Processing quality control method based on circuit board performance and reliability detection

Abstract

The invention discloses a processing quality control method based on circuit board performance and reliability detection, and relates to the field of printed circuit board manufacturing, and the method comprises the steps: obtaining the actual yield of a circuit board in a production line; when the actual yield is smaller than the yield critical value, processing regulation and control are conducted on the production line, and a regulation and control compensation value of the recognition index is obtained; during regulation and control, processing steps are obtained; establishing a processing step parameter regulation simulation prediction model; forming a distribution coefficient of the identification indexes for the processing steps; calculating regulation and control compensation parameters of the processing steps to form at least one regulation and control scheme to be verified; calculating a deviation coefficient of the regulation and control scheme to be verified; and correction compensation parameters of the processing steps are obtained. By establishing the processing step parameter regulation simulation prediction model, calculating the deviation coefficient of the regulation scheme to be verified and obtaining the correction compensation parameters of the processing steps, the superposition effect of the parameters of different processing steps is determined, and processing by using the parameters exceeding the requirements is avoided.

Description

Technical Field

[0001] The present invention relates to the field of printed circuit board manufacturing, and specifically relates to a processing quality control method based on the performance and reliability detection of circuit boards. Background Art

[0002] In the current era of widespread popularity of electronic products, as a key component of electronic devices, the quality of printed circuit boards (PCBs) directly affects the performance, reliability, and service life of electronic products. To ensure that PCBs meet high-quality standards, it is crucial to implement strict and comprehensive quality control during the production process.

[0003] During regulation, due to the superposition and interference effects of different processing parameter regulations, it is difficult to determine the regulation values of processing parameters. At the same time, since it is difficult to eliminate the superposition regulation effects of different parameters, some processing steps are prone to using parameters that exceed the yield requirements for processing, and using parameters that exceed the requirements will lead to an increase in processing costs and time. Summary of the Invention

[0004] To solve the above technical problems, a processing quality control method based on the performance and reliability detection of circuit boards is provided, and this technical solution solves the problems raised in the above background art.

[0005] To achieve the above objectives, the technical solution adopted by the present invention is as follows:

[0006] A processing quality control method based on the performance and reliability detection of circuit boards, comprising:

[0007] Obtain at least one identification index for the performance and reliability detection of the circuit board, and based on historical data, obtain the normal range of the identification index;

[0008] Use the identification index to detect the performance and reliability of the circuit board, and obtain the actual yield of the circuit board in the production line;

[0009] Based on historical data, obtain the yield critical value. When the actual yield is less than the yield critical value, perform processing regulation on the production line, and obtain the regulation compensation value of the identification index;

[0010] During regulation, obtain at least one processing step, where the processing step is material preparation, etching, drilling, electroplating, and lamination, and obtain the real-time parameters of the processing step;

[0011] Establish a simulation prediction model for processing step parameter regulation;

[0012] Based on the simulation prediction model for processing step parameter regulation, form the distribution coefficient of the identification index for the processing step;

[0013] Calculate at least one regulation compensation parameter for the processing step, and form at least one regulation plan to be verified based on the regulation compensation parameter;

[0014] Obtain the value to be verified of the recognition index for processing using the parameters of the regulation plan to be verified, calculate the deviation coefficient of the regulation plan to be verified, and take the regulation plan to be verified with the smallest deviation coefficient as the target plan;

[0015] Perform secondary regulation on the regulation compensation parameter of the processing step in the target plan to obtain the corrected compensation parameter of the processing step, and run the corresponding processing step according to the superimposed value of the corrected compensation parameter and the real-time parameter.

[0016] Preferably, the obtaining of at least one recognition index for detecting the performance and reliability of the circuit board includes the following steps:

[0017] Take the conduction performance, resistance value, impedance, and signal transmission delay duration during the performance and reliability detection process as the recognition indexes. During performance detection, directly monitor the recognition indexes. During reliability detection, monitor the recognition indexes after the circuit board has undergone high-temperature aging test, thermal shock test, and vibration test.

[0018] Preferably, the detecting of the performance and reliability of the circuit board to obtain the actual yield rate of the circuit board in the production line includes the following steps:

[0019] When the detected value of one of the recognition indexes of the circuit board does not fall within the normal range of the recognition index, the circuit board is unqualified;

[0020] Divide the number of unqualified circuit boards by the total number of circuit boards to obtain the actual yield rate of the circuit boards in the production line.

[0021] Preferably, the obtaining of the yield rate critical value based on historical data includes the following steps:

[0022] Obtain at least one yield rate allowable value of the production line, and take the minimum value of the yield rate allowable value as the yield rate critical value.

[0023] Preferably, the obtaining of the regulation compensation value of the recognition index includes the following steps:

[0024] Take the minimum value within the normal range of the recognition index as the first characteristic value, and take the maximum value within the normal range of the recognition index as the second characteristic value;

[0025] When the detected value of the recognition index is less than the first characteristic value, subtract the first characteristic value from the detected value of the recognition index to obtain the regulation compensation value of the recognition index;

[0026] When the detected value of the recognition index is greater than the second eigenvalue, the detected value of the recognition index is subtracted by the second eigenvalue to obtain the regulation compensation value of the recognition index;

[0027] When the detected value of the recognition index falls within the normal range of the recognition index, the regulation compensation value of the recognition index is 0.

[0028] Preferably, establishing the processing step parameter regulation simulation prediction model includes the following steps:

[0029] Take one of at least one processing step as the target processing step;

[0030] Obtain the parameter variation range of the target processing step, and equally spaced divide the parameter variation range of the target processing step to obtain at least one sampling point;

[0031] Under the condition that the parameter variation amplitude of the target processing step is the value at the sampling point and the parameters of the remaining processing steps remain unchanged, obtain the variation value of the recognition index;

[0032] Pair and fit the sampling point with the variation value of the recognition index to obtain a regulation fitting function, and the regulation fitting function corresponds to the target processing step and the recognition index;

[0033] When the target processing step traverses at least one processing step, obtain at least one regulation fitting function, and summarize it into a processing step parameter regulation simulation prediction model.

[0034] Preferably, forming the distribution coefficient of the recognition index for the processing step based on the processing step parameter regulation simulation prediction model includes the following steps:

[0035] Integrate the regulation fitting function corresponding to the recognition index and the processing step over the parameter variation range of the processing step to obtain the integral value of the recognition index relative to the processing step;

[0036] Accumulate the integral values of the recognition index relative to each processing step to obtain the comprehensive integral value of the recognition index;

[0037] Use the proportional distribution formula to calculate the distribution coefficient of the recognition index for the processing step;

[0038] The proportional distribution formula is as follows:

[0039]

[0040] Among them, B is the distribution coefficient of the recognition index for the processing step, D is the comprehensive integral value of the recognition index, and C is the integral value of the recognition index relative to the processing step.

[0041] Preferably, calculating at least one regulation compensation parameter for the processing step and forming at least one regulation scheme to be verified based on the regulation compensation parameter includes the following steps:

[0042] Multiply the regulation compensation value of the identification index by the distribution coefficient of the identification index for the processing step to obtain the index distribution value;

[0043] Substitute the index distribution value into the regulation fitting function corresponding to the identification index and the processing step, and solve for the regulation compensation parameter of the processing step by inverse solution;

[0044] Use the minimum and maximum values of at least one regulation compensation parameter of the processing step as endpoints to form the identification interval of the processing step;

[0045] Equally divide the identification interval of the processing step at equal intervals to obtain at least one identification point, and the identification point corresponds to the processing step;

[0046] Form at least one regulation scheme to be verified. In the regulation scheme to be verified, the compensation parameter used for the processing step is one of at least one identification point.

[0047] Preferably, calculating the deviation coefficient of the regulation scheme to be verified includes the following steps:

[0048] Use the deviation formula to calculate the deviation coefficient of the regulation scheme to be verified;

[0049] The deviation formula is as follows:

[0050]

[0051] Where, |a i -x i | represents taking the absolute value of a i -x i |x i -b i | represents taking the absolute value of x i -b i i is the subscript, n is the number of identification indicators, a i and b i are the endpoint values of the normal range of the i-th identification indicator, x i is the value to be verified of the i-th identification indicator, and A is the deviation coefficient.

[0052] Preferably, performing secondary regulation on the regulation compensation parameter of the processing step in the target scheme to obtain the corrected compensation parameter of the processing step includes the following steps:

[0053] Form a preliminary target plan, where the preliminary regulation compensation parameter for the processing steps in the preliminary target plan is equal to half of the regulation compensation parameter for the processing steps in the target plan. Run the corresponding processing steps according to the superimposed value of the preliminary regulation compensation parameter and the real-time parameter. Use the recognition index to detect the performance and reliability of the processed circuit board, and obtain the regulation yield of the circuit board in the production line;

[0054] When the regulation yield is less than the yield critical value, use the regulation compensation parameter of the processing steps in the target plan as the correction compensation parameter for the processing steps. Otherwise, update the regulation compensation parameter of the processing steps in the target plan with the preliminary regulation compensation parameter of the processing steps in the preliminary target plan, clear the preliminary target plan, and repeat the previous step until the regulation yield is less than the yield critical value.

[0055] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0056] By establishing a simulation prediction model for regulating processing step parameters, forming an allocation coefficient of the recognition index for the processing steps, calculating the deviation coefficient of the to-be-verified regulation plan, and obtaining the correction compensation parameter of the processing steps, it is possible to determine the superimposed effect of the parameters of different processing steps according to the initial analysis results, select a regulation plan with a yield meeting the requirements, and perform secondary regulation on this regulation plan to ensure that the regulation plan after secondary regulation is exactly the parameter plan meeting the requirements, thereby avoiding processing with parameters exceeding the requirements. Thus, the processing cost and time are controlled. Description of the Drawings

[0057] Figure 1 It is a schematic flowchart of the processing quality control method based on the detection of the performance and reliability of the circuit board according to the present invention;

[0058] Figure 2 It is a schematic flowchart of detecting the performance and reliability of the circuit board to obtain the actual yield of the circuit board in the production line according to the present invention;

[0059] Figure 3 It is a schematic flowchart of obtaining the regulation compensation value of the recognition index according to the present invention;

[0060] Figure 4 It is a schematic flowchart of establishing a simulation prediction model for regulating processing step parameters according to the present invention;

[0061] Figure 5 It is a schematic flowchart of forming an allocation coefficient of the recognition index for the processing steps based on the simulation prediction model for regulating processing step parameters according to the present invention;

[0062] Figure 6Calculate at least one regulation compensation parameter for the processing steps of the present invention, and based on the regulation compensation parameter, form a flow schematic diagram of at least one regulation scheme to be verified;

[0063] Figure 7 It is a flow schematic diagram of the present invention for secondary regulation of the regulation compensation parameter of the processing steps in the target scheme to obtain the corrected compensation parameter of the processing steps. Detailed implementation manners

[0064] The following description is used to disclose the present invention so that those skilled in the art can implement the present invention. The preferred embodiments in the following description are only examples, and those skilled in the art can think of other obvious variations.

[0065] Refer to Figure 1 As shown, a processing quality control method based on the performance and reliability detection of a circuit board includes:

[0066] Obtain at least one identification index for the performance and reliability detection of the circuit board, and based on historical data, obtain the normal range of the identification index;

[0067] Use the identification index to detect the performance and reliability of the circuit board, and obtain the actual yield rate of the circuit board in the production line;

[0068] Based on historical data, obtain the yield rate critical value. When the actual yield rate is less than the yield rate critical value, perform processing regulation on the production line to obtain the regulation compensation value of the identification index;

[0069] During regulation, obtain at least one processing step, where the processing steps are material preparation, etching, drilling, electroplating, and lamination, and obtain the real-time parameters of the processing steps;

[0070] Establish a simulation prediction model for processing step parameter regulation;

[0071] Based on the simulation prediction model for processing step parameter regulation, form the distribution coefficient of the identification index for the processing steps;

[0072] Calculate at least one regulation compensation parameter for the processing steps, and based on the regulation compensation parameter, form at least one regulation scheme to be verified;

[0073] Obtain the value to be verified of the identification index for processing using the parameters of the regulation scheme to be verified, calculate the deviation coefficient of the regulation scheme to be verified, and use the regulation scheme to be verified with the smallest deviation coefficient as the target scheme;

[0074] Perform secondary regulation on the regulation compensation parameter of the processing steps in the target scheme to obtain the corrected compensation parameter of the processing steps, and operate the corresponding processing steps according to the superimposed value of the corrected compensation parameter and the real-time parameter.

[0075] The parameters for material preparation are the type of material, the parameters for etching are the concentration, temperature, and etching time of the etching solution, the parameters for drilling are the drilling location and drilling size, the parameters for electroplating are the current density, type of electrolyte, temperature, and time, and the parameters for lamination are the lamination temperature, pressure, and time. At the same time, it also includes the resin content, fluidity, and gel time before lamination;

[0076] In this solution, although a simulation prediction model for regulating the parameters of the processing steps is established, and an identification index for the distribution coefficient of the processing steps is formed through this model. Thus, the regulation compensation value of the identification index can be decomposed, so as to ensure that the superposition effect of different processing steps can nearly meet the regulation requirements. However, due to relying on modeling calculations, there are deviations in the fitting degree of the model. Directly using the calculated values for regulation may lead to deviations in regulation. This deviation may be lower than the requirement or higher than the requirement. To avoid this, first, determine the target solution, which is a solution that meets the regulation requirements, but its parameters may be higher than the yield requirement. Therefore, correct its parameters. Thus, the corrected compensation parameters for the processing steps are obtained. Then, using the high parameters for regulation can be closer to the actual requirements, and further control the processing cost and time after regulation.

[0077] The steps for obtaining at least one identification index for the performance and reliability detection of the circuit board include the following:

[0078] Take the conduction performance, resistance value, impedance, and signal transmission delay duration during the performance and reliability detection as the identification indexes. During performance detection, directly monitor the identification indexes. During reliability detection, after the circuit board undergoes high-temperature aging test, thermal shock test, and vibration test, monitor the identification indexes.

[0079] The indexes for performance and reliability detection are the same. Reliability detection is to detect whether the performance of the circuit board still meets the requirements under various conditions.

[0080] Refer to Figure 2 As shown, the steps for detecting the performance and reliability of the circuit board and obtaining the actual yield of the circuit board in the production line include the following:

[0081] When the detected value of one of the identification indexes of the circuit board does not fall within the normal range of the identification index, the circuit board is unqualified;

[0082] The number of unqualified circuit boards is divided by the total number of circuit boards to obtain the actual yield of the circuit boards in the production line.

[0083] When one of the identification indexes is unqualified, the entire circuit board is unqualified because the normal range of the identification index already includes the fault tolerance range. When it exceeds the normal range, the resulting effect is uncontrollable. Therefore, it is treated as unqualified.

[0084] Based on historical data, obtaining the yield critical value includes the following steps:

[0085] Obtain at least one yield allowable value of the production line, and take the minimum value of the yield allowable values as the yield critical value.

[0086] Refer to Figure 3 As shown, obtaining the regulation compensation value of the recognition index includes the following steps:

[0087] Take the minimum value within the normal range of the recognition index as the first characteristic value, and take the maximum value within the normal range of the recognition index as the second characteristic value;

[0088] When the detected value of the recognition index is less than the first characteristic value, subtract the first characteristic value from the detected value of the recognition index to obtain the regulation compensation value of the recognition index;

[0089] When the detected value of the recognition index is greater than the second characteristic value, subtract the second characteristic value from the detected value of the recognition index to obtain the regulation compensation value of the recognition index;

[0090] When the detected value of the recognition index belongs to the normal range of the recognition index, the regulation compensation value of the recognition index is 0.

[0091] When performing regulation, it is necessary to adjust the value of the recognition index to belong to the normal range of the recognition index through the regulation of processing parameters. Therefore, it is necessary to obtain the regulation amplitude of the recognition index, that is, the regulation compensation value of the recognition index.

[0092] Refer to Figure 4 As shown, establishing a simulation prediction model for regulating processing step parameters includes the following steps:

[0093] Take one of at least one processing step as the target processing step;

[0094] Obtain the parameter variation range of the target processing step, and equally divide the parameter variation range of the target processing step at equal intervals to obtain at least one sampling point;

[0095] Under the condition that the parameter variation amplitude of the target processing step is the value at the sampling point and the parameters of the remaining processing steps remain unchanged, obtain the variation value of the recognition index;

[0096] Pair and fit the sampling point with the variation value of the recognition index to obtain a regulation fitting function, and the regulation fitting function corresponds to the target processing step and the recognition index;

[0097] When the target processing step traverses at least one processing step, obtain at least one regulation fitting function, and summarize it into a simulation prediction model for regulating processing step parameters.

[0098] When the target processing step changes, it will cause changes in multiple recognition indicators. Therefore, for each recognition indicator, a regulation fitting function between the recognition indicator and the target processing step needs to be formed. Since there are multiple processing steps at the same time, in order to avoid interference, it is necessary to ensure that the parameters of the remaining processing steps remain unchanged. Thus, the regulation fitting function can be obtained. However, since the function fitting method is used and multiple remaining processing steps are involved in the whole process, there is a certain deviation in its prediction accuracy. Therefore, it is necessary to adjust the obtained results to obtain the required regulation scheme.

[0099] Referring to Figure 5 As shown, based on the processing step parameter regulation simulation prediction model, forming the distribution coefficient of the recognition indicator for the processing step includes the following steps:

[0100] Integrate the regulation fitting function corresponding to the recognition indicator and the processing step within the parameter variation range of the processing step to obtain the integral value of the recognition indicator relative to the processing step;

[0101] Accumulate the integral values of the recognition indicator relative to each processing step to obtain the comprehensive integral value of the recognition indicator;

[0102] Use the proportional distribution formula to calculate the distribution coefficient of the recognition indicator for the processing step;

[0103] The proportional distribution formula is as follows:

[0104]

[0105] Among them, B is the distribution coefficient of the recognition indicator for the processing step, D is the comprehensive integral value of the recognition indicator, and C is the integral value of the recognition indicator relative to the processing step.

[0106] Since each processing step contributes differently to the recognition indicator, when making the distribution, it is necessary to proportionally distribute the regulation compensation value of the recognition indicator according to its different contributions to the recognition indicator. Therefore, it is necessary to calculate the distribution coefficient of the recognition indicator for the processing step, and its calculation depends on the overall regulation value of the regulation fitting function corresponding to the recognition indicator and the processing step.

[0107] It should be noted here that when the processing step makes no contribution to the recognition indicator, the corresponding regulation fitting function is always equal to 0. Therefore, the distribution coefficient of the recognition indicator for the processing step calculated accordingly is also 0.

[0108] Referring to Figure 6 As shown, calculating at least one regulation compensation parameter of the processing step, and based on the regulation compensation parameter, forming at least one regulation scheme to be verified includes the following steps:

[0109] Multiply the regulation compensation value of the recognition index by the distribution coefficient of the recognition index for the processing step to obtain the index distribution value;

[0110] Substitute the index distribution value into the regulation fitting function corresponding to the recognition index and the processing step, and solve for the regulation compensation parameter of the processing step by inverse solution;

[0111] Use the minimum and maximum values of at least one regulation compensation parameter of the processing step as endpoints to form the recognition interval of the processing step;

[0112] Equally divide the recognition interval of the processing step to obtain at least one recognition point, and the recognition point corresponds to the processing step;

[0113] Form at least one regulation plan to be verified. In the regulation plan to be verified, the compensation parameter adopted by the processing step is one of at least one recognition point.

[0114] Each recognition index will generate a regulation compensation parameter for the processing step, and each regulation compensation parameter can respectively affect the corresponding recognition index. Moreover, different processing steps will also have a superimposed effect on the recognition index. Therefore, it is difficult to select exactly the parameters that meet the requirements from at least one regulation compensation parameter of the processing step. Therefore, a regulation plan to be verified is formed. According to the continuity of the function, there must be a plan that meets the yield requirement in the regulation plan to be verified. Therefore, by calculating the deviation coefficient, the plan that meets the yield requirement can be selected, but there may be room for reduction in the parameter standard of this plan. Therefore, secondary regulation is required.

[0115] Calculating the deviation coefficient of the regulation plan to be verified includes the following steps:

[0116] Use the deviation formula to calculate the deviation coefficient of the regulation plan to be verified;

[0117] The deviation formula is as follows:

[0118]

[0119] Where, |a i -x i | represents taking the absolute value of a i -x i |x i -b i | represents taking the absolute value of x i -b i i is the subscript, n is the number of recognition indices, a i and b i are the endpoint values of the normal range of the i-th recognition index, x i is the value to be verified of the i-th recognition index, and A is the deviation coefficient.

[0120] When the value to be verified is within the normal range of the recognition index, then |a i -x i | + |x i -b i | is equal to the length of the normal range of the recognition index. When the value to be verified is not within the normal range of the recognition index, then |a i -x i | + |x i -b i | is greater than the length of the normal range of the recognition index, and the greater the degree of deviation, then |a i -x i | + |x i -b i | is greater.

[0121] Refer to Figure 7 As shown, perform secondary regulation on the regulation compensation parameters of the processing steps in the target plan to obtain the corrected compensation parameters of the processing steps, including the following steps:

[0122] Form a preliminary target plan, where the preliminary regulation compensation parameter of the processing step in the preliminary target plan is equal to half of the regulation compensation parameter of the processing step in the target plan. Run the corresponding processing step according to the superimposed value of the preliminary regulation compensation parameter and the real-time parameter, and use the recognition index to detect the performance and reliability of the circuit board after processing regulation to obtain the regulation yield of the circuit board in the production line;

[0123] When the regulation yield is less than the yield critical value, use the regulation compensation parameter of the processing step in the target plan as the corrected compensation parameter of the processing step. Otherwise, use the preliminary regulation compensation parameter of the processing step in the preliminary target plan to update the regulation compensation parameter of the processing step in the target plan, and clear the preliminary target plan. Repeat the previous step until the regulation yield is less than the yield critical value.

[0124] Since the target plan is a parameter that can meet the yield requirement, when there is a parameter that can meet the yield requirement with a smaller regulation range, then this parameter must be between the regulation compensation parameter of the processing step in the target plan and 0. Therefore, this value can be approximated by the method of gradual bisection. When making a selection, form a preliminary target plan. When the parameter of the preliminary target plan does not meet the yield requirement, it means that the parameter of the target plan that generates the preliminary target plan is relatively optimal, because when it is reduced again, the generated parameter does not meet the yield requirement. Here, the preliminary regulation compensation parameter of the processing step in the preliminary target plan is equal to half of the regulation compensation parameter of the processing step in the target plan, and it can be changed to any value greater than half but less than 1 according to the regulation requirement. Thus, the reduction amplitude can be made smaller each time, and then a better approximation effect can be generated.

[0125] Further, this solution also proposes a storage medium, on which a computer-readable program is stored. When the computer-readable program is called, it executes the above-mentioned processing quality control method based on the performance and reliability detection of the circuit board.

[0126] It can be understood that the storage medium can be a magnetic medium, such as a floppy disk, a hard disk, or a magnetic tape; an optical medium, such as a DVD; or a semiconductor medium, such as a solid-state disk (SSD).

[0127] In summary, the advantages of the present invention are as follows: By establishing a simulation prediction model for regulating processing step parameters, forming an identification index for the distribution coefficient of processing steps, calculating the deviation coefficient of the regulation scheme to be verified, and obtaining the correction compensation parameters of processing steps, the superposition effect of parameters of different processing steps can be determined according to the initial analysis results, a regulation scheme with a yield meeting the requirements can be selected, and the regulation scheme can be regulated twice to ensure that the regulated scheme after the second regulation is exactly the parameter scheme that meets the requirements, thereby avoiding processing with parameters exceeding the requirements. Thus, the processing cost and time are controlled.

[0128] The above shows and describes the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. What is described in the above embodiments and the specification is only the principle of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements all fall within the scope of the present invention claimed. The scope of protection claimed by the present invention is defined by the appended claims and their equivalents.

Claims

1. A processing quality control method based on circuit board performance and reliability detection, characterized in that: include: Obtaining at least one identification indicator for performance and reliability detection of a circuit board, and obtaining a normal range of the identification indicator based on historical data; Use identification indicators to test the performance and reliability of the circuit board and obtain the actual yield of the circuit board in the production line; Based on historical data, the yield critical value is obtained. When the actual yield is less than the yield critical value, the production line is processed and adjusted to obtain the control compensation value of the identification index; During the control, at least one processing step is obtained, wherein the processing step is material preparation, etching, drilling, electroplating and lamination, and real-time parameters of the processing step are obtained; Establish a simulation prediction model for parameter control of processing steps; Based on the process step parameter control simulation prediction model, the distribution coefficient of the identification index to the process step is formed; Calculate and obtain at least one control and compensation parameter of the processing step, and form at least one control scheme to be verified based on the control and compensation parameter; Obtaining the value to be verified of the identification index processed using the parameters of the control scheme to be verified, calculating the deviation coefficient of the control scheme to be verified, and taking the control scheme to be verified with the smallest deviation coefficient as the target scheme; The control compensation parameters of the processing steps in the target solution are adjusted for the second time to obtain the corrected compensation parameters of the processing steps, and the corresponding processing steps are run according to the superimposed value of the corrected compensation parameters and the real-time parameters.

2. A processing quality control method based on circuit board performance and reliability detection according to claim 1, characterized in that: The step of obtaining at least one identification index for performance and reliability detection of a circuit board comprises the following steps: The conduction performance, resistance value, impedance, and signal transmission delay time in the performance and reliability testing process are used as identification indicators. During performance testing, the identification indicators are directly monitored. During reliability testing, the identification indicators are monitored after the circuit board has undergone high-temperature aging test, hot and cold shock test, and vibration test.

3. A processing quality control method based on circuit board performance and reliability detection according to claim 2, characterized in that: The testing of the performance and reliability of the circuit board to obtain the actual yield of the circuit board in the production line includes the following steps: When the detection value of one of the identification indicators of the circuit board does not fall within the normal range of the identification indicator, the circuit board is unqualified; The number of unqualified circuit boards divided by the total number of circuit boards gives the actual yield of the circuit boards in the production line.

4. A processing quality control method based on circuit board performance and reliability detection according to claim 3, characterized in that: The method of obtaining the yield critical value based on historical data includes the following steps: At least one yield allowable value of the production line is obtained, and the minimum value of the yield allowable value is used as the yield critical value.

5. A processing quality control method based on circuit board performance and reliability detection according to claim 4, characterized in that: The obtaining of the control compensation value of the identification index comprises the following steps: The minimum value within the normal range of the identification index is used as the first characteristic value, and the maximum value within the normal range of the identification index is used as the second characteristic value; When the detection value of the identification index is less than the first characteristic value, the detection value of the identification index is subtracted from the first characteristic value to obtain a control compensation value of the identification index; When the detection value of the identification index is greater than the second characteristic value, the detection value of the identification index is subtracted from the second characteristic value to obtain a control compensation value of the identification index; When the detection value of the recognition index belongs to the normal range of the recognition index, the control compensation value of the recognition index is 0.

6. A processing quality control method based on circuit board performance and reliability detection according to claim 5, characterized in that: The establishment of the processing step parameter control simulation prediction model comprises the following steps: taking one of the at least one processing step as a target processing step; Acquire a parameter variation range of a target processing step, divide the parameter variation range of the target processing step into equal intervals, and obtain at least one sampling point; Under the condition that the parameter variation range of the target processing step is the value at the sampling point and the parameters of the other processing steps remain unchanged, obtaining the variation value of the identification index; Pairing and fitting the sampling points with the change values ​​of the identification index to obtain a regulation fitting function, wherein the regulation fitting function corresponds to the target processing steps and the identification index; When the target processing step traverses at least one processing step, at least one control fitting function is obtained and summarized into a processing step parameter control simulation prediction model.

7. A processing quality control method based on circuit board performance and reliability detection according to claim 6, characterized in that: The method of forming a distribution coefficient of the identification index to the processing step based on the processing step parameter regulation simulation prediction model comprises the following steps: Integrating the control fitting function corresponding to the identification index and the processing step over the parameter variation range of the processing step to obtain the integral value of the identification index relative to the processing step; Accumulating the integral value of the recognition index relative to each processing step to obtain a comprehensive integral value of the recognition index; Using the proportional distribution formula, calculate the distribution coefficient of the identification index to the processing step; The proportional allocation formula is as follows: Among them, B is the distribution coefficient of the identification index to the processing step, D is the comprehensive integral value of the identification index, and C is the integral value of the identification index relative to the processing step.

8. A processing quality control method based on circuit board performance and reliability detection according to claim 7, characterized in that: The calculating and obtaining at least one control compensation parameter of the processing step, and forming at least one control scheme to be verified based on the control compensation parameter, comprises the following steps: The control compensation value of the identification index is multiplied by the allocation coefficient of the identification index for the processing step to obtain the index allocation value; Substituting the index allocation value into the control fitting function corresponding to the identification index and the processing step, and inversely solving to obtain the control compensation parameter of the processing step; Taking the minimum value and the maximum value of at least one control compensation parameter of the processing step as endpoints to form an identification interval of the processing step; Dividing the identification interval of the processing step at equal intervals to obtain at least one identification point, where the identification point corresponds to the processing step; At least one control scheme to be verified is formed, in which the compensation parameter adopted in the processing step is one of the at least one identification point.

9. A processing quality control method based on circuit board performance and reliability detection according to claim 8, characterized in that: The calculation of the deviation coefficient of the control scheme to be verified comprises the following steps: Use the deviation formula to calculate the deviation coefficient of the control scheme to be verified; The deviation formula is as follows: Among them, |a i -x i | indicates a i -x i Take the absolute value, |x i -b i | indicates x i -b i Take the absolute value, i is the subscript, n is the number of identification indicators, a i and b i is the endpoint value of the normal range of the i-th identification index, x i is the value to be verified of the i-th identification index, and A is the deviation coefficient.

10. A processing quality control method based on circuit board performance and reliability detection according to claim 9, characterized in that: The second step of adjusting the control compensation parameters of the processing step in the target solution to obtain the corrected compensation parameters of the processing step includes the following steps: Form a preliminary target solution, satisfying that the preliminary control compensation parameter of the processing step in the preliminary target solution is equal to half of the control compensation parameter of the processing step in the target solution, and running the corresponding processing step according to the superposition value of the preliminary control compensation parameter and the real-time parameter, using the identification index, testing the performance and reliability of the circuit board after processing and control, and obtaining the control yield of the circuit board in the production line; When the controlled yield is less than the yield critical value, the controlled compensation parameters of the processing steps in the target scheme are used as the corrected compensation parameters of the processing steps; otherwise, the controlled compensation parameters of the processing steps in the target scheme are updated using the preliminary controlled compensation parameters of the processing steps in the preliminary target scheme, and the preliminary target scheme is cleared, and the previous step is repeated until the controlled yield is less than the yield critical value.

Images