Laser scanning and projection integrated system and control method thereof

Abstract

The invention discloses a laser scanning and projection integrated system and a control method thereof. The laser scanning and projection integrated system is composed of an MCU micro-control unit, a laser, a dynamic focusing module, a laser beam splitting module, a two-dimensional galvanometer module, a light intensity detection module, a distance detection module and an upper computer. In the scanning stage, the upper computer sends an instruction to the MCU micro-control unit, the MCU micro-control unit controls the first laser to be started, the MCU micro-control unit receives angle data and distance data, and spherical coordinates of point cloud data of a target surface are generated and transmitted to the upper computer; in the projection stage, the upper computer sends an instruction to the MCU micro-control unit, the MCU micro-control unit controls the second laser to be started, the upper computer converts three-dimensional space coordinates into spherical coordinates and transmits the spherical coordinates to the MCU micro-control unit, and the MCU micro-control unit extracts angle data and controls the two-dimensional galvanometer to swing, so that laser beams are projected according to a preset path. The laser scanning and projection functions are integrated into one device, the system universality is high, and the purposes of high precision, high efficiency and low cost are achieved.

Description

Technical Field

[0001] The present invention belongs to the technical field of laser systems, and specifically relates to a laser scanning and projection integrated system and a control method thereof, which are widely applicable to the fields of building construction, medical equipment, engineering assembly, etc. Background Art

[0002] Laser scanners and laser projectors are widely used in industry and engineering as important components of precision measurement and projection technology. Laser scanners obtain three-dimensional point cloud data of target objects through laser ranging technology, and are widely used in surface measurement, model reconstruction, and deformation monitoring. Laser projectors use precise laser beams as a medium to project digital graphics onto the target surface for guiding processing, construction, or display. However, in the prior art, these two devices are usually independently designed and operated systems, and users need to perform data transmission and conversion operations between the two.

[0003] When traditional independent laser scanners and projectors are used independently, the optical systems and coordinate systems of the scanning equipment and the projection equipment are usually inconsistent. Traditional solutions require complex coordinate calibration and calibration processes, which not only increase the complexity of operation, but also easily introduce errors. Coordination between devices is difficult, and errors may accumulate due to differences in field of view. At the same time, the separate device structure design increases the size and cost of the system, limits portability and economy, and hinders its application in mobile scenarios and rapid deployment. Therefore, it is necessary to design a device that integrates scanning and projection functions, solves the problem of inconsistent field of view through unified optical path design, simplifies the coordinate conversion process, and improves the accuracy and efficiency of the system. Summary of the invention

[0004] In order to solve the problems of low efficiency, high error and increased cost caused by the separate design of scanning and projection equipment in the prior art, the present invention provides a laser scanning and projection integrated system and a control method thereof, which is designed for the integrated design of laser scanner and projector. Through the cooperation of MCU microcontroller unit, laser, dynamic focusing module, laser beam splitting module, two-dimensional galvanometer module, light intensity detection module, distance detection module and host computer, a laser scanning and projection integrated system is built, the laser scanning and projection functions are integrated into one device, and a system architecture with a shared optical path is designed. The system has strong versatility, reduces the operational errors introduced by human operation, and achieves the goals of high precision, high efficiency and low cost.

[0005] The objective of the present invention is achieved through the following technical solutions:

[0006] As a first aspect of the present invention, a laser scanning and projection integrated system is provided, which is composed of an MCU micro-control unit, a first laser, a second laser, a dynamic focusing module, a laser beam splitting module, a two-dimensional galvanometer module, a light intensity detection module, a distance detection module, and a host computer;

[0007] The laser No. 1 is used as a scanning light source in the laser scanning stage, and the laser No. 2 is used as a projection light source in the laser projection stage. The laser No. 1 and the laser No. 2 are respectively controlled to be turned on or off by the MCU micro-control unit;

[0008] In the laser scanning stage, the MCU micro-control unit controls the No. 1 laser to turn on, and the laser scanning beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The laser scanning beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module performs deflection control of the laser scanning beam under the control of the MCU micro-control unit, so that the laser scanning beam moves and scans on the target surface. The light intensity detection module transmits the light intensity signal of the laser beam reflected on the target surface to the MCU micro-control unit. The laser scanning beam reflected on the target surface is reflected by the laser beam splitting module to the distance detection module, and the distance detection module transmits the processed data to the MCU micro-control unit. The two-dimensional galvanometer module simultaneously transmits the deflection angle data to the MCU micro-control unit.

[0009] In the laser projection stage, the MCU micro-control unit controls the second laser to turn on, and the laser projection beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module is controlled by the MCU micro-control unit to swing the laser projection beam, so that the laser projection beam generates a laser projection pattern on the target surface. At the same time, the light intensity detection module transmits the light intensity signal of the laser beam reflected on the target surface to the MCU micro-control unit. The MCU micro-control unit controls the dynamic focusing module to focus the laser projection beam according to the light intensity signal, and adjusts the clarity of the laser projection pattern.

[0010] The host computer and the MCU micro-control unit perform bidirectional data transmission.

[0011] Furthermore, the No. 1 laser and the No. 2 laser are not turned on at the same time. The No. 1 laser is turned on and the No. 2 laser is turned off during the scanning phase, and the No. 1 laser is turned off and the No. 2 laser is turned on during the projection phase.

[0012] Furthermore, the wavelength of the first laser is different from the wavelength of the second laser.

[0013] Furthermore, the two-dimensional galvanometer module is used to realize the deflection control of the laser scanning beam and the laser projection beam. In the laser scanning stage, the laser scanning beam is moved and scanned on the target surface through the swing of the two-dimensional galvanometer, and the deflection angle of the two-dimensional galvanometer is monitored in real time through the angular displacement sensor integrated inside the two-dimensional galvanometer, and the deflection angle data is fed back and transmitted to the MCU micro-control unit in real time; in the laser projection stage, the two-dimensional galvanometer is controlled by the MCU micro-control unit to swing, so that the laser projection beam generates a laser projection pattern on the target surface.

[0014] Furthermore, the light intensity detection module captures the optical signal of the laser beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU microcontroller unit for light intensity energy analysis. When the energy signal received by the light intensity detection module is the maximum value, it is determined that the laser beam is precisely focused on the target surface at this time.

[0015] Furthermore, the host computer receives the spherical coordinates of the target surface point cloud data processed by the MCU micro-control unit during the laser scanning stage, converts the spherical coordinates into three-dimensional coordinates, integrates the data into a three-dimensional model of the target surface according to each scanning point, and adds projection graphics according to user needs; during the laser projection stage, the host computer solves the required projection graphics into three-dimensional point cloud data, and converts the three-dimensional data into spherical coordinates and transmits them to the MCU micro-control unit. The MCU micro-control unit extracts the angle data in the spherical coordinates, controls the swing of the two-dimensional galvanometer of the two-dimensional galvanometer module, so that the laser projection beam projects the projection graphics required by the user on the target surface.

[0016] As a second aspect of the present invention, a control method for a laser scanning and projection integrated system is also provided, comprising:

[0017] Laser scanning stage: The host computer sends a laser scanning instruction to the MCU microcontroller unit. The MCU microcontroller unit controls the No. 1 laser to turn on and the No. 2 laser to turn off. The No. 1 laser emits a laser scanning beam, and the swing of the two-dimensional galvanometer causes the laser scanning beam to move and scan the target surface. The MCU microcontroller unit receives the angle data of the two-dimensional galvanometer collected by the two-dimensional galvanometer module and the distance data collected by the distance detection module, and obtains the spherical coordinates of each scanning point on the target surface by combining the distance data and the angle data. The spherical coordinates of the point cloud data of the target surface are generated and stored. After the scanning is completed, the point cloud data is transmitted to the host computer. The host computer converts the spherical coordinates of the point cloud data into three-dimensional space coordinates. The host computer integrates the scanning points to form a three-dimensional model of the target surface.

[0018] Laser projection stage: The host computer sends a laser projection instruction to the MCU micro-control unit. The MCU micro-control unit controls the No. 1 laser to turn off and turn on the No. 2 laser. The No. 2 laser emits a laser projection beam. The host computer converts the three-dimensional spatial coordinates of the projection figure to be projected into spherical coordinates, and transmits the spherical coordinates to the MCU micro-control unit. The MCU micro-control unit extracts the angle data in the spherical coordinates, and controls the two-dimensional galvanometer of the two-dimensional galvanometer module to swing according to the angle data, so that the laser beam is projected along the preset path.

[0019] Furthermore, in the laser scanning stage, the light intensity detection module captures the energy of the optical signal of the scanning light beam reflected on the target surface, and the light intensity detection module converts the detected optical signal into an electrical signal and transmits it to the MCU micro-control unit, which determines whether the laser beam is correctly focused on the target surface. The MCU micro-control unit controls the dynamic focusing module to focus the scanning light beam emitted by laser No. 1, and analyzes the energy signal fed back by the light intensity detection module in real time. When the energy signal fed back by the light intensity detection module is the maximum value, it indicates that the scanning light source emitted by laser No. 1 is focused on the target surface. At this time, the reflected scanning light beam is reflected to the distance detection module through the laser beam splitting module.

[0020] Furthermore, in the laser projection stage, the laser projection beam passes through the laser beam splitting module to obtain the laser projection pattern required by the user on the target surface. At the same time, the light intensity detection module captures the optical signal of the projection beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU micro-control unit for energy analysis. The MCU micro-control unit controls the dynamic focusing module to focus the laser projection beam emitted by the second laser, and analyzes the energy signal sent back by the light intensity detection module in real time. When the energy signal reaches the maximum value, the control of the dynamic focusing module is stopped.

[0021] The present invention has the following beneficial effects:

[0022] The present invention provides an integrated laser scanning and projection system, which integrates laser scanning and projection functions in the same device, and achieves field of view consistency and functional synergy by sharing a two-dimensional galvanometer and optical path. Through an efficient algorithm, point cloud data is quickly converted into a projectable graphic file to achieve dynamic and real-time projection adjustment. The single optical path design not only reduces the complexity of optical components, but also improves the overall stability and reliability of the system. All functional modules are designed with a high degree of integration, and the device is small in size, light in weight, and easy to carry and deploy. The device is compatible with a variety of input data formats and supports a wide range of applications in the fields of construction, industry, etc. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings used in the description of the embodiments of the present invention. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the contents of the embodiments of the present invention and these drawings without paying any creative work.

[0024] Figure 1 This is a schematic diagram of the composition principle of a laser scanning and projection integrated system according to Example 1 of the present invention;

[0025] Figure 2 This is an overall flow chart of a laser scanning and projection integrated system control method described in Example 2 of the present invention;

[0026] Figure 3 This is a flow chart of the laser scanning phase of the laser scanning and projection integrated system in Example 2 of the present invention;

[0027] Figure 4 This is a flow chart of the laser projection stage in Example 2 of the present invention;

[0028] In the figure:

[0029] 1-MCU microcontroller unit; 2-Laser No. 1; 3-Laser No. 2; 4-Dynamic focusing module; 5-Laser beam splitting module; 6-Two-dimensional galvanometer module; 7-Light intensity detection module; 8-Distance detection module; 9-Upper computer; 10-Target surface; 11-Laser projection pattern. DETAILED DESCRIPTION

[0030] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention.

[0031] Example 1

[0032] This embodiment is a laser scanning and projection integrated system. Figure 1 As shown, it is composed of an MCU micro-control unit 1, a No. 1 laser 2, a No. 2 laser 3, a dynamic focusing module 4, a laser beam splitting module 5, a two-dimensional galvanometer module 6, a light intensity detection module 7, a distance detection module 8, and a host computer 9.

[0033] The first laser 2 is used as a scanning light source in the laser scanning stage, and the second laser 3 is used as a projection light source in the laser projection stage. The first laser 2 and the second laser 3 are respectively controlled to be turned on or off by the MCU micro-control unit 1;

[0034] In the laser scanning stage, the MCU micro-control unit 1 controls the No. 1 laser 2 to turn on, and the laser scanning beam is dynamically focused by the dynamic focusing module 4 and then emitted to the laser beam splitting module 5. The laser scanning beam transmitted by the laser beam splitting module 5 enters the two-dimensional galvanometer module 6. The two-dimensional galvanometer module 6 performs deflection control of the laser scanning beam under the control of the MCU micro-control unit 1, so that the laser scanning beam moves and scans on the target surface 10. The light intensity detection module 7 transmits the laser beam signal reflected on the target surface to the MCU micro-control unit 1. The laser scanning beam reflected on the target surface is reflected by the laser beam splitting module 5 to the distance detection module 8, and the distance detection module transmits the processed data to the MCU micro-control unit 1. The two-dimensional galvanometer module 6 simultaneously transmits the deflection angle data to the MCU micro-control unit 1.

[0035] In the laser projection stage, the MCU micro-control unit 1 controls the second laser 3 to turn on, and the laser projection light beam is dynamically focused by the dynamic focusing module 4 and then emitted to the laser beam splitting module 5. The light beam transmitted by the laser beam splitting module 5 enters the two-dimensional galvanometer module 6. The two-dimensional galvanometer module 6 is controlled by the MCU micro-control unit 1 to perform swing control on the laser projection light beam, so that the laser projection light beam generates a laser projection pattern 11 on the target surface. At the same time, the light intensity detection module 7 transmits the light intensity signal of the laser light beam reflected on the target surface to the MCU micro-control unit 1. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the laser projection light beam according to the light intensity signal of the light intensity detection module 7, and adjusts the clarity of the laser projection pattern.

[0036] The host computer 9 and the MCU micro-control unit 1 perform bidirectional data transmission.

[0037] In this embodiment, the first laser 2 is used as a scanning light source in the laser scanning stage, and the wavelength is 1064nm.

[0038] In this embodiment, the second laser 3 is used as a projection light source in the laser projection stage, and its wavelength is different from that of the first laser 2, which is 532 nm.

[0039] In this embodiment, the No. 1 laser 2 and the No. 2 laser cannot be turned on at the same time. In the scanning phase, the No. 1 laser 2 is turned on and the No. 2 laser 3 is turned off; in the projection phase, the No. 1 laser 2 is turned off and the No. 2 laser 3 is turned on.

[0040] In this embodiment, the dynamic focusing module 4 is used to focus the laser beam emitted by the No. 1 laser 2 or the No. 2 laser 3, so that the laser scanning beam or the laser projection beam is concentrated on the target surface 10, thereby improving the scanning accuracy during laser scanning and the projection clarity during projection.

[0041] In this embodiment, the laser beam splitting module 5 is used to emit the laser beam emitted by the No. 1 laser 2 or the No. 2 laser 3, and has no effect on the transmitted laser beam. When the system is in the laser scanning stage, the reflected light beam of the receiving target surface can be reflected to the distance detection module 8, so that the system can obtain the distance data during scanning.

[0042] In this embodiment, the two-dimensional galvanometer module 6 is used to realize the deflection control of the laser scanning beam and the laser projection beam. In the laser scanning stage, the laser scanning beam is moved and scanned on the target surface through the swing of the two-dimensional galvanometer, and the deflection angle of the two-dimensional galvanometer is monitored in real time through the angular displacement sensor integrated inside the two-dimensional galvanometer, and the angle data is fed back in real time to the MCU micro-control unit 1; in the laser projection stage, the two-dimensional galvanometer is controlled by the MCU micro-control unit 1 to swing, so that the laser projection beam generates a laser projection pattern on the target surface.

[0043] In this embodiment, the light intensity detection module 7 captures the optical signal of the laser beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU micro-control unit 1 for energy analysis. When the energy signal received by the light intensity detection module 7 is the maximum value, it is determined that the laser beam is precisely focused on the target surface at this time.

[0044] In this embodiment, the distance detection module 8 receives the laser beam reflected by the laser beam splitting module 5 during the laser scanning stage of the system, obtains the distance data of the laser scanning beam, and transmits it to the MCU micro-control unit 1 .

[0045] In this embodiment, the MCU micro-control unit 1 serves as the core control unit of the system, and is responsible for coordinating the operation of laser No. 1 2, laser No. 2 3, dynamic focusing module 4, two-dimensional galvanometer module 6, light intensity detection module 7, and distance detection module 8, ensuring the synchronization of the scanning and projection processes, and performing data transmission with the host computer 9, processing external input instructions, such as the projection image required by the user operation, etc., and executing corresponding control logic. In the scanning process control, the MCU micro-control unit 1 controls the No. 1 laser 2 to turn on and the No. 2 laser 3 to turn off. The MCU micro-control unit 1 receives the two-dimensional galvanometer angle data collected by the two-dimensional galvanometer module 6 and the distance data collected by the distance detection module 8, and obtains the spherical coordinates of the point cloud data of the target surface 10. The MCU micro-control unit 1 is responsible for managing the storage and transmission of the point cloud data, and transmits the collected scanning data to the host computer 9 for further processing; in the projection process control, the MCU micro-control unit 1 controls the No. 1 laser 2 to turn off and the No. 2 laser 3 to turn on. The MCU micro-control unit 1 receives the projection graphic data of the host computer 9 according to the user's needs, extracts the angle data in the spherical coordinates of the point cloud data, and controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing according to the angle data, so that the laser beam is projected according to the preset path, ensuring the accurate projection of the projection graphic.

[0046] In this embodiment, the host computer 9 and the MCU micro-control unit 1 perform bidirectional data transmission. In the laser scanning stage, the host computer 9 receives the spherical coordinates of the point cloud data of the target surface 10 processed by the MCU micro-control unit 1, and converts the spherical coordinates into three-dimensional coordinates. The host computer 9 can convert it into a visualization model and add projection graphics according to user needs; in the laser projection stage, the host computer 9 solves the required projection graphics into three-dimensional point cloud data, and converts the three-dimensional data into spherical coordinates and transmits them to the MCU micro-control unit 1. The MCU micro-control unit 1 extracts the angle data in the spherical coordinates and controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing, so that the laser projection beam projects the projection graphics 11 required by the user on the target surface.

[0047] Example 2

[0048] like Figures 2 to 4 As shown, this embodiment is a control method for a laser scanning and projection integrated system as described in Embodiment 1, comprising:

[0049] Laser scanning stage: the host computer 9 sends a laser scanning instruction to the MCU micro-control unit 1, and the MCU micro-control unit 1 controls the No. 1 laser 2 to turn on and the No. 2 laser 3 to turn off. The No. 1 laser 2 emits a laser scanning beam, and the laser scanning beam moves and scans on the target surface through the swing of the two-dimensional galvanometer; the MCU micro-control unit 1 receives the angle data of the two-dimensional galvanometer collected by the two-dimensional galvanometer module 6 and the distance data collected by the distance detection module 8, and obtains the spherical coordinates p (α, β, d) of each scanning point on the target surface by combining the distance data and the angle data, generates the spherical coordinates of the point cloud data of the target surface for storage, and transmits the point cloud data to the host computer 9 after the scanning is completed. The host computer 9 converts the spherical coordinates of the point cloud data into three-dimensional space coordinates q (x, y, z), and the host computer 9 integrates the scanning points to form a three-dimensional model of the target surface;

[0050] Laser projection stage: the host computer 9 sends a laser projection instruction to the MCU micro-control unit 1, the MCU micro-control unit 1 turns off the No. 1 laser 2, turns on the No. 2 laser 3, and the No. 2 laser 3 emits a laser projection beam; the host computer 9 converts the three-dimensional spatial coordinates of the projection figure to be projected into spherical coordinates, and transmits the spherical coordinates to the MCU micro-control unit 1. The MCU micro-control unit 1 extracts the angle data in the spherical coordinates, and controls the two-dimensional galvanometer of the two-dimensional galvanometer module 6 to swing according to the angle data, so that the laser beam is projected along a preset path.

[0051] In this embodiment, during the laser scanning process, the light intensity detection module 7 captures the energy of the optical signal of the scanning light beam reflected on the target surface, and the light intensity detection module 7 converts the detected optical signal into an electrical signal and transmits it to the MCU micro-control unit 1, so that the MCU micro-control unit 1 can determine whether the laser beam is correctly focused on the target surface. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the scanning light beam emitted by the No. 1 laser 2, and at the same time analyzes the energy signal fed back by the light intensity detection module 7 in real time. When the energy signal fed back by the light intensity detection module 7 is the maximum value, it indicates that the scanning light source emitted by the No. 1 laser 2 is focused on the target surface. At this time, the reflected scanning light beam is reflected to the distance detection module 8 through the laser beam splitting module 5.

[0052] Furthermore, the distance detection module 8 converts the received optical signal into the distance data between the scanning light beam and the target surface, obtains the target distance data d, and transmits it to the MCU micro-control unit 1. The two-dimensional galvanometer module 6 uses the internal integrated angular displacement sensor to obtain the deflection angle data (α, β) of the galvanometer, and transmits the angle data to the MCU micro-control unit 1.

[0053] In this embodiment, during the laser projection stage, the scanning model can be modified in the host computer 9 according to the specific needs of the user, and the projection pattern required by the user on the target surface can be added.

[0054] In this embodiment, during the laser projection stage, the laser projection light beam passes through the laser beam splitting module 5 to obtain the projection pattern required by the user on the target surface. At the same time, the light intensity detection module captures the optical signal of the projection light beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU micro-control unit 1 for energy analysis. The MCU micro-control unit 1 controls the dynamic focusing module 4 to focus the laser projection light beam emitted by the second laser 3, and analyzes the energy signal sent back by the light intensity detection module 7 in real time. When the energy signal reaches the maximum value, the control of the dynamic focusing module 4 is stopped. At this time, the clarity of the laser projection pattern on the target surface is the highest, and the system completes the projection.

[0055] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A laser scanning and projection integrated system, characterized in that: It consists of MCU micro-control unit, No. 1 laser, No. 2 laser, dynamic focusing module, laser beam splitting module, two-dimensional galvanometer module, light intensity detection module, distance detection module and host computer; The laser No. 1 is used as a scanning light source in the laser scanning stage, and the laser No. 2 is used as a projection light source in the laser projection stage. The laser No. 1 and the laser No. 2 are respectively controlled to be turned on or off by the MCU micro-control unit; In the laser scanning stage, the MCU micro-control unit controls the No. 1 laser to turn on, and the laser scanning beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The laser scanning beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module performs deflection control of the laser scanning beam under the control of the MCU micro-control unit, so that the laser scanning beam moves and scans on the target surface. The light intensity detection module transmits the light intensity signal of the laser beam reflected on the target surface to the MCU micro-control unit. The laser scanning beam reflected on the target surface is reflected by the laser beam splitting module to the distance detection module, and the distance detection module transmits the processed data to the MCU micro-control unit. The two-dimensional galvanometer module simultaneously transmits the deflection angle data to the MCU micro-control unit. In the laser projection stage, the MCU micro-control unit controls the second laser to turn on, and the laser projection beam is dynamically focused by the dynamic focusing module and then emitted to the laser beam splitting module. The beam transmitted by the laser beam splitting module enters the two-dimensional galvanometer module. The two-dimensional galvanometer module is controlled by the MCU micro-control unit to swing the laser projection beam, so that the laser projection beam generates a laser projection pattern on the target surface. At the same time, the light intensity detection module transmits the light intensity signal of the laser beam reflected on the target surface to the MCU micro-control unit. The MCU micro-control unit controls the dynamic focusing module to focus the laser projection beam according to the light intensity signal, and adjusts the clarity of the laser projection pattern. The host computer and the MCU micro-control unit perform bidirectional data transmission.

2. The laser scanning and projection integrated system according to claim 1, characterized in that: The No. 1 laser and the No. 2 laser are not turned on at the same time. The No. 1 laser is turned on and the No. 2 laser is turned off during the scanning phase, and the No. 1 laser is turned off and the No. 2 laser is turned on during the projection phase.

3. The laser scanning and projection integrated system according to claim 1, characterized in that: The wavelength of the first laser is different from the wavelength of the second laser.

4. The laser scanning and projection integrated system according to claim 1, characterized in that: The two-dimensional galvanometer module is used to realize the deflection control of the laser scanning beam and the laser projection beam. In the laser scanning stage, the laser scanning beam is moved and scanned on the target surface through the swing of the two-dimensional galvanometer, and the deflection angle of the two-dimensional galvanometer is monitored in real time through the angular displacement sensor integrated inside the two-dimensional galvanometer, and the deflection angle data is fed back and transmitted to the MCU micro-control unit in real time; in the laser projection stage, the two-dimensional galvanometer is controlled by the MCU micro-control unit to swing, so that the laser projection beam generates a laser projection pattern on the target surface.

5. The laser scanning and projection integrated system according to claim 1, characterized in that: The light intensity detection module captures the optical signal of the laser beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU microcontroller unit for light intensity energy analysis. When the energy signal received by the light intensity detection module is the maximum value, it is determined that the laser beam is precisely focused on the target surface at this time.

6. The laser scanning and projection integrated system according to claim 1, characterized in that: During the laser scanning stage, the host computer receives the spherical coordinates of the target surface point cloud data processed by the MCU micro-control unit, converts the spherical coordinates into three-dimensional coordinates, integrates the data into a three-dimensional model of the target surface according to each scanning point, and adds projection graphics according to user needs; during the laser projection stage, the host computer solves the required projection graphics into three-dimensional point cloud data, converts the three-dimensional data into spherical coordinates and transmits them to the MCU micro-control unit. The MCU micro-control unit extracts the angle data in the spherical coordinates, controls the swing of the two-dimensional galvanometer of the two-dimensional galvanometer module, and makes the laser projection beam project the projection graphics required by the user on the target surface.

7. The control method of a laser scanning and projection integrated system according to claim 1, characterized in that: include: Laser scanning stage: The host computer sends a laser scanning instruction to the MCU microcontroller unit. The MCU microcontroller unit controls the No. 1 laser to turn on and the No. 2 laser to turn off. The No. 1 laser emits a laser scanning beam, and the swing of the two-dimensional galvanometer causes the laser scanning beam to move and scan the target surface. The MCU microcontroller unit receives the angle data of the two-dimensional galvanometer collected by the two-dimensional galvanometer module and the distance data collected by the distance detection module, and obtains the spherical coordinates of each scanning point on the target surface by combining the distance data and the angle data. The spherical coordinates of the point cloud data of the target surface are generated and stored. After the scanning is completed, the point cloud data is transmitted to the host computer. The host computer converts the spherical coordinates of the point cloud data into three-dimensional space coordinates. The host computer integrates the scanning points to form a three-dimensional model of the target surface. Laser projection stage: The host computer sends a laser projection instruction to the MCU micro-control unit. The MCU micro-control unit controls the No. 1 laser to turn off and turn on the No. 2 laser. The No. 2 laser emits a laser projection beam. The host computer converts the three-dimensional spatial coordinates of the projection figure to be projected into spherical coordinates, and transmits the spherical coordinates to the MCU micro-control unit. The MCU micro-control unit extracts the angle data in the spherical coordinates, and controls the two-dimensional galvanometer of the two-dimensional galvanometer module to swing according to the angle data, so that the laser beam is projected along the preset path.

8. The control method of the laser scanning and projection integrated system according to claim 7, characterized in that: During the laser scanning stage, the light intensity detection module captures the energy of the optical signal of the scanning light beam reflected on the target surface, and the light intensity detection module converts the detected optical signal into an electrical signal and transmits it to the MCU micro-control unit. The MCU micro-control unit determines whether the laser beam is correctly focused on the target surface, and the MCU micro-control unit controls the dynamic focusing module to focus the scanning light beam emitted by the No. 1 laser, and at the same time analyzes the energy signal fed back by the light intensity detection module in real time. When the energy signal fed back by the light intensity detection module is the maximum value, it indicates that the scanning light source emitted by the No. 1 laser is focused on the target surface. At this time, the reflected scanning light beam is reflected to the distance detection module through the laser beam splitting module.

9. The control method of the laser scanning and projection integrated system according to claim 7, characterized in that: In the laser projection stage, the laser projection beam passes through the laser beam splitting module to obtain the laser projection pattern required by the user on the target surface. At the same time, the light intensity detection module captures the optical signal of the projection beam reflected on the target surface, converts the optical signal into an electrical signal and transmits it to the MCU micro-control unit for energy analysis. The MCU micro-control unit controls the dynamic focusing module to focus the laser projection beam emitted by the second laser, and analyzes the energy signal sent back by the light intensity detection module in real time. When the energy signal reaches the maximum value, the dynamic focusing module is stopped from being controlled.

Images