voltage values (e.g. VDD = 3V) with normal power-up time 200us, and power supply B is configured to power-up stable voltage value VDDmin with power-up time 200us, and the power-up test is performed by traversing from 200us to 1ms with a predetermined step.

[0093] Therefore, as shown in Figure 1 and Figure 2 the present step comprises the following sub-steps:

[0094] S31: configure one of the power supplies (e.g. power supply A) with power-up time, power-up stable voltage value and power-down time;

[0095] The power-down time of the remaining power supplies can be the same as that of the power supply or different.

[0096] S32: whether the power-up time or the power-up stable voltage value of the power supply has been tested completely, if yes, jump to step S4; if not, enter step S33;

[0097] S33: configure the other power supply (e.g. power supply B) to one of VDDmax, VDD or VDDmin and enter step S34, until all three power-up stable voltage values are tested, then jump to S31;

[0098] S34: configure power supply B to normal power-up time and normal power-down time, start the power-up test and record the data, and traverse from 200us to 1ms with a step of 100us until the end, then jump to step S35;

[0099] S35: configure power supply B to slow power-up and normal power-down time, start the power-up, and traverse from 1ms to 20ms with a step of 2ms until the end, then jump to step S36;

[0100] S36: configure power supply B to fast power-up and normal power-down time, start the power-up, and traverse from 1us to 100us with a step of 10us until the end, then jump to step S31.

[0101] In the case of more than 2 power supplies, all power supplies except power supply A are configured according to the foregoing steps S31-S36, and then the power-on test is completed. For example, in the case of three power supplies, power supply B and power supply C are tested according to the foregoing power-on test and data is recorded. That is, all power supplies, respectively changing the power-on time and the power-on stable voltage value (according to Table 1), repeatedly perform the power-on-stable-power-off test according to a certain time step, and traverse all test scenarios (as shown in Figure 1 and Figure 2

[0102] Specifically, Figure 4 is the test state diagram in the state of the power-on stable voltage value of power supply B being VDDmax. As shown in Figure 4 , power supply A and power supply B are powered on at the same time. During the power-on process, power supply A reaches 3V (the power-on stable voltage value VDD of power supply A) within 200 microseconds, but power supply B reaches 3.63V (the power-on stable voltage value VDDmax of power supply B) within 2 milliseconds (slow power-on). Therefore, there are two test states during the power-on process: 1) power supply A and power supply B are powered on at the same time; 2) power supply A reaches the stable state, but power supply B is still in the power-on state. During the power-on process, the power-on time of power supply B is increased according to a step of 2 milliseconds, and then tested again until 20 milliseconds. Since power supply A and power supply B are powered off at the same time, there are also two test states in the stable state: 1) power supply A is in the stable state and power supply B is in the power-on state; 2) power supply A and power supply B are both in the stable state. During the power-off process, there is only one test state: power supply A and power supply B are both powered off with a normal power-off time.

[0103] S4: configure all power supplies to be powered on at the same time, each power supply is configured to be different in power-on time and different in power-on stable voltage value, and traverse the test with a preset time step and record the data.

[0104] Figure 5 shows a case where power supply A and power supply B start to power on at the same time. In other words, it is used to detect whether there will be mutual interference between two power supplies when there is a single power supply that reaches the stable state in advance and another power supply is still in the rising process.

[0105] Figure 5 ​The power-on process is shown. The power-on stable voltage value of power supply A is 3.63V, and it reaches this voltage level within 10 microseconds. The power-on stable voltage value of power supply B is 3V, and it reaches this voltage level within 200 microseconds. This indicates that the power-on process of power supply B is relatively slow. During the power-on process, there are two test states: 1) power supply A and power supply B start power-on at the same time, but power supply A quickly reaches its power-on stable voltage value, while power supply B takes a longer time to reach its power-on stable voltage value; 2) power supply A has reached a stable state, while power supply B is still in the power-on process, reaching its power-on stable voltage value at 200 microseconds. In the stable state, due to the different power-on stable voltage values of power supply A and power supply B, we can observe two cases: 1) power supply A remains stable after reaching 3.63V, while power supply B also remains stable after reaching 3V; 2) power supply A has stabilized before power supply B reaches a stable state, which means that for a period of time, the voltage of power supply A is higher than that of power supply B. In the power-off process, power supply A and power supply B are powered off with normal power-off time, and there is one test state: power supply A and power supply B start power-off at the same time and complete the power-off process within 200 microseconds.

[0106] Figure 6 Another case of power supply A and power supply B powering on at the same time is shown. In the power-on process, the power-on stable voltage value of power supply A and power supply B is 3.3V. Power supply A reaches its power-on stable voltage value of 3.3V within 200 microseconds, while power supply B also reaches the same power-on stable voltage value within the same time. In the power-on process, there is one test state: power supply A and power supply B power on at the same time and reach the power-on stable voltage value of 3.3V within 200 microseconds. In the stable state, power supply A and power supply B both remain at a voltage level of 3.3V, so there is no different test state caused by voltage difference. That is, there is only one test state: power supply A and power supply B are both in a stable state and have the same voltage. In the power-off process, power supply A and power supply B are powered off with normal power-off time, and there is one test state: power supply A and power supply B start power-off at the same time and complete the power-off process within 200 microseconds.

[0107] S5: Enter the power-off test state, set the power-off amplitude and power-off time of one power supply according to the test scenario, configure the remaining power supplies with different power-off amplitudes and times, then power on each of these power supplies one by one and perform power-off tests according to the set conditions, and record the data.

[0108] The power-down test can be a separate test, i.e., all power supplies are configured with the same power-up time and power-up stable voltage value, and then the power-down amplitude and power-down time of different power supplies are configured respectively and tested. The power-down test can also be combined with the power-up test, so that the power-up and power-down in the power supply test are tested in the same simulation process, in the order of power-up first and power-down second. That is, the power-up stable voltage value in the power-up test is taken as the power-down amplitude, and the power-down time is changed.

[0109] As Figure 1 and Table 1, the following sub-steps are included in this step:

[0110] S51: configure the power-down time and power-down amplitude of one of the power supplies (for example, power supply A);

[0111] S52: whether the power-down time or power-down amplitude of the power supply has been tested completely, if yes, jump to step S6; if not, go to step S53;

[0112] S53: configure another power supply (for example, power supply B) as one of VDDmax, VDD or VDDmin, and go to step S54, until all three power-down amplitudes are tested, then jump to S51;

[0113] S54: configure power supply B as normal power-down time, start power-up test and record data, and traverse from 200 microseconds to 1 millisecond with a step of 100 microseconds until the end, and go to step S55;

[0114] S55: configure power supply B as slow power-down, start power-up, and traverse from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, and go to step S56;

[0115] S56: configure power supply B as fast power-down, start power-up, and traverse from 1 microsecond to 100 microseconds with a step of 10 microseconds until the end, and jump to step S51.

[0116] Although the specific values in the embodiments of the present application are only examples, they can be adjusted according to actual test conditions and requirements, but in the test process of fast power-down, the data of 1 microsecond, 10 microseconds and 100 microseconds are tested.

[0117] Specifically, Figure 7 An example case of step S64 is shown. As Figure 7As shown, the power-up stable voltage values of power supply A and power supply B are both 3V. The power-up processes of the two power supplies are both normal power-up, and both reach the power-up stable voltage value of 3V within 200 microseconds. During the power-up process, there is a test state: 1) power supply A and power supply B are powered up at the same time and reach the power-up stable voltage value of 3V at the same time within 200 microseconds. In the stable state, the states of power supply A and power supply B are the same, both maintaining a voltage level of 3V, and the time of the stable state is the same. During the power-down process, the power-down times of power supply A and power supply B are different. The power-down process of power supply A is completed within 200 microseconds, while the power-down process of power supply B lasts for 10 milliseconds, which is longer than the power-down time of power supply A. Therefore, during the power-down process, there are two test states: 1) power supply A and power supply B are both powering down (within 200 microseconds); 2) power supply A has completed power-down and the voltage returns to a low voltage; power supply B is still in the power-down process (after 200 microseconds).

[0118] Figure 8 Another case is shown, which is similar to Figure 7 . Power supply A and power supply B are both powered up with normal power-up time and have power-up stable voltage values of VDD (3V), both are powered down at the same time, but power supply A is slow power-down with a power-down time of 10 milliseconds; power supply B is normal power-down.

[0119] S6: Configure all power supplies to be powered down at the same time, with the same configuration for each power supply and different power-down times, different power-down amplitudes, and traverse the test with a preset time step, and record the data.

[0120] Figure 9 An exemplary test state is shown, in which power supply A and power supply B are both powered up with normal power-up time (200 microseconds), have power-up stable voltage values of VDD (3V), and start power-down at the same time, and are both slow power-down (10 milliseconds).

[0121] S7: According to the recorded data, perform stability analysis on the multi-power supply system under test.

[0122] In summary, the simulation driving method provided by the embodiments of the present application aims to improve the power-up and power-down stability of the multi-power supply system, and comprehensively and accurately evaluates the power supply performance under dynamic conditions through automated testing. This method constructs a simulation test environment according to the actual environment and diversified application scenarios, allowing the power supply to be tested at an early stage of product design in order to check the impact of the power supply on the overall product performance. Unlike traditional single power supply testing, the present application considers the interaction and interference between multiple power supplies, as well as the impact of power supply timing on product performance. In this way, the present application enhances the stability, robustness and robustness of the power supply system, ensuring the reliability of the power supply system in actual applications.

[0123] Second embodiment

[0124] On the basis of the simulation driving method for improving power-on and power-off stability of multiple power supplies, the second embodiment of the present application provides a simulation driving system for improving power-on and power-off stability of multiple power supplies, as shown in the figure. The simulation driving system comprises a processor and a memory. The memory is coupled with the processor and is configured to store a program. When the program is executed by the processor, the processor implements the simulation driving method for improving power-on and power-off stability of multiple power supplies provided by the above-mentioned embodiments. Figure 10

[0125] The processor is configured to control the overall operation of the simulation driving system to complete all or part of the steps of the simulation driving method for improving power-on and power-off stability of multiple power supplies. The processor can be a central processing unit (CPU), a graphics processing unit (GPU), a field programmable logic gate array (FPGA), an application specific integrated circuit (ASIC), a digital signal processing (DSP) chip, or the like. The memory is configured to store various types of data to support the operation of the simulation driving system. For example, the data can include instructions for any application or method operating on the simulation driving system, and application-related data. The memory can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, or the like.

[0126] In another exemplary embodiment, the present application also provides a computer readable storage medium comprising program instructions, which, when executed by a processor, implement the steps of the simulation driving method for improving power-on and power-off stability of multiple power supplies in any one of the above-mentioned embodiments. For example, the computer readable storage medium can be the above-mentioned memory comprising program instructions, which can be executed by the processor of the system to complete the simulation driving method for improving power-on and power-off stability of multiple power supplies and achieve the technical effects consistent with the above-mentioned method.

[0127] It should be noted that the above-mentioned embodiments are only illustrative. The technical solutions of each embodiment can be combined, and the order of each step can be changed, all of which are within the protection scope of the present patent. Moreover, since the test processes are similar and numerous, only individual detection scenarios are described in detail in the above text and drawings, and the test scenarios are more fully illustrated in Table 1, Figure 1 and Figure 2 If the description or clear description in the text or drawings is not exhaustive, the description in Table 1, Figure 1 and Figure 2 should be used as the standard. ​

[0128] The simulation driving method and system for improving power-on and power-off stability of multiple power supplies are described in detail above. Any obvious modification made to the present application by those skilled in the art without departing from the essential content of the present application shall constitute an infringement of the patent right of the present application and shall bear the corresponding legal responsibility.

Claims

1. A simulation driving method for improving power-on and power-off stability of a multi-power supply, characterized by The method comprises the following steps: S1: determining a test scene to be detected for the multi-power system to be detected; S2: if the power-on test is selected, step S3 is entered; if the power-off test is selected, step S5 is entered; S3: entering the power-on test state, selecting one power supply according to the test scene, setting different power-on time and power-on stable voltage value for the power supply, changing the power-on stable voltage value and the power-on time of another power supply at different simulation time points according to a predetermined step, performing comprehensive power-on test, and recording data; S4: configuring all power supplies to be powered on at the same time, each power supply having the same power-on test condition, power-on time and process, and power-on stable voltage value, and traversing the test at a preset time step and recording data; S5: entering the power-off test state, configuring the power-off amplitude and power-off time of one power supply according to the test scene, and configuring different power-off amplitudes or power-off times for the remaining power supplies, then powering on each power supply respectively to perform the power-off test; S6: performing simultaneous power-off test on all power supplies, each power supply having the same power-on test condition, power-on time and process, and power-on stable voltage value, and traversing the test at a preset time step and recording data; S7: performing stability analysis on the multi-power system to be detected according to the recorded data; In step S1, the test scene is generated by searching for internal unit keywords; The keywords are divided into five levels: ① The highest level is the PWM control unit, and when a PWM-related keyword is searched, all test scenes are selected for testing; ② The second level is the OTP unit, and the test scenes of normal power-on and fast power-on are selected; ③ The third level is the internal security power supply, and only the power-on process is tested without testing the power-off process; ④ The fourth level is the external power supply, and only the VDD is tested in the normal power-on, fast power-on and slow power-on three situations; ⑤ When only a single power supply is detected, only the single power supply test is performed.

2. The simulation driving method for improving the power-on and power-off stability of the multi-power supply according to claim 1, wherein: The comprehensive test of the single power supply includes a plurality of combination schemes of different VDD voltages, power-on speeds and power-off speeds, wherein the VDD voltage is divided into normal voltage, VDDmin and VDDmax; the power-on speed is divided into normal power-on, fast power-on and slow power-on; and the power-off speed is divided into normal power-off, fast power-off and slow power-off.

3. The simulation driving method for improving the power-on and power-off stability of the multi-power supply according to claim 1, wherein: The all test scenes include the following settings of the multiple power supplies: different power-on stable voltage values of two power supplies; simultaneous power-on of two power supplies; simultaneous power-off of two power supplies; different power-on speeds of two power supplies; different power-off speeds of two power supplies; or one of two power supplies is in the stable period and the other is in the power-on or power-off.

4. The simulation driving method for improving power-on and power-off stability of multiple power supplies according to claim 3, characterized in that The step S3 comprises the following sub-steps: S31: configuring one power supply with one power-on time, one power-on stable voltage value and one power-off time. S32: whether the power-up time or the power-up stable voltage value of the one power supply is tested completely, if yes, jump to step S4; if not, enter step S33; S33: configure the other power supply as one of VDDmax, VDD or VDDmin, and enter step S34, until the three power-up stable voltage values are tested completely, jump to S31; S34: configure the power supply B as normal power-up time and normal power-down time, start power-up test and record data, and traverse from 200 microseconds to 1 millisecond with a step of 100 microseconds until the end, jump to step S35; S35: configure the power supply B as slow power-up and normal power-down time, start power-up, and traverse from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, jump to step S36; S36: configure the power supply B as fast power-up and normal power-down time, start power-up, and traverse from 1 microsecond to 100 microseconds with a step of 10 microseconds until the end, jump to step S31.

5. The simulation driving method for improving the power-up and power-down stability of multiple power supplies according to claim 4, characterized in that: In the test process of fast power-up, the data of 1 microsecond, 10 microseconds and 100 microseconds are tested.

6. The simulation driving method for improving power-on and power-off stability of multiple power supplies according to claim 5, characterized in that The step S5 comprises the following sub-steps: S51: configure one power supply as one power-down time and one power-down amplitude; S52: whether the power-down time or the power-down amplitude of the one power supply is tested completely, if yes, jump to step S6; if not, enter step S53; S53: configure the other power supply as one of VDDmax, VDD or VDDmin in power-down amplitude, and enter step S54, until the three power-down amplitudes are tested completely, jump to S51; S54: configure the power supply B as normal power-down time, start power-up test and record data, and traverse from 200 microseconds to 1 millisecond with a step of 100 microseconds until the end, enter step S55; S55: configure the power supply B as slow power-down, start power-up, and traverse from 1 millisecond to 20 milliseconds with a step of 2 milliseconds until the end, enter step S56; S56: configure the power supply B as fast power-down, start power-up, and traverse from 1 microsecond to 100 microseconds with a step of 10 microseconds until the end, jump to step S51.

7. The simulation driving method for improving the power-up and power-down stability of multiple power supplies according to claim 6, characterized in that: In the test process of fast power-down, the data of 1 microsecond, 10 microseconds and 100 microseconds are tested.

8. A simulation driving system for improving power-on and power-off stability of a multi-power supply, characterized by A device comprising a processor and a dynamic characteristic memory, the processor and the dynamic characteristic memory are coupled; wherein the dynamic characteristic memory is used to store a computer program; the processor is used to run the computer program stored in the dynamic characteristic memory, and execute the simulation driving method for improving the power-up and power-down stability of multiple power supplies according to any one of claims 1-7.

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