Ammeter load switch aging dynamic monitoring system and method based on high-speed data acquisition

Abstract

The invention relates to the technical field of electricity meter load switch aging monitoring, in particular to an electricity meter load switch aging dynamic monitoring system and method based on high-speed data acquisition. The method comprises the following steps: carrying out initial aging analysis on each ammeter load switch in sequence based on an aging monitoring sequence; when initial aging analysis is carried out on the ammeter load switch, a first aging characteristic value of the ammeter load switch is generated, and whether the ammeter load switch is marked as a key monitoring ammeter load switch or not is judged based on a comparison result of the first aging characteristic value and a first aging characteristic value threshold value; high-speed data of the key monitoring ammeter load switch are collected, advanced aging analysis is carried out on the key monitoring ammeter load switch based on the high-speed data, and a second aging characteristic value is generated; and an early warning signal of the ammeter load switch is generated based on the second aging characteristic value, so that the aging dynamic state of the ammeter load switch can be monitored more accurately, efficiently and in real time, and the reliability and stability of a power system are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of aging monitoring of electric meter load switches, and particularly to a dynamic aging monitoring system and method for electric meter load switches based on high-speed data acquisition. Background Art

[0002] In the power system, as a key device connecting the power grid and users, the operating state of the electric meter load switch is directly related to the safety and reliability of power supply. However, with the increase of operation time, the load switch will be affected by various factors, such as current impact, temperature change, mechanical wear, etc., resulting in a gradual decline in its performance and even failures.

[0003] Traditional aging monitoring methods for electric meter load switches mainly rely on regular manual inspections and off-line tests. However, this method has many deficiencies: on the one hand, manual inspections are limited by the experience and judgment of personnel, and it is difficult to accurately capture the early aging signs of the load switch; on the other hand, off-line tests require power disconnection, which causes interference to the normal power consumption of users, and the test cycle is long, and it cannot reflect the operating state of the load switch in real time.

[0004] Therefore, there is an urgent need for a dynamic aging monitoring system and method for electric meter load switches based on high-speed data acquisition to solve the above problems. Summary of the Invention

[0005] The purpose of the present invention is to provide a dynamic aging monitoring system and method for electric meter load switches based on high-speed data acquisition, so as to solve the technical problems of inaccurate monitoring and low monitoring timeliness in the traditional aging monitoring method of electric meter load switches, which in turn lead to low safety of power grid operation.

[0006] The purpose of the present invention can be achieved by the following technical solutions:

[0007] On the one hand, a dynamic aging monitoring system for electric meter load switches based on high-speed data acquisition, the system includes:

[0008] An initial aging analysis module, configured to perform initial aging analysis on each electric meter load switch in sequence based on the aging monitoring sequence;

[0009] A key monitoring judgment module, configured to generate a first aging characteristic value of the electric meter load switch when performing initial aging analysis on the electric meter load switch, and determine whether to mark the electric meter load switch as a key monitoring electric meter load switch based on the comparison result between the first aging characteristic value and the first aging characteristic value threshold;

[0010] An advanced aging analysis module, configured to collect high-speed data of the key monitoring electric meter load switches, perform advanced aging analysis on the key monitoring electric meter load switches based on the high-speed data, and generate a second aging characteristic value;

[0011] An aging warning analysis module, which is used to generate a warning signal for the meter load switch based on the second aging characteristic value.

[0012] Further, the aging management sequence is obtained through the following steps: Obtain the aging management sequence values of each meter load switch, multiply all the aging management sequence values by their corresponding aging management weight coefficients to obtain the aging monitoring sequence values, sort them in descending order according to the numerical values of the aging monitoring sequence values, and generate a sequence after sorting. This sequence is the aging monitoring sequence.

[0013] Further, the aging management sequence value of the meter load switch is obtained through the following steps: Obtain a plurality of aging correlation coefficients continuously generated by the meter load switch before the current time of the system. Construct a rectangular coordinate system with the aging correlation coefficient as the Y-axis and the generation time of the aging correlation coefficient as the X-axis. Mark all the aging correlation coefficients as points in the rectangular coordinate system, connect the adjacent points in the rectangular coordinate system to generate an aging correlation curve, set an aging boundary constant line, mark the intersection points of the aging correlation curve and the aging boundary constant line, select the graph of the aging correlation curve above the aging boundary constant line based on the intersection points, calculate the area value of this graph, and record this area value as the aging management sequence value of the meter load switch.

[0014] Further, the specific process of generating the aging correlation coefficient of the meter load switch specifically includes the following:

[0015] Collect the historical correlation data of the meter load switch before the current time of the system. Among them, the historical correlation data includes the switch failure frequency R, the increase rate M of the contact resistance, and the decrease rate N of the insulation resistance; Substitute the switch failure frequency R, the increase rate M of the contact resistance, and the decrease rate N of the insulation resistance into the correlation formula to calculate the aging correlation coefficient GLZ. The correlation formula is as follows:

[0016] Among them, γ is the contact resistance correlation coefficient, and θ is the insulation resistance correlation coefficient.

[0017] Further, the switch failure frequency R is the failure frequency of the meter load switch within a preset time period. The obtaining step of the increase rate M of the contact resistance is: Statistically calculate the contact difference between the contact resistance value of the meter load switch within a preset time period and the preset contact resistance value, and record the ratio of the contact difference to the preset time period as the increase rate M of the contact resistance. The obtaining step of the decrease rate N of the insulation resistance is: Statistically calculate the insulation difference between the insulation resistance of the meter load switch within a preset time period and the preset insulation resistance value, and record the ratio of the insulation difference to the preset time period as the decrease rate of the insulation resistance.

[0018] Further, the specific process of obtaining the aging management weight coefficient specifically includes the following:

[0019] Build a hierarchical model with a hierarchical structure layer by layer, where the levels include the goal level, the criterion level, and the measure level;

[0020] Construct a judgment matrix: Determine the number m of relevant influencing factors of the meter load switch, construct a set U of aging factors of the meter load switch, U = {φ 1 , φ 2 , φ 3 , φ 4}, where φ 1 is the subset of the switch failure frequency, φ 2 is the subset of the increase rate of the contact resistance, φ 3 is the subset of the decrease rate of the insulation resistance, φ 4 is the subset of the dielectric withstand voltage rate of the meter load switch. Take two subsets in the same level from the set U for comparison, use m to represent the ratio of importance, and assign the corresponding importance according to a preset ratio. Combine the importance of each layer to form a judgment matrix;

[0021] Calculate the maximum eigenvalue γ of the judgment matrix:

[0022]

[0023] where v ij is the matrix obtained by normalizing each column vector of the judgment matrix, and the values of i and j are 1, 2... m, w j is the matrix obtained by adding the elements of each row of the matrix v ij and then normalizing the obtained vector, w i is the matrix obtained by adding the elements of each column of the matrix v ij and then normalizing the obtained vector;

[0024] Calculate the consistency index CI: where k represents the order of the judgment matrix;

[0025] Record the value of CI as the aging management weight coefficient.

[0026] Furthermore, generating the first aging eigenvalue of the meter load switch specifically includes the following process:

[0027] Collect the first aging characteristic data of the meter load switch at the current system time, where the first aging characteristic data includes the total historical failure times Q of the meter load switch and the total working duration W of the meter load switch. Obtain the total historical failure times Z of all meter load switches, and calculate the first aging eigenvalue DYX of the meter load switch based on the formula , where K1 and K2 are both coefficient constants, and V is the total historical failure duration of all meter load switches.

[0028] Further, based on the comparison result between the first aging eigenvalue and the first aging eigenvalue threshold, determining whether to mark the meter load switch as a key monitored meter load switch specifically includes the following process:

[0029] If the first aging eigenvalue is greater than the first aging eigenvalue threshold, mark the meter load switch as a key monitored meter load switch; if the first aging eigenvalue is less than or equal to the first aging eigenvalue threshold, do not mark the meter load switch as a key monitored meter load switch.

[0030] Further, based on high-speed data, perform advanced aging analysis on the key monitored meter load switch to generate a second aging eigenvalue, which specifically includes the following process:

[0031] Set i detection times between the current moment of the system and the preset moment, and obtain the high-speed data at the first moment, the high-speed data at the second moment, and up to the high-speed data at the i-th moment based on the detection times; among them, the high-speed data at the first moment includes the first current redundancy, the first voltage redundancy, and the first temperature redundancy of the meter load switch; the high-speed data at the i-th moment includes the i-th current redundancy, the i-th voltage redundancy, and the i-th temperature redundancy of the meter load switch; among them, the current redundancy of the meter load switch is the difference between the current of the meter load switch and the preset current threshold, the voltage redundancy is the difference between the voltage of the meter load switch and the preset voltage threshold, and the temperature redundancy is the difference between the temperature of the meter load switch and the preset temperature threshold; add the first current redundancy, the first voltage redundancy, and the first temperature redundancy to obtain the first candidate aging eigenvalue; until the i-th candidate aging eigenvalue is calculated;

[0032] Select the largest candidate aging eigenvalue from the first candidate aging eigenvalue to the i-th candidate aging eigenvalue, and use the largest candidate aging eigenvalue as the second aging eigenvalue.

[0033] On the other hand, the method for dynamically monitoring the aging of a meter load switch based on high-speed data acquisition is applicable to the above-mentioned system for dynamically monitoring the aging of a meter load switch based on high-speed data acquisition. The method includes:

[0034] Perform initial aging analysis on each meter load switch in sequence based on the aging monitoring sequence;

[0035] When performing initial aging analysis on the meter load switch, generate the first aging eigenvalue of the meter load switch, and based on the comparison result between the first aging eigenvalue and the first aging eigenvalue threshold, determine whether to mark the meter load switch as a key monitored meter load switch;

[0036] Collect the high-speed data of the key monitored meter load switch, and perform advanced aging analysis on the key monitored meter load switch based on the high-speed data to generate a second aging eigenvalue;

[0037] Generate a warning signal for the meter load switch based on the second aging eigenvalue.

[0038] Compared with the existing solutions, the beneficial effects achieved by the present invention are as follows:

[0039] The present invention can continuously and rapidly collect the operating parameters of the meter load switch, ensuring the accuracy and integrity of the data, which helps to more accurately reflect the actual operating state of the load switch. The system can real-time monitor multiple operating parameters of the load switch, including current, voltage, temperature, etc., to achieve immediate mastery of the load switch state.

[0040] The present invention comprehensively analyzes multiple operating parameters to achieve a dynamic assessment of the aging degree of the load switch, improving the accuracy of the assessment of the aging of the meter load switch and providing a strong guarantee for the safe and stable operation of the power system. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required in the embodiments. Obviously, the drawings described below are only some embodiments recorded in the present invention. For those of ordinary skill in the art, other drawings can also be obtained based on these drawings.

[0042] Figure 1 is a system block diagram of a dynamic monitoring system for the aging of a meter load switch based on high-speed data acquisition according to an embodiment of the present invention;

[0043] Figure 2 is a flowchart of a dynamic monitoring method for the aging of a meter load switch based on high-speed data acquisition according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0044] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0045] In addition, the described features, structures, or characteristics may be combined in any suitable manner in one or more example embodiments. In the following description, numerous specific details are provided to give a thorough understanding of the example embodiments of the present disclosure. However, those skilled in the art will realize that the technical solutions of the present disclosure may be practiced without one or more of the specific details, or other methods, components, steps, etc. may be adopted. In other cases, well-known structures, methods, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of the present disclosure.

[0046] This embodiment provides a dynamic monitoring system for the aging of electricity meter load switches based on high-speed data acquisition. Figure 1 FIG. is a system block diagram of a dynamic monitoring system for the aging of electricity meter load switches based on high-speed data acquisition according to an embodiment of the present invention. As Figure 1 shown, the system includes:

[0047] An initial aging analysis module for performing initial aging analysis on each electricity meter load switch in sequence based on an aging monitoring sequence;

[0048] A key monitoring judgment module for generating a first aging characteristic value of the electricity meter load switch when performing initial aging analysis on the electricity meter load switch, and determining whether to mark the electricity meter load switch as a key monitoring electricity meter load switch based on the comparison result between the first aging characteristic value and a first aging characteristic value threshold;

[0049] An advanced aging analysis module for collecting high-speed data of the key monitoring electricity meter load switches and performing advanced aging analysis on the key monitoring electricity meter load switches based on the high-speed data to generate a second aging characteristic value;

[0050] An aging warning analysis module for generating a warning signal for the electricity meter load switch based on the second aging characteristic value.

[0051] Specifically, when the second aging characteristic value is greater than a second aging characteristic value threshold, a warning signal for the electricity meter load switch is generated; when the second aging characteristic value is less than or equal to the second aging characteristic value threshold, a warning signal for the electricity meter load switch is not generated, where the second aging characteristic value threshold is set and stored in the system by the system.

[0052] In summary, the present invention performs initial aging analysis on each meter load switch in sequence based on the aging monitoring sequence; when performing initial aging analysis on the meter load switch, a first aging characteristic value of the meter load switch is generated, and based on the comparison result between the first aging characteristic value and the first aging characteristic value threshold, it is determined whether to mark the meter load switch as a key monitored meter load switch; high-speed data of the key monitored meter load switch is collected, and advanced aging analysis is performed on the key monitored meter load switch based on the high-speed data to generate a second aging characteristic value; an early warning signal of the meter load switch is generated based on the second aging characteristic value, which can more accurately, efficiently, and real-time monitor the aging dynamics of the meter load switch and improve the reliability and stability of the power system.

[0053] In some embodiments, the aging management sequence is obtained through the following steps: obtaining the aging management sequence values of each meter load switch, multiplying all the aging management sequence values by their corresponding aging management weight coefficients to obtain aging monitoring sequence values, sorting them in descending order according to the numerical values of the aging monitoring sequence values, and generating a sequence after sorting, and this sequence is the aging monitoring sequence.

[0054] Further, the aging management sequence value of the meter load switch is obtained through the following steps: obtaining a plurality of consecutive aging correlation coefficients generated by the meter load switch before the current time of the system, constructing a rectangular coordinate system with the aging correlation coefficient as the Y-axis and the generation time of the aging correlation coefficient as the X-axis, marking all the aging correlation coefficients as points in the rectangular coordinate system, connecting adjacent points in the rectangular coordinate system to generate an aging correlation curve, setting an aging boundary constant line, marking the intersection points of the aging correlation curve and the aging boundary constant line, selecting the graph of the aging correlation curve above the aging boundary constant line based on the intersection points, calculating the area value of this graph, and recording this area value as the aging management sequence value of the meter load switch.

[0055] Further, generating the aging correlation coefficient of the meter load switch specifically includes the following process:

[0056] Collecting the historical correlation data of the meter load switch before the current time of the system, where the historical correlation data includes the switch failure frequency R, the increase rate M of the contact resistance, and the decrease rate N of the insulation resistance; substituting the switch failure frequency R, the increase rate M of the contact resistance, and the decrease rate N of the insulation resistance into the correlation formula to calculate the aging correlation coefficient GLZ, and the correlation formula is as follows:

[0057] where γ is the contact resistance correlation coefficient and θ is the insulation resistance correlation coefficient.

[0058] It should be noted that the switch failure frequency R is the failure frequency of the meter load switch within a preset time period. The steps for obtaining the increase rate M of the contact resistance are as follows: statistically calculate the contact difference between the contact resistance value of the meter load switch and the preset contact resistance value within the preset time period, and record the ratio of the contact difference to the preset time period as the increase rate M of the contact resistance. The steps for obtaining the decrease rate N of the insulation resistance are as follows: statistically calculate the insulation difference between the insulation resistance of the meter load switch and the preset insulation resistance value within the preset time period, and record the ratio of the insulation difference to the preset time period as the decrease rate of the insulation resistance.

[0059] In some embodiments, the obtaining of the aging management weight coefficient specifically includes the following process:

[0060] Establish a hierarchical model with a hierarchical structure, where the levels include the target layer, the criterion layer, and the measure layer;

[0061] Construct a judgment matrix: determine the number m of relevant influencing factors of the meter load switch, construct a set U of aging factors of the meter load switch, U = {φ 1 , φ 2 , φ 3 , φ 4}, where φ 1 is the subset of the switch failure frequency, φ 2 is the subset of the increase rate of the contact resistance, φ 3 is the subset of the decrease rate of the insulation resistance, φ 4 is the subset of the dielectric withstand voltage rate of the meter load switch. Take two subsets in the same level from the set U for comparison, use m to represent the ratio of importance, and assign the corresponding importance according to a preset ratio. Combine the importance of each layer to form a judgment matrix;

[0062] Calculate the maximum eigenvalue γ of the judgment matrix:

[0063]

[0064] Among them, v ij is the matrix obtained by normalizing each column vector of the judgment matrix, and the values of i and j are 1, 2... m. w j is the matrix obtained by adding the elements of each row of the matrix v ij and then normalizing the obtained vector. w i is the matrix obtained by adding the elements of each column of the matrix v ij and then normalizing the obtained vector;

[0065] Calculate the consistency index CI: Among them, k represents the order of the judgment matrix;

[0066] Record the value of CI as the aging management weight coefficient.

[0067] In some embodiments, generating the first aging characteristic value of the meter load switch specifically includes the following process:

[0068] Collect the first aging characteristic data of the meter load switch at the current system time. Among them, the first aging characteristic data includes the total historical failure times Q of the meter load switch and the total working duration W of the meter load switch. Obtain the total historical failure times Z of all meter load switches. Based on the formula Calculate the first aging characteristic value DYX of the meter load switch. Among them, K1 and K2 are both coefficient constants, and V is the total historical failure duration of all meter load switches.

[0069] In some embodiments, based on the comparison result between the first aging characteristic value and the first aging characteristic value threshold, determining whether to mark the meter load switch as a key monitoring meter load switch specifically includes the following process:

[0070] If the first aging characteristic value is greater than the first aging characteristic value threshold, mark the meter load switch as a key monitoring meter load switch. If the first aging characteristic value is less than or equal to the first aging characteristic value threshold, do not mark the meter load switch as a key monitoring meter load switch.

[0071] In some embodiments, based on high-speed data, perform advanced aging analysis on the key monitoring meter load switch to generate the second aging characteristic value. The specific process includes the following:

[0072] Set i detection times between the current system time and the preset time. Obtain the high-speed data at the first time, the high-speed data at the second time, and so on until the high-speed data at the i-th time based on the detection times. Among them, the high-speed data at the first time includes the first current redundancy, the first voltage redundancy, and the first temperature redundancy of the meter load switch; the high-speed data at the i-th time includes the i-th current redundancy, the i-th voltage redundancy, and the i-th temperature redundancy of the meter load switch. Among them, the current redundancy of the meter load switch is the difference between the current of the meter load switch and the preset current threshold, the voltage redundancy is the difference between the voltage of the meter load switch and the preset voltage threshold, and the temperature redundancy is the difference between the temperature of the meter load switch and the preset temperature threshold. Add the first current redundancy, the first voltage redundancy, and the first temperature redundancy to obtain the first candidate aging characteristic value; until the i-th candidate aging characteristic value is calculated;

[0073] Select the largest candidate aging characteristic value from the first candidate aging characteristic value to the i-th candidate aging characteristic value, and use the largest candidate aging characteristic value as the second aging characteristic value.

[0074] In some embodiments, Figure 2 is the flowchart of a method for dynamically monitoring the aging of a meter load switch based on high-speed data acquisition according to an embodiment of the present invention, as shown in Figure 2As shown in the figure, the method includes the following steps:

[0075] Step S201: Perform initial aging analysis on each meter load switch in sequence based on the aging monitoring sequence;

[0076] Step S202: When performing initial aging analysis on the meter load switch, generate the first aging characteristic value of the meter load switch, and based on the comparison result between the first aging characteristic value and the first aging characteristic value threshold, determine whether to mark the meter load switch as a key monitored meter load switch;

[0077] Step S203: Collect high-speed data of the key monitored meter load switch, perform advanced aging analysis on the key monitored meter load switch based on the high-speed data, and generate a second aging characteristic value;

[0078] Step S204: Generate an early warning signal for the meter load switch based on the second aging characteristic value.

[0079] The above embodiments can be implemented in whole or in part by software, hardware, firmware, or any other combination. When implemented using software, the above embodiments can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, the processes or functions described in the embodiments of the present application are generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by wired (such as infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that the computer can access, or a data storage device such as a server or data center that contains one or more collections of available media. The available media can be magnetic media (such as floppy disks, hard disks, magnetic tapes), optical media (such as DVDs), or semiconductor media. The semiconductor media can be a solid-state drive.

[0080] Those of ordinary skill in the art can realize that the units and algorithm steps of the examples described in combination with the embodiments disclosed herein can be implemented by electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of this application.

[0081] Those skilled in the art can clearly understand that for the convenience and conciseness of description, the specific working processes of the systems, devices, and units described above can refer to the corresponding processes in the foregoing method embodiments and will not be elaborated herein.

[0082] In several embodiments provided in the present application, it should be understood that the disclosed systems, devices, and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only for some logical function divisions, and there can be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces, and the indirect couplings or communication connections of the devices or units can be in electrical, mechanical, or other forms.

[0083] The units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0084] As described above, the above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present application, and all should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition, characterized in that the system include: An initial aging analysis module, used to perform initial aging analysis on each meter load switch in turn based on an aging monitoring sequence; A key monitoring judgment module is used to generate a first aging characteristic value of the electric meter load switch when performing an initial aging analysis on the electric meter load switch, and determine whether to mark the electric meter load switch as a key monitoring electric meter load switch based on a comparison result between the first aging characteristic value and a first aging characteristic value threshold; An advanced aging analysis module, used for collecting high-speed data of a key monitoring meter load switch, performing advanced aging analysis on the key monitoring meter load switch based on the high-speed data, and generating a second aging characteristic value; The aging warning analysis module is used to generate a warning signal of the load switch of the electric meter based on the second aging characteristic value.

2. The aging dynamic monitoring system for electric meter load switches based on high-speed data acquisition according to claim 1 is characterized in that: The aging management sequence is obtained through the following steps: obtaining the aging management sequence value of each meter load switch, multiplying all aging management sequence values ​​by their corresponding aging management weight coefficients to obtain an aging monitoring sequence value, and sorting the aging monitoring sequence values ​​in descending order. After sorting, a sequence is generated, which is the aging monitoring sequence.

3. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 2 is characterized in that: The aging management sequence value of the meter load switch is obtained by the following steps: obtaining several aging correlation coefficients continuously generated by the meter load switch before the current time of the system, constructing a rectangular coordinate system with the aging correlation coefficient as the Y-axis and the generation time of the aging correlation coefficient as the X-axis, marking all the aging correlation coefficients in the rectangular coordinate system in the form of points, connecting adjacent points in the rectangular coordinate system to generate an aging correlation curve, setting an aging boundary constant straight line, marking the intersection of the aging correlation curve and the aging boundary constant straight line, selecting a figure of the aging correlation curve located above the aging boundary constant straight line based on the intersection, calculating the area value of the figure, and recording the area value as the aging management sequence value of the meter load switch.

4. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 3 is characterized in that: Generating the aging correlation coefficient of the meter load switch specifically includes the following processes: Collect historical correlation data of the meter load switch before the current time of the system, wherein the historical correlation data includes the switch fault frequency R, the increase rate M of the contact resistance and the decrease rate N of the insulation resistance; substitute the switch fault frequency R, the increase rate M of the contact resistance and the decrease rate N of the insulation resistance into the correlation formula to calculate the aging correlation coefficient GLZ, which is as follows: Among them, γ is the contact resistance correlation coefficient, and θ is the insulation resistance correlation coefficient.

5. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 4 is characterized in that: The switch failure frequency R is the failure frequency of the meter load switch within a preset time period. The steps for obtaining the contact resistance increase rate M are: counting the contact difference between the contact resistance value of the meter load switch within the preset time period and the preset contact resistance value, and recording the ratio of the contact difference to the preset time period as the contact resistance increase rate M. The steps for obtaining the insulation resistance reduction rate N are: counting the insulation difference between the insulation resistance of the meter load switch within the preset time period and the preset insulation resistance value, and recording the ratio of the insulation difference to the preset time period as the insulation resistance reduction rate.

6. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 2 is characterized in that: The acquisition of the aging management weight coefficient specifically includes the following process: Establish a hierarchical model with a hierarchical structure, where the levels include the goal level, the criterion level and the measure level; Construct a judgment matrix: determine the number m of influencing factors related to the meter load switch, construct a set U of aging factors of the meter load switch, U = {φ1, φ2, φ3, φ4}, where φ1 is a subset of switch failure frequency, φ2 is a subset of contact resistance increase rate, φ3 is a subset of insulation resistance reduction rate, and φ4 is a subset of dielectric withstand voltage rate of the meter load switch. Take two subsets of the same level from the set U for comparison, use m to represent the importance ratio, and assign the corresponding importance according to the preset ratio. Combine the importance of each level to form a judgment matrix; Calculate the maximum eigenvalue γ of the judgment matrix: Among them, v ij It is a matrix obtained by normalizing each column vector of the judgment matrix. The values ​​of i and j are 1, 2...m, w j is the matrix v ij The elements of are added row by row to obtain the vector and then normalized into a matrix, w i is the matrix v ij Add the elements of column by column to obtain the vector and then normalize the matrix; Calculate the consistency index CI: Among them, k represents the order of the judgment matrix; The CI value is recorded as the aging management weight coefficient.

7. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 1 is characterized in that: Generate the first aging characteristic value of the load switch of the electric meter The process includes: Collect the first aging characteristic data of the meter load switch in the current system time, where the first aging characteristic data includes the total number of historical failures Q of the meter load switch and the total working time W of the meter load switch, obtain the total number of historical failures Z of all meter load switches, based on the formula The first aging characteristic value DYX of the load switch of the electric meter is calculated, wherein K1 and K2 are coefficient constants, and V is the total historical fault duration of all the load switches of the electric meter.

8. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 1 is characterized in that: Based on the comparison result of the first aging characteristic value and the first aging characteristic value threshold, determining whether to mark the electric meter load switch as a key monitoring electric meter load switch specifically includes the following process: If the first aging characteristic value is greater than the first aging characteristic value threshold, the meter load switch is marked as a key monitoring meter load switch; if the first aging characteristic value is less than or equal to the first aging characteristic value threshold, the meter load switch is not marked as a key monitoring meter load switch.

9. The dynamic monitoring system for aging of electric meter load switches based on high-speed data acquisition according to claim 1 is characterized in that: Based on high-speed data, advanced aging analysis is performed on the key monitoring meter load switches to generate the second aging characteristic value. The process includes: Set i detection moments between the current moment and the preset moment of the system, and obtain high-speed data at the first moment, high-speed data at the second moment, and high-speed data at the i-th moment based on the detection moments; wherein the high-speed data at the first moment includes the first current redundancy, the first voltage redundancy, and the first temperature redundancy of the meter load switch; the high-speed data at the i-th moment includes the i-th current redundancy, the i-th voltage redundancy, and the i-th temperature redundancy of the meter load switch; wherein the current redundancy of the meter load switch is the difference between the current of the meter load switch and the preset current threshold, the voltage redundancy is the difference between the voltage of the meter load switch and the preset voltage threshold, and the temperature redundancy is the difference between the temperature of the meter load switch and the preset temperature threshold; add the first current redundancy, the first voltage redundancy, and the first temperature redundancy to obtain a first candidate aging characteristic value; until the i-th candidate aging characteristic value is calculated; The largest aging characteristic value to be selected from the first aging characteristic value to be selected to the i-th aging characteristic value to be selected is selected, and the largest aging characteristic value to be selected is used as the second aging characteristic value.

10. A dynamic monitoring method for aging of electric meter load switches based on high-speed data acquisition, characterized in that: Applicable to the dynamic monitoring system for aging of an electric meter load switch based on high-speed data acquisition according to any one of claims 1 to 9, the method comprising: Perform initial aging analysis on each meter load switch in turn based on the aging monitoring sequence; When performing an initial aging analysis on the electric meter load switch, generating a first aging characteristic value of the electric meter load switch, and determining whether to mark the electric meter load switch as a key monitoring electric meter load switch based on a comparison result of the first aging characteristic value and a first aging characteristic value threshold; Collect high-speed data of a key monitoring meter load switch, perform advanced aging analysis on the key monitoring meter load switch based on the high-speed data, and generate a second aging characteristic value; A warning signal of the load switch of the electric meter is generated based on the second aging characteristic value.

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