Test method and device and storage medium

Abstract

The invention relates to a test method and device and a storage medium. The test method comprises the following steps: acquiring a serial number of a spot inspection object used for assisting a test; based on the serial number, generating a control instruction for the spot inspection object; and sending the control instruction to a second device in communication connection with the first device to control the second device to convey the spot inspection object to a target test position. Through the embodiment of the invention, automatic testing based on the spot inspection object can be realized, and the testing efficiency is improved.

Description

Technical Field

[0001] The present disclosure relates to the field of testing, and in particular, to a testing method, apparatus, and storage medium. Background Art

[0002] With the wide use of electronic devices, it is usually necessary to test the electronic devices to detect whether their performance meets the requirements. During the testing process, there are often line losses. To ensure the accuracy of the test results, manual testing is used to obtain the line loss compensation value for calibration. Traditional testing usually involves complex manual operations, resulting in low testing efficiency. Summary of the Invention

[0003] To overcome the problems existing in the related art, the present disclosure provides a testing method, apparatus, and storage medium, which can achieve automated testing based on the inspection object and improve the testing efficiency.

[0004] According to the first aspect of the embodiments of the present disclosure, a testing method is provided, which is applied to a first device and at least includes:

[0005] Obtain the serial number of the inspection object for assisting in the test;

[0006] Generate a control instruction for the inspection object based on the serial number;

[0007] Send the control instruction to a second device that has established a communication connection with the first device to control the second device to transport the inspection object to the target test position.

[0008] In some embodiments, the control instruction includes a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device;

[0009] The sending the control instruction to a second device that has established a communication connection with the control device includes:

[0010] Send the first control instruction to the transfer device to control the transfer device to transport the inspection object to the test device;

[0011] Send the second control instruction to the test device to control the test device to transport the received inspection object to the target test position.

[0012] In some embodiments, the generating the control instruction for the inspection object based on the serial number includes:

[0013] Based on the serial number, determine the passing result of the inspection object in the transfer device and the passing result of the inspection object in the test device;

[0014] Generate the first control instruction based on the passing result of the object to be inspected in the transfer device;

[0015] Generate the second control instruction based on the passing result of the object to be inspected in the test device.

[0016] In some embodiments, the method further includes:

[0017] Receive a query request sent by the transfer device through the query interface of the first device;

[0018] Obtain inspection information associated with the object to be inspected based on the query request; the inspection information is at least used to indicate the quantity of the object to be inspected;

[0019] Send the inspection information to the transfer device through the query interface of the first device.

[0020] In some embodiments, the method further includes:

[0021] Receive the serial number of the object to be inspected and the type of the object to be inspected through the binding interface of the first device;

[0022] Bind the serial number and type of the same object to be inspected to obtain a binding result.

[0023] In some embodiments, sending the control instruction to a second device that has established a communication connection with the first device includes:

[0024] Send the control instruction through the passing interface of the first device.

[0025] In some embodiments, the method further includes:

[0026] Obtain a test result returned by the test device based on the object to be inspected;

[0027] Update the historical test information of the target test location based on the test result.

[0028] In some embodiments, obtaining the test result returned by the test device based on the object to be inspected includes:

[0029] Obtain the test result through the test feedback interface of the first device.

[0030] In some embodiments, the method further includes:

[0031] Obtain the quantity change value of the object to be inspected in the transfer device through the quantity interface of the first device.

[0032] In some embodiments, the target test position is the target test drawer of the test cabinet in the test device, and the method further includes:

[0033] Obtain the enabled state and the non-enabled state of the target test drawer through the enabling interface of the first device.

[0034] According to a second aspect of the embodiments of the present disclosure, a testing method is provided, which is applied to a second device and at least includes:

[0035] Obtain a control instruction sent by a first device;

[0036] Based on the control instruction, transport the inspection object for assisting the test to the target test position.

[0037] In some embodiments, the control instruction includes a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device;

[0038] The transporting the inspection object for assisting the test to the target test position based on the control instruction includes:

[0039] Based on the first control instruction, transport the inspection object to the test device;

[0040] Based on the second control instruction, transport the inspection object received by the test device to the target test position.

[0041] In some embodiments, the obtaining the control instruction sent by the first device includes:

[0042] Scan the inspection object at the first docking position of the transfer device in the second device to obtain the serial number of the inspection object;

[0043] Send the serial number of the inspection object at the first docking position to the first device;

[0044] Receive the first control instruction returned by the first device through the transfer device; the first control instruction is used to transport the inspection object that reaches the first docking position to the test device.

[0045] In some embodiments, the obtaining the control instruction sent by the first device includes:

[0046] Scan the inspection object at the second docking position of the test device in the second device to obtain the serial number of the inspection object;

[0047] Send the serial number of the inspection object at the second docking position to the first device;

[0048] Receiving, by the test device, a second control instruction returned by the first device; the second control instruction is used to transport the inspection object that has reached the second connection position to the target test position.

[0049] In some embodiments, the method further includes:

[0050] Sending, through the query interface of the transfer device, a query request to the first device;

[0051] Receiving, through the query interface of the transfer device, inspection information returned by the first device based on the query request;

[0052] Controlling the quantity of the transported inspection objects based on the inspection information.

[0053] In some embodiments, the obtaining of the control instruction sent by the first device includes:

[0054] Obtaining, through the passing-through interface of the transfer device, a first control instruction for the transfer device in the second device;

[0055] Obtaining, through the passing-through interface of the test device, a second control instruction for the test device in the second device.

[0056] In some embodiments, the method further includes:

[0057] Sending, through the test feedback interface of the test device in the second device, a test result to the first device, where the test result is obtained by the test device based on the inspection object at the target test position.

[0058] In some embodiments, the method further includes:

[0059] Sending, through the quantity interface of the transfer device in the second device, a change value of the quantity of the inspection objects in the transfer device to the first device.

[0060] In some embodiments, the target test position is the target test drawer of the test cabinet in the test device, and the method further includes:

[0061] Sending, through the enabling interface of the transfer device in the second device, the enabling state and the non-enabling state of the target test position to the first device.

[0062] According to a third aspect of the embodiments of the present disclosure, there is provided a test device applied to a first device, at least including:

[0063] A serial number acquisition module configured to acquire the serial number of the inspection object for assisting in the test;

[0064] A generation module, configured to generate a control instruction for the inspection object based on the serial number;

[0065] A control module, configured to send the control instruction to a second device that has established a communication connection with the first device, so as to control the second device to transport the inspection object to a target test position.

[0066] According to a fourth aspect of the embodiments of the present disclosure, there is provided a testing device, which is applied to a second device and at least includes:

[0067] A second acquisition module, configured to acquire a control instruction sent by a first device;

[0068] A transportation module, configured to transport the inspection object to a target test position based on the control instruction.

[0069] According to a fifth aspect of the embodiments of the present disclosure, there is provided a testing device, which at least includes:

[0070] A processor;

[0071] A memory for storing instructions executable by the processor;

[0072] Wherein, the processor is configured to execute the testing method described in the first aspect or the second aspect above.

[0073] According to a sixth aspect of the embodiments of the present disclosure, there is provided a storage medium, including:

[0074] When the instructions in the storage medium are executed by the processor of the first device, the first device can execute the data processing method described in the first aspect above; or when the instructions in the storage medium are executed by the processor of the second device, the second device can execute the data processing method described in the second aspect above.

[0075] The technical solutions provided by the embodiments of the present disclosure may include the following beneficial effects:

[0076] In the embodiments of the present disclosure, the first device controls the second device to transport the inspection object to the target test position to assist in the test. In this way, through the communication connection between the first device and the second device, the inspection object is automatically transported to the target test position, without manually moving the inspection object or manually controlling the inspection object to the target test position for testing. Furthermore, automated testing based on the inspection object can be achieved, improving the testing efficiency.

[0077] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit the present disclosure. Description of the Drawings

[0078] The accompanying drawings herein are incorporated into the specification and constitute a part of the specification, showing embodiments consistent with the present disclosure, and are used together with the specification to explain the principles of the present disclosure.

[0079] Figure 1 is a schematic flowchart of a test method shown according to an exemplary embodiment Figure 1 .

[0080] Figure 2 is a schematic structural diagram of a first device and a second device shown according to an exemplary embodiment.

[0081] Figure 3 is a schematic structural diagram of a test cabinet shown according to an exemplary embodiment.

[0082] Figure 4 is a schematic flowchart of a test method shown according to an exemplary embodiment Figure 2 .

[0083] Figure 5 is a schematic diagram of the state of a test cabinet shown according to an exemplary embodiment.

[0084] Figure 6 is a schematic diagram of the state of a test drawer shown according to an exemplary embodiment.

[0085] Figure 7 is a schematic interaction diagram of a first device and a second device shown according to an exemplary embodiment.

[0086] Figure 8 is a schematic flowchart of a test process shown according to an exemplary embodiment.

[0087] Figure 9 is a schematic detailed structural diagram of a first device and a second device shown according to an exemplary embodiment.

[0088] Figure 10 is a structural block diagram of a test device provided according to an exemplary embodiment Figure 1 .

[0089] Figure 11 is a structural block diagram of a test device provided according to an exemplary embodiment Figure 2 .

[0090] Figure 12 is a block diagram of a test device shown according to an exemplary embodiment. Detailed implementation manners

[0091] Exemplary embodiments will be described in detail herein, and examples thereof are shown in the accompanying drawings. When the following description refers to the accompanying drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. On the contrary, they are merely examples of test methods, devices, and storage media consistent with some aspects of the present disclosure as detailed in the appended claims.

[0092] An embodiment of the present disclosure provides a test method. Figure 1 It is a schematic flowchart of a test method shown according to an exemplary embodiment. Figure 1 As Figure 1 shown, the test method is applied to a first device and includes the following steps:

[0093] S101. Obtain the serial number of the inspection object for assisting in the test;

[0094] S102. Generate a control instruction for the inspection object based on the serial number;

[0095] S103. Send the control instruction to a second device that has established a communication connection with the first device to control the second device to transport the inspection object to the target test position.

[0096] In an embodiment of the present disclosure, the test method is applied to the application scenario of the inspection service in the main board test process of industrial production and manufacturing. In the main board test (MBT) station of the main board test process, a port confirmation operation needs to be performed. The other three workstations, including the calibration workstation (CAL), the first radio frequency (RFT1) workstation, and the second radio frequency (RFT2) workstation, all need to perform open / short (O / S) tests.

[0097] Among them, the calibration workstation is used to calibrate the hardware and software functions of the main board. The first radio frequency workstation is used to calibrate the radio frequency signals of the second-generation mobile communication technology, the third-generation mobile communication technology, and the fourth-generation mobile communication technology of the radio frequency line. The second radio frequency workstation is used to calibrate the radio frequency signals of the fifth-generation mobile communication technology, the wireless fidelity communication technology, the short-range wireless communication technology, and the global positioning system of the radio frequency line.

[0098] It should be noted that during the testing process of the main board, in order to ensure the radio frequency performance of the radio frequency module on the production line, it is necessary to measure the transmission line loss of the production fixture (including calibration workstations, test workstations, etc.). The goal is to measure the line loss from the test instrument to the thimble of the production fixture (i.e., the starting node where the electronic device receives the radio frequency signal). The closer this line loss is to the true value, the closer the product power is to the true value, and the better the radio frequency performance of the product.

[0099] The above test method is applied to a first device, which includes a wired control device. The wired control device can establish a communication connection with a second device to control the second device to transport the inspection object to the target test position.

[0100] In step S101, the first device will obtain the serial number of the inspection object. The inspection object is used to assist the test instrument in conducting line loss testing. The inspection object can be composed of circuit boards with different functions or a carrier plate loaded with at least one circuit board. Exemplarily, the circuit board includes an open circuit board, a short circuit board, a gold board, etc., and the embodiments of the present disclosure do not limit this.

[0101] For the above-mentioned obtaining of the serial number of the inspection object, when the inspection object is a circuit board, it can be obtaining the serial number of each open circuit board; or, obtaining the serial number of each short circuit board; or, obtaining the serial number of each gold board; when the inspection object is a carrier plate, it can also be putting multiple open circuit boards into the carrier plate and then obtaining the serial number of the carrier plate where the open circuit boards are located; or putting multiple short circuit boards into the carrier plate and then obtaining the serial number of the carrier plate where the short circuit boards are located; or, putting multiple gold boards into the carrier plate and then obtaining the serial number of the carrier plate where the gold boards are located.

[0102] Among them, only one type of circuit board can be placed in one carrier plate. Exemplarily, when four circuit boards are placed in one carrier plate, only four open circuit boards, or four short circuit boards, or four gold boards can be placed.

[0103] It should be noted that during the production process, since the materials on the production line include not only the inspection object but also the main board of the electronic device, the whole electronic device, the packaging box of the electronic device, etc., therefore, by obtaining the serial number of the inspection object, the inspection object can be separated from various materials based on the serial number for testing.

[0104] In the embodiments of the present disclosure, obtaining the serial number of the inspection object can be directly obtained or indirectly obtained by the first device. Exemplarily, it can be that the first device directly obtains the serial number of the inspection object through a sensor; it can also be that the first device controls the second device to scan the inspection object and obtains the serial number of the inspection object based on the signal transmitted by the second device, and the embodiments of the present disclosure do not limit this.

[0105] Among them, the serial number of the inspection object obtained by scanning can be obtained by scanning the QR code on the inspection object or by identifying the code on the inspection object. The embodiments of the present disclosure do not limit this.

[0106] In step S102, the control instruction includes an operation code and an operand. The operation code determines the operation to be completed, and the operand refers to the data participating in the operation and its unit address. That is, the control instruction for the inspection object generated based on the serial number is an instruction and command for operating the inspection object corresponding to the serial number.

[0107] The above control instruction may include multiple control instructions corresponding to the serial number. Different serial numbers may correspond to different control instructions, and these different control instructions can control the second device to perform different transportation methods.

[0108] Exemplarily, the control instruction includes parameters such as a transportation path, a transportation speed, or a set transportation time to ensure that the inspection object can be effectively and safely transported to the target test position. In some embodiments, as Figure 2 and Figure 3 shown, the second device may include multiple test devices, and the test device may include multiple test drawers. The target test position may be the position where the target test drawer in the second device is located. Through the target test drawer, the inspection object can assist the test instrument to perform a line loss test.

[0109] In step S103, a communication connection is established between the first device and the second device. Here, the communication connection can be a wired connection or a wireless connection. The embodiments of the present disclosure do not limit this. When the communication connection is a wired connection, the communication stability can be improved; when the communication connection is a wireless connection, it is convenient for the first device to communicate with multiple second devices.

[0110] Exemplarily, the wireless connection includes: connecting through a wireless local area network or a wireless wide area network. When the wireless connection is a wireless local area network connection, the first device can communicate with multiple second devices through the fourth-generation wireless network technology or the sixth-generation wireless network technology, etc.; when the wireless connection is a wireless wide area network, the first device can communicate with multiple second devices through wireless broadband wireless access.

[0111] The above control for the second device to transport the inspection object to the target test position may be to transport the inspection object to the position where the target test drawer is located. The second device includes multiple test drawers, and the test drawer that needs to be tested among the multiple test drawers is the target test drawer. The inspection object needs to be transported inside one of the multiple target test drawers to assist in the test.

[0112] In an embodiment of the present disclosure, the first device can obtain the number of objects to be spot-checked based on the number of target test positions, and then generate a list of objects to be spot-checked corresponding to the serial numbers of the objects to be spot-checked and the target test positions based on the serial numbers of the objects to be spot-checked corresponding to the number of target test positions. At this time, the first device can determine the target test position (i.e., the target test drawer position) corresponding to the serial number of the object to be spot-checked based on the serial number of the object to be spot-checked sent by the second device and the list of objects to be spot-checked, and control the second device to transport the object to be spot-checked to the target test position based on the target test position corresponding to the serial number of the object to be spot-checked.

[0113] The above objects to be spot-checked for assisting in testing may include: a radio frequency line is connected to the target test position, and a slot for connecting the radio frequency line is provided at the target test position. When the object to be spot-checked is placed on the target test position, the object to be spot-checked is connected to one end of the radio frequency line through the slot, and the other end of the radio frequency line is connected to a test instrument, and the test instrument obtains the line loss value of the radio frequency line.

[0114] It should be noted that the objects to be spot-checked include an open circuit board, a short circuit board, and a gold board. The process of obtaining the target line loss value includes: obtaining the first line loss value of the radio frequency line through the open circuit board, obtaining the second line loss value of the same radio frequency line through the short circuit board, and obtaining the third line loss value of the same radio frequency line through the gold board; calculating the average line loss value of the first line loss value and the second line loss value; comparing the average line loss value with the third line loss value. When the difference between the average line loss value and the third line loss value is within a preset threshold range, the average line loss value is the target line loss value.

[0115] Exemplarily, the preset threshold range is from -0.5 decibels to 0.5 decibels.

[0116] In an embodiment of the present disclosure, the first device controls the second device to transport the object to be spot-checked to the target test position to assist in testing. In this way, the embodiment of the present disclosure can automatically transport the object to be spot-checked to the target test position through the communication connection between the first device and the second device, without manually moving the object to be spot-checked, nor manually controlling the object to be spot-checked to the target test position for testing, thereby enabling automatic testing of the object to be spot-checked and improving the testing efficiency.

[0117] In one embodiment, the control instruction includes a first control instruction for the transfer device in the second device and a second control instruction for the test device in the second device;

[0118] Sending the control instruction to a second device that has established a communication connection with the control device includes:

[0119] Sending the first control instruction to the transfer device to control the transfer device to transport the object to be spot-checked to the test device;

[0120] Send the second control instruction to the test device to control the test device to transport the received object to be spot-checked to the target test position.

[0121] In an embodiment of the present disclosure, the second device includes a transfer device and a test device. The transfer device includes a material table, a storage rack, and an end effector. The material table is used to store materials, the storage rack is used to store different types of objects to be spot-checked, and the end effector is used to transport different types of objects to be spot-checked to the test device.

[0122] The above-mentioned first device is communicatively connected to the transfer device and sends a first control instruction to the transfer device to control the transfer device to transport the object to be spot-checked to the test device.

[0123] Among them, the first control instruction at least includes an instruction to transport a plurality of objects to be spot-checked to the test device, and may also include instructions for the transport time and transport speed. In response to the first control instruction, the transfer device controls the end effector to transport a plurality of objects to be spot-checked to the test device, and may also control the transport time and transport speed of the plurality of objects to be spot-checked to the test device.

[0124] In an embodiment of the present disclosure, the test device includes a console and a test cabinet with different test drawers. The console is used to control the tests of the test cabinet and the test drawers. The test cabinet is used to accommodate the test drawers, and the test drawers are used to accommodate the objects to be spot-checked to assist in the test.

[0125] The above-mentioned first device is communicatively connected to the test device and can send a second control instruction to the test device to control the test device to transport the received object to be spot-checked to the target test position.

[0126] Among them, the second control instruction at least includes an instruction to transport the serial numbers of a plurality of objects to be spot-checked to their respective target test positions, and may also include instructions such as transport time and transport speed. In response to the second control instruction, the test device controls the transport of the object to be spot-checked to the target test position, and may also control the transport time and transport speed of the object to be spot-checked to the target test position. Here, the target test positions of different objects to be spot-checked may be the same or different.

[0127] In an embodiment of the present disclosure, the transfer device is controlled by the first control instruction, and the test device is controlled by the second control instruction, making the transportation and test processes more flexible and controllable. The first device controls the transfer device and the test device in the second device to perform their respective tasks, thereby realizing a more efficient and collaborative test method.

[0128] In one embodiment, generating a control instruction for the object to be spot-checked based on the serial number includes:

[0129] Determine the passing result of the object to be inspected in the transfer device and the passing result of the object to be inspected in the testing device based on the serial number;

[0130] Generate the first control instruction based on the passing result of the object to be inspected in the transfer device;

[0131] Generate the second control instruction based on the passing result of the object to be inspected in the testing device.

[0132] In an embodiment of the present disclosure, query the preset mapping relationship between the serial number and the target test position based on the serial number to obtain a query result. If the query result indicates that the serial number corresponds to a target test position, the passing result of the object to be inspected in the transfer device can be represented as 0, and the first control instruction generated based on the passing result represented as 0 can control the transfer device to transport the object to be inspected corresponding to the serial number to the testing device;

[0133] If the query result indicates that the serial number does not correspond to a target test position, the passing result of the object to be inspected in the transfer device can be represented as non-zero, and the passing result represented as non-zero can control the transfer device to recycle the object to be inspected to the material platform;

[0134] If the query result indicates that the object to be inspected does not correspond to a serial number, the passing result of the object to be inspected in the transfer device can be represented as -1, and the passing result represented as -1 can control the transfer device to let the object to be inspected flow to the production line.

[0135] Among them, different passing results correspond to different control instructions, respectively corresponding to the first device controlling the transfer device to perform different execution actions on the object to be inspected. The first control instruction at least includes an instruction to transport the object to be inspected to the testing device.

[0136] In an embodiment of the present disclosure, query the preset mapping relationship between the serial number and the target test position based on the serial number to obtain a query result. If the query result indicates that the serial number corresponds to a target test position, the passing result of the object to be inspected in the testing device can be represented as non-zero, and the second control instruction generated based on the passing result represented as non-zero can control the testing device to transport the object to be inspected corresponding to the serial number to the target test position;

[0137] If the query result indicates that the serial number does not correspond to a target test position, the passing result of the object to be inspected in the testing device can be represented as 0, and the passing result represented as 0 can control the current testing device to transport the object to be inspected to the next testing device;

[0138] If the query result indicates that there is no corresponding serial number for the inspection object, the passing result of the inspection object at the midpoint of the test equipment can be represented as -1, and the passing result based on -1 can control the test equipment to direct the inspection object to the production line.

[0139] Among them, different passing results correspond to different control instructions, respectively corresponding to the first device controlling the test equipment to perform different execution actions on the inspection object. The second control instruction at least includes the target test position corresponding to the serial number of the inspection object.

[0140] In the embodiments of the present disclosure, through the serial number of the inspection object and the corresponding target test position, the passing results of the inspection object in the transfer equipment and the test equipment can be dynamically determined, thereby generating corresponding control instructions, realizing a more intelligent and flexible test method.

[0141] In one embodiment, the method further includes:

[0142] Receiving a query request sent by the transfer equipment through the query interface of the first device;

[0143] Obtaining inspection information associated with the inspection object based on the query request; the inspection information is at least used to indicate the quantity of the inspection object;

[0144] Sending the inspection information to the transfer equipment through the query interface of the first device.

[0145] In the embodiments of the present disclosure, the first device is provided with a query interface, which can effectively receive and process query requests sent by the transfer equipment. The query interface includes a network interface, an application program interface or other forms of communication channels, and the embodiments of the present disclosure do not limit this.

[0146] Among them, the first device receives the query request and sends the inspection information through the query interface. The function called by the first device can be int QuerySpotlnspectionSigna(int plate Type, int&plateNum).

[0147] The above query request includes querying inspection information. After receiving the query request, the first device, based on the query request, obtains the target test position that needs to be tested, calculates the quantity and type of the inspection object based on the target test position, and returns the quantity of the inspection object to the transfer equipment through the query interface.

[0148] Among them, the first device can obtain the target test location that needs to be tested from the digital twin intelligent factory management system, which includes an Internet of Things platform and a device management system, used to strengthen information management and services, clearly master the production and sales process, improve the controllability of the production process, reduce the manual intervention on the production line, instantaneously and correctly collect production line data, and arrange reasonable production plans and production schedules.

[0149] Calculate the quantity and type of the inspection objects based on the above-mentioned target test location. Exemplarily, when the target test location is used to test the line loss value of a radio frequency line, one radio frequency line requires an open circuit board, a short circuit board, and a gold board for testing. One target test location can be connected to four radio frequency lines. Therefore, one target test location requires four open circuit boards, four short circuit boards, and four gold boards.

[0150] Send the inspection information to the transfer device through the above-mentioned query interface. The inspection information can be encapsulated into a response message, which includes detailed information such as the quantity and type of the inspection objects.

[0151] It should be noted that during the whole process, the communication connection between the first device and the transfer device remains connected to ensure the timely transmission of information.

[0152] In the embodiment of the present disclosure, the first device sends the inspection information related to the inspection objects to the transfer device through the query interface, so that the first device can better understand the status and inspection information of the inspection objects during the test process, so as to control the transfer device to transport the inspection objects more effectively and improve the efficiency of the test process.

[0153] In one embodiment, the method further includes:

[0154] Receive the serial number and type of the inspection object through the binding interface of the first device;

[0155] Bind the serial number and the type of the same inspection object to obtain a binding result.

[0156] In the embodiment of the present disclosure, the first device is provided with a binding interface, which can effectively receive and process the serial number of the inspection object and the type of the inspection object sent by the transfer device. The binding interface can be a dedicated data input channel, an application program interface, or other forms of data receiving mechanisms. The embodiment of the present disclosure does not limit this.

[0157] Among them, the first device can call a function through the binding interface to receive the serial number of the inspection object and the type of the inspection object. Exemplarily, the function can be int BindSNAndPlateType(int plate Type stringstrPlateSN).

[0158] It should be noted that the first device can receive and parse the serial numbers of multiple inspection objects and the types of multiple inspection objects provided by the transfer device through this binding interface, bind the serial number and type of the same inspection object, and store the binding result of the serial number and type of the same inspection object in the memory.

[0159] Among them, after the binding result is stored, data verification can be performed to ensure that the input binding result format is correct and complete, prevent problems caused by data errors during transportation, and feedback information for binding confirmation can also be provided to notify whether the binding is successful, and provide the binding result when the serial number of the inspection object and the corresponding type of the inspection object are required in the case of success.

[0160] In the embodiment of the present disclosure, the first device can flexibly receive the serial number of the inspection object and the corresponding type of the inspection object provided by the transfer device through the binding interface, realize the binding of the serial number and type of the inspection object. This binding mechanism establishes a unique identifier for the inspection object in the test process and provides an accurate information basis for subsequent transportation operations.

[0161] In one embodiment, sending the control instruction to the second device that has established a communication connection with the first device includes:[[]]

[0162] Sending the control instruction through the passing interface of the first device.

[0163] In the embodiment of the present disclosure, the first device is provided with a passing interface for sending control instructions to the transfer device and the test device. The passing interface includes a network interface, an application program interface, or other forms of communication channels, and the embodiment of the present disclosure does not limit this.

[0164] It should be noted that the first device generates corresponding control instructions according to information such as the serial number of the inspection object. The control instructions can include a transportation path, a transportation speed, an action instruction, etc., and the generated control instructions are passed to the passing interface. The passing interface is responsible for passing the generated control instructions to the transfer device and the test device, and can be transmitted through a network, a message queue, a direct function call, etc., to ensure the timely transmission of the control instructions.

[0165] Among them, the first device sends control instructions through the passing station interface. The function called by the first device can be intQueryPlatelnfo(string strPlateSN, int&plate, int&dutLevel).

[0166] Exemplarily, the first device can send a first control instruction to the transfer device through the passing station interface, and can also send a second control instruction to the test device through the passing station interface.

[0167] Among them, the passing station interface of the first device can receive the feedback of the execution results of the control instructions from the transfer device and the test device, so as to monitor the execution situation of the operation in real time and adjust the transported inspection object.

[0168] In the embodiments of the present disclosure, the passing of control instructions is realized through the passing station interface, enabling the first device to dynamically control the operations of the transfer device and the test device, thereby realizing the precise control of the transportation of the inspection object. The passing station interface enables the test process to flexibly adapt to different operation requirements, improving the controllability and intelligence of the test process.

[0169] In one embodiment, the method further includes:

[0170] Obtaining the test results returned by the test device based on the inspection object;

[0171] Updating the historical test information of the target test position based on the test results.

[0172] In the embodiments of the present disclosure, the first device is communicatively connected to the test device to obtain in real time the test results returned based on the inspection object.

[0173] Exemplarily, the test results may include test-related information such as the detected data and the contact situation of the gold board.

[0174] Updating the historical test information of the target test position based on the above test results, that is, the first device stores the historical test information corresponding to the target test position. The historical test information of the target test position may include historical test results, test time, and inspection object status, etc.

[0175] Based on the test results obtained from the test device, the first device updates the historical test information of the target test position, including adding the current test results returned by testing the inspection object to the historical test information of the target test position to ensure the integrity and accuracy of the test information. The updated test information corresponding to the target test position is stored in the first device for future query and analysis.

[0176] Among them, the historical test information of the target test position can be written into the database of the first device, the data structure in the memory, or other persistent storage media, and the embodiments of the present disclosure do not limit this.

[0177] In the embodiments of the present disclosure, by obtaining the test results returned by the test device based on the inspection object and updating the historical test information of the target test drawer, the dynamic update of the historical test information is realized, ensuring the timely recording and saving of the test results, providing a complete trace of the test history based on the inspection object for the test, and helping to analyze and evaluate the performance and stability of the test process.

[0178] In one embodiment, the obtaining the test results returned by the test device based on the inspection object includes:

[0179] Obtaining the test results through the test feedback interface of the first device.

[0180] In the embodiments of the present disclosure, the first device is provided with a test feedback interface for obtaining test results from the test device. The test feedback interface can be a dedicated data input channel, an application programming interface, or other forms of data receiving mechanisms, and the embodiments of the present disclosure do not limit this.

[0181] Exemplarily, the first device obtains the test results through the test feedback interface, and the function called by the first device can be int Spotlnsepectionlnfo(int dutLevel, int resultOp).

[0182] It should be noted that through the test feedback interface, the first device can obtain the test results from the test device. Based on the test results, the first device can perform further processing. Exemplarily, it can update the test information of the target test position, generate a test report, or trigger an alarm, etc.; or, the first device can also store the test results for future query, or feedback them to other relevant systems (digital twin intelligent factory management system) or operators, etc.

[0183] In the embodiments of the present disclosure, the first device realizes the timely transmission and processing of the test results through the test feedback interface, enabling the first device to obtain and analyze the test results of the inspection object in real time, enabling the first device to perform real-time performance monitoring and feedback, and helping with the subsequent test process based on the test results.

[0184] In one embodiment, the method further includes:

[0185] Obtaining the quantity change value of the inspection object in the transfer device through the quantity interface of the first device.

[0186] In the embodiments of the present disclosure, the first device is provided with a quantity interface for obtaining the change value of the quantity of the inspection objects in the transfer device. The quantity interface can be a dedicated data input channel, an application programming interface, or other forms of data receiving mechanisms, and the embodiments of the present disclosure do not limit this.

[0187] Among them, the first device obtains the change value of the quantity of the inspection objects through the quantity interface, and the function called by the first device can be int informPlateNumChange(int plateType, int changeValue).

[0188] In the embodiments of the present disclosure, the first device stores the binding result. Based on the serial number of the inspection object and the binding result, the first device can obtain the type of the inspection object corresponding to the serial number and return the type of the inspection object to the transfer device. Here, after receiving the type of the inspection object, the transfer device will send the change value of the quantity of different types of inspection objects to the first device based on the serial number and type corresponding to the inspection object. The first device can update the type and quantity of the inspection objects that need to be assisted in testing based on the received change value of the quantity, so as to better schedule the inspection objects transported by the transfer device.

[0189] It should be noted that the first device can periodically send a quantity request to the transfer device through the quantity interface to obtain the change value of the quantity of the inspection objects. The frequency of sending the quantity request here can be set according to actual needs. Exemplarily, it can be set within the range of 1 second to 30 seconds, and the embodiments of the present disclosure do not limit this.

[0190] Among them, the change value of the quantity of the inspection objects includes information such as the increased quantity, the decreased quantity, and the serial number of the corresponding inspection object. The first device can perform further processing based on the change value of the quantity, such as updating the quantity of the inspection objects in the first device, recording the changed quantity, generating a report, etc.; or, the first device can also store the change value of the inspection objects for future query, or feedback it to other relevant systems (digital twin intelligent factory management system) and operators, etc.

[0191] In the embodiments of the present disclosure, the first device realizes the real-time acquisition and processing of the change in the quantity of the inspection objects in the transfer device through the quantity interface, enabling the first device to timely understand the change situation of the inspection objects, providing real-time management and monitoring of the inspection objects for the test process, and helping to timely adjust the transportation status of the inspection objects during the test process.

[0192] In one embodiment, the target test position is the target test drawer of the test cabinet in the test device, and the method further includes:

[0193] Obtain the enabled status and disabled status of the target test drawer through the enabling interface of the first device.

[0194] In the embodiments of the present disclosure, the first device is provided with an enabling interface for obtaining the enabled status and disabled status of the target test drawer in the test device. The enabling interface can be a network interface, an application programming interface, or other forms of data receiving mechanisms, and the embodiments of the present disclosure do not limit this.

[0195] Among them, the first device obtains the enabled status and disabled status of the target test drawer through the enabling interface. The function called by the first device can be int SetTesting ToolStatus(int num, int status).

[0196] It should be noted that the first device can periodically send a query request to the test device through the enabling interface to obtain the enabled status and disabled status of the target test drawer. The query frequency can be set according to actual needs. Exemplarily, the query frequency is in the range of 1 second to 30 seconds, and the embodiments of the present disclosure do not limit this.

[0197] Among them, the first device can control the timing of the test device to place the inspection object into the target test drawer based on the enabled status and disabled status of the target test drawer. Exemplarily, when the first inspection object is placed in the target test drawer for testing, the target test drawer obtained by the first device at this time is in the enabled status. When the first inspection object and the target test drawer test are completed, the target test drawer obtained by the first device is in the disabled status. Then the first device can control the test device to take out the first inspection object from the target test drawer and control the second inspection object to be placed in the target test drawer for testing.

[0198] Alternatively, the first device can also record the duration between the state changes of the target test drawer based on the time when the enabled status of the target test drawer switches to the disabled status to determine whether the target test drawer has a fault that needs to be detected.

[0199] In the embodiments of the present disclosure, the first device realizes the real-time acquisition and processing of the enabled status and disabled status of the target test drawer through the enabling interface, enabling the first device to timely understand the status of the target test drawer, providing real-time test environment management and monitoring for the test process, and helping to reasonably schedule the use of the inspection object and the target test drawer.

[0200] In one embodiment, as Figure 4 shown, the test method provided by the embodiments of the present disclosure, applied to the second device, may at least include the following steps:

[0201] S201. Obtain the control instruction sent by the first device;

[0202] S202. Transport the object to be inspected to the target test position based on the control instruction.

[0203] In step S201, the second device and the first device are communicatively connected. The second device can obtain the control instruction sent by the first device based on wired communication or wireless communication. The embodiments of the present disclosure do not limit this.

[0204] It should be noted that the second device can receive different control instructions sent by the first device and respond to the control instruction.

[0205] Exemplarily, the control instruction includes a first control instruction and a second control instruction. The second device obtains the first control instruction and the second control instruction. Based on different control instructions, the second device executes different control instructions and generates corresponding response results.

[0206] In step S202, transporting the object to be inspected to the target test position based on the control instruction includes: the transfer device of the second device determines the transportation operation to be performed according to the passing result corresponding to the object to be inspected in the first control instruction; the test device of the second device determines the transportation operation to be performed according to the passing result corresponding to the object to be inspected in the second control instruction.

[0207] Among them, the target test position includes the target test drawer of the test cabinet in the test device. By transporting the object to be inspected to the target test drawer, it assists the test instrument to perform the line loss test.

[0208] In the embodiments of the present disclosure, the second device obtains the control instruction sent by the first device and transports the object to be inspected to the target test position based on the control instruction. In this way, the embodiments of the present disclosure can control the second device through the first device to automatically transport the object to be inspected to the target test position, without manually moving the object to be inspected or manually controlling the object to be inspected to the target test position for testing, and thus can realize the automatic testing of the object to be inspected and improve the testing efficiency.

[0209] In one embodiment, the control instruction includes a first control instruction for the transfer device in the second device and a second control instruction for the test device in the second device;

[0210] Transporting the object to be inspected for assisting the test to the target test position based on the control instruction includes:

[0211] Transport the object to be inspected to the test device based on the first control instruction;

[0212] Transport the object to be inspected received by the test device to the target test position based on the second control instruction.

[0213] In an embodiment of the present disclosure, a transfer device of a second device is communicatively connected to a first device, capable of receiving a first control instruction sent by the first device, and transporting an inspection object to a test device in response to the first control instruction.

[0214] Exemplarily, the first control instruction at least includes an instruction to transport the inspection object to the test device. After receiving the inspection object, the transfer device scans it to obtain the serial number of the inspection object, and sends the serial number of the inspection object to the first device. The first device obtains the passing result of the inspection object in the transfer device based on the serial number of the inspection object, generates a first control instruction based on the passing result of the inspection object in the transfer device, and after receiving the first control instruction, the transfer device controls the end effector to transport the inspection object in the direction of the test device.

[0215] In an embodiment of the present disclosure, a test device of the second device is communicatively connected to the first device, capable of receiving a second control instruction sent by the first device, and transporting the inspection object to a target test position in response to the second control instruction.

[0216] Exemplarily, the second control instruction at least includes an instruction to transport the inspection object to the target test position. After receiving the inspection object, the test device scans it to obtain the serial number of the inspection object, and sends the serial number of the inspection object to the first device. The first device obtains the passing result of the inspection object in the test device based on the serial number of the inspection object, generates a second control instruction based on the passing result of the inspection object in the test device, and after receiving the second control instruction, the test device transports the inspection object to the target test drawer, and the target test drawer performs an auxiliary test based on the inspection object.

[0217] In an embodiment of the present disclosure, in response to the first control instruction, the transfer device transports the inspection object to the test device, and in response to the second control instruction, the test device transports the inspection object to the target test position, so that the transfer device and the test device cooperate with each other to automatically transport the inspection object to the target test position, thereby realizing a more efficient test method.

[0218] In one embodiment, the obtaining of the control instruction sent by the first device includes:

[0219] Scanning the inspection object that reaches the first docking position of the transfer device in the second device to obtain the serial number of the inspection object;

[0220] Sending the serial number of the inspection object that reaches the first docking position to the first device;

[0221] Receiving, by the transfer device, a first control instruction returned by the first device; the first control instruction is used to transport the inspection object that reaches the first docking position to the test device.

[0222] In an embodiment of the present disclosure, the transfer device includes a first docking position for scanning the inspection object to obtain the serial number.

[0223] Exemplarily, the first docking position may include: a frame, a scanner, and two parallel conveyor belts rotatably arranged on the frame. Among them, the frame is used to fixedly support the scanner and the conveyor belts, the scanner is used to scan the inspection object to obtain the serial number, and the two conveyor belts are used to transport the inspection object.

[0224] After the transfer device scans and obtains the serial number of the inspection object through the scanner, it sends the serial number of the inspection object to the first device. The first device obtains the passing result of the inspection object located in the transfer device based on the serial number, and generates a first control instruction based on the passing result of the inspection object in the transfer device. The first control instruction at least includes an instruction to transport the inspection object in the test direction. After receiving the first control instruction, the transfer device transports the inspection object reaching the first docking position in the direction of the test device.

[0225] In an embodiment of the present disclosure, not only can the serial number of the inspection object be obtained by scanning through the first docking position, but also the inspection object can be buffered in the test process, making it more convenient for the first device to schedule the inspection object of the transfer device to the test device, and the interaction between the transfer device and the first device is more efficient.

[0226] In one embodiment, the obtaining of the control instruction sent by the first device includes:

[0227] Scanning the inspection object reaching the second docking position of the test device in the second device to obtain the serial number of the inspection object;

[0228] Sending the serial number of the inspection object reaching the second docking position to the first device;

[0229] Receiving the second control instruction returned by the first device through the test device; the second control instruction is used to transport the inspection object reaching the second docking position to the target test position.

[0230] In an embodiment of the present disclosure, the test device includes a second docking position for scanning the inspection object to obtain the serial number.

[0231] Exemplarily, the second docking position may include: a frame, a scanner, and two parallel conveyor belts rotatably arranged on the frame. Among them, the frame is used to fixedly support the scanner and the conveyor belts, the scanner is used to scan the inspection object to obtain the serial number, and the two conveyor belts are used to transport the inspection object.

[0232] After the testing device scans to obtain the serial number of the object to be inspected through a scanner, it sends the serial number of the object to be inspected to the first device. The first device obtains the passing result of the testing device corresponding to the object to be inspected based on the serial number, and generates a second control instruction based on the passing result of the testing device. The second control instruction at least includes an instruction to transport the object to be inspected to the target test position. After receiving the second control instruction, the testing device transports the object to be inspected at the second docking position to the target test position.

[0233] In the embodiments of the present disclosure, not only can the serial number of the object to be inspected be obtained by scanning at the second docking position, but also the object to be inspected can be buffered during the testing process, making it more convenient for the first device to schedule the object to be inspected to the target test position, and the interaction between the testing device and the first device is more efficient.

[0234] In one embodiment, the method further includes:

[0235] Sending a query request to the first device through the query interface of the transfer device;

[0236] Receiving the inspection information returned by the first device based on the query request through the query interface of the transfer device;

[0237] Controlling the quantity of the objects to be inspected transported based on the inspection information.

[0238] In the embodiments of the present disclosure, the transfer device is provided with a query interface, which can effectively receive and process the inspection information returned by the first device. The query interface includes a network interface, an application program interface, or other forms of communication channels, and the embodiments of the present disclosure do not limit this.

[0239] The transfer device sends a query request to the first device. The query request may include information such as the type of the object to be inspected and the inspection time. Based on the query request, the first device returns the inspection information, and the inspection information may include the quantity of the objects to be inspected corresponding to different types of the objects to be inspected.

[0240] Among them, after obtaining the quantity corresponding to the type of the object to be inspected, the transfer device can move the corresponding quantity of the objects to be inspected from the material table to the first docking position for scanning to obtain the serial number, and then send the serial number and type of the object to be inspected to the first device for binding, and control the quantity of the objects to be inspected transported by the transfer device to the testing device based on the type and the corresponding quantity of the object to be inspected.

[0241] In the embodiments of the present disclosure, the transfer device sends a query request to the first device through the query interface and receives the inspection information returned based on the query request through the query interface, so that the transfer device can better determine the quantity of the objects to be inspected that need to be tested during the testing process, accurately transport the objects to be inspected by the transfer device, and improve the efficiency of the testing process.

[0242] In one embodiment, obtaining the control instruction sent by the first device includes:

[0243] Obtaining, through the passing interface of the transfer device, a first control instruction for the transfer device in the second device;

[0244] Obtaining, through the passing interface of the test device, a second control instruction for the test device in the second device.

[0245] In the embodiments of the present disclosure, the passing interface of the transfer device is used to receive the first control instruction sent by the first device, and the first control instruction at least includes an instruction to transport the object to be inspected to the test device.

[0246] Wherein, the transfer device sends the serial number of the object to be inspected to the first device, the first device obtains the passing result of the object to be inspected at the transfer device based on the serial number of the object to be inspected, generates a first control instruction based on the passing result of the object to be inspected in the transfer device, the transfer device obtains the first control instruction based on the passing interface, and transports the object to be inspected in the direction of the test device in response to the first control instruction.

[0247] In the embodiments of the present disclosure, the passing interface of the test device is used to receive the second control instruction sent by the first device, and the second control instruction at least includes an instruction to transport the object to be inspected to the target test position.

[0248] Wherein, the test device sends the serial number of the object to be inspected to the first device, the first device obtains the passing result of the object to be inspected at the test device based on the serial number of the object to be inspected, generates a second control instruction based on the passing result of the object to be inspected in the test device, the test device obtains the second control instruction based on the passing interface, and transports the object to be inspected to the target test position in response to the second control instruction.

[0249] In the embodiments of the present disclosure, the transfer device receives the first control instruction through the passing interface, controls the transportation of the object to be inspected to the test device, and the test device receives the second control instruction through the passing interface, controls the transportation of the object to be inspected to the target test position, realizing the cooperation of the transfer device and the test device to transport the object to be inspected to the target test position, realizing the automatic transportation of the object to be inspected and making the transportation process more intelligent.

[0250] In one embodiment, the method further includes: sending a test result to the first device through the test feedback interface of the test device in the second device, where the test result is obtained by the test device based on the object to be inspected at the target test position.

[0251] In the embodiments of the present disclosure, the test device is provided with a test feedback interface, such as Figure 5As shown, the test process includes 4 workstations (MBT, CAL, RFT1, and RFT2). The CAL workstation includes 3 test cabinets, namely GAL1 to CAL3. Each test cabinet includes 7 test drawers, namely CAL1-1 to CAL1-7, CAL2-1 to CAL2-7, and CAL3-1 to CAL3-7. Each test drawer needs to perform O / C spot checks and gold board confirmation. The test equipment can control the spot checks and send, through the test feedback interface, to the first device whether the test drawer is performing gold board confirmation operations or spot check operations.

[0252] As Figure 6 shown, 4 spot check objects can be placed in each test drawer, namely 4 O-boards, 4 C-boards, or 4 gold boards. Each test drawer can display the test status of the 4 spot check objects, namely not started, waiting for loading, in testing, testing completed, and testing failed. The test drawer sends the test status of the spot check objects to the test equipment, and the test equipment sends the test status of the spot check objects to the first device through the test feedback interface.

[0253] Exemplarily, the spot check information sent by the test equipment to the first device includes: 0 indicates the start of testing, 1 indicates the completion of testing, and -1 indicates a testing failure.

[0254] In the embodiments of the present disclosure, the test equipment sends information such as the test status and test results to the first device through the test feedback interface, enabling the first device to perform real-time performance monitoring and feedback based on the acquired information, which helps the intelligent scheduling of spot check objects in automated testing and the recording of detection results.

[0255] In one embodiment, the method further includes:

[0256] Sending, through the quantity interface of the transfer device in the second device, the quantity change value of the spot check objects in the transfer device to the first device.

[0257] In the embodiments of the present disclosure, the transfer device is provided with a quantity interface. During the process of binding the serial numbers and types of the spot check objects, the transfer device sends the quantity change value of the spot check objects in the transfer device to the first device, enabling the first device to obtain the quantities of different types of spot check objects in the transfer device, so as to notify or schedule when the spot check objects are insufficient;

[0258] During the process of transporting the spot check objects to the test equipment, the transfer device sends the quantity change value of the spot check objects in the transfer device to the first device, enabling the first device to obtain the quantity of the spot check objects that need to be assisted in testing, and to keep track of the whereabouts of the spot check objects in the test process in real time, so as to achieve better scheduling of the spot check objects for assisted testing.

[0259] Exemplarily, the change in the number of inspection objects includes: 0 indicates that all inspection objects in the transfer device are cleared, +1 indicates adding one inspection object, and -1 indicates reducing one inspection object.

[0260] In the embodiments of the present disclosure, the transfer device sends the change value of the number of inspection objects to the first device through the quantity interface. Based on the change value of the number of inspection objects, it can be determined whether the required number of inspection objects has been transported to the test device and how many have been transported to the test device, enabling the first device to obtain the number of inspection objects in real time and helping to timely adjust the transportation status of inspection objects during the test passing.

[0261] In one embodiment, the target test position is the target test drawer of the test cabinet in the test device, and the method further includes:

[0262] Sending the enabled state and disabled state of the target test drawer to the first device through the enable interface of the test device in the second device.

[0263] In the embodiments of the present disclosure, the test device is provided with an enable interface. The target test drawer is connected to the console of the test device, and the console obtains the state of the target test drawer and sends the enabled state and disabled state of the target test drawer to the first device.

[0264] It should be noted that the test device may send the enabled state and disabled state of the target test drawer based on the query status request of the first device; the test device may also actively send the enabled state and disabled state of the target test drawer to the first device when the state of the target test drawer changes. The embodiments of the present disclosure do not limit this.

[0265] In the embodiments of the present disclosure, the test device sends the enabled state and disabled state of the target test drawer to the first device through the enable interface, enabling the first device to timely understand the state of the target test drawer, providing real-time test environment management and monitoring for the test process, and helping to reasonably schedule the use of inspection objects and target test drawers.

[0266] To better understand the above one or more embodiments, the embodiments of the present disclosure give examples of the test method and the structure of the test device as follows:

[0267] As Figure 7 、 Figure 8 shown, in the test preparation stage, the first device includes an Internet of Things platform, a device management system, and a line control device. The Internet of Things platform sends a test requirement to the line control device, and the line control device sends a test requirement to the transfer device.

[0268] In the preparation stage, the transfer device has a material platform, and there are multiple inspection objects in the material platform. Each inspection object has a unique serial number.

[0269] The transfer device sends a query request to the first device through the query interface of the transfer device. The first device responds to the query request and returns the inspection information through the query interface of the first device. The inspection information includes the quantity of the inspection objects.

[0270] The transfer device transports the inspection object to the first docking position for scanning, and sends the serial number and type of the inspection object to the first device through the binding interface. The first device binds the serial number and type of the same inspection object to obtain a binding result. After receiving the serial number of the inspection object sent by the transfer device, the first device will obtain the type of the inspection object corresponding to the serial number based on the serial number and the binding result, and send it to the transfer device.

[0271] The transfer device calculates the quantity of the inspection objects based on the type of the inspection object corresponding to the received serial number, and sends the change value of the quantity of the inspection objects to the first device through the quantity interface. Among them, for each additional inspection object stored in the transfer device, the change value of the quantity of the inspection objects is incremented by 1.

[0272] In the test process, the transfer device scans the inspection object arriving at the first docking position to obtain the serial number of the inspection object. The transfer device sends the serial number of the inspection object to the first device through the passing station interface of the transfer device. The first device queries the passing station result of the inspection object corresponding to the serial number of the inspection object, and generates a first control instruction based on the passing station result of the inspection object in the transfer device. The first device returns the first control instruction to the transfer device through the passing station interface of the first device.

[0273] The transfer device responds to the first control instruction, controls the end effector to move the inspection object, and transports the inspection object in the direction of the test device.

[0274] The transfer device sends the change value of the quantity of the inspection objects to the first device through the quantity interface. For each inspection object transported in the direction of the test device, the change value of the quantity of the inspection objects is decremented by 1.

[0275] The test device scans the inspection object arriving at the second docking position to obtain the serial number of the inspection object. The test device sends the serial number of the inspection object to the first device through the passing station interface of the test device. The first device queries the passing station result of the inspection object corresponding to the serial number of the inspection object, and generates a second control instruction based on the passing station result of the inspection object in the test device. The first device returns the second control instruction to the test device through the passing station interface of the first device.

[0276] The test device responds to the second control instruction and controls to transport the inspection object to the target test position.

[0277] The target test position includes a target test drawer. The test device sends the enabled state and the disabled state of the target test drawer to the first device through the enabling interface of the test device. The first device obtains the enabled state and the disabled state of the target test drawer through the enabling interface of the first device and updates the state of the target test drawer.

[0278] The test device sends the test result to the first device through the test feedback interface of the test device. The test result is obtained based on the auxiliary test of the inspection object. The first device obtains the test result corresponding to the target test location through the test feedback interface of the first device and updates the historical test information corresponding to the target test location.

[0279] In this way, the first device can control the second device to transport the inspection object to the target test position to assist in testing, without the need to manually move the inspection object or manually control the inspection object to the target test position for testing. This can enable automated testing based on the inspection object and improve test efficiency.

[0280] It should be noted that, after the inspection object is tested, the first device may also control the second device to transport the inspection object back to the transfer device for subsequent testing or recovery of the inspection object.

[0281] like Figure 9 As shown, the first device includes a device code for communicating with the second device; the first device includes an inspection object list, the inspection object list includes the type corresponding to the inspection object serial number; the first device includes a transfer device list for communicating with the transfer device; the first device also includes a test device list for communicating with the test device.

[0282] The first device can control the test device and the transfer device to transport the inspection object, and can also control the test device to transport the inspection object to the target test drawer.

[0283] The transfer device includes a device code for communicating with the first device; the transfer device also includes a list of inspection objects in the transfer device, including the type and position corresponding to the serial number of the inspection object.

[0284] There are many different types of materials stored in the physical table of the transfer equipment, including electronic equipment, packaging boxes and inspection objects. The inspection objects are divided into test motherboards, O boards, C boards and gold boards according to their types. Each motherboard has a unique serial number.

[0285] The transfer device can put the inspection object in the storage rack of the transfer device, can query the position of the inspection object corresponding to the storage rack, and can also transport the inspection object to the first docking position.

[0286] The test device includes a device code for communicating with the first device; the test device further includes a test drawer list, and the test drawer list includes different drawer positions corresponding to different test devices.

[0287] The test device can control the inspection object to be placed in the drawer, can query the position of the inspection object through the test drawer list, can transport the inspection object, and can also obtain the test results based on the auxiliary test of the inspection object.

[0288] The test drawer includes a device code for the test device to obtain the test drawer position; the test drawer further includes a test result list, and the test result list includes the test results corresponding to the test drawer.

[0289] The test drawer is used to accommodate the inspection object for testing, can query the position of the inspection object, and can also transport the inspection object.

[0290] Among them, one test drawer has multiple slots for accommodating multiple inspection objects, each slot has a slot number, and the serial number of one inspection object can correspond to a slot number.

[0291] Figure 10 The structural block of a test device provided according to an exemplary embodiment Figure 1 . As Figure 10 shown, the test device 700 provided by the embodiment of the present disclosure is applied to the first electronic device and may include:

[0292] A serial number acquisition module 1001, configured to acquire the serial number of the inspection object for auxiliary testing;

[0293] A generation module 1002, configured to generate a control instruction for the inspection object based on the serial number;

[0294] A sending module 1003, configured to send the control instruction to a second device that has established a communication connection with the first device, so as to control the second device to transport the inspection object to the target test position.

[0295] In one embodiment, the control instruction includes a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device;

[0296] The sending module is further configured to send the first control instruction to the transfer device to control the transfer device to transport the inspection object to the test device; and send the second control instruction to the test device to control the test device to transport the received inspection object to the target test position.

[0297] In some embodiments, the generating module is further configured to determine the passing result of the object to be inspected in the transfer device and the passing result of the object to be inspected in the testing device based on the serial number; generate the first control instruction based on the passing result of the object to be inspected in the transfer device; and generate the second control instruction based on the passing result of the object to be inspected in the testing device.

[0298] In some embodiments, the testing device further includes:

[0299] A request receiving module, configured to receive a query request sent by the transfer device through the query interface of the first device;

[0300] An inspection information acquisition module, configured to acquire inspection information associated with the object to be inspected based on the query request; the inspection information is at least used to indicate the quantity of the object to be inspected;

[0301] An information sending module, configured to send the inspection information to the transfer device through the query interface of the first device.

[0302] In some embodiments, the testing device further includes:

[0303] A binding receiving module, configured to receive the serial number of the object to be inspected and the type of the object to be inspected through the binding interface of the first device; bind the serial number and type of the same object to be inspected to obtain a binding result.

[0304] In some embodiments, the sending module is further configured to send the control instruction through the passing interface of the first device.

[0305] In some embodiments, the testing device further includes:

[0306] A test result acquisition module, configured to acquire a test result returned by the testing device based on the object to be inspected;

[0307] An update module, configured to update the historical test information of the target test location based on the test result.

[0308] In some embodiments, the test result acquisition module is further configured to acquire the test result through the test feedback interface of the first device.

[0309] In some embodiments, the testing device further includes:

[0310] A change value acquisition module, configured to acquire the quantity change value of the object to be inspected in the transfer device through the quantity interface of the first device.

[0311] In some embodiments, the target test position is the target test drawer of the test cabinet in the test device, and the test device further includes:

[0312] A status acquisition module, configured to acquire the enabled status and the non-enabled status of the target test position through the enabling interface of the first device.

[0313] Figure 11 The structural block diagram of a test device provided according to an exemplary embodiment Figure 2 . As Figure 11 shown, the test device 800 provided in the embodiments of the present disclosure is applied to a second electronic device and may include:

[0314] A control instruction acquisition module 2001, configured to acquire a control instruction sent by a first device;

[0315] A transportation module 2002, configured to transport an inspection object for assisting in the test to the target test position based on the control instruction.

[0316] In some embodiments, the control instruction includes a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device;

[0317] The transportation module is further configured to transport the inspection object to the test device based on the first control instruction; and transport the inspection object received by the test device to the target test position based on the second control instruction.

[0318] In some embodiments, the control instruction acquisition module is further configured to scan the inspection object that reaches the first connection position of the transfer device in the second device to obtain the serial number of the inspection object; send the serial number of the inspection object that reaches the first connection position to the first device; receive the first control instruction returned by the first device through the transfer device; the first control instruction is used to transport the inspection object that reaches the first connection position to the test device.

[0319] In some embodiments, the control instruction acquisition module is further configured to scan the inspection object that reaches the second connection position of the test device in the second device to obtain the serial number of the inspection object; send the serial number of the inspection object that reaches the second connection position to the first device; receive the second control instruction returned by the first device through the test device; the second control instruction is used to transport the inspection object that reaches the second connection position to the target test position.

[0320] In some embodiments, the test device further includes:

[0321] A sending request module, configured to send a query request to the first device through the query interface of the relay device;

[0322] A receiving information module, configured to receive the inspection information returned by the first device based on the query request through the query interface of the relay device;

[0323] A control transportation module, configured to control the quantity of the inspected object to be transported based on the inspection information.

[0324] In some embodiments, the control instruction acquisition module is further configured to obtain a first control instruction for the relay device in the second device through the passing interface of the relay device; and obtain a second control instruction for the test device in the second device through the passing interface of the test device.

[0325] In some embodiments, the test device further includes:

[0326] A result sending module, configured to send a test result to the first device through the test feedback interface of the test device in the second device, where the test result is obtained by the test device based on the inspected object at the target test position.

[0327] In some embodiments, the test device further includes:

[0328] A change value sending module, configured to send the quantity change value of the inspected object in the relay device to the first device through the quantity interface of the relay device in the second device.

[0329] In some embodiments, the target test position is the target test drawer of the test cabinet in the test device, and the test device further includes:

[0330] A status sending module, configured to send the enabled status and the non-enabled status of the target test position to the first device through the enabling interface of the test device in the second device.

[0331] The specific manners in which each module in the test device in the above embodiments performs operations have been described in detail in the embodiments related to the method, and will not be elaborated herein.

[0332] Figure 12 is a block diagram of a test device 900 shown according to an exemplary embodiment Figure 3 . Refer to Figure 12, the apparatus 900 includes a processing component 922, which further includes one or more processors, and memory resources represented by a memory 932 for storing instructions executable by the processing component 922, such as application programs. The application programs stored in the memory 932 may include one or more modules each corresponding to a set of instructions. In addition, the processing component 922 is configured to execute instructions to perform the above-described test method.

[0333] The apparatus 900 may further include a power component 926 configured to perform power management of the apparatus 900, a wired or wireless network interface 950 configured to connect the apparatus 900 to a network, and an input / output (I / O) interface 958. The apparatus 900 may operate based on an operating system stored in the memory 932, such as Windows ServerTM, Mac OS XTM, UnixTM, LinuxTM, FreeBSDTM or the like.

[0334] A non-transitory computer-readable storage medium, when the instructions in the storage medium are executed by a processor of a first device, enables the first device to execute a test method, the method including: obtaining a serial number of an inspection object for assisting in the test; generating a control instruction for the inspection object based on the serial number; and sending the control instruction to a second device having a communication connection with the first device to control the second device to transport the inspection object to a target test location.

[0335] When the instructions in the storage medium are executed by a processor of a second device, enables the second device to execute a test method, the method including: obtaining a control instruction sent by a first device; and transporting an inspection object for assisting in the test to a target test location based on the control instruction.

[0336] Those skilled in the art will readily conceive of other embodiments of the present disclosure after considering the specification and practicing the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the present disclosure that follow the general principles of the present disclosure and include known common knowledge or conventional technical means in the technical field not disclosed herein. The specification and examples are only to be considered as exemplary, and the true scope and spirit of the present disclosure are pointed out by the following claims.

[0337] It should be understood that the present disclosure is not limited to the exact structures described above and shown in the drawings, and various modifications and changes may be made without departing from its scope. The scope of the present disclosure is only limited by the appended claims.

Claims

1. A testing method, It is characterized in that Applied to a first device, the method includes: Get the serial number of the inspection object used for auxiliary testing; Based on the serial number, generating a control instruction for the inspection object; The control instruction is sent to a second device that has established a communication connection with the first device, so as to control the second device to transport the inspection object to a target test position.

2. The test method according to claim 1, It is characterized in that The control instructions include a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device; The sending the control instruction to the second device that has established a communication connection with the control device includes: Sending the first control instruction to the transfer device to control the transfer device to transport the inspection object to the test device; The second control instruction is sent to the test device to control the test device to transport the received inspection object to the target test position.

3. The test method according to claim 2, It is characterized in that The generating, based on the serial number, a control instruction for the inspection object comprises: Based on the serial number, determining the passing result of the inspection object in the transfer device and the passing result of the inspection object in the test device; generating the first control instruction based on the passing result of the inspection object in the transfer device; The second control instruction is generated based on the passing result of the inspection object in the test equipment.

4. The test method according to claim 2, It is characterized in that The method further comprises: Receiving a query request sent by the transfer device through the query interface of the first device; Acquire inspection information associated with the inspection object based on the query request; the inspection information is used to at least point to the number of the inspection object; The inspection information is sent to the transfer device through the query interface of the first device.

5. The testing method according to claim 2, It is characterized in that The method further comprises: Receiving, through the binding interface of the first device, the serial number of the inspection object and the type of the inspection object; The serial number and the type of the same inspection object are bound to obtain a binding result.

6. The test method according to any one of claims 1 to 5, It is characterized in that The sending the control instruction to the second device that has established a communication connection with the first device includes: The control instruction is sent through the transit interface of the first device.

7. The test method according to any one of claims 1 to 5, It is characterized in that The method further comprises: Obtaining a test result returned by the test device based on the inspection object; The historical test information of the target test location is updated based on the test result.

8. The test method according to claim 7, It is characterized in that The obtaining of the test result returned by the test device based on the inspection object includes: The test result is obtained through a test feedback interface of the first device.

9. The test method according to any one of claims 1 to 5, It is characterized in that The method further comprises: The quantity change value of the inspection object in the transfer device is obtained through the quantity interface of the first device.

10. The test method according to any one of claims 1 to 5, It is characterized in that The target test position is a target test drawer of a test cabinet in the test equipment, and the method further includes: The enabled state and the disabled state of the target test drawer are obtained through an enabling interface of the first device.

11. A testing method, It is characterized in that Applied in the second device, comprising: Obtaining a control instruction sent by the first device; Based on the control instruction, the inspection object for auxiliary testing is transported to the target testing position.

12. The test method according to claim 11, It is characterized in that The control instructions include a first control instruction for a transfer device in the second device and a second control instruction for a test device in the second device; The method of transporting the inspection object for auxiliary testing to a target testing position based on the control instruction includes: Based on the first control instruction, transport the inspection object to the testing device; Based on the second control instruction, the inspection object received by the testing device is transported to the target testing position.

13. The testing method according to claim 11, It is characterized in that The obtaining of the control instruction sent by the first device includes: Scanning the inspection object that has arrived at the first docking position of the transfer device in the second device to obtain a serial number of the inspection object; Sending the serial number of the inspection object arriving at the first docking position to the first device; A first control instruction returned by the first device is received through the transfer device; the first control instruction is used to transport the inspection object arriving at the first docking position to the test device.

14. The testing method according to claim 11, It is characterized in that The obtaining of the control instruction sent by the first device includes: Scanning the inspection object that has arrived at the second docking position of the test device in the second device to obtain a serial number of the inspection object; sending the serial number of the inspection object arriving at the second docking position to the first device; A second control instruction returned by the first device is received through the test device; the second control instruction is used to transport the inspection object that has arrived at the second docking position to the target test position.

15. The test method according to any one of claims 11 to 14, It is characterized in that The method further comprises: Sending a query request to the first device through the query interface of the transfer device; Receiving, through the query interface of the transfer device, the inspection information returned by the first device based on the query request; Based on the inspection information, the quantity of the inspection object to be transported is controlled.

16. The test method according to any one of claims 11 to 14, It is characterized in that The obtaining of the control instruction sent by the first device includes: Acquire a first control instruction for a transfer device in the second device through a transit interface of the transfer device; A second control instruction for the test device in the second device is obtained through the station-crossing interface of the test device.

17. The test method according to any one of claims 11 to 14, It is characterized in that The method further comprises: The test result is sent to the first device through a test feedback interface of the test device in the second device, where the test result is obtained by the test device based on the inspection object at the target test position.

18. The test method according to any one of claims 11 to 14, It is characterized in that The method further comprises: The quantity change value of the inspection object in the transfer device is sent to the first device through the quantity interface of the transfer device in the second device.

19. The test method according to any one of claims 11 to 14, It is characterized in that The target test position is a target test drawer of a test cabinet in the test equipment, and the method further includes: The enabled state and the disabled state of the target test drawer are sent to the first device through an enabling interface of the test device in the second device.

20. A testing device, It is characterized in that Applied to a first device, the apparatus comprises: A serial number acquisition module is configured to acquire a serial number of an inspection object for auxiliary testing; A generating module, configured to generate a control instruction for the inspection object based on the serial number; The control module is configured to send the control instruction to a second device that has established a communication connection with the first device, so as to control the second device to transport the inspection object to a target test position.

21. A testing device, It is characterized in that Applied to a second device, the apparatus comprises: A control instruction acquisition module, configured to acquire a control instruction sent by the first device; The transport module is configured to transport the inspection object for auxiliary testing to a target testing position based on the control instruction.

22. A testing device, It is characterized in that include: processor; a memory for storing processor-executable instructions; The processor is configured to execute the test method according to any one of claims 1 to 10; or, is configured to execute the test method according to any one of claims 11 to 19.

23. A non-transitory computer-readable storage medium, It is characterized in that When the instructions in the storage medium are executed by a processor of a first device, the first device is enabled to execute the test method as described in any one of claims 1 to 10; or, when the instructions in the storage medium are executed by a processor of a second device, the second device is enabled to execute the test method as described in any one of claims 11 to 19.

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