A Measuring Method for Insulation Thickness and Conductor of Enameled Wire Based on Optical Principle

Abstract

The present invention provides a method for measuring the insulation thickness and conductor of enameled wire based on optical principles, belonging to the field of optical measurement; it solves the problem of low measurement efficiency of the insulation thickness and conductor of enameled wire; specifically as follows: Step S1: Obtain index data; Step S2: Construct an incident distance equation, and calculate the standard proportionality coefficient and proportionality coefficient according to the index data to determine whether the enameled wire is qualified; if it is qualified, no treatment is required, if it is unqualified, then measure the insulation layer thickness and conductor radius; Step S3: Calculate the insulation layer thickness and conductor radius of the enameled wire according to the incident distance equation to obtain an inspection report; Step S4: Measure the insulation layer thickness and conductor radius of each enameled wire and update the inspection report; The present invention measures the insulation layer thickness and conductor radius of enameled wire by obtaining, analyzing and processing the relevant data of enameled wire, improving the measurement efficiency.

Description

Technical Field

[0001] A method for measuring the insulation thickness and conductor of enameled wire based on optical principle of the present invention relates to the field of optical measurement. Background Art

[0002] The existing methods for measuring the insulation thickness of enameled wire have the following deficiencies:

[0003] Complexity and cost of the optical system: The design of the optical measurement system is relatively complex. Especially in high-precision measurements, high requirements are imposed on hardware devices such as light sources, optical components, and detectors; high-precision optical instruments may require high-cost optical components, resulting in a large investment in equipment; in addition, the maintenance of the optical measurement system is also relatively complex, and optical components need to be calibrated and maintained regularly.

[0004] Complex data processing: The existing optical measurement methods need to process a large amount of data during the measurement process, especially the three-dimensional information obtained through images. This leads to the need for data processing algorithms to effectively identify the noise in the signal and extract useful information, increasing the difficulty of data processing and data calculation.

[0005] Instability of the light source: Optical measurement relies on the light source for signal reflection or transmission, especially laser light sources; if the output intensity of the laser light source fluctuates, it will directly affect the stability of the measurement results, and the same light source will experience attenuation or non-uniformity during long-term use, resulting in inaccurate data and inability to unify the quantization standard for data processing. Summary of the Invention

[0006] Aiming at the deficiencies of the existing technology, the purpose of the present invention is to provide a method for measuring the insulation thickness and conductor of enameled wire based on optical principle, aiming to solve the problem of low measurement efficiency of the insulation thickness and conductor of enameled wire.

[0007] To achieve the above purpose, the present invention is realized through the following technical solutions: A method for measuring the insulation thickness and conductor of enameled wire based on optical principle includes:

[0008] Step S1: Obtain the standard thickness of the insulation layer of the enameled wire, the refractive index of the insulating material, the standard radius of the enameled wire conductor, the wavelength of the laser, and the distance from the interferometer light source to the screen as index data;

[0009] Step S2: Adjust the incident angle of the laser, and count the optical path difference and the interference fringe width when the incident angle changes from 1° to 360°; construct an incident distance equation, and calculate the standard incident distance and the standard optical path difference of the laser according to the index data to obtain the standard proportionality coefficient; based on the optical path difference, the interference fringe width, and the incident distance equation, calculate the proportionality coefficient of the laser at each incident angle; judge whether the enameled wire is qualified according to the standard proportionality coefficient and the proportionality coefficient; if it is qualified, skip Step S3, if it is unqualified, analyze the proportionality coefficient, and measure the insulation layer thickness and the conductor radius of the enameled wire.

[0010] Step S3: Analyze the proportionality coefficient to judge whether the insulation layer thickness of the enameled wire is uniform; if it is uniform, record the insulation layer thickness according to the standard proportionality coefficient and end the step; if it is not uniform, calculate the insulation layer thickness and the conductor radius of the enameled wire according to the incident distance equation to obtain an inspection report.

[0011] Step S4: Obtain the quantity of all enameled wires, measure the insulation layer thickness and the conductor radius of each enameled wire, eliminate unqualified products, and update the inspection report.

[0012] Further, the specific steps of Step S2 are as follows:

[0013] Step S21: Set the geometric center of the enameled wire as the vertex, denoted as point O; set the position directly to the right of the vertex as the starting position, denoted as point C.

[0014] Set the position where the laser enters the enameled wire as point A, the position where the laser contacts the conductor and reflects inside the enameled wire as point E, and the position where the laser refracts out of the enameled wire as point B.

[0015] Step S22: Based on the points preset in Step S21, denote the size of the incident angle ∠AOC of the enameled wire as α, and the size of the refraction angle ∠EAO as β.

[0016] Denote the wavelength of the laser as λ (0) , and denote the refractive index of the insulation layer as n; satisfy: sin(α) / sin(β) = n.

[0017] Denote the wavelength when the laser propagates in the insulation layer as λ, and the calculation formula of λ is: λ = λ (0) / n;

[0018] Adjust the incident angle α of the laser counterclockwise from 1° to 360° in sequence, and count the optical path difference when the incident angle is from 1° to 360°, denoted as: ix (1) ~ix (360) ;

[0019] Count the interference fringe width when the incident angle is from 1° to 360°, denoted as: iw (1) ~iw (360) ;

[0020] Step S23: the standard radius of the enameled wire conductor is recorded as r, and the standard thickness of the enameled wire insulation layer is recorded as td;

[0021] Assuming that the insulation layer of the enameled wire is uniform and meets the standard, the thickness of the insulation layer of the enameled wire is preset to d, and based on the data in step S21 to step S23, the laser refraction-reflection equation group is constructed to obtain formula B (1) ~Formula B (7) ;

[0022] Step S24: Combining the calculation formula in step S23 to construct an equation for the incident and exiting distance of the laser;

[0023] Step S25: Using the standard thickness td of the insulation layer of the enameled wire as formula B (1) ~Formula B (7) d in the figure, calculate the standard incident and exit distances when the laser incident angle is 1° to 360°, recorded as: gd (1) ~gd (360) ;

[0024] Let the distance from the interferometer light source to the screen be Ll, and define calculation formula 1-1:

[0025] tad (i) =(λ×Ll) / ix (i) Among them, tad (i) It represents the distance of the laser beam when the incident angle is i°, ix (i) It indicates the optical path difference of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360;

[0026] ix (1) ~ix (360) Substituting into the calculation formula 1-1, calculate the laser's one-time incident distance when the incident angle is 1° to 360°, and get: tad (1) ~tad (360) .

[0027] Furthermore, the subsequent steps of step S25 are as follows:

[0028] Step S26: Define calculation formula 1-2:

[0029] Among them, tbd (i) Indicates the secondary incident distance of the laser when the incident angle is i°, iw (i) It indicates the interference fringe width of the laser when the incident angle is i°; i indicates the angle, and the value range of i is: 1~360;

[0030] IW (1) ~iw(360) Substitute into Equation 1-2 and calculate the secondary incident and exit distance of the laser when the incident angle ranges from 1° to 360°, obtaining: tbd (1) ~tbd (360) ;

[0031] Define Equation 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; where ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°;

[0032] Substitute tad (1) ~tad (360) and tbd (1) ~tbd (360) into Equation 1-3 and calculate the true incident and exit distance of the laser when the incident angle ranges from 1° to 360°, obtaining: ttd (1) ~ttd (360) ;

[0033] Step S27: Define Equation 1-4: gw (i) =(λ×Ll) / gd (i) ; where gd (i) represents the standard incident and exit distance of the laser when the incident angle is i°, gw (i) represents the standard optical path difference corresponding to gd (i) ; i represents the angle, and the value range of i is: 1~360;

[0034] Substitute gd (1) ~gd (360) into Equation 1-4 and calculate the standard optical path difference of the standard incident and exit distance of the laser when the incident angle ranges from 1° to 360°, obtaining gw (1) ~gw (360) ;

[0035] Calculate the standard proportionality coefficient of the incident and exit distance of the enameled wire and the optical path difference, denoted as gdw; the calculation formula of gdw is:

[0036]

[0037] Step S28: Define Equation 1-5: tdw (i) =ttd (i) / ix (i) ; where ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°, ix (i) represents the optical path difference of the laser when the incident angle is i°, and tdw (i)It represents the proportionality coefficient of the incident and outgoing distance to the optical path difference when the laser incident angle is i°; i represents the angle, and the value range of i is: 1 to 360;

[0038] Substitute ttd (1) ~ttd (360) and ix (1) ~ix (360) into the calculation formula 1-5, calculate the proportionality coefficient of the incident and outgoing distance to the optical path difference when the laser incident angle is from 1 to 360°, and obtain: tdw (1) ~tdw (360) ;

[0039] Step S29: Determine whether tdw (1) =tdw (2) =~=tdw (360) =gdw holds;

[0040] If it holds, it means that the enameled wire is qualified, the insulation layer thickness of the enameled wire is the standard thickness and the conductor radius is the standard radius, and skip step S3;

[0041] If it does not hold, it means that the enameled wire is unqualified, analyze the proportionality coefficient, mark the non-compliant position, and enter step S3.

[0042] Further, the specific steps of the said step S23 are as follows:

[0043] Step S231: Denote the line segment from point O to point A as l (OA) , and the length of l (OA) is (r + d);

[0044] In triangle △OEA, denote the size of angle ∠OEA as θ, and the size of angle ∠EOA as μ; denote the line segment from point O to point E as l (OE) , and the length of l (OE) is r; denote the line segment from point E to point A as l (EA) ;

[0045] In triangle △OEA, according to the sine theorem, obtain the relational expression a-1-1:

[0046]

[0047] Substitute the data of ∠OEA, l (OA) , l (OA) and ∠EAO, and obtain the relational expression a-1-2:

[0048]

[0049] Based on the relational expression a-1-2: obtain the calculation formula of θ:

[0050] Take the calculation formula of θ as Formula B (1) ;

[0051] Step S232: Denote the line segment from point E to point A as l (EA) , and denote the length of l (OA) as l;

[0052] In triangle △OEA, obtain relational expressions a - 1 - 3 and a - 1 - 4 according to the sine theorem;

[0053] Relational expression a - 1 - 3:

[0054]

[0055] Relational expression a - 1 - 4: ∠EOA = μ = π - β - θ;

[0056] According to relational expressions a - 1 - 3 and a - 1 - 4, obtain the calculation formula of l:

[0057] Take the calculation formula of l as Formula B (2) ;

[0058] Step S233: Denote the line segment from point A to point B as l (AB) , draw a straight line along the extension of l (OE) in the direction of l (AB) and intersect it at l (AB) , and denote the intersection point as point F; Denote the line segment from point F to point A as l (FA) , and denote the length of l (FA) as h;

[0059] In triangle △OBF, the calculation formula of h is: h = sin(μ)×(r + d); Take the calculation formula of h as Formula B (3) ;

[0060] Denote the size of angle ∠EBF as δ, in triangle △EBF, the calculation formula of δ is:

[0061] δ = arccos(h / l); Take the calculation formula of δ as Formula B (4) .

[0062] Furthermore, the subsequent steps of step S233 are as follows:

[0063] Step S234: Denote the line segment from point O to point C as l (OC) , draw a perpendicular line from point B to l (OC) in the direction of l (OC) , and the foot of the perpendicular is point G; Rotate l (OD) counterclockwise by 90° to obtain a straight line l

[0064] Denote the line segment from point B to point G as l (BG) , according to the angle transformation of the triangle, the magnitudes of ∠EBO and ∠EAO are equal, both being β;

[0065] Denote the line segment from point B to point G as l (BG) , l (BG) Divide ∠EBO into ∠OBG and ∠GBE; denote the magnitude of ∠OBG as β1 and the magnitude of ∠GBE as β2;

[0066] According to the principle of parallel lines, the magnitudes of ∠DOB and ∠OBG are equal, both being β1; the calculation formula for β1 is: β1 = (π / 2) - α - (2×μ); take the calculation formula of β1 as formula B (5) ;

[0067] Step S235: Extend point B along the direction of l (OC) , and extend point A along the direction of l (OD) , and the intersection point of the extended lines is H;

[0068] Denote the magnitude of ∠ABH as η, and obtain relationship a - 2 - 1 and relationship a - 2 - 2 from the angle transformation;

[0069] Relationship a - 2 - 1: η = (π / 2) - δ - β2;

[0070] Relationship a - 2 - 2: β2 = β - β1;

[0071] Combine relationship a - 2 - 1, relationship a - 2 - 2 and formula B (5) , and obtain the calculation formula for η:

[0072] η = π - δ - β - α - (2×μ); take the calculation formula of η as formula B (6) ;

[0073] Step S236: Denote the line segment from point H to point A as l (HA) , in triangle △ABF, the incident and exit distance of the laser is l (HA) , denote the length of l (HA) as il;

[0074] Combine formula B (1) ~ formula B (6) and obtain the calculation formula for il: il = (2×h)×sin(η);

[0075] Take the calculation formula of il as formula B (7) , and take formula B (1) ~ formula B (7) as the laser catadioptric equation system.

[0076] Further, the workflow of step S24 is as follows:

[0077] Step S241: Extract formula B (1) : where d represents the preset thickness of the enameled wire insulation layer (d = td or d ≠ td);

[0078] Relationship a - 1 - 4: μ = π - β - θ;

[0079] Formula B (2) :

[0080] Formula B (3) : h = sin(μ) × (r + d);

[0081] Formula B (4) : δ = arccos(h / l);

[0082] Formula B (6) : η = π - δ - β - α - (2 × μ);

[0083] Step S242: Substitute formula B (2) and formula B (3) into formula B (4) to obtain formula C (1) :

[0084]

[0085] Substitute formula B (1) into relationship a - 1 - 4 to obtain formula C (2) :

[0086]

[0087] According to the properties of inverse trigonometric functions, obtain formula C (3) :

[0088]

[0089] Step S243: Substitute formula C (2) and formula C (3) into formula B (6) to obtain formula C (4) :

[0090] η = (π / 2) - α - μ;

[0091] Extract formula B (7) : il = (2 × h) × sin(η);

[0092] Substitute formula C (4) and formula B(3) Substitute into formula B (7) to obtain formula C (5) :

[0093]

[0094] Substitute formula C (2) into formula C (5) to obtain the incident and exit distance equation of the laser:

[0095]

[0096] where α and β respectively represent the incident angle and the refraction angle, and r represents the standard radius of the enameled wire conductor;

[0097] d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; redefine il as the incident and exit distance of the laser, that is, the dependent variable.

[0098] Furthermore, the specific steps of step S3 are as follows:

[0099] Step S31: Extract the standard proportionality coefficient gdw, and extract the proportionality coefficients of the incident and exit distance and the optical path difference when the laser incident angle is 1°, 2° up to 360°: tdw (1) 、tdw (2) ~tdw (360) ;

[0100] Judge whether tdw (1) = tdw (2) =~= tdw (360) holds;

[0101] If it holds, it means that the conductor radius of the enameled wire is the standard radius and the insulation layer thickness of the enameled wire is uniform. Calculate the insulation layer thickness of the enameled wire and enter step S32;

[0102] If it does not hold, it means that the insulation layer thickness of the enameled wire is non-uniform. Conduct a secondary analysis of the proportionality coefficient, calculate the insulation layer thickness of the enameled wire, and enter step S33;

[0103] Step S32: tdw (1) = tdw (2) =~= tdw (360) holds; Calculate the average value of tdw (1) ~tdw (360) and denote it as ddw. Denote the uniform enameled wire insulation layer thickness as cod and calculate the value of cod; Extract the wavelength λ (0) of the laser, and the refractive index n of the insulation layer;

[0104] Step S33: tdw (1) = tdw (2)=~=tdw (360) It does not hold; extract the incident distance equation and calculate the insulation layer thickness and conductor radius of the enameled wire;

[0105] The incident distance equation is as follows:

[0106]

[0107] Among them, α and β respectively represent the incident angle and the refraction angle, r represents the standard radius of the enameled wire conductor; the relationship between α and β satisfies: sin(α) / sin(β)=n;

[0108] d represents the preset thickness of the insulation layer of the enameled wire, that is, the independent variable; redefine il as the incident and exit distance of the laser, that is, the dependent variable;

[0109] Step S34: Summarize the data in steps S31 to S33 as an inspection report.

[0110] Furthermore, the specific steps of step S32 are as follows:

[0111] Step S321: Extract the optical path difference ix when the incident angle of the laser is 1°, 2° up to 360° (1) , ix (2) ~ix (360) ;

[0112] Step S322: Denote the interference order of the laser when the incident angle is i° as mn (i) ; Among them, mn (i) is a positive integer; i represents the angle, and the value range of i is: 1 to 360;

[0113] Define relationship 2-1 and relationship 2-2;

[0114] Relationship 2-1: ix (i) =(mn (i) +0.5)×(λ (0) / n); Among them, ix (i) represents the optical path difference of the laser when the incident angle is i°;

[0115] Relationship 2-2: ix (i) =mn (i) ×(λ (0) / n);

[0116] Substitute ix (1) ~ix (360) backward into relationship 2-1 or relationship 2-2, and calculate the interference order of the laser when the incident angle is 1°, 2° up to 360°, to obtain: mn (1) , mn (2) ~mn (360) ;

[0117] Step S323: Calculate mn (1) ~mn (360) Calculate the average value of mn, denoted as amn; The calculation formula of cod is:

[0118]

[0119] Furthermore, the specific steps of step S33 are as follows:

[0120] Step S331: Extract the true incident and exit distances of the laser when the incident angle is 1°, 2° up to 360°: ttd (1) 、ttd (2) ~ttd (360) ;

[0121] Substitute ttd (1) ~ttd (360) into the incident and exit distance equation as il in reverse, and calculate the insulation layer thickness of the enameled wire when the incident angle is 1°, 2° up to 360°, to obtain: ted (1) 、ted (2) ~ted (360) ;

[0122] Step S332: Extract the standard thickness td of the enameled wire insulation layer;

[0123] Denote the insulation layer thickness of the enameled wire when the incident angle is i° as ted (i) ; where, i represents the angle, and the value range of i is: 1~360;

[0124] Step S333: Compare the magnitudes of ted (i) and td, and define relation 2-3 and relation 2-4;

[0125] ted (i) ≥td, relation 2-3:

[0126] where, tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference when the incident angle of the laser (emitted by the interferometer) is i°;

[0127] ted (i) <td, relation 2-4:

[0128]

[0129] Step S334: Take tdw (1) ~tdw (360)Substitute into relational expression 2-3 or relational expression 2-4, extract the proportionality coefficient that satisfies relational expression 2-3 as the type A coefficient; extract the proportionality coefficient that satisfies relational expression 2-4 as the type B coefficient; extract the proportionality coefficient that does not satisfy relational expression 2-3 and relational expression 2-4 as the type C coefficient;

[0130] Count the number of type A coefficients as ua, the number of type B coefficients as ub, and the number of type C coefficients as uc;

[0131] Step S335: Denote the angles of the 1st to the ua-th type A coefficients as ana (1) ~ana (ua) ;

[0132] Denote the insulation layer thickness of the enameled wire corresponding to ana (1) ~ana (ua) as: aad (1) ~aad (ua) ;

[0133] The enameled wire has a normal conductor radius and a relatively thick insulation layer with a thickness of: aad (1) ~ana (ua) at the angle of ana (1) ~aad (ua) ;

[0134] Step S336: Denote the angles of the 1st to the ub-th type B coefficients as anb (1) ~anb (ub) ;

[0135] Denote the insulation layer thickness of the enameled wire corresponding to anb (1) ~anb (ub) as: bbd (1) ~bbd (ub) ;

[0136] The enameled wire has a normal conductor radius and a relatively thin insulation layer with a thickness of: bbd (1) ~anb (ub) at the angle of anb (1) ~bbd (ub) .

[0137] Furthermore, the subsequent steps of step S336 are as follows:

[0138] Step S337: Denote the angles of the 1st to the uc-th type C coefficients as anc (1) ~anc (uc) ;

[0139] Denote the insulation layer thickness of the enameled wire corresponding to anc (1) ~anc (uc) as: ccd(1) ~ccd (uc) ;

[0140] Define the proportionality coefficient corresponding to anc as cdw (1) ~anc (uc) ; Denote it as cdw (1) ~cdw (uc) ;

[0141] Define the offset coefficient of the conductor radius corresponding to the j-th C-type coefficient as bur (j) ;

[0142] Define the proportionality coefficient corresponding to the j-th C-type coefficient as cdw (j) ; The value range of j is: 1~uc;

[0143] Step S338: Compare the magnitudes of cdw (j) and td, and define relational expressions 2-5 and 2-6;

[0144] cdw (j) ≥td, relational expression 2-5:

[0145]

[0146] cdw (j) <td, relational expression 2-6:

[0147]

[0148] Substitute ccd (1) ~ccd (uc) and cdw (1) ~cdw (uc) into relational expression 2-5 or relational expression 2-6 to calculate the offset coefficient of the conductor radius of the 1st to uc-th C-type coefficients, obtaining: bur (1) ~bur (uc) ;

[0149] Step S339: Determine the sign of bur (1) ~bur (uc) to determine the conductor radius;

[0150] Step S3391: The insulation layer thickness at the enameled wire angle ana (1) is relatively thin, and the thickness is: ccd (1) ;

[0151] If bur (1) is positive, then the conductor at the enameled wire angle ana (1) is thicker, and the conductor radius is: (1 + bur (1) ) × r; where r represents the standard radius of the enameled wire radius;

[0152] If bur (1) is negative, the enameled wire angle is ana (1) where the conductor is thinner, and the conductor radius is: (1 - |bur (1) |) × r; where r represents the standard radius of the enameled wire radius;

[0153] Step S3392: The enameled wire angle is ana (2) where the insulation layer thickness is thinner, and the thickness is: ccd (2) ;

[0154] If bur (2) is positive, the enameled wire angle is ana (2) where the conductor is thicker, and the conductor radius is: (1 + bur (2) ) × r; where r represents the standard radius of the enameled wire radius;

[0155] If bur (2) is negative, the enameled wire angle is ana (2) where the conductor is thinner, and the conductor radius is: (1 - |bur (2) |) × r; where r represents the standard radius of the enameled wire radius;

[0156] Step S3393: And so on, the enameled wire angle is ana (uc) where the insulation layer thickness is thinner, and the thickness is: ccd (uc) ;

[0157] If bur (uc) is positive, the enameled wire angle is ana (uc) where the conductor is thicker, and the conductor radius is: (1 + bur (uc) ) × r; where r represents the standard radius of the enameled wire radius;

[0158] If bur (uc) is negative, the enameled wire angle is ana (uc) where the conductor is thinner, and the conductor radius is: (1 - |bur (uc) |) × r.

[0159] Compared with the prior art, the beneficial effects of the present invention are:

[0160] Non-contact measurement: The measurement method of the present invention based on the optical principle obtains information through the characteristics of light reflection, refraction, etc., without damaging any part of the sample. The greatest advantage is non-contact. During the manufacturing and use of enameled wires, the optical measurement method can be used for the insulation layer thickness of enameled wires, avoiding direct contact with the enameled wires and preventing damage or errors caused by physical contact. Compared with traditional contact measurement methods (such as resistance measurement or mechanical measurement), optical measurement does not change the physical properties of the object to be measured. Especially in the fine production process of enameled wires, the optical measurement method can accurately maintain the original state of the wire.

[0161] High precision: The optical measurement method has a very high resolution and can reach micron-level precision, suitable for accurately measuring the small dimensions of enameled wires. Using laser interferometry or optical microscopy methods, the thickness of the insulation layer can be measured at the nanoscale, ensuring the consistency and stability of the product.

[0162] Suitable for mass production: The present invention can be integrated with production line automation equipment and is suitable for rapid detection of enameled wires in mass production. The optical measurement method is not limited by the skill level of operators and can achieve high-throughput and low-error detection in an efficient production process. BRIEF DESCRIPTION OF THE DRAWINGS

[0163] By reading the detailed description of the non-limiting embodiments with reference to the following drawings, other features, objects, and advantages of the present invention will become more apparent:

[0164] Figure 1 It is a schematic diagram of the method of the present invention;

[0165] Figure 2 It is a schematic diagram of the enameled wire of the present invention;

[0166] Figure 3 It is a schematic diagram of light refraction and reflection of the present invention;

[0167] Figure 4 It is a schematic diagram of light refraction and reflection of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0168] To make the above objects, features, and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the drawings and specific embodiments.

[0169] Please refer to Figure 1 and Figure 2 , a method for measuring the insulation thickness and conductor of enameled wires based on the optical principle includes:

[0170] Step S1: Obtain the standard thickness of the enameled wire insulation layer, the refractive index of the insulating material, the standard radius of the enameled wire conductor, the wavelength of the laser (emitted by the interferometer), and the distance from the interferometer light source to the screen as index data;

[0171] Step S2: Adjust the incident angle of the laser (emitted by the interferometer), and count the optical path difference and the interference fringe width when the incident angle changes from 1° to 360°; construct an incident distance equation (based on the principle of light interference and trigonometric transformation), and calculate the standard incident distance and standard optical path difference of the laser (emitted by the interferometer) according to the index data to obtain the standard proportionality coefficient; calculate the proportionality coefficient of the laser (emitted by the interferometer) at each incident angle based on the optical path difference, the interference fringe width, and the incident distance equation; judge whether the enameled wire is qualified according to the standard proportionality coefficient and the proportionality coefficient; if it is qualified, skip Step S3 (that is, the insulation layer thickness of the enameled wire is the standard thickness, and the radius of the enameled wire conductor is the standard radius), if it is unqualified, analyze the proportionality coefficient and measure the insulation layer thickness and conductor radius of the enameled wire (enter Step S3);

[0172] The specific steps of Step S2 are as follows:

[0173] Step S21: Please refer to Figure 3 , take the geometric center of the enameled wire as the vertex, denoted as point O; take the position directly to the right of the vertex as the starting position, denoted as point C;

[0174] (Use the interferometer to measure the insulation layer thickness of the enameled wire) Let the position where the laser (emitted by the interferometer) enters the enameled wire be point A, the position where the laser (emitted by the interferometer) contacts the conductor and reflects inside the enameled wire be point E, and the position where the laser (emitted by the interferometer) refracts out of the enameled wire be point B;

[0175] It should be noted that the "laser" in the present invention generally refers to a light source that can produce an interference phenomenon, such as: white light with a wavelength range of 400 - 700 nm (white light interference band 400 - 700 nm) or infrared light with a wavelength range of 800 - 1300 nm (infrared interference band 800 - 1300 nm); the user can adjust the light source of the "laser" according to actual needs;

[0176] Step S22: Based on the points preset in Step S21 (and trigonometric transformation), denote the magnitude of the incident angle ∠AOC of the enameled wire as α, and the magnitude of the refraction angle ∠EAO as β;

[0177] Denote the wavelength of the laser (emitted by the interferometer) as λ (0) , denote the refractive index of the insulation layer as n; satisfy: sin(α) / sin(β) = n;

[0178] Denote the wavelength when the laser propagates in the insulation layer as λ, and the calculation formula of λ is: λ = λ (0) / n;

[0179] Adjust the incident angle α of the laser counterclockwise from 1° to 360° in sequence, and count the optical path differences when the incident angles are 1°, 2° up to 360°, denoted as: ix (1) , ix (2) ~ix (360) ;

[0180] Count the fringe widths when the incident angles are 1°, 2° up to 360°, denoted as: iw (1) , iw (2) ~iw (360) ;

[0181] Step S23: Please refer to Figure 3 and Figure 4 , denote the standard radius of the enameled wire conductor as r, and denote the standard thickness of the enameled wire insulation layer as td;

[0182] Assume that the insulation layer of the enameled wire is uniform and meets the standard, preset the thickness of the enameled wire insulation layer as d, and based on the data in construction steps S21 to S23, construct a laser refraction and reflection equation system to obtain formula B (1) ~formula B (7) ;

[0183] Step S231: Denote the line segment from point O to point A as l (OA) , the length of l (OA) is (r + d);

[0184] In triangle △OEA, denote the size of angle ∠OEA as θ, and the size of angle ∠EOA as μ; denote the line segment from point O to point E as l (OE) , the length of l (OE) is r; denote the line segment from point E to point A as l (EA) ;

[0185] In triangle △OEA, according to the sine theorem, obtain the relational expression a - 1 - 1:

[0186]

[0187] Substitute the data of ∠OEA, l (OA) , l (OA) and ∠EAO to obtain the relational expression a - 1 - 2:

[0188]

[0189] Based on the relational expression a - 1 - 2: obtain the calculation formula of θ:

[0190] Take the calculation formula of θ as formula B (1) ;

[0191] Step S232: Denote the line segment from point E to point A as l (EA) , and denote the length of l (OA) as l;

[0192] In triangle △OEA, according to the sine theorem, obtain relationship a - 1 - 3 and relationship a - 1 - 4;

[0193] Relationship a - 1 - 3:

[0194]

[0195] Relationship a - 1 - 4: ∠EOA = μ = π - β - θ;

[0196] According to relationship a - 1 - 3 and relationship a - 1 - 4, obtain the calculation formula for l:

[0197] Take the calculation formula for l as formula B (2) ;

[0198] Step S233: Denote the line segment from point A to point B as l (AB) , draw the extension line of line l (OE) in the direction of l (AB) and intersect it with l (AB) , and denote the intersection point as point F; Denote the line segment from point F to point A as l (FA) , and denote the length of l (FA) as h;

[0199] In triangle △OBF, the calculation formula for h is: h = sin(μ)×(r + d); Take the calculation formula for h as formula B (3) ;

[0200] Denote the size of angle ∠EBF as δ, in triangle △EBF, the calculation formula for δ is:

[0201] δ = arccos(h / l); Take the calculation formula for δ as formula B (4) ;

[0202] Step S234: Denote the line segment from point O to point C as l (OC) , draw a perpendicular line from point B to l (OC) in the direction of l (OC) , and the foot of the perpendicular is point G; Rotate l (OD) counterclockwise by 90° to obtain line l

[0203] Denote the line segment from point B to point G as l (BG) , according to the angle transformation of the triangle, the sizes of angle ∠EBO and angle ∠EAO are equal, both being β;

[0204] Denote the line segment from point B to point G as l (BG) , l (BG) Divide the angle ∠EBO into ∠OBG and ∠GBE; Denote the magnitude of ∠OBG as β1 and the magnitude of ∠GBE as β2;

[0205] According to the principle of parallel lines, the magnitude of ∠DOB is equal to that of ∠OBG, both being β1; The calculation formula for β1 is: β1 = (π / 2) - α - (2×μ); Take the calculation formula of β1 as formula B (5) ;

[0206] Step S235: Extend point B along the direction of l (OC) and point A along the direction of l (OD) to get the intersection point H of the extension lines;

[0207] Denote the magnitude of ∠ABH as η, and obtain relationship a - 2 - 1 and relationship a - 2 - 2 from angle transformation;

[0208] Relationship a - 2 - 1: η = (π / 2) - δ - β2;

[0209] Relationship a - 2 - 2: β2 = β - β1;

[0210] Combine relationship a - 2 - 1, relationship a - 2 - 2 and formula B (5) , and get the calculation formula for η:

[0211] η = π - δ - β - α - (2×μ); Take the calculation formula of η as formula B (6) ;

[0212] Step S236: Denote the line segment from point H to point A as l (HA) , in triangle △ABF, the incident and outgoing distance of the laser is l (HA) , denote the length of l (HA) as il; (il also represents the incident and outgoing distance of the laser, see step S243)

[0213] Combine formula B (1) ~formula B (6) to get the calculation formula for il: il = (2×h)×sin(η);

[0214] Take the calculation formula of il as formula B (7) , and take formula B (1) ~formula B (7) as the laser refraction and reflection equation system;

[0215] Step S24: Combine the calculation formulas in step S23 to construct the incident and outgoing distance equation of the laser;

[0216] Step S241: Extract formula B(1) : where d represents the thickness of the enameled wire insulation layer (d = td or d ≠ td);

[0217] Relationship a-1-4: μ = π - β - θ;

[0218] Formula B (2) :

[0219] Formula B (3) : h = sin(μ) × (r + d);

[0220] Formula B (4) : δ = arccos(h / l);

[0221] Formula B (6) : η = π - δ - β - α - (2 × μ);

[0222] Step S242: Substitute Formula B (2) and Formula B (3) into Formula B (4) to obtain Formula C (1) :

[0223]

[0224] Substitute Formula B (1) into Relationship a-1-4 to obtain Formula C (2) :

[0225]

[0226] According to the properties of inverse trigonometric functions, obtain Formula C (3) :

[0227]

[0228] Step S243: Substitute Formula C (2) and Formula C (3) into Formula B (6) to obtain Formula C (4) :

[0229] η = (π / 2) - α - μ;

[0230] Extract Formula B (7) : il = (2 × h) × sin(η);

[0231] Substitute Formula C (4) and Formula B (3) into Formula B (7) to obtain Formula C (5) :

[0232]

[0233] Substitute formula C (2) into formula C (5) to obtain the incident and exit distance equation of the laser:

[0234]

[0235] where α and β respectively represent the incident angle and the refraction angle, and r represents the standard radius of the enameled wire conductor;

[0236] d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; redefine il as the incident and exit distance of the laser, that is, the dependent variable;

[0237] Step S25: Take the standard thickness td of the enameled wire insulation layer as d in formula B (1) ~formula B (7) to sequentially calculate the standard incident and exit distances when the incident angle of the laser (emitted by the interferometer) is 1°, 2° up to 360°, denoted as: gd (1) 、gd (2) ~gd (360) ;

[0238] Denote the distance from the interferometer light source to the screen as Ll, and define calculation formula 1-1:

[0239] tad (i) =(λ × Ll) / ix (i) ; where tad (i) represents the one-time incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, and ix (i) represents the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1~360;

[0240] Substitute ix (1) ~ix (360) into calculation formula 1-1 to calculate the one-time incident and exit distances of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, and obtain: tad (1) 、tad (2) ~tad (360) ;

[0241] Step S26: Define calculation formula 1-2:

[0242] where tbd (i) represents the two-time incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, and iw (i)Denote the interference fringe width of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360;

[0243] Substitute iw (1) ~iw (360) into the calculation formula 1-2, and calculate the secondary incident and exit distance of the laser (emitted by the interferometer) when the incident angle is 1°, 2° up to 360°, to obtain: tbd (1) , tbd (2) ~tbd (360) ;

[0244] Define the calculation formula 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; where, ttd (i) represents the true incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°;

[0245] Substitute tad (1) ~tad (360) and tbd (1) ~tbd (360) into the calculation formula 1-3, and calculate the true incident and exit distance of the laser (emitted by the interferometer) when the incident angle is 1°, 2° up to 360°, to obtain: ttd (1) , ttd (2) ~ttd (360) ;

[0246] Step S27: Define the calculation formula 1-4: gw (i) =(λ×Ll) / gd (i) ; where, gd (i) represents the standard incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, gw (i) represents the standard optical path difference corresponding to gd (i) ; i represents the angle, and the value range of i is: 1 to 360;

[0247] Substitute gd (1) ~gd (360) into the calculation formula 1-4, and calculate the standard optical path difference of the standard incident and exit distance of the laser (emitted by the interferometer) when the incident angle is 1°, 2° up to 360°, to obtain gw (1) , gw (2) ~gw (360) ;

[0248] Calculate the standard proportionality coefficient of the incident and exit distance of the enameled wire and the optical path difference, denoted as gdw; the calculation formula of gdw is:

[0249]

[0250] Step S28: Define calculation formulas 1 - 5: tdw (i) = ttd (i) / ix (i) ; where, ttd (i) represents the true incident and exit distance of the laser (emitted by the interferometer) when the incident angle is i°, ix (i) represents the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°, and tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°; i represents the angle, and the value range of i is: 1 - 360;

[0251] Substitute ttd (1) ~ ttd (360) and ix (1) ~ ix (360) into calculation formulas 1 - 5, and calculate the proportionality coefficient of the incident and exit distance to the optical path difference of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°, to obtain: tdw (1) , tdw (2) ~ tdw (360) ;

[0252] Step S29: Determine whether tdw (1) = tdw (2) = ~ = tdw (360) = gdw holds;

[0253] If it holds, it indicates that the enameled wire is qualified, the insulation layer thickness of the enameled wire is the standard thickness, and the conductor radius is the standard radius, then skip step S3;

[0254] If it does not hold, it indicates that the enameled wire is unqualified, analyze the proportionality coefficient, mark the non - compliant positions, and enter step S3.

[0255] Step S3: Analyze the proportionality coefficient to determine whether the insulation layer thickness of the enameled wire is uniform; if it is uniform, record the insulation layer thickness according to the standard proportionality coefficient, and end the step; if it is not uniform, calculate the insulation layer thickness and conductor radius of the enameled wire according to the incident and exit distance equation to obtain the inspection report;

[0256] Step S4: Obtain the quantity of all enameled wires, measure the insulation layer thickness and conductor radius of each enameled wire, eliminate the unqualified products, and update the inspection report;

[0257] The specific steps of step S3 are as follows:

[0258] Step S31: Extract the standard proportionality coefficient gdw, and extract the proportionality coefficients of the incident and exit distance to the optical path difference of the laser (emitted by the interferometer) when the incident angles are 1°, 2° up to 360°: tdw(1) , tdw (2) ~tdw (360) ;

[0259] Judge whether tdw (1) =tdw (2) =~=tdw (360) holds;

[0260] If it holds, it means that the conductor radius of the enameled wire is the standard radius and the insulation layer thickness of the enameled wire is uniform. Calculate the insulation layer thickness of the enameled wire and enter step S32;

[0261] If it does not hold, it means that the insulation layer thickness of the enameled wire is not uniform. Conduct a secondary analysis of the proportionality coefficient, calculate the insulation layer thickness of the enameled wire, and enter step S33;

[0262] Step S32: tdw (1) =tdw (2) =~=tdw (360) holds; Calculate tdw (1) ~tdw (360) The average value is denoted as ddw, the uniform insulation layer thickness of the enameled wire is denoted as cod, and calculate the value of cod; Extract the wavelength λ of the laser (emitted by the interferometer) (0) , the refractive index n of the insulation layer;

[0263] Step S321: Extract the optical path differences ix when the incident angles of the laser (emitted by the interferometer) are 1°, 2° up to 360° (1) , ix (2) ~ix (360) ;

[0264] Step S322: Denote the interference order of the laser (emitted by the interferometer) when the incident angle is i° as mn (i) ; Among them, mn (i) is a positive integer; i represents the angle, and the value range of i is: 1~360;

[0265] Define relation 2-1 and relation 2-2;

[0266] Relation 2-1: ix (i) =(mn (i) +0.5)×(λ (0) / n); Among them, ix (i) represents the optical path difference of the laser (emitted by the interferometer) when the incident angle is i°;

[0267] Relation 2-2: ix (i) =mn (i) ×(λ (0) / n);

[0268] Substitute ix (1) ~ix (360) Back-substitute into Equation 2-1 or Equation 2-2, and calculate the interference order of the laser (emitted by the interferometer) when the incident angle is from 1° to 360°, obtaining: mn (1) 、mn (2) ~mn (360) ;

[0269] Step S323: Calculate mn (1) ~mn (360) Calculate the average value, denoted as amn; the calculation formula for cod is:

[0270]

[0271] Step S33: tdw (1) =tdw (2) =~=tdw (360) Does not hold; extract the incident distance equation and calculate the insulation layer thickness and conductor radius of the enameled wire;

[0272] The incident distance equation is:

[0273]

[0274] Among them, α and β represent the incident angle and the refraction angle respectively, r represents the standard radius of the enameled wire conductor; the relationship between α and β satisfies: sin(α) / sin(β)=n;

[0275] d represents the preset thickness of the insulation layer of the enameled wire, that is, the independent variable; redefine il as the incident and exit distance of the laser, that is, the dependent variable;

[0276] Step S331: Extract the true incident and exit distances of the laser (emitted by the interferometer) when the incident angle is from 1° to 360°: ttd (1) 、ttd (2) ~ttd (360) ;

[0277] Substitute ttd (1) ~ttd (360) as il and back-substitute it into the incident distance equation to calculate the insulation layer thickness of the enameled wire when the incident angle is from 1° to 360° (emitted by the interferometer), obtaining: ted (1) 、ted (2) ~ted (360) ;

[0278] Step S332: Extract the standard thickness td of the insulation layer of the enameled wire;

[0279] Record the insulation layer thickness of the enameled wire when the incident angle is i° (emitted by the interferometer) as ted(i) ; where, i represents the angle, and the value range of i is: 1 to 360;

[0280] Step S333: Compare ted (i) with the magnitude of td, and define relational expressions 2-3 and 2-4;

[0281] ted (i) ≥td, relational expression 2-3:

[0282] where, tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference when the incident angle of the laser (emitted by the interferometer) is i°;

[0283] ted (i) <td, relational expression 2-4:

[0284]

[0285] Step S334: Substitute tdw (1) ~tdw (360) into relational expression 2-3 or relational expression 2-4, extract the proportionality coefficient that satisfies relational expression 2-3 as the type A coefficient; extract the proportionality coefficient that satisfies relational expression 2-4 as the type B coefficient; extract the proportionality coefficient that does not satisfy relational expressions 2-3 and 2-4 as the type C coefficient;

[0286] Count the number of type A coefficients and denote it as ua, count the number of type B coefficients and denote it as ub, and count the number of type C coefficients and denote it as uc;

[0287] Step S335: Denote the angles of the 1st to the ua-th type A coefficients as ana (1) ~ana (ua) ;

[0288] Denote the enameled wire's insulation layer thickness corresponding to ana (1) ~ana (ua) as: aad (1) ~aad (ua) ;

[0289] The enameled wire (relative to line segment l (OC) ) has a normal conductor radius and a relatively thick insulation layer at the angle of ana (1) ~ana (ua) , and the thickness is: aad (1) ~aad (ua) ;

[0290] Step S336: Denote the angles of the 1st to the ub-th type B coefficients as anb (1) ~anb (ub) ;

[0291] Take anb (1) ~anb (ub) The insulation layer thickness of the corresponding enameled wire is denoted as: bbd (1) ~bbd (ub) ;

[0292] The enameled wire (relative to the line segment l (OC) ) at an angle of anb (1) ~anb (ub) has a normal conductor radius and a relatively thin insulation layer with a thickness of: bbd (1) ~bbd (ub) ;

[0293] Step S337: Denote the angles of the 1st to uc-th C-type coefficients as anc (1) ~anc (uc) ;

[0294] Take anc (1) ~anc (uc) The insulation layer thickness of the corresponding enameled wire is denoted as: ccd (1) ~ccd (uc) ;

[0295] Take anc (1) ~anc (uc) The corresponding proportionality coefficient is denoted as cdw (1) ~cdw (uc) ;

[0296] Denote the offset coefficient of the conductor radius corresponding to the j-th C-type coefficient as bur (j) ;

[0297] Denote the proportionality coefficient corresponding to the j-th C-type coefficient as cdw (j) ; The value range of j is: 1~uc;

[0298] Step S338: Compare the magnitudes of cdw (j) and td, and define relational expressions 2-5 and relational expression 2-6;

[0299] cdw (j) ≥td, relational expression 2-5:

[0300]

[0301] cdw (j) <td, relational expression 2-6:

[0302]

[0303] Take ccd (1) ~ccd(uc) and cdw (1) ~cdw (uc) Substitute into Equation 2-5 or Equation 2-6 to calculate the offset coefficient of the conductor radius of the 1st to uc-th Class C coefficients, and obtain: bur (1) ~bur (uc) ;

[0304] Step S339: Determine the positive or negative of bur (1) ~bur (uc) to determine the conductor radius;

[0305] Step S3391: The insulation layer thickness at the angle of the enameled wire (relative to line segment l (OC) ) is ana (1) is relatively thin, and the thickness is: ccd (1) ;

[0306] If bur (1) is positive, then the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (1) is relatively thick, and the conductor radius is: (1 + bur (1) ) × r; where r represents the standard radius of the enameled wire radius;

[0307] If bur (1) is negative, then the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (1) is relatively thin, and the conductor radius is: (1 - |bur (1) |) × r; where r represents the standard radius of the enameled wire radius;

[0308] Step S3392: The insulation layer thickness at the angle of the enameled wire (relative to line segment l (OC) ) is ana (2) is relatively thin, and the thickness is: ccd (2) ;

[0309] If bur (2) is positive, then the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (2) is relatively thick, and the conductor radius is: (1 + bur (2) ) × r; where r represents the standard radius of the enameled wire radius;

[0310] If bur (2) is negative, then the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (2) is relatively thin, and the conductor radius is: (1 - |bur (2) |) × r; where r represents the standard radius of the enameled wire radius;

[0311] Step S3393: And so on, the insulating layer thickness at the angle of the enameled wire (relative to line segment l (OC) ) is ana (uc) is thinner, and the thickness is: ccd (uc) ;

[0312] If bur (uc) is positive, the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (uc) is thicker, and the conductor radius is: (1 + bur (uc) ) × r; where r represents the standard radius of the enameled wire radius;

[0313] If bur (uc) is negative, the conductor at the angle of the enameled wire (relative to line segment l (OC) ) is ana (uc) is thinner, and the conductor radius is: (1 - |bur (uc) |) × r;

[0314] Step S34: Summarize the data in Steps S31 to S33 as an inspection report.

[0315] Step S4: Obtain the quantity of all enameled wires, measure the insulating layer thickness and conductor radius of each enameled wire, eliminate unqualified products, and obtain an inspection report.

[0316] The above formulas are all dimensionless and take their numerical values for calculation. The formulas are obtained by collecting a large amount of data for software simulation to get a formula closest to the actual situation. The preset parameters in the formulas are set by those skilled in the art according to the actual situation. If there are weight coefficients and proportionality coefficients, the sizes set are for quantifying each parameter to obtain a specific numerical value for subsequent comparison. Regarding the sizes of the weight coefficients and proportionality coefficients, as long as they do not affect the proportional relationship between the parameters and the quantified numerical values, it is fine.

[0317] Finally, it should be noted that: the above embodiments are only specific embodiments of the present invention, used to illustrate the technical solutions of the present invention, rather than limiting it. The protection scope of the present invention is not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that: any person skilled in the art within the technical scope disclosed by the present invention can still modify the technical solutions recorded in the foregoing embodiments or can easily think of changes, or perform equivalent replacements for some of the technical features; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims

1. A method for measuring the insulation thickness and conductor radius of enameled wire based on optical principles, characterized in that, The method comprises: Step S1: obtaining the standard thickness of the enameled wire insulation layer, the refractive index of the insulation material, the standard radius of the enameled wire conductor, the wavelength of the laser, and the distance from the interferometer light source to the screen as indicator data; Step S2: Adjust the incident angle of the laser, calculate the optical path difference and the interference fringe width; construct the incident distance equation, the incident distance equation of the laser is: Wherein, α and β represent the angle of incidence and the angle of refraction respectively, and r represents the standard radius of the enameled wire conductor; d represents the preset thickness of the insulation layer of the enameled wire; il is redefined as the incident distance of the laser; And according to the index data, the standard incident and exit distances and the standard optical path difference of the laser are calculated to obtain the standard proportional coefficient; based on the optical path difference and the interference fringe width, the proportional coefficient of the laser at each incident angle is calculated; the distance from the interferometer light source to the screen is recorded as Ll, and the calculation formula 1-1 is defined: tad (i) =(λ×Ll) / ix (i) ; where, the wavelength when the laser propagates in the insulating layer is denoted as λ, and tad (i) represents the one-way incident and exit distance of the laser when the incident angle is i°, and ix (i) represents the optical path difference of the laser when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360; Define calculation formula 1-2: Among them, the wavelength of the laser is denoted as λ (0) , tbd (i) represents the secondary incident and exit distance of the laser when the incident angle is i°, iw (i) represents the interference fringe width of the laser when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360; Define calculation formulas 1 - 3: ttd (i) =(tad (i) +tbd (i) ) / 2; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°; Define calculation formulas 1 - 5: tdw (i) = ttd (i) / ix (i) ; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°, ix (i) represents the optical path difference of the laser when the incident angle is i°, and tdw (i) represents the proportionality coefficient between the incident and exit distance and the optical path difference of the laser when the incident angle is i°; i represents the angle, and the value range of i is: 1 - 360; According to the standard proportionality coefficient and the proportionality coefficients of each incident angle, determine whether the enameled wire is qualified; if it is qualified, skip step S3, if it is unqualified, analyze the proportionality coefficient and measure the insulation layer thickness and conductor radius of the enameled wire; Step S3: Analyze the proportionality coefficient to determine whether the insulation thickness of the enameled wire is uniform; if it is uniform, record it as the insulation thickness according to the standard proportionality coefficient and end the step; if it is not uniform, calculate the insulation thickness and conductor radius of the enameled wire according to the incident distance equation to obtain an inspection report; Step S4: Obtain the number of all enameled wires, and measure the insulation thickness and conductor radius of each enameled wire, eliminate unqualified products, and update the inspection report.

2. The method for measuring the insulation thickness and conductor radius of an enameled wire based on the optical principle according to claim 1, characterized in that The specific steps of step S2 are as follows: Step S21: Set the geometric center of the enameled wire as the vertex, recorded as point O; set the right side of the vertex as the starting position, recorded as point C; Assume that the position where the laser enters the enameled wire is point A, the position where the laser contacts the conductor inside the enameled wire and is reflected is point E, and the position where the laser is refracted from the enameled wire is point B; Step S22: Based on the point preset in step S21, the magnitude of the incident angle ∠AOC of the enameled wire is recorded as α, and the magnitude of the refraction angle ∠EAO is recorded as β; Let the wavelength of the laser be denoted as λ (0) , and let the refractive index of the insulating layer be denoted as n; it satisfies: sin(α) / sin(β) = n; When the laser propagates in the insulating layer, the wavelength is denoted as λ, and the calculation formula of λ is: λ = λ (0) / n; Adjust the incident angle α of the laser counterclockwise from 1° to 360° in sequence, and count the optical path differences when the incident angles are from 1° to 360°, denoted as: ix (1) ~ix (360) ; Statistically analyze the interference fringe widths at incident angles from 1° to 360°, denoted as: iw (1) ~iw (360) ; Step S23: the standard radius of the enameled wire conductor is recorded as r, and the standard thickness of the enameled wire insulation layer is recorded as td; Preset the thickness of the enameled wire insulation layer as d, and based on the data in construction steps S21 to S23, construct a laser refraction and reflection equation set to obtain formula B (1) ~ formula B (7) ; Step S24: Combining the calculation formula in step S23 to construct an equation for the incident and exiting distance of the laser; Step S25: Take the standard thickness td of the enameled wire insulation layer as d in Formula B (1) ~ Formula B (7) and successively calculate the standard incident and exit distances when the laser incident angle is from 1° to 360°, denoted as: gd (1) ~ gd (360) ; Let the distance from the interferometer light source to the screen be Ll, and define calculation formula 1-1: tad (i) =(λ × Ll) / ix (i) ; where, tad (i) represents the one-way incident distance of the laser when the incident angle is i°; ix (i) represents the optical path difference of the laser when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360; Substitute ix (1) ~ix (360) into the calculation formula 1-1, and calculate the one-way incident distance of the laser when the incident angle is from 1° to 360°, and obtain: tad (1) ~tad (360) ; The subsequent steps of step S25 are as follows: Step S26: Define calculation formula 1-2: Among them, tbd (i) represents the secondary incident and exit distance of the laser when the incident angle is i°, iw (i) represents the interference fringe width of the laser when the incident angle is i°; i represents the angle, and the value range of i is: 1 to 360; Substitute iw (1) ~iw (360) into calculation formula 1-2, and calculate the secondary incident distance of the laser when the incident angle is from 1° to 360°, and obtain: tbd (1) ~tbd (360) ; Define calculation formulas 1-3: ttd (i) =(tad (i) +tbd (i) ) / 2; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°; Substitute tad (1) ~tad (360) and tbd (1) ~tbd (360) into Equation 1-3, calculate the true incident and exit distances of the laser when the incident angle is from 1° to 360°, and obtain: ttd (1) ~ttd (360) ; Step S27: Define calculation formulas 1-4: gw (i) =(λ×Ll) / gd (i) ; where gd (i) represents the standard incident and exit distance of the laser when the incident angle is i°, and gw (i) represents the standard optical path difference corresponding to gd (i) ; i represents the angle; Substitute gd (1) ~gd (360) into calculation formulas 1 - 4, calculate the standard optical path difference of the standard incident distance with the laser incident angle ranging from 1° to 360°, and obtain gw (1) ~gw (360) ; Calculate the standard proportional coefficient of the incident distance and optical path difference of the enameled wire, recorded as gdw; the calculation formula of gdw is: Step S28: Define calculation formulas 1-5: tdw (i) = ttd (i) / ix (i) ; where, ttd (i) represents the true incident and exit distance of the laser when the incident angle is i°, ix (i) represents the optical path difference of the laser when the incident angle is i°, and tdw (i) represents the proportionality coefficient between the incident and exit distance and the optical path difference of the laser when the incident angle of the laser is i°; i represents the angle, and the value range of i is: 1 to 360; Substitute ttd (1) ~ttd (360) and ix (1) ~ix (360) into calculation formula 1-5, calculate the proportionality coefficient of the incident and exit distances and the optical path difference when the laser incident angle is from 1° to 360°, and obtain: tdw (1) ~tdw (360) ; Step S29: Determine whether tdw (1) = tdw (2) = ~= tdw (360) = gdw holds; If so, it means that the enameled wire is qualified, the insulation thickness of the enameled wire is the standard thickness and the conductor radius is the standard radius, and step S3 is skipped; If not, it means that the enameled wire is unqualified, the proportional coefficient is analyzed, the non-compliant position is marked, and step S3 is entered; The specific steps of step S23 are as follows: Step S231: Denote the line segment from point O to point A as l (OA) , and the length of l (OA) is (r + d); In triangle △OEA, let the size of angle ∠OEA be denoted as θ, and the size of angle ∠EOA be denoted as μ; let the line segment from point O to point E be denoted as l (OE) , l (OE) has a length of r; let the line segment from point E to point A be denoted as l (EA) ; In triangle △OEA, according to the sine theorem, we get the relationship a-1-1: Substitute the data of ∠OEA, l (OA) , l (OA) and ∠EAO to obtain the relational expression a - 1 - 2: Based on the relationship a-1-2: the calculation formula for θ is obtained: Take the calculation formula of θ as Formula B (1) ; Step S232: Denote the line segment from point E to point A as l (EA) , and denote the length of l (OA) as l; In triangle △OEA, the law of sine gives relations a-1-3 and a-1-4; Relationship a-1-3: Relational expression a-1-4: ∠EOA=μ=π-β-θ; According to the relationship a-1-3 and a-1-4, the calculation formula of l is obtained: Take the calculation formula of l as Formula B (2) ; Step S233: Denote the line segment from point A to point B as l (AB) , draw a straight line l (OE) Extend it in the direction of l (AB) and intersect it with l (AB) , and denote the intersection point as point F; Denote the line segment from point F to point A as l (FA) , and denote the length of l (FA) as h; In triangle △OBF, the formula for calculating h is: h = sin(μ) × (r + d); The formula for calculating h is taken as formula B (3) ; Let the size of the angle ∠EBF be denoted as δ. In the triangle △EBF, the calculation formula for δ is: δ = arccos(h / l); Let the calculation formula of δ be Formula B (4) ; The subsequent steps of step S233 are as follows: Step S234: Denote the line segment from point O to point C as l (OC) , draw a perpendicular line from point B to l (OC) in the direction, and the foot of the perpendicular is point G; Rotate l (OC) counterclockwise by 90° to obtain the straight line l (OD) ; Denote the line segment from point B to point G as l (BG) , according to the angle transformation of the triangle, the magnitudes of ∠EBO and ∠EAO are equal, both being β; Denote the line segment from point B to point G as l (BG) , l (BG) Divide the angle ∠EBO into the angle ∠OBG and the angle ∠GBE; Denote the magnitude of the angle ∠OBG as β1 and the magnitude of the angle ∠GBE as β2; According to the principle of parallel lines, the magnitude of angle ∠DOB is equal to the magnitude of angle ∠OBG, both being β1; the calculation formula for β1 is: β1 = (π / 2) - α - (2×μ); the calculation formula for β1 is taken as formula B (5) ; Step S235: Make point B along l (OC) direction, and the extension line of point A along l (OD) direction. The intersection point of the extension lines is H; Let the size of the angle ∠ABH be denoted as η, and the relational expressions a-2-1 and a-2-2 are obtained from angle transformation; Relational expression a-2-1: η = (π / 2) - δ - β2; Relational expression a-2-1: β2 = β - β1; Combine equation a-2-1, equation a-2-2, and formula B (5) , and the calculation formula for η is obtained: η = π - δ - β - α - (2 × μ); The calculation formula of η is taken as formula B (6) ; Step S236: Denote the line segment from point H to point A as l (HA) , in triangle △ABH, the incident and exit distance of the laser is l (HA) , denote l (HA) 's length as il; Simultaneous formula B (1) ~ formula B (6) The calculation formula for il is obtained: il = (2 × h) × sin(η); Take the calculation formula of il as formula B (7) , and take formula B (1) ~ formula B (7) as the laser catadioptric equation set and enter step S24.

3. A method for measuring the insulation thickness and conductor radius of enameled wire based on the optical principle according to claim 2, characterized in that, The workflow of step S24 is as follows: Step S241: Extract formula B (1) : where d represents the preset thickness of the enameled wire insulation layer; Relational expression a-1-4: μ = π - β - θ; Formula B (2) : Formula B (3) : h = sin(μ) × (r + d); Formula B (4) : δ = arccos(h / l); Formula B (6) : η = π - δ - β - α - (2 × μ); Step S242: Substitute formula B (2) and formula B (3) into formula B (4) to obtain formula C (1) : Substitute formula B (1) into the relational expression a - 1 - 4 to obtain formula C (2) : According to the properties of inverse trigonometric functions, formula C is obtained (3) : Step S243: Substitute formula C (2) and formula C (3) into formula B (6) to obtain formula C (4) : η = (π / 2) - α - μ; Extraction formula B (7) : il = (2 × h) × sin(η); Substitute formula C (4) and formula B (3) into formula B (7) to obtain formula C (5) : Substitute formula C (2) into formula C (5) to obtain the incident and exit distance equation of the laser: Where α and β respectively represent the incident angle and the refraction angle, and r represents the standard radius of the enameled wire conductor; d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; il is redefined as the incident and exit distance of the laser, that is, the dependent variable.

4. A method for measuring the insulation thickness and conductor radius of enameled wire based on the optical principle according to claim 2, characterized in that, The specific steps of step S3 are as follows: Step S31: Extract the standard proportionality coefficient gdw, and extract the proportionality coefficients of the incident and outgoing distances to the optical path difference when the laser incident angle is from 1° to 360°: tdw (1) , tdw (2) ~tdw (360) ; Judge tdw (1) = tdw (2) = ~= tdw (360) Whether it holds; If it holds, it means that the conductor radius of the enameled wire is the standard radius and the insulation layer thickness of the enameled wire is uniform. Calculate the insulation layer thickness of the enameled wire and enter step S32; If it does not hold, it means that the insulation layer thickness of the enameled wire is not uniform. Conduct a secondary analysis of the proportionality coefficient, calculate the insulation layer thickness of the enameled wire, and enter step S33; Step S32: tdw (1) = tdw (2) = ~= tdw (360) Holds; calculate tdw (1) ~tdw (360) The average value of ~tdw is denoted as ddw, the thickness of the enameled wire insulation layer is denoted as cod, and the value of cod is calculated; the wavelength λ of the laser is extracted (0) , the refractive index n of the insulation layer; Step S33: tdw (1) = tdw (2) = ~= tdw (360) does not hold; extract the incident distance equation and calculate the insulation layer thickness and conductor radius of the enameled wire; The incident and exit distance equation is: Where α and β respectively represent the incident angle and the refraction angle, and r represents the standard radius of the enameled wire conductor; The relationship between α and β satisfies: sin(α) / sin(β) = n; d represents the preset thickness of the enameled wire insulation layer, that is, the independent variable; il is redefined as the incident and exit distance of the laser, that is, the dependent variable; Step S34: Summarize the data in steps S31 to S33 as an inspection report.

5. A method for measuring the insulation thickness and conductor radius of enameled wire based on the optical principle according to claim 4, characterized in that, The specific steps of step S32 are as follows: Step S321: Extract the optical path differences ix when the laser incident angle is from 1° to 360° (1) ~ix (360) ; Step S322: Denote the interference order of the laser when the incident angle is i° as mn (i) ; where, mn (i) is a positive integer; i represents the angle, and the value range of i is: 1 to 360; Define relational expressions 2-1 and 2-2; Relationship 2-1: ix (i) = (mn (i) + 0.5) × (λ (0) / n); where, ix (i) represents the optical path difference of the laser when the incident angle is i°; Relationship 2-2: ix (i) = mn (i) × (λ (0) / n); Substitute ix (1) ~ix (360) backward into relationship formula 2-1 or relationship formula 2-2, and calculate the interference order of the laser when the incident angle is from 1° to 360°, obtaining: mn (1) ~mn (360) ; Step S323: Calculate mn (1) ~mn (360) The average value of is denoted as amn; the calculation formula for cod is:

6. A measuring method for the insulation thickness and conductor radius of enameled wire based on the optical principle according to claim 5, characterized in that, The specific steps of step S33 are as follows: Step S331: Extract the true incident and exit distances of the laser when the incident angle is from 1° to 360°: ttd (1) ~ttd (360) ; Take ttd (1) ~ttd (360) As il is inversely substituted into the incident distance equation, calculate the insulation layer thickness of the enameled wire when the incident angle is from 1° to 360°, and obtain: ted (1) ~ted (360) ; Step S332: Extract the standard thickness td of the enameled wire insulation layer; The insulation layer thickness of the enameled wire when the incident angle is i° is denoted as ted (i) ; where i represents the angle, and the value range of i is: 1 to 360; Step S333: Compare ted (i) with the size of td, and define relational expressions 2-3 and 2-4; ted (i) ≥td, relationship 2-3: Among them, tdw (i) represents the proportionality coefficient of the incident and exit distance to the optical path difference when the incident angle of the laser is i°; ted (i) <td, relational expression 2-4: Step S334: Substitute tdw (1) ~tdw (360) into Equation 2-3 or Equation 2-4, extract the proportionality coefficient that satisfies Equation 2-3 as the Class A coefficient; extract the proportionality coefficient that satisfies Equation 2-4 as the Class B coefficient; extract the proportionality coefficient that does not satisfy Equation 2-3 and Equation 2-4 as the Class C coefficient; Count the number of A-type coefficients as ua, the number of B-type coefficients as ub, and the number of C-type coefficients as uc; Step S335: Denote the angles of the 1st to the ua-th type-A coefficients as ana (1) ~ana (ua) ; ana (1) ~ana (ua) The insulation layer thickness of the corresponding enameled wire is denoted as: aad (1) ~aad (ua) ; The angle of the enameled wire is ana (1) ~ana (ua) At this point, the conductor radius is normal, and the insulation layer is relatively thick, with a thickness of: aad (1) ~aad (ua) ; Step S336: Denote the angles of the 1st to the ub-th type B coefficients as anb (1) ~anb (ub) ; Take anb (1) ~anb (ub) The insulation layer thickness of the corresponding enameled wire is denoted as: bbd (1) ~bbd (ub) ; The angle of the enameled wire is anb (1) ~anb (ub) At this point, the radius of the conductor is normal, and the thickness of the insulation layer is relatively thin, with a thickness of: bbd (1) ~bbd (ub) .

7. A method for measuring the insulation thickness and conductor radius of enameled wire based on the optical principle according to claim 6, characterized in that, The subsequent steps of step S336 are as follows: Step S337: Denote the angles of the 1st to uc-th C type coefficients as anc (1) ~anc (uc) ; Take anc (1) ~anc (uc) The insulation layer thickness of the corresponding enameled wire is denoted as: ccd (1) ~ccd (uc) ; The anc (1) ~anc (uc) The corresponding proportionality coefficient is denoted as cdw (1) ~cdw (uc) ; The offset coefficient of the conductor radius corresponding to the j-th C-type coefficient is denoted as bur (j) ; Denote the proportionality coefficient corresponding to the j-th C-type coefficient as cdw (j) ; The value range of j is: 1 to uc; Step S338: Compare cdw (j) with the size of td, and define relational expressions 2-5 and 2-6; cdw (j) ≥td, relationship 2-5: cdw (j) <td, relational expression 2-6: The CCD (1) ~ the CCD (uc) and the CDW (1) ~ the CDW (uc) are substituted into Equation 2-5 or Equation 2-6 to calculate the offset coefficients of the conductor radii of the 1st to uc-th Class C coefficients, obtaining: bur (1) ~ bur (uc) ; Step S339: Determine the positive or negative of bur (1) ~bur (uc) to determine the conductor radius; Step S3391: The angle of the enameled wire is ana (1) The thickness of the insulation layer at (1) is relatively thin, and the thickness is: ccd (1) ; If bur (1) is positive, the angle of the enameled wire is ana (1) The conductor at is thicker, and the conductor radius is: (1 + bur (1) ) × r; where r represents the standard radius of the enameled wire radius; If bur (1) is negative, the enameled wire angle is ana (1) where the conductor is thinner, and the conductor radius is: (1 - |bur (1) |) × r; Step S3392: The angle of the enameled wire is ana (2) The thickness of the insulating layer at the position is relatively thin, and the thickness is: ccd (2) ; If bur (2) is positive, the angle of the enameled wire is ana (2) where the conductor is thicker, and the conductor radius is: (1 + bur (2) ) × r; If bur (2) is negative, the enameled wire angle is ana (2) where the conductor is thinner, and the conductor radius is: (1 - |bur (2) |) × r; Step S3393: And so on, the enameled wire angle is ana (uc) The insulation layer thickness at the position is relatively thin, and the thickness is: ccd (uc) ; If bur (uc) is positive, the enameled wire angle is ana (uc) where the conductor is thicker, and the conductor radius is: (1 + bur (uc) ) × r; If bur (uc) is negative, the enameled wire angle is ana (uc) where the conductor is thinner, and the conductor radius is: (1 - |bur (uc) |) × r.

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