Aging cabinet for inverter energy feedback type aging test

Abstract

The invention discloses an aging cabinet for an inverter energy feedback type aging test, and relates to the technical field of aging test cabinets, the aging cabinet comprises a cabinet body and a test unit, the cabinet body comprises a shell, cabinet doors and a test assembly, the test assembly is arranged on the side edge of the shell, the cabinet doors are symmetrically arranged on the two sides of the shell, the test unit is arranged in the cabinet body, and the test unit is arranged in the cabinet body. The testing unit comprises a placing frame and testing turnover plates, the testing turnover plates are arranged in the placing frame in an array mode, and the placing frame is in sliding fit with the shell. The aging cabinet has the advantages that workers can directly take the aging cabinet conveniently, the problem that operation is difficult in the taking process is solved, meanwhile, an activity space is provided for maintenance personnel to maintain the test cabinet, the off-line time of the aging cabinet is shortened, and the working efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of aging test cabinets, in particular to an aging cabinet used for inverter energy-feeding aging test. Background Art

[0002] In the field of power electronic equipment testing, inverter aging testing is crucial to ensure the quality and reliability of the inverter. Traditional inverter aging test cabinets, such as the test cabinet disclosed in CN208125848U, have certain functional advantages, can test the inverter at different voltage values, enhance the detection strength, and have a relatively simple structure. However, with the development of technology and the expansion of application scenarios, the limitations of this test cabinet are becoming increasingly prominent.

[0003] In the widely used energy-feed aging test cabinet, the circuit structure is highly complex. A large number of electronic components, intricate line connections, and precise control modules are intertwined, which greatly reduces the stability of the system. Minor electrical interference, component aging, or parameter drift may cause circuit failures, making the failure rate of the test cabinet high. Frequent failures not only seriously affect the continuity of testing work, but also cause a lot of time and resources to be wasted on troubleshooting and repairing.

[0004] From the perspective of structural design, the existing energy-feedback aging test cabinets have serious defects. The internal layout is compact, and there is almost no sufficient maintenance space between the components. When the test cabinet fails, it is difficult for maintenance personnel to access the faulty components, the operating space is extremely narrow, and even conventional maintenance tools cannot be used. This not only greatly increases the difficulty of maintenance, making maintenance work extremely demanding on the professional skills and operating experience of technicians, but also significantly prolongs the maintenance time. Long-term maintenance causes the test cabinet to be offline for a long time, seriously affecting production efficiency and increasing the company's operating costs. Summary of the invention

[0005] In view of the problem of limited space in the aging test cabinet mentioned above or in the prior art, the present invention is proposed.

[0006] Therefore, an object of the present invention is to provide an aging cabinet for inverter energy-feed aging test.

[0007] In order to solve the above technical problems, the present invention provides the following technical solutions: an aging cabinet for inverter energy feedback aging test, which includes a cabinet body, the cabinet body includes an outer shell, a cabinet door and a test component, the test component is arranged on the side of the outer shell, and the cabinet door is symmetrically arranged on both sides of the outer shell; a test unit, the test unit is arranged inside the cabinet body, the test unit includes a placement frame and a test flip plate, the test flip plate array is arranged inside the placement frame, and the placement frame is slidably matched with the outer shell.

[0008] As a preferred solution of the aging cabinet for inverter energy-feeding aging test described in the present invention, the housing includes a cavity, and a test unit is arranged inside the cavity.

[0009] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the cavity includes a limit groove and an arc groove, the limit groove is symmetrically arranged on the upper and lower sides of the cavity, and the arc groove is symmetrically arranged on both sides of the limit groove.

[0010] As a preferred solution of the aging cabinet for inverter energy-feeding aging test described in the present invention, the housing further includes vertical rotating rods symmetrically arranged on both sides thereof.

[0011] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, wherein: the shell also includes slide grooves symmetrically arranged on the inner walls on both sides of the cavity, and the slide grooves include long grooves, transition grooves and short grooves, and the long grooves, transition grooves and short grooves are arranged in an incremental step-type.

[0012] As a preferred solution of the aging cabinet for inverter energy-feeding aging test described in the present invention, the short slots are arranged at an acute angle to the axial direction of the long slots.

[0013] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the cabinet door includes a handle and a horn, the horn is symmetrically arranged at the upper and lower ends of the cabinet door, and a sliding head is arranged at the end of the horn, and the sliding head protrudes on both the upper and lower sides.

[0014] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, the test component includes a panel and a warning part, the warning part is arranged on the side of the test component, and the panel is arranged on the side of the warning part.

[0015] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, wherein: the placement frame includes vertical rods and horizontal rods, the vertical rods and horizontal rods form a square structure, the vertical rods include a rotating hole arranged on the side thereof, the rotating hole includes an open groove arranged on the side thereof, the horizontal rod includes a toggle groove and a slider, and the toggle grooves are symmetrically arranged on both sides of the slider.

[0016] As a preferred solution of the aging cabinet for inverter energy feedback aging test described in the present invention, wherein: the test flip plate includes a placement cavity, a side plate, a double-stranded rod and a single-stranded rod, the placement cavity includes a placement plate arranged in an array, the side plates are symmetrically arranged on both sides of the test flip plate, the side plates include a flip axis and a lever, the flip axis includes a telescopic head arranged at its end, a protrusion arranged on the inner side of the flip axis, and an elastic member arranged on the side of the protrusion, the flip ball head is arranged on the side of the lever, the levers on both sides are fixedly connected to the double-stranded rod and the single-stranded rod respectively, the double-stranded rod and the single-stranded rod are movably matched with each other, the double-stranded rod includes a buckle one and a connecting rod one, the buckle one array is arranged on both sides of the double-stranded rod, the connecting rod one is arranged at the end of the double-stranded rod, the single-stranded rod includes a buckle two and a connecting rod two, the buckle two array is arranged on the surface of the single-stranded rod, and the connecting rod two is arranged at the end of the single-stranded rod.

[0017] Beneficial effects of the present invention: The present invention transforms the cabinet structure of the aging cabinet, and sets the original single-door structure to a double-door structure, so that the door opening space is increased. At the same time, in order to facilitate the staff to observe the aging test situation and maintain the device, the test part is pushed out during the opening of the cabinet door, and the tested component is turned over to face the staff, so that the staff can directly take it, avoiding the operational difficulties encountered during the taking process. At the same time, it provides activity space for maintenance personnel to repair the test cabinet, reduces the offline time of the aging cabinet, and improves work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 This is the main view of the aging cabinet used for inverter energy feedback aging test.

[0020] Figure 2 This is the front view of the door opening structure of the aging cabinet used for inverter energy feedback aging test.

[0021] Figure 3 This is the internal structure diagram of the aging cabinet used for inverter energy feedback aging test.

[0022] Figure 4 The inverter assembly structure diagram is placed in the aging cabinet used for inverter energy-feed aging test.

[0023] Figure 5 This is a structural diagram of the chute used for inverter energy feedback aging test.

[0024] Figure 6 This is a schematic diagram of the front view flip test structure of the aging cabinet used for inverter energy feedback aging test.

[0025] Figure 7 A frame structure diagram is provided for the aging cabinet test unit used for inverter energy-feed aging test.

[0026] Figure 8 This is the structural diagram of the aging cabinet A used for inverter energy feedback aging test.

[0027] Fig. 9 This is the structural diagram of the aging cabinet B used for inverter energy feedback aging test.

[0028] Fig.10 This is the structural diagram of the aging cabinet C used for inverter energy feedback aging test.

[0029] Fig.11 This is a structural diagram of the clamping part of the aging cabinet used for inverter energy feedback aging test.

[0030] Fig.12 This is the structural diagram of the aging cabinet D used for inverter energy feedback aging test.

[0031] Fig.13 This is a flow chart of the aging cabinet used for inverter energy-feed aging test during operation.

[0032] In the figure: 100, cabinet; 101, shell; 102, cabinet door; 103, test assembly; 200, test unit; 201, placement frame; 202, test flip plate; 101a, cavity; 101a-1, limit groove; 101a-2, arc groove; 101b, vertical rotation rod; 101c, slide groove; 101c-1, long groove; 101c-2, transition groove; 101c-3, short groove; 102a, handle; 102b, ram's horn; 102b-1, sliding head; 103a, panel; 103b, warning part; 201a, vertical rod; 201b, horizontal rod; 2 01a-1, rotating hole; 201a-11, opening slot; 201b-1, toggle slot; 201b-2, slider; 202a, placement cavity; 202b, side panel; 202a-1, placement plate; 202b-1, flip axis; 202b-11, telescopic head; 202b-12, bump; 202b-13, elastic member; 202b-2, toggle rod; 202b-21, flip ball head; 202c, double-strand rod; 202d, single-strand rod; 202c-1, buckle one; 202c-2, connecting rod one; 202d-1, buckle two; 202d-2, connecting rod two. DETAILED DESCRIPTION

[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the accompanying drawings.

[0034] In the following description, many specific details are set forth to facilitate a full understanding of the present invention, but the present invention may also be implemented in other ways different from those described herein, and those skilled in the art may make similar generalizations without violating the connotation of the present invention. Therefore, the present invention is not limited to the specific embodiments disclosed below.

[0035] Secondly, the term "one embodiment" or "embodiment" as used herein refers to a specific feature, structure, or characteristic that may be included in at least one implementation of the present invention. The term "in one embodiment" that appears in different places in this specification does not necessarily refer to the same embodiment, nor is it a separate or selective embodiment that is mutually exclusive with other embodiments.

[0036] Example 1, reference Figure 1 to Figure 3 , which is the first embodiment of the present invention, provides an aging cabinet for inverter energy-feed aging test, which includes a cabinet body 100 and a test unit 200.

[0037] In the inverter energy-feeding aging test cabinet, the cabinet 100 includes an outer shell 101, a cabinet door 102 and a test component 103. The test component 103 is arranged on the side of the outer shell 101, and the cabinet door 102 is symmetrically arranged on both sides of the outer shell 101; the test unit 200 is arranged inside the cabinet 100, and the test unit 200 includes a placement frame 201 and a test flip plate 202. The test flip plate 202 array is arranged inside the placement frame 201, and the placement frame 201 is slidably matched with the outer shell 101.

[0038] When in use, first place the inverter to be tested into the cabinet, and open the cabinet door 102 first. During the process of opening the cabinet door 102, the test flip plate 202 will be transported to the cabinet door position by the placement frame 201, and flipped at the end to expose the test position to be placed to the staff, so that the staff can easily align and insert the specific position of the inverter. When the cabinet door 102 is closed, the test flip plate 202 will be pushed into the test area, and the test component 103 will be started after the cabinet door is closed to perform an aging test on the inverter placed inside the test flip plate 202.

[0039] Example 2, reference Figure 3 to Figure 7 , which is the second embodiment of the present invention, is different from the first embodiment in that: it also includes a housing 101 including a cavity 101a, and a test unit 200 is arranged inside the cavity 101.

[0040] Furthermore, the cavity 101a includes a limiting groove 101a-1 and an arc groove 101a-2. The limiting groove 101a-1 is symmetrically arranged on the upper and lower sides of the cavity 101a, and the arc groove 101a-2 is symmetrically arranged on both sides of the limiting groove 101a-1.

[0041] Preferably, the housing 101 also includes a slide groove 101c symmetrically arranged on the inner wall on both sides of the cavity 101a, and the slide groove 101c includes a long groove 101c-1, a transition groove 101c-2 and a short groove 101c-3, and the long groove 101c-1, the transition groove 101c-2 and the short groove 101c-3 are arranged in an incremental step-type.

[0042] Furthermore, the short slot 101c-3 is arranged at an acute angle with the axial direction of the long slot 101c-1, and the cabinet door 102 includes a handle 102a and a horn 102b, and the horn 102b is symmetrically arranged at the upper and lower ends of the cabinet door 102, and a sliding head 102b-1 is arranged at the end of the horn 102b, and the sliding head 102b-1 protrudes on both the upper and lower sides, and the test component 103 includes a panel 103a and a warning part 103b, and the warning part 103b is arranged on the side of the test component 103, and the panel 103a is arranged on the side of the warning part 103b.

[0043] Preferably, the placement frame 201 includes a vertical rod 201a and a horizontal rod 201b, and the vertical rod 201a and the horizontal rod 201b form a square structure. The vertical rod 201a includes a rotation hole 201a-1 arranged on its side, and the horizontal rod 201b includes a toggle groove 201b-1 and a slider 201b-2, and the toggle groove 201b-1 is symmetrically arranged on both sides of the slider 201b-2.

[0044] On the basis of the first embodiment, the inverter to be tested is placed into the cabinet, and the cabinet door 102 is opened first. During the process of opening the cabinet door 102, the test flip plate 202 will be transported to the cabinet door position by the placement frame 201 and flipped at the end to expose the test position to be placed to the staff, so that the staff can easily align and insert the specific position of the inverter. When the cabinet door 102 is closed, the test flip plate 202 will be pushed into the test area, and the test component 103 will be started after the cabinet door is closed to perform an aging test on the inverter placed inside the test flip plate 202.

[0045] Specifically, the cavity 101a provides space for aging testing, the arc groove 101a-2 slides with one side of the sliding head 102b-1 on the cabinet door 102, and the toggle groove 201b-1 slides with the other side of the sliding head 102b-1. Therefore, when opening and closing the cabinet door, the toggle groove 201b-1 is driven by the toggle effect of the sliding head 102b-1 to drive the placement frame 201 to move outward, and because the slider 201b-2 slides with the limit groove 101a-1, the placement frame 201 performs translational motion. At this time, it should be noted that when opening one cabinet door alone, it cannot be opened, because the slider 201b-2 and the limit groove 101a-1 are slidingly matched. When one side of the cabinet door 102 is opened and closed and is subject to torque, at a certain spatial position, the placement frame 201 generates a torsional torque, which makes the slider 201b-2 fit tightly with the limit groove 101a-1, so the cabinet body cannot be opened from one cabinet door 102 alone.

[0046] Preferably, at this time, the aging test operation can be completed by placing the inverter structure to be tested into the cavity 101a, and the cabinet door that needs to be opened by both hands ensures safety during the test.

[0047] Example 3, reference Figures 1 to 10 , which is the third embodiment of the present invention, and is different from the previous two embodiments in that: it includes a placement frame 201 including a vertical rod 201a and a horizontal rod 201b, the vertical rod 201a and the horizontal rod 201b form a square structure, the vertical rod 201a includes a rotation hole 201a-1 arranged on the side thereof, the rotation hole 201a-1 includes an open groove 201a-11 arranged on the side thereof, the horizontal rod 201b includes a toggle groove 201b-1 and a slider 201b-2, and the toggle groove 201b-1 is symmetrically arranged on both sides of the slider 201b-2.

[0048] Preferably, the test flip plate 202 includes a placement cavity 202a, a side plate 202b, a double-strand rod 202c and a single-strand rod 202d, the placement cavity 202a includes a placement plate 202a-1 arranged in an array, the side plates 202b are symmetrically arranged on both sides of the test flip plate 202, the side plates 202b include a flip shaft 202b-1 and a lever 202b-2, the flip shaft 202b-1 includes a telescopic head 201b-11 arranged at its end, a convex block 202b-12 arranged on the inner side of the flip shaft 202b-1, and an elastic member 202b-13 arranged on the side of the convex block 202b-12, and the flip ball head 202b-21 is arranged On the side of the shift rod 202b-2, the shift rods 202b-2 on both sides are fixedly connected to the double-strand rod 202c and the single-strand rod 202d respectively, and the double-strand rod 202c and the single-strand rod 202d are movably matched with each other in a gap. The double-strand rod 202c includes a buckle 202c-1 and a connecting rod 202c-2. The buckle 202c-1 array is arranged on both sides of the double-strand rod 202c, and the connecting rod 202c-2 is arranged at the end of the double-strand rod 202c. The single-strand rod 202d includes a buckle 202d-1 and a connecting rod 202d-2. The buckle 202d-1 array is arranged on the surface of the single-strand rod 202d, and the connecting rod 202d-2 is arranged at the end of the single-strand rod 202d.

[0049] In the previous embodiment, the cavity 101a provides space for aging testing, the arc groove 101a-2 slides with one side of the sliding head 102b-1 on the cabinet door 102, and the toggle groove 201b-1 slides with the other side of the sliding head 102b-1. Therefore, when opening and closing the cabinet door, the toggle groove 201b-1 is driven by the toggle effect of the sliding head 102b-1 to drive the placement frame 201 to move outward, and because the slider 201b-2 slides with the limit groove 101a-1, the placement frame 201 performs translational motion. At this time, it should be noted that when opening one cabinet door alone, it cannot be opened because the slider 201b-2 slides with the limit groove 101a-1. When one side of the cabinet door 102 is opened and closed and is subject to torque, at a certain spatial position, the placement frame 201 generates a torsional torque, which makes the slider 201b-2 fit tightly with the limit groove 101a-1, so the cabinet body cannot be opened from one cabinet door 102 alone.

[0050] In this embodiment, when the cabinet door is opened, the placement frame 201 is pulled to move outward, and at the same time, the test flip plate 202 on the placement frame 201 is driven to move outward. At this time, the flip shafts 202b-1 on both sides of the test flip plate 202 begin to move along the slide groove 101c respectively. At the beginning of the stepped slide groove 101c, the long groove 101c-1 does not produce an extrusion effect on the telescopic head 201b-11, and when it moves to the transition groove 101c-2 position, the telescopic head 201b-11 is deformed and extruded, and the open groove 201a-11 located on the side of the placement frame 201 is unlocked from the protrusion 202b-12. At this time, the test flip plate 202 can rotate, and the flip ball head 202b-21 at the end of the lever 202b-2 has not yet entered the short groove 101c-3. Inside, the test flip plate 202 cannot rotate at this time, and then when the flip ball head 202b-21 enters the short groove 101c-3, the flip ball head 202b-21 is squeezed by the step inside the short groove 101c-3. At this time, the lever 202b-2 pushes the double-strand rod 202c and the single-strand rod 202d to move centripetally, and the gap between the buckle 1 202c-1 and the buckle 2 202d-1 on the double-strand rod 202c and the single-strand rod 202d begins to increase, unlocking the tested inverter assembly. On the contrary, during the test, since the double-strand rod 202c and the single-strand rod 202d are coordinated through the connecting rod and the elastic member, the lower end of the tested inverter is subjected to the clamping force of the buckle 1 202c-1 and the buckle 2 202d-1, so the inverter assembly can be firmly placed on the test flip plate 202.

[0051] Furthermore, when a new inverter to be tested needs to be placed, the inverter assembly is placed in the placement position, and then the placement frame 201 and the test flip plate 202 are pushed back into the cabinet, and the clamping between the buckles can place the inverter firmly.

[0052] In summary, before the test, the staff simultaneously operates the cabinet door handles on both sides, and the cabinet doors are opened outwards. The sliding head 102b-1 at the end of the cabinet door horns slides along the arc groove 101a-2 of the shell cavity 101a and the toggle groove 201b-1 of the cross bar 201b of the placement frame 201. Since the slider 201b-2 is slidably matched with the limit groove 101a-1, the placement frame 201 is translated outward along the slide groove 101c of the inner wall of the shell under the toggle of the sliding head 102b-1, and the test flip plate 202 on the placement frame 201 also moves outward accordingly, and the flip shafts 202b-1 on both sides of the test flip plate 202 move along the stepped slide groove 101c. In the initial stage, the long groove 101c-1 will not squeeze the telescopic head 201b-11 at the end of the flip shaft 202b-1. When it moves to the transition groove 101c-2 position, the telescopic head 201b-11 is squeezed and deformed, so that the open groove 201a-11 located on the side of the placement frame 201 is unlocked from the protrusion 202b-12 on the inner side of the flip axis 202b-1. At this time, the test flip plate 202 is able to rotate, but because the flip ball head 202b-21 at the end of the lever 202b-2 has not yet entered the short groove 101c-3, the test flip plate 202 cannot rotate temporarily. As the placement frame 201 continues to move outward, when the flip ball head 202b-21 enters the short groove 101c-3, the flip ball head 202b-21 is squeezed by the steps inside the short groove 101c-3. This squeezing action causes the lever 202b-2 to push the double-stranded rod 202c and the single-stranded rod 202d to move centripetally, and the gap between the buckle 1 202c-1 on the double-stranded rod 202c and the buckle 2 202d-1 on the single-stranded rod 202d increases, thereby unlocking the inverter assembly placed on the test flip plate 202, making it convenient for the staff to take out the tested inverter or place a new inverter to be tested. After placing the inverter, the staff closes the cabinet door. In the process of closing the cabinet door, the placement frame 201 and the test flip plate 202 move inward along the slide groove 101c. With the movement, the matching state of the above components changes in the opposite direction, and the double-stranded rod 202c and the single-stranded rod 202d return to the initial state under the action of the connecting rod and the elastic member. The buckle 1 202c-1 and the buckle 2 202d-1 generate a clamping force on the lower end of the inverter, so that the inverter is firmly placed on the test flip plate 202.

[0053] Example 4, reference Figures 1 to 13 , which is the fourth embodiment of the present invention, and this embodiment provides an aging cabinet test system applied to the present invention.

[0054] Specifically, the system is initialized first, the system power is turned on, and the hardware devices perform self-tests, including sensors, controllers, and motors. The driver layer initializes the device drivers and establishes a communication connection with the host computer. The application layer starts the user interface and displays the system initial status information.

[0055] Furthermore, the user clicks the door opening button on the host computer interface, and the application layer sends a command to the driver layer. The driver layer controls the motor to open the door, and the position sensor monitors the position of the door, placement frame, and test flip board in real time to ensure that they move to the correct position. When the test flip board flips to the appropriate angle, the user places the inverter in the placement cavity of the test flip board.

[0056] Furthermore, when the user clicks the Start Test button, the application layer sends a test start command to the driver layer. The driver layer starts the test component and performs an aging test on the inverter according to the preset test parameters. The electrical parameter sensor collects the electrical parameters of the inverter in real time and uploads them to the application layer through the driver layer. The application layer displays the electrical parameters in real time on the user interface and stores the data at the same time. If an abnormal electrical parameter is detected, the application layer triggers the alarm mechanism and the driver layer stops the test component from working.

[0057] Furthermore, after the test is completed, the cabinet door is opened, and the cabinet door repeats the movement of the same placement frame to flip the tested inverter assembly, and then the clamping structure is released to facilitate the staff to take it and re-place the new inverter to be tested to continue testing.

[0058] Furthermore, after the aging test is completed, the driver layer stops the test component and the application layer displays the test results. The user clicks the close door button, the driver layer controls the motor to close the door, and the test flip board is reset. The application layer stores the test data in the database and can generate a test report for the user to view and print.

[0059] To summarize, the present invention, through the transformation of the cabinet structure of the aging cabinet, sets the original single-door structure to a double-door structure, thereby increasing the door opening space; at the same time, in order to facilitate the staff to observe the aging test conditions and perform maintenance on the device, the test part is pushed out during the process of opening the cabinet door, and the tested component is turned over to face the staff, thereby facilitating the staff to directly take it, avoiding the operational difficulties encountered during the taking process, and providing movement space for maintenance personnel to repair the test cabinet, thereby reducing the offline time of the aging cabinet and improving work efficiency.

[0060] It is important to note that the above embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. An aging cabinet for inverter energy-feed aging test, characterized in that: include, A cabinet (100), the cabinet (100) comprising a housing (101), a cabinet door (102) and a test assembly (103), the test assembly (103) being arranged on a side of the housing (101), and the cabinet door (102) being symmetrically arranged on both sides of the housing (101); and, A test unit (200), the test unit (200) is arranged inside the cabinet (100), the test unit (200) comprises a placement frame (201) and a test flip plate (202), the test flip plate (202) is arranged in an array inside the placement frame (201), and the placement frame (201) is slidably matched with the housing (101).

2. The aging cabinet for inverter energy-feed aging test according to claim 1, characterized in that: The housing (101) comprises a cavity (101a), and a test unit (200) is arranged inside the cavity (101).

3. The aging cabinet for inverter energy-feed aging test according to claim 2, characterized in that: The cavity (101a) comprises a limiting groove (101a-1) and an arc-shaped groove (101a-2); the limiting groove (101a-1) is symmetrically arranged on the upper and lower sides of the cavity (101a); and the arc-shaped groove (101a-2) is symmetrically arranged on both sides of the limiting groove (101a-1).

4. The aging cabinet for inverter energy-feed aging test according to claim 3, characterized in that: The housing (101) further comprises vertical rotating rods (101b) symmetrically arranged on both sides thereof.

5. The aging cabinet for inverter energy-feed aging test according to claim 4, characterized in that: The housing (101) further comprises sliding grooves (101c) symmetrically arranged on the inner walls of both sides of the cavity (101a); the sliding grooves (101c) comprise a long groove (101c-1), a transition groove (101c-2) and a short groove (101c-3); the long groove (101c-1), the transition groove (101c-2) and the short groove (101c-3) are arranged in an incremental step-like manner.

6. The aging cabinet for inverter energy-feed aging test according to claim 5, characterized in that: The short slot (101c-3) is arranged at an acute angle to the axial direction of the long slot (101c-1).

7. The aging cabinet for inverter energy-feed aging test according to claim 6, characterized in that: The cabinet door (102) comprises a handle (102a) and a horn (102b), wherein the horn (102b) is symmetrically arranged at the upper and lower ends of the cabinet door (102), and a sliding head (102b-1) is arranged at the end of the horn (102b), and the sliding head (102b-1) protrudes at both the upper and lower sides.

8. The aging cabinet for inverter energy-feed aging test according to claim 7, characterized in that: The test component (103) comprises a panel (103a) and a warning portion (103b); the warning portion (103b) is arranged on a side of the test component (103), and the panel (103a) is arranged on a side of the warning portion (103b).

9. The aging cabinet for inverter energy-feed aging test according to claim 8, characterized in that: The placement frame (201) comprises a vertical rod (201a) and a horizontal rod (201b), the vertical rod (201a) and the horizontal rod (201b) forming a square structure, the vertical rod (201a) comprising a rotation hole (201a-1) arranged on a side thereof, the rotation hole (201a-1) comprising an opening groove (201a-11) arranged on a side thereof, the horizontal rod (201b) comprising a toggle groove (201b-1) and a slider (201b-2), the toggle groove (201b-1) being symmetrically arranged on both sides of the slider (201b-2).

10. The aging cabinet for inverter energy-feed aging test according to claim 9, characterized in that: The test flip plate (202) comprises a placement cavity (202a), side plates (202b), a double-stranded rod (202c) and a single-stranded rod (202d); the placement cavity (202a) comprises placement plates (202a-1) arranged in an array; the side plates (202b) are symmetrically arranged on both sides of the test flip plate (202); the side plates (202b) comprise a flip shaft (202b-1) and a lever (202b-2); the flip shaft (202b-1) comprises a telescopic head (201b-11) arranged at its end, a convex block (202b-12) arranged on the inner side of the flip shaft (202b-1), and an elastic member (202b-13) arranged on the side of the convex block (202b-12); the flip ball head (202b-21) is arranged on the lever The side of the rod (202b-2), the shifting rods (202b-2) on both sides are respectively fixedly connected to the double-strand rod (202c) and the single-strand rod (202d), the double-strand rod (202c) and the single-strand rod (202d) are intermittently matched, the double-strand rod (202c) comprises a buckle 1 (202c-1) and a connecting rod 1 (202c-2), the buckle 1 (202c-1) array is arranged on both sides of the double-strand rod (202c), the connecting rod 1 (202c-2) is arranged at the end of the double-strand rod (202c), the single-strand rod (202d) comprises a buckle 2 (202d-1) and a connecting rod 2 (202d-2), the buckle 2 (202d-1) array is arranged on the surface of the single-strand rod (202d), and the connecting rod 2 (202d-2) is arranged at the end of the single-strand rod (202d).

Images