Sample analyzer

Abstract

A sample analyzer disclosed by the present invention comprises a sample unit, a reagent unit, a reaction unit, a sample separate injection unit, a reagent separate injection unit and a detection unit, the detection unit comprises a first optical detection assembly and a reference light source assembly, and the first optical detection assembly is used for receiving and detecting signal light emitted by a reaction liquid; the reference light source assembly is used for emitting reference light to the first light measurement assembly, and the first light measurement assembly is further used for receiving the reference light and detecting the reference light; the reference light source assembly comprises a first light source and a second light source, the first light source is configured to be capable of emitting light to form first reference light incident to the first light measurement assembly, and the second light source is configured to be capable of emitting light to form second reference light incident to the first light measurement assembly; at least part of the first reference light and at least part of the second reference light are different in light intensity. The light intensity variation range of the emergent light of the single light source is relatively small, control over the light source is facilitated, and meanwhile the service life of the light source can be prolonged.

Description

Technical Field

[0001] The present invention relates to the field of medical devices, and particularly to a sample analyzer. Background Art

[0002] An optical measurement device is a detection device for sample analysis. It can receive the signal light emitted by the sample and detect the light intensity. The controller obtains the detection result based on the detected light intensity. After the optical measurement device is used for a certain period of time, it needs to be calibrated or verified for light intensity to reduce the influence of signal drift on the detection result. Taking calibration as an example, during calibration, a reference light source emits reference light to the optical measurement device, and the controller calibrates the optical measurement device based on the reference light. In the related art, usually a single reference light source is used to emit reference light. When the optical measurement device needs reference light in a large light intensity range, the emitted light intensity of the single reference light source needs to vary within a large range, which has high requirements for control and also reduces the service life of the light source. Summary of the Invention

[0003] The present invention aims to solve the problem that a single reference light source cannot provide reference light in a large light intensity range. For this purpose, the present invention provides a sample analyzer, which can reduce the control requirements and extend the service life of the light source.

[0004] According to the sample analyzer in the first embodiment of the present invention, it includes:

[0005] A sample unit for carrying a sample;

[0006] A reagent unit for carrying a reagent;

[0007] A reaction unit is provided with at least one reaction site, and the reaction site is used to place a reaction container and incubate the reaction solution in the reaction container. The reaction solution is prepared through the sample;

[0008] A sample dispensing unit for sucking the sample and discharging it into the reaction container located at the reaction site;

[0009] A reagent dispensing unit for sucking the reagent and discharging it into the reaction container located at the reaction site;

[0010] A detection unit includes a first optical measurement component and a reference light source component. The first optical measurement component is used to receive the signal light emitted by the reaction solution and perform detection. The reference light source component is used to emit reference light to the first optical measurement component, and the first optical measurement component is further used to receive the reference light and perform detection;

[0011] Among them, the reference light source assembly includes a first light source and a second light source. The first light source is configured to be able to emit light rays to form a first reference light incident on the first light measurement assembly, and the second light source is configured to be able to emit light rays to form a second reference light incident on the first light measurement assembly. At least part of the first reference light and at least part of the second reference light have different light intensities.

[0012] The sample analyzer according to the embodiment of the present invention has at least the following beneficial effects:

[0013] The first light source and the second light source respectively emit light rays in different light intensity ranges. The variation range of the light intensity of the light rays emitted by a single light source is relatively small, which is beneficial to the control of the light source and can also extend the service life of the light source.

[0014] In other embodiments of the present invention, it is defined that in response to the unit voltage change of the first light source, the light intensity change value generated by the first reference light incident on the first light measurement assembly is a first change value, and in response to the same unit voltage change of the second light source, the light intensity change value generated by the second reference light incident on the first light measurement assembly is a second change value. The reference light source is configured such that the first change value is greater than the second change value.

[0015] In other embodiments of the present invention, the reference light source is configured such that the maximum light intensity of the first reference light incident on the first light measurement assembly is greater than the maximum light intensity of the second reference light incident on the first light measurement assembly.

[0016] In other embodiments of the present invention, the reference light source is configured such that the light intensity range of the first reference light incident on the first light measurement assembly is defined as a first range, and the light intensity range of the second reference light incident on the first light measurement assembly is defined as a second range. The difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range.

[0017] In other embodiments of the present invention, the sample analyzer further includes a controller, and the reference light source assembly further includes a first optical element and a second light measurement assembly, where:

[0018] The reference light source assembly is further configured such that the first light source can emit light rays to the first optical element, so that the first optical element emits the first reference light and a third reference light, and the second light measurement assembly can receive the third reference light and detect the light intensity of the third reference light; the controller is configured to be able to obtain the light intensity of the first reference light based on the third reference light;

[0019] And / or, the reference light source assembly is further configured such that the second light source can emit light towards the first optical element, so that the first optical element emits the second reference light and the fourth reference light, and the second light measurement assembly can receive the fourth reference light and detect the light intensity of the fourth reference light; the controller is configured to be able to obtain the light intensity of the second reference light based on the fourth reference light.

[0020] In other embodiments of the present invention, the reference light source is configured such that the light emitted by the first light source is reflected by the first optical element to form the first reference light, and the light emitted by the first light source passes through the first optical element to form the third reference light;

[0021] And / or, the reference light source is configured such that the light emitted by the second light source passes through the first optical element to form the second reference light, and the light emitted by the second light source is reflected by the first optical element to form the fourth reference light.

[0022] In other embodiments of the present invention, the reference light source assembly further includes a main body assembly, the main body assembly has a first channel and a second channel arranged crosswise, the first optical element is arranged at the intersection of the first channel and the second channel, opposite ends of the first channel respectively lead to the second light source and the first light measurement assembly, and opposite ends of the second channel respectively lead to the first light source and the second light measurement assembly;

[0023] Wherein, the first light source is configured to emit light towards the first optical element through the second channel, and the first reference light formed by reflection of the first optical element can be emitted towards the first light measurement assembly through the first channel, and the third reference light formed by transmission of the first optical element can be emitted towards the second light measurement assembly through the second channel;

[0024] The second light source is configured to emit light towards the first optical element through the first channel, and the second reference light formed by transmission of the first optical element can be emitted towards the first light measurement assembly through the first channel, and the fourth reference light formed by reflection of the first optical element can be emitted towards the second light measurement assembly through the second channel.

[0025] In other embodiments of the present invention, the sample analyzer further includes at least one of the following solutions:

[0026] The reference light source assembly further includes a first diaphragm, and the first diaphragm is arranged in the second channel between the first optical element and the first light source;

[0027] The reference light source assembly further includes a first attenuation sheet, and the first attenuation sheet is disposed in the second channel between the first optical element and the first light source;

[0028] The reference light source assembly further includes a second aperture, and the second aperture is disposed in the first channel between the first optical element and the second light source;

[0029] The reference light source assembly further includes a second attenuation sheet, and the second attenuation sheet is disposed in the first channel between the first optical element and the second light source;

[0030] The reference light source assembly further includes a third attenuation sheet, and the second attenuation sheet is disposed in the first channel between the first optical element and the first optical measurement assembly.

[0031] In other embodiments of the present invention, the reference light source assembly further includes a first switching mechanism;

[0032] Wherein, the first switching mechanism is configured to be able to drive the first light source and the second light source to move relative to the first optical measurement assembly. When the first light source moves to the working position and the second light source leaves the working position, the first light source emits light to the first optical measurement assembly to form the first reference light. When the second light source moves to the working position and the first light source leaves the working position, the second light source emits light to the first optical measurement assembly to form the second reference light.

[0033] In other embodiments of the present invention, the sample analyzer further includes a controller, and the reference light source assembly further includes a first optical element and a second optical measurement assembly, wherein:

[0034] The reference light source assembly is further configured that when the first light source moves to the working position and the second light source leaves the working position, the first light source can emit light to the first optical element, so that the first optical element emits the first reference light and the third reference light, and the second optical measurement assembly can receive the third reference light and detect the light intensity of the third reference light; the controller is configured to be able to obtain the light intensity of the first reference light based on the third reference light;

[0035] And when the second light source moves to the working position and the first light source leaves the working position, the second light source can emit light to the first optical element, so that the first optical element emits the second reference light and the fourth reference light, and the second optical measurement assembly can receive the fourth reference light and detect the light intensity of the fourth reference light; the controller is configured to be able to obtain the light intensity of the second reference light based on the fourth reference light.

[0036] In other embodiments of the present invention, the reference light source assembly further includes a main body assembly, the main body assembly having a first channel and a second channel. One end of the first channel leads to the first optical measurement assembly, and the other end is an incident end. One end of the second channel leads to the second optical measurement assembly, and the other end communicates with the first channel. The first optical element is disposed at the connection of the first channel and the second channel;

[0037] Wherein, when the first light source moves to the working position and the second light source leaves the working position, the first light source emits light to the first optical element through the incident end, and moreover, the first reference light formed by reflection of the first optical element can be emitted to the first optical measurement assembly through the first channel, and the third reference light formed by transmission of the first optical element can be emitted to the second optical measurement assembly through the second channel;

[0038] And, when the second light source moves to the working position and the first light source leaves the working position, the second light source emits light to the first optical element through the incident end, and moreover, the second reference light formed by transmission of the first optical element can be emitted to the first optical measurement assembly through the first channel, and the fourth reference light formed by reflection of the first optical element can be emitted to the second optical measurement assembly through the second channel.

[0039] In other embodiments of the present invention, the first optical element is a beam splitter or a dichroic sheet.

[0040] In other embodiments of the present invention, the reference light source assembly is further configured such that when one of the first light source and the second light source is working, the other stops working.

[0041] In other embodiments of the present invention, the sample analyzer further includes a controller, and the controller is configured to calibrate the first optical measurement assembly based on the light intensity of the first reference light detected by the first optical measurement assembly to form a calibration curve, and moreover, control the first optical measurement assembly to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value;

[0042] And / or, the controller is configured to verify the first optical measurement assembly based on the light intensity of the second reference light detected by the first optical measurement assembly.

[0043] In other embodiments of the present invention, the sample analyzer further includes a controller;

[0044] Wherein, the controller is configured to control the first light source to form the first reference lights with different light intensities, calibrate the first light measurement component based on the light intensities of the first reference lights detected by the first light measurement component to form a calibration curve, and control the first light measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value; and / or, the controller is configured to control the second light source to form the second reference lights with different light intensities, and verify the first light measurement component based on the light intensities of the second reference lights detected by the first light measurement component;

[0045] Alternatively, the controller is configured to calibrate the first light measurement component based on the light intensity of the first reference light and the light intensity of the second reference light detected by the first light measurement component to form a calibration curve, and control the first light measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value.

[0046] According to the sample analyzer in the second embodiment of the present invention, it includes:

[0047] A sample unit for carrying a sample;

[0048] A reagent unit for carrying a reagent;

[0049] A reaction unit is provided with at least one reaction site, and the reaction site is used for placing a reaction container and incubating the reaction solution in the reaction container, and the reaction solution is prepared by the sample;

[0050] A sample dispensing unit for sucking a sample and discharging it into the reaction container located at the reaction site;

[0051] A reagent dispensing unit for sucking a reagent and discharging it into the reaction container located at the reaction site;

[0052] A detection unit includes a first light measurement component and a reference light source component. The first light measurement component is configured to receive and detect the signal light emitted by the reaction solution, and the reference light source component is configured to emit reference light to the first light measurement component, and the first light measurement component is further configured to receive and detect the reference light;

[0053] Wherein, the reference light source assembly includes a third light source, a second switching mechanism, and an optical assembly. The optical assembly includes a second optical element and a third optical element. The second switching mechanism is configured to drive relative movement between the optical assembly and the third light source. When the third light source emits light to the second optical element, the second optical element emits a first reference light to the first optical measurement assembly. And when the third light source emits light to the third optical element, the third optical element emits a second reference light to the first optical measurement assembly;

[0054] The light intensities of at least part of the first reference light and at least part of the second reference light are different.

[0055] In other embodiments of the present invention, both the second optical element and the third optical element are beam splitters, and the beam splitting ratios of the second optical element and the third optical element are different;

[0056] Alternatively, both the second optical element and the third optical element are attenuation sheets, and the transmittances of the second optical element and the third optical element are different.

[0057] In other embodiments of the present invention, it is defined that in response to a unit voltage change of the third light source, the value of the light intensity change generated by the first reference light incident on the first optical measurement assembly is a first change value, and in response to the same unit voltage change of the third light source, the value of the light intensity change generated by the second reference light incident on the first optical measurement assembly is a second change value, and the first change value is greater than the second change value.

[0058] In other embodiments of the present invention, the reference light source is configured such that the light intensity range of the first reference light incident on the first optical measurement assembly is a first range, the light intensity range of the second reference light incident on the first optical measurement assembly is a second range, and the difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range.

[0059] In other embodiments of the present invention, the sample analyzer further includes a controller;

[0060] Wherein, the controller is configured to control the first light source to form the first reference lights with different light intensities, and calibrate the first optical measurement assembly based on the light intensities of the first reference lights detected by the first optical measurement assembly to form a calibration curve, and control the first optical measurement assembly to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value; and / or, the controller is configured to control the second light source to form the second reference lights with different light intensities, and verify the first optical measurement assembly based on the light intensities of the second reference lights detected by the first optical measurement assembly;

[0061] Alternatively, the controller is configured to calibrate the first optical measurement component based on the light intensity of the first reference light detected by the first optical measurement component and the light intensity of the second reference light to form a calibration curve, and control the first optical measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value.

[0062] Additional aspects and advantages of the present invention will be given in part in the following description, become apparent in part from the following description, or be learned through the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0063] The present invention will be further described below in conjunction with the drawings and embodiments, where:

[0064] Figure 1 is a schematic diagram of the modules of the sample analyzer in the first embodiment of the present invention;

[0065] Figure 2 is a three-dimensional schematic diagram of the detection unit in the first embodiment of the present invention;

[0066] Figure 3 is Figure 2 a cross-sectional schematic diagram of the detection unit in

[0067] Figure 4 is Figure 2 an exploded schematic diagram of the detection unit in

[0068] Figure 5 is a schematic diagram of the first reference light incident on the first optical measurement component in the first embodiment;

[0069] Figure 6 is a schematic diagram of the second reference light incident on the first optical measurement component in the first embodiment;

[0070] Figure 7 is a schematic diagram of the first reference light incident on the first optical measurement component in another embodiment;

[0071] Figure 8 is a schematic diagram of the second reference light incident on the first optical measurement component in another embodiment;

[0072] Figure 9 is a schematic diagram of the first reference light incident on the first optical measurement component in the second embodiment;

[0073] Figure 10 is a schematic diagram of the second reference light incident on the first optical measurement component in the second embodiment.

[0074] Reference numerals:

[0075] Sample unit 10;

[0076] Sample dispensing unit 20, sample needle 21, first moving member 22;

[0077] Reagent unit 30;

[0078] Reagent dispensing unit 40, reagent needle 41, second moving member 42;

[0079] Reaction unit 50;

[0080] Mixing unit 60;

[0081] Detection unit 70.

[0082] First optical measurement assembly 100;

[0083] Second optical measurement assembly 200;

[0084] Reference light source assembly 300, first light source 310, second light source 320, first optical element 330, main body member 340, first channel 341, second channel 342, first aperture 350, first attenuation sheet 360, second aperture 370, second attenuation sheet 380, third attenuation sheet 390, first switching mechanism 3100, third light source 3110, second switching mechanism 3120, second optical element 3130, third optical element 3140;

[0085] First reference light X 1 , second reference light X 2 , third reference light X 3 , fourth reference light X 4 . Detailed implementation manners

[0086] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions from beginning to end. The embodiments described below with reference to the drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention.

[0087] In the description of the present invention, it should be understood that the orientation descriptions, such as up, down, front, back, left, right, etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation to the present invention.

[0088] In the description of the present invention, "several" means more than one, "multiple" means more than two, and understandings such as "greater than", "less than", "exceeding", etc. do not include the base number, and understandings such as "above", "below", "within", etc. include the base number. If there is a description of "first" and "second", it is only for the purpose of distinguishing technical features and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence relationship of the indicated technical features.

[0089] In the description of the present invention, unless otherwise clearly defined, words such as "set", "installed", "connected", etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in the present invention in combination with the specific content of the technical solution.

[0090] In the description of the present invention, the description with reference to terms such as "one embodiment", "some embodiments", "schematic embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments or examples.

[0091] This application provides a sample analyzer, such as in vitro diagnostic instruments like hematology analyzers, biochemical analyzers, immunoassays, coagulation analyzers, etc. In the following description, an immunoassay analyzer is mainly taken as an example. Refer to Figure 1 、 Figure 2 ,refer to Figure 1 ,which shows a schematic plan view of the sample analyzer in the first embodiment of the present invention. The arc-shaped dotted line in the figure represents the rotation trajectory of the rotating component. The sample analyzer of the embodiment of the present invention includes a sample unit 10, a sample dispensing unit 20, a reagent unit 30, a reaction unit 50, a mixing unit 60, and a detection unit 70, which will be specifically described below with reference to the accompanying drawings.

[0092] The sample unit 10 is used to carry the sample to be sampled. For example, the sample unit 10 can be implemented through a sample distribution module (SDx10 6 , Sax10 6 ple Delivery x10 6 odule) and a front-end track. In some other embodiments, it can also be a rotary sample tray, and at least one sample position is provided on the sample tray. The sample position is used to place a sample container such as a sample tube, and the sample can be scheduled to a corresponding position by the rotation of the sample tray, for example, the position for the sample dispensing unit 20 to aspirate the sample.

[0093] The sample dispensing unit 20 includes a sample needle 21 and a first moving member 22. The first moving member 22 can drive the sample needle 21 to move to aspirate a sample and discharge it into a reaction vessel located at a reaction position. In some embodiments, the number of sample needles 21 can be one or more. In some embodiments, when there are multiple sample needles 21, the first moving member 22 can drive these sample needles 21 to move independently. The first moving member 22 can be a two-dimensional or three-dimensional driving mechanism, which can be designed according to specific requirements. For the sample needle 21, a typical sequence of actions is as follows: The sample needle 21 moves to, for example, a sample position to aspirate a sample, then moves to, for example, a reaction position to discharge the aspirated sample into the reaction vessel, and then moves to a predetermined position to be cleaned; of course, in some cases, the outer wall of the sample needle 21 can also be cleaned once after the sample needle 21 aspirates the sample and before discharging the sample.

[0094] The reaction unit 50 is used to carry reaction vessels, and is provided with at least one reaction position for placing reaction vessels to incubate the reaction liquid in the reaction vessels. The reaction liquid is prepared at least from a sample and a reagent. In some embodiments, the reaction unit 50 can be a rotary reaction disk, and a plurality of reaction positions are provided on the reaction disk. Specifically, the reaction disk can rotate and drive the reaction vessels in its reaction positions to rotate, for scheduling the reaction vessels in the reaction disk and incubating the reaction liquid in the reaction vessels.

[0095] The mixing unit 60 is used to mix the reaction liquid that needs to be mixed in the reaction vessel. For example, the mixing unit 60 mixes the reaction liquid located at the mixing position.

[0096] The detection unit 70 includes a first optical measurement component 100, and the first optical measurement component 100 is used to perform optical measurement on the reaction liquid after incubation to obtain reaction data of the sample. For example, the optical measurement component can receive the signal light emitted from the reaction liquid and detect the light intensity of the signal light, especially for detecting a weak light signal of no more than 200 million photons per second generated by the chemiluminescence of the sample to be tested. Combining with the calibration curve, the concentration of the component to be tested in the sample can be calculated, etc. In this embodiment, the first optical measurement component 100 can include a photomultiplier tube. It should be noted that in some scenarios, the reaction liquid after incubation can emit light by itself to emit signal light, and in other scenarios, a detection light source can be set. The detection light source can emit light, and the light irradiates the reaction liquid and then emits from the reaction liquid as signal light.

[0097] In this embodiment, the detection unit further includes a reference light source assembly 300. The reference light source assembly 300 is configured to emit reference light to the first optical measurement assembly 100. The reference light does not pass through the reaction solution. The first optical measurement assembly 100 is further configured to receive the reference light and perform detection. In other words, the first optical measurement assembly 100 has at least one detection port for receiving signal light and at least one detection port for receiving reference light. When the first optical measurement assembly 100 is used for sample detection, the reference light source assembly 300 stops working, and the first optical measurement assembly 100 receives the signal light and performs detection. It should be noted that after the first optical measurement assembly 100 detects the light intensity of the reference light, the controller of the sample analyzer can calibrate and / or verify the first optical measurement assembly 100 based on this light intensity, which will be described in subsequent embodiments.

[0098] Referring to Figures 2 to 6 , the reference light source assembly 300 in this embodiment includes a first light source 310 and a second light source 320. The first light source 310 is configured to be able to emit light rays to form a first reference light X incident on the first optical measurement assembly 100 1 , the second light source 320 is configured to be able to emit light rays to form a second reference light X incident on the first optical measurement assembly 100 2 , and at least part of the first reference light X 1 and at least part of the second reference light X 2 have different light intensities. In this way, the first light source 310 and the second light source 320 can respectively emit light rays with different light intensity ranges. The variation range of the light intensity of the light rays emitted by a single light source is relatively small, which is beneficial to the control of the light source and can also extend the service life of the light source.

[0099] It should be noted that at least part of the first reference light X 1 and at least part of the second reference light X 2 have different light intensities, which is described from the perspective of the reference light incident on the first optical measurement assembly 100. It does not mean that the first light source 310 and the second light source 320 must be light sources of different specifications. In other words, the first light source 310 and the second light source 320 can be light sources of different specifications, and at least part of the light intensity ranges of the light rays they can emit are different; the first light source 310 and the second light source 320 can also be exactly the same light sources, and the light intensity ranges of the light rays they can emit are the same, but in actual use, they emit light rays with different light intensity ranges respectively.

[0100] It should also be noted that the first light source 310 forms a first reference light X incident on the first optical measurement assembly 100 1 specifically includes the case where the first light source 310 directly emits the first reference light X 1 , and also includes the case where the light rays emitted by the first light source 310 are processed by other optical elements and then form the first reference light X 1Case; the second light source 320 forms the second reference light X incident on the first optical measurement component 100 2 Specifically, it includes the case where the first light source 310 directly emits the second reference light X 2 and also includes the case where the light rays emitted by the first light source 310 are processed by other optical elements and then form the second reference light X 2 Case.

[0101] It should also be noted that "at least part of the first reference light X 1 and at least part of the second reference light X 2 have different light intensities" includes but is not limited to the following cases:

[0102] 1. The first light source 310 emits the first reference light X multiple times 1 , the second light source 320 emits the second reference light X once 2 , and the light intensities of the multiple first reference lights X 1 are all different from the light intensity of the second reference light X 2 .

[0103] 2. The first light source 310 emits the first reference light X multiple times 1 , the second light source 320 emits the second reference light X once 2 , and the light intensities of a part of the multiple first reference lights X 1 are different from the light intensity of the second reference light X 2 , and the light intensities of another part of the multiple first reference lights X 1 are the same as the light intensity of the second reference light X 2 .

[0104] 3. The first light source 310 emits the first reference light X once 1 , the second light source 320 emits the second reference light X multiple times 2 , and the light intensities of the multiple second reference lights X 2 are all different from the light intensity of the first reference light X 1 .

[0105] 4. The first light source 310 emits the first reference light X once 1 , the second light source 320 emits the second reference light X multiple times 2 , and the light intensities of a part of the multiple second reference lights X 2 are different from the light intensity of the first reference light X 1 , and the light intensities of another part of the multiple second reference lights X 2 are the same as the light intensity of the first reference light X 1 .

[0106] 5. The first light source 310 emits the first reference light X multiple times 1 , the second light source 320 emits the second reference light X multiple times 2, multiple first reference lights X 1 have different light intensities from multiple second reference lights X 2 . Among them, the light intensities of multiple first reference lights X 1 can be all the same or at least partially different, and the light intensities of multiple second reference lights X 2 can be all the same or at least partially different.

[0107] 6. The first light source 310 emits multiple first reference lights X 1 , and the second light source 320 emits multiple second reference lights X 2 . Among the multiple first reference lights X 1 , the light intensities of a part are different from those of a part of the multiple second reference lights X 2 , and the light intensities of another part of the multiple first reference lights X 1 are the same as those of another part of the second reference lights X 2 .

[0108] 7. The first light source 310 emits a first reference light X once 1 , and the second light source 320 emits a second reference light X once 2 . The light intensity of the first reference light X 1 is different from that of the second reference light X 2 .

[0109] Based on the first embodiment, in some embodiments of the present invention, the resolutions of the first reference light X 1 and the second reference light X 2 incident on the first light measurement component 100 can also be different. In this embodiment, the resolution refers to the light intensity change of the reference light incident on the first light measurement component 100 in response to the change of the unit voltage of the light source, that is, the minimum light intensity that the reference light incident on the first light measurement component 100 can change. Specifically, it is defined that in response to the change of the unit voltage of the first light source 310, the light intensity change value generated by the first reference light X 1 incident on the first light measurement component 100 is the first change value, and in response to the same unit voltage change of the second light source 320, the light intensity change value generated by the second reference light X 2 incident on the first light measurement component 100 is the second change value. Different resolutions mean that the first change value and the second change value are different. By setting the resolutions of the first reference light X 1 and the second reference light X 2 to be unequal, different scenarios can be targeted. For example, in some scenarios, when the light intensity range of the second reference light X 2 used for inspection is much smaller than the light intensity range of the first reference light X 1 used for calibration, the resolution of the second reference light X 2The resolution is adjusted to adapt to a small range of light intensities. In this embodiment, the first reference light X 1 and the second reference light X 2 The difference in resolution is specifically manifested as follows: The resolution of the first reference light X 1 is lower than the resolution of the second reference light X 2 That is, the first change value is greater than the second change value.

[0110] It should be noted that in this embodiment, the first reference light X 1 and the second reference light X 2 The difference in resolution is also described in terms of the reference light incident on the first optical measurement component 100, which does not mean that the resolutions of the first light source 310 and the second light source 320 must be different. In other words, the first light source 310 and the second light source 320 can be light sources with different resolutions, such that in response to a change in unit voltage, the light intensity change values of the light rays emitted from the two are different from the beginning. The first light source 310 and the second light source 320 can also be light sources with the same resolution, and the two make the first reference light X 1 and the second reference light X 2 Have different resolutions, which will be described in subsequent embodiments.

[0111] When the resolution of the first light source 310 is lower than the resolution of the second light source 320, in some embodiments of the present invention, the maximum light intensity of the first reference light X 1 incident on the first optical measurement component 100 is greater than the maximum light intensity of the second reference light X 2 incident on the first optical measurement component 100. That is, the first light source 310 emits a reference light with a higher light intensity, and the second light source 320 emits a reference light with a lower light intensity. Specifically, it is defined that the light intensity range of the first reference light X 1 incident on the first optical measurement component 100 is the first range, and the light intensity range of the second reference light X 2 incident on the first optical measurement component 100 is the second range. Then the maximum value of the first range is greater than the maximum value of the second range. For example, the first range is 1x10 6 to 200x10 6 (In the present invention, the light intensity is characterized by the number of photons detected by the first optical measurement component 100 per second. The number of photons is specifically manifested as the number of pulse signals generated by the first optical measurement component 100 in the instrument), and the second range is 1x10 3 to 1x10 6 . In some embodiments, the minimum value of the first range is also greater than the maximum value of the second range. In other embodiments, the minimum value of the first range is less than the maximum value of the second range, but greater than the minimum value of the second range.

[0112] When the resolution of the first light source 310 is lower than that of the second light source 320, in some embodiments of the present invention, the first reference light X incident on the first optical measurement component 100 1 has a light intensity range within the aforementioned first range, and the second reference light X incident on the first optical measurement component 100 2 has a light intensity range within the aforementioned second range. The difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range. It can be understood that the smaller the light intensity range of the light, the higher the resolution. For example, when the first range is from the aforementioned 1x10 6 to 200x10 6 , the resolution can be 1x10 6 , that is, in response to the change in the unit voltage of the first light source 310, the first change value of the first reference light X 1 is 1x10 6 . However, for the aforementioned second range (the light intensity range is from 1x10 3 to 1x10 6 ), if the resolution still remains at 1x10 6 , then obviously the change amplitude is too large. Therefore, it is necessary to increase the resolution, such as 1x10 3 . If a single reference light source is used, it is necessary to adopt the first resolution within the first range and the second resolution within the second range. On the one hand, it will further increase the control difficulty of the reference light source. On the other hand, the price of such light sources that can adjust the resolution is extremely high, which will significantly increase the cost, and even such light sources do not exist on the market. Based on this, in this embodiment, there are a first light source 310 and a second light source 320. The first light source 310 has a larger light intensity range and a relatively lower resolution, while the second light source 320 has a smaller light intensity range and a relatively higher resolution. In this way, a large range of reference light can be provided to the first optical measurement component 100, and the cost is also lower.

[0113] On the basis of the first embodiment, referring to Figures 2 to 6 , the sample analyzer in some embodiments of the present invention further includes a controller. The reference light source assembly 300 further includes a first optical element 330 and a second optical measurement component 200. The first optical element 330 is used for beam splitting. The first light source 310 can emit light to the first optical element 330. After the beam splitting by the first optical element 330, the first optical element 330 can emit a third reference light X 3 and the aforementioned first reference light X 1 . In other words, the first reference light X 1 in this embodiment is split from the light emitted by the first light source 310.

[0114] In this embodiment, the second optical measurement component 200 can receive the third reference light X 3And detect the third reference light X 3 of the light intensity; the controller is configured to be able to obtain the light intensity of the first reference light X 3 based on the third reference light X 1 In this way, by accurately detecting the third reference light X 3 through the second optical measurement component 200, the light intensity value of the first reference light X 1 entering the first optical measurement component 100 can be accurately obtained. Then, combined with the light intensity value of the first reference light X 1 actually measured by the first optical measurement component 100, the first optical measurement component 100 can be calibrated and / or verified.

[0115] On the basis of the first embodiment, referring to Figures 2 to 6 , the sample analyzer in some embodiments of the present invention further includes a controller. The reference light source assembly 300 further includes a first optical element 330 and a second optical measurement component 200. The first optical element 330 is used for beam splitting. The second light source 320 can emit light to the first optical element 330. After the beam splitting by the first optical element 330, the first optical element 330 emits a fourth reference light X 4 and the aforementioned second reference light X 2 . In other words, the second reference light X 2 in this embodiment is split from the light emitted by the second light source 320.

[0116] In this embodiment, the second optical measurement component 200 can receive the fourth reference light X 4 and detect the light intensity of the fourth reference light X 4 ; the controller is configured to be able to obtain the light intensity of the second reference light X 4 based on the fourth reference light X 2 . In this way, by accurately detecting the fourth reference light X 4 through the second optical measurement component 200, the light intensity value of the second reference light X 2 entering the first optical measurement component 100 can be accurately obtained. Then, combined with the light intensity value of the second reference light X 2 actually measured by the first optical measurement component 100, the first optical measurement component 100 can be calibrated and / or verified.

[0117] It should be noted that the above embodiments can be combined. For example, the first optical measurement component 100 is calibrated and / or verified jointly by the first reference light X 1 and the second reference light X 2 . At this time, in order to avoid interference, when the first light source 310 is working, the second light source 320 stops working, and when the second light source 320 is working, the first light source 310 stops working, so that the first optical measurement component 100 only receives the first reference light X 1 or the second reference light X 2。

[0118] It should also be noted that in the foregoing embodiments, when describing the light emitted from the first optical element 330, it includes both the case where the light irradiates on the first optical element 330 and is reflected by the first optical element 330, and the case where the light irradiates on the first optical element 330 and transmits through the first optical element 330. Specific examples are as follows in the following embodiments.

[0119] When the reference light source assembly 300 further includes the first optical element 330 and the second optical measurement assembly 200, referring to Figure 5 、 Figure 6 In some embodiments of the present invention, the first light source 310 is configured to be able to emit light towards the first optical element 330, and the light emitted by the first light source 310 is reflected by the first optical element 330 to form the first reference light X 1 The light emitted by the first light source 310 transmits through the first optical element 330 to form the third reference light X 3 。

[0120] When the reference light source assembly 300 further includes the first optical element 330 and the second optical measurement assembly 200, referring to Figure 5 、 Figure 6 In some embodiments of the present invention, the second light source 320 is configured to be able to emit light towards the first optical element 330, and the light emitted by the second light source 320 is reflected by the first optical element 330 to form the second reference light X 2 The light emitted by the second light source 320 transmits through the first optical element 330 to form the fourth reference light X 4 。

[0121] In the above embodiments, the first optical element 330 can achieve the reflection of some light and the transmission of some light, and the transmission ratio and the reflection ratio are adjusted according to different replaced first optical elements 330. By configuring appropriate transmission ratios and reflection ratios (beam splitting ratios), reference lights with different resolutions can be formed by the same light source. Specifically, the first light source 310 and the second light source 320 are the same light source, so the light intensity changes generated by the two in response to a unit voltage change are equal, and the ratio of the transmission ratio to the reflection ratio of the first optical element 330 is not equal. Thus, even if the change values of the light emitted by the first light source 310 and the second light source 320 are the same, the reference lights incident into the first optical measurement assembly 100 after passing through the first optical element 330 will be different. For example, assuming that the ratio of the transmission ratio to the reflection ratio of the first optical element 330 is 1:9, in response to a unit voltage change, the change values generated by the light emitted by the first light source 310 and the light emitted by the second light source 320 are both 1x10 3 Then the first reference light X formed by the light emitted by the first light source 310 after being reflected by the first optical element 3301 The change value is 0.9x10 3 , and the light emitted by the second light source 320 passes through the first optical element 330 to form a second reference light X 2 The change value is 0.1x10 3 , so the first reference light X 1 The change value of the second reference light X 2 9 times of the change value, thereby being able to form reference lights of different resolutions. By adjusting the splitting ratio of the first optical element 330, reference lights of other resolutions can also be formed. In this embodiment, the first light source 310 and the second light source 320 can use the same light source, thereby being able to reduce the number of light source models and facilitating material management. It can be understood that the first light source 310 and the second light source 320 can also be light sources with different resolutions. In this case, the ratio of the transmission ratio to the reflection ratio of the first optical element 330 can also be equal.

[0122] Refer to the figure Figures 3 to 6 In some specific embodiments of the present invention, the reference light source assembly 300 further includes a main body component 340. The main body component 340 may be an integrally formed structure or a structure composed of a plurality of components. As shown in the figure, the main body component 340 is a substantially rectangular structure, and the aforementioned first light measuring assembly 100, the second light measuring assembly 200, the first light source 310, and the second light source 320 are respectively arranged on different sides of the main body component 340.

[0123] In this embodiment, the main body part 340 has a first channel 341 and a second channel 342 which are cross-arranged. The opposite ends of the first channel 341 lead to the second light source 320 and the first photodetection component 100 respectively, and the opposite ends of the second channel 342 lead to the first light source 310 and the second photodetection component 200 respectively. For example, the first channel 341 and the second channel 342 are perpendicular to each other and intersect at the middle part. The first channel 341 is arranged along the vertical direction shown in the figure, and the second channel 342 is arranged along the horizontal direction shown in the figure. Of course, the angle between the first channel 341 and the second channel 342 can also be other values.

[0124] In this embodiment, the first optical element 330 is disposed at the intersection of the first channel 341 and the second channel 342. For example, when the first channel 341 and the second channel 342 are perpendicular to each other, the first optical element 330 is placed at an angle of 45°. Of course, depending on the different angles between the first channel 341 and the second channel 342, the placement angle of the first optical element 330 can also be adjusted accordingly.

[0125] The first light source 310 can emit light to the first optical element 330 through the second channel 342, and the first reference light X reflected by the first optical element 330 1The third reference light X that can be emitted through the first channel 341 towards the first optical measurement component 100 and transmitted by the first optical element 330 3 can be emitted through the second channel 342 towards the second optical measurement component 200. Similarly, the second light source 320 can emit light towards the first optical element 330 through the first channel 341, and the second reference light X 2 transmitted by the first optical element 330 can be emitted through the first channel 341 towards the first optical measurement component 100, and the fourth reference light X 4 reflected by the first optical element 330 can be emitted through the second channel 342 towards the second optical measurement component 200. In this way, the integrated setting of the reference light source component 300 can be realized. When it is necessary to switch the reference light source, only the first light source 310 or the second light source 320 needs to be correspondingly selected to be turned on.

[0126] When the reference light source component 300 further includes a main body component 340, referring to Figure 4 , the reference light source component 300 in some embodiments of the present invention further includes a first aperture 350. The first aperture 350 is disposed in the second channel 342 between the first optical element 330 and the first light source 310. The first aperture 350 is used to limit the emission angle of the first light source 310 and reduce scattered light.

[0127] When the reference light source component 300 further includes a main body component 340, referring to Figure 4 , the reference light source component 300 in some embodiments of the present invention further includes a first attenuation sheet 360. The first attenuation sheet 360 is disposed in the second channel 342 between the first optical element 330 and the first light source 310. The first attenuation sheet 360 can reduce the light intensity of the light emitted by the first light source 310 to adapt to devices for detecting weak light such as photomultiplier tubes. In addition, the first attenuation sheet 360 can also cooperate with the first optical element 330 to adjust the resolution. For example, assuming that the transmittance of the first attenuation sheet 360 is 60%, and the ratio of the transmission ratio to the reflection ratio of the first optical element 330 is 1:9, in response to the change of unit voltage, the change value of the light emitted by the first light source 310 and the change value of the light emitted by the second light source 320 are both 1x10 3 , then after the light emitted by the first light source 310 is attenuated by the first attenuation sheet 360, the change value of the light intensity of the emitted light is 0.6x10 3 , and after being reflected by the first optical element 330, the first reference light X 1 formed has a change value of 0.54x10 3 , while the change value of the second reference light X 2 formed after the light emitted by the second light source 320 is transmitted through the first optical element 330 is 0.1x10 3 , then the change value of the first reference light X 1The change value is the second reference light X 2 5.4 times the change value.

[0128] When the reference light source assembly 300 further includes a main body member 340, referring to Figure 4 , in some embodiments of the present invention, the reference light source assembly 300 further includes a second diaphragm 370. The second diaphragm 370 is disposed in the first channel 341 between the first optical element 330 and the second light source 320. The second diaphragm 370 is used to limit the emission angle of the second light source 320 and reduce scattered light.

[0129] When the reference light source assembly 300 further includes a main body member 340, referring to Figure 4 , in some embodiments of the present invention, the reference light source assembly 300 further includes a second attenuation sheet 380. The second attenuation sheet 380 is disposed in the first channel 341 between the first optical element 330 and the second light source 320. The second attenuation sheet 380 can reduce the light intensity of the light emitted by the second light source 320 to adapt to devices for detecting weak light such as photomultiplier tubes. Similarly, the second attenuation sheet 380 can also cooperate with the first optical element 330 to adjust the resolution. Taking the foregoing data as an example, if the first attenuation sheet 360 is not provided and the transmittance of the second attenuation sheet 380 is 10%, then after the light emitted by the second light source 320 is attenuated by the second attenuation sheet 380, the change value of the light intensity of the emitted light is 0.1x10 3 , and after passing through the first optical element 330 by transmission, the formed first reference light X 1 The change value is 0.01x10 3 , then the first reference light X 1 The change value is 90 times the change value of the second reference light X 2 .

[0130] When the reference light source assembly 300 further includes a main body member 340, referring to Figure 4 , in some embodiments of the present invention, the reference light source assembly 300 further includes a third attenuation sheet 390. The third attenuation sheet 390 is disposed in the first channel 341 between the first optical element 330 and the first light measurement assembly 100 to further weaken the light entering the first light measurement assembly 100.

[0131] On the basis of the first embodiment, referring to Figure 7 、 Figure 8 , in some embodiments of the present invention, the reference light source assembly 300 further includes a first switching mechanism 3100. Different from the foregoing solution in which both the first light source 310 and the second light source 320 are fixed relative to the main body member 340, in this embodiment, the first light source 310 and the second light source 320 can move relative to the first light measurement assembly 100, thereby realizing the switching of the reference light source.

[0132] Specifically, both the first light source 310 and the second light source 320 are connected to the first switching mechanism 3100, and the first switching mechanism 3100 is configured to be able to drive the first light source 310 and the second light source 320 to move relative to the first optical measurement component 100. When the first light source 310 moves to the working position ( Figure 7 the position shown) and the second light source 320 leaves the working position, the first light source 310 emits light rays to the first optical measurement component 100 to form the first reference light X 1 ; when the second light source 320 moves to the working position ( Figure 8 the position shown) and the first light source 310 leaves the working position, the second light source 320 emits light rays to the first optical measurement component 100 to form the second reference light X 2 .

[0133] The first switching mechanism 3100 can be a well-known linear drive mechanism or a rotary drive mechanism, and drives the light source to switch by means of linear movement or rotation.

[0134] When the reference light source assembly 300 further includes the first switching mechanism 3100, referring to Figure 7 , Figure 8 , in some embodiments of the present invention, the sample analyzer further includes a controller. The reference light source assembly 300 further includes a first optical element 330 and a second optical measurement component 200. The first optical element 330 is used for splitting light. When the first light source 310 moves to the working position and the second light source 320 leaves the working position, the first light source 310 can emit light rays to the first optical element 330. After the light is split by the first optical element 330, the first optical element 330 can emit the third reference light X 3 and the aforementioned first reference light X 1 . In other words, the first reference light X in this embodiment 1 is split from the light rays emitted by the first light source 310.

[0135] When the second light source 320 moves to the working position and the first light source 310 leaves the working position, the second light source 320 can emit light rays to the first optical element 330. After the light is split by the first optical element 330, the first optical element 330 emits the fourth reference light X 4 and the aforementioned second reference light X 2 . In other words, the second reference light X in this embodiment 2 is split from the light rays emitted by the second light source 320.

[0136] In this embodiment, the second optical measurement component 200 can receive the third reference light X 3 and detect the light intensity of the third reference light X 3 ; the controller is configured to be able to obtain the first reference light X based on the third reference light X 3 ​1 of the light intensity, so that the third reference light X can be accurately detected by the second optical measurement component 200 3 , the light intensity value of the first reference light X incident on the first optical measurement component 100 can be accurately obtained 1 . Combining with the light intensity value of the first reference light X actually measured by the first optical measurement component 100 1 , the first optical measurement component 100 can be calibrated and / or verified. The second optical measurement component 200 can also receive the fourth reference light X 4 and detect the light intensity of the fourth reference light X 4 . The controller is configured to be able to obtain the light intensity of the second reference light X based on the fourth reference light X 4 , so that the fourth reference light X can be accurately detected by the second optical measurement component 200 2 , and the light intensity value of the second reference light X incident on the first optical measurement component 100 can be accurately obtained 4 . Combining with the light intensity value of the second reference light X actually measured by the first optical measurement component 100 2 , the first optical measurement component 100 can be calibrated and / or verified. 2

[0137] When the reference light source assembly 300 further includes the first optical element 330 and the second optical measurement component 200, referring to Figure 7 , Figure 8 , in some embodiments of the present invention, the reference light source assembly 300 further includes a main body member 340. The main body member 340 has a first channel 341 and a second channel 342. One end of the first channel 341 leads to the first optical measurement component 100, and the other end is the incident end. The first light source 310 and the second light source 320 alternatively emit light from the incident end. One end of the second channel 342 leads to the second optical measurement component 200, and the other end communicates with the first channel 341. For example, the first channel 341 and the second channel 342 are perpendicular to each other, the second channel 342 intersects at the middle part of the first channel 341, the first channel 341 is arranged in the vertical direction shown in the figure, and the second channel 342 is arranged in the horizontal direction shown in the figure. Of course, the included angle between the first channel 341 and the second channel 342 can also be other values.

[0138] In this embodiment, the first optical element 330 is disposed at the communication portion of the first channel 341 and the second channel 342. For example, when the first channel 341 and the second channel 342 are perpendicular to each other, the first optical element 330 is placed at an angle of 45°. Of course, according to the different included angles between the first channel 341 and the second channel 342, the placement angle of the first optical element 330 can be adjusted accordingly.

[0139] ​When the first light source 310 moves to the working position, it aligns with the incident end. The first light source 310 can emit light to the first optical element 330 through the incident end, and the first reference light X reflected by the first optical element 330 1 enters the first optical measurement assembly 100 through the first channel 341. The third reference light X transmitted by the first optical element 330 3 can be directed to the second optical measurement assembly 200 through the second channel 342. When the second light source 320 moves to the working position, it aligns with the incident end. The second light source 320 can emit light to the first optical element 330 through the incident end, and the second reference light X transmitted by the first optical element 330 2 can be directed to the first optical measurement assembly 100 through the first channel 341. The fourth reference light X reflected by the first optical element 330 4 can be directed to the second optical measurement assembly 200 through the second channel 342.

[0140] It should be noted that in this embodiment, devices such as the aforementioned first aperture 350, first attenuation sheet 360, second aperture 370, and second attenuation sheet 380 can also be provided. Among them, when different light sources are configured with different attenuation sheets and apertures, the first light source 310, the first aperture 350, and the first attenuation sheet 360 can be integrated into one light source module, and the second light source 320, the second aperture 370, and the second attenuation sheet 380 can be integrated into another light source module. The first switching mechanism 3100 can drive the light source module to move relative to the main body component 340.

[0141] When the reference light source assembly 300 further includes the first optical element 330, in some embodiments of the present invention, the first optical element 330 includes a beam splitter, which is also called a semi-transmissive and semi-reflective sheet. It can transmit a part of the light and reflect a part of the light. The beam splitter has a definite splitting ratio and can split the incident light according to the splitting ratio. In other words, when the light intensity of one of the branched optical paths is known (such as the aforementioned third reference light X 3 ), the light intensity of other branched optical paths (such as the aforementioned first reference light X 1 ) can be obtained according to the splitting ratio.

[0142] When the reference light source assembly 300 further includes the first optical element 330, in some embodiments of the present invention, the first optical element 330 includes a dichroic sheet, which is suitable for the case where the light emitted by the light source includes light of different wavelengths. The dichroic sheet can transmit light within a certain wavelength range and reflect light in other wavelength ranges, thus also achieving beam splitting.

[0143] When the reference light source assembly 300 includes the first light source 310 and the second light source 320, in some embodiments of the present invention, when one of the first light source 310 and the second light source 320 is working, the other stops working, so as to avoid interference between the light sources.

[0144] Based on the first embodiment, in some embodiments of the present invention, the first light source 310 is used as a calibration light source. Specifically, the sample analyzer further includes a controller, and the controller is configured to calibrate the first optical measurement component 100 based on the light intensity of the first reference light X 1 detected by the first optical measurement component 100 to form a calibration curve, and control the first optical measurement component 100 to detect the light intensity of the signal light to obtain a detection value. After obtaining the calibration curve and the detection value, a calibration value is obtained based on the calibration curve and the detection value, and the calibration value is the actual output value. Specifically, the method of obtaining the calibration value based on the calibration curve and the detection value is to input the detection value into the calibration curve and obtain the corresponding calibration value through the calibration curve. It should be noted that this embodiment does not limit the order of forming the calibration curve and obtaining the detection value.

[0145] Based on the first embodiment, in some embodiments of the present invention, the second light source 320 is used as a verification light source. Specifically, the sample analyzer further includes a controller, and the controller is configured to verify the first optical measurement component 100 based on the light intensity of the second reference light X 2 detected by the first optical measurement component 100. The difference between verification and calibration is that calibration requires correcting the detection value, while verification only needs to determine whether the first optical measurement component 100 is in a normal working state. Specifically, when the second reference light X 2 is a determined and known value, the detected value actually measured by the first optical measurement component 100 is compared with the light intensity value of the second reference light X 2 . If the deviation of the detected value from the second reference light X 2 is within a preset range, it is proved that the first optical measurement component 100 is in a normal state. If the deviation of the detected value from the second reference light X 2 exceeds the preset range, it is proved that the first optical measurement component 100 is in an abnormal state.

[0146] The above embodiments can be combined. For example, first verify through the second reference light X 2 , and then calibrate through the first reference light X 1 .

[0147] Based on the first embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller, and the controller is configured to control the first light source 310 to emit first reference lights X 1 with different light intensities to the first optical measurement component 100, and based on each first reference light X detected by the first optical measurement component 1001 Calibrate the first optical measurement component 100 with the light intensity of 1 to form a calibration curve, and control the first optical measurement component 100 to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value. For the specific calibration scheme, reference may be made to the foregoing embodiments for understanding. In this embodiment, through multiple first reference lights X 1 Calibrating the first optical measurement component 100 with the light intensity of 1 can improve the accuracy of the calibration result. It should be noted that the first light source 310 emits first reference lights X with different light intensities to the first optical measurement component 100 1 Specifically, it means emitting the first reference light X to the first optical measurement component 100 multiple times 1 and the light intensities of the respective first reference lights X 1 are different.

[0148] Based on the first embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller configured to control the second light source 320 to emit second reference lights X with different light intensities to the first optical measurement component 100 2 and verify the first optical measurement component 100 based on the light intensities of the respective second reference lights X detected by the first optical measurement component 100 2 For the specific verification scheme, reference may be made to the foregoing embodiments for understanding. In this embodiment, verifying the first optical measurement component 100 with the light intensities of multiple second reference lights X 2 can improve the accuracy of the verification result. It should be noted that the second light source 320 emits second reference lights X with different light intensities to the first optical measurement component 100 2 Specifically, it means emitting the second reference light X to the first optical measurement component 100 multiple times 2 and the light intensities of the respective second reference lights X 2 are different.

[0149] Based on the first embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller configured to calibrate the first optical measurement component 100 based on the light intensity of the first reference light X 1 detected by the first optical measurement component 100 and the light intensity of the second reference light X 2 to form a calibration curve, and control the first optical measurement component 100 to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value. For the specific calibration scheme, reference may be made to the foregoing embodiments for understanding. In this embodiment, using the first reference light X 1 and the second reference light X 2 together for calibration can improve the calibration range and the accuracy of the calibration result. It should be noted that in this embodiment, at least one first reference light X 1 and at least one second reference light X 2 can be used together for calibration.

[0150] The foregoing embodiments describe various solutions for forming the first reference light X 1 and the second reference light X 2 using different light sources. The second embodiment of the present invention further proposes a solution for forming the first reference light X 1 and the second reference light X 2 using the same light source. The sample analyzer in the second embodiment includes the aforementioned sample unit 10, sample dispensing unit 20, reagent unit 30, reaction unit 50, and mixing unit 60. Referring to Figure 9 , Figure 10 , the detection unit 70 in this embodiment is different from the detection unit 70 in the first embodiment. The differences include: the reference light source assembly 300 of the detection unit 70 in this embodiment does not include the aforementioned first light source 310 and second light source 320, but includes a third light source 3110, a second switching mechanism 3120, and an optical assembly. The optical assembly includes a second optical element 3130 and a third optical element 3140. The second switching mechanism 3120 is used to drive relative movement between the optical assembly and the third light source 3110, so that the light emitted by the third light source 3110 can pass through different optical elements to form different reference lights.

[0151] The so-called "relative movement between the optical assembly and the third light source 3110" includes a solution where the third light source 3110 is fixed and the optical assembly moves, and also includes a solution where the optical assembly is fixed and the third light source 3110 moves. Taking the former as an example, when the second optical element 3130 moves into the emission optical path of the third light source 3110, the third light source 3110 emits light towards the second optical element 3130, and the first reference light X 1 is emitted by the second optical element 3130; when the third optical element 3140 moves into the emission optical path of the third light source 3110, the third light source 3110 emits light towards the third optical element 3140, and the second reference light X 2 is emitted by the third optical element 3140.

[0152] The second switching mechanism 3120 can be a well-known linear drive mechanism or a rotary drive mechanism, which drives the light source to switch by linear movement or rotation.

[0153] It should be noted that after the third light source 3110 emits light towards the second optical element 3130, in addition to being able to emit the first reference light X 1 , the second optical element 3130 can also emit the aforementioned third reference light X 3 . After the third light source 3110 emits light towards the third optical element 3140, in addition to being able to emit the second reference light X 2In addition, the aforementioned fourth reference light X can also be emitted 4 . Specifically, both the second optical element 3130 and the third optical element 3140 can reflect part of the light and transmit part of the light. As shown in the figure, the light emitted by the third light source 3110 passes through the second optical element 3130 to form the first reference light X 1 , and the light emitted by the third light source 3110 is reflected by the second optical element 3130 to form the third reference light X 3 , the light emitted by the third light source 3110 passes through the third optical element 3140 to form the second reference light X 2 , and the light emitted by the third light source 3110 is reflected by the third optical element 3140 to form the fourth reference light X 4 .

[0154] When the reference light source assembly includes the second optical element 3130 and the third optical element 3140, in some embodiments of the present invention, both the second optical element 3130 and the third optical element 3140 are beam splitters, and the beam splitting ratios of the second optical element 3130 and the third optical element 3140 are different, so as to form reference lights with different light intensities through the same light source.

[0155] It should be noted that the reference light source assembly may further include other optical elements, such as a fourth optical element, and the beam splitting ratios of each optical element are different. In this way, the third light source 3110 can form the first reference light X with different light intensities by switching between the second optical element 3130 and the fourth optical element 1 . Similarly, the third light source 3110 can form the second reference light X with different light intensities by switching between the third optical element 3140 and the fourth optical element 2 .

[0156] When the reference light source assembly includes the second optical element 3130 and the third optical element 3140, in some embodiments of the present invention, both the second optical element 3130 and the third optical element 3140 are attenuation sheets. The process of the attenuation sheet attenuating the incident light is also the process of reducing the light intensity. The transmittances of the second optical element 3130 and the third optical element 3140 are different, so as to form reference lights with different light intensities through the same light source. It should be noted that the reference light source assembly may further include other optical elements, such as a fourth optical element, and the transmittances of each optical element are different. In this way, the third light source 3110 can form the first reference light X with different light intensities through the second optical element 3130 and the fourth optical element 1 . Similarly, the third light source 3110 can form the second reference light X with different light intensities through the third optical element 3140 and the fourth optical element 2 .

[0157] Based on the second embodiment, the first reference light X incident on the first optical measurement component 100 1 and the second reference light X 2 can also have different resolutions. In this embodiment, the resolution refers to the change in light intensity of the reference light incident on the first optical measurement component 100 in response to a change in the unit voltage of the light source, that is, the minimum light intensity change that the reference light incident on the first optical measurement component 100 can change. Specifically, it is defined that in response to a change in the unit voltage of the third light source 3110, the light intensity change value generated by the first reference light X incident on the first optical measurement component 100 1 is the first change value, and in response to the same unit voltage change of the third light source 3110, the light intensity change value generated by the second reference light X incident on the first optical measurement component 100 2 is the second change value. Different resolutions mean that the first change value and the second change value are different. By setting the resolutions of the first reference light X 1 and the second reference light X 2 to be unequal, for different scenarios. For example, in some scenarios, when the light intensity range of the second reference light X 2 used for inspection is much smaller than the light intensity range of the first reference light X 1 used for calibration, the resolution of the second reference light X 2 can be increased to adapt to a small range of light intensity. In this embodiment, the fact that the resolutions of the first reference light X 1 and the second reference light X 2 are different is specifically reflected in that: the resolution of the first reference light X 1 is lower than the resolution of the second reference light X 2 , that is, the first change value is greater than the second change value.

[0158] It should be noted that when the second optical element 3130 and the third optical element 3140 are beam splitters, by setting different beam splitting ratios of the second optical element 3130 and the third optical element 3140, the first reference light X 1 and the second reference light X 2 with different resolutions can be formed. For example, the ratio of the transmission ratio to the reflection ratio of the second optical element 3130 is 9:1, and the ratio of the transmission ratio to the reflection ratio of the third optical element 3140 is 1:9. In response to a change in the unit voltage, the change value of the light emitted by the third light source 3110 is 1×10 3 , then the change value of the first reference light X 1 formed after the light emitted by the third light source 3110 passes through the second optical element 3130 is 0.9×10 3 , and the change value of the second reference light X 2 formed after the light emitted by the third light source 3110 passes through the third optical element 3140 is 0.1×10 3, then the change value of the first reference light X 1 is 9 times the change value of the second reference light X 2 .

[0159] When the resolution of the first light source 310 is lower than that of the second light source 320, in some embodiments of the present invention, the maximum light intensity of the first reference light X 1 incident on the first optical measurement component 100 is greater than the maximum light intensity of the second reference light X 2 incident on the first optical measurement component 100. That is, the first light source 310 emits a reference light with a higher light intensity, and the second light source 320 emits a reference light with a lower light intensity. Specifically, it is defined that the light intensity range of the first reference light X 1 incident on the first optical measurement component 100 is the first range, and the light intensity range of the second reference light X 2 incident on the first optical measurement component 100 is the second range. Then the maximum value of the first range is greater than the maximum value of the second range. In some embodiments, the minimum value of the first range is also greater than the maximum value of the second range. In other embodiments, the minimum value of the first range is less than the maximum value of the second range, but greater than the minimum value of the second range.

[0160] When the resolution of the first light source 310 is lower than that of the second light source 320, in some embodiments of the present invention, the light intensity range of the first reference light X 1 incident on the first optical measurement component 100 is the aforementioned first range, and the light intensity range of the second reference light X 2 incident on the first optical measurement component 100 is the aforementioned second range. The difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range. In this embodiment, there are provided a first light source 310 and a second light source 320. The first light source 310 has a larger light intensity range and a relatively lower resolution, and the second light source 320 has a larger light intensity range and a relatively higher resolution. In this way, it is possible to improve the reference light in a large range and the cost is also lower.

[0161] On the basis of the second embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller configured to control the first light source 310 to emit first reference lights X 1 with different light intensities to the first optical measurement component 100, and calibrate the first optical measurement component 100 based on the light intensities of the first reference lights X 1 detected by the first optical measurement component 100 to form a calibration curve. In addition, control the first optical measurement component 100 to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value. The specific calibration scheme can be understood with reference to the foregoing embodiments. In this embodiment, through multiple first reference lights X 1Calibrating the first optical measurement component 100 with the light intensity can improve the accuracy of the calibration result. It should be noted that the first light source 310 emits first reference lights X with different light intensities to the first optical measurement component 100 1 Specifically, it emits the first reference light X to the first optical measurement component 100 multiple times 1 and the light intensities of the respective first reference lights X 1 are different.

[0162] Based on the second embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller configured to control the second light source 320 to emit second reference lights X with different light intensities to the first optical measurement component 100 2 and verify the first optical measurement component 100 based on the light intensities of the respective second reference lights X detected by the first optical measurement component 100 2 . The specific verification scheme can be understood with reference to the foregoing embodiments. In this embodiment, verifying the first optical measurement component 100 with the light intensities of multiple second reference lights X 2 can improve the accuracy of the verification result. It should be noted that the second light source 320 emits the second reference light X with different light intensities to the first optical measurement component 100 2 Specifically, it emits the second reference light X to the first optical measurement component 100 multiple times 2 and the light intensities of the respective second reference lights X 2 are different.

[0163] Based on the second embodiment, in some embodiments of the present invention, the sample analyzer further includes a controller configured to calibrate the first optical measurement component 100 based on the light intensity of the first reference light X 1 detected by the first optical measurement component 100 and the light intensity of the second reference light X 2 to form a calibration curve, and control the first optical measurement component 100 to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value. The specific calibration scheme can be understood with reference to the foregoing embodiments. In this embodiment, using the first reference light X 1 and the second reference light X 2 together for calibration can improve the calibration range and the accuracy of the calibration result. It should be noted that in this embodiment, at least one first reference light X 1 and at least one second reference light X 2 can be used together for calibration.

[0164] The above has described the embodiments of the present invention in detail with reference to the drawings. However, the present invention is not limited to the above embodiments, and various changes can be made without departing from the spirit of the present invention within the knowledge scope of those of ordinary skill in the art. In addition, the embodiments of the present invention and the features in the embodiments can be combined with each other without conflict.

Claims

1. Sample analyzer, characterized in that, comprising: a sample unit for carrying a sample; a reagent unit for carrying a reagent; a reaction unit provided with at least one reaction site, the reaction site being used for placing a reaction vessel and incubating a reaction solution in the reaction vessel, the reaction solution being prepared by the sample; a sample dispensing unit for aspirating the sample and discharging it into the reaction vessel located at the reaction site; a reagent dispensing unit for aspirating the reagent and discharging it into the reaction vessel located at the reaction site; a detection unit comprising a first optical measurement component and a reference light source component, the first optical measurement component being used for receiving a signal light emitted by the reaction solution and performing detection, the reference light source component being used for emitting a reference light to the first optical measurement component, and the first optical measurement component being further used for receiving the reference light and performing detection; wherein, the reference light source component comprises a first light source and a second light source, the first light source is configured to be able to emit light rays to form a first reference light incident on the first optical measurement component, the second light source is configured to be able to emit light rays to form a second reference light incident on the first optical measurement component, and at least part of the first reference light and at least part of the second reference light have different light intensities.

2. The sample analyzer according to claim 1, characterized in that, defining a light intensity change value generated by the first reference light incident on the first optical measurement component in response to a unit voltage change of the first light source as a first change value, and defining a light intensity change value generated by the second reference light incident on the first optical measurement component in response to the same unit voltage change of the second light source as a second change value, the reference light source being configured such that: the first change value is greater than the second change value.

3. The sample analyzer according to claim 2, characterized in that, the reference light source is configured such that: the maximum light intensity of the first reference light incident on the first optical measurement component is greater than the maximum light intensity of the second reference light incident on the first optical measurement component.

4. The sample analyzer according to claim 2, characterized in that, the reference light source is configured such that: defining a light intensity range of the first reference light incident on the first optical measurement component as a first range, and defining a light intensity range of the second reference light incident on the first optical measurement component as a second range, the difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range.

5. The sample analyzer according to claim 1, characterized in that, the sample analyzer further comprises a controller, and the reference light source component further comprises a first optical element and a second optical measurement component, wherein: the reference light source component is further configured such that: the first light source can emit light rays to the first optical element so that the first optical element emits the first reference light and a third reference light, and the second optical measurement component can receive the third reference light and detect the light intensity of the third reference light; the controller is configured to be able to obtain the light intensity of the first reference light based on the third reference light; And / or, the reference light source assembly is further configured such that: the second light source can emit light towards the first optical element, so that the first optical element emits the second reference light and the fourth reference light, and the second light measurement assembly can receive the fourth reference light and detect the light intensity of the fourth reference light; the controller is configured to be able to obtain the light intensity of the second reference light based on the fourth reference light.

6. The sample analyzer according to claim 5, wherein, the reference light source is configured such that: the light emitted by the first light source is reflected by the first optical element to form the first reference light, and the light emitted by the first light source transmits through the first optical element to form the third reference light; And / or, the reference light source is configured such that: the light emitted by the second light source transmits through the first optical element to form the second reference light, and the light emitted by the second light source is reflected by the first optical element to form the fourth reference light.

7. The sample analyzer according to claim 6, wherein, the reference light source assembly further includes a main body assembly, the main body assembly has a first channel and a second channel arranged crosswise, the first optical element is arranged at the intersection of the first channel and the second channel, opposite ends of the first channel respectively lead to the second light source and the first light measurement assembly, and opposite ends of the second channel respectively lead to the first light source and the second light measurement assembly; wherein, the first light source is configured to emit light towards the first optical element through the second channel, and the first reference light formed by reflection of the first optical element can be emitted towards the first light measurement assembly through the first channel, and the third reference light formed by transmission of the first optical element can be emitted towards the second light measurement assembly through the second channel; the second light source is configured to emit light towards the first optical element through the first channel, and the second reference light formed by transmission of the first optical element can be emitted towards the first light measurement assembly through the first channel, and the fourth reference light formed by reflection of the first optical element can be emitted towards the second light measurement assembly through the second channel.

8. The sample analyzer according to claim 7, wherein, the sample analyzer further includes at least one of the following solutions: the reference light source assembly further includes a first aperture stop, and the first aperture stop is arranged in the second channel between the first optical element and the first light source; the reference light source assembly further includes a first attenuation sheet, and the first attenuation sheet is arranged in the second channel between the first optical element and the first light source; the reference light source assembly further includes a second aperture stop, and the second aperture stop is arranged in the first channel between the first optical element and the second light source; the reference light source assembly further includes a second attenuation sheet, and the second attenuation sheet is arranged in the first channel between the first optical element and the second light source; The reference light source assembly further includes a third attenuation sheet, and the second attenuation sheet is disposed in the first channel between the first optical element and the first optical measurement assembly.

9. The sample analyzer according to claim 1, wherein, the reference light source assembly further includes a first switching mechanism; wherein, the first switching mechanism is configured to be able to drive the first light source and the second light source to move relative to the first optical measurement assembly. When the first light source moves to the working position and the second light source leaves the working position, the first light source emits light to the first optical measurement assembly to form the first reference light. When the second light source moves to the working position and the first light source leaves the working position, the second light source emits light to the first optical measurement assembly to form the second reference light.

10. The sample analyzer according to claim 9, wherein, the sample analyzer further includes a controller, and the reference light source assembly further includes a first optical element and a second optical measurement assembly, wherein: the reference light source assembly is further configured that when the first light source moves to the working position and the second light source leaves the working position, the first light source can emit light to the first optical element, so that the first optical element emits the first reference light and the third reference light, and the second optical measurement assembly can receive the third reference light and detect the light intensity of the third reference light; the controller is configured to be able to obtain the light intensity of the first reference light based on the third reference light; and, when the second light source moves to the working position and the first light source leaves the working position, the second light source can emit light to the first optical element, so that the first optical element emits the second reference light and the fourth reference light, and the second optical measurement assembly can receive the fourth reference light and detect the light intensity of the fourth reference light; the controller is configured to be able to obtain the light intensity of the second reference light based on the fourth reference light.

11. The sample analyzer according to any one of claims 5 to 8 and 10, wherein, the first optical element is a beam splitter or a dichroic sheet.

12. The sample analyzer according to claim 1, wherein, the reference light source assembly is further configured that when one of the first light source and the second light source is working, the other stops working.

13. The sample analyzer according to claim 1, wherein, the sample analyzer further includes a controller, and the controller is configured to calibrate the first optical measurement assembly based on the light intensity of the first reference light detected by the first optical measurement assembly to form a calibration curve, and control the first optical measurement assembly to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value; and / or, the controller is configured to verify the first optical measurement assembly based on the light intensity of the second reference light detected by the first optical measurement assembly.

14. The sample analyzer according to claim 1, wherein, the sample analyzer further includes a controller; Wherein, the controller is configured to control the first light source to form the first reference lights with different light intensities, calibrate the first light measurement component based on the light intensities of the first reference lights detected by the first light measurement component to form a calibration curve, and control the first light measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value; and / or, the controller is configured to control the second light source to form the second reference lights with different light intensities, and verify the first light measurement component based on the light intensities of the second reference lights detected by the first light measurement component; Alternatively, the controller is configured to calibrate the first light measurement component based on the light intensities of the first reference light and the second reference light detected by the first light measurement component to form a calibration curve, and control the first light measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value.

15. Sample analyzer, Characterized in that, It includes: A sample unit for carrying a sample; A reagent unit for carrying a reagent; A reaction unit provided with at least one reaction site for placing a reaction vessel and incubating the reaction solution in the reaction vessel, the reaction solution being prepared by the sample; A sample dispensing unit for sucking the sample and discharging it into the reaction vessel located at the reaction site; A reagent dispensing unit for sucking the reagent and discharging it into the reaction vessel located at the reaction site; A detection unit including a first light measurement component and a reference light source component, the first light measurement component being configured to receive and detect the signal light emitted by the reaction solution, the reference light source component being configured to emit reference light to the first light measurement component, and the first light measurement component being further configured to receive and detect the reference light; Wherein, the reference light source component includes a third light source, a second switching mechanism and an optical component, the optical component includes a second optical element and a third optical element, the second switching mechanism is configured to drive relative movement between the optical component and the third light source, when the third light source emits light to the second optical element, the second optical element emits the first reference light to the first light measurement component, and when the third light source emits light to the third optical element, the third optical element emits the second reference light to the first light measurement component; At least part of the first reference light and at least part of the second reference light have different light intensities.

16. The sample analyzer according to claim 15, Characterized in that, Both the second optical element and the third optical element are beam splitters, and the beam splitting ratios of the second optical element and the third optical element are different; Alternatively, both the second optical element and the third optical element are attenuation sheets, and the transmittances of the second optical element and the third optical element are different.

17. The sample analyzer according to claim 15, Characterized in that, Define the light intensity change value generated by the first reference light incident on the first optical measurement component in response to the unit voltage change of the third light source as the first change value, and the light intensity change value generated by the second reference light incident on the first optical measurement component in response to the same unit voltage change of the third light source as the second change value, and the first change value is greater than the second change value.

18. The sample analyzer according to claim 17, wherein, the reference light source is configured such that: the light intensity range of the first reference light incident on the first optical measurement component is the first range, the light intensity range of the second reference light incident on the first optical measurement component is the first range, and the difference between the maximum value and the minimum value of the first range is greater than the difference between the maximum value and the minimum value of the second range.

19. The sample analyzer according to claim 15, wherein, the sample analyzer further includes a controller; wherein, the controller is configured to control the first light source to form the first reference lights with different light intensities, and calibrate the first optical measurement component based on the light intensities of the first reference lights detected by the first optical measurement component to form a calibration curve, and control the first optical measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value; and / or, the controller is configured to control the second light source to form the second reference lights with different light intensities, and verify the first optical measurement component based on the light intensities of the second reference lights detected by the first optical measurement component; alternatively, the controller is configured to calibrate the first optical measurement component based on the light intensity of the first reference light and the light intensity of the second reference light detected by the first optical measurement component to form a calibration curve, and control the first optical measurement component to detect the light intensity of the signal light to obtain a detection value, and obtain a calibration value based on the calibration curve and the detection value.

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