Self-checking method, device and equipment for read-write performance of solid state disk and medium
By performing read and write performance tests and PCIE communication tests in solid-state drives, it is solved that it is difficult to accurately distinguish between solid-state drive performance problems and host-side software problems in the prior art, and high-accurate performance test results are achieved.
Patent Information
- Application Number
- CN202510110142.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-23
- Publication Date
- 2025-05-16
AI Technical Summary
The existing technology is difficult to accurately distinguish between solid-state drive performance problems and host-side software problems, resulting in inaccurate performance test results.
By implementing read and write performance tests and PCIE communication tests in a solid state drive, and sending the test results to the host, the host only needs to send two commands to obtain accurate performance test results.
This method can accurately measure the read and write performance of solid-state drives and PCIE communication rate, eliminate the host-side software reasons, and improve the accuracy of the test results.
Smart Images
Figure CN120015100A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of solid state hard disk testing, and in particular to a solid state hard disk read and write performance self-test method, device, equipment and medium. Background Art
[0002] NVME solid-state drives have now become the main storage device for personal computers. NVME (NVM Express, non-volatile memory host controller interface specification) is a storage device communication protocol that uses the PCIE (peripheral component interconnectexpress, a high-speed serial computer expansion bus standard) interface as a physical transmission channel. Read and write speed is the most important factor in judging the performance of solid-state drives.
[0003] The current method for testing the performance of SSDs by hosts is mainly to use the host software to directly read and write the SSDs. In addition to the performance of the SSD itself, the host software design, system fluency, etc. will also affect the test results.
[0004] When a storage device performance problem occurs, it is difficult for the host to directly determine whether the problem is caused by the hard disk performance or the host software. Summary of the invention
[0005] Embodiments of the present invention provide a method, device, equipment and medium for self-checking the read and write performance of a solid state drive, aiming to solve at least one technical problem in the above-mentioned background technology.
[0006] In a first aspect, an embodiment of the present invention provides a method for self-testing the read and write performance of a solid-state hard disk, the method being applied to a solid-state hard disk, the method comprising:
[0007] If a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host;
[0008] If a performance acquisition command sent by the host is received, the test result of the read / write performance test and the test result of the PCIE communication test are obtained;
[0009] The test results of the read and write performance test and the test results of the PCIE communication test are sent to the host.
[0010] A further technical solution is that the read and write performance test of the NAND flash of the solid state drive includes:
[0011] The NAND flash of the solid state drive is read and written at full speed.
[0012] A further technical solution is that the PCIE communication test is performed between the solid state drive and the host, including:
[0013] Full-speed access is provided to the HMB of the host.
[0014] A further technical solution is that obtaining the test result of the read-write performance test includes:
[0015] Obtaining a first test duration of the read-write performance test;
[0016] Obtaining a total amount of first data read and written from the nand flash during the read and write performance test;
[0017] The read and write rate of the nand flash is determined based on the first total amount of data and the test duration.
[0018] A further technical solution is that the step of obtaining the test duration of the read-write performance test includes:
[0019] The time interval between the test command and the performance acquisition command is obtained as the test duration.
[0020] A further technical solution is that obtaining the test result of the PCIE communication test includes:
[0021] Obtain a second test duration of the PCIE communication test;
[0022] Obtaining a total amount of second data read and written from the HMB during the PCIE communication test;
[0023] A PCIE communication rate between the solid state drive and the host is determined based on the second total amount of data and the test duration.
[0024] In a second aspect, an embodiment of the present invention provides a method for self-testing the read and write performance of a solid state drive, the method being applied to a host, the method comprising:
[0025] Sending a test command to the solid state drive, wherein if the test command sent by the host is received, the solid state drive performs a read and write performance test on the NAND flash of the solid state drive, and performs a PCIE communication test between the solid state drive and the host;
[0026] A performance acquisition command is sent to the solid-state drive, wherein if the performance acquisition command sent by the host is received, the solid-state drive obtains the test results of the read and write performance test and the test results of the PCIE communication test; and sends the test results of the read and write performance test and the test results of the PCIE communication test to the host.
[0027] In a third aspect, an embodiment of the present invention further provides a solid state hard disk read and write performance self-test device, which includes a unit for executing the above method.
[0028] In a fourth aspect, an embodiment of the present invention further provides a computer device, which includes a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the above method when executing the computer program.
[0029] In a fifth aspect, an embodiment of the present invention further provides a computer-readable storage medium, wherein the storage medium stores a computer program, and the computer program can implement the above method when executed by a processor.
[0030] The embodiment of the present invention provides a method, device, equipment and medium for self-testing the read and write performance of a solid-state hard disk. The method includes: if a test command sent by a host is received, a read and write performance test is performed on the NAND flash of the solid-state hard disk, and a PCIE communication test is performed between the solid-state hard disk and the host; if a performance acquisition command sent by the host is received, the test results of the read and write performance test and the test results of the PCIE communication test are obtained; and the test results of the read and write performance test and the test results of the PCIE communication test are sent to the host. It can be seen that the host only needs to send two commands, and the read and write performance of the solid-state hard disk can be measured without the host-side software performing a read and write test, thereby eliminating the host-side software cause and making the test result more accurate. BRIEF DESCRIPTION OF THE DRAWINGS
[0031] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying any creative work.
[0032] Figure 1 A flowchart of a method for self-checking the read and write performance of a solid state hard disk provided by an embodiment of the present invention;
[0033] Figure 2 Another schematic diagram of a flow chart of a method for self-checking the read and write performance of a solid state hard disk provided by an embodiment of the present invention;
[0034] Figure 3 A schematic diagram of the connection relationship between a solid state drive and a host provided by an embodiment of the present invention;
[0035] Figure 4 A schematic block diagram of a computer device provided in an embodiment of the present invention. DETAILED DESCRIPTION
[0036] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0037] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.
[0038] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.
[0039] It should be further understood that the term "and / or" used in the present description and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.
[0040] As used in this specification and the appended claims, the term "if" may be interpreted as "when" or "upon" or "in response to determining" or "in response to detecting," depending on the context. Similarly, the phrases "if it is determined" or "if [described condition or event] is detected" may be interpreted as meaning "upon determination" or "in response to determining" or "upon detection of [described condition or event]" or "in response to detecting [described condition or event]," depending on the context.
[0041] See also Figure 1-Figure 3 The embodiment of the present invention provides a method for self-testing the read and write performance of a solid state hard disk, and the method is applied to a solid state hard disk. Figure 1 As shown, the method comprises the following steps:
[0042] S1, if a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host.
[0043] In a specific implementation, the host sends a test command to the SSD. Accordingly, when the SSD receives the test command sent by the host, it performs a performance self-test. Specifically, the test items include: performing a read and write performance test on the NAND flash of the SSD, and performing a PCIE communication test between the SSD and the host.
[0044] It should be noted that NAND Flash is a non-volatile storage medium for solid-state drives.
[0045] In one embodiment, the above step of "performing a read and write performance test on the NAND flash of the solid state drive" specifically includes the following steps: performing full-speed reading and writing on the NAND flash of the solid state drive.
[0046] In a specific implementation, the NAND flash of the solid state drive is read and written at full speed at the maximum read and write speed to test the read and write performance of the solid state drive.
[0047] In one embodiment, the above step of "performing a PCIE communication test between the solid state drive and the host" specifically includes the following steps: performing full-speed access to the HMB of the host.
[0048] In specific implementation, HMB (Host Memory Buffer) is a memory area provided by the host side for SSD use as specified in the NVME protocol, and the SSD can freely access this memory area. By accessing HMB at full speed, PCIE communication during actual reading and writing is simulated.
[0049] See also Figure 3 ,The solid state drive (SSD) includes an SSD main control chip and the storage medium Nand flash, and the solid state drive communicates with the host via PCIE.
[0050] S2: If a performance acquisition command sent by the host is received, the test results of the read and write performance test and the test results of the PCIE communication test are obtained.
[0051] In a specific implementation, if a performance acquisition command sent by the host is received, the read / write performance test and the PCIE communication test are immediately stopped, and the test results of the read / write performance test and the PCIE communication test are obtained. The time interval between the test command sent by the host and the performance acquisition command can be 10s, which is not specifically limited by the present invention.
[0052] In some embodiments, the above step of "obtaining the test results of the read and write performance test" specifically includes the following steps: obtaining a first test duration of the read and write performance test; obtaining a first total amount of data read and written from the nand flash during the read and write performance test; and determining the read and write rate of the nand flash based on the first total amount of data and the test duration.
[0053] In a specific implementation, the time interval between the test command and the performance acquisition command is obtained as the first test duration. The quotient of the first data volume and the first test duration is obtained to obtain the read and write rate of the nand flash, that is, the test result of the read and write performance test.
[0054] In some embodiments, the above step of "obtaining the test results of the PCIE communication test" specifically includes the following steps: obtaining a second test duration of the PCIE communication test; obtaining a second total amount of data read and written from the HMB during the PCIE communication test; and determining the PCIE communication rate between the solid-state drive and the host based on the second total amount of data and the test duration.
[0055] In a specific implementation, the time interval between the test command and the performance acquisition command is obtained as the second test duration. It can be seen that in the embodiment of the present invention, the first test duration is the same as the second test duration. The quotient of the second total amount of data and the second test duration is obtained to obtain the PCIE communication rate between the solid state drive and the host, that is, the test result of the PCIE communication test.
[0056] S3, sending the test results of the read and write performance test and the test results of the PCIE communication test to the host.
[0057] In a specific implementation, the test result of the read / write performance test (the read / write rate of the nand flash) and the test result of the PCIE communication test (the PCIE communication rate between the solid state drive and the host) are sent to the host.
[0058] The embodiment of the present invention proposes a self-test method for the read and write performance of a solid-state hard disk, which is applied to a solid-state hard disk, and includes: if a test command sent by a host is received, a read and write performance test is performed on the NAND flash of the solid-state hard disk, and a PCIE communication test is performed between the solid-state hard disk and the host; if a performance acquisition command sent by the host is received, the test result of the read and write performance test is obtained and the test result of the PCIE communication test is obtained; and the test result of the read and write performance test and the test result of the PCIE communication test are sent to the host. It can be seen that the host only needs to send two commands, and the read and write performance of the solid-state hard disk can be measured without the host-side software performing a read and write test, thereby eliminating the host-side software cause and making the test result more accurate.
[0059] After the host receives the above test results returned by the SSD, if the read and write rates of the NAND flash are lower than the expected read and write performance rates of the SSD, external factors affecting the performance of the NAND flash, such as whether the SSD is nearing the end of its service life or whether the operating temperature is too high, should be checked; if the PCIE communication rate is lower than the expected PCIE communication rate of the SSD, the PCIE interface between the SSD and the host should be checked for abnormalities, as well as the PCIE hardware settings on the host side.
[0060] The present invention accordingly proposes a self-test method for the read and write performance of a solid-state hard disk, which is applied to a host and comprises: sending a test command to the solid-state hard disk, wherein if the test command sent by the host is received, the solid-state hard disk performs a read and write performance test on the NAND flash of the solid-state hard disk, and performs a PCIE communication test between the solid-state hard disk and the host; sending a performance acquisition command to the solid-state hard disk, wherein if the performance acquisition command sent by the host is received, the solid-state hard disk acquires the test result of the read and write performance test and the test result of the PCIE communication test; and sending the test result of the read and write performance test and the test result of the PCIE communication test to the host.
[0061] Corresponding to the above solid-state hard disk read / write performance self-test method, the present invention also provides a solid-state hard disk read / write performance self-test device. The solid-state hard disk read / write performance self-test device includes a unit for executing the above solid-state hard disk read / write performance self-test method, and the solid-state hard disk read / write performance self-test device can be configured in a terminal. Specifically, the solid-state hard disk read / write performance self-test device includes:
[0062] If a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host;
[0063] If a performance acquisition command sent by the host is received, the test result of the read / write performance test and the test result of the PCIE communication test are obtained;
[0064] The test results of the read and write performance test and the test results of the PCIE communication test are sent to the host.
[0065] In some embodiments, such as this embodiment, the step of performing a read and write performance test on the NAND flash of the solid state drive includes:
[0066] The NAND flash of the solid state drive is read and written at full speed.
[0067] In some embodiments, such as this embodiment, the PCIE communication test between the solid state drive and the host includes:
[0068] Full-speed access is provided to the HMB of the host.
[0069] In some embodiments, such as this embodiment, obtaining the test result of the read / write performance test includes:
[0070] Obtaining a first test duration of the read-write performance test;
[0071] Obtaining a total amount of first data read and written from the nand flash during the read and write performance test;
[0072] The read and write rate of the nand flash is determined based on the first total amount of data and the test duration.
[0073] In some embodiments, such as this embodiment, obtaining the test duration of the read / write performance test includes:
[0074] The time interval between the test command and the performance acquisition command is obtained as the test duration.
[0075] In some embodiments, such as this embodiment, obtaining the test result of the PCIE communication test includes:
[0076] Obtain a second test duration of the PCIE communication test;
[0077] Obtaining a total amount of second data read and written from the HMB during the PCIE communication test;
[0078] A PCIE communication rate between the solid state drive and the host is determined based on the second total amount of data and the test duration.
[0079] In some embodiments, the solid state drive read / write performance self-test device includes:
[0080] A first sending unit is used to send a test command to the solid state drive, wherein if the test command sent by the host is received, the solid state drive performs a read and write performance test on the NAND flash of the solid state drive, and performs a PCIE communication test between the solid state drive and the host;
[0081] The second sending unit is used to send a performance acquisition command to the solid-state drive, wherein if the performance acquisition command sent by the host is received, the solid-state drive obtains the test results of the read and write performance test and the test results of the PCIE communication test; and sends the test results of the read and write performance test and the test results of the PCIE communication test to the host.
[0082] It should be noted that technicians in the relevant field can clearly understand that the specific implementation process of the above-mentioned solid-state hard disk read and write performance self-test device and each unit can refer to the corresponding description in the aforementioned method embodiment, and for the convenience and conciseness of the description, it will not be repeated here.
[0083] The above-mentioned solid state hard disk read / write performance self-test device can be implemented in the form of a computer program, and the computer program can be used in Figure 4 Runs on the computer device shown.
[0084] See also Figure 4 , Figure 4 1 is a schematic block diagram of a computer device provided by an embodiment of the present invention. The computer device 500 may be a terminal or a server.
[0085] The computer device 500 includes a processor 502 , a memory, and a network interface 505 connected via a system bus 501 , wherein the memory may include a non-volatile storage medium 503 and an internal memory 504 .
[0086] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. When the computer program 5032 is executed, the processor 502 can execute a method for self-testing the read and write performance of a solid state hard disk.
[0087] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500 .
[0088] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can execute a self-test method for the read and write performance of the solid state drive.
[0089] The network interface 505 is used to communicate with other devices over the network. Those skilled in the art will appreciate that the above structure is only a block diagram of a portion of the structure related to the solution of the present invention, and does not constitute a limitation on the computer device 500 to which the solution of the present invention is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.
[0090] The processor 502 is used to run the computer program 5032 stored in the memory to implement the following steps:
[0091] If a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host;
[0092] If a performance acquisition command sent by the host is received, the test result of the read / write performance test and the test result of the PCIE communication test are obtained;
[0093] The test results of the read and write performance test and the test results of the PCIE communication test are sent to the host.
[0094] In some embodiments, such as this embodiment, the step of performing a read and write performance test on the NAND flash of the solid state drive includes:
[0095] The NAND flash of the solid state drive is read and written at full speed.
[0096] In some embodiments, such as this embodiment, the PCIE communication test between the solid state drive and the host includes:
[0097] Full-speed access is provided to the HMB of the host.
[0098] In some embodiments, such as this embodiment, obtaining the test result of the read / write performance test includes:
[0099] Obtaining a first test duration of the read-write performance test;
[0100] Obtaining a total amount of first data read and written from the nand flash during the read and write performance test;
[0101] The read and write rate of the nand flash is determined based on the first total amount of data and the test duration.
[0102] In some embodiments, such as this embodiment, obtaining the test duration of the read / write performance test includes:
[0103] The time interval between the test command and the performance acquisition command is obtained as the test duration.
[0104] In some embodiments, such as this embodiment, obtaining the test result of the PCIE communication test includes:
[0105] Obtain a second test duration of the PCIE communication test;
[0106] Obtaining a total amount of second data read and written from the HMB during the PCIE communication test;
[0107] A PCIE communication rate between the solid state drive and the host is determined based on the second total amount of data and the test duration.
[0108] In some embodiments, the following steps are implemented:
[0109] Sending a test command to the solid state drive, wherein if the test command sent by the host is received, the solid state drive performs a read and write performance test on the NAND flash of the solid state drive, and performs a PCIE communication test between the solid state drive and the host;
[0110] A performance acquisition command is sent to the solid-state drive, wherein if the performance acquisition command sent by the host is received, the solid-state drive obtains the test results of the read and write performance test and the test results of the PCIE communication test; and sends the test results of the read and write performance test and the test results of the PCIE communication test to the host.
[0111] It should be understood that in the embodiment of the present invention, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.
[0112] It is understood by those skilled in the art that all or part of the processes in the method for implementing the above embodiment can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a storage medium, which is a computer-readable storage medium. The computer program is executed by at least one processor in the computer system to implement the process steps of the embodiment of the above method.
[0113] Therefore, the present invention also provides a storage medium. The storage medium may be a computer-readable storage medium. The storage medium stores a computer program. When the computer program is executed by a processor, the processor executes the following steps:
[0114] If a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host;
[0115] If a performance acquisition command sent by the host is received, the test result of the read / write performance test and the test result of the PCIE communication test are obtained;
[0116] The test results of the read and write performance test and the test results of the PCIE communication test are sent to the host.
[0117] In some embodiments, such as this embodiment, the step of performing a read and write performance test on the NAND flash of the solid state drive includes:
[0118] The NAND flash of the solid state drive is read and written at full speed.
[0119] In some embodiments, such as this embodiment, the PCIE communication test between the solid state drive and the host includes:
[0120] Full-speed access is provided to the HMB of the host.
[0121] In some embodiments, such as this embodiment, obtaining the test result of the read / write performance test includes:
[0122] Obtaining a first test duration of the read-write performance test;
[0123] Obtaining a total amount of first data read and written from the nand flash during the read and write performance test;
[0124] The read and write rate of the nand flash is determined based on the first total amount of data and the test duration.
[0125] In some embodiments, such as this embodiment, obtaining the test duration of the read / write performance test includes:
[0126] The time interval between the test command and the performance acquisition command is obtained as the test duration.
[0127] In some embodiments, such as this embodiment, obtaining the test result of the PCIE communication test includes:
[0128] Obtain a second test duration of the PCIE communication test;
[0129] Obtaining a total amount of second data read and written from the HMB during the PCIE communication test;
[0130] A PCIE communication rate between the solid state drive and the host is determined based on the second total amount of data and the test duration.
[0131] In some embodiments, the following steps are implemented:
[0132] Sending a test command to the solid state drive, wherein if the test command sent by the host is received, the solid state drive performs a read and write performance test on the NAND flash of the solid state drive, and performs a PCIE communication test between the solid state drive and the host;
[0133] A performance acquisition command is sent to the solid-state drive, wherein if the performance acquisition command sent by the host is received, the solid-state drive obtains the test results of the read and write performance test and the test results of the PCIE communication test; and sends the test results of the read and write performance test and the test results of the PCIE communication test to the host.
[0134] The storage medium is a physical, non-transient storage medium, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a magnetic disk, or an optical disk, etc., which can store program codes. The computer-readable storage medium can be non-volatile or volatile.
[0135] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in terms of function in the above description. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.
[0136] In the several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of each unit is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.
[0137] The steps in the method of the embodiment of the present invention can be adjusted in order, combined and deleted according to actual needs. The units in the device of the embodiment of the present invention can be combined, divided and deleted according to actual needs. In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.
[0138] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, terminal, or network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention.
[0139] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.
[0140] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
[0141] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.
Claims
1. A method for self-testing the read and write performance of a solid state hard disk, characterized in that: The method is applied to a solid state drive, and the method comprises: If a test command sent by the host is received, a read and write performance test is performed on the NAND flash of the solid state drive, and a PCIE communication test is performed between the solid state drive and the host; If a performance acquisition command sent by the host is received, the test result of the read / write performance test and the test result of the PCIE communication test are obtained; The test results of the read and write performance test and the test results of the PCIE communication test are sent to the host.
2. The method for self-checking the read and write performance of a solid state hard disk according to claim 1, characterized in that: The reading and writing performance test of the NAND flash of the solid state drive includes: The NAND flash of the solid state drive is read and written at full speed.
3. The method for self-testing the read and write performance of a solid state drive according to claim 1, characterized in that: The PCIE communication test is performed between the solid state drive and the host, including: Full-speed access is provided to the HMB of the host.
4. The method for self-testing the read and write performance of a solid state drive according to claim 2, characterized in that: The obtaining of the test result of the read-write performance test includes: Obtaining a first test duration of the read-write performance test; Obtaining a total amount of first data read and written from the nand flash during the read and write performance test; The read and write rate of the nand flash is determined based on the first total amount of data and the test duration.
5. The method for self-checking the read and write performance of a solid state hard disk according to claim 4, characterized in that: The obtaining of the test duration of the read and write performance test includes: The time interval between the test command and the performance acquisition command is obtained as the test duration.
6. The method for self-checking the read / write performance of a solid state hard disk according to claim 3, characterized in that: The obtaining of the test result of the PCIE communication test comprises: Obtain a second test duration of the PCIE communication test; Obtaining a total amount of second data read and written from the HMB during the PCIE communication test; A PCIE communication rate between the solid state drive and the host is determined based on the second total amount of data and the test duration.
7. A method for self-checking the read and write performance of a solid state hard disk, characterized in that: The method is applied to a host, and the method comprises: Sending a test command to the solid state drive, wherein if the test command sent by the host is received, the solid state drive performs a read and write performance test on the NAND flash of the solid state drive, and performs a PCIE communication test between the solid state drive and the host; A performance acquisition command is sent to the solid-state drive, wherein if the performance acquisition command sent by the host is received, the solid-state drive obtains the test results of the read and write performance test and the test results of the PCIE communication test; and sends the test results of the read and write performance test and the test results of the PCIE communication test to the host.
8. A solid state hard disk read and write performance self-test device, characterized in that: The method comprises a unit for executing the method according to any one of claims 1 to 7.
9. A computer device, characterized in that: The computer device includes a memory and a processor, the memory stores a computer program, and the processor implements the method according to any one of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 7 can be implemented.