Method and system for diagnosing electron temperature of strong field side electron cyclotron radiometer

Abstract

The invention discloses an electron temperature diagnosis method and system for a strong field side electron cyclotron radiometer, and particularly relates to the technical field of plasma diagnosis, and the technical key points are as follows: obtaining the chord average electron density of plasmas of different chords in a Tokamak device, and obtaining the electron density space distribution through Abell inversion; extracting a first electron density at the central position of the Tokamak device from the electron density spatial distribution, and extracting a second electron density and an electron density gradient at an uncorrected diagnosis position of each diagnosis channel; obtaining the electron temperature of the plasma measured by each diagnosis channel of the strong field side electron cyclotron radiometer, and calculating the relativistic offset of each diagnosis channel of the strong field side electron cyclotron radiometer; and correcting the corresponding diagnosis channel according to the relativistic offset of each diagnosis channel, and diagnosing the electron temperature of the plasma by using the diagnosis position of each corrected diagnosis channel to obtain an electron temperature diagnosis result.

Description

Technical Field

[0001] The invention relates to the technical field of plasma diagnosis, and in particular to an electron temperature diagnosis method and system of a strong field side electron cyclotron radiometer. Background Art

[0002] In the future operation of fusion power plants based on tokamaks, high plasma pressure is an important way to improve its economic benefits. However, benefits come with risks. Under high plasma pressure, large ruptures caused by magnetic fluid instability may terminate the discharge and damage the safety of the device; therefore, the use of diagnostic monitoring and feedback control of magnetic fluid instability is a necessary development path.

[0003] Electron cyclotron radiometer is a very important tool for monitoring magnetohydrodynamic instabilities in tokamak plasmas. It can provide high spatial and temporal resolution information on electron stability distribution, as well as information on instability perturbation distribution. It is crucial for monitoring and feedback control of magnetohydrodynamic instabilities in high plasma pressures, and its ability to monitor magnetohydrodynamic instabilities has been experimentally verified on several large tokamaks in the world.

[0004] However, in the case of high plasma pressure, the traditional weak-field side electron cyclotron radiometer may have the risk of right-handed cutoff, making it ineffective in the process of monitoring magnetofluid instability. This is mainly because when the plasma density increases, the right-handed cutoff frequency will also increase and exceed the secondary electron cyclotron radiation frequency. The secondary electron cyclotron radiation signal received by the electron cyclotron radiometer is used as a diagnostic signal. When the right-handed cutoff frequency exceeds the secondary electron cyclotron radiation frequency, the secondary electron cyclotron radiation will be reflected by the right-handed cutoff layer, making the electron cyclotron radiometer unable to work properly. When right-handed cutoff occurs and magnetofluid instability occurs, the disturbance signal of the magnetofluid instability cannot be transmitted normally to the electron cyclotron radiometer, so it cannot play the role of monitoring feedback control.

[0005] Therefore, the present invention aims to provide a method and system for diagnosing electron temperature of a strong field side electron cyclotron radiometer to solve the above-mentioned related problems. Summary of the invention

[0006] The technical problem to be solved by the present invention is that the weak field side electron cyclotron radiometer in the prior art may have the risk of right-handed cutoff under high plasma pressure, which causes it to fail in the process of monitoring magnetic fluid instability. The purpose is to provide an electron temperature diagnosis method and system for a strong field side electron cyclotron radiometer, which utilizes the strong field side electron cyclotron radiometer and inputs the acquired diagnostic data into the strong field side electron cyclotron radiometer calibration rate calculation function to calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer, corrects the diagnostic position of the strong field side electron cyclotron radiometer, and finally obtains the electron temperature and disturbance distribution of the strong field side, thereby utilizing the characteristic that the strong field side secondary cyclotron radiation is not easily cut off by right-handed cutoff under high plasma pressure, and using the strong field side electron cyclotron radiometer for diagnosis to solve the failure problem faced by traditional weak field side electron cyclotron radiometers under high plasma pressure.

[0007] The present invention is achieved through the following technical solutions:

[0008] A method for diagnosing electron temperature of a strong field side electron cyclotron radiometer, the method comprising:

[0009] Obtaining a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculating an uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter;

[0010] Obtaining the string average electron density of plasmas of different strings in the tokamak device, and using Abel inversion to obtain the electron density spatial distribution, and then extracting the first electron density at the center of the tokamak device from the electron density spatial distribution, and extracting the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel;

[0011] The electron temperature of the plasma measured by each diagnostic channel of the electron cyclotron radiometer on the strong field side is obtained, and the relativistic offset of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated by using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient;

[0012] The corresponding diagnostic channels are corrected respectively by the relativistic offset of each diagnostic channel, and then the electron temperature of the plasma is diagnosed using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result.

[0013] Furthermore, the first parameters of the tokamak device include the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameters of the strong field side electron cyclotron radiometer include the electron charge number, the electron mass and the measurement frequency of the diagnostic channel.

[0014] Furthermore, the uncorrected diagnostic position of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated using the first parameter and the second parameter, specifically:

[0015]

[0016] Among them, R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel; e represents the electron charge number; R0 represents the radius of the tokamak device; B T0 Indicates the toroidal magnetic field strength at the center of the tokamak device; m e represents the mass of the electron; f i Indicates the measurement frequency of the i-th diagnostic channel.

[0017] Furthermore, the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer is calculated using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient, specifically:

[0018] The first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient are input into the pre-constructed strong field electron cyclotron radiometer calibration rate calculation function to calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer. The pre-constructed strong field electron cyclotron radiometer calibration rate calculation function is specifically:

[0019]

[0020] Among them, D i represents the relativistic offset of the i-th diagnostic channel; α=6.065×10 -3 ×R0-6.062×10 -2 , R0 represents the radius of the tokamak device; a HL-3 represents a constant, a HL-3 =1.626;Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; ne i, Uncorrected represents the second electron density of the uncorrected diagnostic position of the i-th diagnostic channel; G i, Uncorrected represents the electron density gradient of the uncorrected diagnostic position of the ith diagnostic channel;

[0021] S ne0 represents the intermediate quantity, ne0 represents the first electron density at the center of the tokamak device;

[0022]

[0023] S BT0 Indicates the intermediate quantity, B T0Represents the toroidal magnetic field strength at the center of the tokamak device.

[0024] Furthermore, the corresponding diagnostic channels are corrected respectively by the relativistic offset of each diagnostic channel, and then the electron temperature of the plasma is diagnosed using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result, which is specifically:

[0025] Te(R i,修正后 ,Te i )=Te(R i,未修正 -D i ,Te i )

[0026] Where Te(·) represents the electron temperature distribution; R i,修正后 represents the corrected diagnostic position of the i-th diagnostic channel; Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel; D i Represents the relativistic offset of the ith diagnostic channel.

[0027] The present invention also provides a strong field side electron cyclotron radiometer electron temperature diagnosis system, which is used in any one of the above-mentioned strong field side electron cyclotron radiometer electron temperature diagnosis methods, and the system includes:

[0028] The first module is used to obtain a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculate the uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter;

[0029] The second module is used to obtain the string average electron density of plasmas of different strings in the tokamak device, and use Abel inversion to obtain the electron density spatial distribution, and then extract the first electron density at the center of the tokamak device from the electron density spatial distribution, and extract the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel;

[0030] The third module is used to obtain the electron temperature of the plasma measured by each diagnostic channel of the strong field side electron cyclotron radiometer, and calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient;

[0031] The fourth module is used to correct the corresponding diagnostic channels respectively according to the relativistic offset of each diagnostic channel, and then diagnose the electron temperature of the plasma using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result.

[0032] Furthermore, the first parameters of the tokamak device include the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameters of the strong field side electron cyclotron radiometer include the electron charge number, the electron mass and the measurement frequency of the diagnostic channel.

[0033] The present invention also provides a computer device, comprising a system memory and a processor, wherein the system memory stores a computer program, and the processor implements the steps of any one of the above-mentioned methods when executing the computer program.

[0034] The present invention also provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of any one of the methods described above are implemented.

[0035] The present invention also provides a computer program product comprising instructions, and when the instructions are executed by a computer device cluster, the computer device cluster executes any of the above methods.

[0036] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0037] In the present invention, a strong field side electron cyclotron radiometer is used, and the acquired diagnostic data is input into the calibration rate calculation function of the strong field side electron cyclotron radiometer, the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer is calculated, the diagnostic position of the strong field side electron cyclotron radiometer is corrected, and finally the electron temperature and disturbance distribution of the strong field side are obtained, thereby utilizing the characteristic that the secondary cyclotron radiation of the strong field side is not easily cut off by right-handed rotation under high plasma pressure, and using the strong field side electron cyclotron radiometer for diagnosis, so as to solve the failure problem faced by traditional weak field side electron cyclotron radiometers under high plasma pressure. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions of the exemplary embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and should not be regarded as limiting the scope. For those of ordinary skill in the art, other relevant drawings can be obtained based on these drawings without creative work. In the drawings:

[0039] Figure 1 This is a schematic diagram of a method flow of a strong field side electron cyclotron radiometer electron temperature diagnosis method in this embodiment;

[0040] Figure 2 This is an example simulation schematic diagram given in a method for diagnosing electron temperature of a strong field side electron cyclotron radiometer in this embodiment;

[0041] Figure 3 This is a schematic diagram of system module connections of a strong field side electron cyclotron radiometer electron temperature diagnostic system in this embodiment;

[0042] Figure 4 It is a structural schematic diagram of a computer device in this embodiment. DETAILED DESCRIPTION

[0043] The following is a description of exemplary embodiments of the present disclosure in conjunction with the accompanying drawings, including various details of the embodiments of the present disclosure to facilitate understanding, which should be considered as merely exemplary. Therefore, it should be recognized by those of ordinary skill in the art that various changes and modifications may be made to the embodiments described herein without departing from the scope of the present disclosure. Similarly, for the sake of clarity and conciseness, the description of well-known functions and structures is omitted in the following description.

[0044] In the present disclosure, unless otherwise specified, the use of the terms "first", "second", etc. to describe various elements is not intended to limit the positional relationship, timing relationship, or importance relationship of these elements, and such terms are only used to distinguish one element from another element. In some examples, the first element and the second element may refer to the same instance of the element, and in some cases, based on the description of the context, they may also refer to different instances.

[0045] The terms used in the description of various examples in this disclosure are only for the purpose of describing specific examples and are not intended to be limiting. Unless the context clearly indicates otherwise, if the number of elements is not specifically limited, the element can be one or more. In addition, the term "and / or" used in this disclosure covers any one of the listed items and all possible combinations.

[0046] Example 1

[0047] See also Figure 1 As shown, this embodiment provides a method for diagnosing electron temperature of a strong field side electron cyclotron radiometer, the method comprising:

[0048] S1: obtaining a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculating an uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter;

[0049] It should be noted that the strong field side electron cyclotron radiometer is specifically a multi-channel strong field side electron cyclotron radiometer. The diagnostic channel of the strong field side electron cyclotron radiometer is used to measure the electronic parameters of the plasma. The diagnostic position of the diagnostic channel refers to the measurement area corresponding to the diagnostic channel in the plasma. The technical content is common knowledge in the field and will not be elaborated here.

[0050] Specifically, in this embodiment, the first parameter of the tokamak device includes the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameter of the strong field side electron cyclotron radiometer includes the electron charge number, the electron mass and the measurement frequency of the diagnostic channel;

[0051] First, the toroidal magnetic field strength B at the center of the tokamak device is measured by the magnetic field coil. T0 , and then use the radius R0 of the tokamak device and the toroidal magnetic field strength B at the center of the tokamak device T0 , combined with the electron charge number e and the electron mass m e and the measurement frequency f for each diagnostic channel i , the uncorrected diagnostic position of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated, specifically:

[0052]

[0053] Among them, R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel, in cm; e represents the electron charge; R0 represents the radius of the tokamak device; B T0 Indicates the toroidal magnetic field strength at the center of the tokamak device; m e Indicates the mass of the electron in kg; f i Indicates the measurement frequency of the ith diagnostic channel in GHz.

[0054] S2: Obtain the string average electron density of plasmas of different strings in the tokamak device, and use Abel inversion to obtain the electron density spatial distribution, then extract the first electron density at the center of the tokamak device from the electron density spatial distribution, and extract the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel;

[0055] It should be noted that, in this embodiment, different chords represent different horizontal heights of the plasma. This technical content is common knowledge in the art and will not be elaborated on here. At the same time, using Abel inversion to obtain the spatial distribution of electron density is also a conventional technical means in the art and will not be elaborated on here.

[0056] Specifically, in this embodiment, a multi-channel laser interferometer is used to measure the average electron density of plasmas of different strings in the tokamak device, and then the electron density spatial distribution ne is obtained by Abel inversion. Then, the first electron density ne0 at the center of the tokamak device is extracted from the electron density spatial distribution, and the second electron density ne of the uncorrected diagnostic position of each diagnostic channel is extracted. i,未修正 With the electron density gradient G i,未修正 .

[0057] S3: obtaining the electron temperature of the plasma measured by each diagnostic channel of the electron cyclotron radiometer on the strong field side, and calculating the relativistic offset of each diagnostic channel of the electron cyclotron radiometer on the strong field side using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient;

[0058] Specifically, in this embodiment, the electron temperature Te of the plasma measured by each diagnostic channel can be obtained by the strong field electron cyclotron radiometer itself. i , the electron temperature Te of the plasma measured by each diagnostic channel i , the second electron density ne of the uncorrected diagnostic position of each diagnostic channel i,未修正 , the electron density gradient G at the uncorrected diagnostic position of each diagnostic channel i,未修正 , the radius R0 of the tokamak device and the first electron density ne0 at the center of the tokamak device are input into the calibration rate calculation function of the constructed strong field electron cyclotron radiometer to calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer, specifically:

[0059]

[0060] Among them, D i represents the relativistic offset of the i-th diagnostic channel; α=6.065×10 -3 ×R0-6.062×10 -2 , R0 represents the radius of the tokamak device; a HL-3 represents a constant, a HL-3 =1.626;Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; ne i, Uncorrected represents the second electron density of the uncorrected diagnostic position of the i-th diagnostic channel; G i, Uncorrected represents the electron density gradient of the uncorrected diagnostic position of the ith diagnostic channel;

[0061] S ne0 represents the intermediate quantity, ne0 represents the first electron density at the center of the tokamak device;

[0062]

[0063] S BT0 Indicates the intermediate quantity, B T0 Represents the toroidal magnetic field strength at the center of the tokamak device.

[0064] S4: Correct the corresponding diagnostic channels respectively by the relativistic offset of each diagnostic channel, and then diagnose the electron temperature of the plasma using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result, which is specifically:

[0065] Te(R i,修正后 ,Te i )=Te(R i,未修正 -D i ,Te i )

[0066] Where Te(·) represents the electron temperature distribution; R i,修正后 represents the corrected diagnostic position of the i-th diagnostic channel; Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel; D i Represents the relativistic offset of the ith diagnostic channel.

[0067] It should be noted that, in this embodiment, the electron temperature diagnosis result is the electron temperature distribution of the plasma measured at the corrected diagnosis position of each diagnosis channel.

[0068] Specifically, in the present embodiment, a strong field side electron cyclotron radiometer is used, and the acquired diagnostic data is input into the calibration rate calculation function of the strong field side electron cyclotron radiometer, the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer is calculated, and the diagnostic position of the strong field side electron cyclotron radiometer is corrected, and finally the electron temperature and disturbance distribution on the strong field side are obtained, thereby utilizing the characteristic that the secondary cyclotron radiation on the strong field side is not easily cut off by right-handed rotation under high plasma pressure, and using the strong field side electron cyclotron radiometer for diagnosis, thereby solving the failure problem faced by traditional weak field side electron cyclotron radiometers under high plasma pressure.

[0069] At the same time, this embodiment also gives an example, see Figure 2 , Figure 2 The assumed plasma electron temperature and electron density profile are shown, with a plasma radius of R0 = 620 cm and ne0 = 7 × 10 19 m -3 , B T0 =1.8T; Assume that the measurement frequencies of the 14-channel high-field side electron cyclotron radiometer are f i =103GHz:3GHz:142GHz, therefore, the uncorrected diagnostic positions of the 14 diagnostic channels of the electron cyclotron radiometer on the strong field side are calculated, specifically:

[0070]

[0071] Uncorrected diagnostic position R according to 14 diagnostic channels i,未修正 It can be assumed that the multi-channel laser interferometer measures the string-averaged electron density of plasmas of different strings in the tokamak device, and then uses Abel inversion to obtain the electron density spatial distribution ne, and extracts the uncorrected second electron density ne of the diagnostic position of the 14 diagnostic channels i,未修正 =[6.8 6.5 6.3 6.0 5.8 5.6 5.4 5.2 5.0 4.8 4.7 4.5 4.4 4.2]×10 19 m -3 , and the electron density gradient G at the uncorrected diagnostic positions of the 14 diagnostic channels i,未修正 =0.0064×10 19 m -3 / cm. The electron temperature of the plasma measured by the 14 diagnostic channels of the electron cyclotron radiometer on the strong field side is:

[0072] Te i =[1.02 1.17 1.32 1.47 1.61 1.76 1.90 2.04 2.18 2.32 2.46 2.602.73 2.85]keV, the electron temperature profile measured by the uncorrected high-field side electron cyclotron radiometer is as follows: Figure 2 As shown in the black circle in the middle, it is quite different from the background electron temperature profile.

[0073] Then, the data is substituted into the calibration rate calculation function of the strong field electron cyclotron radiometer to calculate the relativistic offset of the 14 diagnostic channels of the strong field side electron cyclotron radiometer, specifically:

[0074] D i =[5.66 7.08 8.60 9.40 10.1 12.0 13.8 15.7 18.6 21.0 24.5 28.0 32.537.1]cm; after relative

[0075] Regarding the offset correction, we can get Figure 2 It can be seen that after the calibration rate calculation and diagnostic position correction, the diagnostic electron temperature profile of the electron cyclotron radiometer on the strong field side is as follows: Figure 2 As shown in the red circle in the middle, it is in good agreement with the background electron temperature profile, indicating that the strong field side electron cyclotron radiometer corrected by the method of the present invention can be effectively used in the measurement of the strong field side electron temperature profile.

[0076] Example 2

[0077] See also Figure 3As shown, the present invention also provides a strong field side electron cyclotron radiometer electron temperature diagnosis system, which is used in any one of the above-mentioned strong field side electron cyclotron radiometer electron temperature diagnosis methods, and the system includes:

[0078] The first module 100 is used to obtain a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculate the uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter;

[0079] The second module 200 is used to obtain the string average electron density of plasmas of different strings in the tokamak device, and obtain the electron density spatial distribution by using Abel inversion, and then extract the first electron density at the center position of the tokamak device from the electron density spatial distribution, and extract the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel;

[0080] The third module 300 is used to obtain the electron temperature of the plasma measured by each diagnostic channel of the strong field side electron cyclotron radiometer, and calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient;

[0081] The fourth module 400 is used to correct the corresponding diagnostic channels respectively according to the relativistic offset of each diagnostic channel, and then diagnose the electron temperature of the plasma using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result.

[0082] Furthermore, the first parameters of the tokamak device include the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameters of the strong field side electron cyclotron radiometer include the electron charge number, the electron mass and the measurement frequency of the diagnostic channel.

[0083] It should be noted that the modules in the system of Example 2 correspond to the steps in the method of Example 1. The steps in the method of Example 1 have been described in detail in Example 1. In this Example 2, the contents of the modules in the system will not be described in detail.

[0084] Example 3

[0085] See also Figure 4 As shown, this embodiment further provides a computer device, including a system memory 1005 and a processor 1001, wherein the system memory 1005 stores a computer program, and the processor 1001 implements the steps of any of the above methods when executing the computer program.

[0086] It should be noted that the processor 1001 is used to execute the steps in the above method embodiments according to the instructions in the program code. Alternatively, the processor 1001 implements the functions of each module / unit in the above system / device embodiments when executing the computer program.

[0087] Specifically, in this embodiment, the computer program may be divided into one or more modules / units, one or more modules / units are stored in the system memory 1005, and are executed by the processor 1001 to complete the present application. One or more modules / units may be a series of computer program instruction segments that can complete specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0088] The terminal device may be a computing device such as a desktop computer, a notebook, a PDA, a cloud server, etc. The terminal device may include, but is not limited to, a processor 1001 and a system memory 1005. Those skilled in the art will appreciate that this does not constitute a limitation on the terminal device, and may include more or less components than shown in the figure, or combine certain components, or different components. For example, the terminal device may also include an input / output device 1003, a network access device 1002, a bus 1006, etc.

[0089] The processor 1001 may be a central processing unit (CPU), or other general-purpose processors 1001, digital signal processors 1001 (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor 1001 may be a microprocessor or any conventional processor, etc.

[0090] The system memory 1005 may be an internal storage unit of the terminal device, such as a hard disk or memory of the terminal device. The system memory 1005 may also be a storage device 1004 of the terminal device, such as a plug-in hard disk, a smart memory card (SmartMedia Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (FlashCard), etc. equipped on the terminal device. Further, the system memory 1005 may also include both the internal storage unit of the terminal device and the storage device 1004. The system memory 1005 is used to store computer programs and other programs and data required by the terminal device. The system memory 1005 may also be used to temporarily store data that has been output or is to be output.

[0091] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, systems and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0092] Example 4

[0093] This embodiment provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of any one of the above methods are implemented.

[0094] Among them, the computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared or semiconductor system, system or device, or any combination of the above. More specific examples of computer-readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable computer disk, a hard disk. Random Access Memory (RAM), Read-Only Memory (ROM), Erasable Programmable Read Only Memory (EPROM), registers, hard disks, optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the above, or any other form of computer-readable storage medium known in the art.

[0095] An exemplary storage medium is coupled to a processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an application-specific integrated circuit (ASIC). In an embodiment of the present invention, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, system, or device.

[0096] Example 5

[0097] This embodiment also provides a computer program product including instructions. When the instructions are executed by a computer device cluster, the computer device cluster executes the method described in Embodiment 1.

[0098] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A method for diagnosing electron temperature of a strong field side electron cyclotron radiometer, characterized in that: Methods include: Obtaining a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculating an uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter; Obtaining the string average electron density of plasmas of different strings in the tokamak device, and using Abel inversion to obtain the electron density spatial distribution, and then extracting the first electron density at the center of the tokamak device from the electron density spatial distribution, and extracting the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel; The electron temperature of the plasma measured by each diagnostic channel of the electron cyclotron radiometer on the strong field side is obtained, and the relativistic offset of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated by using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient; The corresponding diagnostic channels are corrected respectively by the relativistic offset of each diagnostic channel, and then the electron temperature of the plasma is diagnosed using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result.

2. The electron temperature diagnosis method of a strong field side electron cyclotron radiometer according to claim 1 is characterized in that: The first parameters of the tokamak device include the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameters of the strong field side electron cyclotron radiometer include the electron charge number, the electron mass and the measurement frequency of the diagnostic channel.

3. The electron temperature diagnosis method of a strong field side electron cyclotron radiometer according to claim 1, characterized in that: The uncorrected diagnostic position of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated using the first parameter and the second parameter, specifically: Among them, R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel; e represents the electron charge number; R0 represents the radius of the tokamak device; B T0 Represents the toroidal magnetic field strength at the center of the tokamak device; m e represents the mass of the electron; f i Indicates the measurement frequency of the i-th diagnostic channel.

4. The electron temperature diagnosis method of a strong field side electron cyclotron radiometer according to claim 1, characterized in that: The relativistic offset of each diagnostic channel of the electron cyclotron radiometer on the strong field side is calculated using the first parameter, electron temperature, first electron density, second electron density and electron density gradient, specifically: The first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient are input into the pre-constructed strong field electron cyclotron radiometer calibration rate calculation function to calculate the relativistic offset of each diagnostic channel of the strong field side electron cyclotron radiometer. The pre-constructed strong field electron cyclotron radiometer calibration rate calculation function is specifically: Among them, D i represents the relativistic offset of the i-th diagnostic channel; α=6.065×10 -3 ×R0-6.062×10 -2 , R0 represents the radius of the tokamak device; a HL-3 represents a constant, a HL-3 =1.626;Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; ne i,未修正 G represents the second electron density of the uncorrected diagnostic position of the i-th diagnostic channel; i,未修正 represents the electron density gradient of the uncorrected diagnostic position of the ith diagnostic channel; S ne0 represents the intermediate quantity, ne0 represents the first electron density at the center of the tokamak device; S BT0 Indicates the intermediate quantity, B T0 Represents the toroidal magnetic field strength at the center of the tokamak device.

5. The electron temperature diagnosis method of a strong field side electron cyclotron radiometer according to claim 1, characterized in that: The corresponding diagnostic channels are corrected by the relativistic offset of each diagnostic channel, and then the electron temperature of the plasma is diagnosed using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result, which is specifically: Te(R i,修正后 You i )=Te(R i,未修正 d i You i ) Where Te(·) represents the electron temperature distribution; R i,修正后 represents the corrected diagnostic position of the i-th diagnostic channel; Te i represents the electron temperature of the plasma measured by the i-th diagnostic channel; R i,未修正 represents the uncorrected diagnostic position of the ith diagnostic channel; D i Represents the relativistic offset of the ith diagnostic channel.

6. A strong field side electron cyclotron radiometer electron temperature diagnostic system, characterized in that: The system is used in a strong field side electron cyclotron radiometer electron temperature diagnosis method as described in any one of claims 1 to 5, and the system comprises: The first module is used to obtain a first parameter of the tokamak device and a second parameter of the strong field side electron cyclotron radiometer, and calculate the uncorrected diagnostic position of each diagnostic channel of the strong field side electron cyclotron radiometer using the first parameter and the second parameter; The second module is used to obtain the string average electron density of plasmas of different strings in the tokamak device, and use Abel inversion to obtain the electron density spatial distribution, and then extract the first electron density at the center of the tokamak device from the electron density spatial distribution, and extract the uncorrected second electron density and electron density gradient at the diagnostic position of each diagnostic channel; The third module is used to obtain the electron temperature of the plasma measured by each diagnostic channel of the electron cyclotron radiometer on the strong field side, and calculate the relativistic offset of each diagnostic channel of the electron cyclotron radiometer on the strong field side using the first parameter, the electron temperature, the first electron density, the second electron density and the electron density gradient; The fourth module is used to correct the corresponding diagnostic channels respectively according to the relativistic offset of each diagnostic channel, and then diagnose the electron temperature of the plasma using the diagnostic position of each corrected diagnostic channel to obtain the electron temperature diagnosis result.

7. The strong field side electron cyclotron radiometer electron temperature diagnostic system according to claim 6, characterized in that: The first parameters of the tokamak device include the radius of the tokamak device and the toroidal magnetic field strength at the center of the tokamak device; the second parameters of the strong field side electron cyclotron radiometer include the electron charge number, the electron mass and the measurement frequency of the diagnostic channel.

8. A computer device comprising a system memory and a processor, wherein the system memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 5 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 5 are implemented.

10. A computer program product comprising instructions, characterized in that When the instructions are executed by a computer device cluster, the computer device cluster executes the method according to any one of claims 1 to 5.

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