An active testing method and system for a circuit breaker

Abstract

The present invention relates to the technical field of data analysis, and particularly relates to an active test method and system for a circuit breaker. The method includes: obtaining the peak voltage of the circuit breaker and circuit breaker test data; determining a fluctuation data group at each moment; determining data-related indicators according to the distribution of the fluctuation data group; determining a circuit breaker test fluctuation indicator according to the data-related indicators and the fluctuation data group; determining a fluctuation trend indicator by combining temporally adjacent data fluctuations; determining the degree of abnormality according to the peak voltage and the fluctuation trend indicators of all circuit breaker test data, and performing a fault test on the circuit breaker according to the degree of abnormality at all moments to obtain a test result. The present invention can effectively analyze the fluctuations in circuit breaker test data caused by changes in the peak voltage, and determine the accurate degree of abnormality at each moment in combination with the analysis results, improving the reliability and accuracy of the fault test on the circuit breaker and optimizing the test result.

Description

Technical Field

[0001] The present invention relates to the technical field of data analysis, and particularly relates to an active testing method and system for a circuit breaker. Background Art

[0002] The purpose of active testing of a circuit breaker is to perceive the state of the circuit breaker in an automated manner when the circuit breaker fails to work properly and is in a certain uncertain fault, and to analyze and report the output according to the test results to ensure the safety and accuracy of the circuit breaker test.

[0003] The active testing of a circuit breaker usually uses professional testing equipment, such as a multi-functional tester, a large current injection tester, a circuit breaker mechanical life test bench, etc. By analyzing the various data obtained from the test, the fault condition of the circuit breaker can be determined. During the test, since the peak voltage will fluctuate when the circuit breaker is in the energized state, and the fluctuating peak voltage will affect the test data during the test, causing corresponding changes in the test data itself. Therefore, analyzing only based on the various data obtained from the test will result in poor reliability and accuracy of the active fault test of the circuit breaker. Summary of the Invention

[0004] In order to solve the technical problem that the peak voltage of the circuit breaker fluctuates in the energized state, and the fluctuation affects the credibility of the test data, and analyzing only based on the various data obtained from the test, resulting in poor reliability and accuracy of the fault test of the circuit breaker, the present invention provides an active testing method and system for a circuit breaker. The specific technical solutions adopted are as follows:

[0005] The present invention proposes an active testing method for a circuit breaker, and the method includes:

[0006] Obtain the peak voltage of the circuit breaker and at least two types of circuit breaker test data at different times; optionally select one type of circuit breaker test data as the data to be tested, and determine the fluctuation data group at each time according to the data values of the peak voltage and the data to be tested at each time;

[0007] According to the distribution of the fluctuation data groups at all times, determine the data-related index at each time; optionally select one time as the time to be tested, and other times as the comparison times, and determine the data fluctuation coefficient of the time to be tested according to the data-related index of the time to be tested and the fluctuation data groups of the time to be tested and all the comparison times;

[0008] According to the data fluctuation coefficients at all times, determine the circuit breaker test fluctuation index; according to the fluctuation data groups of the preset number of other times closest to the time to be tested and the circuit breaker test fluctuation index, determine the fluctuation trend index of the time to be tested;

[0009] Determine the abnormality degree of the to-be-tested moment according to the correlation between the peak voltage at the to-be-tested moment and the fluctuation trend index of all circuit breaker test data, and perform a fault test on the circuit breaker according to the abnormality degree of all moments to obtain a test result.

[0010] Further, determining the fluctuation data group at each moment according to the peak voltage and the data value of the to-be-tested data at each moment includes:

[0011] Construct a two-dimensional coordinate system with the peak voltage as the abscissa and the to-be-tested data as the ordinate, determine the coordinate points of the corresponding data at each moment in the two-dimensional coordinate system, and use the coordinate values corresponding to the coordinate points as the fluctuation data group at each moment.

[0012] Further, determining the data correlation index at each moment according to the distribution of the fluctuation data groups at all moments includes:

[0013] Perform density analysis on the coordinate points corresponding to the fluctuation data groups at all moments in the two-dimensional coordinate system, and determine the center point with the maximum density as the reference point;

[0014] Normalize the Euclidean distance between the coordinate point corresponding to each moment and the reference point to obtain the data correlation index at each moment.

[0015] Further, determining the data fluctuation coefficient of the to-be-tested moment according to the data correlation index of the to-be-tested moment and the fluctuation data groups of the to-be-tested moment and all the comparison moments includes:

[0016] Calculate the mean value of the fluctuation data groups at all the comparison moments on each coordinate axis to obtain the mean coordinate;

[0017] Take the Euclidean distance between the coordinate corresponding to the fluctuation data group of the to-be-tested moment and the mean coordinate as the initial fluctuation coefficient;

[0018] Calculate the normalized value of the product of the data correlation index and the initial fluctuation coefficient to obtain the data fluctuation coefficient of the to-be-tested moment.

[0019] Further, determining the circuit breaker test fluctuation index according to the data fluctuation coefficients of all moments includes:

[0020] Calculate the mean value of the data fluctuation coefficients of all moments as the circuit breaker test fluctuation index.

[0021] Further, determining the fluctuation trend index of the to-be-tested moment according to the fluctuation data groups of a preset number of other moments closest to the to-be-tested moment and the circuit breaker test fluctuation index includes:

[0022] Take the nearest preset number of other moments to the moment to be measured as neighborhood moments;

[0023] Based on the arctangent function, calculate the function values of the coordinate points corresponding to the moment to be measured and each neighborhood moment respectively, where the function value of the coordinate point corresponding to the moment to be measured is the to-be-measured fluctuation index, and the function value of the coordinate point corresponding to the neighborhood moment is the neighborhood fluctuation index;

[0024] Calculate the absolute value of the difference between the to-be-measured fluctuation index and the neighborhood fluctuation index to obtain the neighborhood fluctuation difference;

[0025] Normalize the mean value of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient of the moment to be measured;

[0026] Determine the fluctuation trend index of the moment to be measured according to the circuit breaker test fluctuation index and the fluctuation difference coefficient of the moment to be measured.

[0027] Furthermore, the circuit breaker test fluctuation index has a positive correlation with the fluctuation trend index of the moment to be measured, the fluctuation difference coefficient of the moment to be measured has a positive correlation with the fluctuation trend index of the moment to be measured, and the value range of the fluctuation trend index of the moment to be measured is the normalized range.

[0028] Furthermore, determining the abnormality degree of the moment to be measured according to the correlation between the peak voltage at the moment to be measured and the fluctuation trend indexes of all circuit breaker test data includes:

[0029] Calculate the variances of the peak voltage at the moment to be measured and the fluctuation trend indexes of all circuit breaker test data respectively to obtain the fluctuation trend dispersion degree;

[0030] Calculate the means of the peak voltage at the moment to be measured and the fluctuation trend indexes of all circuit breaker test data respectively to obtain the fluctuation trend average coefficient;

[0031] Take the normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient as the abnormality degree of the moment to be measured.

[0032] Furthermore, performing a fault test on the circuit breaker according to the abnormality degrees of all moments to obtain a test result includes:

[0033] Take the moments with the abnormality degree values greater than the preset abnormality threshold as target moments;

[0034] Calculate the ratio of the number of target moments to the number of all moments to obtain the fault degree, and take the fault degree as the test result.

[0035] The present invention also provides an active testing system for a circuit breaker. The system includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of an active testing method for a circuit breaker as described above are implemented.

[0036] The present invention has the following beneficial effects:

[0037] The present invention obtains the peak voltage of the circuit breaker and the circuit breaker test data; determines the fluctuation data group; determines the data correlation index according to the distribution of the fluctuation data groups at all times; since there is a correlation between the peak voltage of the circuit breaker and the circuit breaker test data, thus, the present invention determines the data correlation index, and then analyzes the correlation, combines the data correlation index to determine the data fluctuation coefficient at the moment to be measured; the data fluctuation coefficient characterizes the eigenvalue of data fluctuation, and the fluctuation condition of the circuit breaker itself, that is, the circuit breaker test fluctuation index, can be determined according to the data fluctuation coefficients at all times; then, since data fluctuations affect each other in adjacent time periods, thus, the present invention determines the fluctuation trend index at the moment to be measured according to the fluctuation data groups at other times adjacent in time sequence and the circuit breaker test fluctuation index; after that, combined with different types of circuit breaker test data, the degree of abnormality at each moment is analyzed to determine the degree of abnormality at the moment to be measured, and the circuit breaker is subjected to a fault test according to the degree of abnormality at all times to obtain a test result. In summary, the present invention can effectively analyze the circuit breaker test fluctuations caused by changes in the peak voltage, and determine the accurate degree of abnormality at each moment in combination with the analysis results, improving the reliability and accuracy of the fault test for the circuit breaker and optimizing the test result. Description of the Drawings

[0038] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0039] Figure 1 It is a flowchart of an active testing method for a circuit breaker provided by an embodiment of the present invention. Detailed Embodiments

[0040] In order to further elaborate on the technical means and effects adopted by the present invention to achieve the intended invention purpose, the following specifically describes, with reference to the accompanying drawings and preferred embodiments, a method and system for active testing of a circuit breaker according to the present invention, including its specific implementation manner, structure, features, and effects. In the following description, different "one embodiment" or "another embodiment" do not necessarily refer to the same embodiment. In addition, the specific features, structures, or characteristics in one or more embodiments can be combined in any suitable form.

[0041] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs.

[0042] The following specifically describes, with reference to the accompanying drawings, the specific solution of a method for active testing of a circuit breaker provided by the present invention.

[0043] Please refer to Figure 1 , which shows a flowchart of a method for active testing of a circuit breaker provided by an embodiment of the present invention. The method includes:

[0044] S101: Obtain the peak voltage of the circuit breaker and at least two types of circuit breaker test data at different times; select any one of the circuit breaker test data as the data to be tested, and determine the fluctuation data group at each time according to the data values of the peak voltage and the data to be tested at each time.

[0045] A specific implementation scenario of the present invention includes: when the circuit breaker cannot work properly, actively perform a fault test on the circuit breaker. Here, a fault usually refers to a problem with the components or circuits on the circuit breaker, resulting in the circuit breaker being unable to work properly or its performance deteriorating. Active testing usually means that the test system actively detects and diagnoses the circuit breaker. This type of testing usually uses professional test equipment and software, such as oscilloscopes, multifunctional testers, etc. It should be noted that since the circuit breaker may still be running during the fault test, there will be a corresponding peak voltage during its operation. The load corresponding to the circuit breaker at different times will be different, resulting in possible fluctuations in the peak voltage. As a result, both the applied peak voltage and the circuit breaker test data at different times will change, making the accuracy and reliability of circuit breaker testing based on a unified fault standard insufficient.

[0046] Therefore, the present invention can periodically obtain the peak voltage of the circuit breaker and at least two types of circuit breaker test data at different times when performing a fault test on the circuit breaker. Among them, the circuit breaker test data can specifically be, for example, data such as the signal amplitude generated by the oscilloscope and the voltage value at the circuit breaker test point. The present invention can obtain the peak voltage and the circuit breaker test data once every 0.01 seconds. Among them, the acquisition period of the circuit breaker test data can also be adjusted according to actual detection requirements, and no limitation is imposed on this.

[0047] Further, in some embodiments of the present invention, according to the peak voltage and the data value of the data to be measured at each moment, a fluctuation data group at each moment is determined, including: constructing a two-dimensional coordinate system with the peak voltage as the abscissa and the data to be measured as the ordinate, determining the coordinate points of the corresponding data at each moment in the two-dimensional coordinate system, and taking the coordinate values corresponding to the coordinate points as the fluctuation data group at each moment.

[0048] Among them, constructing a two-dimensional coordinate system with the peak voltage as the abscissa and the data to be measured as the ordinate means that the peak voltage and the data to be measured are respectively used as the abscissa and ordinate, so as to realize the relationship analysis between the peak voltage and the data to be measured. For example, when the peak voltage at a certain moment is 0.5 volts and the value of the data to be measured is 2, the coordinate value of the corresponding coordinate point is (0.5, 2). Then, the present invention takes (0.5, 2) as the fluctuation data group. Thus, by determining the coordinate points at each moment and counting them all in the two-dimensional coordinate system, the corresponding relationship between the peak voltage and the data to be measured, as well as the numerical distribution characteristics under normal conditions, can be obtained.

[0049] S102: Determine the data-related index at each moment according to the distribution of the fluctuation data groups at all moments; select any moment as the moment to be measured, and other moments as the comparison moments. According to the data-related index of the moment to be measured and the fluctuation data groups of the moment to be measured and all comparison moments, determine the data fluctuation coefficient of the moment to be measured.

[0050] Further, in some embodiments of the present invention, determining the data-related index at each moment according to the distribution of the fluctuation data groups at all moments includes: performing density analysis on the coordinate points corresponding to the fluctuation data groups at all moments in the two-dimensional coordinate system, and determining the center point with the largest density as the reference point; normalizing the Euclidean distance between the coordinate points corresponding to each moment and the reference point to obtain the data-related index at each moment.

[0051] Among them, it can be understood that the distribution of the coordinate points corresponding to the fluctuation data groups at all moments in the two-dimensional coordinate system can represent the corresponding data analysis characteristics. The region with the largest density, that is, the region under normal conditions. Thus, the present invention performs clustering analysis on it, determines the region with the largest density, and takes the center point corresponding to the region with the largest density as the point of the peak voltage and the data to be measured under normal conditions. It should be noted that the clustering analysis of the present invention is density clustering analysis. By density analysis, the influence of abnormal points on the reference point is eliminated, and a more accurate and effective reference point is obtained. Density clustering is a well-known technology in the art, and no further limitation and elaboration are made here.

[0052] The reference point in the embodiment of the present invention is the center point of the region with the highest density, which can effectively characterize the peak voltage and the characteristic points of the data to be measured under normal conditions. Thus, the farther the distance between other coordinate points and the reference point, the greater the corresponding degree of abnormality. The present invention normalizes the Euclidean distance between the coordinate points and the reference point to obtain the data-related index at each moment. That is to say, the greater the data-related index, the more the corresponding coordinate point conforms to the numerical characteristics of the abnormal peak voltage-reference data.

[0053] In an embodiment of the present invention, the normalization process may specifically be, for example, the maximum-minimum normalization process, and the normalization in subsequent steps may all adopt the maximum-minimum normalization process. In other embodiments of the present invention, other normalization methods may be selected according to the specific numerical range, which will not be elaborated here.

[0054] In the embodiment of the present invention, the Euclidean distance can be subjected to the maximum-minimum normalization process to obtain the data-related index.

[0055] In the embodiment of the present invention, any moment is taken as the moment to be measured, and the other moments except the moment to be measured are taken as the comparison moments. Thus, the moment to be measured is analyzed.

[0056] Further, in some embodiments of the present invention, according to the data-related index of the moment to be measured and the fluctuation data groups between the moment to be measured and all comparison moments, the data fluctuation coefficient of the moment to be measured is determined, including: calculating the mean value of the fluctuation data groups at all comparison moments on each coordinate axis to obtain the mean coordinate; taking the Euclidean distance between the coordinate corresponding to the fluctuation data group of the moment to be measured and the mean coordinate as the initial fluctuation coefficient; calculating the normalized value of the product of the data-related index and the initial fluctuation coefficient to obtain the data fluctuation coefficient of the moment to be measured.

[0057] In the embodiment of the present invention, since the peak voltage is the abscissa and the data to be measured is the ordinate, calculating the mean value of the fluctuation data groups at all comparison moments on each coordinate axis is to calculate the mean value of the peak voltage and the mean value of the data to be measured at all comparison moments, and taking the two mean values as the abscissa and ordinate values of the mean coordinate respectively. Then this mean coordinate characterizes the overall numerical mean characteristics of the peak voltage and the data to be measured at the comparison moments. The Euclidean distance between the coordinate corresponding to the fluctuation data group of the moment to be measured and the mean coordinate is taken as the initial fluctuation coefficient. The greater the initial fluctuation coefficient, the greater the difference between the moment to be measured and all other comparison moments, that is, the greater the abnormality of the moment to be measured itself.

[0058] In the embodiments of the present invention, the data-related index characterizes the abnormal situation at the density distribution level, while the initial fluctuation coefficient characterizes the abnormal situation at the numerical level. Therefore, they are combined, that is, the normalized value of the product of the data-related index and the initial fluctuation coefficient is calculated to obtain the data fluctuation coefficient at the moment to be measured. The larger the data fluctuation coefficient at the moment to be measured, the greater the degree of abnormality in the correlation distribution of the horizontal and vertical coordinates and the numerical direction at the moment to be measured.

[0059] S103: Determine the breaker test fluctuation index according to the data fluctuation coefficients at all moments; determine the fluctuation trend index at the moment to be measured according to the fluctuation data groups at a preset number of other moments closest to the moment to be measured and the breaker test fluctuation index.

[0060] Further, in some embodiments of the present invention, determining the breaker test fluctuation index according to the data fluctuation coefficients at all moments includes: calculating the mean value of the data fluctuation coefficients at all moments as the breaker test fluctuation index.

[0061] Each moment has a corresponding data fluctuation coefficient. Therefore, the present invention calculates the mean value of the data fluctuation coefficients at all moments as the breaker test fluctuation index. Then, the breaker test fluctuation index characterizes the degree of abnormality of the breaker itself in the peak voltage and the data to be measured. The higher the degree of breaker failure, the lower the distribution regularity of the coordinate points corresponding to the peak voltage and the data to be measured at all moments, the larger the distribution range, and the larger the value of the corresponding breaker test fluctuation index. Fault analysis can be realized based on the breaker test fluctuation index.

[0062] Further, in some embodiments of the present invention, determining the fluctuation trend index at the moment to be measured according to the fluctuation data groups at a preset number of other moments closest to the moment to be measured and the breaker test fluctuation index includes: taking a preset number of other moments closest to the moment to be measured as neighborhood moments; respectively calculating the function values of the coordinate points corresponding to the moment to be measured and each neighborhood moment based on the arctangent function, where the function value of the coordinate point corresponding to the moment to be measured is the to-be-measured fluctuation index, and the function value of the coordinate point corresponding to the neighborhood moment is the neighborhood fluctuation index; calculating the absolute value of the difference between the to-be-measured fluctuation index and the neighborhood fluctuation index to obtain the neighborhood fluctuation difference; normalizing the mean value of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the moment to be measured; determining the fluctuation trend index at the moment to be measured according to the breaker test fluctuation index and the fluctuation difference coefficient at the moment to be measured.

[0063] Wherein, the preset number is the number of preset neighborhood moments, which can be used to characterize the influencing moments of the moment to be measured within its local time sequence range. In the embodiments of the present invention, the preset number can be specifically 5, for example, or it can also be adjusted according to actual detection requirements.

[0064] It can be understood that since the peak voltages and circuit breaker test data at adjacent times will all affect the time to be measured, that is, they will further affect the abnormal performance of the circuit breaker at the time to be measured. Therefore, the present invention analyzes the values at the time to be measured and all neighborhood times. Among them, based on the arctangent function, the function values of the coordinate points corresponding to the time to be measured and each neighborhood time are calculated respectively. Then, the absolute value of the difference between the measured fluctuation index and the neighborhood fluctuation index is calculated to obtain the neighborhood fluctuation difference.

[0065] The present invention calculates the mean normalization of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the time to be measured. The larger the value of the fluctuation difference coefficient, the greater the data fluctuation between the time to be measured and the corresponding neighborhood time, the more inconsistent with the normal circuit breaker test data fluctuation characteristics, and the greater the abnormality of the time to be measured itself.

[0066] Therefore, the fluctuation trend index at the time to be measured can be determined by combining the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be measured.

[0067] Furthermore, in some embodiments of the present invention, there is a positive correlation between the circuit breaker test fluctuation index and the fluctuation trend index at the time to be measured, and there is a positive correlation between the fluctuation difference coefficient at the time to be measured and the fluctuation trend index at the time to be measured. The value range of the fluctuation trend index at the time to be measured is the normalized range. Among them, the positive correlation means that the dependent variable will increase as the independent variable increases, and the dependent variable will decrease as the independent variable decreases. The specific relationship can be a multiplicative relationship, an additive relationship, the power of an exponential function, etc., which is determined by the actual application; the negative correlation means that the dependent variable will decrease as the independent variable increases, and the dependent variable will increase as the independent variable decreases, which can be a subtractive relationship, a divisive relationship, etc., which is determined by the actual application.

[0068] The present invention can calculate the sum of the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be measured, and normalize it to obtain the fluctuation trend index at the time to be measured. Or, it can also calculate the product of the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be measured, and normalize it to obtain the fluctuation trend index at the time to be measured.

[0069] S104: Determine the abnormality degree at the time to be measured according to the correlation between the peak voltage at the time to be measured and the fluctuation trend indexes of all circuit breaker test data, and perform a fault test on the circuit breaker according to the abnormality degrees at all times to obtain a test result.

[0070] Further, in some embodiments of the present invention, according to the correlation between the peak voltage at the moment to be measured and the fluctuation trend index of all circuit breaker test data, the abnormality degree at the moment to be measured is determined, including: calculating the variances of the peak voltage at the moment to be measured and the fluctuation trend indexes of all circuit breaker test data respectively to obtain the fluctuation trend dispersion degree; calculating the means of the peak voltage at the moment to be measured and the fluctuation trend indexes of all circuit breaker test data respectively to obtain the fluctuation trend average coefficient; taking the normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient as the abnormality degree at the moment to be measured.

[0071] In the embodiments of the present invention, the fluctuation trend dispersion degree represents the trend dispersion degree of the fluctuation characteristics of each data at the moment to be measured. The larger its value is, the more discrete the fluctuations at the same moment are, that is, the greater the influence of abnormalities. The fluctuation trend average coefficient, on the other hand, characterizes the numerical abnormality of all circuit breaker test data itself. Therefore, the present invention calculates the normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient as the abnormality degree at the moment to be measured.

[0072] It can be understood that the abnormality degree in the embodiments of the present invention combines the numerical distribution of the fluctuation trend indexes of all circuit breaker test data at the same moment, so as to be able to perform fluctuation analysis on each kind of circuit breaker test data, and further analyze the dispersion of the fluctuation trend and the overall numerical characteristics, so as to ensure that the abnormality degree can effectively combine the abnormal conditions of all circuit breaker test data, making the abnormality degree have a more effective characterization effect.

[0073] Further, in some embodiments of the present invention, according to the abnormality degree at all moments, a fault test is performed on the circuit breaker to obtain a test result, including: taking the moment when the value of the abnormality degree is greater than the preset abnormality threshold as the target moment; calculating the ratio of the number of target moments to the number of all moments to obtain the fault degree, and taking the fault degree as the test result.

[0074] In the embodiments of the present invention, the preset abnormality threshold is the threshold value of the abnormality degree. Optionally, the preset abnormality threshold can be specifically, for example, 0.8, that is to say, taking the moment when the value of the abnormality degree is greater than 0.8 as the target moment. Since the greater the abnormality degree is, the more abnormal the values of each circuit breaker test data at the corresponding moment are, that is, the greater the probability of circuit breaker failure at the corresponding moment. Therefore, the present invention takes the target moment as the fault moment, calculates the ratio of the number of target moments to the number of all moments to obtain the fault degree, and takes the fault degree as the test result.

[0075] The present invention obtains the peak voltage of the circuit breaker and the circuit breaker test data; determines the fluctuation data group; determines the data correlation index according to the distribution of the fluctuation data groups at all times; since there is a correlation between the peak voltage of the circuit breaker and the circuit breaker test data, thus, the present invention analyzes the correlation relationship by determining the data correlation index, and combines the data correlation index to determine the data fluctuation coefficient at the moment to be measured; the data fluctuation coefficient characterizes the eigenvalue of data fluctuation, and the fluctuation condition of the circuit breaker itself, that is, the circuit breaker test fluctuation index, can be determined according to the data fluctuation coefficients at all times; then, since data fluctuations affect each other within adjacent time periods, thus, the present invention determines the fluctuation trend index at the moment to be measured according to the fluctuation data groups at other times adjacent in time sequence and the circuit breaker test fluctuation index; afterwards, by combining different types of circuit breaker test data, the abnormality degree at each moment is analyzed to determine the abnormality degree at the moment to be measured, and the circuit breaker is subjected to a fault test according to the abnormality degrees at all times to obtain a test result. In summary, the present invention can effectively analyze the circuit breaker test fluctuations caused by the change of the peak voltage, and determine the accurate abnormality degree at each moment in combination with the analysis result, improving the reliability and accuracy of the fault test of the circuit breaker and optimizing the test result.

[0076] The present invention also provides an active test system for a circuit breaker. The system includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of an active test method for a circuit breaker as described above.

[0077] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the various embodiments of the present application, and should all be included in the protection scope of the present application.

[0078] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other. Each embodiment focuses on the differences from other embodiments.

Claims

1. An active testing method for a circuit breaker, characterized in that, The method includes: Obtaining the peak voltage of the circuit breaker and at least two types of circuit breaker test data at different times; optionally selecting one type of circuit breaker test data as the data to be measured, and determining the fluctuation data group at each time according to the peak voltage and the data value of the data to be measured at each time; Determining the data correlation index at each time according to the distribution of the fluctuation data groups at all times; optionally selecting one time as the time to be measured, and other times as the comparison times, and determining the data fluctuation coefficient at the time to be measured according to the data correlation index at the time to be measured and the fluctuation data groups at the time to be measured and all the comparison times; Determining the circuit breaker test fluctuation index according to the data fluctuation coefficients at all times; determining the fluctuation trend index at the time to be measured according to the fluctuation data groups at the preset number of other times closest to the time to be measured and the circuit breaker test fluctuation index; Determining the abnormality degree at the time to be measured according to the correlation between the peak voltage at the time to be measured and the fluctuation trend indexes of all the circuit breaker test data, and performing a fault test on the circuit breaker according to the abnormality degrees at all times to obtain a test result; The step of determining the fluctuation data group at each time according to the peak voltage and the data value of the data to be measured at each time includes: Constructing a two-dimensional coordinate system with the peak voltage as the abscissa and the data to be measured as the ordinate, determining the coordinate points of the corresponding data at each time in the two-dimensional coordinate system, and taking the coordinate values corresponding to the coordinate points as the fluctuation data group at each time; The step of determining the data correlation index at each time according to the distribution of the fluctuation data groups at all times includes: Performing density analysis on the coordinate points corresponding to the fluctuation data groups at all times in the two-dimensional coordinate system, and determining the center point with the largest density as the reference point; Normalizing the Euclidean distance between the coordinate point corresponding to each time and the reference point to obtain the data correlation index at each time.

2. The active testing method for a circuit breaker according to claim 1, characterized in that, The step of determining the data fluctuation coefficient at the time to be measured according to the data correlation index at the time to be measured and the fluctuation data groups at the time to be measured and all the comparison times includes: Calculating the mean value of the fluctuation data groups at all the comparison times on each coordinate axis to obtain the mean coordinate; Taking the Euclidean distance between the coordinate corresponding to the fluctuation data group at the time to be measured and the mean coordinate as the initial fluctuation coefficient; Calculating the normalized value of the product of the data correlation index and the initial fluctuation coefficient to obtain the data fluctuation coefficient at the time to be measured.

3. The active testing method for a circuit breaker according to claim 1, characterized in that, The step of determining the circuit breaker test fluctuation index according to the data fluctuation coefficients at all times includes: Calculating the mean value of the data fluctuation coefficients at all times as the circuit breaker test fluctuation index.

4. The active test method for a circuit breaker according to claim 1, characterized in that, The step of determining the fluctuation trend index at the time to be measured according to the fluctuation data groups at the preset number of other times closest to the time to be measured and the circuit breaker test fluctuation index includes: Taking the preset number of other times closest to the time to be measured as the neighborhood times; Calculate the function values of the coordinate points corresponding to the to-be-measured moment and each neighborhood moment respectively based on the arctangent function, where the function value of the coordinate point corresponding to the to-be-measured moment is the to-be-measured fluctuation index, and the function value of the coordinate point corresponding to the neighborhood moment is the neighborhood fluctuation index; Calculate the absolute value of the difference between the to-be-measured fluctuation index and the neighborhood fluctuation index to obtain the neighborhood fluctuation difference; Normalize the mean value of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the to-be-measured moment; Determine the fluctuation trend index at the to-be-measured moment according to the breaker test fluctuation index and the fluctuation difference coefficient at the to-be-measured moment.

5. The active testing method for a circuit breaker according to claim 4, characterized in that, The breaker test fluctuation index is positively correlated with the fluctuation trend index at the to-be-measured moment, the fluctuation difference coefficient at the to-be-measured moment is positively correlated with the fluctuation trend index at the to-be-measured moment, and the value range of the fluctuation trend index at the to-be-measured moment is the normalized range.

6. The active test method for a circuit breaker according to claim 1, wherein Determining the abnormality degree at the to-be-measured moment according to the correlation between the peak voltage at the to-be-measured moment and the fluctuation trend indexes of all breaker test data includes: Calculate the variance of the peak voltage at the to-be-measured moment and the fluctuation trend indexes of all breaker test data respectively to obtain the fluctuation trend dispersion degree; Calculate the mean value of the peak voltage at the to-be-measured moment and the fluctuation trend indexes of all breaker test data respectively to obtain the fluctuation trend average coefficient; Take the normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient as the abnormality degree at the to-be-measured moment.

7. The active testing method for a circuit breaker according to claim 1, characterized in that Performing a fault test on the breaker according to the abnormality degrees at all moments to obtain a test result, including: Take the moments when the value of the abnormality degree is greater than the preset abnormality threshold as the target moments; Calculate the ratio of the number of the target moments to the number of all moments to obtain the fault degree, and take the fault degree as the test result.

8. An active test system for a circuit breaker, the system comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the active test method for a breaker according to any one of claims 1 to 7.

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