Laser etching label production data management method based on Internet of Things

Through the Internet of Things technology combined with adaptive European distance and texture feature analysis, abnormal data points of laser etching labels are identified and eliminated, which solves the problem of low laser etching detection accuracy and realizes efficient quality control and intelligent management.

CN120047436AActive Publication Date: 2025-05-27GUANGZHOU BOREN NEW MATERIALS CO LTD
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Patent Information

Application Number
CN202510510034.3
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-04-23
Publication Date
2025-05-27
Estimated Expiration
2045-04-23

AI Technical Summary

Technical Problem

The existing laser etching technology has problems of low efficiency and low accuracy in detection accuracy, making it difficult to achieve efficient and high-precision quality control.

Method used

Using an Internet of Things method, multi-dimensional production data and images of laser etching labels are collected, cluster analysis is performed using adaptive Euro-style distance and DBSCAN algorithm, texture features are extracted in combination with grayscale symbiosis matrix, and abnormal data points are identified and eliminated.

Benefits of technology

It improves the accuracy and robustness of abnormal detection in the production process of laser etching labels, reduces the inflow of defective labels, improves product quality and production efficiency, and realizes intelligent quality control.

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Abstract

The invention relates to the technical field of electric digital data processing, in particular to a laser etching label production data management method based on the Internet of Things, which comprises the following steps: acquiring multi-dimensional production data and images of each laser etching label, and taking the multi-dimensional production data of any laser etching label as a data point; clustering the data points based on the adaptive Euclidean distance between the data points to obtain a plurality of clusters, and calculating an average Euclidean distance between each data point and other data points in the clusters, the data points whose ratio of the average Euclidean distance to the minimum value of the average Euclidean distance between each data point in the cluster and other data points is greater than a set threshold value are abnormal data points. According to the invention, the problem of low detection precision in the aspect of laser etching detection precision is solved.
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Description

Technical Field

[0001] The present invention relates to the technical field of electronic digital data processing. More specifically, the present invention relates to a method for managing laser etching label production data based on the Internet of Things. Background Art

[0002] Laser etching technology is a precision machining technology widely used in industries such as electronic manufacturing, automotive industry, medical devices, and packaging printing. By using a high-energy laser beam to mark, engrave, or remove on the material surface, permanent identification or patterns can be formed. Compared with traditional marking methods such as mechanical engraving and inkjet printing, laser etching has significant advantages such as non-contact processing, high precision, high contrast, wear resistance, and wide application range, and can achieve high-quality identification on various materials such as metals, plastics, glasses, and ceramics. However, in the actual production process, the laser etching process is affected by various factors such as processing parameters, equipment status, and environmental factors, and problems such as uneven etching depth, edge burrs, blurred characters, and positioning deviation are likely to occur, resulting in a decline in product quality. Therefore, how to intelligently manage the data in the laser etching label production process to improve production quality, optimize process parameters, and reduce the defect rate is the focus of current industry attention.

[0003] In recent years, the rapid development of the Internet of Things technology has provided new solutions for intelligent manufacturing. The Internet of Things combines sensors, intelligent terminals, network communication, and data analysis to achieve real-time monitoring and remote control of key data such as production equipment, process parameters, and environmental status. In laser etching label production, the Internet of Things can integrate industrial cameras, photoelectric sensors, temperature and humidity sensors, laser power detection modules, etc. to achieve comprehensive data collection and analysis of the production process, thereby improving the intelligent management level.

[0004] Traditional laser etching quality inspection mainly relies on manual visual inspection or offline inspection equipment, but these methods have many limitations. Manual inspection has low efficiency and is affected by subjective factors, making it difficult to ensure the consistency of inspection results and refined quality control; offline inspection has latency and cannot detect and correct defects in real time during the etching process, resulting in the accumulation of defects in the production process and affecting the quality of the final product. Therefore, traditional inspection methods are difficult to balance high efficiency and high precision, resulting in problems with low detection accuracy. Summary of the Invention

[0005] To solve the problem of low detection accuracy in the above-mentioned background art, the present invention provides the following solutions.

[0006] The present invention provides a method for managing production data of laser-etched labels based on the Internet of Things, including: collecting multi-dimensional production data and images of each laser-etched label at different times, and taking the multi-dimensional production data of any laser-etched label as a data point; clustering the data points based on the adaptive Euclidean distance between the data points to obtain multiple clustering clusters, obtaining the average Euclidean distance between each data point in the clustering cluster and other data points, and in response to the ratio of the average Euclidean distance to the minimum value of the average Euclidean distance between each data point in the clustering cluster and other data points being greater than a set threshold, the data point is an abnormal data point; wherein, the adaptive Euclidean distance is , is the texture Euclidean distance between the images corresponding to the th data point and the th data point, is the Euclidean distance between the th data point and the th data point, is the average value of the texture Euclidean distances between the images corresponding to all pairs of data points among all data points; the texture Euclidean distance is: , is the importance degree of the th texture, is the number of texture types, is the sum of the importance degrees of all textures, is the frequency of the th texture appearing in the image corresponding to the th data point, is the frequency of the th texture appearing in the image corresponding to the th data point, and the importance degree characterizes the regularity degree of the texture.

[0007] Through the above technical solution, by collecting multi-dimensional production data and images of laser-etched labels and performing clustering analysis based on the adaptive Euclidean distance, and by analyzing the average distance of data points within the clustering cluster, data points with a large deviation degree are screened out as abnormal data points, avoiding misjudgment that may be caused by simply relying on the traditional Euclidean distance, thereby improving the accuracy and robustness of anomaly detection.

[0008] Furthermore, the importance degree is , where is the th frequency value of the th texture in the th clustering cluster, , , are respectively the th texture in the The frequency value of the cluster center of the The frequency value of the cluster center of the th cluster, is the total number of clusters, is the total number of frequency values in the th cluster.

[0009] The above technical solution quantifies the importance of textures by calculating the frequency distribution characteristics of various textures in different clusters and combining the frequency changes of the cluster centers, thereby enhancing the discrimination ability of the texture Euclidean distance, being able to adaptively evaluate the regularity of textures, making the contribution of different textures to the overall difference more reasonable when calculating the adaptive Euclidean distance between data points, and effectively avoiding the interference caused by some texture features with large local changes to anomaly detection.

[0010] Further, the multi-dimensional production data includes: laser etching speed, laser etching intensity, and etching surface temperature.

[0011] Further, a CCD camera or a CMOS camera is used to collect images of each laser etching label.

[0012] Further, the DBSCAN clustering algorithm is used for clustering.

[0013] The above technical solution improves the clustering ability for data with complex distributions by introducing a density-based clustering method to adaptively identify data clusters with different density distributions. Combining the importance analysis of texture features and the calculation of adaptive Euclidean distance enables the clustering results to more accurately reflect the true associations between data points and effectively distinguish normal data points from abnormal data points.

[0014] Further, the set threshold is 1.6.

[0015] Further, the texture is specifically: Obtain the gray-level co-occurrence matrix of the image, and calculate texture features including at least contrast, correlation, energy, and entropy based on the gray-level co-occurrence matrix to characterize the texture of the image.

[0016] The above technical solution extracts the deep texture features of the image by constructing a gray-level co-occurrence matrix, including contrast, correlation, energy, and entropy, and characterizes the texture information of the image from multiple dimensions, making the calculation of the texture Euclidean distance more accurate. Contrast can measure the clarity of the texture, correlation reflects the regularity of the texture structure, energy reflects the uniformity of the texture, and entropy is used to describe the complexity of the texture. The combination of these features enables the differences between data points to be more comprehensively characterized.

[0017] Further, it also includes standardizing the multi-dimensional production data.

[0018] Further, it also includes grayscaling the image.

[0019] Further, when an abnormal data point is detected, the laser etching label corresponding to the abnormal data point is removed.

[0020] By identifying and removing the laser etching labels corresponding to the abnormal data points, the above technical solution can effectively prevent defective labels from flowing into the subsequent processes, improving the consistency and reliability of product quality. By automatically removing abnormal labels, the workload of manual inspection is reduced, production efficiency is increased, and at the same time, quality problems caused by abnormal labels are avoided, reducing the rework and scrap rates. The intelligent level of quality control is strengthened, making the laser etching process more accurate and stable, and optimizing the reliability and traceability of the entire production process.

[0021] The beneficial effects of the present invention are as follows: The present invention combines multi-dimensional production data and image data, and uses adaptive Euclidean distance and texture feature analysis to accurately detect and manage abnormal data points in the production process of laser etching labels. Through the comprehensive evaluation of clustering analysis and texture features, abnormal situations that may occur in the production process can be effectively identified, improving the accuracy and reliability of production data. Extracting texture features using the gray-level co-occurrence matrix of the image helps to accurately distinguish the subtle differences between different data points, further enhancing the ability to identify abnormal data points. When an abnormal data point is detected, the corresponding laser etching label is removed in a timely manner, which can prevent defective products from flowing in, improving product quality and production efficiency. The entire process improves the intelligent level of laser etching label production through automated data management and processing, reduces the need for manual intervention, and promotes the optimization and intelligent management of the production process. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a flowchart schematically showing a method for managing production data of laser etching labels based on the Internet of Things according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] An embodiment of a method for managing production data of laser etching labels based on the Internet of Things.

[0024] As Figure 1 shown, a flowchart of a method for managing production data of laser etching labels based on the Internet of Things according to an embodiment of the present invention includes the following steps: S1: Collect multi-dimensional production data and their images of each laser-etched label at different times, and use the multi-dimensional production data of any laser-etched label as a data point.

[0025] In one embodiment, the multi-dimensional production data includes: laser etching speed, laser etching intensity, and etching surface temperature. These key parameters directly determine the etching effect, edge clarity, and uniformity of material removal. Since in the laser etching process, fluctuations may exist in the external environment, equipment status, and material properties, resulting in different etching effects under the same process parameters, it is crucial to standardize the collected multi-dimensional production data.

[0026] Exemplarily, Z-score standardization can be used for the multi-dimensional production data; through standardization, the deviation caused by different data scales or unit differences can be eliminated, the comparability of data in different batches can be improved, and subsequent analysis and optimization can be made more accurate.

[0027] In addition, in order to further improve the etching quality monitoring and product consistency, a high-precision CCD camera or CMOS camera is used to collect images of each laser-etched label, and advanced image processing algorithms are used to grayscale the collected images. Grayscaling can not only reduce the complexity of image information but also enhance the contrast of the etched area, making the etching profile and micro-defects clearer, facilitating subsequent quality inspection, edge recognition, and depth analysis. Combining the image information and the multi-dimensional production data after standardization, an efficient quality assessment can be established to achieve precise control of the laser etching process, reduce etching defects, improve the overall production efficiency, and provide solid data support for intelligent detection and process optimization, thereby improving the product qualification rate and consistency and meeting the strict requirements of high-precision manufacturing.

[0028] S2: Cluster the data points based on the adaptive Euclidean distance between the data points to obtain multiple clusters.

[0029] In one embodiment, the DBSCAN algorithm is used for clustering. The adaptive Euclidean distance between the th data point and the th data point is , where is the texture Euclidean distance between the images corresponding to the th data point and the th data point, is the Euclidean distance between the th data point and the th data point, and is the average value of the texture Euclidean distances between the images corresponding to all pairs of data points among all data points; By combining the adaptive Euclidean distance with the density clustering method, the similarity calculation between data points becomes more reasonable, improving the accuracy and robustness of clustering. The adaptive Euclidean distance takes into account both the texture features of the image and the differences in multi-dimensional production data. It measures the similarity of image details through the texture Euclidean distance and combines the traditional Euclidean distance to calculate the overall relationship between data points, making the distance metric more in line with the actual situation. Normalization adjustment is performed using the average value of the global texture differences, avoiding the unbalanced influence between data of different scales and making the clustering more stable. Combining with the density clustering method, without presetting the number of clusters, it can effectively identify clustering structures with complex shapes and improve the detection ability of abnormal data points.

[0030] The texture Euclidean distance is: , is the importance degree of the th texture, is the number of texture types, is the sum of the importance degrees of all textures, is the frequency of the th texture in the image corresponding to the th data point, is the frequency of the th texture in the image corresponding to the th data point; The texture, specifically: Obtain the gray-level co-occurrence matrix of the image, and calculate texture features including at least contrast, correlation, energy, and entropy based on the gray-level co-occurrence matrix to characterize the texture of the image.

[0031] By constructing the gray-level co-occurrence matrix to extract the key texture features of the image and using the texture Euclidean distance to measure the texture similarity between data points, the quantization of image features becomes more comprehensive and accurate. By calculating texture features in multiple dimensions such as contrast, correlation, energy, and entropy, the structure, complexity, and uniformity of the image can be fully characterized, making the texture analysis more representative. Combining with the weighted calculation of the importance degree of the texture, the contributions of different textures to the distance metric are reasonably allocated, thus reducing the interference of local texture fluctuations on the overall analysis. Further, by calculating the weighted texture differences between data points, different categories of images can be more accurately distinguished during the clustering process, improving the recognition ability of abnormal data points.

[0032] The importance degree is , where is the th frequency value of the th texture in the th clustering cluster, , , are the frequency values of the cluster centers of the th texture in the th, th, and th cluster clusters, is the total number of cluster clusters, is the th total number of frequency values in the cluster cluster, is a preset hyperparameter, and the cluster clusters are obtained by obtaining the frequencies of various textures appearing in different images and clustering the frequencies.

[0033] By calculating the frequency distribution of texture features in different cluster clusters and combining the change amount of the cluster center, the importance degree of the texture is quantified, so that the contribution of the texture features in similarity calculation is more accurate. By analyzing the frequency fluctuation conditions within different cluster clusters, the importance of the texture can be dynamically adjusted, so that a larger weight is given to textures with higher regularity, while the influence of textures with larger fluctuations is reduced, thereby improving the stability and discrimination ability of the texture Euclidean distance. Using the exponential function to normalize the frequency deviation can effectively reduce the interference of outliers or local extreme values on the calculation results, making the role of texture features in cluster analysis and anomaly detection more reasonable.

[0034] In another embodiment, the importance degree is , where is the th frequency value of the th texture in the th cluster cluster, is the frequency value of the cluster center of the th texture in the th cluster cluster, is the total number of cluster clusters, is the th total number of frequency values in the cluster cluster, is a preset hyperparameter, is the th standard deviation of the frequency values of the th texture in the

[0035] By calculating the frequency distribution of texture features in different clustering clusters and introducing the standard deviation as a factor to measure the volatility of the texture, the calculation of the importance degree of the texture is made more refined. Using the standard deviation of the frequency values to adjust the weight of the texture can effectively distinguish stable textures from textures with large variations, so that when calculating the similarity between data points, the contribution of stable textures is greater, while the influence of textures with strong volatility is appropriately weakened, thereby improving the reliability of the texture Euclidean distance. The application of the exponential function further enhances the robustness to local outliers, making the calculation result smoother and avoiding the interference of a single extreme value on the overall clustering analysis.

[0036] S3: Calculate the ratio of the average Euclidean distance of the data points within the clustering cluster to the minimum average Euclidean distance within the clustering cluster to identify abnormal data points.

[0037] In one embodiment, calculate the average Euclidean distance between each data point in the clustering cluster and other data points, and the data point whose ratio of the average Euclidean distance to the minimum value of the average Euclidean distance between each data point in the clustering cluster and other data points is greater than the set threshold is an abnormal data point; The set threshold can be 1.6, and of course it can also be set according to the actual situation.

[0038] When an abnormal data point is detected, the laser etching label corresponding to the abnormal data point is removed.

[0039] The solution of the present invention realizes data management and anomaly detection in the production process of laser etching labels by collecting multi-dimensional production data and images of laser etching labels, and combining the adaptive Euclidean distance and clustering analysis methods. By accurately calculating the texture features of the images and using clustering techniques to identify the relationships between data points, abnormal data points can be effectively identified and removed, improving the quality control level of production data. In addition, the application of standardization processing and grayscale processing helps to enhance the consistency and stability of the data, thereby improving the accuracy and reliability of the entire production process. Through this method, abnormal situations in the production process can be detected and processed in a timely manner, thereby reducing the occurrence of unqualified labels and ensuring the high quality and production efficiency of laser etching labels.

[0040] In the description of this specification, the meanings of "a plurality of" and "several" are at least two, such as two, three or more, etc., unless otherwise clearly and specifically defined.

[0041] Although this specification has shown and described several embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Many variations, modifications, and alternative forms will occur to those skilled in the art without departing from the spirit and scope of the present invention. It should be understood that various alternatives to the embodiments of the invention described herein may be employed in practicing the invention.

Claims

1. A laser etching label production data management method based on the Internet of Things, characterized in that: include: Collect multi-dimensional production data and images of each laser-etched label at different times, and take the multi-dimensional production data of any laser-etched label as a data point; Clustering the data points based on the adaptive Euclidean distance between the data points to obtain a plurality of clusters, obtaining the average Euclidean distance between each data point in the cluster and other data points, and in response to a data point whose ratio of the average Euclidean distance to the minimum value of the average Euclidean distance between each data point in the cluster and other data points is greater than a set threshold, as an abnormal data point; Among them, adaptive Euclidean distance for, , For the Data points and The texture Euclidean distance between the images corresponding to the data points is For the Data points and The Euclidean distance between data points is is the average value of the texture Euclidean distance between the corresponding images of all data points; The texture Euclidean distance is: , For the The importance of the texture, is the number of texture types, is the sum of the importance of all textures, For the The data point corresponds to the The frequency of the texture. For the The data point corresponds to the The frequency of occurrence of a texture, and the importance degree represents the regularity of the texture.

2. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: The importance is: , where For the Texture The first frequency values, , , Respectively Texture , , The frequency value of the cluster center of the clusters, is the total number of clusters, For the The total number of frequency values ​​in the clusters, To preset the hyperparameters, the clusters are obtained by obtaining the frequencies of occurrence of various textures in different images and clustering the frequencies.

3. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: The multi-dimensional production data includes: laser etching speed, laser etching intensity and etching surface temperature.

4. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: This facilitates the CCD camera or CMOS camera to capture images of each laser-etched label.

5. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: Clustering is performed using the DBSCAN algorithm.

6. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: The set threshold is 1.

6.

7. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: The texture is specifically: A gray level co-occurrence matrix of the image is obtained, and texture features including at least contrast, correlation, energy and entropy are calculated based on the gray level co-occurrence matrix to characterize the texture of the image.

8. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: It also includes standardizing the multi-dimensional production data.

9. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: The method also includes gray-scaling the image.

10. The method for managing laser-etched label production data based on the Internet of Things according to claim 1, characterized in that: When an abnormal data point is detected, the laser etched label corresponding to the abnormal data point is removed.

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