High-temperature probe of eddy current testing equipment

Abstract

The invention relates to the technical field of nondestructive testing, in particular to a high-temperature probe of eddy current testing equipment, which comprises a mounting disc, a linkage mechanism, an adjusting mechanism and a cooling mechanism, the top of the mounting disc is rotationally connected with a mounting grip, and a probe main body is arranged in the mounting disc; the linkage mechanism is arranged on the mounting disc and used for controlling the inclination angle of the mounting disc, one end of the linkage mechanism is connected with the mounting disc, and the other end of the linkage mechanism is connected with the mounting grip; the adjusting mechanism is arranged on the mounting grip and used for adjusting and limiting the position of the linkage mechanism, and one end of the adjusting mechanism is connected with the mounting grip; and the cooling mechanism is arranged in the mounting disc and is used for cooling the probe main body. Through cooperative arrangement of the linkage mechanism and the adjusting mechanism, the included angle between the mounting disc and the mounting grip is adjusted to be proper, effective contact between the probe body and a to-be-detected object is facilitated, the detection accuracy is ensured, and diversified use requirements in actual production are conveniently met.

Description

Technical Field

[0001] The present invention relates to the technical field of non-destructive testing, and particularly to a high-temperature probe for eddy current testing equipment. Background Art

[0002] In industrial production, there are a large number of major equipment that use welding for joint connection. Welds are a crucial part of the manufacturing process, and the quality of welds during processing or service directly affects the service life, performance, and safety of the equipment. Especially in some key fields, such as aerospace, railway, nuclear industry, power, petroleum, chemical industry, etc., there are strict standard requirements for welding quality, and accurate and reliable detection of welds is required at different stages.

[0003] Chinese Patent with Publication No. CN111879848A discloses a high-temperature eddy current testing probe, which includes a detection module and a cooling module. The cooling module includes a water cooling system and an air cooling system. The water cooling system includes an inlet conduit and a drain conduit for transporting cooling water, a cooling water tank, and a cooling water circulator for cooling and recycling the cooling water. And a heat-insulating water layer can be formed by the cooling water in the cooling water tank to isolate the inside of the probe from the high-temperature environment outside. The air cooling system includes an air compressor for generating high-speed air flow, an inlet conduit and an exhaust conduit for transporting the high-speed air flow, and a cavity where the detection module is located. The air compressor compresses the air and outputs it at high speed to transport high-speed air flow into the cavity where the detection module is located to discharge heat, so as to meet the detection requirements in a higher temperature environment. The present invention adopts a unique cooling method of liquid heat insulation and heat dissipation combined with air cooling heat dissipation, which not only simplifies the structure of the detection probe, but also has a significantly better cooling effect than conventional high-temperature eddy current testing probes.

[0004] However, the above technical solution has the following deficiencies: In actual use, it is very difficult for the detection probe to contact the side wall in a narrow space, which seriously affects the accuracy of detection, has great limitations in use, and cannot meet the diverse use requirements in actual production. Summary of the Invention

[0005] The object of the present invention is to propose a high-temperature probe for eddy current testing equipment in view of the problems existing in the background art.

[0006] The technical solution of the present invention: A high-temperature probe for eddy current testing equipment, comprising:

[0007] A mounting plate, on the top of which a mounting handle is rotatably connected, and a probe body is arranged inside the mounting plate;

[0008] A linkage mechanism, which is arranged on the mounting plate for controlling the tilt angle of the mounting plate. One end of the linkage mechanism is connected to the mounting plate, and the other end of the linkage mechanism is connected to the mounting handle;

[0009] An adjustment mechanism is provided on the installation grip for adjusting and limiting the position of the linkage mechanism. One end of the adjustment mechanism is connected to the installation grip, and the other end is connected to the linkage mechanism.

[0010] A cooling mechanism is provided inside the mounting plate to dissipate heat from the probe body. One end of the cooling mechanism extends to the outside of the mounting plate.

[0011] Preferably, the linkage mechanism includes a linkage rod, a linkage bracket, and a sliding assembly; the linkage rod is slidably connected to the installation grip, one end of the linkage bracket is rotatably connected to the linkage rod, the other end of the linkage bracket is connected to the sliding assembly, and the sliding assembly is arranged on the mounting plate.

[0012] Preferably, the sliding assembly includes a slider and a slide rail; the slide rail is fixedly connected to the mounting plate, the slider is slidably connected to the slide rail, and the linkage bracket is rotatably connected to the slider.

[0013] Preferably, there are also two guiding blocks. One end of each guiding block is fixedly connected to the linkage rod, and guiding grooves are formed on the surface of the installation grip. The other end of the guiding block is slidably connected to the guiding groove.

[0014] Preferably, the adjustment mechanism includes a movable box, a movable plate, a limiting block, and an adjustment component; the movable box is slidably connected to the installation grip, the movable box is fixedly connected to the linkage rod, the movable plate is slidably arranged inside the movable box, the limiting block is fixedly connected to the movable plate, limiting tooth grooves adapted to the movable plate are formed on the surface of the installation grip, and the adjustment component is slidably arranged on the installation grip. One end of the adjustment component is connected to the movable plate.

[0015] Preferably, a return spring is further included. The return spring is arranged inside the movable box. One end of the return spring is fixedly connected to the movable plate, and the other end is fixedly connected to the inner wall of the movable box.

[0016] Preferably, the adjustment component includes an adjustment plate and connecting blocks; the adjustment plate is slidably connected to the installation grip, there are two connecting blocks, one end of each connecting block is fixedly connected to the adjustment plate, and the other end is fixedly connected to the movable plate.

[0017] Preferably, a movable hole is formed through the surface of the movable box, and the connecting block passes through the movable hole and extends into the movable box.

[0018] Preferably, the cooling mechanism includes a heat exchange coil, a liquid inlet pipe, and a liquid outlet pipe; the heat exchange coil is arranged inside the mounting plate, the heat exchange coil surrounds the surface of the probe body, the water outlet of the liquid inlet pipe extends into the mounting plate and is communicated with the heat exchange coil, and the water inlet of the liquid outlet pipe extends into the mounting plate and is communicated with the heat exchange coil.

[0019] Compared with the prior art, the above technical solutions of the present invention have the following beneficial technical effects:

[0020] With the coordinated setting between the linkage mechanism and the adjustment mechanism of the present invention, when it is necessary to detect the side wall in a narrow space, first drive the linkage mechanism to move through the adjustment mechanism, and then adjust the angle between the mounting plate and the mounting grip to an appropriate size, which is convenient for the probe body to effectively contact the object to be detected, ensuring the accuracy of the detection and facilitating the satisfaction of diverse usage requirements in actual production. Through the setting of the cooling mechanism, heat dissipation and temperature reduction are carried out on the mounting plate and the probe body to meet the detection requirements in a higher temperature environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 is a perspective view of an embodiment proposed by the present invention;

[0022] Figure 2 is a schematic structural view of the linkage mechanism in an embodiment proposed by the present invention;

[0023] Figure 3 is a cross-sectional view of the adjustment mechanism in an embodiment proposed by the present invention;

[0024] Figure 4 is a cross-sectional view of the mounting plate in an embodiment proposed by the present invention;

[0025] Figure 5 is a schematic structural view of the cooling mechanism in an embodiment proposed by the present invention.

[0026] Reference numerals: 1, mounting plate; 2, mounting grip; 31, linkage rod; 32, linkage frame; 331, slider; 332, slide rail; 34, guide block; 35, guide groove; 41, movable box; 42, movable plate; 43, limit block; 441, adjustment plate; 442, connecting block; 45, limit tooth groove; 46, return spring; 47, movable hole; 51, heat exchange coil; 52, liquid inlet pipe; 53, liquid outlet pipe; 6, probe body. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0027] Embodiment 1, as Figures 1-5 shown, a high-temperature probe of an eddy current detection device proposed by the present invention includes a mounting plate 1, a linkage mechanism, an adjustment mechanism, and a cooling mechanism;

[0028] A mounting grip 2 is rotatably connected to the top of the mounting plate 1, and a probe body 6 is arranged inside the mounting plate 1;

[0029] The linkage mechanism is arranged on the mounting plate 1 for controlling the tilt angle of the mounting plate 1. One end of the linkage mechanism is connected to the mounting plate 1, and the other end of the linkage mechanism is connected to the mounting grip 2;

[0030] The adjustment mechanism is arranged on the installation grip 2 and is used to adjust and limit the position of the linkage mechanism. One end of the adjustment mechanism is connected to the installation grip 2, and the other end of the adjustment mechanism is connected to the linkage mechanism;

[0031] The cooling mechanism is arranged in the installation disk 1 to dissipate heat for the probe body 6, and one end of the cooling mechanism extends to the outside of the installation disk 1.

[0032] Embodiment 2, as Figures 1-2 shown, a high-temperature probe of an eddy current detection device proposed by the present invention. Compared with Embodiment 1, the structure of the linkage mechanism is specifically disclosed in this embodiment; the linkage mechanism includes a linkage rod 31, a linkage frame 32 and a sliding component; the linkage rod 31 is slidably connected to the installation grip 2, one end of the linkage frame 32 is rotatably connected to the linkage rod 31, the other end of the linkage frame 32 is connected to the sliding component, the sliding component is arranged on the installation disk 1, and the sliding component includes a slider 331 and a slide rail 332; the slide rail 332 is fixedly connected to the installation disk 1, the slider 331 is slidably connected to the slide rail 332, the linkage frame 32 is rotatably connected to the slider 331, and further includes two guide blocks 34. One end of the guide block 34 is fixedly connected to the linkage rod 31, and a guide groove 35 is formed on the surface of the installation grip 2. The other end of the guide block 34 is slidably connected to the guide groove 35.

[0033] Embodiment 3, as Figures 1-3 shown, a high-temperature probe of an eddy current detection device proposed by the present invention. Compared with Embodiment 2, the structure of the adjustment mechanism is specifically disclosed in this embodiment; the adjustment mechanism includes a movable box 41, a movable plate 42, a limit block 43 and an adjustment component; the movable box 41 is slidably connected to the installation grip 2, the movable box 41 is fixedly connected to the linkage rod 31, the movable plate 42 is slidably arranged in the movable box 41, the limit block 43 is fixedly connected to the movable plate 42, and a limit tooth groove 45 adapted to the movable plate 42 is formed on the surface of the installation grip 2. The adjustment component is slidably arranged on the installation grip 2, one end of the adjustment component is connected to the movable plate 42, and further includes a return spring 46. The return spring 46 is arranged in the movable box 41, one end of the return spring 46 is fixedly connected to the movable plate 42, and the other end of the return spring 46 is fixedly connected to the inner wall of the movable box 41. The adjustment component includes an adjustment plate 441 and a connection block 442; the adjustment plate 441 is slidably connected to the installation grip 2, there are two connection blocks 442, one end of the connection block 442 is fixedly connected to the adjustment plate 441, the other end of the connection block 442 is fixedly connected to the movable plate 42, a movable hole 47 is formed through the surface of the movable box 41, and the connection block 442 passes through the movable hole 47 and extends into the movable box 41 through the movable box 41.

[0034] Embodiment 4, as Figures 4-5As shown in the figure, a high-temperature probe of an eddy current detection device proposed by the present invention specifically discloses the structure of the cooling mechanism compared with Embodiment 3; the cooling mechanism includes a heat exchange coil 51, a liquid inlet pipe 52 and a liquid outlet pipe 53; the heat exchange coil 51 is arranged in the mounting plate 1, the heat exchange coil 51 surrounds the surface of the probe body 6, the water outlet of the liquid inlet pipe 52 extends into the mounting plate 1 and is communicated with the heat exchange coil 51, and the water inlet of the liquid outlet pipe 53 extends into the mounting plate 1 and is communicated with the heat exchange coil 51.

[0035] When it is necessary to adjust the angle between the mounting plate 1 and the mounting grip 2, press the adjusting plate 441 to drive the movable plate 42 through the connecting block 442. The movement of the movable plate 42 compresses the return spring 46 and at the same time drives the limiting block 43 to disengage from the limiting tooth groove 45. The sliding linkage rod 31 drives the mounting plate 1 to rotate around the connection between the mounting plate 1 and the mounting grip 2 through the linkage frame 32, so as to realize the adjustment of the included angle between the mounting plate 1 and the mounting grip 2. After the adjustment, release the adjusting plate 441, and the limiting block 43 is inserted into the limiting tooth groove 45 under the action of the return spring 46 to limit and fix the movable box 41, thereby realizing the fixation of the included angle between the mounting plate 1 and the mounting grip 2. During the use process, the coolant enters the heat exchange coil 51 through the liquid inlet pipe 52 and exchanges heat with the inside of the mounting plate 1 to dissipate heat and cool down the mounting plate 1 and the probe body 6. The heated coolant is discharged from the heat exchange coil 51 through the liquid outlet pipe 53.

[0036] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited thereto. Various changes can be made without departing from the spirit of the present invention within the knowledge scope of those skilled in the art.

Claims

1. A high temperature probe for eddy current testing equipment, characterized in that: include: A mounting plate (1), the top of which is rotatably connected to a mounting handle (2), and a probe body (6) is disposed inside the mounting plate (1); A linkage mechanism, which is arranged on the mounting plate (1) and is used to control the tilt angle of the mounting plate (1), one end of the linkage mechanism being connected to the mounting plate (1), and the other end of the linkage mechanism being connected to the mounting handle (2); An adjustment mechanism, which is arranged on the mounting handle (2) and is used to adjust and limit the position of the linkage mechanism, one end of the adjustment mechanism is connected to the mounting handle (2), and the other end of the adjustment mechanism is connected to the linkage mechanism; A cooling mechanism is arranged inside the mounting plate (1) to dissipate heat and cool the probe body (6), and one end of the cooling mechanism extends to the outside of the mounting plate (1).

2. A high temperature probe of eddy current testing equipment according to claim 1, characterized in that: The linkage mechanism comprises a linkage rod (31), a linkage frame (32) and a sliding assembly; the linkage rod (31) is slidably connected to the mounting handle (2), one end of the linkage frame (32) is rotationally connected to the linkage rod (31), and the other end of the linkage frame (32) is connected to the sliding assembly, and the sliding assembly is arranged on the mounting plate (1).

3. A high temperature probe of eddy current testing equipment according to claim 2, characterized in that: The sliding assembly comprises a slider (331) and a slide rail (332); the slide rail (332) is fixedly connected to the mounting plate (1), the slider (331) is slidably connected to the slide rail (332), and the linkage frame (32) is rotatably connected to the slider (331).

4. A high temperature probe of eddy current testing equipment according to claim 2, characterized in that: It also includes two guide blocks (34), one end of which is fixedly connected to the linkage rod (31), a guide groove (35) is provided on the surface of the mounting handle (2), and the other end of the guide block (34) is slidably connected to the guide groove (35).

5. The high temperature probe of eddy current testing equipment according to claim 2, characterized in that: The adjustment mechanism comprises a movable box (41), a movable plate (42), a limit block (43) and an adjustment component; the movable box (41) is slidably connected to the mounting handle (2), the movable box (41) is fixedly connected to the linkage rod (31), the movable plate (42) is slidably arranged in the movable box (41), the limit block (43) is fixedly connected to the movable plate (42), a limit tooth groove (45) adapted to the movable plate (42) is provided on the surface of the mounting handle (2), the adjustment component is slidably arranged on the mounting handle (2), and one end of the adjustment component is connected to the movable plate (42).

6. A high temperature probe of eddy current testing equipment according to claim 5, characterized in that: It also includes a return spring (46), which is arranged in the movable box (41), one end of the return spring (46) is fixedly connected to the movable plate (42), and the other end of the return spring (46) is fixedly connected to the inner wall of the movable box (41).

7. A high temperature probe of eddy current testing equipment according to claim 5, characterized in that: The adjustment assembly comprises an adjustment plate (441) and a connection block (442); the adjustment plate (441) is slidably connected to the mounting handle (2); two connection blocks (442) are provided, one end of the connection block (442) is fixedly connected to the adjustment plate (441), and the other end of the connection block (442) is fixedly connected to the movable plate (42).

8. A high temperature probe of eddy current testing equipment according to claim 7, characterized in that: A movable hole (47) is formed through the surface of the movable box (41), and the connecting block (442) passes through the movable box (41) through the movable hole (47) and extends into the movable box (41).

9. The high temperature probe of eddy current testing equipment according to claim 1, characterized in that: The cooling mechanism comprises a heat exchange coil (51), a liquid inlet pipe (52) and a liquid outlet pipe (53); the heat exchange coil (51) is arranged in the mounting plate (1), the heat exchange coil (51) surrounds the surface of the probe body (6), the water outlet of the liquid inlet pipe (52) extends into the mounting plate (1) and is connected to the heat exchange coil (51), and the water inlet of the liquid outlet pipe (53) extends into the mounting plate (1) and is connected to the heat exchange coil (51).

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