Stress decoupling method, device and system and computing equipment

Abstract

The embodiment of the invention provides a stress decoupling method, device and system and computing equipment. The method comprises the steps of obtaining stress data; generating a basic matrix based on the stress data; and based on the obtained load parameters, decoupling iteration processing is performed on the basic matrix to generate a decoupling matrix, so that the basic matrix is processed in an iteration mode, the data acquired by the sensor can be effectively decoupled, the problem of inter-dimensional coupling of stress data is improved, the processed data is more accurate, and the processing efficiency is improved. The problem that the eccentric loading error of the strain type stress sensor is large is remarkably solved, safety and reliability are achieved, stability is high, and the measurement precision of the stress sensor is improved.

Description

Technical Field

[0001] The embodiments of this specification relate to the field of mechanical testing technology, and in particular to a force decoupling method. Background Art

[0002] In the field of mechanical testing, there are a large number of multi-dimensional force testing needs under the state of dynamic and static load coupling. The strain-type multi-dimensional force sensor has excellent static and medium-low frequency testing performance, and is extremely suitable for multi-dimensional force testing under the state of dynamic and static load coupling. When the multi-dimensional force sensor is subjected to force in two or more directions, the forces affect each other, which constitutes inter-dimensional "coupling". Inter-dimensional coupling is a major factor affecting the measurement accuracy of multi-dimensional force sensors. Decoupling is to minimize or eliminate coupling interference to the greatest extent. The decoupling of the six-dimensional force sensor is to uniquely confirm the relationship between the input and output of the sensor with the smallest possible error through mathematical methods.

[0003] The least squares method is a common linear decoupling method. Its principle is to assume that the input and output of the six-dimensional force / torque sensor are in a linear relationship. By using the least squares method to determine its relevant parameters, the least squares method is used to statically decouple the multi-dimensional force sensor.

[0004] At present, multi-dimensional force sensors can achieve decoupling between force signals and torque signals through optimized design of elastic bodies. However, the decoupling effect between the torque and the force signal that generates the torque is not good, resulting in a phenomenon in actual use that if the six-dimensional force sensor is eccentrically loaded, the measurement accuracy of the multi-dimensional force sensor will be significantly reduced. Summary of the invention

[0005] In view of this, the embodiments of this specification provide a force decoupling method. One or more embodiments of this specification simultaneously relate to a force decoupling device, a force decoupling system, and a computing device to solve the technical defect that the decoupling effect between the torque and the force signal generating the torque in the prior art is not good, resulting in the phenomenon in actual use that if the six-dimensional force sensor is eccentrically loaded with a load, the measurement accuracy of the multi-dimensional force sensor will be significantly reduced.

[0006] According to a first aspect of an embodiment of this specification, a force decoupling method is provided, comprising: Obtain force data; generating a basic matrix based on the force data; Based on the acquired load parameters, a decoupling iterative process is performed on the basic matrix to generate a decoupling matrix.

[0007] In a possible implementation, the basic matrix includes basic matrix rows and columns, and the basic matrix rows and columns correspond to the force directions; and the decoupling iterative processing is performed on the basic matrix based on the acquired load parameters to generate the decoupling matrix, including: Determine a correction direction based on the force direction, where the correction direction is the force direction that needs to be corrected; Based on the load parameters and the modification parameters, decoupling iterative processing is performed on the target basic matrix rows and columns to generate decoupled rows and columns, wherein the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; The decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix.

[0008] In a possible implementation manner, when the number of the correction directions is greater than 1, after the decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix, the method further includes: The decoupling matrix is ​​used as the basic matrix, and the correction direction is determined based on the force direction, where the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, the target basic matrix rows and columns are decoupled iteratively processed to generate decoupled rows and columns, where the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; the decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix; and the decoupling matrix is ​​used as the basic matrix.

[0009] In a possible implementation, performing decoupling iterative processing on target basic matrix rows and columns based on the load parameters and the modification parameters to generate decoupled rows and columns includes: Generate a first test result based on the load parameter and the target basic matrix rows and columns; Modify the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generating a second test result based on the load parameter and the modification matrix; The decoupling rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical results.

[0010] In a possible implementation manner, generating the decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result, and the acquired theoretical result includes: The decoupled rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result through an iterative formula.

[0011] In a possible implementation, the generating the decoupled columns based on the target basic matrix columns, the modified matrix, the first test result, the second test result and the acquired theoretical result through an iterative formula includes: By means of the iterative formula, a target basic matrix value is determined from the target basic matrix rows and columns, a modified matrix value is determined from the modified matrix, a first test value is determined from the first test result, a second test value is determined from the second test result, and a theoretical value is determined from the theoretical result; Generate a matrix test ratio result according to the target basic matrix value, the modified matrix value, the first test value and the second test value; Generate a product result based on the matrix test ratio result, the first test value and the theoretical value; Generate decoupled row and column values ​​based on the multiplication result and the target basic matrix value; A decoupling column is generated based on the decoupling column value.

[0012] In a possible implementation, when the number of the load parameters is multiple; after the decoupling rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result, the method further includes: The decoupled rows and columns are used as the target basic matrix rows and columns, and the steps of generating a first test result based on the load parameters and the target basic matrix rows and columns; modifying the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generating a second test result based on the load parameters and the modified matrix; generating the decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical results; and using the decoupled rows and columns as the target basic matrix rows and columns are performed.

[0013] According to a second aspect of an embodiment of this specification, a force decoupling device is provided, comprising: An acquisition module, configured to acquire force data; A first generating module is configured to generate a basic matrix based on the force data; The second generating module is configured to perform decoupling iterative processing on the basic matrix based on the acquired load parameters to generate a decoupling matrix.

[0014] According to a third aspect of an embodiment of this specification, there is provided a force decoupling system, the system comprising a force module and a computing device; The force module is used to collect force data and send the force data to the computing device; The computing device is used to obtain force data; generate a basic matrix based on the force data; and perform decoupling iterative processing on the basic matrix based on the obtained load parameters to generate a decoupling matrix.

[0015] According to a fourth aspect of an embodiment of this specification, a computing device is provided, including: Memory and processor; The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the above-mentioned force decoupling method are implemented.

[0016] An embodiment of the present specification implements a force decoupling method, apparatus, system and computing device to obtain force data; generate a basic matrix based on the force data; and perform decoupling iterative processing on the basic matrix based on the obtained load parameters to generate a decoupling matrix, thereby processing the basic matrix in an iterative manner, which can effectively decouple the data collected by the sensor, improve the inter-dimensional coupling problem of the force data, make the processed data more accurate, and significantly improve the problem of large eccentric loading errors of strain-type force sensors. The system is safe, reliable, and highly stable, and improves the measurement accuracy of the force sensor. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a flow chart of a force decoupling method provided by an embodiment of this specification; Figure 2 It is a structural schematic diagram of a force decoupling device provided by an embodiment of this specification; Figure 3 is a schematic diagram of a force decoupling system provided by an embodiment of this specification; Figure 4 It is a schematic diagram of the connection between a multi-channel data collector and a force sensor provided by an embodiment of this specification; Figure 5 is a schematic diagram of a multi-channel data collector provided by an embodiment of this specification; Figure 6 It is a structural block diagram of a computing device provided by an embodiment of this specification. DETAILED DESCRIPTION

[0017] Many specific details are described in the following description to facilitate a full understanding of this specification. However, this specification can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the connotation of this specification, so this specification is not limited to the specific implementation disclosed below.

[0018] The terms used in one or more embodiments of this specification are only for the purpose of describing specific embodiments, and are not intended to limit one or more embodiments of this specification. The singular forms of "a" and "the" used in one or more embodiments of this specification and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used in one or more embodiments of this specification refers to and includes any or all possible combinations of one or more associated listed items.

[0019] It should be understood that although the terms first, second, etc. may be used to describe various information in one or more embodiments of this specification, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of this specification, the first may also be referred to as the second, and similarly, the second may also be referred to as the first. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0020] In this specification, a force decoupling method is provided. This specification also relates to a force decoupling device, a force decoupling system, and a computing device, which are described in detail one by one in the following embodiments.

[0021] Figure 1 is a flow chart of a force decoupling method provided by an embodiment of this specification, such as Figure 1 As shown, the method includes: Step 101: The computing device obtains force data.

[0022] In some embodiments, the computing device is connected to at least one force sensor, and the force sensor includes a multi-dimensional force sensor or a single-dimensional force sensor. The multi-dimensional force sensor includes a three-dimensional force sensor or a six-dimensional force sensor.

[0023] For example, a multi-dimensional force sensor includes a six-dimensional force sensor, which is used to measure force. The collected data usually includes forces in three directions along the coordinate axis (Fx, Fy, Fz) and moments in three directions (Mx, My, Mz). The point at the center of the six-dimensional force sensor is taken as the center point, and a measuring object is placed anywhere on the six-dimensional force sensor, for example, the measuring object is a weight. The measuring object is usually not placed exactly at the center point, but the six-dimensional force sensor loads data through the center point to obtain the force data of the measuring object. The measuring object is not placed at the center point, but the force data collected by the sensor through the center point is eccentrically loaded data. The computing device is connected to the six-dimensional force sensor, and the six-dimensional force sensor sends the force data to the computing device.

[0024] Step 102: The computing device generates a basic matrix based on the force data.

[0025] In some embodiments, the computing device decouples the force data using a linear decoupling method to generate a basic matrix. For example, the linear decoupling method is a least squares method.

[0026] Step 103: The computing device performs decoupling iterative processing on the basic matrix based on the acquired load parameters to generate a decoupling matrix.

[0027] In some embodiments, the load parameter is the distance between the loading point and the center point of the measured object, which can be expressed as a force arm L. Without changing the measured object, at least one force arm L1 is changed. The actual weight of the measured object and at least one force arm L1 are known to the computing device, and the data measured by the force sensor are decoupled and iteratively processed, thereby iteratively optimizing the basic matrix. The obtained decoupling matrix can be used as a benchmark for measuring accuracy, further reducing the eccentric loading error and improving the measurement accuracy of the force sensor.

[0028] An embodiment of the present specification provides a force decoupling method, which obtains force data; generates a basic matrix based on the force data; performs decoupling iterative processing on the basic matrix based on the obtained load parameters to generate a decoupling matrix, thereby processing the basic matrix in an iterative manner, which can effectively decouple the data collected by the sensor, improve the inter-dimensional coupling problem of the force data, make the processed data more accurate, significantly improve the problem of large eccentric loading error of the strain-type force sensor, is safe and reliable, has high stability, and improves the measurement accuracy of the force sensor. .

[0029] In a possible implementation, in step 102, the computing device generates a basic matrix based on the force data by using a least squares method.

[0030] In some embodiments, the computing device performs preliminary decoupling of the force data by the least square method, and uses the decoupled matrix as the basic matrix C1. For example, the force data measured by the six-dimensional force sensor includes six-dimensional force data, and the computing device performs preliminary decoupling of the six-dimensional force data by the least square method to obtain a basic matrix C1 with 6 rows and 6 columns.

[0031] In a possible implementation, the basic matrix includes basic matrix rows and columns, and the basic matrix rows and columns correspond to the force directions; step 103 may specifically include: Step 1031: The computing device determines a correction direction based on the force direction, where the correction direction is the force direction that needs to be corrected.

[0032] In some embodiments, the correction direction may be any force direction that needs to be corrected. For example, when the force in the Fx direction needs to be corrected, Fx is used as the correction direction. The correction direction may be a direction that needs to be corrected that is known in advance. Alternatively, the computing device knows the actual mass of the measured object, and obtains the measured mass corresponding to the force direction from the force data; the actual mass is compared with the measured mass corresponding to the force direction, and when the error between the actual mass and the measured mass is greater than the error threshold, the force direction is determined to be the correction direction.

[0033] Step 1032: The computing device performs decoupling iterative processing on the target basic matrix rows and columns based on the load parameters and the modification parameters to generate decoupled rows and columns, where the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction.

[0034] In some embodiments, the target matrix rows and columns include target matrix rows or target matrix columns. For example, the basic matrix C1 is a 6*6 matrix, and the first row of the basic matrix is ​​used as the target matrix row corresponding to the Fx direction.

[0035] Step 1032 may specifically include: Step 1032A: The computing device generates a first test result based on the load parameters and the target basic matrix rows and columns.

[0036] In some embodiments, the load parameter includes a force arm L1. The computing device applies a load (force arm L1) in the correction direction to obtain a set of test results, which are first test results R1. For example, the computing device obtains the first test result R1 based on the product of the rows and columns of the target basic matrix and the force arm L1.

[0037] Step 1032B: The computing device modifies the rows and columns of the target basic matrix based on the modification parameters to generate a modified matrix.

[0038] In some embodiments, the computing device modifies all values ​​of the target basic matrix rows and columns into modification parameters to obtain updated target basic matrix rows and columns, and uses the updated target basic matrix rows and columns as the modification matrix.

[0039] For example, the modification parameter is 0.05, the target matrix row is a matrix with 1 row and 6 columns, with 6 values, and all 6 values ​​of the target matrix row are modified to 0.05. The modified target matrix row is the modified matrix.

[0040] Step 1032C: The computing device generates a second test result based on the load parameter and the modification matrix.

[0041] In some embodiments, the computing device applies the same load (lever L1) to the modified matrix to obtain another set of test results, which is the second test result R2. For example, the computing device obtains the second test result R2 based on the product of the modified matrix and the lever L1.

[0042] Step 1032D: The computing device generates decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result, and the acquired theoretical result.

[0043] In some embodiments, the computing device generates decoupled columns based on the target basic matrix columns, the modified matrix, the first test result, the second test result, and the acquired theoretical result through an iterative formula. The theoretical result is the result theoretically generated by the computing device when the measuring object is placed on the force sensor.

[0044] The computing device determines the target basic matrix value from the target basic matrix rows and columns through an iterative formula , determine the modified matrix value from the modified matrix , determine the first test value from the first test result R1 , determine the second test value from the second test result R2 , determine the theoretical value from the theoretical results ; According to the target basic matrix value , modify the matrix value , the first test value The second test value Generate a matrix test ratio result; based on the matrix test ratio result, the first test value Compared with theoretical values Generate product results; based on the product results and the target basic matrix value Generate decoupled row and column values; Generate decoupled rows and columns based on the decoupled row and column values. When there are multiple values ​​in the target basic matrix rows and columns, the computing device iteratively executes the iterative formula to determine the target basic matrix values ​​from the target basic matrix rows and columns. , determine the modified matrix value from the modified matrix , determine the first test value from the first test result R1 , determine the second test value from the second test result R2 , determine the theoretical value from the theoretical results ; According to the target basic matrix value , modify the matrix value , the first test value The second test value Generate a matrix test ratio result; based on the matrix test ratio result, the first test value Compared with theoretical values Generate product results; based on the product results and the target basic matrix value The step of generating decoupled row and column values, until the last decoupled row and column value is generated, generates a decoupled row and column based on multiple decoupled row and column values.

[0045] According to the target basic matrix value , modify the matrix value , the first test value The second test value Generate matrix test ratio results, including: Calculate the value of the target basic matrix based on the device Modify the matrix value The difference between the first test value and the second test value determines the first difference; based on the first test value The second test value The second difference is determined based on the difference between the first difference and the second difference; and the matrix test ratio result is determined based on the ratio of the first difference to the second difference.

[0046] Based on the matrix test ratio results, the first test value Compared with theoretical values Generate product results, including: calculation equipment based on theoretical values With the first test value The third difference is determined based on the difference of the matrix test ratio result and the third difference; and the product result is determined based on the product of the matrix test ratio result and the third difference.

[0047] For example, the iteration formula is = + *( ), where i represents a row and j represents a column; or, i represents a column and j represents a row.

[0048] For another example, when i represents a column, j represents a row, and the first row of the basic matrix is ​​the row and column of the target basic matrix, i is an integer in the interval [1, 6], and j is 1. When i=1, the computing device determines the target basic matrix value corresponding to the correction direction from the target basic matrix row , determine the modification matrix value corresponding to the correction direction from the modification matrix , determine the first test value corresponding to the correction direction from the first test result R1 , determine the second test value corresponding to the correction direction from the second test result R2 , determine the theoretical value corresponding to the correction direction from the theoretical results ; Among them, the target basic matrix value Modify the matrix value to the first value in the target basic matrix row To modify the first value in the matrix, the first test value is the first value among the six values ​​of the first test result R1, and the second test value The first value among the six values ​​of the second test result R2, the theoretical value is the first value in the theoretical result R3; through the above iterative formula, according to the target basic matrix value , modify the matrix value , the first test value , the second test value Compared with theoretical values Generate the first decoupled row value. When i=2, refer to the above content when i=1 to generate the second decoupled row value, until i=6, generate the sixth decoupled row value, which will not be repeated here. The computing device composes a decoupled row according to the 6 decoupled row values.

[0049] The number of load parameters can be multiple. After the computing device executes step 1032D, it iteratively executes the decoupled rows and columns as the target basic matrix rows and columns, and executes steps 1032A to 1032D until the last load parameter participates in the operation to obtain the decoupled rows and columns. The load parameter can be multiple independent values, or at least one combination. For example, the load parameter includes a load combination composed of a positive load parameter and a negative load parameter. The load parameter may include at least one load combination, and the positive load parameter and the negative load parameter are opposite numbers to each other. After the basic matrix rows and columns corresponding to the correction direction are processed by the positive load parameter to obtain the decoupled rows and columns, the computing device uses the decoupled rows and columns corresponding to the positive load parameter as the target basic matrix rows and columns, and uses the negative load parameter as the load parameter, and executes steps 1032A to 1032D to obtain the decoupled rows and columns corresponding to the negative load parameter.

[0050] Step 1033: The computing device generates a decoupling matrix based on the decoupling rows and columns and the basic matrix.

[0051] In some embodiments, the computing device replaces target basic matrix rows and columns in the basic matrix with decoupling rows and columns, and uses the replaced basic matrix as the decoupling matrix.

[0052] For example, the first row in the basic matrix is ​​replaced with the decoupled row and column, and the basic matrix after replacement is the decoupled matrix.

[0053] In one possible implementation, when the number of correction directions is greater than 1, after step 1033, the computing device iteratively executes steps 1031 to 1033 using the decoupling matrix as the basic matrix until the number of correction directions is zero.

[0054] In some embodiments, the computing device may sort the multiple correction directions, sequentially execute the steps of generating a decoupling matrix corresponding to the first correction direction, using the decoupling matrix corresponding to the first correction direction as a basic matrix, generating a decoupling matrix corresponding to the second correction direction, etc. Alternatively, the computing device may also create multiple threads, one for each correction direction, the threads do not affect each other, the computing device generates decoupling rows and columns corresponding to the correction directions on the threads, and generates a decoupling matrix according to the decoupling rows and columns corresponding to the multiple correction directions.

[0055] The computing device knows the actual mass of the measured object, and obtains the decoupling array corresponding to the correction direction through the above iterative formula, so that the decoupling array can match the actual mass, thereby realizing the correction and decoupling of the force in the correction direction. When measuring the force of an unknown object in the correction direction, the obtained decoupling matrix can be used as a reference to decouple the force of the unknown object. Even if the latest force data is eccentrically loaded data, a more accurate force result can be obtained, thereby improving the measurement accuracy of the force sensor. An embodiment of the present specification provides a force decoupling method, which obtains force data; generates a basic matrix based on the force data; and performs decoupling iterative processing on the basic matrix based on the obtained load parameters to generate a decoupling matrix, thereby processing the basic matrix in an iterative manner, which can effectively decouple the data collected by the sensor, improve the inter-dimensional coupling problem of the force data, make the processed data more accurate, and significantly improve the problem of large eccentric loading errors of strain-type force sensors. It is safe, reliable, and highly stable, which improves the measurement accuracy of the force sensor and can also meet the measurement requirements of at least one channel.

[0056] Corresponding to the above method embodiment, this specification also provides a force decoupling device embodiment, Figure 2 is a structural schematic diagram of a force decoupling device provided by an embodiment of this specification, such as Figure 2 As shown, the device includes: an acquisition module 201, a first generation module 202 and a second generation module 203. The acquisition module 201 is connected to the first generation module 202, and the first generation module 202 is connected to the second generation module 203.

[0057] The acquisition module 201 is configured to acquire force data; the first generation module 202 is configured to generate a basic matrix based on the force data; the second generation module 203 is configured to perform decoupling iterative processing on the basic matrix based on the acquired load parameters to generate a decoupling matrix.

[0058] In one possible implementation, the basic matrix includes basic matrix rows and columns, and the basic matrix rows and columns correspond to the force direction; the second generation module 203 is configured to: determine the correction direction based on the force direction, and the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, decouple the target basic matrix rows and columns to generate decoupled rows and columns, and the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; generate a decoupling matrix based on the decoupling rows and columns and the basic matrix.

[0059] In one possible implementation, when the number of correction directions is greater than 1, the second generation module 203 is configured to: use the decoupling matrix as the basic matrix, and determine the correction direction based on the force direction, where the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, perform decoupling iterative processing on the target basic matrix rows and columns to generate decoupled rows and columns, where the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; generate a decoupling matrix based on the decoupling rows and columns and the basic matrix; and use the decoupling matrix as the basic matrix.

[0060] In one possible implementation, a first test result is generated based on load parameters and target basic matrix rows and columns; the target basic matrix rows and columns are modified based on modification parameters to generate a modified matrix; a second test result is generated based on the load parameters and the modified matrix; and a decoupled row and column is generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result, and the acquired theoretical results.

[0061] In a possible implementation, the second generation module 203 is configured to generate decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result through an iterative formula.

[0062] In one possible implementation, the second generation module 203 is configured to: determine the target basic matrix values ​​from the target basic matrix rows and columns through an iterative formula, determine the modified matrix values ​​from the modified matrix, determine the first test values ​​from the first test results, determine the second test values ​​from the second test results, and determine the theoretical values ​​from the theoretical results; generate a matrix test ratio result based on the target basic matrix values, the modified matrix values, the first test values ​​and the second test values; generate a product result based on the matrix test ratio result, the first test value and the theoretical value; generate a decoupled row and column value based on the product result and the target basic matrix value; generate a decoupled row and column value based on the decoupled row and column values.

[0063] In one possible implementation, when the number of load parameters is multiple; the second generation module 203 is configured to: use the decoupled rows and columns as the target basic matrix rows and columns, and generate a first test result based on the load parameters and the target basic matrix rows and columns; modify the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generate a second test result based on the load parameters and the modified matrix; generate decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test results, the second test results and the obtained theoretical results; and use the decoupled rows and columns as the target basic matrix rows and columns.

[0064] In a possible implementation, the first generating module 201 is configured to generate a basic matrix based on the force data by using a least squares method.

[0065] The embodiments of the present specification provide a force decoupling device, an acquisition module, configured to acquire force data; a first generation module, configured to generate a basic matrix based on the force data; a second generation module, configured to perform decoupling iterative processing on the basic matrix based on the acquired load parameters to generate a decoupling matrix, thereby processing the basic matrix in an iterative manner, which can effectively decouple the data collected by the sensor, improve the inter-dimensional coupling problem of the force data, make the processed data more accurate, and significantly improve the problem of large eccentric loading errors of strain-type force sensors. The device is safe, reliable, and highly stable, and improves the measurement accuracy of the force sensor.

[0066] The above is a schematic scheme of a force decoupling device of this embodiment. It should be noted that the technical scheme of the force decoupling device and the technical scheme of the force decoupling method described above belong to the same concept, and the details of the technical scheme of the force decoupling device that are not described in detail can all be referred to the description of the technical scheme of the force decoupling method described above.

[0067] Corresponding to the above method embodiment, this specification also provides a force decoupling system embodiment, Figure 3 is a schematic diagram of a force decoupling system provided by an embodiment of this specification, such as Figure 3 As shown, the system includes a force-bearing module 301 and a computing device 302 , and the computing device 302 is connected to the force-bearing module 301 .

[0068] The force module 301 is used to collect force data and send the force data to the computing device 302; the computing device 302 is used to obtain the force data; generate a basic matrix based on the force data; based on the obtained load parameters, perform decoupling iterative processing on the basic matrix to generate a decoupling matrix.

[0069] In a possible implementation, the force module 301 includes a force sensor 3011 and a collector 3012 ; the collector 3012 is connected to the force sensor 3011 and the computing device 302 .

[0070] The force sensor 3011 is used to send the force data to the collector 3012; the collector 3012 is used to collect the force data from the force sensor; perform analog-to-digital conversion on the force data to generate converted force data; and send the force data to the computing device 302.

[0071] In some embodiments, the collector may be connected to at least one force sensor, the collector may include a multi-channel data collector, and the number of sensors is an integer greater than or equal to 1.

[0072] Figure 4 FIG. 1 is a schematic diagram of a connection between a multi-channel data collector and a force sensor provided by an embodiment of the present specification. Figure 4 As shown, the force decoupling system includes a multi-channel data collector and N sensors, wherein the sensor refers to a force sensor and N is an integer greater than 1. The multi-channel data collector is connected to the N force sensors. The multi-channel data collector provides secondary power to the sensors and collects force data from the force sensors.

[0073] The collector 3012 includes at least one of a channel, a memory, an ARM processor, an FPGA chip, an analog to digital converter (ADC), an analog circuit and a backplane bus, wherein the backplane bus includes at least one of an address bus, a 24-bit parallel data bus, a power line and the like. Figure 5 is a schematic diagram of a multi-channel data collector provided by an embodiment of this specification, such as Figure 5 As shown in FIG. 1 , the multi-channel data acquisition device includes channels, electrically erasable programmable read only memory (EEPROM), ARM processor, FPGA chip, analog to digital converter (ADC), analog circuit and backplane bus, wherein the channels and EEPROM are not shown in FIG. Figure 5As shown in FIG. 1 , the ARM processor is connected to the backplane bus, the EEPROM, the FPGA chip and the analog circuit, the analog circuit is connected to the ADC, and the FPGA chip is connected to the backplane bus and the ADC. After the multi-channel data collector is powered on, the ARM processor is initialized, and the parameters of the last power-on are read from the EEPROM, and the parameters of this power-on are set according to the parameters of the last power-on; after the decoupling software is started, the multi-channel data collector reads the channel information from the ARM processor; the channel parameter setting command is obtained from the decoupling software, and the channel parameter setting command includes the sampling command; the channel responds to the command, and after the sampling command is started, the ARM processor writes the sampling rate code to the FPGA; the ARM processor releases the sampling clock, and the channel can be sampled, and the analog circuit converts the collected force data into standardized force data; the analog circuit inputs the data into the ADC; the ADC is used to convert the analog signal into a digital signal, thereby converting the standardized force data into digital force data, and storing the data in the FPGA; after the FPGA reads the digital force data, it caches the data into a First Input First Output (FIFO) queue; the ARM processor takes data from the FIFO queue and sends a read enable (OE) signal to the channel through the backplane bus, and the channel obtains the latest force data; when stopping sampling, the sampling clock is stopped first, and the channel will stop sampling.

[0074] In a possible implementation, the computing device 302 includes a collector, and the collector is connected to the force sensor.

[0075] In some embodiments, the collector has the function of collecting and processing data, and a processor capable of implementing the above-mentioned force decoupling method is integrated on the collector, and the above-mentioned force decoupling method is implemented by the collector.

[0076] In one possible implementation, the basic matrix includes basic matrix rows and columns, and the basic matrix rows and columns correspond to the force direction; the computing device 302 is used to determine the correction direction based on the force direction, and the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, the target basic matrix rows and columns are decoupled iteratively processed to generate decoupled rows and columns, and the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; a decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix.

[0077] In one possible implementation, when the number of correction directions is greater than 1, the computing device 302 is used to use the decoupling matrix as a basic matrix, and determine the correction direction based on the force direction, where the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, decouple the target basic matrix rows and columns to generate decoupled rows and columns, where the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; generate a decoupling matrix based on the decoupling rows and columns and the basic matrix; and use the decoupling matrix as the basic matrix.

[0078] In one possible implementation, the computing device 302 is used to generate a first test result based on the load parameters and the target basic matrix rows and columns; modify the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generate a second test result based on the load parameters and the modified matrix; and generate a decoupled row and column based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result, and the acquired theoretical results.

[0079] In a possible implementation, the computing device 302 is used to generate decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result, and the acquired theoretical result through an iterative formula.

[0080] In one possible implementation, the computing device 302 is used to determine target basic matrix values ​​from target basic matrix rows and columns, determine modified matrix values ​​from modified matrix, determine first test values ​​from first test results, determine second test values ​​from second test results, and determine theoretical values ​​from theoretical results through an iterative formula; generate matrix test ratio results based on the target basic matrix values, modified matrix values, first test values, and second test values; generate product results based on the matrix test ratio results, first test values, and theoretical values; generate decoupled row and column values ​​based on the product results and target basic matrix values; generate decoupled rows and columns based on the decoupled row and column values.

[0081] In one possible implementation, when the number of load parameters is multiple; the computing device 302 is used to use the decoupled rows and columns as the target basic matrix rows and columns, and execute the steps of generating a first test result based on the load parameters and the target basic matrix rows and columns; modifying the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generating a second test result based on the load parameters and the modified matrix; generating decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test results, the second test results and the obtained theoretical results; and using the decoupled rows and columns as the target basic matrix rows and columns.

[0082] In a possible implementation, the computing device 302 is configured to generate a basic matrix based on the force data by using a least square method.

[0083] The embodiment of the present specification provides a force decoupling system, which includes a force module and a computing device; the force module is used to collect force data and send the force data to the computing device; the computing device is used to obtain the force data; a basic matrix is ​​generated based on the force data; based on the obtained load parameters, the basic matrix is ​​decoupled and iteratively processed to generate a decoupling matrix, so that the basic matrix is ​​processed in an iterative manner, which can effectively decouple the data collected by the sensor, improve the inter-dimensional coupling problem of the force data, make the processed data more accurate, and significantly improve the problem of large eccentric loading errors of strain-type force sensors. It is safe, reliable, and has high stability, and improves the measurement accuracy of the force sensor.

[0084] The above is a schematic scheme of a force decoupling system of this embodiment. It should be noted that the technical scheme of the force decoupling system and the technical scheme of the force decoupling method described above belong to the same concept, and the details of the technical scheme of the force decoupling system that are not described in detail can be found in the description of the technical scheme of the force decoupling method described above.

[0085] Figure 6 is a block diagram of a computing device 600 provided by an embodiment of the present specification, such as Figure 6 As shown, the computing device 600 is Figure 3 The computing device 302 shown, the components of the computing device 600 include but are not limited to a memory 610 and a processor 620. The processor 620 is connected to the memory 610 via a bus 630, and the database 650 is used to store data.

[0086] The computing device 600 also includes an access device 640 that enables the computing device 600 to communicate via one or more networks 660. Examples of these networks include a public switched telephone network (PSTN), a local area network (LAN), a wide area network (WAN), a personal area network (PAN), or a combination of communication networks such as the Internet. The access device 640 may include one or more of any type of network interface (e.g., a network interface card (NIC)) that is wired or wireless, such as an IEEE 802.11 wireless local area network (WLAN) wireless interface, a world-wide interoperability for microwave access (Wi-MAX) interface, an Ethernet interface, a universal serial bus (USB) interface, a cellular network interface, a Bluetooth interface, and a near field communication (NFC).

[0087] In one embodiment of the present specification, the above components of the computing device 600 and Figure 6 Other components not shown in the figure may also be connected to each other, for example, via a bus. It should be understood that Figure 6 The computing device structure block diagram shown is only for the purpose of illustration, and is not intended to limit the scope of this specification. Those skilled in the art can add or replace other components as needed.

[0088] The computing device 600 may be any type of stationary or mobile computing device, including a mobile computer or mobile computing device (e.g., a tablet computer, a personal digital assistant, a laptop computer, a notebook computer, a netbook, etc.), a mobile phone (e.g., a smart phone), a wearable computing device (e.g., a smart watch, smart glasses, etc.), or other types of mobile devices, or a stationary computing device such as a desktop computer or a personal computer (PC). The computing device 600 may also be a mobile or stationary server.

[0089] The processor 620 is used to execute the following computer executable instructions, which, when executed by the processor, implement the steps of the above-mentioned force decoupling method. The above is a schematic scheme of a computing device of this embodiment. It should be noted that the technical scheme of the computing device and the technical scheme of the above-mentioned force decoupling method belong to the same concept. For details not described in detail in the technical scheme of the computing device, please refer to the description of the technical scheme of the above-mentioned force decoupling method.

[0090] An embodiment of the present specification further provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the steps of the above-mentioned force decoupling method.

[0091] The above is a schematic scheme of a computer-readable storage medium of this embodiment. It should be noted that the technical scheme of the storage medium and the technical scheme of the above-mentioned force decoupling method belong to the same concept, and the details not described in detail in the technical scheme of the storage medium can be referred to the description of the technical scheme of the above-mentioned force decoupling method.

[0092] An embodiment of the present specification further provides a computer program, wherein when the computer program is executed in a computer, the computer is caused to execute the steps of the above-mentioned force decoupling method.

[0093] The above is a schematic scheme of a computer program of this embodiment. It should be noted that the technical scheme of the computer program and the technical scheme of the above-mentioned force decoupling method belong to the same concept, and the details not described in detail in the technical scheme of the computer program can be referred to the description of the technical scheme of the above-mentioned force decoupling method.

[0094] The above is a description of a specific embodiment of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0095] The computer instructions include computer program codes, which may be in source code form, object code form, executable files or some intermediate forms, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that the content contained in the computer-readable medium may be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0096] It should be noted that, for the convenience of description, the aforementioned method embodiments are all described as a series of action combinations, but those skilled in the art should be aware that the embodiments of this specification are not limited by the order of the actions described, because according to the embodiments of this specification, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the embodiments of this specification.

[0097] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0098] The preferred embodiments of this specification disclosed above are only used to help explain this specification. The optional embodiments do not describe all the details in detail, nor do they limit the invention to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the embodiments of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the embodiments of this specification, so that technicians in the relevant technical field can understand and use this specification well. This specification is limited only by the claims and their full scope and equivalents.

Claims

1. A force decoupling method, characterized in that: include: Obtain force data; generating a basic matrix based on the force data; Based on the acquired load parameters, a decoupling iterative process is performed on the basic matrix to generate a decoupling matrix.

2. The method according to claim 1, characterized in that The basic matrix includes basic matrix rows and columns, and the basic matrix rows and columns correspond to the force direction; the basic matrix is ​​subjected to decoupling iterative processing based on the acquired load parameters to generate a decoupling matrix, including: Determine a correction direction based on the force direction, where the correction direction is the force direction that needs to be corrected; Based on the load parameters and the modification parameters, decoupling and iterating the target basic matrix rows and columns to generate decoupled rows and columns, wherein the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; The decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix.

3. The method according to claim 2, characterized in that When the number of the correction directions is greater than 1, after generating the decoupling matrix based on the decoupling rows and columns and the basic matrix, the method further includes: The decoupling matrix is ​​used as the basic matrix, and the correction direction is determined based on the force direction, where the correction direction is the force direction that needs to be corrected; based on the load parameters and the modification parameters, the target basic matrix rows and columns are decoupled iteratively processed to generate decoupled rows and columns, where the target basic matrix rows and columns are the basic matrix rows and columns corresponding to the correction direction; the decoupling matrix is ​​generated based on the decoupling rows and columns and the basic matrix; and the decoupling matrix is ​​used as the basic matrix.

4. The method according to claim 2, characterized in that: The step of performing decoupling iterative processing on target basic matrix rows and columns based on the load parameters and the modified parameters to generate decoupled rows and columns includes: Generate a first test result based on the load parameter and the target basic matrix rows and columns; Modify the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generating a second test result based on the load parameter and the modification matrix; The decoupling rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical results.

5. The method according to claim 4, characterized in that The generating the decoupling rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result comprises: The decoupled rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result through an iterative formula.

6. The method according to claim 5, characterized in that The step of generating the decoupled matrix based on the target basic matrix matrix, the modified matrix, the first test result, the second test result and the acquired theoretical result through an iterative formula includes: By means of the iterative formula, a target basic matrix value is determined from the target basic matrix rows and columns, a modified matrix value is determined from the modified matrix, a first test value is determined from the first test result, a second test value is determined from the second test result, and a theoretical value is determined from the theoretical result; Generate a matrix test ratio result according to the target basic matrix value, the modified matrix value, the first test value and the second test value; Generate a product result based on the matrix test ratio result, the first test value and the theoretical value; Generate decoupled row and column values ​​based on the multiplication result and the target basic matrix value; A decoupling column is generated based on the decoupling column value.

7. The method according to claim 4, characterized in that When the number of the load parameters is multiple; after the decoupling rows and columns are generated based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical result, the method further includes: The decoupled rows and columns are used as the target basic matrix rows and columns, and the steps of generating a first test result based on the load parameters and the target basic matrix rows and columns; modifying the target basic matrix rows and columns based on the modification parameters to generate a modified matrix; generating a second test result based on the load parameters and the modified matrix; generating the decoupled rows and columns based on the target basic matrix rows and columns, the modified matrix, the first test result, the second test result and the acquired theoretical results; and using the decoupled rows and columns as the target basic matrix rows and columns are performed.

8. A force decoupling device, characterized in that: include: An acquisition module, configured to acquire force data; A first generating module is configured to generate a basic matrix based on the force data; The second generating module is configured to perform decoupling iterative processing on the basic matrix based on the acquired load parameters to generate a decoupling matrix.

9. A force decoupling system, characterized in that: The system includes a force module and a computing device; The force module is used to collect force data and send the force data to the computing device; The computing device is used to obtain force data; generating a basic matrix based on the force data; Based on the acquired load parameters, a decoupling iterative process is performed on the basic matrix to generate a decoupling matrix.

10. A computing device, characterized in that: include: Memory and processor; The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the force decoupling method described in any one of claims 1 to 7 are implemented.

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